TWI610985B - Liquid silicone resin composition and a cured product thereof, a sealing material for a semiconductor light-emitting device using the same, a light-emitting device using the same, and a method of manufacturing the light-emitting device - Google Patents
Liquid silicone resin composition and a cured product thereof, a sealing material for a semiconductor light-emitting device using the same, a light-emitting device using the same, and a method of manufacturing the light-emitting device Download PDFInfo
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Abstract
一種聚矽氧樹脂液狀組成物,係含有聚矽氧樹脂之聚矽氧樹脂液狀組成物,其中在29Si-NMR測定中,相對於來自矽原子的全訊號面積,歸屬於A3矽原子的訊號面積之比例為51%以上69%以下。(A3矽原子表示與其他的矽原子結合之氧原子為3個所結合的矽原子。) A liquid composition of a polyoxyxylene resin, which is a liquid composition of a polyoxyxylene resin containing a polyoxyxylene resin, which is classified into an A3 atom in a 29 Si-NMR measurement with respect to a total signal area from a germanium atom. The ratio of the signal area is 51% or more and 69% or less. (A3 矽 atom means that the oxygen atom bonded to other ruthenium atoms is three bonded ruthenium atoms.)
Description
本發明係有關聚矽氧樹脂液狀組成物。 The present invention relates to a liquid composition of a polyoxyxylene resin.
近年來,已有使用聚矽氧樹脂組成物之硬化物作為半導體發光元件之密封材的提案。不過,聚矽氧樹脂組成物之硬化物的氣體透過性高,且空氣中的硫化氫氣體之阻隔性偏低。因此,在使用聚矽氧樹脂組成物之硬化物密封時,會有使密封的半導體發光元件之背面反射板的銀膜因空氣中的硫化氫而腐蝕,以致半導體發光元件之亮度降低的問題。 In recent years, a cured product of a polyoxyxylene resin composition has been proposed as a sealing material for a semiconductor light-emitting device. However, the cured product of the polyoxymethylene resin composition has high gas permeability and low barrier property of hydrogen sulfide gas in the air. Therefore, when the cured product of the polyoxyxylene resin composition is sealed, the silver film of the back surface reflection plate of the sealed semiconductor light-emitting element is corroded by hydrogen sulfide in the air, so that the brightness of the semiconductor light-emitting element is lowered.
作為解決上述問題的聚矽氧樹脂組成物,已提案一種硬化性聚矽氧樹脂組成物(參照專利文獻1),其係包含使硬化後的聚矽氧樹脂組成物之折射率為1.50至1.55的聚矽氧樹脂,與以1至30質量%的濃度均勻分散在該聚矽氧樹脂中之平均粒徑1至10μm的氧化矽填充料者。 As a polyoxyxylene resin composition for solving the above problems, a curable polyoxyxene resin composition (refer to Patent Document 1) containing a refractive index of a cured polyoxyxene resin composition of 1.50 to 1.55 has been proposed. The polyoxynene resin is a cerium oxide filler having an average particle diameter of 1 to 10 μm uniformly dispersed in the polyfluorinated resin at a concentration of 1 to 30% by mass.
[專利文獻1]日本特開2012-41496號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2012-41496
然而,專利文獻1中所述之聚矽氧樹脂組成物,其耐熱性、耐碎裂性以及對硫化氫氣體的阻隔性不足。(聚矽氧,silicone,有稱為矽氧、矽酮的情形,本文中稱為聚矽氧) However, the polyoxymethylene resin composition described in Patent Document 1 is insufficient in heat resistance, chipping resistance, and barrier property against hydrogen sulfide gas. (Polyoxime, silicone, there is a case called helium oxygen, anthrone, referred to herein as polyoxane)
本發明是有鑑於上述問題而完成的發明,其目的是提供:作為半導體發光元件之密封材的新穎聚矽氧樹脂液狀組成物,其耐熱性、對硫化氫氣體的阻隔性以及抑制半導體發光元件的基板或與封裝的界面中之碎裂的耐裂性均高;該聚矽氧樹脂液狀組成物之硬化物;包含該硬化物之半導體發光元件用密封材;以及具備該硬化物的半導體發光裝置及其製造方法。 The present invention has been made in view of the above problems, and an object thereof is to provide a novel polyoxyxylene resin liquid composition as a sealing material for a semiconductor light-emitting device, which has heat resistance, barrier property against hydrogen sulfide gas, and suppression of semiconductor light emission. a high crack resistance of the substrate of the element or the interface with the package; a cured product of the liquid composition of the polyoxymethylene resin; a sealing material for a semiconductor light-emitting element comprising the cured product; and a semiconductor having the cured product A light emitting device and a method of manufacturing the same.
本發明人等為解決前述問題而深入探討的結果,達成如同下述之本發明。 The inventors of the present invention have intensively studied in order to solve the above problems, and have achieved the present invention as described below.
亦即,本發明之一形態,係提供一種聚矽氧樹脂液狀組成物,其是含有聚矽氧樹脂的聚矽氧樹脂液狀組成物,相對於29Si-NMR測定中來自矽原子的全訊號之面積,歸屬於下述A3矽原子的訊號面積的比例,為51%以上69%以下。 That is, an aspect of the present invention provides a liquid composition of a polyoxyxylene resin which is a liquid composition of a polyoxyxylene resin containing a polyoxyxylene resin, which is derived from a germanium atom in a 29 Si-NMR measurement. The area of the whole signal is the ratio of the signal area of the following A3 矽 atom, which is 51% or more and 69% or less.
其中,「A3矽原子」表示與其他的矽原子結合之氧原子為3個所結合的矽原子。 Here, the "A3 矽 atom" means that the oxygen atom bonded to another ruthenium atom is three bonded ruthenium atoms.
「來自矽原子的全訊號」,係指29Si-NMR測定中,含在-200ppm以上100ppm以下的化學位移之範圍中 的來自矽原子之全訊號。 The "full signal from a ruthenium atom" refers to a total signal derived from a ruthenium atom in a range of chemical shifts of -200 ppm or more and 100 ppm or less in a 29 Si-NMR measurement.
該聚矽氧樹脂液狀組成物是液狀,而以20℃以上50℃以下的溫度範圍中為液狀者為佳。同時,該聚矽氧樹脂液狀組成物,係以20℃以上50℃以下的溫度範圍中具有流動性者為佳。 The polyoxynoxy resin liquid composition is liquid, and it is preferably a liquid in a temperature range of from 20 ° C to 50 ° C. At the same time, the liquid composition of the polyoxymethylene resin is preferably a fluidity in a temperature range of from 20 ° C to 50 ° C.
該聚矽氧樹脂組成物在25℃中之黏度,係以10,000mPa.s以下為佳。黏度,一般是100mPa.s以上。黏度可使用圓筒型旋轉黏度計測定。 The viscosity of the polyoxyxene resin composition at 25 ° C is 10,000 mPa. The following is better. Viscosity, generally 100mPa. s above. Viscosity can be measured using a cylindrical rotary viscometer.
本發明的一態樣中,前述聚矽氧樹脂也可以是含有下述樹脂A與下述寡聚物B的構成。樹脂A:係相對於下述A1矽原子、下述A2矽原子與前述A3矽原子的合計含量,前述A3矽原子的含量之比例為20%以上90%以下,且重量平均分子量為1,500以上8,000以下之樹脂寡聚物B:係相對於下述A1矽原子、下述A2矽原子與前述A3矽原子的合計含量,前述A3矽原子的含量之比例為0%以上30%以下,且重量平均分子量未達1,500之寡聚物 In one aspect of the invention, the polyfluorene oxide resin may have a structure in which the following resin A and the following oligomer B are contained. Resin A: The total content of the A1 矽 atom, the following A2 矽 atom and the above A3 矽 atom, the ratio of the content of the A3 矽 atom is 20% or more and 90% or less, and the weight average molecular weight is 1,500 or more and 8,000. The following resin oligomer B is a total content of the following A1 矽 atom, the following A2 矽 atom and the above A3 矽 atom, and the ratio of the A3 矽 atom content is 0% or more and 30% or less, and the weight average Oligomers with molecular weights below 1,500
此處,「A1矽原子」表示與其他的矽原子結合之氧原子為1個所結合的矽原子。「A2矽原子」表示與其他的矽原子結合之氧原子為2個所結合的矽原子。 Here, the "A1 矽 atom" means that one oxygen atom bonded to another ruthenium atom is a bonded ruthenium atom. The "A2 矽 atom" means that the oxygen atom bonded to another ruthenium atom is two bonded ruthenium atoms.
本發明之一態樣中,前述樹脂A也可以是具有式(1)表示的有機聚矽氧烷結構之樹脂的構成。 In one aspect of the invention, the resin A may have a structure of a resin having an organopolyoxane structure represented by the formula (1).
本發明之一態樣中,前述寡聚物B也可以是具有式(2)表示的有機聚矽氧烷結構之寡聚物的構成。 In one aspect of the invention, the oligomer B may be a structure having an oligomer having an organopolyoxyalkylene structure represented by the formula (2).
本發明之一態樣中,樹脂A與寡聚物B的混合比率,也可以是樹脂A:寡聚物B=100:0.1至20(質 量比)的構成。 In one aspect of the present invention, the mixing ratio of the resin A to the oligomer B may also be a resin A: oligomer B = 100: 0.1 to 20 (quality The composition of the ratio.
本發明之一態樣中,也可為另含有無機粒子的構成。 In one aspect of the present invention, the composition may further contain inorganic particles.
本發明之一態樣中,前述無機粒子也可為選自矽之氧化物、鈦之氧化物及鋁之氧化物所形成之群組中的1種以上之構成。 In one aspect of the invention, the inorganic particles may be one or more selected from the group consisting of cerium oxide, titanium oxide, and aluminum oxide.
本發明之一態樣中,也可為另含有螢光體之構成。 In one aspect of the invention, the composition of the phosphor may be additionally included.
本發明之一態樣中,也可為另含有矽烷耦合劑之構成。 In one aspect of the invention, the composition of the decane coupling agent may also be included.
本發明之一態樣中,也可為使其以5℃/分鐘的昇溫速度自室溫昇溫至150℃之後,以150℃加熱3小時使其硬化而得的硬化物之比重為1.20g/cm3以上1.35g/cm3以下的範圍之構成。 In one aspect of the present invention, the specific gravity of the cured product obtained by heating the substrate at a temperature elevation rate of 5 ° C /min to 150 ° C and then heating at 150 ° C for 3 hours may be 1.20 g / cm. A configuration of 3 or more in the range of 1.35 g/cm 3 or less.
本發明之一態樣,係提供一種硬化物,其是將上述的聚矽氧樹脂液狀組成物藉由加熱至40℃以上250℃以下而得。 According to an aspect of the invention, there is provided a cured product obtained by heating the liquid composition of the above polyoxyxylene resin to 40 ° C or more and 250 ° C or less.
上述硬化物之一態樣中,也可為比重在1.20g/cm3以上1.35g/cm3以下的範圍之構成。 In one aspect of the cured product, the specific gravity may be in a range of 1.20 g/cm 3 or more and 1.35 g/cm 3 or less.
本發明之一態樣,係提供一種半導體發光元件用密封材,其包含上述的硬化物。 According to an aspect of the invention, there is provided a sealing material for a semiconductor light-emitting element comprising the above-mentioned cured product.
本發明之一態樣,係提供一種半導體發光裝置,其具備上述的硬化物。 One aspect of the present invention provides a semiconductor light-emitting device comprising the above-described cured product.
本發明之一態樣,係提供一種半導體發光 裝置之製造方法,其中具有將上述的聚矽氧樹脂液狀組成物加熱至100℃以上250℃以下使其硬化的步驟。 One aspect of the present invention provides a semiconductor light emitting A method for producing a device, comprising the step of heating the above-mentioned polyoxyxylene resin liquid composition to a temperature of 100 ° C or more and 250 ° C or less to be cured.
第1圖是實施例2之聚矽氧樹脂液狀組成物(α 1)的29Si-NMR圖。 Fig. 1 is a 29 Si-NMR chart of the polyoxyxylene resin liquid composition (α 1) of Example 2.
第2圖是實施例3之聚矽氧樹脂液狀組成物(α 2)的29Si-NMR圖。 Fig. 2 is a 29 Si-NMR chart of the polyoxyxylene resin liquid composition (?2) of Example 3.
第3圖是比較例2之聚矽氧樹脂X1的29Si-NMR圖。 Fig. 3 is a 29 Si-NMR chart of the polyoxyxylene resin X1 of Comparative Example 2.
第4圖是比較例2之聚矽氧樹脂X 2的29Si-NMR圖。 Fig. 4 is a 29 Si-NMR chart of the polyoxyxylene resin X 2 of Comparative Example 2.
第5圖是比較例3之聚矽氧樹脂液狀組成物(β 3)之29Si-NMR圖。 Fig. 5 is a 29 Si-NMR chart of the liquid composition (β 3 ) of the polyanthracene resin of Comparative Example 3.
以下,雖然可詳細的說明本發明,但本發 明並不侷限於以下的實施形態,只要是在其要旨的範圍內,可變更成各種形態而實施。 Hereinafter, although the present invention can be described in detail, the present invention The present invention is not limited to the embodiments described below, and may be modified into various forms and implemented within the scope of the gist of the invention.
[聚矽氧樹脂液狀組成物] [Polyoxygenated resin liquid composition]
本發明的聚矽氧樹脂液狀組成物(以下,亦可稱為本組成物。)係含有聚矽氧樹脂之聚矽氧樹脂液狀組成物,其含在29Si-NMR測定中的來自矽原子之全訊號的面積中歸屬於下述A3矽原子的訊號面積之比例,為51%以上69%以下者。 The polyxanthene resin liquid composition of the present invention (hereinafter also referred to as the present composition) is a polyoxyxylene resin liquid composition containing a polyoxyxylene resin, which is contained in a 29 Si-NMR measurement. The ratio of the area of the total signal of the cesium atom to the signal area of the following A3 矽 atom is 51% or more and 69% or less.
此處,構成本說明書的聚矽氧樹脂液狀組成物之聚矽氧樹脂或寡聚物,含有下述式的重複單元。 Here, the polyfluorene oxide resin or oligomer constituting the liquid composition of the polyoxyxylene resin of the present specification contains a repeating unit of the following formula.
在本說明書中,含有與其他的矽原子結合之氧原子3個和與R1結合的矽原子之重複單元,稱為重複單元A3(上述式(A3))。 In the present specification, a repeating unit containing three oxygen atoms bonded to another germanium atom and a germanium atom bonded to R 1 is referred to as a repeating unit A3 (the above formula (A3)).
同樣的,含有與其他的矽原子結合之氧原子2個和與R1及R2結合的矽原子之重複單元,稱為重複單元A2(上述式(A2))。 Similarly, a repeating unit containing two oxygen atoms bonded to another germanium atom and a germanium atom bonded to R 1 and R 2 is referred to as repeating unit A2 (the above formula (A2)).
含有與其他的矽原子結合之氧原子1個和與R1及2個R2結合的矽原子之重複單元,稱為重複單元A1(上述式(A1))。 A repeating unit containing one oxygen atom bonded to another germanium atom and a germanium atom bonded to R 1 and two R 2 is referred to as a repeating unit A1 (the above formula (A1)).
含有與R1及2個R2結合的矽原子、該矽原子與其他的重複單元中之氧原子結合的重複單元,稱為重複單元A1’(上述式(A1’))。 A repeating unit containing a deuterium atom bonded to R 1 and two R 2 and which is bonded to an oxygen atom in another repeating unit is referred to as a repeating unit A1′ (the above formula (A1′)).
以下的說明中,係將本發明中的「與其他的矽原子結合之氧原子為3個所結合的矽原子」稱為「A3矽原子」。「A3矽原子」是相當於含在重複單元A3中的矽 原子。 In the following description, the "oxide atom to which three atomic atoms are bonded to another germanium atom in the present invention" is referred to as "A3 germanium atom". "A3 矽 atom" is equivalent to 矽 contained in repeating unit A3 atom.
本發明中的「與其他的矽原子結合之氧原 子為2個所結合的矽原子」稱為「A2矽原子」。「A2矽原子」是相當於含在重複單元A2中的矽原子。 The "oxygen source combined with other germanium atoms" in the present invention The child is a combination of two helium atoms, which is called "A2矽 atom." The "A2 germanium atom" is equivalent to the germanium atom contained in the repeating unit A2.
本發明中的「與其他的矽原子結合之氧原 子為1個所結合的矽原子」稱為「A1矽原子」。「A1矽原子」是相當於含在重複單元A1、A1’中的矽原子。 The "oxygen source combined with other germanium atoms" in the present invention The child is a combined atom of cesium, which is called "A1 矽 atom." The "A1 矽 atom" is equivalent to the ruthenium atom contained in the repeating units A1, A1'.
重複單元A1及A1’,係構成有機聚矽氧烷 鏈之末端。重複單元A3是由1或2支的有機聚矽氧烷鏈構成分枝鏈結構。即,重複單元A3是形成樹脂的網狀結構或環結構的一部份。 Repeating units A1 and A1' constitute an organopolyoxane The end of the chain. The repeating unit A3 is a branched chain structure composed of 1 or 2 organopolyoxyalkylene chains. That is, the repeating unit A3 is a part of a network structure or a ring structure forming a resin.
本組成物中,如來自前述A3矽原子的訊號 面積在上述範圍內時,將使前述聚矽氧樹脂液狀組成物之硬化物(以下,亦稱為本硬化物)的耐熱性、耐碎裂性及對硫化氫氣體的阻隔性變佳。如來自前述A3矽原子的訊號面積超過69%時,將使本硬化物易於產生碎裂。如來自前述A3矽原子的訊號面積小於51%時,將使本硬化物對硫化氫氣體之阻隔性及耐熱性變低。 來自前述A3矽原子的訊號之面積,係以55%以上68%以下為佳。 In this composition, such as the signal from the aforementioned A3 矽 atom When the area is within the above range, the cured product of the polyoxyxylene resin liquid composition (hereinafter also referred to as the cured product) is improved in heat resistance, chipping resistance, and barrier property against hydrogen sulfide gas. If the signal area from the aforementioned A3 germanium atom exceeds 69%, the cured product is liable to be cracked. When the signal area from the A3 germanium atom is less than 51%, the barrier property and heat resistance of the cured product to hydrogen sulfide gas are lowered. The area of the signal from the A3 germanium atom is preferably 55% or more and 68% or less.
本說明書中,矽原子的NMR之訊號面積是 根據利用29Si-NMR測定的NMR圖計算出。 In the present specification, the NMR signal area of the ruthenium atom is calculated from the NMR chart measured by 29 Si-NMR.
具體上,係利用一般附屬於矽原子的NMR之測定裝置上的解析裝置,藉由求得測定對象的訊號之積分值,求得 訊號之面積。 Specifically, an analysis device on an NMR measuring device generally attached to a ruthenium atom is used to obtain an integral value of a signal to be measured. The area of the signal.
如使來自各矽原子的訊號與來自其他種類 的矽原子之訊號不重疊而獨立觀察時,可在對應於測定對象的矽原子之訊號的兩側之基線上設定積分之始點與終點,求得訊號面積。 Such as the signal from each atom and other species When the signals of the helium atoms do not overlap and are independently observed, the start point and the end point of the integral can be set on the baselines on both sides of the signal of the helium atom corresponding to the measurement object, and the signal area can be obtained.
如使來自各矽原子的訊號與來自其他種類 的矽原子之訊號重疊而觀察時,可利用一般附屬於解析裝置上的波形分離處理軟體,將重疊的訊號分離而求得各個訊號的面積。例如,利用高斯函數(Gauss function)作為擬合函數(fitting function),將重疊的數個訊號波形分離之後,與使上述的訊號獨立而觀察時同樣的設定積分之始點與終點,而求得訊號面積。 Such as the signal from each atom and other species When the signals of the helium atoms are overlapped and observed, the waveform separation processing software generally attached to the analysis device can be used to separate the overlapping signals to obtain the area of each signal. For example, using a Gauss function as a fitting function, after separating the overlapping signal waveforms, the starting point and the end point of the integration are set as in the case of observing the above-mentioned signals independently. Signal area.
NMR測定中,結合在矽原子上的原子、官 能基及取代基的結構等,可參考已知的數據資料庫或文獻而決定。 In the NMR measurement, the atom, the official attached to the helium atom The structure of the energy group and the substituent can be determined by referring to a known data database or literature.
本組成物,係自室溫以5℃/分鐘的昇溫速 度昇溫至150℃之後,以150℃加熱3小時使其硬化而得之硬化物的比重,以1.20g/cm3以上1.35g/cm3以下的範圍為佳。前述比重以1.23g/cm3以上1.30g/cm3以下更佳。 The composition is heated to 150 ° C at a temperature increase rate of 5 ° C / min from room temperature, and then cured by heating at 150 ° C for 3 hours to obtain a specific gravity of the cured product of 1.20 g / cm 3 or more and 1.35 g / cm 3 . The following range is preferred. The specific gravity is more preferably 1.23 g/cm 3 or more and 1.30 g/cm 3 or less.
前述比重在上述範圍內時,因可使對硫化氫氣體的阻隔性更為優異而佳。如前述比重超過1.35g/cm3時,容易使本硬化物產生碎裂。前述比重可藉由改變含在本組成物中的聚矽氧樹脂之含量及A3矽原子的存在比而調整。 When the specific gravity is within the above range, the barrier property against hydrogen sulfide gas can be further improved. When the specific gravity exceeds 1.35 g/cm 3 , the cured product is likely to be broken. The above specific gravity can be adjusted by changing the content of the polyoxyxylene resin contained in the present composition and the existence ratio of the A3 germanium atom.
前述比重,一般可由體積與質量求得。如 硬化物的形狀為不定形時,可藉由市售的阿基米德法之比重測定裝置測定。 The aforementioned specific gravity can generally be obtained from volume and quality. Such as When the shape of the cured product is indeterminate, it can be measured by a specific gravity measuring device of the commercially available Archimedes method.
前述聚矽氧樹脂,可對應於構成聚矽氧樹 脂的上述各重複單元,將具有可產生矽氧烷鍵之官能基的有機矽化合物作為起始原料而合成。「可產生矽氧烷鍵之官能基」,可舉出鹵素原子、羥基、烷氧基。例如,對應於重複單元A3之有機矽化合物,可將有機三鹵矽烷或有機三烷氧基矽烷等作為起始原料。聚矽氧樹脂,可藉由使此種起始原料以對應於各重複單元之存在比之比例,以水解縮合法使其反應而合成。可藉由選擇此起始原料,而調整A3矽原子之存在比及本硬化物之比重。如此而合成的聚矽氧樹脂,已在工業上作為聚矽氧樹脂或烷氧基寡聚物販售。 The polyxanthene resin may correspond to a polyoxygen tree Each of the above repeating units of the lipid is synthesized by using an organic ruthenium compound having a functional group capable of generating a decane bond as a starting material. The "functional group capable of generating a decane bond" includes a halogen atom, a hydroxyl group, and an alkoxy group. For example, an organic trihalodecane or an organotrialkoxydecane or the like can be used as a starting material corresponding to the organic hydrazine compound of the repeating unit A3. The polyoxyxylene resin can be synthesized by reacting such a starting material in a ratio corresponding to the existence ratio of each repeating unit by a hydrolysis condensation method. The ratio of the presence of the A3 germanium atom to the specific gravity of the hardened material can be adjusted by selecting this starting material. The polyoxyxylene resin thus synthesized has been industrially sold as a polyoxyxylene resin or an alkoxy oligomer.
本組成物中所含的聚矽氧樹脂,係以下述 的樹脂A及寡聚物B為佳。 The polysiloxane resin contained in the composition is as follows Resin A and oligomer B are preferred.
樹脂A,係相對於A1矽原子、A2矽原子與A3矽原子之合計含量,A3矽原子的含量之比例為20%以上90%以下,且重量平均分子量為1,500以上8,000以下的樹脂。相對於A1矽原子、A2矽原子與A3矽原子之合計含量,A3矽原子的含量之比例是以50%以上90%以下為佳,並以60%以上90%以下更佳,而以70%以上85%以下又更佳。 該A3矽原子的含量之比例,可使用29Si-NMR測定中求得的歸屬A3矽原子之訊號的面積,除以29Si-NMR測定中求得的歸屬A1矽原子之訊號的面積、歸屬A2矽原子之訊號 的面積與歸屬A3矽原子之訊號的面積之合計面積而求得。 Resin A is a resin having a total content of A1矽 atoms, A2矽 atoms and A3矽 atoms, a content of A3矽 atoms of 20% or more and 90% or less, and a weight average molecular weight of 1,500 or more and 8,000 or less. The ratio of the content of the A3 矽 atom to the A3 矽 atom is preferably 50% or more and 90% or less, and more preferably 60% or more and 90% or less, and 70% or less. More than 85% of the above is even better. The content ratio of silicon atoms in A3, the signal area may be used in the home A3 silicon atoms 29 Si-NMR measurement ascertained, attribution signal A1 is divided by silicon atoms 29 Si-NMR measurement area is obtained, the home The area of the signal of the A2 矽 atom is determined by the total area of the area of the signal belonging to the A3 矽 atom.
寡聚物B,係相對於A1矽原子、A2矽原子與A3矽原子之合計含量,A3矽原子之含量的比例為0%以上30%以下,且重量平均分子量未達1,500的寡聚物。相對於A2矽原子、A1矽原子與A3矽原子之合計含量,A3矽原子之含量的比例是以0%以上25%以下為佳。該A3矽原子之含量的比例,可使用29Si-NMR測定中求得的歸屬A3矽原子之訊號面積,除以29Si-NMR測定中求得的歸屬A1矽原子之訊號面積、歸屬A2矽原子之訊號面積與歸屬A3矽原子之訊號面積之合計面積而求得。 The oligomer B is an oligomer having a total content of A1矽 atoms, A2矽 atoms and A3矽 atoms, a content of A3矽 atoms of 0% or more and 30% or less, and a weight average molecular weight of less than 1,500. The ratio of the content of the A3矽 atom to the total content of the A2矽 atom, the A1矽 atom and the A3矽 atom is preferably 0% or more and 25% or less. The content ratio of the silicon atoms of A3, using 29 Si-NMR measurement signals obtained silicon atoms A3 home area, divided by the signal area of 29 Si-NMR measurement ascertained the home silicon atoms A1, A2 silicon attribution The area of the signal of the atom is determined by the total area of the signal area belonging to the atom of A3.
A3矽原子,為構成由3個有機聚矽氧烷鏈 之分枝鏈結構,可使具有A3矽原子的樹脂A及寡聚物B形成網狀結構或環結構。 A3 矽 atom, consisting of 3 organopolyoxyalkylene chains The branched chain structure allows the resin A and the oligomer B having an A3 fluorene atom to form a network structure or a ring structure.
對於樹脂A及寡聚物B等樹脂中結合在矽 原子上之官能基的種類及存在比,可藉由例如核磁共振分光法(NMR)測定。在各種文獻等中已有該測定法之詳述,也已廣泛的販售專用的測定裝置。具體上,係使測定對象的樹脂溶解於特定之溶劑中,給予樹脂中的氫原子核或矽原子核強大的磁場與高頻率的無線電波,使原子核中的核磁矩(Nuclear rmagnetic moment)共振,而可測定該樹脂中的各官能基之種類及存在比。測定氫原子核的方法稱為1H-NMR,測定矽原子核的方法稱為29Si-NMR。溶劑可依各種官能基之種類而選擇氘代氯仿、氘代二甲基亞碸、氘代甲醇、氘代丙酮、重水等。 The type and existence ratio of the functional group bonded to the ruthenium atom in the resin such as the resin A and the oligomer B can be measured by, for example, nuclear magnetic resonance spectroscopy (NMR). A detailed description of the measurement method has been made in various documents and the like, and a dedicated measurement device has been widely sold. Specifically, the resin to be measured is dissolved in a specific solvent, and a strong magnetic field of a hydrogen nucleus or a ruthenium nucleus in the resin and a high-frequency radio wave are given to resonate the nuclear magnetic moment in the nucleus. The type and existence ratio of each functional group in the resin were measured. The method of measuring the hydrogen nucleus is called 1 H-NMR, and the method of measuring the ruthenium nucleus is called 29 Si-NMR. The solvent may be selected from the group of various functional groups, such as deuterated chloroform, deuterated dimethyl hydrazine, deuterated methanol, deuterated acetone, heavy water, and the like.
[樹脂A] [Resin A]
R1為烷基時,該烷基可為直鏈狀、可為分枝狀,也可具有環狀結構,但以直鏈狀或分枝鏈狀的烷基為佳,而以直鏈狀的烷基更佳。該烷基的碳數雖然無特別的限定,但以碳數1至10的烷基為佳,並以碳數1至6的烷基更佳,而以碳數1至3的烷基又更佳。 When R 1 is an alkyl group, the alkyl group may be linear, may be branched, or may have a cyclic structure, but is preferably a linear or branched alkyl group, and is linear. The alkyl group is better. Although the carbon number of the alkyl group is not particularly limited, it is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 6 carbon atoms, and an alkyl group having 1 to 3 carbon atoms. good.
該烷基,也可以其他的基取代構成該烷基 的1或2以上之氫原子。該烷基的取代基,可列舉:例如苯基、萘基等碳數6至10的芳基,並以苯基為佳。 The alkyl group may be substituted with other groups to form the alkyl group. One or more hydrogen atoms. The substituent of the alkyl group may, for example, be an aryl group having 6 to 10 carbon atoms such as a phenyl group or a naphthyl group, and a phenyl group is preferred.
R1表示的烷基,具體上可列舉:例如甲基、 乙基、丙基、異丙基、丁基、異丁基、第三丁基、戊基、新戊基、己基、辛基、壬基、癸基等無取代的烷基;苯基甲基、苯基乙基、苯基丙基等芳烷基。此等烷基之中,以甲基、乙基、丙基及丁基為佳,而以甲基、乙基及異丙基更佳。 The alkyl group represented by R 1 may, for example, be specifically a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, an isobutyl group, a tert-butyl group, a pentyl group, a neopentyl group, a hexyl group or an octyl group. An unsubstituted alkyl group such as a fluorenyl group or a fluorenyl group; an aralkyl group such as a phenylmethyl group, a phenylethyl group or a phenylpropyl group. Among these alkyl groups, a methyl group, an ethyl group, a propyl group and a butyl group are preferred, and a methyl group, an ethyl group and an isopropyl group are more preferred.
如R1為芳基時,該芳基是以碳數6至10的 芳基為佳。該芳基,也可以其他的基取代構成該芳基的1或2以上之氫原子。該芳基的取代基,可列舉:例如甲基、乙基、丙基、丁基等碳數1至6的烷基。 When R 1 is an aryl group, the aryl group is preferably an aryl group having 6 to 10 carbon atoms. The aryl group may be substituted with another group to form one or more hydrogen atoms of the aryl group. The substituent of the aryl group may, for example, be an alkyl group having 1 to 6 carbon atoms such as a methyl group, an ethyl group, a propyl group or a butyl group.
R1表示的芳基,具體上可列舉:例如苯基、 萘基等無取代的芳基、如同甲基苯基、乙基苯基、丙基苯基等烷基苯基之烷基芳基等,並以苯基為佳。 The aryl group represented by R 1 may, for example, be an unsubstituted aryl group such as a phenyl group or a naphthyl group, or an alkyl aryl group such as an alkylphenyl group such as a methylphenyl group, an ethylphenyl group or a propylphenyl group. Etc., and phenyl is preferred.
R2分別獨立地表示烷氧基、烯基、氫原子或羥基。較佳者係表示烷氧基或羥基。 R 2 each independently represents an alkoxy group, an alkenyl group, a hydrogen atom or a hydroxyl group. Preferred are alkoxy or hydroxy groups.
R2為烷氧基時,該烷氧基可為直鏈狀、可 為分枝鏈狀,也可具有環狀結構,但以直鏈狀或分枝鏈狀的烷氧基為佳,而以直鏈狀的烷氧基更佳。該烷氧基之碳數雖然無特別的限定,但以碳數1至4的烷氧基為佳。R2表示的烷氧基,具體上是以甲氧基、乙氧基、丙氧基、異丙氧基、丁氧基、異丁氧基、第三丁氧基為佳,並以甲氧基、乙氧基、異丙氧基更佳。 When R 2 is an alkoxy group, the alkoxy group may be linear, may be branched, or may have a cyclic structure, but a linear or branched alkoxy group is preferred. A linear alkoxy group is more preferred. Although the carbon number of the alkoxy group is not particularly limited, it is preferably an alkoxy group having 1 to 4 carbon atoms. The alkoxy group represented by R 2 is specifically a methoxy group, an ethoxy group, a propoxy group, an isopropoxy group, a butoxy group, an isobutoxy group or a third butoxy group, and is preferably a methoxy group. More preferably, ethoxy, isopropoxy.
R2為烯基時,該烯基可為直鏈狀、可為分 枝鏈狀,也可具有環狀結構,但以直鏈狀或分枝鏈狀的烯基為佳,而以直鏈狀的烯基更佳。該烯基之碳數雖然無特別的限定,但以碳數2至4的烯基為佳。R1表示的烯基,具體上是以乙烯基(ethenyl)、烯丙基(2-丙烯基)、1-丙烯基、異丙烯基、丁烯基為佳,並以乙烯基更佳。 When R 2 is an alkenyl group, the alkenyl group may be linear, may be branched, or may have a cyclic structure, but a linear or branched chain alkenyl group is preferred, and a linear chain is preferred. The alkenyl group is more preferred. Although the carbon number of the alkenyl group is not particularly limited, it is preferably an alkenyl group having 2 to 4 carbon atoms. The alkenyl group represented by R 1 is specifically an ethenyl group, an allyl group (2-propenyl group), a 1-propenyl group, an isopropenyl group or a butenyl group, and more preferably a vinyl group.
樹脂A是以不具有烯基及氫矽基為佳。即, 樹脂A之較佳者係R2不具有烯基或氫原子的樹脂。如樹脂A具有烯基或氫矽基時,則有使本硬化物對硫化氫氣體之阻隔性及耐熱性變低的傾向。 Resin A is preferably one having no alkenyl group or hydroquinone group. That is, a preferred resin A is a resin in which R 2 does not have an alkenyl group or a hydrogen atom. When the resin A has an alkenyl group or a hydroquinone group, the barrier property and heat resistance of the cured product to hydrogen sulfide gas tend to be lowered.
樹脂A,較佳者係具有下述式(1)表示的有機聚矽氧烷結構。 The resin A preferably has an organopolyoxyalkylene structure represented by the following formula (1).
數個的R1及R2,可以是分別同種的基,也可以是相互不同的基。 A plurality of R 1 and R 2 may be the same kind of groups, or may be different groups.
樹脂A,係具有前述式(1)表示的有機聚矽氧烷結構之樹脂,並以R1具有以前述中較佳的基作為烷基及芳基而例示之基中的任何一基,R2具有以前述中較佳的基作為烷氧基而舉出之基及羥基中的任何一基者為佳。樹脂A,尤其是具有式(1)表示的有機聚矽氧烷結構之樹脂,係以具有選自甲基、乙基及苯基所形成之群組中的1種以上作為R1,具有選自甲氧基、乙氧基、異丙氧基及羥基所形成之群組中的1種以上作為R2者為佳,並以具有選自甲基及乙基所形成之群組中的1種以上作為R1,具有選自甲氧基、乙氧基、異丙氧基及羥基所形成之群組中的1種以上作為R2者更佳,而以具有選自甲基及乙基所形成之群組中的1種以上作為R1,具有選自甲氧基、乙氧基及異丙氧基所形成之群組中的1種以上與羥基作為R2者又更佳。 Resin A is a resin having an organopolyoxane structure represented by the above formula (1), and R 1 has any one of the groups exemplified by the above preferred group as an alkyl group and an aryl group, R It is preferred that the base having a preferred alkoxy group as the alkoxy group and any one of the hydroxyl groups is preferred. The resin A, in particular, a resin having an organic polyoxane structure represented by the formula (1), has one or more selected from the group consisting of a methyl group, an ethyl group and a phenyl group as R 1 . One or more of the group consisting of a methoxy group, an ethoxy group, an isopropoxy group, and a hydroxyl group is preferably R 2 and is one having a group selected from the group consisting of a methyl group and an ethyl group. The above R 1 is preferably one or more selected from the group consisting of a methoxy group, an ethoxy group, an isopropoxy group and a hydroxyl group as R 2 , and has a group selected from a methyl group and an ethyl group. One or more of the groups formed are preferably R 1 and have one or more selected from the group consisting of a methoxy group, an ethoxy group and an isopropoxy group, and a hydroxyl group as R 2 .
式(1)表示的樹脂中之各重複單元的存在 比,可以A2矽原子及A3矽原子之存在比表示。亦即,理論上是A2矽原子:A3矽原子=[p1+b1×q1]:[a1×q1]。亦即,樹脂A中的A2矽原子及A3矽原子之存在比,可由適宜調整p1、q1、a1及b1的數值而調整。 The existence ratio of each repeating unit in the resin represented by the formula (1) can be expressed by the existence ratio of the A 2 矽 atom and the A 3 矽 atom. That is, in theory, it is an A2 矽 atom: A3 矽 atom = [p 1 + b 1 × q 1 ]: [a 1 × q 1 ]. That is, the ratio of the existence of the A2矽 atom and the A3矽 atom in the resin A can be adjusted by appropriately adjusting the values of p 1 , q 1 , a 1 and b 1 .
式(1)中,p1、q1、a1及b1表示形成[p1+b1× q1]:[a1×q1]=1:0.25至9的任何正數。亦即,可使p1、q1、a1及b1適宜的調整成使A2矽原子的個數(x1)與A3矽原子的個數(y1)之存在比在x1:y1=1:0.25至9的範圍內。 In the formula (1), p 1 , q 1 , a 1 and b 1 represent any positive number forming [p 1 + b 1 × q 1 ]: [a 1 × q 1 ] = 1: 0.25 to 9. That is, p 1 , q 1 , a 1 and b 1 can be suitably adjusted such that the ratio of the number of A 2 矽 atoms (x 1 ) to the number of A 3 矽 atoms ( y 1 ) is in x 1 : y 1 =1: 0.25 to 9 range.
樹脂A,較佳者係具有前述式(1)表示的有 機聚矽氧烷結構之聚矽氧樹脂,其中相對於A2矽原子與A3矽原子的合計含量,A3矽原子的含量[y1/(x1+y1)]在0.2至0.9的範圍內。樹脂A係因A3矽原子的存在比較高,可藉由使樹脂A硬化而獲得有機聚矽氧烷鏈為網狀構成的硬化物。如A3矽原子的存在比高於該範圍時,則有本硬化物的耐碎裂性變低的情形,如低於該範圍時,則有對硫化氫氣體之阻隔性變低的情形。 Resin A is preferably a polyfluorene-oxygen resin having an organopolyoxane structure represented by the above formula (1), wherein the content of A3 矽 atoms is relative to the total content of A2 矽 atoms and A3 矽 atoms [y 1 / (x 1 + y 1 )] is in the range of 0.2 to 0.9. Resin A is relatively high in the presence of A3 ruthenium atoms, and can be obtained by curing resin A to obtain a cured product having a network of organic polyoxyalkylene chains. When the ratio of the presence of the A3 ruthenium atom is higher than the above range, the chipping resistance of the cured product may be lowered. If the ratio is lower than the above range, the barrier property against hydrogen sulfide gas may be lowered.
樹脂A,由於是具有前述式(1)中的A3矽原子之存在比在前述範圍內的有機聚矽氧烷結構之聚矽氧樹脂,而使樹脂A的硬化物對硫化氫等氣體之阻隔性高。樹脂A,係以[y1/(x1+y1)]在0.5至0.9的範圍內(x1:y1=1:1至9)者為佳,並以0.6至0.9的範圍內(x1:y1=1:1.5至9)者更佳,而以0.7至0.85的範圍內(x1:y1=1:2.33至5.67)者又更佳。 Resin A is a polyfluorene resin having an organopolyoxane structure having a ratio of A3 fluorene atoms in the above formula (1), and the cured product of resin A is blocked from a gas such as hydrogen sulfide. High sex. Resin A, preferably in the range of 0.5 to 0.9 (x 1 : y 1 = 1:1 to 9) with [y 1 /(x 1 +y 1 )], and in the range of 0.6 to 0.9 ( x 1 : y 1 =1: 1.5 to 9) is better, and in the range of 0.7 to 0.85 (x 1 : y 1 = 1: 2.33 to 5.67) is even better.
經適當地調整樹脂A的每分子之A2矽原子 及A3矽原子的個數,可使具有前述式(1)表示的有機聚矽氧烷結構之樹脂成為所要求的分子量。本發明中,樹脂A的每分子之A2矽原子及A3矽原子的個數之和,係以5以上為佳。 A2 矽 atom per molecule of resin A is appropriately adjusted Further, the number of the A3 ruthenium atoms can be such that the resin having the organopolyoxane structure represented by the above formula (1) has a desired molecular weight. In the present invention, the sum of the number of A2矽 atoms and A3矽 atoms per molecule of the resin A is preferably 5 or more.
樹脂A的重量平均分子量(Mw)是1,500以上 8,000以下。如樹脂A的重量平均分子量過少時,會有本硬化物對硫化氫氣體之阻隔性變低的傾向。由於樹脂A之重量平均分子量在該範圍內,故可得到對硫化氫氣體之阻隔性更優異的硬化物。樹脂A之重量平均分子量,係以1,500以上7,000以下為佳,並以2,000以上5,000以下更佳。 Resin A has a weight average molecular weight (Mw) of 1,500 or more 8,000 or less. When the weight average molecular weight of the resin A is too small, the barrier property of the cured product to hydrogen sulfide gas tends to be low. Since the weight average molecular weight of the resin A is within this range, a cured product having more excellent barrier properties against hydrogen sulfide gas can be obtained. The weight average molecular weight of the resin A is preferably 1,500 or more and 7,000 or less, and more preferably 2,000 or more and 5,000 or less.
樹脂A,可對應於構成樹脂A的上述各重 複單元,將具有可生成矽氧烷鍵的官能基之有機矽化合物作為起始原料而合成。「可生成矽氧烷鍵的官能基」表示與上述者同義。例如,對應於重複單元A3之有機矽化合物,可將有機三鹵矽烷或有機三烷氧矽烷等作為起始原料。聚矽氧樹脂,可藉由使此種起始原料以對應於各重複單元的存在比之比例,以水解縮合法反應而合成。如此而合成的聚矽氧樹脂,工業上是作為聚矽氧樹脂或烷氧基寡聚物而販售。 Resin A may correspond to the above-mentioned respective weights constituting the resin A The complex unit is synthesized by using an organic ruthenium compound having a functional group capable of forming a decane bond as a starting material. The "functional group capable of generating a decane bond" means that it is synonymous with the above. For example, an organic trihalomene or an organic trialkoxysilane or the like can be used as a starting material corresponding to the organic hydrazine compound of the repeating unit A3. The polyoxyxylene resin can be synthesized by a hydrolysis condensation reaction by reacting such a starting material in a ratio corresponding to the existence ratio of each repeating unit. The polyoxyxylene resin thus synthesized is industrially sold as a polyoxyxylene resin or an alkoxy oligomer.
[寡聚物B] [Oligomer B]
R1及R2表示與上述同義。 R 1 and R 2 represent the same as above.
寡聚物B較佳是實質上不具有烯基及氫矽基。亦即,寡聚物B之較佳者係R2不具有結合在矽原子上 的烯基及氫原子。寡聚物B具有烯基或羥基時,會有使本硬化物對硫化氫氣體之阻隔性及耐熱性變低的傾向。 The oligomer B preferably has substantially no alkenyl group and hydroquinone group. That is, the preferred one of the oligomers B, R 2 , does not have an alkenyl group and a hydrogen atom bonded to a ruthenium atom. When the oligomer B has an alkenyl group or a hydroxyl group, the barrier property and heat resistance of the cured product to hydrogen sulfide gas tend to be lowered.
寡聚物B之較佳者係具有式(2)表示的有機聚矽氧烷結構之寡聚物。 Preferred of the oligomer B is an oligomer having an organic polyoxoxane structure represented by the formula (2).
數個的R1及R2可以是分別相同種類的基,也可以是相互不同的基。 A plurality of R 1 and R 2 may be the same type of groups, or may be different from each other.
寡聚物B,係具有式(2)表示的有機聚矽氧烷結構之樹脂,並以R1具有以前述中所舉出作為較佳之基中的任何基作為烷基及芳基,R2具有以前述中所舉出作為較佳之基的任何基作為烷氧基、烯基、氫原子及羥基者為佳。寡聚物B,尤其是具有式(2)表示的有機聚矽氧烷結構之樹脂,並以R1具有選自甲基、乙基及苯基所形成之群組中的1種以上,R2具有選自甲氧基、乙氧基、異丙氧基及 羥基所形成之群組中的1種以上者為佳,而以R1具有選自甲基及乙基所形成之群組中的1種以上,R2具有選自甲氧基、乙氧基及異丙氧基所形成之群組中的1種以上更佳。 B oligomers, alkoxy-based resin having a structure of silicon oxide organopolysiloxane represented by the formula (2), and R 1 has the order as mentioned in the foregoing as the preferred group of any base as of alkyl and aryl, R 2 Any group having a preferred group as mentioned above is preferably an alkoxy group, an alkenyl group, a hydrogen atom or a hydroxyl group. The oligomer B, in particular, a resin having an organic polyoxosiloxane structure represented by the formula (2), and having R 1 having at least one selected from the group consisting of a methyl group, an ethyl group and a phenyl group, R 2 is preferably one or more selected from the group consisting of a methoxy group, an ethoxy group, an isopropoxy group, and a hydroxyl group, and R 1 has a group selected from the group consisting of a methyl group and an ethyl group. One or more kinds of R 2 may be one or more selected from the group consisting of a methoxy group, an ethoxy group, and an isopropoxy group.
式(2)表示的寡聚物之各重複單元的存在 比,可以A1矽原子、A2矽原子及A3矽原子之存在比表示。亦即,理論上A1矽原子:A2矽原子:A3矽原子=[r2+q2]:[p2+b2×q2]:[a2×q2]。亦即,寡聚物B中的各矽原子之存在比,可藉由適當地調整p2、q2、r2、a2及b2之數值而調整。例如,如a2與q2的至少一方為0時,該寡聚物B中不存在A3矽原子,而僅含有直鏈狀或環狀分子。另一方面,如r2與q2的兩方為0時,該寡聚物B僅存在A2矽原子,僅含有環狀分子。 The existence ratio of each repeating unit of the oligomer represented by the formula (2) can be represented by the existence ratio of the A1矽 atom, the A2矽 atom, and the A3矽 atom. That is, theoretically, A1 矽 atom: A2 矽 atom: A3 矽 atom = [r 2 + q 2 ]: [p 2 + b 2 × q 2 ]: [a 2 × q 2 ]. That is, the existence ratio of each of the ruthenium atoms in the oligomer B can be adjusted by appropriately adjusting the values of p 2 , q 2 , r 2 , a 2 and b 2 . For example, when at least one of a 2 and q 2 is 0, the oligomer B does not have an A 3 fluorene atom but only a linear or cyclic molecule. On the other hand, when both of r 2 and q 2 are 0, the oligomer B contains only an A 2 矽 atom and contains only a cyclic molecule.
式(2)中,如將A2矽原子之個數設為x2、A3 矽原子之個數設為y2、A1矽原子之個數設為z2時,式(2)中的重複單元A3矽原子之存在比係以[y2/(x2+y2+z2)]表示。 In the formula (2), when the number of A2 矽 atoms is x 2 and the number of A3 矽 atoms is y 2 and the number of A1 矽 atoms is z 2 , the repeating unit in the formula (2) The existence ratio of the A3 ruthenium atom is represented by [y 2 /(x 2 +y 2 +z 2 )].
式(2)中,p2、q2、r2、a2及b2表示形成[a2× q2]/[(p2+b2×q2)+a2×q2+(r2+q2)]=0至0.3的任何0以上之數。 In the formula (2), p 2 , q 2 , r 2 , a 2 and b 2 represent formation of [a 2 × q 2 ] / [(p 2 + b 2 × q 2 ) + a 2 × q 2 + (r 2 +q 2 )] = 0 to 0.3 of any number above 0.
此處,[a2×q2]/[(p2+b2×q2)+a2×q2+(r2+q2)]是等於式(2)中的重複單元A3矽原子之存在比[y2/(x2+y2+z2)]。亦即,經適當地調整式(2)中的p2、q2、r2、a2及b2,使A3矽原子之存在比成為0至0.3的範圍內。 Here, [a 2 ×q 2 ]/[(p 2 +b 2 ×q 2 )+a 2 ×q 2 +(r 2 +q 2 )] is equal to the repeating unit A3 in the formula (2) The ratio of existence is [y 2 /(x 2 +y 2 +z 2 )]. That is, by appropriately adjusting p 2 , q 2 , r 2 , a 2 and b 2 in the formula (2), the existence ratio of the A 3 矽 atom is in the range of 0 to 0.3.
亦即,本發明的聚矽氧樹脂組成物所含有 之寡聚物B,是以具有前述式(2)表示的有機聚矽氧烷結構之聚矽氧樹脂為佳,相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量[y2/(x2+y2+z2)]為0至0.3,且重量平均分子量(Mw)未達1,500。只要A3矽原子的存在比在前述範圍內,A2矽原子之存在比[x2/(x2+y2+z2)]及A1矽原子之存在比[z2/(x2+y2+z2)]即無特別的限定。寡聚物B是以[y2/(x2+y2+z2)]在0至0.25的範圍內者為佳,而以0.05至0.2的範圍內者更佳。 In other words, the oligomer B contained in the polyoxyxylene resin composition of the present invention is preferably a polyfluorene-oxygen resin having an organic polyoxyalkylene structure represented by the above formula (2), and is preferably a relative to the A1 germanium atom. The total content of the A2 ruthenium atom and the A3 ruthenium atom, the content of the A3 ruthenium atom [y 2 /(x 2 +y 2 +z 2 )] is 0 to 0.3, and the weight average molecular weight (Mw) is less than 1,500. As long as the existence of the A3 germanium atom is within the above range, the existence ratio of the A2 germanium atom is greater than that of [x 2 /(x 2 +y 2 +z 2 )] and the A1 germanium atom [z 2 /(x 2 +y 2 ) +z 2 )] is not particularly limited. The oligomer B is preferably in the range of 0 to 0.25 for [y 2 /(x 2 +y 2 +z 2 )], and more preferably in the range of 0.05 to 0.2.
寡聚物B,由於A3矽原子之存在比較低, 而少含分枝鏈結構,多含直鏈狀或環狀分子。寡聚物B可僅含有環狀分子者,但以多含直鏈狀的分子為佳。例如,寡聚物B,係以前述A1矽原子之存在比[z2/(x2+y2+z2)]在0至0.80的範圍內者為佳,並以在0.30至0.80的範圍內者更佳,而以在0.35至0.75的範圍內者更佳,而以在0.35至0.55的範圍內者又更佳。 Oligomer B, because of the relatively low presence of A3 ruthenium atoms, contains less branched chain structures and contains more linear or cyclic molecules. The oligomer B may contain only a cyclic molecule, but it is preferably a linear one. For example, oligomer B, is present in the A1-based silicon atomic ratio [z 2 / (x 2 + y 2 + z 2)] is preferred in the range of 0 to 0.80, and is 0.30 to 0.80 in The inner one is more preferable, and it is preferably in the range of 0.35 to 0.75, and more preferably in the range of 0.35 to 0.55.
寡聚物B的重量平均分子量未達1,500。如 The weight average molecular weight of the oligomer B was less than 1,500. Such as
寡聚物B的重量平均分子量過大時,則所得的硬化物之耐碎裂性有不足之虞。寡聚物B的重量平均分子量,係以200以上未達1,500為佳,並以250至1,000更佳。 When the weight average molecular weight of the oligomer B is too large, the chipping resistance of the obtained cured product is insufficient. The weight average molecular weight of the oligomer B is preferably 200 or more and less than 1,500, and more preferably 250 to 1,000.
經適當地調整寡聚物B的每分子中之A1矽 A1矽 per molecule of oligomer B is appropriately adjusted
原子、A21矽原子及A3矽原子的個數,可使具有式(2)表示的有機聚矽氧烷結構之樹脂成為所要求的分子量。本發明中,寡聚物B的每分子中之A1矽原子的個數、A21矽原子的個數及A3矽原子的個數之和,是以2以上為佳。 The number of atoms, A21 ruthenium atoms and A3 ruthenium atoms can be such that the resin having the organopolyoxane structure represented by the formula (2) has a desired molecular weight. In the present invention, the sum of the number of A1矽 atoms, the number of A21矽 atoms, and the number of A3矽 atoms per molecule of the oligomer B is preferably 2 or more.
藉由使樹脂A中調配有寡聚物B者硬化, 可獲得不損及樹脂A的高的氣體阻隔性,且耐碎裂性及密著性優異的硬化物。藉由寡聚物B之添加,雖然未能明瞭提高含有樹脂A的樹脂組成物之耐碎裂性及與其他材質之密著性的理由,但由低分子的寡聚物使樹脂A之高分子間交聯的結合結果,可推測是為提高可撓性,同時由寡聚物中的官能基而增加樹脂整體的極性,而提高與其他材質之間的接著力。 By hardening the resin A in which the oligomer B is formulated, It is possible to obtain a cured product which does not impair the high gas barrier properties of the resin A and is excellent in chipping resistance and adhesion. The addition of the oligomer B does not clarify the chipping resistance of the resin composition containing the resin A and the adhesion to other materials, but the resin A is made of a low molecular oligomer. As a result of the intermolecular cross-linking, it is presumed that the flexibility is increased, and the polarity of the entire resin is increased by the functional groups in the oligomer to improve the adhesion with other materials.
寡聚物B,可對應於構成寡聚物B的上述之 各重複單元,將具有可生成矽氧烷鍵的官能基之有機矽化合物作為起始原料而合成。「可生成矽氧烷鍵的官能基」,係與上述者同義。例如,對應於重複單元A3的有機矽化合物,可將有機三鹵矽烷或有機三烷氧基矽烷等作為起始原料。聚矽氧樹脂,可藉由使此種起始原料以對應於各重複單元的存在比之比例,以水解縮合法反應而合成。 The oligomer B may correspond to the above-mentioned one constituting the oligomer B Each repeating unit is synthesized by using an organic ruthenium compound having a functional group capable of forming a decane bond as a starting material. The "functional group capable of generating a decane bond" is synonymous with the above. For example, an organic trihalodecane or an organotrialkoxydecane or the like can be used as a starting material corresponding to the organic hydrazine compound of the repeating unit A3. The polyoxyxylene resin can be synthesized by a hydrolysis condensation reaction by reacting such a starting material in a ratio corresponding to the existence ratio of each repeating unit.
在寡聚物B的合成時,係在起始原料中混合對應於上述的重複單元A1、A1’之有機矽化合物而成。對應於此重複單元A1、A1’之有機矽化合物,係在使起始原料進行水解縮合反應而聚合時,結合在聚合反應之末端而停止聚合反應。因此,容易使聚合平均分子量更小於起始原料中不含對應於重複單元A1、A1’之有機矽化合物的樹脂A。 In the synthesis of the oligomer B, an organic ruthenium compound corresponding to the above-mentioned repeating units A1, A1' is mixed in the starting material. The organic ruthenium compound corresponding to the repeating units A1 and A1' is bonded to the end of the polymerization reaction to terminate the polymerization reaction when the starting material is subjected to a hydrolysis condensation reaction. Therefore, it is easy to make the polymerization average molecular weight smaller than the resin A in the starting material which does not contain the organic sulfonium compound corresponding to the repeating units A1, A1'.
與樹脂A之重量平均分子量的不同,例如,也可藉由控制使起始原料水解縮合反應時的反應溫度,或 起始原料在反應系內的追加速度而控制。 Different from the weight average molecular weight of the resin A, for example, by controlling the reaction temperature at the time of hydrolysis and condensation reaction of the starting material, or The rate of addition of the starting materials in the reaction system is controlled.
如此而合成的聚矽氧樹脂,工業上是作為聚矽氧樹脂或烷氧基寡聚物而販售。 The polyoxyxylene resin thus synthesized is industrially sold as a polyoxyxylene resin or an alkoxy oligomer.
重量平均分子量(Mw),一般可使用以凝膠 滲透層析儀(GPC)法測定之值。具體上,係使樹脂(或寡聚物)溶解於可溶性的溶劑中之後,在使用存在許多細孔(pore)之充填劑的管柱內,與移動相溶液一起通液,在管柱內使其依分子量的大小分離,使用示差折射計或UV計、黏度計、光散射檢測器等之檢測器而將其檢測出。實際上,GPC專用設備已廣泛販售,一般是以換算成標準聚苯乙烯而測定,本發明中的重量平均分子量(Mw),係以換算成此標準聚苯乙烯而測定者。 Weight average molecular weight (Mw), generally used as a gel The value measured by a permeation chromatography (GPC) method. Specifically, after dissolving the resin (or oligomer) in a soluble solvent, it is passed through a column of a mobile phase solution using a filler having a plurality of pores, and is allowed to pass through the column. It is separated by the molecular weight, and is detected using a detector of a differential refractometer or a UV meter, a viscometer, a light scattering detector, or the like. Actually, GPC-dedicated equipment has been widely sold, and it is generally measured by conversion into standard polystyrene, and the weight average molecular weight (Mw) in the present invention is measured by conversion into the standard polystyrene.
欲使樹脂(或寡聚物)溶解而使用的溶劑,係以與GPC測定中使用的移動相溶劑相同之溶劑為佳,具體上可使用四氫呋喃、氯仿、甲苯、二甲苯、二氯甲烷、二氯乙烷、甲醇、乙醇、異丙醇等。 The solvent to be used for dissolving the resin (or oligomer) is preferably the same solvent as the mobile phase solvent used in the GPC measurement, and specifically, tetrahydrofuran, chloroform, toluene, xylene, dichloromethane, or the like can be used. Ethyl chloride, methanol, ethanol, isopropanol, and the like.
使用的管柱,也大多已在市售,只要依照假設的分子量使用特定的管柱即可。 Most of the columns used are commercially available as long as a specific column is used according to the assumed molecular weight.
本發明及本申請案說明書中,對於聚矽氧 樹脂中有無存在烯基、氫矽基,可藉由以上述的1H-NMR或29Si-NMR或紅外分光光度計之測定而判斷。 In the present invention and the specification of the present application, the presence or absence of an alkenyl group or a hydroquinone group in the polyfluorene oxide resin can be determined by the above-described 1 H-NMR or 29 Si-NMR or infrared spectrophotometer.
本發明的聚矽氧樹脂液狀組成物,較佳的 是由樹脂A與寡聚物B的混合而得。對於樹脂A,是以混合較樹脂A少量的寡聚物B者為佳。尤其是,藉由將本發 明的聚矽氧樹脂液狀組成物之樹脂A與寡聚物B的混合比設為樹脂A:寡聚物B=100:0.1至20(質量比),而可得對硫化氫氣體之阻隔性與耐碎裂性更優的硬化物。樹脂A與寡聚物B之混合比,係以樹脂A:寡聚物B=100:0.2至15(質量比)為佳,而以樹脂A:寡聚物B=100:0.5至10(質量比)更佳。 The polyoxyxylene resin liquid composition of the present invention is preferred It is obtained by mixing of resin A and oligomer B. For the resin A, it is preferred to mix a small amount of the oligomer B with respect to the resin A. Especially by using the hair The mixing ratio of the resin A to the oligomer B of the liquid composition of the polyoxyl resin is set to be a resin A: oligomer B = 100: 0.1 to 20 (mass ratio), and a barrier to hydrogen sulfide gas can be obtained. A hardened material with better fracture resistance. The mixing ratio of the resin A to the oligomer B is preferably resin A: oligomer B = 100: 0.2 to 15 (mass ratio), and resin A: oligomer B = 100: 0.5 to 10 (mass Better than.)
樹脂A與寡聚物B之混合方法並無特別的 限定,可使用將2種以上的高分子混合時一般進行的任何已知之方法。例如,可將樹脂A與寡聚物B(視需要的其他樹脂)溶解於有機溶劑中而混合。 There is no special mixing method between resin A and oligomer B. For the limitation, any known method generally carried out when two or more kinds of polymers are mixed can be used. For example, the resin A and the oligomer B (other resin as needed) may be dissolved in an organic solvent and mixed.
較佳的是,為能更均勻的混合,且可使其後的樹脂溶液之安定性提高,宜使樹脂A等溶解在一時揮發性及溶解性高的有機溶劑中之後,取代成別的溶劑。具體上,係將樹脂A投入揮發性高的有機溶劑(以下,為有機溶劑P)中,藉由加熱攪拌至有機溶劑P的沸點附近之溫度,使樹脂A等溶解。接著,投入寡聚物B,同樣的使其混合溶解。然後,在已溶解樹脂A等及寡聚物B的溶液中,投入揮發性低於有機溶劑P的溶劑(以下,為溶劑Q),可由加熱蒸餾使有機溶劑P之濃度成為1%以下,而進行由有機溶劑P至溶劑Q之溶劑取代。此時,也可使用將容器內減壓的狀態加熱,作為更有效的進行溶劑取代之方式。 Preferably, in order to achieve more uniform mixing and to improve the stability of the subsequent resin solution, it is preferred to dissolve the resin A or the like in an organic solvent having high volatility and high solubility, and then replace it with another solvent. . Specifically, the resin A is introduced into a highly volatile organic solvent (hereinafter referred to as an organic solvent P), and the resin A or the like is dissolved by heating to a temperature near the boiling point of the organic solvent P. Next, the oligomer B was introduced, and the mixture was dissolved and dissolved in the same manner. Then, a solvent having a lower volatility than the organic solvent P (hereinafter referred to as solvent Q) is introduced into the solution in which the resin A or the like and the oligomer B are dissolved, and the concentration of the organic solvent P can be made 1% or less by heating distillation. Substitution of the solvent from the organic solvent P to the solvent Q is carried out. At this time, it is also possible to use a state in which the inside of the vessel is decompressed, and it is also possible to replace the solvent more effectively.
藉由進行這樣的處理,即可因在合成樹脂A或寡聚物B之際使用的殘存溶劑或未反應就殘留的水等隨著溶劑取代的進行而去除。因此,這樣的處理是有效於樹脂溶液之 安定性。 By carrying out such a treatment, it is possible to remove the residual solvent used in the synthesis of the resin A or the oligomer B or the water remaining without being reacted, as the solvent is substituted. Therefore, such treatment is effective for the resin solution Stability.
有機溶劑P,係以沸點未達100℃之有機溶 劑為佳。具體上,係以丙酮、甲基乙基酮等酮系溶劑;甲醇、乙醇、異丙醇、正丙醇等醇系溶劑;己烷、環己烷、庚烷、苯等烴系溶劑;醋酸甲酯、醋酸乙酯等醋酸酯系溶劑;二甲基醚、四氫呋喃等醚系溶劑為佳,其中並以甲醇、乙醇、異丙醇、正丙醇等醇系溶劑更佳。 The organic solvent P is an organic solvent having a boiling point of less than 100 ° C. The agent is better. Specifically, a ketone solvent such as acetone or methyl ethyl ketone; an alcohol solvent such as methanol, ethanol, isopropanol or n-propanol; a hydrocarbon solvent such as hexane, cyclohexane, heptane or benzene; An ester solvent such as methyl ester or ethyl acetate; an ether solvent such as dimethyl ether or tetrahydrofuran is preferred, and an alcohol solvent such as methanol, ethanol, isopropanol or n-propanol is more preferred.
溶劑Q,係以沸點在100℃以上之有機溶劑 為佳。具體上,係以乙二醇單甲基醚、乙二醇單乙基醚、乙二醇單異丙基醚、乙二醇單丁基醚、乙二醇單己基醚、乙二醇單乙基己基醚、乙二醇單苯基醚、乙二醇單苯甲基醚、二乙二醇單甲基醚、二乙二醇單乙基醚、二乙二醇單異丙基醚、二乙二醇單丁基醚、二乙二醇單己基醚、二乙二醇單乙基己基醚、二乙二醇單苯基醚、二乙二醇單苯甲基醚、丙二醇單甲基醚、丙二醇單乙基醚、丙二醇單異丙基醚、丙二醇單丁基醚、丙二醇單己基醚、丙二醇單乙基己基醚、丙二醇單苯基醚、丙二醇單苯甲基醚、二丙二醇單甲基醚、二丙二醇單乙基醚、二丙二醇單異丙基醚、二丙二醇單丁基醚、二丙二醇單己基醚、二丙二醇單乙基己基醚、二丙二醇單苯基醚、二丙二醇單苯甲基醚等乙二醇醚系溶劑;乙二醇單乙基醚醋酸酯、乙二醇單異丙基醚醋酸酯、乙二醇單丁基醚醋酸酯、乙二醇單己基醚醋酸酯、乙二醇單乙基己基醚醋酸酯、乙二醇單苯基醚醋酸酯、乙二醇單苯甲基醚醋酸酯等在前述之乙二醇醚系溶劑上附加 醋酸基的二醇酯系溶劑等為佳,其中並以乙二醇單丁基醚、二乙二醇單丁基醚、乙二醇單丁基醚醋酸酯更佳。 Solvent Q is an organic solvent with a boiling point above 100 ° C It is better. Specifically, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monoisopropyl ether, ethylene glycol monobutyl ether, ethylene glycol monohexyl ether, ethylene glycol single ethyl Hexyl hexyl ether, ethylene glycol monophenyl ether, ethylene glycol monobenzyl ether, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monoisopropyl ether, two Ethylene glycol monobutyl ether, diethylene glycol monohexyl ether, diethylene glycol monoethylhexyl ether, diethylene glycol monophenyl ether, diethylene glycol monobenzyl ether, propylene glycol monomethyl ether , propylene glycol monoethyl ether, propylene glycol monoisopropyl ether, propylene glycol monobutyl ether, propylene glycol monohexyl ether, propylene glycol monoethylhexyl ether, propylene glycol monophenyl ether, propylene glycol monomethyl ether, dipropylene glycol monomethyl Ether, dipropylene glycol monoethyl ether, dipropylene glycol monoisopropyl ether, dipropylene glycol monobutyl ether, dipropylene glycol monohexyl ether, dipropylene glycol monoethylhexyl ether, dipropylene glycol monophenyl ether, dipropylene glycol monophenyl Glycol ether solvent such as ether; ethylene glycol monoethyl ether acetate, ethylene glycol monoisopropyl ether acetate, ethylene glycol monobutyl ether vinegar Ester, ethylene glycol monohexyl ether acetate, ethylene glycol monoethylhexyl ether acetate, ethylene glycol monophenyl ether acetate, ethylene glycol monobenzyl ether acetate, etc. in the aforementioned glycol ether Attached to the solvent An acetic acid-based glycol ester-based solvent or the like is preferable, and ethylene glycol monobutyl ether, diethylene glycol monobutyl ether, and ethylene glycol monobutyl ether acetate are more preferable.
[其他添加物] [Other Additives]
本組成物,以進一步含有無機粒子、螢光體、矽烷耦合劑及硬化用觸媒為佳。 The composition further preferably contains inorganic particles, a phosphor, a decane coupling agent, and a curing catalyst.
(無機粒子、螢光體) (inorganic particles, phosphors)
在利用本硬化物作為半導體發光元件之密封材時,為直接就利用來自發光元件的光時,也可直接使用本組成物。如欲提高來自發光元件之光時,可在本組成物中含有可因光而發出螢光的螢光體及無機粒子。該無機粒子,可在本硬化物中使光散射而使螢光體有效的激發,同時可防止螢光體在樹脂中沉降。 When the cured product is used as a sealing material for a semiconductor light-emitting device, the composition can be used as it is when the light from the light-emitting element is used as it is. When it is desired to increase the light from the light-emitting element, the present composition may contain a phosphor and inorganic particles which emit fluorescence by light. The inorganic particles can scatter light in the cured product to effectively excite the phosphor and prevent sedimentation of the phosphor in the resin.
欲使螢光體或無機粒子混合在本組成物中 時,在混合容易沉降的螢光體之前,先使無機粒子混合,然後在混合該螢光體之後,快速的給予半導體發光元件之密封,可更有效的防止螢光體之沉降。 To mix a phosphor or inorganic particle in the composition At the time of mixing the inorganic particles, the inorganic particles are mixed, and after the phosphor is mixed, the sealing of the semiconductor light-emitting element is quickly applied, and the sedimentation of the phosphor can be more effectively prevented.
該無機粒子,係以矽、鈦、鋯、鋁、鐵、鋅等的氧化物、碳黑、鈦酸鋇、矽酸鈣、碳酸鈣等為佳。其中,以矽之氧化物、鈦之氧化物及鋁之氧化物更佳。 The inorganic particles are preferably an oxide of cerium, titanium, zirconium, aluminum, iron or zinc, carbon black, barium titanate, calcium citrate or calcium carbonate. Among them, oxides of cerium, oxides of titanium and oxides of aluminum are more preferable.
該無機粒子的形狀,可舉出略球狀、板狀、柱狀、針狀、鬚狀、纖維狀,也可為此等的任何一種形狀。就可獲得更均勻的本組成物而言,該無機粒子的形狀是以略球狀為佳。 The shape of the inorganic particles may be a substantially spherical shape, a plate shape, a column shape, a needle shape, a whisker shape, or a fiber shape, or any shape thereof. In the case where a more uniform composition can be obtained, the shape of the inorganic particles is preferably a spherical shape.
可含在本組成物中的無機粒子,可僅為1 種,也可為2種以上。如使無機粒子含在本組成物中時,係以含有粒子大小不同的2種以上之無機粒子為佳。例如,係以含有一次粒子之平均粒徑為100nm以上500nm以下的無機粒子A,與相同的一次粒子之平均粒徑為未達100nm的無機粒子B更佳。本組成物可因含有一次粒子之平均粒徑不同的2種以上之無機粒子,而使藉由光之散射的螢光體之激發效率更為提高,可發揮防止螢光體沉降之效果。 Inorganic particles which may be contained in the composition, may be only 1 The species may be two or more. When the inorganic particles are contained in the present composition, it is preferred to contain two or more kinds of inorganic particles having different particle sizes. For example, the inorganic particles A having an average particle diameter of primary particles of 100 nm or more and 500 nm or less are more preferable than the inorganic particles B having an average primary particle diameter of less than 100 nm. When the composition contains two or more kinds of inorganic particles having different average particle diameters of primary particles, the excitation efficiency of the phosphor by light scattering is further improved, and the effect of preventing sedimentation of the phosphor can be exhibited.
此處的一次粒子之平均粒徑,可藉由以電 子顯微鏡等直接觀察粒子之影像成像法等求得。具體上,係將測定對象之無機粒子在任何溶劑中照射超音波等而充分分散之液滴在載玻片(slide glass)等上,使其乾燥者,或藉由無機粒子直接在接著膠帶的接著面上振動而使其附著者,以掃描型電子顯微鏡(SEM)或透過型電子顯微鏡(TEM)等直接觀察粒子,由其形狀推算出尺寸而獲得。 The average particle size of the primary particles here can be obtained by electricity A sub-microscope or the like directly observes the image imaging method of the particles and the like. Specifically, the inorganic particles to be measured are irradiated with ultrasonic waves or the like in any solvent, and the droplets are sufficiently dispersed on a slide glass or the like to be dried, or directly by the inorganic particles on the adhesive tape. Then, the surface is vibrated and attached, and the particles are directly observed by a scanning electron microscope (SEM) or a transmission electron microscope (TEM), and the shape is obtained by estimating the shape.
本組成物中的無機粒子之含量,並無特別 的限定,但對於聚矽氧樹脂之含量100質量份時,無機粒子的總含量是以0.01至100質量份為佳,並以0.1至50質量份更佳。 The content of inorganic particles in this composition is not special However, when the content of the polyoxyxylene resin is 100 parts by mass, the total content of the inorganic particles is preferably 0.01 to 100 parts by mass, more preferably 0.1 to 50 parts by mass.
可含在本組成物中的螢光體之組成或種 類,並無特別的限制,可含有以波長570nm至700nm的範圍發出螢光之紅色螢光體、以波長490nm至570nm的範圍發出螢光之綠色螢光體、以波長420nm至480nm的範圍發出螢光之藍色螢光體等。也可依明亮度或色度而使數種的 螢光體混合。 a composition or species of a phosphor that may be contained in the composition The type is not particularly limited, and may include a red phosphor that emits fluorescence in a wavelength range of 570 nm to 700 nm, a green phosphor that emits fluorescence in a wavelength range of 490 nm to 570 nm, and emits at a wavelength of 420 nm to 480 nm. Fluorescent blue phosphor, etc. Can also be made of several kinds depending on brightness or chromaticity Fluorescent body mixing.
本組成物中含有的螢光體之含量,也無特別的限定,可依發光元件之光量或作為半導體發光裝置的必要色度或明亮度而及時地調整比率。 The content of the phosphor contained in the composition is not particularly limited, and the ratio can be adjusted in time according to the amount of light of the light-emitting element or the necessary chromaticity or brightness of the semiconductor light-emitting device.
(矽烷耦合劑) (decane coupling agent)
矽烷耦合劑,具有使本硬化物與半導體發光元件或封裝體之間的密著性提昇之效果。矽烷耦合劑,係以具有選自乙烯基、環氧基、苯乙烯基、甲基丙烯酸基、丙烯酸基、胺基、脲基、硫醇基、亞碸基及異氰酸酯基所形成之群組中的至少一種之基的矽烷耦合劑為佳,其中以含有環氧基或硫醇基的矽烷耦合劑為佳。具體上,係以2-(3,4-環氧基環己基)乙基三甲氧基矽烷、3-去水甘油氧基丙基甲基二甲氧基矽烷、3-去水甘油氧基丙基三甲氧基矽烷、3-去水甘油氧基丙基甲基二乙氧基矽烷、3-去水甘油氧基丙基三乙氧基矽烷、3-硫醇基丙基甲基二甲氧基矽烷、3-硫醇基丙基三甲氧基矽烷為佳。 The decane coupling agent has an effect of improving the adhesion between the cured product and the semiconductor light-emitting device or the package. a decane coupling agent having a group selected from the group consisting of a vinyl group, an epoxy group, a styryl group, a methacryl group, an acryl group, an amine group, a urea group, a thiol group, a fluorenylene group, and an isocyanate group. Preferably, at least one of the decane coupling agents is preferred, and a decane coupling agent containing an epoxy group or a thiol group is preferred. Specifically, 2-(3,4-epoxycyclohexyl)ethyltrimethoxydecane, 3-dehydroglyceryloxypropylmethyldimethoxydecane, 3-dehydroglyceryloxypropane Trimethoxy decane, 3-dehydroglyceryloxypropyl methyl diethoxy decane, 3-dehydroglyceryloxypropyl triethoxy decane, 3-thiol propyl methyl dimethoxy Preferably, decane or 3-thiol propyl trimethoxy decane is preferred.
如本組成物中含有矽烷耦合劑時,雖然也可以29Si-NMR之訊號檢測出含在矽烷耦合劑中的矽原子,但本發明中,在計算本組成物之訊號面積時亦包含矽烷耦合劑的訊號。 When the decane coupling agent is contained in the composition, although the ruthenium atom contained in the decane coupling agent can be detected by the 29 Si-NMR signal, in the present invention, the decane coupling is also included in the calculation of the signal area of the composition. The signal of the agent.
本組成物中的矽烷耦合劑之含量,在相對 於聚矽氧樹脂之含量100質量份時,係以0.0001至1.0質量份為佳,並以0.001至0.1質量份更佳。如矽烷耦合劑之含量比上述範圍還多時,將因矽烷耦合劑自身吸收光,而 有可能使本硬化物的透明性降低。 The content of the decane coupling agent in the composition is relative When the content of the polyoxyxene resin is 100 parts by mass, it is preferably 0.0001 to 1.0 part by mass, and more preferably 0.001 to 0.1 part by mass. If the content of the decane coupling agent is more than the above range, the decane coupling agent absorbs light by itself. It is possible to lower the transparency of the cured product.
該矽烷耦合劑,可混合在本組成物中而使 用,也可使用預先以塗布或浸漬處理而使該矽烷耦合劑附著在半導體發光元件或封裝體的表面上,然後以灌封等形成本組成物使其硬化的方法。 The decane coupling agent can be mixed in the composition to make Alternatively, a method in which the decane coupling agent is adhered to the surface of the semiconductor light-emitting device or the package by coating or immersion treatment, and then the composition is cured by potting or the like may be used.
(硬化用觸媒) (hardening catalyst)
硬化用觸媒,只要是可促進聚矽氧樹脂成份之交聯反應者,即無特別的限制。如樹脂A及寡聚物B中的官能基(上述R2)為烷氧基或羥基時,為促進水解縮合反應而可使用鹽酸、硫酸、硝酸、磷酸等無機酸;蟻酸、醋酸、草酸、檸檬酸、丙酸、丁酸、乳酸、琥珀酸等有機酸作為硬化用觸媒。硬化用觸媒,不僅只有酸性化合物,也可使用鹼性的化合物。具體上,可使用氫氧化銨、氫氧化四甲基銨、氫氧化四乙基銨等作為鹼性的化合物。 The catalyst for hardening is not particularly limited as long as it is a crosslinking reaction which promotes the component of the polyoxymethylene resin. When the functional group (the above R 2 ) in the resin A and the oligomer B is an alkoxy group or a hydroxyl group, an inorganic acid such as hydrochloric acid, sulfuric acid, nitric acid or phosphoric acid may be used to promote the hydrolysis condensation reaction; formic acid, acetic acid, oxalic acid, An organic acid such as citric acid, propionic acid, butyric acid, lactic acid or succinic acid is used as a catalyst for curing. The catalyst for curing is not only an acidic compound but also a basic compound. Specifically, ammonium hydroxide, tetramethylammonium hydroxide, tetraethylammonium hydroxide or the like can be used as the basic compound.
如樹脂A及寡聚物B中的官能基(上述R2) 為烯基或氫原子時,為促進氫矽化反應而可使用鉑系、鈀系、銠系的金屬觸媒。如為鉑系,具體上可使用鉑、鉑黑、氯鉑酸等鉑系者,例如:H2PtCl6.mH2O、K2PtCl6、KHPtCl6.mH2O、K2PtCl4、KHPtCl4.mH2O、PtO2.mH2O(m是正整數)等,或此等與烯烴等之烴、醇或含有乙烯基的有機聚矽氧烷之錯合體等。 When the functional group (the above R 2 ) in the resin A and the oligomer B is an alkenyl group or a hydrogen atom, a platinum-based, palladium-based or lanthanide-based metal catalyst can be used to promote the hydroquinone reaction. For the platinum system, platinum, platinum black, chloroplatinic acid or the like may be used, for example, H 2 PtCl 6 . mH 2 O, K 2 PtCl 6 , KHPtCl 6 . mH 2 O, K 2 PtCl 4 , KHPtCl 4 . mH 2 O, PtO 2 . mH 2 O (m is a positive integer) or the like, or a mixture with such a hydrocarbon such as an olefin, an alcohol or a vinyl group-containing organic polyoxyalkylene.
硬化用觸媒,為能以設定的濃度添加,能 以經容易在水、有機溶劑或聚矽氧樹脂液狀組成物中調整之聚矽氧系單體或烷氧基矽烷寡聚物等稀釋的狀態,添加 在聚矽氧樹脂液狀組成物中。 The catalyst for hardening can be added at a set concentration. It is added in a state of being diluted with a polyfluorene-based monomer or an alkoxydecane oligomer which is easily adjusted in a liquid composition of water, an organic solvent or a polyoxymethylene resin. In the liquid composition of the polyoxyl resin.
添加在本組成物中的硬化用觸媒之量,可 考量硬化反應時的加熱溫度、反應時間、觸媒的種類等而適當地調整。相對於本組成物100質量份,硬化用觸媒之含量是以0.01至20質量份為佳,並以0.01至10質量份更佳。硬化用觸媒可在進行硬化反應之前添加至本組成物中,也可原本就含在本組成物中。較佳的是,在進行硬化反應之前添加至本組成物中。 The amount of the hardening catalyst added to the composition can be The heating temperature, the reaction time, the type of the catalyst, and the like at the time of the hardening reaction are appropriately adjusted. The content of the hardening catalyst is preferably 0.01 to 20 parts by mass, and more preferably 0.01 to 10 parts by mass, based on 100 parts by mass of the composition. The curing catalyst may be added to the composition before the hardening reaction, or may be originally contained in the composition. Preferably, it is added to the present composition before the hardening reaction.
(其他的添加劑) (other additives)
本組成物可進一步含有與樹脂A及寡聚物B不同的聚矽氧化合物,以及添加劑。 The composition may further contain a polyfluorene oxide compound different from the resin A and the oligomer B, and an additive.
與樹脂A及寡聚物B不同的聚矽氧化合物,可列舉如下:相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例超過30%、90%以下,且重量平均分子量未達1,500之寡聚物、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例超過90%,且重量平均分子量未達1,500之寡聚物、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子的含量之比例為0%以上未達20%,且重量平均分子量為1,500以上8,000以下之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例超過90%,且重量平均分子量 為1,500以上8,000以下之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例為0%以上未達30%,且重量平均分子量為超過8,000、15,000以下之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例為30%以上90%以下,且重量平均分子量為超過8,000、15,000以下之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例為0%以上未達30%,且重量平均分子量超過15,000之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例為30%以上90%以下,且重量平均分子量超過15,000之樹脂、相對於A1矽原子、A2矽原子與A3矽原子的合計含量,A3矽原子之含量比例超過90%,且重量平均分子量超過8,000之樹脂等。 The polyoxonium compound different from the resin A and the oligomer B is exemplified by a total content of the A1矽 atom, the A2矽 atom and the A3矽 atom, and the content ratio of the A3矽 atom is more than 30% and 90% or less. And an oligomer having a weight average molecular weight of less than 1,500, an aggregate content of A1矽 atom, A2矽 atom and A3矽 atom, an A3矽 atom content ratio exceeding 90%, and a weight average molecular weight of less than 1,500 With respect to the total content of the A1矽 atom, the A2矽 atom and the A3矽 atom, the ratio of the content of the A3矽 atom is 0% or more and less than 20%, and the weight average molecular weight is 1,500 or more and 8,000 or less, relative to A1矽The total content of atoms, A2 矽 atoms and A3 矽 atoms, the content ratio of A3 矽 atoms exceeds 90%, and the weight average molecular weight The content of the resin of 1,500 or more and 8,000 or less, the total content of the A1矽 atom, the A2矽 atom and the A3矽 atom, the content ratio of the A3矽 atom is 0% or more and less than 30%, and the weight average molecular weight is more than 8,000 and 15,000 or less. The resin, the total content of the A1 矽 atom, the A2 矽 atom and the A3 矽 atom, the content ratio of the A3 矽 atom is 30% or more and 90% or less, and the weight average molecular weight is more than 8,000, 15,000 or less of the resin, relative to the A1 The total content of ruthenium atom, A2 矽 atom and A3 矽 atom, the content ratio of A3 矽 atom is 0% or more and less than 30%, and the weight average molecular weight exceeds 15,000 resin, relative to A1 矽 atom, A2 矽 atom and A3 矽The total content of atoms, the content ratio of A3 矽 atoms is 30% or more and 90% or less, and the weight average molecular weight exceeds 15,000, the total content of A1 矽 atoms, A2 矽 atoms and A3 矽 atoms, A3 矽 atoms A resin having a ratio of more than 90% and a weight average molecular weight of more than 8,000.
該聚矽氧化合物,可舉出工業上市售的一般聚矽氧化合物。藉由添加該改質用聚矽氧,即可在本硬化物上賦予柔軟性。 As the polyoxyxene compound, a general polyoxynitride compound which is commercially available for sale can be mentioned. By adding the polyoxyl oxide for the modification, flexibility can be imparted to the cured product.
如本組成物中含有聚矽氧化合物時,雖然也可以29Si-NMR的訊號檢測出含在聚矽氧化合物中的矽原子,但本發明中,在計算本組成物的訊號面積時亦包含聚矽氧化合物的訊號。 When the polyoxyxasiloxane is contained in the composition, the ruthenium atom contained in the polyfluorene oxide can be detected by the 29 Si-NMR signal, but in the present invention, the signal area of the composition is also included. The signal of polyoxyl compounds.
相對於聚矽氧樹脂之含量100質量份,本組 成物中的改質用聚矽氧之含量是以0.1至20質量份為佳,並以0.5至10質量份更佳。如改質用聚矽氧之含量比上述範圍更多時,可能有損及本硬化物之透明性的情形。 The group is 100 parts by mass relative to the content of the polyoxyl resin. The content of the polyphosphonium for reforming in the product is preferably 0.1 to 20 parts by mass, more preferably 0.5 to 10 parts by mass. If the content of the polyfluorene oxide for reforming is more than the above range, the transparency of the cured product may be impaired.
前述添加劑,可舉出為抑制在混合本組成物時產生的氣泡之消泡劑。 The above-mentioned additives include antifoaming agents for suppressing bubbles generated when the present composition is mixed.
[硬化物] [hardened material]
本組成物,可使其硬化。 The composition can be hardened.
欲使本組成物硬化,一般是將本組成物加熱。 In order to harden the composition, the composition is generally heated.
加熱的溫度,係以40至250℃為佳。加熱的時間,一般是5分鐘至6小時。欲使其硬化,係以加入硬化用觸媒為佳。 The heating temperature is preferably 40 to 250 °C. The heating time is generally 5 minutes to 6 hours. In order to harden it, it is preferable to add a catalyst for hardening.
欲使本組成物硬化之條件,可列舉之較佳者係以40至250℃加熱5分鐘至6小時的方法。在本組成物中加入硬化用觸媒之後,係以放置於250℃以下的溫度之環境氣體內使其硬化者為佳,並以放置於40至200℃的溫度之環境氣體內使其硬化者更佳。在硬化之際,為去除存在於本組成物中的溶劑或水、控制聚矽氧樹脂之縮合反應速度時,也可以階段性的調整溫度、時間使其硬化,例如以40至60℃進行5至30分鐘,接著以60至100℃進行10至60分鐘,然後以140至200℃進行30分鐘至5小時。 The condition for hardening the composition is preferably a method of heating at 40 to 250 ° C for 5 minutes to 6 hours. After the curing catalyst is added to the composition, it is preferably cured by placing it in an ambient gas at a temperature of 250 ° C or lower, and hardening it in an ambient gas placed at a temperature of 40 to 200 ° C. Better. In the case of hardening, in order to remove the solvent or water present in the present composition and control the condensation reaction rate of the polyoxynoxy resin, the temperature and time may be adjusted stepwise to harden it, for example, at 40 to 60 ° C. To 30 minutes, followed by 60 to 100 ° C for 10 to 60 minutes, and then 140 to 200 ° C for 30 minutes to 5 hours.
為了有效地進行硬化反應,宜包含在100至250℃之溫度範圍內進行加熱的步驟。在100至250℃之溫度範圍內進行加熱的時間通常為1至5小時。 In order to carry out the hardening reaction efficiently, it is preferred to include a step of heating in a temperature range of from 100 to 250 °C. The heating time in the temperature range of 100 to 250 ° C is usually from 1 to 5 hours.
本硬化物中,因可在矽原子與其他的矽原 子之間介入1個以上的原子形成鍵結,使整體形成網狀結構,而表現阻隔性。例如,使結合在矽原子上的氧原子再與其他的矽原子結合而形成矽氧烷鍵,或以碳原子使2個矽原子間交聯,而形成網狀結構。 In this hardened material, it can be used in cesium atoms and other samarium One or more atoms are interposed between the sub-forms to form a bond, so that the whole forms a network structure and exhibits barrier properties. For example, an oxygen atom bonded to a ruthenium atom is combined with another ruthenium atom to form a ruthenium oxide bond, or a carbon atom is used to crosslink two ruthenium atoms to form a network structure.
此處,如結合在矽原子上的氧原子不再與 其他的矽原子結合,而與氫原子結合而形成矽醇基時,在形成該矽醇基之處不會形成網狀結構。因此,可在理解本硬化物之物性下,評估殘留的矽醇基之量。 Here, if the oxygen atom bound to the germanium atom is no longer When other ruthenium atoms are bonded, and a hydrogen atom is bonded to form a sterol group, a network structure is not formed at the point of forming the sterol group. Therefore, the amount of residual sterol groups can be evaluated under the understanding of the physical properties of the cured product.
相對於本硬化物之全質量,此種矽醇基之 量可作為矽醇基的質量之比率而評估。以下,將此種的比率稱為「矽醇含有率」。矽醇含有率的單位是質量%。 Relative to the total mass of the hardened material, such a sterol group The amount can be evaluated as a ratio of the mass of the sterol group. Hereinafter, such a ratio is referred to as "sterol content rate". The unit of the sterol content is % by mass.
矽醇含有率,可如下述求得。 The sterol content can be obtained as follows.
首先,測定本硬化物之固體29Si-NMR光譜,計算出來自矽醇的訊號面積相對於所得的光譜中的全訊號面積之比率。藉此,即可求得含在矽醇基中之矽原子相對於含在本硬化物中的全矽原子之比例。如所得的NMR光譜為含有較多雜訊之光譜時,例如,也可藉由首先將所得的光譜進行傳立葉(Fourier)轉換,去除100Hz以上的高頻成份之後,經逆傳立葉轉換等的方法進行平滑處理。 First, the solid 29 Si-NMR spectrum of the cured product was measured, and the ratio of the signal area from the sterol to the total signal area in the obtained spectrum was calculated. Thereby, the ratio of the ruthenium atom contained in the decyl group to the total ruthenium atom contained in the sinter can be determined. When the obtained NMR spectrum is a spectrum containing a large amount of noise, for example, the obtained spectrum may be subjected to Fourier conversion to remove high-frequency components of 100 Hz or more, and then subjected to reverse-transformation conversion or the like. The method performs smoothing.
另一方面,可藉由對於本硬化物進行衍生 結合高頻電漿分光分析,而求得含在本硬化物中的矽含有率(質量%)。 On the other hand, it can be derived from the hardened material. In combination with high-frequency plasma spectroscopic analysis, the cerium content (% by mass) contained in the present hardened material was determined.
由此等測定結果之積,可求得「相對於本 硬化物的全質量之形成矽醇基的矽原子之質量比」(質量%)。 The product of such measurement results can be obtained as "relative to this The mass ratio of the ruthenium-based ruthenium atom of the total mass of the cured product (% by mass).
將所得的質量比乘以45/28((=Si、O、H 的原子量之和)/(Si的原子量)),可求得相對於本硬化物的全質量之矽醇基的質量比,亦即「矽醇含有率」。求得的矽醇含有率,可於本硬化物之評估中使用。 Multiply the resulting mass ratio by 45/28 ((=Si, O, H The sum of the atomic weights) / (the atomic weight of Si)), the mass ratio of the sterol groups to the total mass of the cured product, that is, the "sterol content" can be obtained. The obtained sterol content can be used in the evaluation of the cured product.
使本組成物硬化而得的本硬化物,因對硫 化氫氣體之阻隔性、耐熱性及耐碎裂性高,故可供使用作為半導體發光元件、發光二極體、CCD、CMOS等的密封材,尤其是可供使用作為半導體發光元件用密封材。 The hardened material obtained by hardening the composition due to sulfur Since the hydrogen gas has high barrier properties, heat resistance, and chipping resistance, it can be used as a sealing material for a semiconductor light-emitting device, a light-emitting diode, a CCD, or a CMOS, and is particularly useful as a sealing material for a semiconductor light-emitting device. .
以本組成物將基板上的半導體發光元件密 封之後,可藉由使該本組成物硬化而製造具備經本硬化物密封的半導體發光元件之半導體發光裝置。該本硬化物與基板或封裝體之間的密著性高,且對硫化氫氣體之阻隔性高。因此,以該本硬化物密封半導體發光元件之半導體發光裝置,除了不易在基板或與封裝體之界面產生碎裂或剥離,也具備不易使半導體發光元件的背面反射板之銀膜變色、不易產生經時之亮度下降的優點。該半導體發光裝置具有良好的發光亮度,也可使用於一般的照明上。 The semiconductor light-emitting element on the substrate is dense with the composition After the sealing, the semiconductor light-emitting device having the semiconductor light-emitting device sealed by the cured product can be produced by curing the composition. The cured product has high adhesion to the substrate or the package, and has high barrier property against hydrogen sulfide gas. Therefore, in the semiconductor light-emitting device in which the semiconductor light-emitting device is sealed with the cured material, it is difficult to cause discoloration or peeling of the silver film on the back surface reflector of the semiconductor light-emitting device, and it is difficult to cause cracking or peeling at the interface between the substrate and the package. The advantage of decreasing brightness over time. The semiconductor light-emitting device has good light-emitting luminance and can also be used for general illumination.
具體上,以本組成物將基板上的半導體發 光元件密封之後,藉由進行熱硬化反應,即可製造該半導體發光裝置。半導體發光元件之密封方法並無特別的限定,例如,藉由將本組成物滴在半導體發光元件表面上,或以本組成物塗布半導體發光元件表面,即可以本組成物 被覆半導體發光元件而密封。也可預先使本組成物硬化成薄片狀,將硬化後的薄片貼附在半導體發光元件表面上而密封。 Specifically, the semiconductor on the substrate is emitted by the composition After the optical element is sealed, the semiconductor light-emitting device can be manufactured by performing a heat hardening reaction. The sealing method of the semiconductor light-emitting device is not particularly limited. For example, the composition can be dropped on the surface of the semiconductor light-emitting device, or the surface of the semiconductor light-emitting device can be coated with the composition. The semiconductor light emitting element is covered and sealed. The composition may be hardened into a sheet shape in advance, and the cured sheet may be attached to the surface of the semiconductor light emitting element to be sealed.
以下,雖以實施例及比較例具體地說明本發明,但本發明並不侷限於下述之實施例。 Hereinafter, the present invention will be specifically described by way of Examples and Comparative Examples, but the present invention is not limited to the examples described below.
測定下述實施例中使用的以有機聚矽氧烷作為主鏈之樹脂A及寡聚物B之種類與存在比所用的方式,係利用1H-NMR法、29Si-NMR法。對於樹脂A、寡聚物B的分子量測定,係利用GPC法。各測定法中的測定條件係如下述。 The type and the ratio of the presence of the resin A and the oligomer B using the organopolysiloxane as the main chain used in the following examples were measured by a 1 H-NMR method or a 29 Si-NMR method. The molecular weight of the resin A and the oligomer B was measured by the GPC method. The measurement conditions in each measurement method are as follows.
<1H-NMR測定條件> < 1 H-NMR measurement conditions>
裝置名稱:JEOL RESONANCE公司製ECA-500 Device name: ECA-500 made by JEOL RESONANCE
觀測核:1H Observation core: 1 H
觀測頻率:500.16MHz Observation frequency: 500.16MHz
測定溫度:室溫 Measuring temperature: room temperature
測定溶劑:DMSO-d6 Determination of solvent: DMSO-d6
脈衝幅:6.60μ秒(45°) Pulse amplitude: 6.60μsec (45°)
脈衝往返時間:7.0秒 Pulse round trip time: 7.0 seconds
累積次數:16次 Cumulative number: 16 times
試料濃度(試料/測定溶劑):300mg/0.6mL Sample concentration (sample / determination solvent): 300mg / 0.6mL
<29Si-NMR測定條件> < 29 Si-NMR measurement conditions>
裝置名稱:Agilent公司製400-MR Device name: 400-MR manufactured by Agilent
觀測核:29Si Observation core: 29 Si
觀測頻率:79.42MHz Observation frequency: 79.42MHz
測定溫度:室溫 Measuring temperature: room temperature
測定溶劑:CDCl3 Determination of solvent: CDCl 3
脈衝幅:8.40μ秒(45°) Pulse amplitude: 8.40μsec (45°)
脈衝往返時間:15.0秒 Pulse round trip time: 15.0 seconds
累積次數:4,000次 Cumulative number: 4,000 times
試料濃度(試料/測定溶劑):300mg/0.6mL Sample concentration (sample / determination solvent): 300mg / 0.6mL
<樹脂A之GPC測定條件> <GPC measurement conditions of Resin A>
裝置:東曹社製HLC-8220 Device: HTC-8220 made by Tosoh Corporation
管柱:TSKgel Multipore HXL-M×3+Guard column-MP(XL) Column: TSKgel Multipore HXL-M×3+Guard column-MP(XL)
流量:1.0mL/分鐘 Flow rate: 1.0mL/min
檢測條件:RI(極性+) Detection condition: RI (polarity +)
濃度:100mg+5mL(THF) Concentration: 100mg + 5mL (THF)
注入量:100μL Injection volume: 100μL
管柱溫度:40℃ Column temperature: 40 ° C
溶離液:THF Dissolution: THF
<寡聚物B之GPC測定條件> <GPC measurement conditions of oligomer B>
裝置:東曹社製HLC-8220 Device: HTC-8220 made by Tosoh Corporation
管柱:TSKgel G2000HHR×2+G1000HHR×2 Column: TSKgel G2000HHR×2+G1000HHR×2
流量:1.0mL/分鐘 Flow rate: 1.0mL/min
檢測條件:RI(極性-) Detection conditions: RI (polarity -)
濃度:100mg+5mL(THF) Concentration: 100mg + 5mL (THF)
注入量:200μL Injection volume: 200μL
管柱溫度:40℃ Column temperature: 40 ° C
溶離液:THF Dissolution: THF
<聚矽氧樹脂硬化物之比重測定法> <Measurement method of specific gravity of hardened polyoxyl resin>
裝置名稱:Alfa Mirage公司製電子比重計MDS-300 Device name: Alf Mirage company electronic hydrometer MDS-300
使用液體:水 Use liquid: water
測定溫度:24℃ Measuring temperature: 24 ° C
計算式:使用ρ=A/(A-B)×ρ 0 Calculation formula: use ρ=A/(A-B)×ρ 0
ρ:硬化樹脂之比重(單位:g/cm3) ρ: specific gravity of hardened resin (unit: g/cm 3 )
A:硬化樹脂在空氣中之重量(單位:g) A: Weight of hardened resin in air (unit: g)
B:硬化樹脂在液體中之重量(單位:g) B: Weight of hardened resin in liquid (unit: g)
ρ 0:液體之比重(單位:g/cm3) ρ 0: specific gravity of liquid (unit: g/cm 3 )
(級別1) (Level 1)
使用具有前述式(1)表示的有機聚矽氧烷結構之樹脂1(Mw=3,500,前述式(1)中,R1=甲基,R2=甲氧基或羥基)作為樹脂A與具有前述式(2)表示的有機聚矽氧烷結構之樹脂2(Mw=450,前述式(2)中,R1=甲基,R2=甲氧基)作為寡聚物B,而獲得樹脂組成物。測定29Si-NMR而求得的樹脂1及樹脂2之各重複單元的存在比率,分別表示於表1及表2中。 Resin 1 having a structure of an organopolyoxane represented by the above formula (1) (Mw=3,500, in the above formula (1), R 1 =methyl group, R 2 =methoxy group or hydroxyl group) is used as the resin A and has The resin 2 of the organopolyoxane structure represented by the above formula (2) (Mw=450, R 1 =methyl group, R 2 =methoxy group in the above formula (2)) is used as the oligomer B to obtain a resin. Composition. The ratios of the respective repeating units of the resin 1 and the resin 2 which were obtained by measuring 29 Si-NMR were shown in Tables 1 and 2, respectively.
具體上,係在已設置於油浴內的燒瓶內,投入354g的前述樹脂1與190g的異丙醇,昇溫攪拌至液溫成為85℃,使樹脂1充分的溶解在異丙醇中。接著,投入35g的前述樹脂2,攪拌1小時以上使其溶解。 Specifically, 354 g of the above-mentioned resin 1 and 190 g of isopropyl alcohol were placed in a flask which was placed in an oil bath, and the temperature was raised until the liquid temperature became 85 ° C, and the resin 1 was sufficiently dissolved in isopropyl alcohol. Next, 35 g of the above resin 2 was charged, and the mixture was stirred for 1 hour or more to be dissolved.
然後,在所得的樹脂組成物中,加入123g的醋酸2-丁氧基乙酯與0.1g的3-去水甘油氧基丙基三甲氧基矽烷(矽烷耦合劑)之後,將所得的混合物裝入蒸發器中,使該混合物放置於溫度70℃、壓力4kPaA的條件中,餾除異丙醇直至該樹脂組成物中的異丙醇濃度成為1質量%以下。藉此,獲得樹脂A與寡聚物B之混合比率為樹脂A:寡聚物B=100:10的聚矽氧樹脂液狀組成物。 Then, after adding 123 g of 2-butoxyethyl acetate and 0.1 g of 3-dehydroglyceryloxypropyltrimethoxydecane (decane coupling agent) to the obtained resin composition, the resulting mixture was charged. Into the evaporator, the mixture was placed under the conditions of a temperature of 70 ° C and a pressure of 4 kPa A, and isopropyl alcohol was distilled off until the concentration of isopropyl alcohol in the resin composition was 1% by mass or less. Thereby, a polyoxyxylene resin liquid composition in which the mixing ratio of the resin A and the oligomer B was a resin A: oligomer B = 100:10 was obtained.
[比較例1] [Comparative Example 1]
除了省略寡聚物B的投入以外,其餘進行與實施例1相同的操作,獲得僅含有樹脂A之高分子成份的聚矽氧樹脂液狀組成物。 The same operation as in Example 1 was carried out except that the input of the oligomer B was omitted, and a liquid composition of a polyoxyxylene resin containing only the polymer component of the resin A was obtained.
<含有硬化用觸媒的聚矽氧樹脂液狀組成物之調製> <Preparation of a liquid composition of a polyoxyl resin containing a catalyst for curing>
對於實施例1、比較例1中所得的各聚矽氧樹脂液狀組成物,係相對於聚矽氧樹脂液狀組成物100質量份,添加磷酸15%與下述式(3)表示的烷氧基矽烷(n=3至7的正數)之混合物1質量份作為硬化用觸媒,充分的攪拌混合,獲得含有硬化用觸媒之聚矽氧樹脂液狀組成物。 In each of the liquid compositions of the polyanthracene resin obtained in Example 1 and Comparative Example 1, 15% of phosphoric acid and an alkane represented by the following formula (3) were added to 100 parts by mass of the liquid composition of the polyanthracene resin. 1 part by mass of a mixture of oxydecane (n=3 to a positive number of 7) is used as a catalyst for curing, and is sufficiently stirred and mixed to obtain a liquid composition of a polyoxymethylene resin containing a catalyst for curing.
<耐碎裂性評估> <Fracture resistance evaluation>
對於所得的含有觸媒之聚矽氧樹脂液狀組成物,進行耐碎裂性評估。具體上,係藉由旋轉塗布,將含有觸媒之聚矽氧樹脂液狀組成物使膜厚成為50μm之方式成膜在無鹼玻璃基板上。將成膜後的玻璃基板放置於40℃溫度的烤箱內10分鐘,接著放置於160℃的烤箱內3小時,進行樹脂硬化。 The chipping resistance of the obtained catalyst-containing polyoxyl resin liquid composition was evaluated. Specifically, a liquid composition of a polyoxyl resin containing a catalyst was spin-coated to form a film on an alkali-free glass substrate so as to have a film thickness of 50 μm. The film-formed glass substrate was placed in an oven at a temperature of 40 ° C for 10 minutes, and then placed in an oven at 160 ° C for 3 hours to cure the resin.
然後,觀察自烤箱取出的玻璃基板之結果,將實施例 1中所得的聚矽氧樹脂液狀組成物熱硬化之膜(樹脂硬化膜),並無碎裂而良好。相對於此,將比較例1中所得的聚矽氧樹脂液狀組成物熱硬化之膜(樹脂硬化膜),則產生碎裂。 Then, observing the result of the glass substrate taken out from the oven, the embodiment will be The film thermally cured by the liquid composition of the polyoxyxylene resin obtained in the first embodiment (resin cured film) was not broken and was good. On the other hand, when the film (resin cured film) which hardened the liquid composition of the polyxanthoxy resin obtained in the comparative example 1 was fractured, it fractured.
<硫化物耐性評估> <Sulphide tolerance evaluation>
對於所得的含有觸媒之聚矽氧樹脂液狀組成物,進行硫化物耐性(對硫化氫氣體之阻隔性)評估。具體上,首先準備已成膜膜厚10nm之鉻膜、其上為膜厚100nm之銀膜的無鹼玻璃基板(銀膜玻璃基板),以可在其上使含有各觸媒之聚矽氧樹脂液狀組成物成為膜厚20μm之條件旋轉塗布,藉由在40℃下進行10分鐘的熱處理,接著在160。℃下進行3小時的熱處理,使樹脂硬化膜成膜在銀膜上。 Sulfate resistance (barrier to hydrogen sulfide gas) was evaluated for the obtained catalyst-containing polyoxyl resin liquid composition. Specifically, first, a chromium film having a film thickness of 10 nm and an alkali-free glass substrate (silver film glass substrate) having a silver film having a thickness of 100 nm thereon are prepared, so that the polysiloxane containing each catalyst can be made thereon. The resin liquid composition was spin-coated under the conditions of a film thickness of 20 μm, and heat-treated at 40 ° C for 10 minutes, followed by 160. The heat treatment was performed at ° C for 3 hours to form a resin cured film on the silver film.
將已成膜此樹脂硬化膜的銀膜玻璃基板與未形成任何膜之銀膜玻璃基板,以硫化氫濃度2至6ppm、溫度85至90℃、相對濕度90%以上之密閉環境下,放置90分鐘。 The silver film glass substrate on which the resin cured film has been formed and the silver film glass substrate on which no film is formed are placed in a sealed environment having a hydrogen sulfide concentration of 2 to 6 ppm, a temperature of 85 to 90 ° C, and a relative humidity of 90% or more. minute.
其結果是,未形成任何膜之銀膜玻璃基板因受到硫化氫的腐蝕而變成黑色。另一方面,將實施例1、比較例1中所得的各聚矽氧樹脂液狀組成物上添加硬化用觸媒者成膜之銀膜玻璃基板,則均完全不變色。 As a result, the silver film glass substrate in which no film is formed becomes black due to corrosion by hydrogen sulfide. On the other hand, the silver film glass substrates which were formed by adding the catalyst for curing to each of the polyoxynoxy resin liquid compositions obtained in Example 1 and Comparative Example 1 were completely discolored.
(級別2) (Level 2)
將具有前述式(1)表示的有機聚矽氧烷結構之樹脂(A-1)(Mw=3,500,前述式(1)中,R1=甲基、R2=甲氧基或羥基)(以下,稱為樹脂(A-1))與具有前述式(2)表示的有機聚 矽氧烷結構之寡聚物(B-1)(Mw=450,前述式(2)中,R1=甲基、R2=甲氧基)(以下,稱為樹脂(B-1))混合後,獲得聚矽氧樹脂液狀組成物(α 1)。 A resin (A-1) having an organopolyoxyalkylene structure represented by the above formula (1) (Mw=3,500, in the above formula (1), R 1 =methyl group, R 2 =methoxy group or hydroxyl group) ( Hereinafter, it is referred to as a resin (A-1) and an oligomer (B-1) having an organopolyoxyalkylene structure represented by the above formula (2) (Mw=450, in the above formula (2), R 1 = After mixing methyl group and R 2 = methoxy group (hereinafter referred to as resin (B-1)), a liquid composition (α 1 ) of a polyoxyxylene resin is obtained.
將前述樹脂(A-1)之重複單元的存在比表示於表3中。將前述寡聚物(B-1)之重複單元的存在比表示於表4中。 The existence ratio of the repeating unit of the aforementioned resin (A-1) is shown in Table 3. The existence ratio of the repeating unit of the aforementioned oligomer (B-1) is shown in Table 4.
對於樹脂(A-1)及寡聚物(B-1)之重複單元的 存在比,係對於樹脂(A-1)及寡聚物(B-1)以上述之測定條件測定29Si-NMR而求得。 The ratio of the existence of the repeating unit of the resin (A-1) and the oligomer (B-1) was determined by measuring the 29 Si-NMR of the resin (A-1) and the oligomer (B-1) under the above-described measurement conditions. And ask for it.
樹脂(A-1),係相對於依本說明書中定義之 A1矽原子、A2矽原子與A3矽原子的合計含量,前述A3矽原子的含量之比例為77%。 Resin (A-1), as defined in the specification The total content of the A1 ruthenium atom, the A2 ruthenium atom and the A3 ruthenium atom is 77% in the content of the A3 ruthenium atom.
A2矽原子的含量與前述A3矽原子的含量之比,係[A2 矽原子的含量]:[A3矽原子的含量]=1:3.35。 The ratio of the content of A2 germanium atom to the content of the aforementioned A3 germanium atom is [A2 The content of ruthenium atoms]: [A3 矽 atomic content] = 1: 3.35.
寡聚物(B-1),係相對於依本說明書中定義 之A1矽原子、A2矽原子與A3矽原子的合計含量,前述A3矽原子的含量之比例為12%。 Oligomer (B-1), as defined in the specification The total content of the A1矽 atom, the A2矽 atom and the A3矽 atom, and the ratio of the A3矽 atom content is 12%.
具體上,係在已設置於油浴內的燒瓶內, 加入前述樹脂(A-1)311g及異丙醇190g,加熱攪拌至內溫成為85℃,使前述樹脂(A-1)溶解。接著,在溶解後的混合物中加入前述寡聚物(B-1)78g,攪拌1小時以上使前述寡聚物(B-1)溶解,獲得混合物。 Specifically, in a flask that has been placed in an oil bath, 311 g of the above-mentioned resin (A-1) and 190 g of isopropyl alcohol were added, and the mixture was heated and stirred until the internal temperature became 85 ° C to dissolve the resin (A-1). Next, 78 g of the above oligomer (B-1) was added to the dissolved mixture, and the mixture was stirred for 1 hour or more to dissolve the oligomer (B-1) to obtain a mixture.
在獲得的混合物中,加入醋酸2-丁氧基乙酯123g及3-去水甘油氧基丙基三甲氧基矽烷(矽烷耦合劑)0.1g之後,利用蒸發器,以溫度70℃、壓力4kPaA的條件,餾除異丙醇直至異丙醇濃度成為1質量%以下,獲得前述樹脂(A-1)與前述寡聚物(B1)之混合比為80:20的聚矽氧樹脂液狀組成物(α 1)。 To the obtained mixture, after adding 123 g of 2-butoxyethyl acetate and 0.1 g of 3-dehydroglyceryloxypropyltrimethoxydecane (decane coupling agent), the temperature was 70 ° C and the pressure was 4 kPa A using an evaporator. The isopropyl alcohol is distilled off until the isopropyl alcohol concentration is 1% by mass or less, and a liquid composition of the polyoxyxylene resin having a mixing ratio of the resin (A-1) and the oligo (B1) of 80:20 is obtained. (α 1).
所得的聚矽氧樹脂液狀組成物(α 1)之29Si-NMR測定的結果,相對於來自矽原子的全訊號,來自A3矽原子的訊號面積之比例為60%。第1圖中,表示聚矽氧樹脂液狀組成物(α 1)之29Si-NMR圖。聚矽氧樹脂液狀組成物(α 1)中,不含有烯基及氫矽基。 As a result of 29 Si-NMR measurement of the obtained polyoxyxylene resin liquid composition (α 1), the ratio of the signal area from the A3 germanium atom was 60% with respect to the total signal from the germanium atom. In the first drawing, a 29 Si-NMR chart of the polyoxyxylene resin liquid composition (α 1) is shown. The polyoxynene resin liquid composition (α 1) does not contain an alkenyl group or a hydroquinone group.
相對於聚矽氧樹脂液狀組成物(α 1)100質 量份,添加含有磷酸15%的硬化用觸媒1質量份,充分攪拌混合後獲得聚矽氧樹脂液狀組成物(α 1-1),然後將所得的聚矽氧樹脂液狀組成物(α 1-1)約5g投入鋁製杯中,在烤 箱中以5℃/分鐘的速度由室溫昇溫至150℃,以150℃放置3小時後,獲得聚矽氧樹脂液狀組成物(α 1-1)之硬化物。所得的硬化物之比重是1.27。 Compared with polyoxyl resin liquid composition (α 1) 100 quality In an amount of 1 part by mass of a hardening catalyst containing 15% phosphoric acid, the liquid composition (α 1-1) of the polyxanthoxy resin was obtained by thorough stirring and mixing, and then the obtained liquid composition of the polyoxyl resin was obtained ( α 1-1) about 5g into an aluminum cup, baked The temperature was raised from room temperature to 150 ° C at a rate of 5 ° C /min, and left at 150 ° C for 3 hours to obtain a cured product of the polyoxyxylene resin liquid composition (α 1-1). The specific gravity of the obtained hardened material was 1.27.
[實施例3] [Example 3]
將實施例2中使用的樹脂(A-1)354g加入異丙醇190g中,加熱攪拌直至內溫成為85℃,使前述樹脂(A-1)溶解於異丙醇中。接著,在溶解後的混合物中,同樣地加入實施例2中使用的寡聚物(B-1)35g,然後,加入不同於本說明書中的樹脂A及寡聚物B之市售聚矽氧化合物3.8g,攪拌1小時以上使其溶解。 354 g of the resin (A-1) used in Example 2 was added to 190 g of isopropyl alcohol, and the mixture was stirred under heating until the internal temperature became 85 ° C, and the resin (A-1) was dissolved in isopropyl alcohol. Next, 35 g of the oligomer (B-1) used in Example 2 was similarly added to the dissolved mixture, and then, commercially available polyoxyl oxide different from the resin A and the oligomer B in the present specification was added. 3.8 g of the compound was dissolved by stirring for 1 hour or more.
使用的聚矽氧化合物,係相對於A1矽原子、A2矽原子與A3矽原子的合計含量,前述A3矽原子的含量之比例為0%以上未達30%,且重量平均分子量超過8,000、15,000以下之樹脂。 The polyoxyxene compound used is a total content of the A1矽 atom, the A2矽 atom and the A3矽 atom, and the ratio of the A3矽 atom content is 0% or more and less than 30%, and the weight average molecular weight exceeds 8,000, 15,000. The following resins.
然後,進行與實施例2同樣的處理,獲得樹脂(A-1)與寡聚物(B-1)的混合比為100:10之聚矽氧樹脂液狀組成物(α 2)。 Then, the same treatment as in Example 2 was carried out to obtain a polyoxyxylene resin liquid composition (α 2) having a mixing ratio of the resin (A-1) and the oligomer (B-1) of 100:10.
所得的聚矽氧樹脂液狀組成物(α 2)之29Si-NMR測定的結果,係相對於來自矽原子的全訊號時,來自A3矽原子的訊號面積之比例為65%。第2圖中,表示聚矽氧樹脂液狀組成物(α 2)之29Si-NMR圖。聚矽氧樹脂液狀組成物(α 2)中,不含有烯基及氫矽基。 As a result of 29 Si-NMR measurement of the obtained polyoxyxylene resin liquid composition (α 2 ), the ratio of the signal area from the A3 germanium atom was 65% with respect to the total signal from the germanium atom. In Fig. 2, a 29 Si-NMR chart of the polyoxyxylene resin liquid composition (?2) is shown. The polyoxynene resin liquid composition (α 2) does not contain an alkenyl group or a hydroquinone group.
相對於聚矽氧樹脂液狀組成物(α 2)100質量份,添加含有磷酸15%的硬化用觸媒2質量份,以與實 施例2相同的條件獲得聚矽氧樹脂液狀組成物之硬化物。所得的硬化物之比重是1.26。 2 parts by mass of a curing catalyst containing 15% phosphoric acid is added to 100 parts by mass of the polyoxyl resin liquid composition (α 2 ). The cured product of the polyoxyxylene resin liquid composition was obtained under the same conditions as in Example 2. The specific gravity of the obtained hardened material was 1.26.
[比較例2] [Comparative Example 2]
將下述式(A)表示的聚矽氧樹脂X1(Mw=5,100)與下述式(B)表示的聚矽氧樹脂X2(Mw=2,100),以X1:X2=1:4(質量比)混合,在其中加入含鉑的觸媒,獲得聚矽氧樹脂液狀組成物(β 1) Polyoxyxylene resin X1 (Mw=5,100) represented by the following formula (A) and polyoxyxylene resin X2 (Mw=2,100) represented by the following formula (B), X1:X2=1:4 (mass ratio) Mixing, adding a platinum-containing catalyst to obtain a liquid composition of polyoxyxylene resin (β 1)
聚矽氧樹脂X1的29Si-NMR測定結果,係相對於來自矽原子的全訊號,來自A3矽原子的訊號面積之比例為8%。第3圖中,表示聚矽氧樹脂X1之29Si-NMR圖。 As a result of 29 Si-NMR measurement of the polyoxyxylene resin X1, the ratio of the signal area from the A3 germanium atom was 8% with respect to the total signal from the germanium atom. In Fig. 3, a 29 Si-NMR chart of polyoxyxylene resin X1 is shown.
聚矽氧樹脂X2的29Si-NMR測定結果,係相對於來自矽原子的全訊號,來自A3矽原子的訊號面積之比例為60%。第4圖中,表示聚矽氧樹脂X2之29Si-NMR圖。 As a result of 29 Si-NMR measurement of the polyoxyxylene resin X2, the ratio of the signal area from the A3 germanium atom was 60% with respect to the total signal from the germanium atom. In Fig. 4, a 29 Si-NMR chart of polyoxyxylene resin X2 is shown.
所得的聚矽氧樹脂液狀組成物(β 1)之來自矽原子的全訊號之中,來自A3矽原子的訊號面積,由式(A)表示的聚矽氧樹脂X1與式(B)表示的聚矽氧樹脂X2之混合比例計算出是50%。 Among the total signals derived from the ruthenium atom of the obtained liquid composition of the polyoxyxylene resin (β 1 ), the signal area from the atom of A3 is represented by the polyoxyl resin X1 represented by the formula (A) and the formula (B) The mixing ratio of the polyoxyl resin X2 was calculated to be 50%.
在鋁製杯內投入聚矽氧樹脂液狀組成物(β 1)約5g,在烤箱中以5℃/分鐘的速度由室溫昇溫至150℃,並以150℃保溫4小時後,獲得聚矽氧樹脂液狀組成物(β 1)之硬化物。所得的硬化物之比重是1.18。 A liquid composition (β 1 ) of polyoxyl resin was placed in an aluminum cup to about 5 g, and the temperature was raised from room temperature to 150 ° C at a rate of 5 ° C/min in an oven, and held at 150 ° C for 4 hours to obtain a poly A cured product of a liquid composition of a silicone resin (β 1 ). The specific gravity of the obtained hardened material was 1.18.
<硫化物耐性評估1> <Sulphide tolerance evaluation 1>
對於聚矽氧樹脂液狀組成物(α 1-1)、聚矽氧樹脂液狀組成物(α 2)及聚矽氧樹脂液狀組成物(β 1),進行對硫化氫氣體之阻隔性的評估。 For the polyoxynene resin liquid composition (α 1-1), the polyoxymethylene resin liquid composition (α 2), and the polyoxyxylene resin liquid composition (β 1), the barrier property against hydrogen sulfide gas is performed. evaluation of.
具體上,首先係準備已成膜膜厚10nm之鉻膜、其上為形成膜厚100nm之銀膜的無鹼玻璃基板(銀膜玻璃基板),在其上以使各聚矽氧樹脂組成物成為膜厚20μm之條件旋轉塗布,藉由以與實施例2中的聚矽氧樹脂液狀組成物之硬化物的製造的相同條件進行熱處理,使聚矽氧樹脂液狀組成物之硬化物在銀膜上成膜。 Specifically, first, a chromium film having a film thickness of 10 nm and an alkali-free glass substrate (silver film glass substrate) on which a silver film having a thickness of 100 nm is formed are prepared thereon, so that each polyoxyn resin composition is formed thereon. The material was spin-coated under the conditions of a film thickness of 20 μm, and heat treatment was carried out under the same conditions as those of the cured product of the liquid composition of the polyoxynoxy resin in Example 2, whereby the cured product of the liquid composition of the polyoxyxylene resin was Film formation on the silver film.
將聚矽氧樹脂液狀組成物之硬化物成膜的銀膜玻璃基板2片與聚矽氧樹脂液狀組成物之硬化物未成膜之附有銀膜之玻璃基板1片,以硫化氫氣體濃度2至 6ppm、溫度85至90°、相對濕度90%以上的環境下,放置90分鐘。 One piece of a silver film glass substrate formed by forming a cured product of a liquid composition of a polyoxyn resin, and a glass substrate with a silver film not formed by a cured product of a liquid composition of a polyoxymethylene resin, with hydrogen sulfide gas Concentration 2 to Placed in an environment of 6 ppm, a temperature of 85 to 90°, and a relative humidity of 90% or more, for 90 minutes.
其結果是,聚矽氧樹脂液狀組成物(α 1-1) 或聚矽氧樹脂液狀組成物(α 2)之硬化物成膜的銀膜,係與放置前幾乎是無變化的,但聚矽氧樹脂液狀組成物(β 1)之硬化物成膜的銀膜,以及未使硬化物成膜之銀膜,則因受到硫化氫的腐蝕而變成黑色。 As a result, the polyoxyl resin liquid composition (α 1-1) Or the silver film formed by the hardening of the liquid composition of the polyoxyxylene resin (α 2 ) is almost unchanged before being placed, but the cured film of the liquid composition of the polyoxyxylene resin (β 1) is formed. The silver film and the silver film which does not form a cured film become black due to corrosion by hydrogen sulfide.
<硫化物耐性評估2> <Sulphide tolerance evaluation 2>
對於聚矽氧樹脂液狀組成物(α 2),進行對硫化氫氣體之阻隔性的評估。 For the polyoxyxylene resin liquid composition (α 2 ), the barrier property against hydrogen sulfide gas was evaluated.
具體上,係在已將銀的反射膜鍍覆成膜於 該封裝體底部的市售之半導體發光元件用樹脂製封裝體SMD-3602B(松下半導體元件(蘇州)有限公司製)上,使完全覆蓋銀的反射膜之方式滴入聚矽氧樹脂液狀組成物(α 2),然後,藉由以與實施例2中的聚矽氧樹脂液狀組成物之硬化物的製造之相同條件進行熱處理,在封裝體內作成前述聚矽氧樹脂液狀組成物之硬化物。 Specifically, the silver reflective film has been plated into a film. A resin package SMD-3602B (manufactured by Matsushita Semiconductor Components Co., Ltd.), which is a commercially available semiconductor light-emitting device at the bottom of the package, is dropped into a liquid crystal of a polyoxyl resin by completely reflecting a silver-reflecting film. The material (α 2) is then subjected to heat treatment under the same conditions as those of the cured product of the liquid composition of the polyoxyxylene resin of Example 2, and the liquid composition of the polyoxyxylene resin is formed in the package. Hardened material.
在硫化氫濃度2至6ppm、溫度85至90°、 相對濕度90%以上的密閉環境下,將此封裝體放置5小時。 At a hydrogen sulfide concentration of 2 to 6 ppm, a temperature of 85 to 90 °, The package was placed in a closed environment having a relative humidity of 90% or more for 5 hours.
其結果是,在使聚矽氧樹脂液狀組成物(α 2)硬化的封裝體中,封裝體底部的銀之反射膜幾乎無變化。 As a result, the polyxanthene resin liquid composition (α) 2) In the hardened package, the silver reflective film at the bottom of the package has almost no change.
<耐熱性評估> <heat resistance evaluation>
對於聚矽氧樹脂液狀組成物(α 1)、聚矽氧樹脂液狀組成物(α 2)及聚矽氧樹脂液狀組成物(β 1),進行耐熱性評 估。 Evaluation of heat resistance for liquid composition of polyoxyxylene resin (α 1), liquid composition of polyoxyxylene resin (α 2), and liquid composition of polyoxyxylene resin (β 1) estimate.
具體上,除了將液量調整成使厚度成為1mm 以外,其餘藉由以與實施例2中的聚矽氧樹脂液狀組成物之硬化物的製造之相同條件進行熱處理,獲得各聚矽氧樹脂液狀組成物之硬化物,自鋁製杯取出,測定波長400nm及350nm之透過率。然後將此等硬化物放置於200℃的烤箱中60分鐘之後,再測定相同波長之透過率。將結果表示於表5中。 Specifically, in addition to adjusting the liquid amount to a thickness of 1 mm The heat treatment was carried out under the same conditions as those of the cured product of the liquid composition of the polyoxyxylene resin of Example 2 to obtain a cured product of each liquid composition of the polyoxynoxy resin, which was taken out from the aluminum cup. The transmittances at wavelengths of 400 nm and 350 nm were measured. Then, the hardened materials were placed in an oven at 200 ° C for 60 minutes, and then the transmittance at the same wavelength was measured. The results are shown in Table 5.
聚矽氧樹脂液狀組成物(α 1)及聚矽氧樹脂 液狀組成物(α 2)之硬化物對各波長的透過率,在200℃的放置前後幾乎無變化,而聚矽氧樹脂液狀組成物(β 1)之硬化物則可明顯地見到透過率之變化,同時硬化物的外觀,是聚矽氧樹脂液狀組成物(α 2)之硬化物在200℃的放置前後為透明,而聚矽氧樹脂液狀組成物(β 1)之硬化物在200℃的放置前為透明,但放置後變成微黃色,200℃的環境使耐熱性惡化。 Polyoxyl resin liquid composition (α 1) and polyoxyl resin The transmittance of the cured product of the liquid composition (α 2 ) for each wavelength hardly changes before and after the placement at 200 ° C, and the cured product of the liquid composition of the polyoxyxylene resin (β 1 ) can be clearly seen. The change in transmittance, and the appearance of the cured product at the same time, is that the cured product of the liquid composition of the polyoxyxylene resin (α 2) is transparent before and after standing at 200 ° C, and the liquid composition of the polyphthalocyanine resin (β 1) The cured product was transparent before being placed at 200 ° C, but became yellowish after standing, and the environment at 200 ° C deteriorated heat resistance.
[比較例3] [Comparative Example 3]
除了不加入寡聚物(B-1)以外,其餘是藉由與實施例2的相同操作,獲得僅含有樹脂(A-1)作為聚矽氧樹脂成份之聚矽氧樹脂液狀組成物(β 3)。 A liquid composition of a polyoxyxylene resin containing only the resin (A-1) as a polyoxyxylene resin component was obtained by the same operation as in Example 2 except that the oligomer (B-1) was not added. β 3).
聚矽氧樹脂液狀組成物(β 3)經29Si-NMR測定所得之結果,來自A3矽原子的訊號面積在來自矽原子的全體訊號之中,係70%。 As a result of 29 Si-NMR measurement of the polyoxyxylene resin liquid composition (β 3 ), the signal area from the A 3 矽 atom was 70% in the total signal from the ruthenium atom.
第5圖中,表示聚矽氧樹脂液狀組成物(β 3)之29Si-NMR圖。在聚矽氧樹脂液狀組成物(β 3)中,不含有烯基及氫矽基。 In Fig. 5, a 29 Si-NMR chart of the polyoxyxylene resin liquid composition (?3) is shown. The polyoxynene resin liquid composition (β 3 ) does not contain an alkenyl group or a hydroquinone group.
相對於聚矽氧樹脂液狀組成物(β 3)100質 量份,添加含磷酸15%的硬化用觸媒2質量份,以與實施例2的相同條件獲得樹脂組成物之硬化物。所得的硬化物之比重是1.28。 Compared with polyoxyl resin liquid composition (β 3) 100 quality In a part by weight, 2 parts by mass of a curing catalyst containing 15% phosphoric acid was added, and a cured product of the resin composition was obtained under the same conditions as in Example 2. The specific gravity of the obtained hardened material was 1.28.
<耐碎裂性評估> <Fracture resistance evaluation>
對於聚矽氧樹脂液狀組成物(α 1-1)、聚矽氧樹脂液狀組成物(α 2)及聚矽氧樹脂液狀組成物(β 3),進行耐碎裂性評估。 The chipping resistance was evaluated for the polyoxynoxy resin liquid composition (α 1-1), the polyoxymethylene resin liquid composition (α 2 ), and the polyoxyxylene resin liquid composition (β 3 ).
具體上,係將此等各聚矽氧樹脂液狀組成 物滴在市售的半導體發光元件用樹脂製封裝體SMD-3602B之中使容器幾乎成為滿杯之後,在40℃溫度的烤箱內放置10分鐘,接著在150℃的烤箱內放置3小時,獲得前述各聚矽氧樹脂液狀組成物之硬化物。 Specifically, the liquid composition of each of the polyoxyl resins is The product was placed in a commercially available resin package SMD-3602B for a semiconductor light-emitting device, and the container was placed in an oven at a temperature of 40 ° C for 10 minutes, and then placed in an oven at 150 ° C for 3 hours. A cured product of each of the above polyoxyalkylene resin liquid compositions.
然後,觀察自烤箱取出之封裝體的結果, 聚矽氧樹脂液狀組成物(α 1-1)及聚矽氧樹脂液狀組成物(α 2)之硬化物並無碎裂而良好,而聚矽氧樹脂液狀組成物(β 3)之硬化物則產生碎裂。 Then, observe the results of the package taken out of the oven, The cured product of the liquid composition of the polyoxyxylene resin (α 1-1) and the liquid composition of the polyoxynoxy resin (α 2) is not cracked and is good, and the liquid composition of the polyoxyxylene resin (β 3) The hardened material is cracked.
本發明的聚矽氧樹脂液狀組成物,由於對硫化氫氣體之阻隔性及在如200℃的高溫中之耐熱性高,並且,硬化時的耐碎裂性亦優,故非常有效於作為半導體發光元件之密封材。 The polyxanthene resin liquid composition of the present invention is very effective because it has high barrier properties against hydrogen sulfide gas and high heat resistance at a high temperature such as 200 ° C, and excellent chipping resistance at the time of hardening. A sealing material for a semiconductor light emitting element.
本發明的聚矽氧樹脂液狀組成物,可給予耐熱性、耐碎裂性及對硫化氫氣體之阻隔性優異的聚矽氧樹脂液狀組成物之硬化物。因此,本發明的聚矽氧樹脂液狀組成物之硬化物,可供使用為半導體發光元件用密封材。 The polyxanthene resin liquid composition of the present invention can impart a cured product of a polyoxyxylene resin liquid composition excellent in heat resistance, chipping resistance, and barrier property against hydrogen sulfide gas. Therefore, the cured product of the polyoxyxylene resin liquid composition of the present invention can be used as a sealing material for a semiconductor light-emitting element.
由於本案的圖為實施例之29Si-NMR圖,並非本案的代表圖。故本案無指定代表圖。 Since the figure in the present case is the 29 Si-NMR chart of the embodiment, it is not a representative figure of the present case. Therefore, there is no designated representative map in this case.
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