TWI721720B - Light source device and optical inspection system - Google Patents
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Abstract
Description
本發明是有關於一種光源裝置及使用光源裝置的光學檢測系統,且特別是有關於一種用於量測孔狀結構的光源裝置及使用光源裝置的光學檢測系統。The present invention relates to a light source device and an optical detection system using the light source device, and more particularly to a light source device for measuring a hole-shaped structure and an optical detection system using the light source device.
自動光學檢查(Automated Optical Inspection,AOI),係運用機器視覺做為檢測標準技術,透過機器視覺取代傳統人眼辨識以達到高精密度及高效率的檢測。作為改良傳統上以人力使用光學儀器進行檢測的缺點,應用層面包括從高科技產業之研發、製造品管、國防、民生、醫療、環保、電力等領域。Automated Optical Inspection (AOI) uses machine vision as the inspection standard technology to replace traditional human eye recognition through machine vision to achieve high-precision and high-efficiency inspections. As an improvement on the shortcomings of the traditional use of optical instruments for inspection by humans, the application level includes the research and development of high-tech industries, manufacturing quality control, national defense, people's livelihood, medical treatment, environmental protection, electric power and other fields.
在光學檢測領域中,複雜表面的檢測相對平滑表面較為困難,一般可視性的複雜表面取決於影像擷取裝置的景深範圍,若是影像擷取裝置的景深足夠一般都可以克服。相對而言,針對平面不可視的缺陷(例如盲孔、穿孔的內側壁面缺陷),則是難以由傳統的光學方式(例如平面拍攝)進行檢測,這類的缺陷通常需要針對影像擷取裝置的相對位置及拍攝角度進行調整,且必須針對每一個目標區域逐一進行拍攝,以致於在進行這類的檢測時非常的耗時耗功,難以達到相應的效率。In the field of optical inspection, it is more difficult to detect complex surfaces than smooth surfaces. Generally, complex surfaces with visibility depend on the depth of field of the image capture device. If the depth of field of the image capture device is sufficient, it can generally be overcome. In contrast, for the defects that are not visible on the plane (such as blind holes, perforated inner wall surface defects), it is difficult to detect by traditional optical methods (such as plane shooting). Such defects usually need to be opposed to the image capture device. The position and shooting angle must be adjusted, and each target area must be shot one by one, so that this type of detection is very time-consuming and labor-intensive, and it is difficult to achieve the corresponding efficiency.
本發明提供一種光源裝置及光學檢測系統,可感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。The invention provides a light source device and an optical detection system, which can sense image information with different characteristics for analysis and comparison of objects to be tested.
本發明提供一種光源裝置適於提供一檢測光束。光源裝置包括一殼體、多個第一發光元件以及多個導光結構。殼體具有一出光口以及一第一容置空間。多個第一發光元件配置於第一容置空間,適於提供多個第一光束。多個導光結構配置於第一容置空間,其中多個第一發光元件分別對應於多個導光結構,且多個導光結構分別導引多個第一光束朝不同方向傳遞。多個第一光束傳遞出出光口以形成檢測光束。The present invention provides a light source device suitable for providing a detection beam. The light source device includes a housing, a plurality of first light-emitting elements, and a plurality of light guide structures. The shell has a light outlet and a first accommodating space. The plurality of first light-emitting elements are arranged in the first accommodating space and are suitable for providing a plurality of first light beams. The plurality of light guide structures are arranged in the first accommodating space, wherein the plurality of first light emitting elements respectively correspond to the plurality of light guide structures, and the plurality of light guide structures respectively guide the plurality of first light beams to pass in different directions. The multiple first light beams are passed out of the light exit to form a detection light beam.
本發明另提供一種光學檢測系統,適於測量一待測物件。光學檢測系統包括一光源裝置、一影像擷取裝置以及一處理裝置。光源裝置適於提供一檢測光束。光源裝置包括一殼體、多個第一發光元件以及多個導光結構。殼體具有一出光口以及一第一容置空間。多個第一發光元件配置於第一容置空間,適於提供多個第一光束。多個導光結構配置於第一容置空間,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。影像擷取裝置配置於經待測物件反射的檢測光束的傳遞路徑上,以擷取待測物的一影像。處理裝置電性連接於影像擷取裝置,用以影像分析待測物的影像,以獲得待測物的一檢測結果,其中第一光束傳遞出出光口以形成檢測光束。The present invention also provides an optical detection system, which is suitable for measuring an object to be tested. The optical detection system includes a light source device, an image capture device, and a processing device. The light source device is suitable for providing a detection beam. The light source device includes a housing, a plurality of first light-emitting elements, and a plurality of light guide structures. The shell has a light outlet and a first accommodating space. The plurality of first light-emitting elements are arranged in the first accommodating space and are suitable for providing a plurality of first light beams. A plurality of light guide structures are arranged in the first accommodating space, wherein the first light emitting elements respectively correspond to the light guide structures, and the light guide structures respectively guide the first light beams to pass in different directions. The image capturing device is arranged on the transmission path of the detection beam reflected by the object to be tested to capture an image of the object to be tested. The processing device is electrically connected to the image capturing device for image analysis of the image of the object to be tested to obtain a detection result of the object to be tested, wherein the first light beam is transmitted out of the light outlet to form a detection light beam.
本發明另提供一種光源裝置,適於提供一檢測光束。光源裝置包括一殼體、一導光結構、多個第一發光元件、多個第二發光元件以及一分光元件。殼體具有一出光口、一第一容置空間以及一第二容置空間。導光結構配置於第一容置空間,具有一反射曲面及一第三容置空間。多個第一發光元件配置於第三容置空間,適於提供多個第一光束至反射曲面。多個第二發光元件配置於第二容置空間,適於提供一第二光束。分光元件配置於第二光束的傳遞路徑上,其中第一光束及第二光束傳遞出出光口以形成檢測光束,且反射曲面適於反射第一光束以使傳遞出出光口的傳遞方向皆不同。The present invention also provides a light source device suitable for providing a detection beam. The light source device includes a housing, a light guide structure, a plurality of first light-emitting elements, a plurality of second light-emitting elements, and a light splitting element. The shell has a light outlet, a first accommodating space and a second accommodating space. The light guide structure is disposed in the first accommodating space, and has a reflective curved surface and a third accommodating space. The plurality of first light-emitting elements are arranged in the third accommodating space, and are suitable for providing the plurality of first light beams to the reflective curved surface. The plurality of second light-emitting elements are arranged in the second accommodating space and are suitable for providing a second light beam. The light splitting element is arranged on the transmission path of the second light beam, wherein the first light beam and the second light beam are transmitted out of the light outlet to form a detection light beam, and the reflective curved surface is suitable for reflecting the first light beam so that the transmission directions of the transmitted light outlet are different.
本發明另提供一種光學檢測系統,適於測量一待測物件。光學檢測系統包括一光源裝置、一影像擷取裝置以及一處理裝置。光源裝置適於提供一檢測光束至待測物件。光源裝置包括一殼體、一導光結構、多個第一發光元件、多個第二發光元件以及一分光元件。殼體具有一出光口、一第一容置空間以及一第二容置空間。導光結構配置於第一容置空間,具有一反射曲面及一第三容置空間。多個第一發光元件配置於第三容置空間,適於提供多個第一光束至反射曲面。多個第二發光元件配置於第二容置空間,適於提供一第二光束。分光元件配置於第二光束的傳遞路徑上。影像擷取裝置配置於經待測物件反射的檢測光束的傳遞路徑上。處理裝置電性連接於影像擷取裝置,其中第一光束及第二光束傳遞出出光口以形成檢測光束,且反射曲面適於反射第一光束以使傳遞出出光口的傳遞方向皆不同。The present invention also provides an optical detection system, which is suitable for measuring an object to be tested. The optical detection system includes a light source device, an image capture device, and a processing device. The light source device is suitable for providing a detection beam to the object to be tested. The light source device includes a housing, a light guide structure, a plurality of first light-emitting elements, a plurality of second light-emitting elements, and a light splitting element. The shell has a light outlet, a first accommodating space and a second accommodating space. The light guide structure is disposed in the first accommodating space, and has a reflective curved surface and a third accommodating space. The plurality of first light-emitting elements are arranged in the third accommodating space, and are suitable for providing the plurality of first light beams to the reflective curved surface. The plurality of second light-emitting elements are arranged in the second accommodating space and are suitable for providing a second light beam. The light splitting element is arranged on the transmission path of the second light beam. The image capturing device is arranged on the transmission path of the detection beam reflected by the object to be tested. The processing device is electrically connected to the image capturing device, wherein the first light beam and the second light beam are transmitted out of the light outlet to form a detection light beam, and the reflective curved surface is adapted to reflect the first light beam so that the transmission directions of the light transmitted through the light outlet are different.
基於上述,在本發明的光源裝置及光學檢測系統中,多個第一發光元件配置於殼體的第一容置空間,且藉由多個導光結構以提供多個第一光束,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。如此一來,對待測物件進行感測時,可藉由提供多個第一光束分別至待測物件的不同區域,以使不同區域分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,導光結構的設計可使第一發光元件進一步集中配置於殼體中延伸方向垂直於光軸方向的第一容置空間,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統中光源裝置與影像擷取裝置的工作距離。同時,這樣的設計能節省配置空間,使光源裝置的體積較小。Based on the above, in the light source device and the optical detection system of the present invention, a plurality of first light-emitting elements are arranged in the first accommodating space of the housing, and a plurality of light guide structures are used to provide a plurality of first light beams. A light-emitting element respectively corresponds to the light-guiding structure, and the light-guiding structure respectively guides the first light beam to pass in different directions. In this way, when the object to be tested is sensed, a plurality of first beams can be provided to different areas of the object to be tested, so that different areas can present different image frames respectively, and then can be sensed with different characteristics Image information for the analysis and comparison of the object under test. In addition, compared with the conventional spatial configuration of the coaxial light framework, the design of the light guide structure enables the first light-emitting elements to be further concentratedly arranged in the first accommodating space in the housing whose extending direction is perpendicular to the optical axis direction. Therefore, other components can be arranged in the space perpendicular to the optical axis direction, and the working distance between the light source device and the image capturing device in the optical detection system can be shortened. At the same time, this design can save configuration space and make the light source device smaller.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.
圖1為本發明一實施例的光學檢測系統的剖面示意圖。圖2為本發明一實施例的光學檢測系統對待測物件進行測量的部份示意圖。圖3為圖1中的光源裝置的立體示意圖。請參考圖1至圖3。為方便說明,圖3僅顯示部分的結構,並非為實體結構外觀。本實施例提供一種光學檢測系統10,適於測量一待測物件20。詳細而言,待測物件20例如為電路板,且具有孔洞結構,孔洞結構具有一底面區A1以及一側壁區A2。光學檢測系統10適於藉由光源裝置100分別提供兩種光學特性(例如是準直性、波長、光信號強度、入射角度等光學特性)相異的光至待測物件20的底面區A1以及側壁區A2,以使在感光時能讓底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件20的分析及比對。FIG. 1 is a schematic cross-sectional view of an optical detection system according to an embodiment of the present invention. 2 is a partial schematic diagram of the optical inspection system measuring an object to be tested according to an embodiment of the present invention. FIG. 3 is a three-dimensional schematic diagram of the light source device in FIG. 1. Please refer to Figure 1 to Figure 3. For the convenience of description, FIG. 3 only shows part of the structure, not the appearance of the physical structure. This embodiment provides an
光學檢測系統10包括一光源裝置100、一影像擷取裝置50以及一處理裝置60。影像擷取裝置50配置於經待測物件20反射的光傳遞路徑上,用以擷取待測物件20所反射的光以獲得影像。影像擷取裝置50例如是包括電荷耦合元件(charge coupled device,CCD)或互補式金屬氧化物半導體元件(complementary metal oxide semiconductor,CMOS)等感光元件,但本發明並不限於此。The
處理裝置60電性連接於影像擷取裝置50,用以接收擷取裝置50所擷取到的影像以進行影像檢測。處理裝置60為中央處理單元(central processing unit,CPU)、微處理器(microprocessor)、數位訊號處理器(digital signal processor,DSP)、可程式化控制器、可程式化邏輯裝置(programmable logic device,PLD)或其他類似裝置或這些裝置的組合,本發明並不加以限制。The
光源裝置100適於提供一檢測光束L至待測物件20。詳細而言,光源裝置100包括一殼體110、多個第一發光元件120、一分光元件130、多個第二發光元件140。殼體110具有一出光口O1、相互間隔的一第一容置空間E1以及一第二容置空間E2,用以裝載上述的第一發光元件120、分光元件130以及第二發光元件140。具體而言,在本實施例中,第一容置空間E1與第二容置空間E2之間具有一開口O2,用以讓第一容置空間E1及第二容置空間E2內的光束藉由開口O2通過並傳遞。在開口O2的邊緣處,第一容置空間E1與第二容置空間E2可藉由隔板或中框進一步隔開,如圖1所繪示,但本發明並不限於此。另一方面,第二容置空間E2相對第一容置空間E1的一側具有一開口O3,用以讓待測物件20反射的光藉由開口O3傳遞至影像擷取裝置50。The
多個第二發光元件140配置於第二容置空間E2,適於提供一第二光束L2,而分光元件130配置於第二光束L2的傳遞路徑上。在本實施例中,第二發光元件140例如是發光二極體(light-emitting diode,LED)或雷射二極體(laser diode,LD)等發光裝置,但本發明並不限於此。在本實施例中,光源裝置100還包括一準直鏡組160,配置於第二容置空間E2及第二光束L2的傳遞路徑上。因此,第二發光元件140所發出的第二光束L2通過準直鏡組160以形成準直光,並藉由分光元件130反射並傳遞通過第一容置空間E1至待測物件20,例如是照射待測物件20的底面區A1。在此需說明的是,此處所謂的準直光,是指具有一定準直特性的光束,即為不具有較大發散或聚焦特性的光束,而非絕對準直的光束。在其他實施例中,不同的準直鏡組160可使第二發光元件140所發出的第二光束L2通過以達到發散、聚焦,或是強度調整等效果。The plurality of second light-emitting
多個第一發光元件120配置於第一容置空間E1,適於提供多個第一光束L1,其中傳遞出出光口O1的第一光束L1的傳遞方向皆不同。換句話說,多個第一光束L1在殼體110的傳遞方向也皆不同。更詳細而言,光源裝置100還包括多個導光結構150,配置於第一容置空間E1,其中第一發光元件120分別對應於導光結構150,且導光結構150分別導引第一光束L1朝不同方向傳遞。導光結構150例如為板狀結構、光纖,或是以擴散特性的材料製成,本發明並不限於此。換句話說,第一發光元件120可藉由導光結構150的形狀將第一光束L1導引至較難照射到的區域,並且藉由導光結構150形成漫射光以照射至待測物件20,例如是照射待測物件20的側壁區A2。The plurality of first light-emitting
因此,第一光束L1及第二光束L2傳遞出出光口O1以形成檢測光束L,且在檢測光束L中,第一光束L1與第二光束L2的光學特性相異。第一發光元件120可選用與第二發光元件140相同或不同的發光裝置,本發明亦不限於此。檢測光束L傳遞至待測物件20,並藉由待測物件20的反射而依序傳遞通過出光口O1、開口O2及開口O3至影像擷取裝置50,以進行感測。Therefore, the first light beam L1 and the second light beam L2 pass through the light exit O1 to form the detection light beam L, and in the detection light beam L, the optical characteristics of the first light beam L1 and the second light beam L2 are different. The first light-emitting
在其他實施例中,第一光束L1與第二光束L2之間的光學相異特性可以例如是第一光束L1的波長不同於第二光束L2的波長。又或者是,第一光束L1的發光強度不同於第二光束L2的發光強度。在不同的實施例中,可針對不同種類的待測物件20或其孔洞的特性,配設不同種類或光學特性的第一發光元件120及第二發光元件140,本發明並不限制第一光束L1與第二光束L2的光學特性差異種類。如此一來,對待測物件20進行感測時,可藉由提供第一光束L1及第二光束L2分別至待測物件20的側壁區A2以及底面區A1,以使底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊(例如是亮度不同)以進行待測物件20的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,本實施例的導光結構150可針對同一區域的第一發光元件120設計,以使第一發光元件120所提供的第一光束L1能以不同的角度傳遞出殼體110。另外,導光結構150的設計可使得第一發光元件120可進一步集中配置於殼體110中延伸方向垂直於光軸方向的第一容置空間E1,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統10中光源裝置100與影像擷取裝置50的工作距離。同時,這樣的設計能節省配置空間,使光源裝置100的體積較小。In other embodiments, the optical difference between the first light beam L1 and the second light beam L2 may be, for example, that the wavelength of the first light beam L1 is different from the wavelength of the second light beam L2. Alternatively, the luminous intensity of the first light beam L1 is different from the luminous intensity of the second light beam L2. In different embodiments, the first light-emitting
詳細而言,在本實施例中,第一發光元件120的其中一部份位於一平面B1上,而第一發光元件120的其中另一部份位於另一平面B2上,且兩平面的方向相互平行,如圖1所繪示。如此一來,除了可使減少光源裝置100的體積,還可輕易配置散熱器以散熱上述兩部份的第一發光元件120,進而達到簡單配置的優點。換句話說,光源裝置100還可包括兩散熱裝置170,分別配置連接於第一發光元件120的其中一部份以些第一發光元件120的其中另一部份。如圖3所顯示,第一發光元件120與第二發光元件140可分別具有電路基板,以使散熱裝置170(僅顯示於左方一側)可方便配置於第一發光元件120與第二發光元件140上。In detail, in this embodiment, one part of the first light-emitting
圖4為本發明另一實施例的光學檢測系統的剖面示意圖。請同時參考圖2及圖4。本實施例的光學檢測系統10A類似於圖1的光學檢測系統10。兩者不同之處在於,在本實施例中,光學檢測系統10A的光源裝置100A與圖1的光源裝置100不同。詳細而言,在本實施例中,光源裝置100A的導光結構150A具有一反射曲面S及一第三容置空間E3。多個第一發光元件120配置於第三容置空間E3,適於提供多個第一光束L1至反射曲面S,其中反射曲面S適於反射第一光束L1以使傳遞出出光口O1的傳遞方向皆不同。導光結構150A的圓頂處具有一開口O4,用以讓待測物件20反射的光藉由開口O4傳遞通過開口O3至影像擷取裝置50。4 is a schematic cross-sectional view of an optical detection system according to another embodiment of the invention. Please refer to Figure 2 and Figure 4 at the same time. The
詳細而言,在本實施例中,第一發光元件120位於同一平面B3上且朝同一方向,即朝上方提供第一光束L1。因此,第一光束L1可藉由反射曲面S反射以朝不同方向傳遞,進而可導引至較難照射到的區域,並且藉由反射曲面S形成漫射光以照射至待測物件20,例如是照射待測物件20的側壁區A2。如此一來,對待測物件20進行感測時,可藉由提供第二光束L2及第一光束L1分別至待測物件20的底面區A1以及側壁區A2,以使底面區A1以及側壁區A2分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊(例如是亮度不同)以進行待測物件20的分析及比對。In detail, in this embodiment, the first
除此之外,值得一提的是,在本實施例中,第一發光元件120可分別配置於平面B3的兩個同區域上,例如是以燈條配置,如圖4所繪示。如此一來,可輕易配置散熱器以散熱兩部份的第一發光元件120,進而達到簡單配置的優點。換句話說,光源裝置100還可包括兩散熱裝置170,分別配置連接於第一發光元件120的其中一部份以些第一發光元件120的其中另一部份。In addition, it is worth mentioning that in this embodiment, the first light-emitting
綜上所述,在本發明的光源裝置及光學檢測系統中,多個第一發光元件配置於殼體的第一容置空間,且藉由多個導光結構以提供多個第一光束,其中第一發光元件分別對應於導光結構,且導光結構分別導引第一光束朝不同方向傳遞。如此一來,對待測物件進行感測時,可藉由提供多個第一光束分別至待測物件的不同區域,以使不同區域分別呈現出不同的影像畫面,進而能感測出具有不同特徵的影像資訊以進行待測物件的分析及比對。除此之外,相較於習知的同軸光架構的空間配置,導光結構的設計可使第一發光元件進一步集中配置於殼體中延伸方向垂直於光軸方向的第一容置空間,因此可使其他元件配置於垂直於光軸方向的空間中,進而可縮短光學檢測系統中光源裝置與影像擷取裝置的工作距離。同時,這樣的設計能節省配置空間,使光源裝置的體積較小。In summary, in the light source device and the optical detection system of the present invention, a plurality of first light-emitting elements are arranged in the first accommodating space of the housing, and a plurality of light guide structures are used to provide a plurality of first light beams, The first light-emitting elements respectively correspond to the light guide structure, and the light guide structure respectively guides the first light beam to pass in different directions. In this way, when the object to be tested is sensed, a plurality of first beams can be provided to different areas of the object to be tested, so that different areas can present different image frames respectively, and then can be sensed with different characteristics Image information for the analysis and comparison of the object under test. In addition, compared with the conventional spatial configuration of the coaxial light framework, the design of the light guide structure enables the first light-emitting elements to be further concentratedly arranged in the first accommodating space in the housing whose extending direction is perpendicular to the optical axis direction. Therefore, other components can be arranged in the space perpendicular to the optical axis direction, and the working distance between the light source device and the image capturing device in the optical detection system can be shortened. At the same time, this design can save configuration space and make the light source device smaller.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be determined by the scope of the attached patent application.
10、10A:光學檢測系統
20:待測物件
50:影像擷取裝置
60:處理裝置
100、100A:光源裝置
110:殼體
120:第一發光元件
130:分光元件
140:第二發光元件
150、150S:導光結構
160:準直鏡組
170:散熱裝置
A1:底面區
A2:側壁區
B1、B2、B3:平面
E1:第一容置空間
E2:第二容置空間
E3:第三容置空間
L:檢測光束
L1:第一光束
L2:第二光束
O1:出光口
O2、O3、O4:開口
S:反射曲面
10.10A: Optical inspection system
20: Object to be tested
50: Image capture device
60: processing
圖1為本發明一實施例的光學檢測系統的剖面示意圖。 圖2為本發明一實施例的光學檢測系統對待測物件進行測量的部份示意圖。 圖3為圖1中的光源裝置的立體示意圖。 圖4為本發明另一實施例的光學檢測系統的剖面示意圖。 FIG. 1 is a schematic cross-sectional view of an optical detection system according to an embodiment of the present invention. 2 is a partial schematic diagram of the optical inspection system measuring an object to be tested according to an embodiment of the present invention. FIG. 3 is a three-dimensional schematic diagram of the light source device in FIG. 1. 4 is a schematic cross-sectional view of an optical detection system according to another embodiment of the invention.
10:光學檢測系統 10: Optical inspection system
20:待測物件 20: Object to be tested
50:影像擷取裝置 50: Image capture device
60:處理裝置 60: processing device
100:光源裝置 100: light source device
110:殼體 110: shell
120:第一發光元件 120: The first light-emitting element
130:分光元件 130: Spectroscopic element
140:第二發光元件 140: second light-emitting element
150:導光結構 150: light guide structure
160:準直鏡組 160: collimating lens group
170:散熱裝置 170: heat sink
B1、B2:平面 B1, B2: plane
E1:第一容置空間 E1: The first housing space
E2:第二容置空間 E2: Second housing space
L:檢測光束 L: detection beam
L1:第一光束 L1: First beam
L2:第二光束 L2: second beam
O1:出光口 O1: Optical port
O2、O3:開口 O2, O3: opening
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020102749A1 (en) * | 2000-09-20 | 2002-08-01 | John Fielden | Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process |
CN1242251C (en) * | 1999-06-08 | 2006-02-15 | 菲利普莫里斯生产公司 | High speed flaw detecting apparatus and method for reflective material |
TW200839227A (en) * | 2007-03-05 | 2008-10-01 | 3I Systems Corp | Automatic inspection system for flat panel substrate |
TWM343801U (en) * | 2008-05-16 | 2008-11-01 | Lite On Semiconductor Corp | Uniform light generating and contact image sensor device |
CN104380087A (en) * | 2012-06-18 | 2015-02-25 | 财团法人工业技术研究院 | Inspection device and method for small holes |
TW201713932A (en) * | 2015-10-08 | 2017-04-16 | 采鈺科技股份有限公司 | Detection device for specimens |
CN109313257A (en) * | 2016-06-24 | 2019-02-05 | 高通股份有限公司 | System and method for light-beam position detection |
TW201932828A (en) * | 2011-07-12 | 2019-08-16 | 美商克萊譚克公司 | System for wafer inspection |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL131284A (en) * | 1999-08-05 | 2003-05-29 | Orbotech Ltd | Illumination for inspecting surfaces of articles |
CN103220449B (en) * | 2012-01-20 | 2016-03-09 | 亚亚科技股份有限公司 | Face shape scanning element and there is the optical detection apparatus of face shape scanning element |
CN202563223U (en) * | 2012-03-14 | 2012-11-28 | 廖怀宝 | Optical detection device and color mapping light source device thereof |
US9553034B1 (en) * | 2012-03-27 | 2017-01-24 | Kla-Tencor Corporation | Combined semiconductor metrology system |
JP6194622B2 (en) * | 2013-04-23 | 2017-09-13 | 株式会社島津製作所 | Illumination device and inspection device |
TWI647431B (en) * | 2015-11-09 | 2019-01-11 | 耐諾股份有限公司 | Optical metrology apparatus and method |
CN207379945U (en) * | 2017-11-03 | 2018-05-18 | 联策科技股份有限公司 | Optical image detection device |
-
2019
- 2019-12-19 TW TW108146785A patent/TWI721720B/en active
-
2020
- 2020-11-27 CN CN202011357685.7A patent/CN113008787A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1242251C (en) * | 1999-06-08 | 2006-02-15 | 菲利普莫里斯生产公司 | High speed flaw detecting apparatus and method for reflective material |
US20020102749A1 (en) * | 2000-09-20 | 2002-08-01 | John Fielden | Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process |
TW200839227A (en) * | 2007-03-05 | 2008-10-01 | 3I Systems Corp | Automatic inspection system for flat panel substrate |
TWM343801U (en) * | 2008-05-16 | 2008-11-01 | Lite On Semiconductor Corp | Uniform light generating and contact image sensor device |
TW201932828A (en) * | 2011-07-12 | 2019-08-16 | 美商克萊譚克公司 | System for wafer inspection |
CN104380087A (en) * | 2012-06-18 | 2015-02-25 | 财团法人工业技术研究院 | Inspection device and method for small holes |
TW201713932A (en) * | 2015-10-08 | 2017-04-16 | 采鈺科技股份有限公司 | Detection device for specimens |
CN109313257A (en) * | 2016-06-24 | 2019-02-05 | 高通股份有限公司 | System and method for light-beam position detection |
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