ivnzyiui 五、新型說明： 【新型所屬之技術領域 一種探針頭， 及一第二接觸部之 先前技術】 具有一第 探針頭 接觸部 電子元件之電子訊號連接組件， 觸器如探針，對乂微彈性接Ivnzyiui V. New description: [The prior art of a new type of probe head and a second contact part] An electronic signal connection component having a probe head contact electronic component, a contactor such as a probe,乂 micro elastic connection
耵罨子凡件作性能測試，w π A 品的產生，而對商 μ心 避免不良 丁同菜观肀力產生影響。 請參照第1圖及第2圖所示，其传為^ 之探針頭立體干音、為白知技術 體不思圖及使用狀態示意圖。R φ 探針頭包括-探針頭本體π、一第 圓中，該 第二接觸部13、一第— 觸邛12、一 弟二接觸部14及—结 15。該第一接觸 第四接觸部 接觸。"2、該第二接觸部” 觸邓】4及該第四接觸部 -第二接 η之-側端向外延伸別由該探針頭本體 使用時，則將該探針頭之該 第二接觸部13、該第 接觸4】2、該 15與-待測物件2 &該第四接觸部 表面會形成-氧化層二：…待測物… 號，需使探針頭與待測物件：里測到準確的電性訊 接觸力，使該等接觸部制&之間形成適當的表面 以三點接觸今四破待測物件之氧化層後, 伐觸或四點接觸等方、 w便 電流或電壓等電性訊號。工篁測待測物件電阻、 3 二而，由於習知探針頭Α θ π > π 丨呼加形成多個接觸部，由 於針頭本身非常微小，導 φ 守蚁接觸部之加工困難。此 外’習知探針針頭之結構強 傅5*度不向’使用次數無法 進一步提升。 【新型内容】 本創作之主要目#，旨在提供一種探針頭’其 僅設有兩接觸部，以提升結構強度及延長使用壽命。 為達上述目的，本創作之探針頭，其係包含一 探針頭本體、一第_妓艇 第接觸部及一第二接觸部。該探 疏頭本體具有一第-側邊及-第二側邊。該第一接 觸部係由該探針頭本體之第一側邊向外斜向延伸。 該第二接觸部係由該探針頭本體之該第一側邊向外 斜向延伸。 其中’該第-接觸部及該第二接觸部之間係形 成約5 0度之夹角。 其中，該探針頭本體係由金屬合金所製成。 其中’該第—接觸部及該第二接觸部係盥一待 測物件形成—點接觸、一線接觸或一面接觸：、 其中’該第-接觸部及該第二接觸部之間係形 成約30〜90度之夹角。 實施方式】 4The performance of the scorpion piece is tested, the production of w π A product, and the influence of the quotient on the quotient of the quotient. Please refer to Fig. 1 and Fig. 2 for the three-dimensional dry sound of the probe head, which is the schematic diagram of the white body and the state of use. The R φ probe head includes a probe head body π, a first circle, a second contact portion 13, a first contact 12, a second contact portion 14 and a junction 15. The first contact fourth contact is in contact. "2, the second contact portion "touch Deng" 4 and the fourth contact portion - the second contact η - the side end extends outwardly when the probe head body is used, then the probe head The second contact portion 13, the first contact 4, 2, the 15 and - the object to be tested 2 & the surface of the fourth contact portion will form - the oxide layer 2: ... the object to be tested ..., the probe head and the Measured object: The accurate electrical contact force is measured, so that the contact surface system and the appropriate surface are formed to contact the oxide layer of the object to be tested, three-point contact, four-point contact, etc. Square, w current or voltage isoelectric signal. The work of measuring the resistance of the object to be tested, 3 2, because the conventional probe head Α θ π > π 丨 加 加 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成In addition, the processing of the φ ant ant contact is difficult. In addition, the structure of the conventional probe needle is 5* degrees, and the number of uses cannot be further improved. [New content] The main purpose of this creation is to provide a kind of exploration. The needle 'has only two contact parts to enhance the structural strength and extend the service life. The probe head of the present invention comprises a probe head body, a first keel first contact portion and a second contact portion. The probe head body has a first side and a second side. The first contact portion extends obliquely outward from the first side of the probe head body. The second contact portion extends obliquely outward from the first side of the probe head body. The angle between the first contact portion and the second contact portion is formed at an angle of about 50 degrees. The probe head system is made of a metal alloy, wherein the first contact portion and the second contact portion The object to be tested is formed into a point contact, a line contact or a side contact: wherein 'the first contact portion and the second contact portion form an angle of about 30 to 90 degrees. Embodiments 4
為使貴審杳1 D 以下列π ~貝月b清楚了解本創作之内容，1 r夕丨』s兒明搭献R η令，謹 I配圖式’敬請參閱。 5月參閱第3圖、第4回^ 其係為本創作探針頭第一、弟5圖及第6圖所示， 視圖、使用示意 $施例之立體示意圖、剖 3 ‘、3及組裝示意圖。圖中，該摄-s 3可以金屬合金所梦 T該探針碩 一筮 ^ 成，並包含一探針頭本體31、 第—接觸部32及—笛 1 ^ 第二接觸部33。 該探針頭本體31 ? 件，並且古性 —圓柱體形而為一圓形加工 筮邊31 1及一第二側邊312。兮· 弟一接觸部32係^ '、由該探針頭本體3 1之該第一相 3 11向外钭氏< 忑第側邊 本體… 第二接觸冑33係由該探針頭 "側邊311向外沿伸’且該第二接觸 33係相對於該第一 按觸邛32。在本實施例中， 孩第一接觸部及該筮-&嫌μ β , 第一接觸部係由三個斜面所構In order to make your review 1 D clearly understand the content of this creation with the following π ~ Bay Moon b, 1 r 丨 丨 s 明 搭 搭 搭 R R R , , , 谨 谨 谨 谨 谨 谨 谨 谨 ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ Refer to Figure 3 and the 4th in May. The first is the first probe, the fifth and the sixth, and the view, the schematic diagram of the application, the section 3 ', 3 and the assembly. schematic diagram. In the figure, the photo-s 3 can be made of a metal alloy, and includes a probe head body 31, a first contact portion 32, and a flute 1 ^ second contact portion 33. The probe head body 31 is a piece of the ancient-cylindrical shape and has a circular processing edge 31 1 and a second side 312.兮· Brother a contact part 32 series ^ ', the first phase 3 11 of the probe head body 3 1 outwards 钭 忑 忑 侧 侧 侧 本体 ... 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二 第二The side edge 311 extends outwardly and the second contact 33 is relative to the first touch pad 32. In this embodiment, the first contact portion of the child and the 筮-&μβ, the first contact portion is constructed by three slopes
成’且該三個斜面#形& mL ^ 係形成一父點，而可與待測物件 形成一點接觸。. 在本實施例中，該第-接觸部32及該第二接觸 部33之間係形成、約5〇度左右之夾角，但不以此為 限，亦可為30〜90度左右之夾角。 ¥使用該探針頭量測一待測物件4之電性訊號 時，使該探針頭3與該待測物件4之間形成一適當 的表面接觸力，藉由該第一接觸部32及該第二接觸 邛3 3刮破該待測物件4表面之氧化層4丨後，使該 第一接觸部32及該第二接觸部33與該待測物件4 5 作點接觸、線接觸或面接觸’以量測該待測物件4 之阻抗、電壓及電流等各種電性訊號。相較於習知 技術之探針頭使用多個接觸部作多點接觸而言，本 創作之該探針頭3只形成兩接觸部，因此其結構強 度較強’不易斷裂或變形，從而提升探針頭之使用 哥命。 此外該探針頭本體31之尾端除可為圓弧造型 外，更可為一尖頭造型，如第7圖所示。 »月參第8圖’其係為本創作探針頭第二實施 例之示意圖。圖中，該探針頭4包含—探針頭本體 41' 一第-接觸部42及—第二接觸部43所構成。 本實施例與第—實施例之差異在於該第-接觸 部42及該第二接觸部43係由兩斜面所構成，且盘 該兩斜面處之交界處構成-交線，該交線係與待測 工件形成一線接觸。 、 探二本創作探針頭，其功效在於僅需使 :針頭與待測物件形成兩點接觸便可量測電性π t相較Μ知技術而言，更可加強探針頭之結構 強度’以提升使用壽命。 唯’以上所述者’僅為本創作之較佳實施例而 =並非用以限定本創作實施之範圍，在不脫離本 創作之精神與範圍下所作之 涵蓋於本創作之專㈣圍内。匕與修飾1應 綜上所述’本創作之探針頭，係具有專利之創 6 M429101 作性，及對產業的利用價值；申請人爰依專利法之 規定，向 鈎局提起新型專利之申請。And the three slopes #形 & mL ^ form a parent point, and can form a little contact with the object to be tested. In the present embodiment, the first contact portion 32 and the second contact portion 33 are formed at an angle of about 5 degrees, but not limited thereto, and may be an angle of about 30 to 90 degrees. . When the probe head is used to measure the electrical signal of the object to be tested 4, an appropriate surface contact force is formed between the probe head 3 and the object to be tested 4, by the first contact portion 32 and After the second contact 邛3 3 scrapes the oxide layer 4 of the surface of the object to be tested 4, the first contact portion 32 and the second contact portion 33 are in point contact, line contact with the object to be tested 45 or The surface contact 'measures various electrical signals such as impedance, voltage and current of the object to be tested 4. Compared with the prior art, the probe head uses a plurality of contact portions for multi-point contact, the probe head 3 of the present invention only forms two contact portions, so the structural strength is strong, which is not easy to be broken or deformed, thereby improving The use of the probe head is fatal. In addition, the tip end of the probe head body 31 can be a pointed shape in addition to the arc shape, as shown in Fig. 7. »月参第8图' is a schematic diagram of a second embodiment of the creation probe head. In the figure, the probe head 4 comprises a probe head body 41', a first contact portion 42, and a second contact portion 43. The difference between this embodiment and the first embodiment is that the first contact portion 42 and the second contact portion 43 are formed by two inclined surfaces, and the intersection of the two inclined surfaces of the disk constitutes an intersection line, and the intersection line is The workpiece to be tested forms a line contact. The second probe head can be used to measure the electrical π t compared with the known technology, and the structural strength of the probe head can be strengthened. 'To increase the service life. The above description is only for the preferred embodiment of the present invention and is not intended to limit the scope of the present invention, and is intended to cover the scope of this creation (4) without departing from the spirit and scope of the present invention.匕 and Modification 1 should be summed up in the above-mentioned probe head of the creation, which has the patented creation 6 M429101 and the use value of the industry; the applicant filed a new patent with the hook in accordance with the provisions of the Patent Law. Application.
M429101 【圖式簡單說明】 圖。 示意圖。 體不意圖。 視圖。 用不意圖。 a裝示意圖。 針頭本體後 示意圖。 第1圖’為習知技術探針頭之立體示意 第2圖，為習知技術探針頭之使用狀態 第3圖，為本創作探針頭第一實施例立 第4圖，為本創作探針頭第一實施例剖 第5圖，為本創作探針頭第一實施例使 第6圖，為本創作探針頭第一實施例之彳 第7圖，為本創作探針頭第一實施例摞 端之造型示意圖。 第8圖，為本創作探針頭第二實施例之 【主要 11 12 13 14 15 2 21 3 31 元件符號說明】 探針頭本體 第一接觸部 第二接觸部 第三接觸部 第四接觸部 待測物件 氣化層 探針頭 $針頭本體 第一惻邊 第二側邊 8 312 M429101 32 第一接觸部 33 第二接觸部 4 待測物件 41 氧化層M429101 [Simple description of the diagram] Figure. schematic diagram. Not intended. view. Use no intention. a installed schematic. Rear view of the needle body. Fig. 1 is a perspective view of a prior art probe head. Fig. 2 is a view showing a state of use of a conventional probe head. Fig. 4 is a fourth embodiment of the creation probe head. The first embodiment of the probe head is shown in Fig. 5, which is the first embodiment of the prior art probe head, and Fig. 6 is the first embodiment of the prior art probe head. A schematic diagram of the shape of an embodiment. Figure 8 is a second embodiment of the present invention. [Main 11 12 13 14 15 2 21 3 31 symbol description] probe head body first contact portion second contact portion third contact portion fourth contact portion Test object gasification layer probe head $ needle body first side second side 8 312 M429101 32 first contact portion 33 second contact portion 4 object to be tested 41 oxide layer