TWI734305B - Hybrid system architecture for thin film deposition - Google Patents
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- TWI734305B TWI734305B TW108146298A TW108146298A TWI734305B TW I734305 B TWI734305 B TW I734305B TW 108146298 A TW108146298 A TW 108146298A TW 108146298 A TW108146298 A TW 108146298A TW I734305 B TWI734305 B TW I734305B
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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- H—ELECTRICITY
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67715—Changing the direction of the conveying path
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Abstract
Description
本申請案是2019年9月25日提交的美國專利申請案16/583,165的部分延續,該申請案的全部公開內容引用於本案做為參考。本申請案主張2018年12月18日提交的美國專利臨時申請案62/781,577的優先權,其全部公開內容也引用於本案。 This application is a partial continuation of U.S. Patent Application 16/583,165 filed on September 25, 2019, and the entire disclosure of the application is incorporated by reference in this case. This application claims the priority of U.S. Provisional Application 62/781,577 filed on December 18, 2018, and the entire disclosure content of this application is also cited in this case.
本發明主要是關於基板處理的技術領域,例如在基板,尤其是半導體晶圓上形成薄膜塗層的技術領域。 The present invention mainly relates to the technical field of substrate processing, for example, the technical field of forming a thin film coating on a substrate, especially a semiconductor wafer.
在真空中進行基板的處理在本技術領域中是眾所周知的技術,且有時會稱為薄膜處理。通常,薄膜處理系統可以歸為以下三種架構:批次處理,群集系統和線上系統。這些架構中的任一個都有其優點和缺點,在本領域中也是眾所周知。 The processing of substrates in a vacuum is a well-known technique in this technical field, and is sometimes referred to as thin film processing. Generally, thin film processing systems can be classified into the following three architectures: batch processing, cluster system and online system. Each of these architectures has its advantages and disadvantages, which are also well known in the art.
在一些系統架構中,尤其是應用於使用半導體晶圓製造微晶片的系統架構中,基板是由機械手臂個別傳送到處理室中,並且被放置在固定的夾盤或基座上。反之,在其他系統中,例如應用於硬式磁碟機或太陽能電池製造的系統中,在基板的傳送和處理過程中,基板是放置在可移動的基板載具上。 In some system architectures, especially those that use semiconductor wafers to manufacture microchips, the substrates are individually transferred to the processing chamber by a robotic arm and placed on a fixed chuck or susceptor. Conversely, in other systems, such as those used in hard disk drives or solar cell manufacturing, the substrate is placed on a movable substrate carrier during the transfer and processing of the substrate.
本技術領域亟需有改進的系統結構,以供應用於在不同類型的基板上,形成薄膜。此外,在本領域中也需要可以高產量,且以商業上可接受的成本形成薄膜塗層的機器。 There is an urgent need for an improved system structure in the technical field to provide for the formation of thin films on different types of substrates. In addition, there is also a need in the art for machines that can form thin-film coatings with high throughput and at a commercially acceptable cost.
以下對本發明內容的簡述,目的在於對本發明之數種面向和技術特徵作出基本的說明。發明的簡述並非對本發明的詳細表述,因此其目的不在特別列舉本發明的關鍵性或重要元件,也不是用來界定本發明的範圍。其唯一目的是以簡明的方式呈現本發明的數種概念,作為以下詳細說明的前言。 The following brief description of the content of the present invention aims to provide a basic description of several aspects and technical features of the present invention. The brief description of the invention is not a detailed description of the invention, so its purpose is not to specifically enumerate the key or important elements of the invention, nor to define the scope of the invention. Its sole purpose is to present several concepts of the present invention in a concise manner as a prelude to the detailed description below.
本發明實施例提供一種系統,該系統專門設計用於以高產量生產,並以商業上可接受的成本形成改進的薄膜塗層。本發明系統特別適合在半導體晶圓上形成多數組成分互相不同的薄層,例如用於製造MRAMs(Magnetoresistive Random-Access Memory,磁阻隨機存取記憶裝置)。 Embodiments of the present invention provide a system that is specifically designed to produce an improved thin film coating at a high-volume production and at a commercially acceptable cost. The system of the present invention is particularly suitable for forming multiple arrays of thin layers with different compositions on a semiconductor wafer, for example, for manufacturing MRAMs (Magnetoresistive Random-Access Memory).
在一個MRAM單元中,資料是以磁性記憶元件儲存。記憶元件是以薄絕緣層隔開的兩個鐵磁板形成。兩塊磁板之一稱為參考層,是設置為特定極性的永磁體。而另一個磁板稱為自由磁板,其磁化可以改變以匹配外部磁場的磁性,以儲存一個記憶位元。這種配置稱為磁性穿隧接面,是MRAM位元的最基本結構。MRAM記憶裝置晶片就是從這種「單元」的柵格開始建立。實際上,每個鐵磁板都是由材料組成互不相同的數層薄膜形成,與硬式磁碟機的磁碟結構有點類似。 In an MRAM cell, data is stored in magnetic memory elements. The memory element is formed by two ferromagnetic plates separated by a thin insulating layer. One of the two magnetic plates is called the reference layer, which is a permanent magnet set to a specific polarity. The other magnetic plate is called a free magnetic plate, and its magnetization can be changed to match the magnetism of the external magnetic field to store a memory bit. This configuration is called a magnetic tunnel junction and is the most basic structure of MRAM bits. The MRAM memory device chip is built from this grid of "cells". In fact, each ferromagnetic plate is formed by several layers of thin films with different material composition, which is somewhat similar to the structure of a hard disk drive.
本發明的實施例提供適於在真空處理系統中,高速沉積薄膜層的兩個重要元件:一是真空系統的架構,另一個是晶圓裝載系統的架構。該體系 結構設計成可以解決與在圓形矽晶圓上濺鍍磁性材料薄膜相關的各種問題。其中的問題包括:如何避免水蒸氣到達各材料層,如何避免顆粒污染,以及如何避免晶圓移位和破裂等。 The embodiment of the present invention provides two important components suitable for high-speed deposition of thin film layers in a vacuum processing system: one is the architecture of the vacuum system, and the other is the architecture of the wafer loading system. The system The structure is designed to solve various problems related to the sputtering of thin films of magnetic materials on round silicon wafers. Among the problems are: how to prevent water vapor from reaching each material layer, how to avoid particle contamination, and how to avoid wafer displacement and cracking.
在本發明的實施例中,真空外罩具有附接到其上的多個處理室。在處理過程中,多個載具在真空外罩內一致地連續移動,以在各處理室中處理晶圓。裝卸載區連接到真空外罩,並可具備加載側和卸載側,兩者可以共享真空環境或分別具有獨立的真空環境。閘閥將裝卸載區與真空外罩分開。軌道轉換器位於真空外罩內。軌道轉換器可在第一位置和第二位置之間移動。當軌道轉換器位於第一位置時,可使載具在真空外罩內連續移動;而在第二位置時,則可使載具在真空外罩與裝卸載區之間移動。 In an embodiment of the present invention, the vacuum enclosure has a plurality of processing chambers attached to it. During the processing, multiple carriers move continuously in the vacuum enclosure to process wafers in each processing chamber. The loading and unloading area is connected to the vacuum enclosure, and can have a loading side and an unloading side, and the two can share a vacuum environment or have independent vacuum environments. The gate valve separates the loading and unloading area from the vacuum enclosure. The orbital converter is located in the vacuum enclosure. The track switch is movable between the first position and the second position. When the orbital converter is in the first position, the carrier can be continuously moved in the vacuum enclosure; and in the second position, the carrier can be moved between the vacuum enclosure and the loading and unloading area.
根據本發明的一般面向,本發明提供一種處理系統,該系統包括:真空外罩;多個處理腔室,附接至該真空外罩的側壁;傳送腔室,通過第一閘閥連接至真空外罩的裝載端,該傳送腔室中具有傳送軌道;一個裝卸載區,經由第二閘閥耦接到該傳送腔室,並在其入口側具有第三閘閥,該裝卸載區內配備傳送軌道;晶圓保持模組,附接到該裝卸載區的側壁上,並具有晶圓保持器,該晶圓保持器在該裝卸載區內以垂直朝向或接近垂直的朝向支撐該基板;一支關節運動的機械手臂,具有端部執行器,通過可旋轉的腕部連接在該關節運動的機械手臂的一端,該關節運動的機械手臂位於該裝卸載區的外部,並可從一個FOUP內將基板以水平朝向移出,將基板轉動到垂直朝向或接近垂直的朝向,再將基板放置到晶圓保持器上;以及多個基板載具,可在傳送軌道上移動並可與晶圓保持模組交換基板。 According to the general aspect of the present invention, the present invention provides a processing system including: a vacuum housing; a plurality of processing chambers attached to the side walls of the vacuum housing; a transfer chamber connected to the loading of the vacuum housing through a first gate valve At the end, the transfer chamber has a transfer track; a loading and unloading area is coupled to the transfer chamber via a second gate valve, and has a third gate valve on its inlet side, and the loading and unloading area is equipped with a transfer track; wafer holding The module is attached to the side wall of the loading and unloading area, and has a wafer holder, and the wafer holder supports the substrate in the loading and unloading area in a vertical or nearly vertical orientation; a joint moving machine An arm with an end effector, connected to one end of the articulated robotic arm through a rotatable wrist, the articulated robotic arm is located outside the loading and unloading area, and the substrate can be horizontally directed from a FOUP Remove, rotate the substrate to a vertical or nearly vertical orientation, and then place the substrate on the wafer holder; and multiple substrate carriers that can move on the transfer track and exchange substrates with the wafer holding module.
該系統可以包括轉盤,轉盤上具有直線軌道部分。該轉盤可以旋轉,以將基板載具從卸載位置傳送到裝載位置,或從一組傳送軌道傳送到另一組傳送軌道。該轉盤可以配置在真空外罩內,也可配置在該裝卸載區內,並可以包括動力輪。 The system may include a turntable with a linear track portion on the turntable. The turntable can be rotated to transfer the substrate carrier from the unloading position to the loading position, or from one set of transfer tracks to another set of transfer tracks. The turntable can be arranged in the vacuum outer cover or in the loading and unloading area, and can include power wheels.
該系統可以包括:跑道形單軌,位於真空外罩內部;環形輸送帶,位於真空外罩內,用以接合載具,使載具自由在跑道形單軌上運行;以及軌道轉換器,定位在跑道形單軌的一端,用以傳送載具在跑道形單軌和傳送軌道之間運行。 The system may include: a racetrack-shaped monorail located inside the vacuum housing; an endless conveyor belt, located in the vacuum housing, for engaging the carrier so that the carrier can run on the racetrack-shaped monorail freely; and a track converter positioned on the racetrack-shaped monorail One end is used for the conveying vehicle to run between the racetrack-shaped monorail and the conveying track.
每個基板載具可以包括定位成朝向近乎垂直的晶圓保持器及/或靜電吸盤。 Each substrate carrier may include a wafer holder and/or an electrostatic chuck positioned to face nearly perpendicularly.
該系統可以包括:轉盤,該轉盤位於真空外罩的末端,該末端與裝載端相對;跑道形單軌,該跑道形單軌位於真空外罩內;環形輸送帶,位於真空外罩內,用以接合載具,使載具自由在跑道形單軌上運行;軌道轉換器,位於跑道形單軌的一端,並在跑道形單軌和轉盤之間傳送載具;以及至少一個第二處理系統,附接到真空外罩的末端處。該環形輸送帶可包括多個驅動叉,且每個基板載具包括多個自由旋轉輪,建構成可與該跑道形單軌接合,以及一支驅動銷,建構成可與該驅動叉相接合。而且,該轉盤可以包括直線軌道部分和動力輪,並且每個基板載具包括與動力輪接合的驅動桿。 The system may include: a turntable located at the end of the vacuum housing, the end opposite to the loading end; a racetrack-shaped monorail located in the vacuum housing; an endless conveyor belt located in the vacuum housing to join the carrier, Allow the vehicle to run freely on the racetrack-shaped monorail; orbit converter, located at one end of the racetrack-shaped monorail, and transfer the vehicle between the racetrack-shaped monorail and the turntable; and at least one second processing system attached to the end of the vacuum housing Place. The endless conveyor belt may include a plurality of driving forks, and each substrate carrier includes a plurality of freely rotating wheels, which are configured to be engaged with the racetrack-shaped monorail, and a driving pin is configured to be engaged with the driving fork. Moreover, the turntable may include a linear track portion and a power wheel, and each substrate carrier includes a driving rod engaged with the power wheel.
除此之外,該系統可以包括第二傳送室,該第二傳送室耦接至真空外罩的裝載端;第二裝卸載區,耦接到該第二傳送室。傳送機構將載具從第二裝卸載區傳送到第一裝載室,或從第二傳送室傳送到第一傳送室。傳送機構可包括至少一個軌道轉換器,該軌道轉換器包括可移動的工作台,位於工作台 上的筆直的單軌部分和位於工作台上的彎曲的單軌部分,並且還可以包括具有直線軌道部分在其上的轉盤。該系統還可以包括單軌,該單軌位於真空外罩的內部並且形成為:第一單軌段,形狀為跑道形,以及第二單軌段,具有兩個平行的直線單軌延伸部;以及位於第一單軌段的動力元件;沿第二單軌段設置的多個動力輪;其中,該軌道轉換器在第一和第二單軌段之間傳送載具。多個載具中的每一個可以包括:基座;接合機構,該接合機構附接至該基座,並建構成可以接合該動力元件,以在第一單軌段中移動該載具;以及驅動桿,安裝在該基座上,該驅動桿建構成可與多個動力輪接合,以便在載具在第二單軌段上運行時,可以移動載具。 In addition, the system may include a second transfer chamber, which is coupled to the loading end of the vacuum enclosure, and a second loading and unloading area, which is coupled to the second transfer chamber. The transfer mechanism transfers the carriers from the second loading and unloading area to the first loading chamber, or from the second transfer chamber to the first transfer chamber. The conveying mechanism may include at least one orbital converter, the orbital converter including a movable worktable located on the worktable The straight monorail part on the upper part and the curved monorail part on the worktable may also include a turntable having a straight track part thereon. The system may further include a monorail located inside the vacuum envelope and formed as: a first monorail section having a racetrack shape, and a second monorail section having two parallel linear monorail extensions; and located at the first monorail section The power element; a plurality of power wheels arranged along the second monorail section; wherein the track converter transfers the carrier between the first and second monorail section. Each of the plurality of vehicles may include: a base; an engagement mechanism attached to the base and configured to engage the power element to move the vehicle in the first monorail section; and drive The rod is installed on the base, and the driving rod is configured to be engaged with a plurality of power wheels, so that the vehicle can be moved when the vehicle is running on the second monorail section.
根據本發明另一面向,本發明提供一種處理系統,該系統包括:真空外罩,具有多個處理窗口和一條位於真空外罩內的連續軌道;多個處理室,附接到該真空外罩的側壁,每個處理室對應到一個處理窗口;一個裝卸載區,連接在該真空外罩的一端,且其內部具有裝載軌道;至少一個閘閥,以將裝卸載區與真空外罩分開;多個基板載具,建構成可以在該連續軌道和該裝載軌道上移動;至少一個軌道轉換器,位於該真空外罩內,該軌道轉換器可在第一位置和第二位置之間移動,其中,在第一位置時可使基板載具在連續軌道上連續移動,而在第二位置時可使基板載具在連續軌道和裝載軌道之間傳送。 According to another aspect of the present invention, the present invention provides a processing system including: a vacuum enclosure having a plurality of processing windows and a continuous track located in the vacuum enclosure; a plurality of processing chambers attached to the side walls of the vacuum enclosure, Each processing chamber corresponds to a processing window; a loading and unloading area is connected to one end of the vacuum housing and has a loading track inside; at least one gate valve to separate the loading and unloading area from the vacuum housing; multiple substrate carriers, The structure can move on the continuous track and the loading track; at least one track switch is located in the vacuum housing, and the track switch can move between a first position and a second position, wherein when in the first position The substrate carrier can be continuously moved on the continuous rail, and in the second position, the substrate carrier can be transported between the continuous rail and the loading rail.
在本發明進一步的面向中,本發明提供一個基板處理系統,該系統包括:裝卸載區,具有第一側和與第一側相對的第二側;大氣區段,耦接到該裝卸載區的第一側;真空區段,耦接到該裝卸載區部分的第二側,並具有多個處理室連接到其 上;載具傳送機構,包括:i.一道單軌,形成為:第一單軌段,形狀為跑道形,並位於該真空區段內;第二單軌段,具有兩道平行的直線單軌段,位於裝卸載區內並延伸至大氣區段和真空區段;以及第三單軌段,位於該大氣區段中,形狀為曲線,第三單軌段的一端與直線單軌之一的延伸相連,另一端與另一道直線單軌的延伸相連,ii.動力元件,位於該跑道形中,iii.多個動力輪,沿該第二單軌段定位,iv.兩個軌道轉換器,位於第一單軌段的一端,每個軌道轉換器包括一個可移動的工作台,一個位於工作台上的直線單軌部分,以及一個位於工作台上的彎曲單軌部分,以及多個載具,具有多個轉輪,該載具建構成可與該單軌接合,以使載具在單軌上運行。 In a further aspect of the present invention, the present invention provides a substrate processing system including: a loading and unloading area having a first side and a second side opposite to the first side; an atmospheric section coupled to the loading and unloading area The first side; the vacuum section, coupled to the second side of the loading and unloading area part, and has a plurality of processing chambers connected to it The carrier conveying mechanism includes: i. A monorail formed as: a first monorail section with a racetrack shape and located in the vacuum section; a second monorail section with two parallel straight monorail sections located at The loading and unloading area extends to the atmospheric section and the vacuum section; and the third monorail section, which is located in the atmospheric section and is shaped like a curve. One end of the third monorail section is connected to the extension of one of the linear monorails, and the other end is connected The extension of the other linear monorail is connected, ii. the power element, located in the racetrack shape, iii. multiple power wheels, positioned along the second monorail section, iv. two track converters, located at one end of the first monorail section, Each track converter includes a movable worktable, a linear monorail part on the worktable, and a curved monorail part on the worktable, and a plurality of carriers with a plurality of wheels. The carrier is built The structure can be engaged with the monorail so that the carrier can run on the monorail.
在本發明一個實施例中,該系統由以下元件組成:裝卸載區,具有第一側面和與第一側面相對的第二側面;大氣區段,連接到該裝卸載區的第一側;真空區段,連接到該裝卸載區部分的第二側,並具有多個處理室連接到其上;載具傳送機構,包括:i.一道單軌,形成為:第一單軌段,形狀為跑道形並位於該真空區段內:第二單軌段,該第二單軌段具有兩個平行的直線單軌段,位於裝卸載區段內並延伸至該大氣區段與該真空區段,以及第三單軌段,位於大氣區段內,形狀為彎曲,其一端與該直線單軌段之一的延伸相連,另一端與另一道直線單軌的延伸相連, ii.環形輸送帶,位於該跑道形內,並具有多個驅動叉,iii.驅動輪,位於大氣區段並附連有多個驅動叉,iv.多個動力輪,沿第二單軌部分定位,v.兩個軌道轉換器,位於第一單軌段的一端,每個軌道轉換器包括一個可移動的工作台,一個位於工作台上的直線單軌部分和一個位於工作台上的彎曲單軌部分,多個載具,每個載具具有:基座;多數轉輪,附接至該基座並建構成可接合該單軌,以使載具可自由在該單軌上運行;驅動桿,附接至該基座,該驅動桿建構成可接合該多個動力輪,以在載具位在該第二單軌區段上時,使載具運行;以及驅動銷,該驅動銷附接至該基座,並建構成可與該驅動叉接合,以在載具位在該第一或第三單軌區段上時,使載具運行;且其中,當該軌道轉換器是位在第一位置時,該彎曲的單軌段與該第一單軌段對準,以使該載具可以由該驅動叉驅動而連續沿該第一單軌段移動,且當該軌道轉換器位於第二位置時,該直線單軌區段將該第一單軌段連接到該第二單軌段,以使載具在該裝卸載區和該真空區段之間進行轉換。 In an embodiment of the present invention, the system is composed of the following elements: a loading and unloading area having a first side and a second side opposite to the first side; an atmospheric section connected to the first side of the loading and unloading area; a vacuum Section, connected to the second side of the loading and unloading area part, and having a plurality of processing chambers connected to it; the carrier conveying mechanism, including: i. a monorail, formed as: a first monorail section, in the shape of a racetrack And located in the vacuum section: the second monorail section, the second monorail section has two parallel straight monorail sections, located in the loading and unloading section and extending to the atmospheric section and the vacuum section, and the third monorail section The section, located in the atmospheric section, is curved in shape, one end of which is connected with the extension of one of the linear monorail sections, and the other end is connected with the extension of the other linear monorail, ii. The endless conveyor belt is located in the racetrack shape and has multiple drive forks, iii. the drive wheels are located in the atmospheric section and are attached with multiple drive forks, iv. multiple power wheels are positioned along the second monorail section , V. Two track converters, located at one end of the first monorail section, each track converter includes a movable worktable, a linear monorail part on the worktable and a curved monorail part on the worktable, A plurality of vehicles, each of which has: a base; a plurality of wheels, attached to the base and constructed to engage the monorail so that the carrier can run on the monorail freely; a drive rod, attached to The base, the drive rod is configured to engage the plurality of power wheels to enable the vehicle to run when the vehicle is located on the second monorail section; and a drive pin attached to the base , And the structure can be engaged with the driving fork to make the carrier move when the carrier is located on the first or third monorail section; and wherein, when the track converter is in the first position, The curved monorail section is aligned with the first monorail section so that the carrier can be driven by the driving fork to continuously move along the first monorail section, and when the track switch is in the second position, the linear monorail The section connects the first monorail section to the second monorail section so that the carrier can be switched between the loading and unloading area and the vacuum section.
100:系統 100: System
105:大氣區段 105: Atmospheric section
110:裝卸載區 110: loading and unloading area
115:真空區段即通過型連續處理區段 115: Vacuum section that is through continuous processing section
120A-120D:處理室 120A-120D: processing room
125:單軌 125: Monorail
127:跑道形單軌即第一單軌段 127: Racetrack-shaped monorail is the first monorail section
128:軌道 128: Orbit
128A、128B:直線軌道 128A, 128B: straight track
129:月牙狀迴轉軌道 129: Crescent Orbit
130:環形輸送帶 130: endless conveyor belt
131A、131B:旋轉鼓 131A, 131B: rotating drum
132:驅動叉 132: Drive fork
135:動力輪 135: Power Wheel
137:旋轉輪 137: Rotating Wheel
140:軌道轉換器 140: track converter
140A:軌道轉換器 140A: Track converter
141:工作台 141: Workbench
142:彎曲軌道段 142: Curved track section
144:直線軌道段 144: Straight track section
150:基板載具 150: substrate carrier
152:基座 152: Pedestal
153:滾輪裝置 153: Roller device
154:基板保持器 154: substrate holder
154’:保持器 154’: Retainer
156:驅動桿 156: Drive Rod
157:靜電吸盤 157: Electrostatic chuck
158:驅動銷 158: Drive pin
159:支撐銷 159: Support pin
160:裝載站 160: loading station
161:卸載區段 161: Uninstall section
163:真空外罩 163: vacuum cover
166、167、168:維修出入窗口 166, 167, 168: Maintenance access window
170:隔板 170: partition
171:可轉動的鉸鏈 171: Rotatable hinge
172:處理窗口 172: Processing window
300:前方開口通用盒 300: Universal box with front opening
302:晶圓保持模組 302: Wafer holding module
304:晶圓保持器 304: Wafer Holder
305:裝卸載區/交換腔室LL/EX 305: Loading and unloading area/exchange chamber LL/EX
310:傳送室 310: transfer room
312:機械手臂 312: Robotic Arm
314:端部執行器 314: End effector
316:可旋轉腕部 316: Rotatable wrist
321:直線軌道部分 321: Straight track part
322:轉盤 322: Turntable
323:轉盤 323: Turntable
326:處理室或處理系統 326: Processing room or processing system
327:轉盤 327: Turntable
328:輪轂 328: Wheel Hub
329:輪輻 329: Spokes
331:直線軌道區段 331: Straight track section
EN:入口閘閥 EN: inlet gate valve
EX:出口閘閥 EX: outlet gate valve
IN:閘閥 IN: Gate valve
本發明的其他技術特徵和面向可由以下詳細說明,並參考所附圖式更形清楚。應該理解的是,詳細說明和附圖都是在提供由所附申請專利範圍所限定的本發明各種實施例的各種非限制性示例。 Other technical features and aspects of the present invention can be described in detail below, and are more clearly apparent with reference to the accompanying drawings. It should be understood that the detailed description and the drawings are intended to provide various non-limiting examples of the various embodiments of the present invention defined by the scope of the appended application.
所附的圖式納入本專利說明書中,並成為其一部份,是用來例示本發明的實施例,並與本案的說明內容共同用來說明及展示本發明的原理。圖 式的目的旨在以圖型方式例示本發明實施例的主要特徵。圖式並不是用來顯示實際上的範例的全部特徵,也不是用來表示其中各個元件之相對尺寸,或其比例。 The attached drawings are incorporated into the specification of this patent and become a part of it. They are used to illustrate the embodiments of the present invention, and are used together with the description of the case to illustrate and demonstrate the principle of the present invention. picture The purpose of the formula is to illustrate the main features of the embodiments of the present invention in a graphical manner. The drawings are not used to show all the features of the actual example, nor are they used to show the relative sizes or proportions of the various components.
圖1,圖1A和圖1B顯示本發明使用雙模式移動載具形成薄膜塗層的模組化系統的實施例。 Fig. 1, Fig. 1A and Fig. 1B show an embodiment of a modular system for forming a thin film coating using a dual-mode mobile carrier according to the present invention.
圖2A顯示本發明雙模式移動基板載具的一個實施例,而圖2B顯示用於圓形基板的基板保持器。 Fig. 2A shows an embodiment of the dual-mode mobile substrate carrier of the present invention, and Fig. 2B shows a substrate holder for a circular substrate.
圖3A-3B及圖3D顯示本發明配置用於處理半導體晶圓的架構的實施例,而圖3C則顯示本發明用於在系統的一端附接處理模組的實施例。 3A-3B and FIG. 3D show an embodiment of the structure of the present invention configured for processing semiconductor wafers, and FIG. 3C shows an embodiment of the present invention for attaching a processing module to one end of the system.
以下將參照附圖說明本發明用於沉積薄膜的複合系統架構的實施例。不同的實施例或其組合可以提供在不同的應用中或實現不同的優點。根據所要實現的結果,可以將本發明不同技術特徵全部或部分利用,也可以單獨使用或與其他技術特徵結合使用,從而在需求與限制之間,求得平衡的優點。因此,參考不同的實施例可能會突顯特定的優點,但本發明並不限於本發明實施例。也就是說,本發明技術特徵並不限於應用在所描述的實施例,而是可以與其他技術特徵「組合和配合」,並結合在其他實施例中。 Hereinafter, embodiments of the composite system architecture for depositing thin films of the present invention will be described with reference to the accompanying drawings. Different embodiments or combinations thereof may provide in different applications or achieve different advantages. According to the result to be achieved, the different technical features of the present invention can be used in whole or in part, or can be used alone or in combination with other technical features, so as to achieve a balanced advantage between requirements and limitations. Therefore, referring to different embodiments may highlight specific advantages, but the present invention is not limited to the embodiments of the present invention. That is to say, the technical features of the present invention are not limited to be applied to the described embodiments, but can be "combined and matched" with other technical features and combined in other embodiments.
本發明的實施例提供適於在真空處理系統中,高速沉積薄膜層的兩個重要元件:一是真空系統的架構,另一個是晶圓裝載系統的架構。以下先說明該真空系統架構,接著說明該裝載系統架構。 The embodiment of the present invention provides two important components suitable for high-speed deposition of thin film layers in a vacuum processing system: one is the architecture of the vacuum system, and the other is the architecture of the wafer loading system. The following describes the vacuum system architecture first, and then the loading system architecture.
本發明的實施例提供一種系統架構,該系統架構能夠在第一載具移動模式下傳送基板,以在通過型連續處理區段內,對基板進行連續的處理。並提供一種機構,可在第二載具移動模式下,將載具從通過型連續處理區段中移出。在任一載具移動模式中,載具都是自由在軌道上運行。但是在不同載具移動模式中,施加到載具上以使載具在軌道上運行的動力不同。當在載具位在該通過型連續處理區段內時,所有載具都一致地移動,但是在離開該通過型連續處理區段之後,載具可以獨立地移動。 Embodiments of the present invention provide a system architecture capable of transferring substrates in a first carrier movement mode, so as to continuously process the substrates in a through-type continuous processing section. It also provides a mechanism to move the carrier out of the continuous processing section in the second carrier movement mode. In any vehicle movement mode, the vehicle is free to run on the track. However, in different vehicle movement modes, the power applied to the vehicle to make the vehicle run on the track is different. When the carriers are located in the through-type continuous processing section, all the carriers move in unison, but after leaving the through-type continuous processing section, the carriers can move independently.
以下將參照圖1並結合圖2A和2B,說明本發明第一實施例。圖1顯示本發明系統的俯視示意圖,而圖2A顯示載具,圖2B顯示用來替換圖2A載具的基板保持器。圖2B的架構特別適合用來處理半導體基板。 Hereinafter, the first embodiment of the present invention will be described with reference to FIG. 1 in conjunction with FIGS. 2A and 2B. Fig. 1 shows a schematic top view of the system of the present invention, Fig. 2A shows a carrier, and Fig. 2B shows a substrate holder used to replace the carrier of Fig. 2A. The architecture of FIG. 2B is particularly suitable for processing semiconductor substrates.
在圖1中,系統100由一個大氣區段105,一個裝卸載區110和一個真空區段115組成。在大氣區段105中裝載和卸載載具,載具是經由裝卸載區110,在大氣區段105和真空區段115之間傳送。基板是在真空區段115內部進行加工處理。該真空區段115形成一個通過型連續處理區段。在本實施例中顯示四個處理室120A-120D,但是應用上可以提供任何數量的處理室,詳情將在下面進一步說明。每個處理室120A-120D都可以是蝕刻腔室,濺鍍腔室,離子注入腔室等中的一種。如圖所示,在該實施例中,處理室連接到共同的真空環境,各處理室之間沒有閥門。各處理室均建置成用以進行連續的通過型處理。如果是用來製造MRAM,則這些處理室可以是磁控濺鍍腔室,其靶材具有不同的材質,,例如鈷(Co),鉭(Ta),鉑(Pt),釕(Ru),或是合金,例如鈷鐵硼(CoFeB),用於形成磁性層。
In FIG. 1, the
在三個區段105、110和115中提供多數單軌區段125,以使基板載具能夠行經所有三個區段。在通過型連續處理區段115內部的單軌區段形成一個跑道形單軌127,在裝卸載區的單軌區段形成直線軌道128A和128B,穿過整個裝卸載區110,並部分延伸進入大氣區段105且部分延伸進入真空區段,而在該大氣區段105內的單軌區段則形成彎曲的月牙狀迴轉軌道129。環形輸送帶130設置在通過型連續處理區段115內部的旋轉鼓131A和131B上,環形輸送帶130具有多數驅動叉132,附接至該環形輸送帶130。在直線軌道的旁邊設有多數動力輪135,在大氣區段設有旋轉輪137,其上也附有驅動叉132。
A plurality of single-
在通過型連續處理區段115的內部提供兩個軌道轉換器140,其放大圖提供在圖1的放大圖中。軌道轉換器包括工作台141,在該工作台上提供兩個軌道段,即彎曲軌道段142和直線軌道段144。軌道轉換器可在如圖1中的雙頭箭頭所示的兩個位置之間移動。軌道轉換器位在一個位置時,彎曲軌道段對準跑道形單軌127,使得載具可以在真空區段內沿著跑道連續移動,以在腔室120A-120D中連續處理基板。當基板完成真空室中的處理後,該軌道轉換器移動到第二位置。在該位置,該軌道轉換器上的直線軌道將直線軌道128A和128B與跑道形單軌127的直線區段互相連接,使得真空室中的載具可以退出真空室,進入裝卸載區,而裝卸載區內的載具則可進入該真空區段。
Two
在圖2A中顯示基板載具150的實施例。在該實施例中,載具150具有基座152和基板保持器154。基板保持器154可從基座上拆卸下來,從而能夠用來處理不同形狀和數量的基板。例如,圖2A所示的保持器154可以用來保持形成三階層的正方形或矩形基板,而圖2B所示的保持器154’則可用來保持圓形的基板,例如半導體晶圓。在本發明一種特別適合用來製造MRAM的實施例中,
保持器154’可包括靜電吸盤157。替代的做法或額外的選用,可使保持器154’可選的包括支撐銷159,用來接合晶圓的外圍。同時,保持器的平面相對於水平面傾斜一個角度θ。在圖中的實施例中,該角度是150。
An embodiment of the
如圖2A所示,基座152還包括滾輪裝置153,用來接合單軌125,並在其上運行。該滾輪裝置未動力化,並且可以包括多數自由旋轉的轉輪,使得基座可以自由在單軌上運行。動力來自與驅動桿156接合的動力輪135,或與驅動銷158接合的驅動叉132。
As shown in FIG. 2A, the
以下說明在系統100中執行基板加工處理的示例。空的載具先傳送到裝卸載區160,在此將該滾輪裝置153接合直線軌道128A,且將動力輪135接合到驅動桿156。將未經處理的基板裝載到基板保持器154上。同時,可以從位於卸載站161處的另一個載具移除處理過的基板。一旦完成裝載和卸載,則打開裝卸載區的裝載站160中的入口閘閥EN。可選的步驟是也打開裝卸載區的卸載區段161的出口閘閥EX。裝載用裝卸載區的入口閘閥EN保持關閉狀態。同樣,如果卸載區段的出口閘閥打開,則其入口閘閥也須關閉。在本發明一些實施例中,兩個裝卸載區為互相獨立,以如虛線顯示的隔板170分隔,使得每個裝卸載區可彼此獨立地保持真空。在這種情況下,當將未經處理的基板裝載到裝載用裝卸載區中時,可以將處理過的載具從真空區段裝載到卸載用裝卸載區161中。但請注意,入口閘閥和出口閘閥是相對於載具行進方向所做的區別標識,但事實上入口閘閥和出口閘閥的結構相同。換言之,如果行進方向翻轉,則入口閘閥和出口閘閥的名稱也將彼此對調。
Hereinafter, an example of performing substrate processing processing in the
在上述狀態下將動力輪135通電,以使裝載站中的基板載具移動到相應的裝卸載區,同時另一個裝卸載區內的基板載具可以移動到大氣區段105
及/或使經過處理的基板載具可以移入卸載用裝卸載區。但是請注意,這些操作並非必須同時執行。替代的方式包括可以在時間上分開進行裝載,因此只須打開帶有未經處理的基板的載具的入口閘閥,以將其移動到裝卸載區中,但這時在卸載區段中的動力輪並不通電。換言之,直線軌道區段中的動力輪可以個別或成組通電,使得只有一部分動力輪具有動力。而且,如果各裝卸載區是獨立運作,亦即具有獨立的專用泵浦裝置時,則各個閘閥也可以獨立通電,使得加載和卸載不需要同步。當然,為了提高操作效率,同步操作是較好的做法。
In the above state, the
在本發明一種實施例中,該裝卸載區維持共同的真空環境並且以共同的泵浦抽真空。亦即,移除該隔板170,使閘閥以同步操作。例如,裝載用裝卸載區的閘閥EN就與卸載用裝卸載區的閘閥EX一起操作,而加載用裝卸載區的閘閥EX則與卸載用裝卸載區的閘閥EN一起操作。
In an embodiment of the present invention, the loading and unloading area maintains a common vacuum environment and is evacuated by a common pump. That is, the
當載具進入裝卸載區後,關閉入口閘閥並抽真空。如果是已處理的載具從出口裝卸載區中移出,則也須抽氣至真空狀態。當達到適當的真空程度時,打開加載用裝卸載區的出口閘閥EX,並對適當的動力輪通電,以將載具移動到真空區段115中。這時,軌道轉換器140移動到使直線軌道段144與跑道形單軌127的直線區段對準的位置。因此,當動力輪通電,將載具移動到真空區段時,載具會進入跑道迴圈中,驅動叉當中的一個會與驅動銷158接合。其後,將軌道轉換器140移動到另一個位置,在該位置使彎曲軌道段142與跑道形單軌127的直線區段對準。當軌道轉換器140在此位置時,載具是以環形輸送帶130傳動,而不是動力輪135。此外,在這種情況下,隨著環形輸送帶的旋轉,載具將根據需要沿著跑道形進所需次數的迴圈,直到可以退出基板處理區段為止。因此,
可以根據需要在腔室120A-120D中的每個腔室對載具上的基板重複進行所需次數的加工處理。
When the carrier enters the loading and unloading area, close the inlet gate valve and evacuate. If the processed vehicle is removed from the outlet loading and unloading area, it must also be evacuated to a vacuum state. When an appropriate degree of vacuum is reached, the outlet gate valve EX of the loading and unloading area is opened, and the appropriate power wheel is energized to move the carrier into the
當基板處理完成時,卸載區段的軌道轉換器140移至使直線軌道段144與跑道形單軌127的直線區段對準的位置。隨著環形輸送帶繼續旋轉,載具移動到軌道轉換器140上並從原驅動叉上脫離,同時驅動桿156會接合動力輪135。然後可以對動力輪通電,以將載具移出跑道的迴圈。
When the substrate processing is completed, the
可以看出,在以上所描述的實施例中,載具具有兩種移動模式,即接合在動力輪,在直線軌道上移動的模式,以及接合在驅動叉上,在跑道迴圈及在大氣返回迴圈ARC中移動的模式。當位在跑道中時,驅動叉接合環形輸送帶,而當位在大氣返回迴圈中時,驅動叉則是接合在驅動輪上。此外,軌道轉換器是用於將載具引入跑道或從跑道中移出。軌道轉換器位在第一位置時,可使載具能夠無端點地繞跑道移動,而軌道轉換器位在第二位置時,則可以將載具引入跑道或從跑道中移出。 It can be seen that in the embodiment described above, the vehicle has two modes of movement, namely the mode of engaging on the power wheels, moving on a straight track, and engaging on the drive fork, looping on the runway and returning in the atmosphere. Loop the mode of movement in ARC. When in the racetrack, the drive fork engages the endless conveyor, and when in the atmosphere return loop, the drive fork engages the drive wheels. In addition, the orbit converter is used to introduce or remove vehicles from the runway. When the orbit converter is in the first position, the vehicle can move around the runway without an endpoint, and when the orbit converter is in the second position, the vehicle can be introduced into or removed from the runway.
如前所述,本發明的系統適於包括所需多數量的處理室。在圖1A中顯示一種實例。圖1A中所示的實例與圖1中所示的實例相似,且相似的元件是以相同的元件符號表示。兩者的主要區別在於圖1A的系統包括六個處理室120A-120F,其餘的所有元件都可能與圖1相同。圖1A是用來說明本發明體系結構的多用途性。
As previously mentioned, the system of the present invention is suitable for including as many processing chambers as required. An example is shown in Figure 1A. The example shown in FIG. 1A is similar to the example shown in FIG. 1, and similar elements are denoted by the same element symbols. The main difference between the two is that the system in FIG. 1A includes six
圖1B顯示本發明一種具有六個處理室的實施例的外觀視圖,在該視圖中可見處理室120A-120C。與前述相同,該系統是由三個區段組成:即大氣區段105,裝卸載區110和真空區段115。該真空區段115包括真空外罩163和附於其上的處理室。在圖式中,維修出入窗口166、167和168顯示為打開狀態,以實
現真空外罩內部的可視化。例如,可以分別從維修出入窗口166和168看到旋轉鼓131A和131B。通過維修出入窗口167可以看到跑道形單軌127和環形輸送帶130的一部分。
FIG. 1B shows an external view of an embodiment of the present invention having six processing chambers, in which
在圖1B的示例中,處理室120B顯示成處於打開狀態,從而易於通過處理窗口172進出處理室和真空外罩內部其他處所。具體而言,在該示例中,處理室120A-120C經由可轉動的鉸鏈171(從圖1B的視圖中無法看到,但顯示在圖1A中)附接到真空外罩163。當腔室120B以其鉸鏈為軸轉動後,會從該腔室的位置暴露真空外罩163的內部,圖中顯示負載四個基板的載具150。
In the example of FIG. 1B, the
以上所述的架構提供一種基板處理系統,該系統具有大氣區段105;裝卸載區110;與真空區段115,該真空區段115具有多數連接到其上的處理室120。載具傳送機構包括:單軌,形成為:第一單軌段127形狀為跑道形狀,並配置於該真空區段內;第二單軌區段具有兩條平行的直線單軌128A和128B,配置於該裝卸載區內,並且延伸到該大氣區段與該真空區段;以及第三彎曲單軌區段,呈月牙狀迴轉軌道129形狀,配置在該大氣區段中,其一端與該直線單軌之一的延伸相接,另一端與另一直線單軌的延伸相交接;以及環形輸送帶130,設置在該跑道上並具有:多數驅動叉132附接其上;驅動輪137,配置在該大氣區段,並有多數驅動叉132連接其上;多數動力輪135,沿該第二單軌區段配置;以及兩個軌道轉換器140,位於該第一單軌段的一端,每個軌道轉換器140具有可動工作台141,一個直線單軌區段144位在該工作台上,以及一個彎曲單軌段142,也位在該工作台上。
The above-mentioned architecture provides a substrate processing system which has an
多數載具支持待處理的基板,每個載具具有基座152;多數自由旋轉的轉輪153,該自由旋轉輪153附接至該基座並構造成可接合該單軌,以使
載具自由在該單軌上運行;驅動桿156,附接至該基座,並建構成可與該多數動力輪135接合,以便在載具位於該第二單軌區段上時可移動該載具;以及驅動銷158,附接至該基座並構造成可與該驅動叉132接合,以在載具位於該第一或第三單軌區段時,可移動該載具。
Most carriers support the substrate to be processed, and each carrier has a
當軌道轉換器位於該第一位置時,該彎曲單軌區段與第一單軌段對準,從而使得驅動叉可驅動載具沿第一單軌段連續移動。且當軌道轉換器位於該第二位置時,其上的直線單軌區段可將第一單軌段連接到第二單軌段,從而使載具在裝卸載區和真空區段之間進行轉移。 When the track switch is in the first position, the curved monorail section is aligned with the first monorail section, so that the drive fork can drive the carrier to move continuously along the first monorail section. And when the track switch is in the second position, the linear monorail section on it can connect the first monorail section to the second monorail section, so that the carrier can be transferred between the loading and unloading area and the vacuum section.
在本發明的處理系統中用於處理基板的方法可以包括以下步驟:將基板裝載到載具上;以傳送軌道將載具傳送到裝卸載區中;在裝卸載區內抽真空;在傳送軌道上將載具傳送到具有多數處理室的處理封閉體中;操作軌道轉換器使其位於第一位置,以在該傳送軌道和處理軌道之間形成連接,接著使載具在軌道轉換器上移動,並藉此移動到處理封閉體內的處理軌道上;操作軌道轉換器使其位於第二位置,以將處理軌道與傳送軌道分開;在對處理室通電的同時,使載具在處理軌道上連續移動;及,在完成基板處理後,操作該軌道轉換器使其位在該第一位置,將處理軌道上的載具傳送到傳送軌道。其中,該連續移動載具的步驟可以包括例如通過將多數載具連接至環形輸送帶,而使多數載具一致地連續移動的步驟。 The method for processing a substrate in the processing system of the present invention may include the following steps: loading the substrate on a carrier; transferring the carrier to the loading and unloading area by a transfer track; vacuuming in the loading and unloading area; The carrier is transferred to the processing enclosure with a plurality of processing chambers; the rail switch is operated to be located in the first position to form a connection between the transfer rail and the processing rail, and then the carrier is moved on the rail switch , And move to the processing track in the processing enclosure; operate the track switch to be located in the second position to separate the processing track from the conveying track; while energizing the processing chamber, make the carrier continuous on the processing track Move; and, after the substrate processing is completed, operate the track switch to position it in the first position, and transfer the carrier on the processing track to the transfer track. Wherein, the step of continuously moving the carriers may include, for example, a step of making the plurality of carriers uniformly and continuously move by connecting the plurality of carriers to an endless conveyor belt.
以上所說明的系統通用架構可以應用於加工處理各種基板。但根據本發明的另一面向,為要加工處理半導體晶圓,例如於製造MRAM時,該系統需要重新配置,以使系統可以容易地因應需求調整,應用於通常稱為晶圓廠的晶圓製造設施中。在晶圓廠中,晶圓是放在FOUP(Front Opening Universal Pod,前方開口通用盒)中傳輸。FOUP是一種專門設計的盒子,每個盒子可以容納多個晶圓。以下的說明內容提供將晶圓從FOUP傳輸到本發明處理系統中的機制。 The general architecture of the system described above can be applied to processing various substrates. However, according to another aspect of the present invention, in order to process semiconductor wafers, for example, when manufacturing MRAM, the system needs to be reconfigured so that the system can be easily adjusted to meet requirements and applied to wafers commonly referred to as fabs. In the manufacturing facility. In the fab, the wafer is placed in FOUP (Front Opening Universal Pod, universal box with front opening). FOUP is a specially designed box, each box can hold multiple wafers. The following description provides a mechanism for transferring wafers from the FOUP to the processing system of the present invention.
圖3A顯示本發明一種實施例,該實施例建置以應用於加工處理半導體晶圓。該實施例特別適用於在矽晶圓上製造MRAM的磁性層,但也可以應用於在標準圓形矽晶圓上製造其他裝置。以下先說明在圓形矽晶圓上製造薄層的三個潛在困難,以及本發明的實施例解決這些困難的方案。 FIG. 3A shows an embodiment of the present invention, which is configured to be applied to processing semiconductor wafers. This embodiment is particularly suitable for manufacturing the magnetic layer of MRAM on a silicon wafer, but can also be applied to manufacturing other devices on a standard round silicon wafer. The following first describes three potential difficulties in manufacturing thin layers on circular silicon wafers, and the solutions of the embodiments of the present invention to solve these difficulties.
製造磁性層時,如果遭到汙染,別是水蒸氣汙染,將嚴重影響成品的品質。因此,本發明的實施例是設計成使系統的晶圓傳送機構任何部分都不離開真空環境。這種設計確保載具不會進入大氣環境中遭受污染。此外,由於形成磁性層需要濺鍍,可能引起顆粒污染。因此在本發明系統內部,晶圓行進時晶圓表面是朝向接近垂直的方向,從而降低顆粒污染的可能性。由於晶圓為圓形,且只能從其外圍邊緣固定,因此本發明將晶圓以垂直朝向保持在系統內部,其實會提高晶圓從載具上脫落的風險。因此,本發明的實施例中要求當晶圓位在系統內部時,晶圓是以接近垂直的方向保持在載具上。在本發明的實施例中,所謂接近垂直的朝向是指晶圓保持與垂直方向成5-20度傾斜。這種設計除可減少污染的可能性外,還會降低晶圓從載具脫落的可能性。 When manufacturing the magnetic layer, if it is contaminated, not because of water vapor contamination, it will seriously affect the quality of the finished product. Therefore, the embodiment of the present invention is designed so that no part of the wafer transfer mechanism of the system leaves the vacuum environment. This design ensures that the vehicle will not enter the atmosphere and be polluted. In addition, since the formation of the magnetic layer requires sputtering, particle contamination may be caused. Therefore, in the system of the present invention, the surface of the wafer faces a nearly vertical direction when the wafer is traveling, thereby reducing the possibility of particle contamination. Since the wafer is round and can only be fixed from its peripheral edge, the present invention keeps the wafer in the system in a vertical orientation, which actually increases the risk of the wafer falling off the carrier. Therefore, the embodiment of the present invention requires that when the wafer is located inside the system, the wafer is held on the carrier in a nearly vertical direction. In the embodiment of the present invention, the so-called near-vertical orientation means that the wafer is kept inclined at 5-20 degrees from the vertical. In addition to reducing the possibility of contamination, this design also reduces the possibility of wafers falling off the carrier.
在圖3A中,與圖1到1B中的元件相似的元件,是以相同的元件符號表示。其中,標示為Vac 115的通過型連續處理區段與圖1到1B中的元件Vac 115類似。然而,裝載晶圓進入該通過型連續處理區段115的真空環境中的配置,則不相同。
In FIG. 3A, elements similar to those in FIGS. 1 to 1B are denoted by the same element symbols. Among them, the through-type continuous processing section labeled
如前所述,晶圓在通過型連續處理區段115內行進時,晶圓表面是朝向接近垂直的方向。但是,晶圓廠中的FOUP是將晶圓以水平朝向放置。因此,要以本發明處理半導體晶圓時,除了須將晶圓傳送進入處理系統的真空環境中之外,還需要將晶圓旋轉到接近垂直的朝向。該目的可以如下方式實現。
As mentioned above, when the wafer travels in the through-type
晶圓由機械手臂312從FOUP 300中取出,並重新放置到FOUP 300中。在本發明實施例中,機械手臂312是SCARA(Selective Compliance Assembly Robot Arm,選擇性依從性裝配機械手臂)機械手臂,其端部執行器314通過可旋轉腕部316耦接到機械手臂。可旋轉腕部316使端部執行器314能夠將晶圓從水平朝向轉到垂直朝向,反之亦然。在本文中所稱的「端部執行器」是指其業界普遍接受的含義,即機械手臂的最後一個連結單元,並與工件(在本實施例為晶圓)相互作用的部分。雖然也可以使用任何常規的端部執行器,但是在本發明實施例中,該端部執行器可以是衝擊性的(物理性從其外圍邊緣抓住晶圓)或約束性的(使用吸引力,例如真空或磁/電吸引力從背面保持晶圓)。
The wafer is taken out of the
因此,在將未處理的晶圓裝載到系統中時,端部執行器是將晶圓以水平朝向從FOUP 300中移出。在該SCARA機械手臂轉向時,轉動其腕部316,以將晶圓的朝向從水平轉到垂直或接近垂直,即從垂直方向傾斜0到20度的角度。接著打開閘閥IN,以機械手將晶圓放置到位在裝卸載區/交換腔室LL/EX 305內的晶圓保持模組302上。將晶圓以垂直或接近垂直的朝向,即從垂直方向傾斜0到20度的角度,放置在晶圓保持模組302的晶圓保持器304上。然後使機械手臂312回縮並且關閉閘閥IN。然後可以在裝卸載區/交換腔室LL/EX 305內抽真空。抽真空完成後,將傳送載具150移動到裝卸載區/交換腔室LL/EX 305的裝載位置,並從晶圓保持器304將晶圓移送到傳送載具150上。
Therefore, when loading unprocessed wafers into the system, the end effector removes the wafers from the
如圖所示,在本發明一些實施例中,載具150具有基板保持器154’。該基板保持器154’包括靜電吸盤157。在這種實施例中,該基板處理方法進行到以該端部執行器將晶圓放置到該晶圓保持器304中時,該晶圓的朝向是使晶圓的裝置側面面向晶圓保持器304,晶圓的背面面向遠離保持器304的方向。然後,當載具進入裝卸載區305時,將靜電吸盤通電,以從晶圓的背面將晶圓吸附到基板保持器154’。
As shown in the figure, in some embodiments of the present invention, the
在該實施例中,晶圓保持模組302具有可伸縮晶圓保持器304,該可伸縮晶圓保持器304在第一位置和第二位置(即,伸出位置和回縮位置)之間水平移動。一個位置用於與機械手臂312交換晶圓,而另一位置用於與載具150交換晶圓。另外也是以一個位置用於接收晶圓(在裝載未處理的基板時,從機械手臂接收晶圓,在卸載已經處理的晶圓時,從載具接收晶圓),而另一個位置是用於發配晶圓(在裝載未處理基板時,將晶圓發配到載具,在卸載已處理的基板時,則將晶圓發配到機械手臂)。
In this embodiment, the
取決於所使用的特定架構,可以將載具150從不同的位置,通過不同的方法和路線,移動到裝卸載區305內的裝載位置。在圖3A所示的實例中,可通過轉盤322的轉動,將載具150移動到該裝載位置。如此可將載具150從卸載位置移動到裝載位置。但在本發明另一個實例中,即如圖3B所示,傳輸載具15是從傳送室TR310移動到裝卸載區/交換室LL/EX 305的裝載位置。反之,在本發明另一個實例中,即如圖3C所示,就不使用轉盤將傳輸載具150移動到該裝載位置。
Depending on the specific architecture used, the
轉盤322包括直線軌道部分321,直線軌道部分321使載具能夠從直線軌道128A和128B進出轉盤322。轉盤322也可以具有類似於轉輪135的動力輪,以使載具能在直線軌道部分321上作直線運動。
The
在將未經處理的晶圓裝載到傳輸載具150之後,將載具150移動到傳送室310中,之後可以關閉閘閥EN,進行另一個裝載循環。在關閉閘閥EN之後,可以打開閘閥EX,並將載具150移動進入通過型連續處理區段115。然後進行晶圓的加工處理,如以上關於本發明任何實施例的說明所述,其中該載具進入跑道形單軌,並根據需要在跑道內移動所需的迴圈數。
After the unprocessed wafers are loaded on the
無庸贅言,卸載當然是與前述相反的操作。負載經過加工處理的晶圓的載具進入傳送室310,由此移動到轉盤322上的卸載位置,在此將晶圓裝載到晶圓保持器304上。然後將空的載具移動到裝載位置,以接收未經處理的新晶圓。同時,SCARA機械手臂用於將晶圓從晶圓保持器304中移出,再將晶圓放置到FOUP 300中。
Needless to say, uninstalling is of course the opposite of the aforementioned operation. The carrier carrying the processed wafers enters the
綜合以上可知,本發明提供一種晶圓裝載系統,該系統包括:機械手臂,該機械手臂具有通過旋轉腕部聯接至該機械手臂的端部執行器;一個裝卸載室,具有晶圓保持模組,可致動晶圓保持器;傳送室,鄰近該裝卸載室;閘閥,位於該裝卸載室與該傳送室之間;軌道,穿越該裝卸載室和該傳送室;及晶圓載具,可在該軌道上運行,並建置成可與晶圓保持器交換晶圓。該晶圓裝載系統還可以包括轉盤,該轉盤具有位於其上的軌道部分,用以接收載具。該轉盤可以進一步包括動力輪,以在該直線軌道部分上移動載具。該載具可以建置成可自由在該軌道上運行,並由該動力輪驅動。該載具可以進一步包括靜電吸盤。 Based on the above, the present invention provides a wafer loading system, which includes: a robotic arm having an end effector connected to the robotic arm through a rotating wrist; a loading and unloading chamber having a wafer holding module , Can actuate the wafer holder; transfer chamber, adjacent to the loading and unloading chamber; gate valve, located between the loading and unloading chamber and the transfer chamber; rail, passing through the loading and unloading chamber and the transfer chamber; and wafer carriers, which can be It runs on this track and is built to exchange wafers with wafer holders. The wafer loading system may further include a turntable having a track portion on the turntable for receiving a carrier. The turntable may further include a power wheel to move the carrier on the linear track portion. The vehicle can be built to run on the track freely and driven by the power wheel. The carrier may further include an electrostatic chuck.
如果要將傳輸載具從卸載位置移動到裝載位置,只要將該傳輸載具從該卸載位置移動回到該通過型連續處理區段115中,再以該環形輸送帶130移動該傳輸載具在該跑道繞行,再退出到該裝卸載區,即可達成。然而,在本發明實施例中,則是利用例如轉盤322來避免這種繁複的傳送過程。在圖3A所示的實施例中,轉盤322是定位在裝卸載室內部。但是,該轉盤322也可以配置在該系統的其他腔室中,也可以完全取消,如下所述。
If you want to move the transport carrier from the unloading position to the loading position, you only need to move the transport carrier from the unloading position back to the through-type
圖3B顯示本發明另一種建置用以處理半導體晶圓的實施例。圖3B的實施例類似於圖3A的實施例,不同之處是轉盤322位於裝卸載室和傳遞室的外部。在該示例中,轉盤位於傳送室310與處理區段115之間,即在傳送室與跑道區段之間。在本發明另一個實施例(未示出)中,轉盤322可以配置在傳送室TR310的內部。
FIG. 3B shows another embodiment of the invention for processing semiconductor wafers. The embodiment of FIG. 3B is similar to the embodiment of FIG. 3A, except that the
因此,該晶圓裝載系統可進一步包括轉盤,該轉盤上具有直線軌道部分。一種替代的做法是,該處理室可以進一步包括轉盤,該轉盤上具有直線軌道部分。另一種替代的做法是,具有直線軌道部分的轉盤可以配置在處理室和晶圓裝載系統之間。 Therefore, the wafer loading system may further include a turntable having a linear track portion on the turntable. An alternative approach is that the processing chamber may further include a turntable having a linear track portion on the turntable. Another alternative is that a turntable with a linear track portion can be arranged between the processing chamber and the wafer loading system.
以上所說明任何實施例都可以耦接到其他處理腔室和/或系統。圖3C就提供一個此種應用的實例。為清楚顯示起見,圖3C中並不顯示裝載區段的元件,但以上所描述的任何實施例所述的裝載區段,都可以用來將基板裝載到該系統中。 Any of the embodiments described above can be coupled to other processing chambers and/or systems. Figure 3C provides an example of such an application. For the sake of clarity, the components of the loading section are not shown in FIG. 3C, but the loading section described in any of the embodiments described above can be used to load the substrate into the system.
轉盤323配置跑道形外側,位在該裝載側相對的側端上。轉盤323是建構成從跑道接收傳輸載具,並將傳輸載具傳送到附接的處理室或處理系統(例如,傳統的主機型處理系統)上。在圖3C的圖式中,任何標示326的元件都
可以指示這種處理室或處理系統,例如大型主機。可以使用軌道轉換器140A配置,將載具150從跑道形單軌127轉移到轉盤323上;該軌道轉換器140A類似於相對側上的軌道轉換器140配置。轉盤323包括用於接收載具的直線軌道部分321,並且還可以包括用於驅動載具在直線軌道部分321上移動的動力輪135。
The
在圖3C中還顯示一種具有不同結構的轉盤。該轉盤可以用於任何本發明實施例中,並且也可以僅僅稱為轉盤。具體而言,轉盤327是具有輪輻329的輪轂328的結構。直線軌道區段331附接到每個輪輻329的端部。每個直線軌道區段331適合於形成軌道128的延續。
Fig. 3C also shows a turntable with a different structure. The turntable can be used in any embodiment of the present invention, and can also be simply referred to as a turntable. Specifically, the
在圖3A-3C的實施例中顯示裝載和卸載分開的配置,並以轉盤將載具從卸載側移送到裝載側。但是,這種設計並非任何技術限制,因為也可以使用單一配置,包含裝載側和卸載側。如果加工處理程序留有足夠時間,就可以使用單一的裝載/卸載兩用裝置來卸載加工晶圓,然後裝載新晶圓。在圖3D中提供一個這種設計的實例。在裝卸載區305清空之後,閘閥EN打開,可以將在傳送室310中等待,負載已處理晶圓的載具150移送到裝卸載區305中。然後將已經處理的晶圓從載具150移送到晶圓保持器304。之後可以將載具送回到傳送室310,並且關閉閘閥EN。使該裝卸載區回至大氣壓,將閘閥IN打開,以使機械手臂312從保持器取出處理過的晶圓304,然後放入一個未經處理的晶圓在保持器304中。該閘閥IN隨後關閉,並將裝卸載區305抽真空。其後將閘閥EN打開,並且將載具150移回到裝卸載區,從晶圓保持器304取出未經處理的晶圓,其後,該載具返回到傳送室,並將閘閥EN關閉。隨後打開閘閥EX,就可以經由軌道轉換器140將該載具移動到跑道形單軌127上。
In the embodiment of FIGS. 3A-3C, a separate configuration of loading and unloading is shown, and the carrier is moved from the unloading side to the loading side with a turntable. However, this design is not any technical limitation, because a single configuration can also be used, including the loading side and the unloading side. If enough time is left for the processing procedure, a single loading/unloading device can be used to unload the processed wafers and then load new wafers. An example of this design is provided in Figure 3D. After the loading and
應當理解的是,本說明書所描述的程序和技術並非必然與任何特定裝置相關,並且可以通過各種元件的任何合適的組合來實現。此外,可以根據本說明書的教導,使用各種類型的通用設備達成本發明。本發明已經根據具體的實施例描述如上,但說明內容無論如何都只是在說明,而不是用來限制本發明。本領域技術人員都可理解,許多不同的組合方式都可適用於實施本發明。 It should be understood that the programs and techniques described in this specification are not necessarily related to any specific device, and can be implemented by any suitable combination of various elements. In addition, according to the teaching of this specification, various types of general-purpose devices can be used to achieve the invention. The present invention has been described above according to specific embodiments, but the content of the description is only for illustration in any case, and is not used to limit the present invention. Those skilled in the art can understand that many different combinations are suitable for implementing the present invention.
此外,只要閱讀本件專利說明書並實踐說明書所記載的發明,本發明的其他實施方式對於此行業人士即屬顯而易見,而能推知。所述的實施例中的各種面向及/或元件可以單獨使用,也可以任何組合方式使用。因此,本專利說明書及其實施例的說明,目的僅是示例,不得用以限制本發明之範圍。本發明的真實範圍應由以下的申請專利範圍所規範。 In addition, as long as you read this patent specification and practice the invention described in the specification, other embodiments of the present invention are obvious to those in the industry and can be inferred. The various aspects and/or elements in the described embodiments can be used alone or in any combination. Therefore, the description of this patent specification and its embodiments are only examples and should not be used to limit the scope of the present invention. The true scope of the present invention should be regulated by the following patent application scope.
100:系統 100: System
105:大氣區段 105: Atmospheric section
115:真空區段即通過型連續處理區段 115: Vacuum section that is through continuous processing section
120A-120D:處理室 120A-120D: processing room
127:跑道形單軌即第一單軌段 127: Racetrack-shaped monorail is the first monorail section
128A、128B:直線軌道 128A, 128B: straight track
130:環形輸送帶 130: endless conveyor belt
131A、131B:旋轉鼓 131A, 131B: rotating drum
132:驅動叉 132: Drive fork
135:動力輪 135: Power Wheel
140:軌道轉換器 140: track converter
152:基座 152: Pedestal
154’:保持器 154’: Retainer
300:前方開口通用盒 300: Universal box with front opening
302:晶圓保持模組 302: Wafer holding module
304:晶圓保持器 304: Wafer Holder
305:裝卸載區/交換腔室LL/EX 305: Loading and unloading area/exchange chamber LL/EX
310:傳送室 310: transfer room
312:機械手臂 312: Robotic Arm
314:端部執行器 314: End effector
316:可旋轉腕部 316: Rotatable wrist
321:直線軌道部分 321: Straight track part
322:轉盤 322: Turntable
EN:入口閘閥 EN: inlet gate valve
EX:出口閘閥 EX: outlet gate valve
IN:閘閥 IN: Gate valve
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