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TWI721720B - Light source device and optical inspection system - Google Patents

Light source device and optical inspection system Download PDF

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Publication number
TWI721720B
TWI721720B TW108146785A TW108146785A TWI721720B TW I721720 B TWI721720 B TW I721720B TW 108146785 A TW108146785 A TW 108146785A TW 108146785 A TW108146785 A TW 108146785A TW I721720 B TWI721720 B TW I721720B
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light
accommodating space
source device
emitting elements
beams
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TW108146785A
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TW202125034A (en
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黃冠勳
曹語晴
余欣儒
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由田新技股份有限公司
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Priority to CN202011357685.7A priority patent/CN113008787A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
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  • Immunology (AREA)
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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A light source device adapted to provide an inspection beam is provided. The light source device includes a housing, a plurality of first light illuminating elements, and a plurality of light guiding structures. The housing has a light exiting port, and a first accommodating space. The plurality of first illuminating elements are disposed in the first accommodating space and are adapted to provide a plurality of first light beams. The plurality of light guiding structures are disposed in the first accommodating space, wherein the plurality of first illuminating elements respectively correspond to the plurality of light guiding structures, and the plurality of light guiding structures respectively guide the plurality of first light beams to be transmitted in different directions. The first light beams are transmitted out of the light exiting port to form the inspection light beam.

Description

光源裝置及光學檢測系統Light source device and optical detection system

本發明是有關於一種光源裝置及使用光源裝置的光學檢測系統,且特別是有關於一種用於量測孔狀結構的光源裝置及使用光源裝置的光學檢測系統。The present invention relates to a light source device and an optical detection system using the light source device, and more particularly to a light source device for measuring a hole-shaped structure and an optical detection system using the light source device.

自動光學檢查(Automated Optical Inspection,AOI),係運用機器視覺做為檢測標準技術,透過機器視覺取代傳統人眼辨識以達到高精密度及高效率的檢測。作為改良傳統上以人力使用光學儀器進行檢測的缺點,應用層面包括從高科技產業之研發、製造品管、國防、民生、醫療、環保、電力等領域。Automated Optical Inspection (AOI) uses machine vision as the inspection standard technology to replace traditional human eye recognition through machine vision to achieve high-precision and high-efficiency inspections. As an improvement on the shortcomings of the traditional use of optical instruments for inspection by humans, the application level includes the research and development of high-tech industries, manufacturing quality control, national defense, people's livelihood, medical treatment, environmental protection, electric power and other fields.

在光學檢測領域中,複雜表面的檢測相對平滑表面較為困難,一般可視性的複雜表面取決於影像擷取裝置的景深範圍,若是影像擷取裝置的景深足夠一般都可以克服。相對而言,針對平面不可視的缺陷(例如盲孔、穿孔的內側壁面缺陷),則是難以由傳統的光學方式(例如平面拍攝)進行檢測,這類的缺陷通常需要針對影像擷取裝置的相對位置及拍攝角度進行調整,且必須針對每一個目標區域逐一進行拍攝,以致於在進行這類的檢測時非常的耗時耗功,難以達到相應的效率。In the field of optical inspection, it is more difficult to detect complex surfaces than smooth surfaces. Generally, complex surfaces with visibility depend on the depth of field of the image capture device. If the depth of field of the image capture device is sufficient, it can generally be overcome. In contrast, for the defects that are not visible on the plane (such as blind holes, perforated inner wall surface defects), it is difficult to detect by traditional optical methods (such as plane shooting). Such defects usually need to be opposed to the image capture device. The position and shooting angle must be adjusted, and each target area must be shot one by one, so that this type of detection is very time-consuming and labor-intensive, and it is difficult to achieve the corresponding efficiency.

本發明提供一種光源裝置及光學檢測系統,可感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。The invention provides a light source device and an optical detection system, which can sense image information with different characteristics for analysis and comparison of objects to be tested.

本發明提供一種光源裝置適於提供一檢測光束。光源裝置包括一殼體、多個第一發光元件以及多個導光結構。殼體具有一出光口以及一第一容置空間。多個第一發光元件配置於第一容置空間,適於提供多個第一光束。多個導光結構配置於第一容置空間,其中多個第一發光元件分別對應於多個導光結構,且多個導光結構分別導引多個第一光束朝不同方向傳遞。多個第一光束傳遞出出光口以形成檢測光束。The present invention provides a light source device suitable for providing a detection beam. The light source device includes a housing, a plurality of first light-emitting elements, and a plurality of light guide structures. The shell has a light outlet and a first accommodating space. The plurality of first light-emitting elements are arranged in the first accommodating space and are suitable for providing a plurality of first light beams. The plurality of light guide structures are arranged in the first accommodating space, wherein the plurality of first light emitting elements respectively correspond to the plurality of light guide structures, and the plurality of light guide structures respectively guide the plurality of first light beams to pass in different directions. The multiple first light beams are passed out of the light exit to form a detection light beam.

本發明另提供一種光學檢測系統,適於測量一待測物件。光學檢測系統包括一光源裝置、一影像擷取裝置以及一處理裝置。光源裝置適於提供一檢測光束。光源裝置包括一殼體、多個第一發光元件以及多個導光結構。殼體具有一出光口以及一第一容置空間。多個第一發光元件配置於第一容置空間,適於提供多個第一光束。多個導光結構配置於第一容置空間,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。影像擷取裝置配置於經待測物件反射的檢測光束的傳遞路徑上,以擷取待測物的一影像。處理裝置電性連接於影像擷取裝置,用以影像分析待測物的影像,以獲得待測物的一檢測結果,其中第一光束傳遞出出光口以形成檢測光束。The present invention also provides an optical detection system, which is suitable for measuring an object to be tested. The optical detection system includes a light source device, an image capture device, and a processing device. The light source device is suitable for providing a detection beam. The light source device includes a housing, a plurality of first light-emitting elements, and a plurality of light guide structures. The shell has a light outlet and a first accommodating space. The plurality of first light-emitting elements are arranged in the first accommodating space and are suitable for providing a plurality of first light beams. A plurality of light guide structures are arranged in the first accommodating space, wherein the first light emitting elements respectively correspond to the light guide structures, and the light guide structures respectively guide the first light beams to pass in different directions. The image capturing device is arranged on the transmission path of the detection beam reflected by the object to be tested to capture an image of the object to be tested. The processing device is electrically connected to the image capturing device for image analysis of the image of the object to be tested to obtain a detection result of the object to be tested, wherein the first light beam is transmitted out of the light outlet to form a detection light beam.

本發明另提供一種光源裝置,適於提供一檢測光束。光源裝置包括一殼體、一導光結構、多個第一發光元件、多個第二發光元件以及一分光元件。殼體具有一出光口、一第一容置空間以及一第二容置空間。導光結構配置於第一容置空間,具有一反射曲面及一第三容置空間。多個第一發光元件配置於第三容置空間,適於提供多個第一光束至反射曲面。多個第二發光元件配置於第二容置空間,適於提供一第二光束。分光元件配置於第二光束的傳遞路徑上,其中第一光束及第二光束傳遞出出光口以形成檢測光束,且反射曲面適於反射第一光束以使傳遞出出光口的傳遞方向皆不同。The present invention also provides a light source device suitable for providing a detection beam. The light source device includes a housing, a light guide structure, a plurality of first light-emitting elements, a plurality of second light-emitting elements, and a light splitting element. The shell has a light outlet, a first accommodating space and a second accommodating space. The light guide structure is disposed in the first accommodating space, and has a reflective curved surface and a third accommodating space. The plurality of first light-emitting elements are arranged in the third accommodating space, and are suitable for providing the plurality of first light beams to the reflective curved surface. The plurality of second light-emitting elements are arranged in the second accommodating space and are suitable for providing a second light beam. The light splitting element is arranged on the transmission path of the second light beam, wherein the first light beam and the second light beam are transmitted out of the light outlet to form a detection light beam, and the reflective curved surface is suitable for reflecting the first light beam so that the transmission directions of the transmitted light outlet are different.

本發明另提供一種光學檢測系統,適於測量一待測物件。光學檢測系統包括一光源裝置、一影像擷取裝置以及一處理裝置。光源裝置適於提供一檢測光束至待測物件。光源裝置包括一殼體、一導光結構、多個第一發光元件、多個第二發光元件以及一分光元件。殼體具有一出光口、一第一容置空間以及一第二容置空間。導光結構配置於第一容置空間,具有一反射曲面及一第三容置空間。多個第一發光元件配置於第三容置空間,適於提供多個第一光束至反射曲面。多個第二發光元件配置於第二容置空間,適於提供一第二光束。分光元件配置於第二光束的傳遞路徑上。影像擷取裝置配置於經待測物件反射的檢測光束的傳遞路徑上。處理裝置電性連接於影像擷取裝置,其中第一光束及第二光束傳遞出出光口以形成檢測光束,且反射曲面適於反射第一光束以使傳遞出出光口的傳遞方向皆不同。The present invention also provides an optical detection system, which is suitable for measuring an object to be tested. The optical detection system includes a light source device, an image capture device, and a processing device. The light source device is suitable for providing a detection beam to the object to be tested. The light source device includes a housing, a light guide structure, a plurality of first light-emitting elements, a plurality of second light-emitting elements, and a light splitting element. The shell has a light outlet, a first accommodating space and a second accommodating space. The light guide structure is disposed in the first accommodating space, and has a reflective curved surface and a third accommodating space. The plurality of first light-emitting elements are arranged in the third accommodating space, and are suitable for providing the plurality of first light beams to the reflective curved surface. The plurality of second light-emitting elements are arranged in the second accommodating space and are suitable for providing a second light beam. The light splitting element is arranged on the transmission path of the second light beam. The image capturing device is arranged on the transmission path of the detection beam reflected by the object to be tested. The processing device is electrically connected to the image capturing device, wherein the first light beam and the second light beam are transmitted out of the light outlet to form a detection light beam, and the reflective curved surface is adapted to reflect the first light beam so that the transmission directions of the light transmitted through the light outlet are different.

基於上述,在本發明的光源裝置及光學檢測系統中,多個第一發光元件配置於殼體的第一容置空間,且藉由多個導光結構以提供多個第一光束,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。如此一來,對待測物件進行感測時,可藉由提供多個第一光束分別至待測物件的不同區域,以使不同區域分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,導光結構的設計可使第一發光元件進一步集中配置於殼體中延伸方向垂直於光軸方向的第一容置空間,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統中光源裝置與影像擷取裝置的工作距離。同時,這樣的設計能節省配置空間,使光源裝置的體積較小。Based on the above, in the light source device and the optical detection system of the present invention, a plurality of first light-emitting elements are arranged in the first accommodating space of the housing, and a plurality of light guide structures are used to provide a plurality of first light beams. A light-emitting element respectively corresponds to the light-guiding structure, and the light-guiding structure respectively guides the first light beam to pass in different directions. In this way, when the object to be tested is sensed, a plurality of first beams can be provided to different areas of the object to be tested, so that different areas can present different image frames respectively, and then can be sensed with different characteristics Image information for the analysis and comparison of the object under test. In addition, compared with the conventional spatial configuration of the coaxial light framework, the design of the light guide structure enables the first light-emitting elements to be further concentratedly arranged in the first accommodating space in the housing whose extending direction is perpendicular to the optical axis direction. Therefore, other components can be arranged in the space perpendicular to the optical axis direction, and the working distance between the light source device and the image capturing device in the optical detection system can be shortened. At the same time, this design can save configuration space and make the light source device smaller.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.

圖1為本發明一實施例的光學檢測系統的剖面示意圖。圖2為本發明一實施例的光學檢測系統對待測物件進行測量的部份示意圖。圖3為圖1中的光源裝置的立體示意圖。請參考圖1至圖3。為方便說明,圖3僅顯示部分的結構,並非為實體結構外觀。本實施例提供一種光學檢測系統10,適於測量一待測物件20。詳細而言,待測物件20例如為電路板,且具有孔洞結構,孔洞結構具有一底面區A1以及一側壁區A2。光學檢測系統10適於藉由光源裝置100分別提供兩種光學特性(例如是準直性、波長、光信號強度、入射角度等光學特性)相異的光至待測物件20的底面區A1以及側壁區A2,以使在感光時能讓底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件20的分析及比對。FIG. 1 is a schematic cross-sectional view of an optical detection system according to an embodiment of the present invention. 2 is a partial schematic diagram of the optical inspection system measuring an object to be tested according to an embodiment of the present invention. FIG. 3 is a three-dimensional schematic diagram of the light source device in FIG. 1. Please refer to Figure 1 to Figure 3. For the convenience of description, FIG. 3 only shows part of the structure, not the appearance of the physical structure. This embodiment provides an optical inspection system 10 suitable for measuring an object 20 to be tested. In detail, the object under test 20 is, for example, a circuit board and has a hole structure. The hole structure has a bottom surface area A1 and a side wall area A2. The optical detection system 10 is adapted to use the light source device 100 to provide two different optical characteristics (such as optical characteristics such as collimation, wavelength, optical signal intensity, incident angle, etc.) to the bottom area A1 of the object under test 20 and The side wall area A2 allows the bottom surface area A1 and the side wall area A2 to respectively present different image frames during exposure, so that image information with different characteristics can be sensed for analysis and comparison of the object 20 under test.

光學檢測系統10包括一光源裝置100、一影像擷取裝置50以及一處理裝置60。影像擷取裝置50配置於經待測物件20反射的光傳遞路徑上,用以擷取待測物件20所反射的光以獲得影像。影像擷取裝置50例如是包括電荷耦合元件(charge coupled device,CCD)或互補式金屬氧化物半導體元件(complementary metal oxide semiconductor,CMOS)等感光元件,但本發明並不限於此。The optical inspection system 10 includes a light source device 100, an image capturing device 50 and a processing device 60. The image capturing device 50 is disposed on the light transmission path reflected by the object 20 to be tested, and is used to capture the light reflected by the object 20 to be tested to obtain an image. The image capture device 50 includes, for example, a photosensitive element such as a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS), but the invention is not limited thereto.

處理裝置60電性連接於影像擷取裝置50,用以接收擷取裝置50所擷取到的影像以進行影像檢測。處理裝置60為中央處理單元(central processing unit,CPU)、微處理器(microprocessor)、數位訊號處理器(digital signal processor,DSP)、可程式化控制器、可程式化邏輯裝置(programmable logic device,PLD)或其他類似裝置或這些裝置的組合,本發明並不加以限制。The processing device 60 is electrically connected to the image capturing device 50 for receiving images captured by the capturing device 50 for image detection. The processing device 60 is a central processing unit (CPU), a microprocessor (microprocessor), a digital signal processor (DSP), a programmable controller, and a programmable logic device (programmable logic device, PLD) or other similar devices or combinations of these devices are not limited by the present invention.

光源裝置100適於提供一檢測光束L至待測物件20。詳細而言,光源裝置100包括一殼體110、多個第一發光元件120、一分光元件130、多個第二發光元件140。殼體110具有一出光口O1、相互間隔的一第一容置空間E1以及一第二容置空間E2,用以裝載上述的第一發光元件120、分光元件130以及第二發光元件140。具體而言,在本實施例中,第一容置空間E1與第二容置空間E2之間具有一開口O2,用以讓第一容置空間E1及第二容置空間E2內的光束藉由開口O2通過並傳遞。在開口O2的邊緣處,第一容置空間E1與第二容置空間E2可藉由隔板或中框進一步隔開,如圖1所繪示,但本發明並不限於此。另一方面,第二容置空間E2相對第一容置空間E1的一側具有一開口O3,用以讓待測物件20反射的光藉由開口O3傳遞至影像擷取裝置50。The light source device 100 is adapted to provide a detection beam L to the object 20 to be tested. In detail, the light source device 100 includes a housing 110, a plurality of first light-emitting elements 120, a dichroic element 130, and a plurality of second light-emitting elements 140. The housing 110 has a light outlet O1, a first accommodating space E1, and a second accommodating space E2 spaced apart from each other for accommodating the first light-emitting element 120, the light splitting element 130, and the second light-emitting element 140 mentioned above. Specifically, in this embodiment, there is an opening O2 between the first accommodating space E1 and the second accommodating space E2 for allowing the light beams in the first accommodating space E1 and the second accommodating space E2 to borrow Pass and pass through the opening O2. At the edge of the opening O2, the first accommodating space E1 and the second accommodating space E2 can be further separated by a partition or a middle frame, as shown in FIG. 1, but the present invention is not limited to this. On the other hand, the side of the second accommodating space E2 opposite to the first accommodating space E1 has an opening O3 for transmitting the light reflected by the object under test 20 to the image capturing device 50 through the opening O3.

多個第二發光元件140配置於第二容置空間E2,適於提供一第二光束L2,而分光元件130配置於第二光束L2的傳遞路徑上。在本實施例中,第二發光元件140例如是發光二極體(light-emitting diode,LED)或雷射二極體(laser diode,LD)等發光裝置,但本發明並不限於此。在本實施例中,光源裝置100還包括一準直鏡組160,配置於第二容置空間E2及第二光束L2的傳遞路徑上。因此,第二發光元件140所發出的第二光束L2通過準直鏡組160以形成準直光,並藉由分光元件130反射並傳遞通過第一容置空間E1至待測物件20,例如是照射待測物件20的底面區A1。在此需說明的是,此處所謂的準直光,是指具有一定準直特性的光束,即為不具有較大發散或聚焦特性的光束,而非絕對準直的光束。在其他實施例中,不同的準直鏡組160可使第二發光元件140所發出的第二光束L2通過以達到發散、聚焦,或是強度調整等效果。The plurality of second light-emitting elements 140 are arranged in the second accommodating space E2 and are suitable for providing a second light beam L2, and the light splitting element 130 is arranged on the transmission path of the second light beam L2. In this embodiment, the second light-emitting element 140 is, for example, a light-emitting diode (LED) or a laser diode (LD) or other light-emitting device, but the invention is not limited to this. In this embodiment, the light source device 100 further includes a collimating lens group 160, which is disposed in the second accommodating space E2 and the transmission path of the second light beam L2. Therefore, the second light beam L2 emitted by the second light-emitting element 140 passes through the collimating lens group 160 to form collimated light, and is reflected by the beam splitting element 130 and transmitted through the first accommodating space E1 to the object under test 20, for example, The bottom area A1 of the object 20 to be tested is illuminated. It should be noted here that the so-called collimated light here refers to a light beam with certain collimation characteristics, that is, a light beam that does not have a large divergence or focusing characteristic, rather than an absolutely collimated light beam. In other embodiments, different collimating lens groups 160 can pass the second light beam L2 emitted by the second light-emitting element 140 to achieve effects such as divergence, focusing, or intensity adjustment.

多個第一發光元件120配置於第一容置空間E1,適於提供多個第一光束L1,其中傳遞出出光口O1的第一光束L1的傳遞方向皆不同。換句話說,多個第一光束L1在殼體110的傳遞方向也皆不同。更詳細而言,光源裝置100還包括多個導光結構150,配置於第一容置空間E1,其中第一發光元件120分別對應於導光結構150,且導光結構150分別導引第一光束L1朝不同方向傳遞。導光結構150例如為板狀結構、光纖,或是以擴散特性的材料製成,本發明並不限於此。換句話說,第一發光元件120可藉由導光結構150的形狀將第一光束L1導引至較難照射到的區域,並且藉由導光結構150形成漫射光以照射至待測物件20,例如是照射待測物件20的側壁區A2。The plurality of first light-emitting elements 120 are disposed in the first accommodating space E1, and are suitable for providing a plurality of first light beams L1, wherein the transmission directions of the first light beams L1 transmitted out of the light outlet O1 are all different. In other words, the transmission directions of the multiple first light beams L1 in the housing 110 are also different. In more detail, the light source device 100 further includes a plurality of light guide structures 150 disposed in the first accommodating space E1, wherein the first light emitting elements 120 respectively correspond to the light guide structures 150, and the light guide structures 150 respectively guide the first The light beam L1 is transmitted in different directions. The light guide structure 150 is, for example, a plate-shaped structure, an optical fiber, or is made of a material with diffusion characteristics, and the present invention is not limited thereto. In other words, the first light-emitting element 120 can guide the first light beam L1 to a region that is difficult to irradiate by the shape of the light guide structure 150, and the light guide structure 150 forms a diffused light to illuminate the object 20 under test. , For example, illuminate the sidewall area A2 of the object 20 to be tested.

因此,第一光束L1及第二光束L2傳遞出出光口O1以形成檢測光束L,且在檢測光束L中,第一光束L1與第二光束L2的光學特性相異。第一發光元件120可選用與第二發光元件140相同或不同的發光裝置,本發明亦不限於此。檢測光束L傳遞至待測物件20,並藉由待測物件20的反射而依序傳遞通過出光口O1、開口O2及開口O3至影像擷取裝置50,以進行感測。Therefore, the first light beam L1 and the second light beam L2 pass through the light exit O1 to form the detection light beam L, and in the detection light beam L, the optical characteristics of the first light beam L1 and the second light beam L2 are different. The first light-emitting element 120 may be the same or different light-emitting device as the second light-emitting element 140, and the present invention is not limited thereto. The detection light beam L is transmitted to the object 20 to be tested, and is sequentially transmitted through the light exit port O1, the opening O2, and the opening O3 to the image capturing device 50 by the reflection of the object to be tested 20 for sensing.

在其他實施例中,第一光束L1與第二光束L2之間的光學相異特性可以例如是第一光束L1的波長不同於第二光束L2的波長。又或者是,第一光束L1的發光強度不同於第二光束L2的發光強度。在不同的實施例中,可針對不同種類的待測物件20或其孔洞的特性,配設不同種類或光學特性的第一發光元件120及第二發光元件140,本發明並不限制第一光束L1與第二光束L2的光學特性差異種類。如此一來,對待測物件20進行感測時,可藉由提供第一光束L1及第二光束L2分別至待測物件20的側壁區A2以及底面區A1,以使底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊(例如是亮度不同)以進行待測物件20的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,本實施例的導光結構150可針對同一區域的第一發光元件120設計,以使第一發光元件120所提供的第一光束L1能以不同的角度傳遞出殼體110。另外,導光結構150的設計可使得第一發光元件120可進一步集中配置於殼體110中延伸方向垂直於光軸方向的第一容置空間E1,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統10中光源裝置100與影像擷取裝置50的工作距離。同時,這樣的設計能節省配置空間,使光源裝置100的體積較小。In other embodiments, the optical difference between the first light beam L1 and the second light beam L2 may be, for example, that the wavelength of the first light beam L1 is different from the wavelength of the second light beam L2. Alternatively, the luminous intensity of the first light beam L1 is different from the luminous intensity of the second light beam L2. In different embodiments, the first light-emitting element 120 and the second light-emitting element 140 of different types or optical characteristics can be configured for different types of the object to be tested 20 or its hole characteristics. The present invention does not limit the first light beam. The optical characteristics of L1 and the second light beam L2 are different types. In this way, when the object under test 20 is sensed, the first light beam L1 and the second light beam L2 can be provided to the sidewall area A2 and the bottom area A1 of the object under test 20, respectively, so that the bottom area A1 and the sidewall area A2 are Different image frames are presented respectively, and image information with different characteristics (for example, different brightness) can be sensed for analysis and comparison of the object 20 under test. In addition, compared with the conventional spatial configuration of the coaxial light structure, the light guide structure 150 of this embodiment can be designed for the first light emitting element 120 in the same area, so that the first light emitting element 120 provided by the first light emitting element 120 The light beam L1 can be transmitted out of the housing 110 at different angles. In addition, the design of the light guide structure 150 enables the first light emitting element 120 to be further concentratedly arranged in the first accommodating space E1 in the housing 110 whose extending direction is perpendicular to the optical axis direction, so that other elements can be arranged perpendicular to the optical axis. In the space of the direction, the working distance between the light source device 100 and the image capturing device 50 in the optical detection system 10 can be shortened. At the same time, such a design can save configuration space and make the light source device 100 smaller in size.

詳細而言,在本實施例中,第一發光元件120的其中一部份位於一平面B1上,而第一發光元件120的其中另一部份位於另一平面B2上,且兩平面的方向相互平行,如圖1所繪示。如此一來,除了可使減少光源裝置100的體積,還可輕易配置散熱器以散熱上述兩部份的第一發光元件120,進而達到簡單配置的優點。換句話說,光源裝置100還可包括兩散熱裝置170,分別配置連接於第一發光元件120的其中一部份以些第一發光元件120的其中另一部份。如圖3所顯示,第一發光元件120與第二發光元件140可分別具有電路基板,以使散熱裝置170(僅顯示於左方一側)可方便配置於第一發光元件120與第二發光元件140上。In detail, in this embodiment, one part of the first light-emitting element 120 is located on a plane B1, and another part of the first light-emitting element 120 is located on another plane B2, and the directions of the two planes are Parallel to each other, as shown in Figure 1. In this way, in addition to reducing the volume of the light source device 100, a heat sink can be easily configured to dissipate the above-mentioned two parts of the first light-emitting element 120, thereby achieving the advantage of simple configuration. In other words, the light source device 100 may further include two heat dissipation devices 170 respectively configured to be connected to one part of the first light emitting element 120 and the other part of the first light emitting element 120. As shown in FIG. 3, the first light-emitting element 120 and the second light-emitting element 140 may each have a circuit substrate, so that the heat sink 170 (shown on the left side only) can be conveniently arranged on the first light-emitting element 120 and the second light-emitting element. Element 140 on.

圖4為本發明另一實施例的光學檢測系統的剖面示意圖。請同時參考圖2及圖4。本實施例的光學檢測系統10A類似於圖1的光學檢測系統10。兩者不同之處在於,在本實施例中,光學檢測系統10A的光源裝置100A與圖1的光源裝置100不同。詳細而言,在本實施例中,光源裝置100A的導光結構150A具有一反射曲面S及一第三容置空間E3。多個第一發光元件120配置於第三容置空間E3,適於提供多個第一光束L1至反射曲面S,其中反射曲面S適於反射第一光束L1以使傳遞出出光口O1的傳遞方向皆不同。導光結構150A的圓頂處具有一開口O4,用以讓待測物件20反射的光藉由開口O4傳遞通過開口O3至影像擷取裝置50。4 is a schematic cross-sectional view of an optical detection system according to another embodiment of the invention. Please refer to Figure 2 and Figure 4 at the same time. The optical detection system 10A of this embodiment is similar to the optical detection system 10 of FIG. 1. The difference between the two is that in this embodiment, the light source device 100A of the optical detection system 10A is different from the light source device 100 in FIG. 1. In detail, in this embodiment, the light guide structure 150A of the light source device 100A has a reflective curved surface S and a third accommodating space E3. The plurality of first light-emitting elements 120 are disposed in the third accommodating space E3, and are suitable for providing a plurality of first light beams L1 to the reflective curved surface S, wherein the reflective curved surface S is suitable for reflecting the first light beam L1 so as to transmit the light exiting port O1. The directions are all different. The dome of the light guide structure 150A has an opening O4 for allowing light reflected by the object 20 to be measured to pass through the opening O3 to the image capturing device 50 through the opening O4.

詳細而言,在本實施例中,第一發光元件120位於同一平面B3上且朝同一方向,即朝上方提供第一光束L1。因此,第一光束L1可藉由反射曲面S反射以朝不同方向傳遞,進而可導引至較難照射到的區域,並且藉由反射曲面S形成漫射光以照射至待測物件20,例如是照射待測物件20的側壁區A2。如此一來,對待測物件20進行感測時,可藉由提供第二光束L2及第一光束L1分別至待測物件20的底面區A1以及側壁區A2,以使底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊(例如是亮度不同)以進行待測物件20的分析及比對。In detail, in this embodiment, the first light emitting element 120 is located on the same plane B3 and faces the same direction, that is, provides the first light beam L1 upward. Therefore, the first light beam L1 can be reflected by the reflective curved surface S to be transmitted in different directions, and then can be guided to areas that are harder to irradiate, and the reflective curved surface S forms diffused light to illuminate the object 20 under test, for example, The side wall area A2 of the object 20 to be tested is illuminated. In this way, when the object under test 20 is sensed, the second light beam L2 and the first light beam L1 can be provided to the bottom surface area A1 and the side wall area A2 of the object under test 20 respectively, so that the bottom surface area A1 and the side wall area A2 are Different image frames are presented respectively, and image information with different characteristics (for example, different brightness) can be sensed for analysis and comparison of the object 20 under test.

除此之外,值得一提的是,在本實施例中,第一發光元件120可分別配置於平面B3的兩個同區域上,例如是以燈條配置,如圖4所繪示。如此一來,可輕易配置散熱器以散熱兩部份的第一發光元件120,進而達到簡單配置的優點。換句話說,光源裝置100還可包括兩散熱裝置170,分別配置連接於第一發光元件120的其中一部份以些第一發光元件120的其中另一部份。In addition, it is worth mentioning that in this embodiment, the first light-emitting elements 120 can be respectively arranged on two same areas of the plane B3, for example, in a light bar arrangement, as shown in FIG. 4. In this way, the heat sink can be easily configured to dissipate the two parts of the first light-emitting element 120, thereby achieving the advantage of simple configuration. In other words, the light source device 100 may further include two heat dissipation devices 170 respectively configured to be connected to one part of the first light emitting element 120 and the other part of the first light emitting element 120.

綜上所述,在本發明的光源裝置及光學檢測系統中,多個第一發光元件配置於殼體的第一容置空間,且藉由多個導光結構以提供多個第一光束,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。如此一來,對待測物件進行感測時,可藉由提供多個第一光束分別至待測物件的不同區域,以使不同區域分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,導光結構的設計可使第一發光元件進一步集中配置於殼體中延伸方向垂直於光軸方向的第一容置空間,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統中光源裝置與影像擷取裝置的工作距離。同時,這樣的設計能節省配置空間,使光源裝置的體積較小。In summary, in the light source device and the optical detection system of the present invention, a plurality of first light-emitting elements are arranged in the first accommodating space of the housing, and a plurality of light guide structures are used to provide a plurality of first light beams, The first light-emitting elements respectively correspond to the light guide structure, and the light guide structure respectively guides the first light beam to pass in different directions. In this way, when the object to be tested is sensed, a plurality of first beams can be provided to different areas of the object to be tested, so that different areas can present different image frames respectively, and then can be sensed with different characteristics Image information for the analysis and comparison of the object under test. In addition, compared with the conventional spatial configuration of the coaxial light framework, the design of the light guide structure enables the first light-emitting elements to be further concentratedly arranged in the first accommodating space in the housing whose extending direction is perpendicular to the optical axis direction. Therefore, other components can be arranged in the space perpendicular to the optical axis direction, and the working distance between the light source device and the image capturing device in the optical detection system can be shortened. At the same time, this design can save configuration space and make the light source device smaller.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be determined by the scope of the attached patent application.

10、10A:光學檢測系統 20:待測物件 50:影像擷取裝置 60:處理裝置 100、100A:光源裝置 110:殼體 120:第一發光元件 130:分光元件 140:第二發光元件 150、150S:導光結構 160:準直鏡組 170:散熱裝置 A1:底面區 A2:側壁區 B1、B2、B3:平面 E1:第一容置空間 E2:第二容置空間 E3:第三容置空間 L:檢測光束 L1:第一光束 L2:第二光束 O1:出光口 O2、O3、O4:開口 S:反射曲面 10.10A: Optical inspection system 20: Object to be tested 50: Image capture device 60: processing device 100, 100A: light source device 110: shell 120: The first light-emitting element 130: Spectroscopic element 140: second light-emitting element 150, 150S: light guide structure 160: collimating lens group 170: heat sink A1: Bottom area A2: Sidewall area B1, B2, B3: plane E1: The first housing space E2: Second housing space E3: Third housing space L: detection beam L1: First beam L2: second beam O1: Optical port O2, O3, O4: opening S: reflective surface

圖1為本發明一實施例的光學檢測系統的剖面示意圖。 圖2為本發明一實施例的光學檢測系統對待測物件進行測量的部份示意圖。 圖3為圖1中的光源裝置的立體示意圖。 圖4為本發明另一實施例的光學檢測系統的剖面示意圖。 FIG. 1 is a schematic cross-sectional view of an optical detection system according to an embodiment of the present invention. 2 is a partial schematic diagram of the optical inspection system measuring an object to be tested according to an embodiment of the present invention. FIG. 3 is a three-dimensional schematic diagram of the light source device in FIG. 1. 4 is a schematic cross-sectional view of an optical detection system according to another embodiment of the invention.

10:光學檢測系統 10: Optical inspection system

20:待測物件 20: Object to be tested

50:影像擷取裝置 50: Image capture device

60:處理裝置 60: processing device

100:光源裝置 100: light source device

110:殼體 110: shell

120:第一發光元件 120: The first light-emitting element

130:分光元件 130: Spectroscopic element

140:第二發光元件 140: second light-emitting element

150:導光結構 150: light guide structure

160:準直鏡組 160: collimating lens group

170:散熱裝置 170: heat sink

B1、B2:平面 B1, B2: plane

E1:第一容置空間 E1: The first housing space

E2:第二容置空間 E2: Second housing space

L:檢測光束 L: detection beam

L1:第一光束 L1: First beam

L2:第二光束 L2: second beam

O1:出光口 O1: Optical port

O2、O3:開口 O2, O3: opening

Claims (15)

一種光源裝置,適於提供一檢測光束,包括:一殼體,具有一出光口、一第一容置空間以及與該第一容置空間相互間隔的一第二容置空間;多個第一發光元件,配置於該第一容置空間,適於提供多個第一光束;多個導光結構,配置於該第一容置空間;以及多個第二發光元件,配置於該第二容置空間,適於提供一第二光束;其中該些第一發光元件分別對應於該些導光結構,且該些導光結構分別導引該些第一光束朝不同方向傳遞,該些第一光束傳遞出該出光口以與該第二光束形成該檢測光束。 A light source device suitable for providing a detection beam includes: a housing with a light exit, a first accommodating space, and a second accommodating space spaced apart from the first accommodating space; a plurality of firsts A light-emitting element is arranged in the first accommodating space and is suitable for providing a plurality of first light beams; a plurality of light guide structures are arranged in the first accommodating space; and a plurality of second light-emitting elements are arranged in the second accommodating space The set space is suitable for providing a second light beam; wherein the first light-emitting elements respectively correspond to the light guide structures, and the light guide structures respectively guide the first light beams to pass in different directions, and the first light-emitting elements respectively correspond to the light guide structures. The light beam is passed out of the light outlet to form the detection light beam with the second light beam. 如申請專利範圍第1項所述的光源裝置,其中該些第一發光元件的其中一部份位於一平面上,該些第一發光元件的其中另一部份位於另一平面上,且該兩平面的方向相互平行。 In the light source device described in claim 1, wherein one part of the first light-emitting elements is located on a plane, another part of the first light-emitting elements is located on another plane, and the The directions of the two planes are parallel to each other. 如申請專利範圍第1項所述的光源裝置,還包括:兩散熱裝置,分別配置連接於該些第一發光元件的其中一部份以及該些第一發光元件的其中另一部份。 The light source device described in the first item of the scope of patent application further includes: two heat dissipation devices respectively configured and connected to one part of the first light-emitting elements and another part of the first light-emitting elements. 如申請專利範圍第1項所述的光源裝置,還包括:一分光元件,配置於該第二光束的傳遞路徑上。 The light source device described in item 1 of the scope of patent application further includes: a light splitting element arranged on the transmission path of the second light beam. 如申請專利範圍第1項所述的光源裝置,其中該些第一光束為漫射光,且該第二光束為準直光。 According to the light source device described in claim 1, wherein the first light beams are diffuse light, and the second light beams are collimated light. 如申請專利範圍第1項所述的光源裝置,其中該些第一光束的波長不同於該第二光束的波長或該些第一光束的發光強度不同於該第二光束的發光強度。 According to the light source device described in claim 1, wherein the wavelength of the first light beams is different from the wavelength of the second light beam or the luminous intensity of the first light beams is different from the luminous intensity of the second light beam. 如申請專利範圍第1項所述的光源裝置,還包括:一準直鏡組,配置於該第二容置空間及該第二光束的傳遞路徑上。 The light source device described in item 1 of the scope of patent application further includes: a collimating lens group disposed on the second accommodating space and the transmission path of the second light beam. 如申請專利範圍第1項所述的光源裝置,其中該第一容置空間位於該第二容置空間及該出光口之間,且該第二光束傳遞通過該第一容置空間。 According to the light source device described in claim 1, wherein the first accommodating space is located between the second accommodating space and the light exit, and the second light beam passes through the first accommodating space. 如申請專利範圍第1項所述的光源裝置,其中該些導光結構由板狀結構、光纖或具擴散特性材料的其中至少一者組成。 According to the light source device described in item 1 of the scope of patent application, the light guide structures are composed of at least one of a plate structure, an optical fiber, or a material with diffusing properties. 一種光學檢測系統,適於測量一待測物件,包括:一光源裝置,適於提供一檢測光束至該待測物件,包括:一殼體,具有一出光口、一第一容置空間以及與該第一容置空間相互間隔的一第二容置空間;多個第一發光元件,配置於該第一容置空間,適於提供多個第一光束;多個導光結構,配置於該第一容置空間;以及多個第二發光元件,配置於該第二容置空間,適於提供一第二光束;其中該些第一發光元件分別對應於該些導光結構,且該些導光結構分別導引該些第一光束朝不同方向傳遞; 一影像擷取裝置,配置於經該待測物件反射的該檢測光束的傳遞路徑上,以擷取該待測物的一影像;以及一處理裝置,電性連接於該影像擷取裝置,用以影像分析該待測物的該影像,以獲得該待測物的一檢測結果,其中該些第一光束傳遞出該出光口以與該第二光束形成該檢測光束。 An optical detection system, suitable for measuring an object to be tested, includes: a light source device, adapted to provide a detection beam to the object to be tested, including: a housing with a light outlet, a first accommodating space, and A second accommodating space in which the first accommodating space is spaced apart; a plurality of first light-emitting elements are arranged in the first accommodating space and adapted to provide a plurality of first light beams; a plurality of light guide structures are arranged in the first accommodating space A first accommodating space; and a plurality of second light-emitting elements arranged in the second accommodating space, adapted to provide a second light beam; wherein the first light-emitting elements correspond to the light guide structures, and the The light guide structure respectively guides the first light beams to pass in different directions; An image capture device is arranged on the transmission path of the detection beam reflected by the object to be tested to capture an image of the object to be tested; and a processing device is electrically connected to the image capture device for The image of the object to be measured is analyzed with an image to obtain a detection result of the object to be measured, wherein the first light beams pass through the light exit port to form the detection light beam with the second light beam. 如申請專利範圍第10項所述的光學檢測系統,其中該光源裝置還包括一分光元件,配置於該第二光束的傳遞路徑上,該待測物件具有一孔洞結構,且該孔洞結構具有一底面區以及一側壁區,該第二光束傳遞至該底面區,且該些第一光束傳遞至該側壁區。 According to the optical detection system described in claim 10, the light source device further includes a beam splitting element disposed on the transmission path of the second light beam, the object to be tested has a hole structure, and the hole structure has a A bottom surface area and a side wall area, the second light beam is transmitted to the bottom surface area, and the first light beams are transmitted to the side wall area. 一種光源裝置,適於提供一檢測光束,包括:一殼體,具有一出光口、一第一容置空間以及一第二容置空間;一導光結構,配置於該第一容置空間,具有一反射曲面及一第三容置空間;多個第一發光元件,配置於該第三容置空間,適於提供多個第一光束至該反射曲面;多個第二發光元件,配置於該第二容置空間,適於提供一第二光束;以及一分光元件,配置於該第二光束的傳遞路徑上,其中該些第一光束及該第二光束傳遞出該出光口以形成該檢測光束,且該反射曲面適於反射該些第一光束以使傳遞出該出光口的傳遞方向皆 不同。 A light source device suitable for providing a detection beam includes: a housing with a light exit, a first accommodating space, and a second accommodating space; a light guide structure arranged in the first accommodating space, It has a reflective curved surface and a third accommodating space; a plurality of first light-emitting elements are arranged in the third accommodating space and is suitable for providing a plurality of first light beams to the reflective curved surface; a plurality of second light-emitting elements are arranged in The second accommodating space is suitable for providing a second light beam; and a beam splitting element is disposed on the transmission path of the second light beam, wherein the first light beams and the second light beams are transmitted out of the light outlet to form the Detecting light beams, and the reflective curved surface is suitable for reflecting the first light beams so that the transmission direction of the light exit port is all different. 如申請專利範圍第12項所述的光源裝置,其中該些第一發光元件位於同一平面上且朝同一方向提供該些第一光束。 According to the light source device described in claim 12, the first light-emitting elements are located on the same plane and provide the first light beams in the same direction. 一種光學檢測系統,適於測量一待測物件,包括:一光源裝置,適於提供一檢測光束至該待測物件,包括:一殼體,具有一出光口、一第一容置空間以及一第二容置空間;一導光結構,配置於該第一容置空間,具有一反射曲面及一第三容置空間;多個第一發光元件,配置於該第三容置空間,適於提供多個第一光束至該反射曲面;多個第二發光元件,配置於該第二容置空間,適於提供一第二光束;以及一分光元件,配置於該第二光束的傳遞路徑上;一影像擷取裝置,配置於經該待測物件反射的該檢測光束的傳遞路徑上;以及一處理裝置,電性連接於該影像擷取裝置,其中該些第一光束及該第二光束傳遞出該出光口以形成該檢測光束,且該反射曲面適於反射該些第一光束以使傳遞出該出光口的傳遞方向皆不同。 An optical detection system, suitable for measuring an object to be tested, includes: a light source device, adapted to provide a detection beam to the object to be tested, including: a housing with a light outlet, a first accommodating space, and a A second accommodating space; a light guide structure arranged in the first accommodating space, having a reflective curved surface and a third accommodating space; a plurality of first light-emitting elements, arranged in the third accommodating space, suitable for Providing a plurality of first light beams to the reflective curved surface; a plurality of second light-emitting elements arranged in the second accommodating space, suitable for providing a second light beam; and a beam splitting element arranged on the transmission path of the second light beam An image capturing device, configured on the transmission path of the detection beam reflected by the object to be tested; and a processing device, electrically connected to the image capturing device, wherein the first beams and the second beam The light exit port is transmitted to form the detection beam, and the reflective curved surface is suitable for reflecting the first light beams so that the transmission directions of the light exit port are different. 如申請專利範圍第14項所述的光學檢測系統,其中該待測物件具有一孔洞結構,且該孔洞結構具有一底面區以及一側 壁區,該些第一光束傳遞至該側壁區,且該第二光束傳遞至該底面區。 The optical inspection system according to item 14 of the scope of patent application, wherein the object to be tested has a hole structure, and the hole structure has a bottom area and one side In the wall area, the first light beams are transmitted to the side wall area, and the second light beams are transmitted to the bottom area.
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