TWI450851B - Testing and classifying machine for electronic elements - Google Patents

Description

Electronic component test sorter

The invention provides a electronic component test sorting machine which can utilize the variable distance carrier with different moving arms to effectively simplify the mechanism design of the moving arm, make the moving arm easy to assemble and assemble, and facilitate the addition of the pick and place device.

According to FIG. 1 , it is a schematic diagram of an electronic component test sorting machine, which is provided with a feeding device 10 in front of the machine table, and the feeding device 10 is provided with at least one receiving tray. 11. A plurality of electronic components to be tested are mounted, and a receiving device 20 is disposed behind the machine. The receiving device 20 is provided with a plurality of trays 21 having accommodating grooves for different grades. The electronic component is completed, and the test device 30 and the transport device 40 are disposed on the machine. The test device 30 is provided with a test circuit board 31 having a plurality of test sockets 32 for testing electronic components. The transport device 40 The first carrier 41 and the second carrier 42 are respectively disposed before and behind the testing device 30, and the first and second carriers 41 and 42 each have a plurality of positioning grooves 411 and 421. The first moving arm 43 is provided between the feeding and receiving device 10, 20 and the first and second carriers 41, 42 for holding the electronic component to be tested/tested, and the first moving arm 43 has a plurality of pick-and-place devices 431 for taking out the electronic components to be tested at the tray 11 of the feeding device 10 and transferring them to the first carrier 41 On the positioning slot 411, the measured electronic component can be taken out on the positioning slot 421 of the second carrier 42 and transferred to the tray 21 of the receiving device 20, and the conveying device 40 is attached to the testing device. The second transfer arm 44 and the third transfer arm 45 are disposed above the 30, and the second transfer arm 44 has a plurality of pickers 441 for taking out at the positioning groove 411 of the first carrier 41. The electronic component is measured and transferred to the test socket 32 of the test device 30 to perform a test operation. The third transfer arm 45 also has a plurality of pick and placeers 451 for testing the test sockets 32 of the device 30. The measured electronic components are taken out and transferred to the positioning groove 421 of the second carrier 42 for output sorting.

However, due to the different sizes of the various types of electronic components, the spacing of the receiving slots of the loading tray is different, and the spacing of the test sockets for testing is different. When the testing sorter is to test different electronic components, the first, The pick-and-place 431, 441, 451 of the second and third transfer arms 43, 44, 45 can adjust the spacing so as to correspond to the spacing of the receiving slots of different trays and the distance between the test seats, in order to the tray and the test seat. The electronic component to be tested/completed is taken; therefore, please refer to FIGS. 2 and 3, taking the variable-distance first transfer arm 43 as an example, which is provided with a complex array Z-axis drive on the frame 432. The source 433 is configured to drive a driving plate 434 of the X-axis sliding slot 4341 for Z-axis displacement, and the X-axis sliding groove 4341 of each driving plate 434 is disposed for the roller 4311 of the pick-and-placer 431 to slide. The back side of each pick-and-place 431 is provided with a Z-axis slide rail 4312, and is slidably placed on a Z-axis slide 4351 of a slide plate 435, and each slide plate 435 is slid by the X-axis slide 4352. On the X-axis slide rails 4321 of the frame 432, and respectively connected to the X-axis drive source 436 behind the frame 432, the X-axis of each pick-and-placer 431 is adjusted. In the case of the spacing, the X-axis driving source 436 can be controlled to drive the sliding plates 435 to perform X-axis displacement, and each of the sliding plates 435 uses the Z-axis sliding seat 4351 and the Z-axis sliding rail 4312 to drive the pick-and-place 431 as the X-axis. For the displacement, the pick-and-placer 431 adjusts the pitch by the X-axis displacement of the roller 4311 along the X-axis sliding groove 4341. After adjusting the X-axis spacing of each pick-and-placer 431, the Z-axis drive can be controlled. The source 433 drives the driving plate 434 to perform Z-axis displacement, so that the driving plate 434 pushes the roller 4311 of the pick-and-place 431 with the X-axis sliding slot 4341, and drives the pick-and-placer 431 to perform Z-axis displacement to take the component; The overall mechanism design of the variable-distance shifting arm, the configuration and linkage relationship of each component is quite complicated, not only is not easy to manufacture and assemble, but also has a large volume and takes up space, but the test sorting machine is adapted to the receiving groove of different trays. The pitch and the distance between the test blocks, and the variable distance first transfer arm 43 must be provided between the supply and receiving devices 10, 20 and the first and second carriers 41, 42 and in the test device 30 and the first The second carrier 41 and 42 are provided with the variable-distance first and second transfer arms 44 and 45, which greatly increases the equipment cost and is disadvantageous. In the absence of the space configuration of the machine, in addition, the operator wants to add a plurality of pick-and-place 431, 441, 451 (for example, 8 pick-and-placers) arranged in parallel with the Y-axis in order to improve the working capacity of the pick-and-place components, that is, The first row, the second and the third transfer arms 43 , 44 , 451 can adjust the XY axial spacing, but in the first, second and third transfer arms 43 , 44 , 45 When the overall mechanism design is quite complicated, if the multi-column pick and place device is added, and the multi-column pick and place device can be used for XYZ axial displacement, not only the addition of the multi-column pick and place device is difficult, but the overall mechanism design is bound to be more It is not easy to make and assemble, and it greatly increases the cost.

An object of the present invention is to provide an electronic component test sorting machine, comprising a feeding device, a receiving device, a testing device and a conveying device, the feeding device is for accommodating a plurality of electronic components to be tested, and the receiving device is for receiving a plurality of electronic components. a test device with a plurality of test sockets for testing electronic components, the transport device is provided with at least two transfer arms of a plurality of pick and place devices and at least A variable-distance carrier, wherein a plurality of pick-and-place devices of each moving arm are used for transferring electronic components to be tested/finished, and the carrier is provided with at least two sockets, and is provided with a variable-distance mechanism for Adjusting at least one axial spacing of the two sockets for a plurality of pick-and-placers of the second transfer arm to accurately pick up the electronic components to be tested/completed on the second carrier of the carrier; The distance carrier is equipped with different moving arms to simplify the mechanism design of the moving arm, and it is easy to manufacture, assemble, and reduce the volume, achieving substantial cost savings and practical benefits for space configuration.

A second object of the present invention is to provide an electronic component test sorting machine, wherein the variable distance carrier of the conveying device can make at least one axial variable pitch of each bearing seat for matching multiple pick and place of different moving arms. Conveniently transporting electronic components, no need to configure a complex variable-distance shifting arm, and it is easy to add multiple rows of pick-and-placers directly on the moving arm to increase the transfer efficiency and shorten the working time, thereby improving the performance. Practical benefits.

In order to make the reviewer further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, which will be described in detail later. Referring to Figures 4, 5 and 6, the electronic component test sorting machine of the present invention is attached to the machine. A feeding device 50 is provided in front of the table for holding the electronic components to be tested, and a receiving device 60 is provided behind the machine for holding the electronic components to be tested, and a testing device is arranged on the machine. 70, for testing electronic components, and a transport device 80 for transporting electronic components to be tested/tested, wherein the feeding device 50 is provided with at least one tray 501 having a plurality of volumes The receiving device 60 is provided with at least one tray 601, and the tray 601 has a plurality of receiving slots 602 for receiving the tested electronic components. The testing device is provided. The test system 72 has a test circuit board 71 with a test stand 72. The test stand 72 can be a normally open test stand or a normally closed test stand. In this embodiment, the test circuit board 71 is configured with four normally open. Type test stand 72 for simultaneously performing test operations of four electronic components and enabling the tester ( The figure is not shown) the test result is transmitted to a central control unit (not shown), and the central control unit controls the operation of each device. The conveying device 80 is provided with at least one variable distance carrier with a plurality of seats. And at least two moving arms of the plurality of pickers for transporting the electronic components to be tested/tested between the feeding device 50, the receiving device 60 and the testing device 70. In the embodiment, the conveying device The first carrier 81 is provided with a first carrier 81, and the first carrier 81 has at least two sockets, and a variable distance mechanism for adjusting the two sockets for at least one axial variable distance, and testing A second carrier 82 is disposed behind the device 70. The second carrier 82 also has at least two sockets, and a variable pitch mechanism for adjusting the two sockets by at least one axial variable distance. In the present embodiment, the first and second carriers 81 and 82 are active variable-distance carriers, and are respectively provided by the first and second loads. The driving source 83, 84 is driven to be X-axis displacement for transferring the electronic component to be tested/finished, taking the first carrier 81 as an example. A carrier 81 is provided with a carrier 811 on the first carrier driving source 83, and a plurality of sockets 812A, 812B, 812C, 812D and a variable pitch mechanism are disposed on the carrier 811, and the variable pitch mechanism is provided. There are a plurality of Y-axis members 813A, 813B, 813C, and 813D, and each of the Y-axis members 813A, 813B, 813C, and 813D can be respectively moved in the X-axis relative displacement of the movable type, or a Y-axis member. 813B is used as a fixed reference member, and the other Y-axis members 813A, 813C, and 813D are X-axially displaced with respect to the Y-axis member 813B. In this embodiment, a fixed type Y is provided on the carrier 811. The axial rod member 813B is provided with at least one X-axis driving source for driving the Y-axis rod members 813A, 813C, and 813D for X-axis displacement. In this embodiment, the X-axis driving source is provided. There is a motor 814 for driving the two X-axis pulley sets 815A, 815B, an upper belt of the X-axis pulley set 815A is available for assembling the Y-axis rod member 813A, and the lower belt is equipped with the Y-axis rod member 813C. The lower belt of the other X-axis pulley set 815B is used to assemble the Y-axis rod member 813D, so that the two X-axis pulley sets 815A, 815B can drive the Y-axis rod members 813A. 813C, 813D are X-axis displaced relative to the Y-axis member 813B, and the sockets 812A, 812B, 812C, and 812D can be respectively assembled on the Y-axis members 813A, 813B, 813C, and 813D, and the conveying device The 80 series is provided with a first transfer arm 85 capable of XYZ axial displacement between the supply and receiving devices 50, 60 and the first and second carriers 81, 82, and is fixed on the first transfer arm 85. In the embodiment, a plurality of pick-and-placers 851 are fixed on the first transfer arm 85, and the X-axis spacing of each pick-up 851 is relative to the trays 501 and 601. The X-axis spacing of each of the accommodating slots 502, 602 is used to transfer the electronic component to be tested/tested, and a second XYZ axial displacement is provided between the first carrier 81 and the testing device 70. A plurality of pickers 861 are fixed on the second transfer arm 86. In the embodiment, four pickers 861 are fixed on the second transfer arm 86. The X-axis spacing of the pick-and-place 861 is relative to the X-axis spacing of the test sockets 72 of the testing device 70 for transferring the electronic components to be tested, and between the second carrier 82 and the testing device 70. Can be used as XYZ axial The third transfer arm 87 is moved, and a plurality of pick-and-place devices 871 are fixed on the third transfer arm 87. In this embodiment, four pick-and-place devices are fixed on the third transfer arm 87. The X-axis spacing of each of the pickers 871 is relative to the X-axis spacing of the test sockets 72 of the test apparatus 70 for transferring the completed electronic components.

Referring to FIG. 7, when the X-axis spacing of each of the sockets 812A, 812B, 812C, and 812D is adjusted and enlarged, the first carrier 81 controls the motor 814 to drive the two X-axis pulley sets 815A, 815B to make the X-axis. Driving the Y-axis rod members 813A and 813C to the X-axis outward displacement of the Y-axis rod member 813B to the pulley set 815A, and driving the other X-axis pulley group 815B to drive the Y-axis rod member 813D relative to the Y-axis The X-axis is outwardly displaced to the rod member 813B, so that the Y-axis members 813A, 813C, and 813D drive the sockets 812A, 812C, and 812D to adjust the X-axis spacing; otherwise, refer to FIG. When the X-axis spacing of each of the sockets 812A, 812B, 812C, and 812D is, the first carrier 81 controls the motor 814 to drive the two X-axis pulley sets 815A, 815B to rotate in the opposite direction, so that the X-axis pulley set 815A drives Y. The axial rods 813A and 813C are axially displaced inward with respect to the Y-axis rod member 813B, and the other X-axis pulley group 815B is driven by the Y-axis rod member 813D with respect to the Y-axis member 813B. The axially inward displacement causes each Y-axis member 813A, 813C, 813D to drive the sockets 812A, 812C, 812D for X-axis spacing adjustment.

Referring to Figures 9, 10 and 11, another embodiment of the variable pitch carrier of the present invention, the first carrier 81 is provided with a first row of sockets 812A, 812B, 812C, 812D on the carrier 811. And the second row of sockets 812E, 812F, 812G, 812H, and the variable pitch mechanism, the variable pitch mechanism is provided with a plurality of Y axial rods 813A, 813B, 813C, 813D, and a plurality of X axial rods 816A 816B, and each Y-axis member 813A, 813B, 813C, 813D and the two X-axis members 816A, 816B have a height difference, and further a fixed Y-axis member 813B is disposed on the bracket 811, And a motor 814 is provided for driving the two X-axis pulley sets 815A, 815B, one of the X-axis pulley sets 815A, and the lower layer of the belts can be respectively equipped with Y-axis rods 813A, 813C, and another X-axis pulley The lower belt of the group 815B is used to assemble the Y-axis member 813D, so that the two X-axis pulley sets 815A, 815B can drive the Y-axis members 813A, 813C, and 813D to the X-axis with respect to the Y-axis member 813B. Displacement, and further, the sockets 812A, 812E can be assembled on the Y-axis rod member 813A, the sockets 812B, 812F are assembled on the Y-axis rod member 813B, and assembled on the Y-axis rod member 813C. Seat 812C, 812G, the sockets 812D, 812H are assembled on the Y-axis rod 813D, so that the Y-axis rods 813A, 813C, 813D can drive the sockets 812A, 812C, 812D and the second column of the first row. The seats 812E, 812G, and 812H are adjusted in the X-axis spacing, and the Y-axis driving source is disposed on the frame 811. The Y-axis driving source is provided with a motor 817 for driving a Y-axis pulley set 818. And on the Y-axis pulley set 818, the lower belt is respectively equipped with X-axis rods 816A, 816B, and can drive the X-axis rods 816A, 816B for Y-axis relative displacement, and then the X-axis rods The first row of seats 812A, 812B, 812C, and 812D are assembled on the 816A, and the second row of seats 812E, 812F, 812G, and 812H are assembled on the X-axis member 816B to make the two X-axis members 816A, The 816B can respectively drive the sockets 812A, 812B, 812C, and 812D of the first row and the sockets 812E, 812F, 812G, and 812H of the second row for the Y-axis spacing adjustment.

Referring to FIG. 12, in use, the conveying device 80 drives the plurality of pickers 851 to the feeding device 50 by the first moving arm 85, because the XY axial spacing of each picker 851 is fixed. The first shifting arm 85 can drive the plurality of pick and placers 851 for Z-axis displacement, and directly to the receiving slots 502 of the tray 501, with respect to the XY axial spacing of the receiving slots 502 of the tray 501. The electronic component 100 to be tested is taken out; referring to FIGS. 13 and 14, after the plurality of pick-and-place devices 851 of the first transfer arm 85 take out the electronic component 100 to be tested, the device is transferred to the first carrier 81. The first carrier 81 controls the motor 814 to drive the two X-axis pulley sets 815A, 815B, so that the two X-axis pulley sets 815A, 815B drive the Y-axis rods 813A, 813C, 813D relative to the Y-axis rod. The piece 813B is X-axis displaced so that each Y-axis member 813A, 813C, 813D drives the sockets 812A, 812C, 812D of the first row and the sockets 812E, 812G, 812H of the second row respectively along the X-axis rod The pieces 816A, 816B are adjusted for the X-axis spacing, and then the motor 817 is controlled to drive the X-axis pulley set 818, so that the X-axis pulley set 818 drives the X-axis rod member 816A, 816B is the Y-axis relative displacement, so that the X-axis rods 816A, 816B drive the sockets 812A, 812B, 812C, 812D of the first row and the sockets 812E, 812F, 812G, 812H of the second row along the Y-axis respectively The Y-axis spacing is adjusted to the rods 813A, 813B, 813C, and 813D, and the XY axes of the sockets 812A, 812B, 812C, and 812D of the first row and the sockets 812E, 812F, 812G, and 812H of the second row are further The spacing corresponds to the XY axial spacing of the pick-and-place 851 of the first moving arm 85, so that the pick-and-place 851 of the first moving arm 85 can accurately place the electronic component 100 to be tested on the first carrier 81. The first row of seats 812A, 812B, 812C, 812D and the second row of seats 812E, 812F, 812G, 812H; please refer to Figures 15, 16 because of the first and second moving arms 85, 86 The XY axial distances of the occupants 851 and 861 are different. When the first carrier driving source 83 drives the first carrier 81 to move to the front of the testing device 70, the first carrier 81 controls the motor 814 to drive the two X axes again. Each of the Y-axis members 813A, 813C, and 813D is axially displaced relative to the Y-axis member 813B to the pulley sets 815A, 815B, so that each Y-axis member 813A, 813C, 813 D drives the sockets 812A, 812C, 812D of the first row and the sockets 812E, 812G, 812H of the second row to adjust the X-axis spacing, and controls the motor 817 to drive the X-axis pulley set 818 to drive the X-axis rod 816A. 816B is the Y-axis relative displacement, so that the X-axis rods 816A, 816B drive the sockets 812A, 812B, 812C, 812D of the first row and the sockets 812E, 812F, 812G, 812H of the second row for the Y-axis The pitch adjustment further causes the XY axial spacing of the sockets 812A, 812B, 812C, 812D of the first row and the sockets 812E, 812F, 812G, 812H of the second row to correspond to the pick and placeers 861 of the second moving arm 86. The XY axial spacing is such that the pick-and-place 861 of the second moving arm 86 can accurately take out the electronic component 100 to be tested; please refer to FIG. 17, due to the XY axis of each pick-and-place 861 of the second moving arm 86 The pitch spacing corresponds to the XY axial spacing of the test sockets 72 of the test device 70, and the pick and placeers 861 of the second moving arm 86 can transfer the electronic components 100 to be tested into the test sockets 72. Each test stand 72 performs a test operation, and causes the test circuit board 71 to transmit the test signal to the tester, and the tester transmits the test result. The central control unit; referring to Fig. 18, after the test operation of the test socket 72 is completed, the XY axial spacing of each of the pick-and-placers 871 of the third moving arm 87 corresponds to the XY of each test socket 72 of the test device 70. The axial spacing is such that each of the pick-and-place 871 of the third moving arm 87 can take out the tested electronic component 100 in each test socket 72; please refer to FIGS. 19 and 20 for picking and placing in the third moving arm 87. After the device 871 takes out the measured electronic component 100, the second carrier driving source 84 drives the second carrier 82 to be displaced to the test device 70, and the second carrier 82 also drives the first column of the socket with the variable pitch mechanism. The 822A, 822B, 822C, 822D and the second row of seats 822E, 822F, 822G, 822H are adjusted for XY axial spacing, and may correspond to the respective pickers 871 of the third moving arm 87 for the third moving arm Each pick-and-place 871 of 87 can accurately place the completed electronic component 100 on the sockets 822A, 822B, 822C, 822D of the first row and the sockets 822E, 822F, 822G, 822H of the second row; 21, 22, after the second carrier 82 carries the tested electronic component 100, due to the first and third moving arms 85, 87 of the pick and place 85 1. The XY axial spacing of the 871 is different. When the second carrier driving source 84 carries the second carrier 82, the second carrier 82 drives the sockets 822A, 822B, and 822C of the first row again by the variable pitch mechanism. The 822D and the second row of seats 822E, 822F, 822G, and 822H are adjusted in XY axial spacing to correspond to the respective pickers 851 of the first moving arm 85, and the pick and placeers 851 of the first moving arm 85 are provided. The electronic component 100 can be accurately taken out; referring to FIG. 23, the pick-and-place 851 of the first moving arm 85 transfers the completed electronic component 100 to the receiving device 60, because the first moving arm 85 The XY axial spacing of each of the pickers 851 has been spaced relative to the XY axial spacing of the receiving slots 602 of the tray 601, such that the first moving arm 85 can drive the plurality of pick and placeers 851 for Z-axis displacement. And according to the test result (such as good electronic components, defective electronic components or secondary electronic components), the completed electronic components 100 are directly placed in the receiving slots 602 of the tray 601 to complete the classification and storage. operation.

Accordingly, the electronic component test sorting machine of the present invention can simplify the design of the mechanism, is easy to manufacture and assemble, and is easy to add a pick and place device, thereby saving cost and improving the use efficiency, and is actually a practical and progressive design. See the same products and publications open to allow for the invention patent application requirements, and apply in accordance with the law.

[Literature]

10. . . Feeding device

11. . . Trays

20. . . Receiving device

twenty one. . . Trays

30. . . Test device

31. . . Test board

32. . . Test stand

40. . . Conveyor

41. . . First vehicle

411. . . Positioning slot

42. . . Second vehicle

421. . . Positioning slot

43. . . First transfer arm

431. . . Pick and place

4311. . . Wheel

4312. . . Z axial slide

432. . . frame

4321. . . X axial slide

433. . . Z axial drive source

434. . . Drive plate

4341. . . X axial chute

435. . . Sliding plate

4351. . . Z axial slide

4352. . . X axial slide

436. . . X-axis drive source

44. . . Second transfer arm

441. . . Pick and place

45. . . Third transfer arm

451. . . Pick and place

[this invention]

50. . . Feeding device

501. . . Trays

502. . . Locating slot

60. . . Receiving device

601. . . Trays

602. . . Locating slot

70. . . Test device

71. . . Test board

72. . . Test stand

80. . . Conveyor

81. . . First vehicle

811. . . Shelf

812A, 812B, 812C, 812D, 812E, 812F, 812G, 812H. . . Seat

813A, 813B, 813C, 813D. . . Y axial rod

814. . . motor

815A, 815B. . . X-axis pulley set

816A, 816B. . . X axial rod

817. . . motor

818. . . Y axial pulley set

82. . . Second vehicle

822A, 822B, 822C, 822D, 822E, 822F, 822G, 822H. . . Seat

83. . . First carrier drive source

84. . . Second carrier drive source

85. . . First transfer arm

851. . . Pick and place

86. . . Second transfer arm

861. . . Pick and place

87. . . Third transfer arm

871. . . Pick and place

100. . . Electronic component

Figure 1: Configuration diagram of each device of the test test sorter.

Figure 2: Front view of the conventional transfer arm.

Figure 3: Side view of the conventional transfer arm.

Figure 4: Configuration diagram of each device of the test sorting machine of the present invention.

Figure 5: Top view of the carrier of the present invention.

Figure 6: Front view of the vehicle of the present invention.

Figure 7: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets (1).

Figure 8: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets (2).

Figure 9 is a plan view of another embodiment of the carrier of the present invention.

Figure 10: Front view of another embodiment of the carrier of the present invention.

Figure 11 is a side elevational view of another embodiment of the carrier of the present invention.

Fig. 12 is a schematic view showing the use of another embodiment of the test sorting machine of the present invention (1).

Figure 13 is a schematic view showing the use of another embodiment of the test sorter of the present invention (2).

Figure 14: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets.

Figure 15 is a schematic view showing the use of another embodiment of the test sorting machine of the present invention (3).

Figure 16: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets.

Figure 17: Schematic diagram of the use of another embodiment of the test sorter of the present invention (4).

Figure 18: Schematic diagram of the use of another embodiment of the test sorter of the present invention (5).

Figure 19: Schematic diagram of the use of another embodiment of the test sorter of the present invention (vi).

Figure 20: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets.

Figure 21: Schematic diagram of the use of another embodiment of the test sorter of the present invention (7).

Figure 22: Schematic diagram of the use of the carrier of the present invention to adjust the spacing of the sockets.

Figure 23: Schematic diagram of the use of another embodiment of the test sorter of the present invention (VIII).

50. . . Feeding device

501. . . Trays

502. . . Locating slot

60. . . Receiving device

601. . . Trays

602. . . Locating slot

70. . . Test device

71. . . Test board

72. . . Test stand

80. . . Conveyor

81. . . First vehicle

82. . . Second vehicle

83. . . First carrier drive source

84. . . Second carrier drive source

85. . . First transfer arm

851. . . Pick and place

86. . . Second transfer arm

861. . . Pick and place

87. . . Third transfer arm

871. . . Pick and place

Claims (10)

An electronic component testing and classifying machine comprises: a machine table; a feeding device: configured on the machine platform for accommodating a plurality of electronic components to be tested; and a receiving device: configured on the machine platform for accommodating a plurality of The tested electronic device; the test device is disposed on the machine table, and is provided with a test circuit board having a plurality of test sockets for testing electronic components; and the conveying device is disposed on the machine platform and has at least one a variable pitch carrier, and at least two first and second transfer arms of the plurality of pick and place arms, wherein the plurality of pick and place arms of the first and second transfer arms are used for transferring electronic components, the carrier is tied to The first and second rows of sockets are arranged on the frame, and a variable pitch mechanism is provided for adjusting at least one axial spacing of the first and second rows of seats for a plurality of picking and placing of the first and second moving arms The device can accurately pick and place electronic components on the first and second rows of the carrier, and the variable pitch mechanism is provided with a plurality of Y-axis members and at least one X-axis member, and the Y-axis is Having a height difference between the rod member and the at least one X-axis rod member for mounting the first and second row of sockets, and The rack is provided with at least one X-axis driving source, and the X-axis driving source is provided with a motor for driving at least one X-axis pulley set, and driving the Ys with the at least one X-axis pulley set The axial rod is X-axis displaced to adjust the X-axis spacing of the first and second rows of seats; the central control unit is used to control and integrate the various devices to perform automated operations. The electronic component test sorting machine according to claim 1, wherein the feeding device is provided with at least one receiving tray for receiving the electronic component to be tested. The electronic component testing and sorting machine according to claim 1, wherein the receiving device is provided with a plurality of trays having receiving slots for receiving the electronic components of different test results. The electronic component testing and sorting machine according to claim 1, wherein the variable distance carrier of the conveying device is provided with a carrier, and a plurality of bearing and variable pitch mechanisms are arranged on the carrier, The variable distance mechanism is provided with a plurality of Y-axis members, and a socket is respectively arranged on each Y-axis member, and at least one X-axis driving source is provided on the frame for driving each Y The axial rods are X-axially displaced to adjust the X-axis spacing of the respective sockets. The electronic component test sorting machine according to claim 4, wherein the X-axis driving source is provided with a motor for driving the two X-axis pulley sets, and driving the two X-axis pulley sets respectively. The Y-axis member is X-axis displaced relative to a fixed Y-axis member. The electronic component test sorting machine according to claim 1, wherein the variable pitch mechanism is provided with a plurality of X-axis rod members, and each of the Y-axis rod members and each of the X-axis rod members is provided. The height difference is provided, and at least one Y-axis driving source is provided for driving the X-axis rods to perform Y-axis displacement to adjust the Y-axis spacing of the first and second rows of seats. The electronic component test sorting machine according to claim 6, wherein the Y-axis driving source is provided with a motor for driving the Y-axis pulley set, and driving the plurality of X-axis by the Y-axis pulley set The Y-axis relative displacement is made to the rod. The electronic component testing and sorting machine according to claim 1, wherein the conveying device is provided with a carrier driving source on the machine table for driving the carrier to be displaced. The electronic component test sorting machine according to claim 1, wherein the carrier of the transport device is fixed on the machine. The electronic component testing and sorting machine according to claim 1, wherein the conveying device is provided with first and second moving arms capable of axial displacement of XYZ, and the first moving arm is fixed with a plurality of Pick and place device for feeding and receiving The electronic component to be tested/tested is transferred between the carriers, and the second moving arm is fixed with a plurality of pick and place devices for transferring the electronic components to be tested/tested between the test device and the carrier. .