TWI227497B - A four functions in one tool for testing, repairing, recording and analyzing - Google Patents

Abstract

A four functions in one tool for testing, repairing, recording and analyzing an NAND-type flash is composed of a main board, a transforming board and application program saving in a personal computer. The main board is saved with all testing, repairing, recording and analyzing software for an NAND-type flash. The transforming board can receive a packaged NAND-type flash and can be connected to the main board. Using the application program in personal computer to connect with the main board, this tool can complete the testing, repairing, recording and analyzing functions for the NAND-type flash on the transforming board.

Description

Five-month revision [Technical field to which the invention belongs] Especially one, which is about a device for testing flash memory between NAND f 'said that the strong seed can have test, repair, burn and analyze NAND flash memory Body foot I set. [Prior art] Even if the US body (f USh mem ° ry) is a non-volatile body, P makes it easy to understand the "health" after the power is turned off.

Dram or SRAM ": =: two can still save 4 same :: to save the stored data. Same as •, fast flash; a special e will not consume a lot of electricity when used 5; :: 占; 大 t; write private. Because of these advantages, the faster, it can be used in the same equipment, such as cameras, with beans, is widely used less than memory cards. The bun game console, small computer, and workstation are flashing .... There are two types of memory. One λ τ is a NAND type, which is based on the memory #; 隹, &方# 工 / 、 Input / wheel 屮 rain soil, ^ τ address and data, and pass through this wheel in / wheel out ☆ ν to transmit the finger / specific control signal resolution value,! 1 bus (BUS) And the materials that make you want.

Flash memory is sorted by one of the turn-in / kiss. Among them, the AND address and data are transmitted through this round-robin / recognition bus to send instructions, and a specific control signal is distinguished by the value #BUS (BUS) to use the desired data. Summary of the Invention 1 ^ ·

Technical problem to be solved: The application of NAND flash memory (NAND flash) is becoming more and more widespread, especially digital cameras, mobile phones, etc., which require a large amount of memory to store data, are even more important. On the one hand, these vendors enjoy the benefits of high capacity and low price brought by the NAND flash flash memory, but on the other hand, they must face the difficulty that the gjNAND flash memory is difficult to manipulate and the defect rate is often unexpectedly high + Brother. Therefore, how to provide a four-function test, repair, programming, and analysis functions on the same detection device is the main scope of the present invention. Technical means to solve the problem:

In view of the lack of known technology, the present invention designs a brand new NAND afh test tool, which is used to complete the test, repair, programming and analysis functions in a four-in-one device, and the device has a host Board and a p = different package adapter board, the software embedded in the motherboard and the ^ operating interface are used for testing to achieve the effect of fast testing and no K buckle. Contrast with the effect of the prior art The main effect of this test is to provide a kind of nand gate flash memory test

I22749f Zhengma, deposit # 号 月 卯 1 Correction Θ V. Description of the invention (3) Test / repair / burning / analysis of the requirements of the four, for the industry to remove from the production line :: f is sufficient for the industry It can be repaired to the best state, and it can be repaired to the best state. If it can be repaired, it can improve the yield rate of the industry and reduce the cost. The present invention further selects four types of tantalum / repair / burning / analysis. For flash memory testing between planes, it can be fast through the _ interface; 'm as a writer makes the burning time of a large program, improves the program to be burned and the rate to be burned, and shortens Pang Er. Find out the problem and shorten the development 砗 #, _, J ~ ⑽ with the understanding of effective memory. 'It can improve the R & D staff's understanding of the NAND flashing flash-His Committee members Hi-knowledge of the invention can be further improved, and The same payer (Per son sk i 11 ed in the fie 1 d) can implement the method according to the present invention, but it is implemented by the implementation method of 4 ° month 2 /, so One of the two best disclosures: 埶: The following is to reveal the basic spirit and proper teaching of the present invention. A person skilled in the art can use the content of the present invention to add η / Τ AV- 〇p. ^ Π Λ down 'will be explained in detail in accordance with the embodiment shown in the figure. The method and effect of the method are described below, and the preferred embodiment is provided with 3 schemes and diagrams. The composition of the present invention and its achieved effects are 1222749. Case No. 12125835 Amendment V. Description of the Invention … (4) Detailed description is as shown in the figure below]

Soft analysis and recording of body memory, memory 4 memory, 1 flash, 1 face repair, fast face introduction, Α machine brake introduction, T test, RBR test, D, s, A, S, S, N, U, U一 iiiii main: iii: j 1 2 3 4 5 6 ·· 1 ± 1 ± 1 ± rH 1 ± IX o IX 2 0 ...... transfer board 3 0 ...... personal computer [ Embodiment] Referring to the first figure, the present invention is mainly composed of three parts: a main board 10, an adapter board 20, and a personal computer 30. Built-in system in motherboard 10, all software for testing, repairing, burning and analysis 16 and a US B interface 14 (USB universal serial bus), a UART interface 15 (general asynchronous) Transceivers).

The adapter board 20 is for fast flashing of NAND gates of different packages ^ such as TSOP, WSOP, BGA 'SmartMedia, etc., the packaging is made-heart-body motherboard connection, making the device of the present invention more flexible and can support ^ / connection board Flash memory with NAND gate. The adapter board 2 〇 is provided by a = 2-movable! . Connectors. We have printed board plus personal computer. There are applications in the memory, which can be connected to the main board 1 0. The function of this application is to manipulate the main board ^ ^, 0 and achieve the desired function. 'Make the test, repair and function of the motherboard, 10, and the four functions of the software, analysis and analysis software as follows: * 1. Test: Please refer to the test flow chart shown in the third figure. When the adapter board 20 is connected to the motherboard 10, the motherboard 10 can manually detect whether the memory can be repaired; if the memory ID and device ID of the memory can be read, it can be repaired, and vice versa. . Among them, Manufacture ID is composed of vendor ID and device Π). 0xecn represents Samsung company. This is an example of the present invention, but it does not return to

Page 10 122749? Case No. η 921: 丨 more. V. Invention— (6) This test software provides a function "view bad blocks" to view the current sacrifice. Exist in the location of all bad blocks (badb 10k) in the flash memory. Another function is “check a 1 way shi gh bit”, which can check out the flash memory of NAND gate. After erasing, its value is “1” but it is a damaged bit. After the method * erase, write "0" to the entire NAND flash memory 'and check if there is a bit of π Γ in the flash memory. If it exists, mark this b 丨 〇ck It is a bad block. There is also a function "Mark bad block manually", which can mark -4b the block that is questionable but not certain as a bad block. ~ block). Calculate the number of bad blocks. If it exceeds the maximum bad block limit (determined by the NAND flash manufacturer), it will be regarded as a defective product; if it is not exceeded, it will be a normal product. As shown in the repair procedure, connect the NAND flash memory to be tested to the motherboard. After executing the test procedure, if the NAND nash interface is damaged, it cannot be repaired. If it is normal, check the memory size. If it exceeds 64Mbytes, write Enter FAT 16 directory; write below FAT 12 directory; so, complete repair.

Some NAND gate flash memory is packaged as a memory card (SmartMedia (TM)), just like a PC on a PC,., X, / s ® ▲, pregnant drive (f 1 〇ppy d1Sk ), You must give the memory FAT (file allocation directory Fiie

Allocated Table). If the memory is less than 64MBytes, use FAT 12 (representing the address of the file with 12bU). If it exceeds 64MBytes, you must use FAT 16. Because 12bi 64MBytes ^ || ® / Yi is not suitable for those who can read the ID ^ 〇 Flash memory provides a function "Optimize NAND flash optimum memory (NAND flash optimum)", which can repair NAND flash memory to the best state. The method is to wipe the erase block first, and then check all the bytes (byte) in the block (b 1 〇ck). If there is more than one byte (by te), the value is not "0x ff" ", Then mark this block as a bad block (hd block), otherwise mark this block as a good block (g00d block), regardless of the initial setting. If the byte is a SmartMedia ™ package, another function must be performed: “Write to SmartMedia? FAT format (Write

SmartMedia FAT format) ", which can be accessed by ordinary card readers after completion. One block in each NAND flash memory block

Page 12 9. i 〇1227497 Case No. 92125835 Λ_η Fifth, the invention ... (8) Modified a specific byte (byte) to indicate whether this block (ι ^ ΐο ^) is a bad block (bad block) ), As long as this byte is not equal to Oxff "is a bad block, and a good block is good. 3. Burning: Please refer to the burning procedure shown in the fifth figure. First connect the flash memory to be burned & NAND to the host M 0 ′, and then detect the ID of the flash memory to determine the structure type. State, and download the program to be burned to the buffer area of the microprocessor of the motherboard through the USB interface; determine whether the burning type is the Boot ioader plus the main program to be executed (image), and if yes, suspend r force: an offset of block size, and download to the new = tank address, and then directly select the burning type and execute the burning; if not, directly select the burning type and execute the burning. Two = provide, support two kinds of interfaces for downloading to be burned: private or -bei 'use for UART, another δρ0ειί ^^ users can quickly download to the host computer USB; 丨 quickly download to the host The program or data of the board is written to the program or data on the NAND gate 30, and the motherboard then downloads the downloaded flash memory. 1227497 Γ_I… ^ Year V. Description of the invention (9) ^ ^ §- 4. Analysis · Six-block data type action of page data type NAND gate flash memory Analysis of the invention For the sequence, please refer to the analysis in Figure 7, the analysis of the block state shown in Figure 7, and the method that cannot be analyzed shown in Figure 8. See the poem thick and j &

Intermediate flash memory is connected to: 3 sad analysis, first test the NAND dD and select the data structure = = test the circular flash memory X 冓, and then know the ^ field block (b 1 〇ck), and Determine whether all bits in block blocc ^ are "1"; if yes, record iMblocck): 〇Ck); repeat this action to the last block, and display two kinds of contributions Expected all block numbers of the complaint. This is convenient for analysts to review. μ Analysis of the page data in the block shown in Figure 7 ^ ~ 'First turn in the block number, and scan the page, (P g)' to determine all the content in the page. If the bits are all 0% " is 7 1; If the mouth black, black, white, fruit, and clothing are all 0, then it is recorded as a blank declared by the system but not used = 'σ f is 1, then the record Into an unused page (page); if ^, the recorded page exists (page); repeat to the last page

The page and ^ fH subpages display all page numbers of the three types of data for the convenience of the analyst.

Page 14 1227497 Fifth case No. 92125 · Λ Description of invention (10) Monthly revision refers to the law. The NAND gate program analyzed in this analysis uses NAMD gate to flash quickly, so the internal data of the data (block is the customer The method shown in Figure 8 of the flashing NAND gate flashing method is to use flash memory. The two NAND contents and addresses on the memory of the present invention are installed. The page recording tool has different addresses and the memory has a thermal operation. The flash memory analysis method uses the% c method. The device of the present invention is used to read out the data in the inoperable body, and then the customer is recorded to another good and same model, and then read its content. If the two pieces of flash memory are the first data and the last one should be the same. Therefore, if the first 0) content is different, it means that the programming is unsuccessful, problem. If the first data is the same but the last ’, the customer ’s programming method is wrong. Because of three different data structures: 1 block = 16pages, 1 page-512Bytes? Spare page = 1 6Byte, b · 1 block = 32pages, lpage = 512Bytes, spare page 2 6Byte, c · 1 block = 64pages, lpage 2 2048Bytes, spare page

64Byte) Customers often make errors due to unfamiliar architecture and no evasive measures against bad blocks (ba (i blOCk). The burned memory often fails to boot or execute.

Page 15 1227497 Star U2125835 V. Explanation of the invention. (11) Revision It can be seen from the above analysis program that the device of the present invention provides a powerful analysis function. The analysis method is as follows: ): Verify that each byte in block 'check bloc] k has a value other than “〇xf f”. If it exists, it means that this block has been used and is a useful block. 2) Search for useful pages Page (Find valid pages): The verification of the block is fast but not accurate enough, and in some cases "0x0 0" is not useful data, but it represents a blank or spare area of some data format, so This function will scan all the pages in b 1 〇ck, and according to the internal data, it will be all pages with “1”, all pages and useful pages. 3) Print all pages Spare area (print all pages' spare area) · spare area (sparearea) has its special purpose in NAND flash memory, in general, it stores important information such as bad block identification, ECC error correction code Storage, logical block instructions, etc. This function will display all the spare areas of all pages in the block, which is convenient for understanding the flash memory distribution of the entire NAND gate. 4) Dumping out any page data (dumpanypage): display The data of all pages in the NAND flash memory and spare area are displayed in hexadecimal machine code. This function can check out Owned material intended position is correct.

Page 16 122749 wins Replacement page 5. The invention says that rain mr S2 \ 25m said Correction Through the use of the above four functions, development personnel can quickly find out the problem and shorten the development time. Please refer to the system architecture diagram of the present invention shown in the second figure, in which the motherboard 10 has an SD RAM memory 1 1, an ARM 9 microprocessor 12 and an NOR flash memory 13. When the computer 30 turns on the power and executes the boot process, the microprocessor 12 loads the program of the NOR flash memory 13 into the SD RAM memory 1 1 as an executable program. Refer to the arrow line L 1 in the figure. Test / repair / analysis functions can be performed through the operating program on the computer 30. It is completed through the U A R T interface 15. Refer to the arrow line L 2 in the figure. If the programming function is performed, it needs to be executed through the USB interface 14. The programs or data on the computer 30 are quickly downloaded to the buffer area of the motherboard 1 0 microprocessor 1 2 through the USB interface 14 and then downloaded. The program or data is written to the flash memory of the AND gate. Refer to the arrow line L 3 in the figure. In addition, the software in the device of the present invention can have anti-theft functions and timeliness. Refer to the software explanatory diagram of software anti-copy and customer lease term control shown in Figure 9 which uses the micro processing of the motherboard 10 Machine 1 2 production

Page 12 1227497

_Ji said to revise the real time clock and set the time to synchronize with Taipei standard time 'and set the usable time limit on the software of the motherboard. In this way, the software is time-effective and overdue will make the device of the present invention It can't work unless you use the updated program provided by the original factory to continue using it. This is an absolutely effective method for the management of rental customers. Even software and hardware that want to pirate products are meaningless because of their timeliness.

To sum up, the present invention is a NAND gate flash memory test / repair / burning / analysis four-in-one device, which is a NAND gate flash memory test / repair / burning / analysis four-in-one device. And can be derived from a wide range of applications 'Because the functions are complete, multiplying production efficiency can also take into account production costs, and the user's purchase costs can be greatly reduced, suitable for mass production' have industrial use value, It is in line with the industrial applicability of the invention patent application requirements. Furthermore, the NAND gate flash memory testing / repairing / burning / analysis four-in-one device of the present invention is compared with the closest prior art. Below, it clearly has a considerable step in progress (Inventive Step), which is in line with the progress of the invention patent application requirements, and through the detailed disclosure of this specification (such as specification, circuit diagram and block diagram, etc.), it is enough to make the same Professionals in the industry can implement the present invention. And its structure has not been seen in books or publicly used, and it is in line with the novelty of the invention patent application requirements. We kindly ask you to refer to it and grant the exclusive right of the invention as soon as possible to facilitate the commercialization of the applicant.

Page 18 1227497 u _ case number 92125835_ year month date __ V. Description of the invention (14) '' Those who need to be identified, the above are the specific embodiments of the present invention and the technical principles used, according to the disclosure of this article Or the teaching can derive many changes and corrections. If the equivalent changes made according to the concept of the present invention still have functional functions that do not exceed the spirit covered by the description and drawings, they should follow the principle of all requirements or The principle of equality theory falls within the technical scope of the present invention without departing from the scope of the invention stated in the scope of patent application.

Page 19 1227497

921gp835 B id year, month, month, day, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month. The second figure represents a system architecture diagram of the present invention. The third figure represents the NAND gate flash memory test flow chart of the present invention. The fourth figure represents the NAND gate flash memory repair procedure diagram of the present invention. The fifth figure represents the NAND gate flash memory programming sequence diagram of the present invention. The sixth figure represents the analysis procedure diagram of the block data type in the NAND flash memory of the present invention. The seventh figure represents the analysis of the page data type in the NAND flash memory block of the present invention. The eighth figure represents the inoperable NAND gate flash memory analysis method of the present invention. The ninth figure represents the software anti-copy and customer lease term control hardware description diagram of the present invention. 1 Page 20

Claims (1)

1227497 VI. Patent application Fan ir 1. Flash memory of a NAND device A device, which includes: a motherboard with internal programming and analysis software, case number 9,2125835 " Τ η ^ (Flow) device); a transfer adapter board flash flash application motherboard description of the host through the transfer board boot process and analysis program function; a UAR board, for different purposes, and the above memory; and It is stored on the above-mentioned components of the embedded software of the application board and connected to the software of the boot (boot). The software is tested / repaired / embedded by the USB memory via UA r. Contains a USB interface and T interface (common non-same packaging of NAND flash flash motherboard, and can be connected to a personal computer. The connectable function is to control the host function; link, the NAND flash flash motherboard; open the above All tests in the motherboard are executable programs, and the test surface can be used to perform the programming function. Programming / analysis four-in-one test, repair, and surface (generic sequence Huibu send and receive transmission memory packaging to support all The NAND is connected to the computer and the above board, so that the flash memory is placed on the computer power supply, and then the test, repair, and burning are performed; the test / repair / analysis is performed on the computer. According to the scope of the patent application, the test / repair / burning / eight include an SDRam; 7 flash memory. The NAND gate flash memory test described in the first item of the motherboard —> Analysis of the four-in-one device, its condition I # \ ϋί Microprocessor and a NOR Page 21 Amendment: According to the nAND gate flash memory test / repair / burning / analysis four-in-one device described in item 2 of the scope of patent application, the software of the motherboard is stored in the NOR gate flash memory. After booting, the micro processing The machine loads the program of flash memory memory into SDRA memory as an executable program. 4: According to the NAND gate flash memory test " type / repair / burning / analysis four-in-one device described in the first patent application scope, wherein the adapter board is connected by a printed circuit board and a movable IC Device. 5. According to the NAND gate flash memory test / repair / burning / analysis four-in-one device described in item 1 of the scope of the patent application, the test flow of the motherboard is' the memory to be tested is connected with the adapter board. When the motherboard is connected, the host ^ can automatically or manually detect whether the memory can be repaired; if the nanufacture id and device ID of §memory can be restored, it means that it can be repaired, but not vice versa. 62 Two-in-one device for testing / repairing / flashing / analyzing NAND flash memory as described in item 5 of the scope of the patent application, in which the testing of the motherboard / melon = further provides "view bad blocks ”” This can be used to observe the location of the bad blocks currently existing in the NAND flash memory. 7.According to the "NAND gate flash memory test Page 22, 122,749, Amendment, Case No. 921, 6 Application Patent Scope — Trial / Repair / Burn / Analyze 4-in-1 device, in which the motherboard test " 丨 Wang Jinzhang's inspection is always high bit (check always h 1 gh b 11) ”function, you can check out NA〇 flash memory, after erasing (erase), its value is“ 丨 ”, but it is a damaged bit; after erasing, its method will be“ 〇 "Write the entire ^ 〇 gate flash memory, and then check whether the NAND gate flash memory has a" 丨 "bit, if it exists, mark this block as a bad block. 8. Basis The NAND gate flash memory testing / repairing / burning / analyzing four-in-one device described in item 7 of the scope of the patent application, in which the testing of the motherboard, the process further provides "Mark bad block manual ly ) ”Function, which can mark some questionable but uncertain blocks as bad blocks (ba (j block).), According to the NAND gate flash memory test f / Repair / Burn / Analyze 4-in-1 device, where the main The test of the board / "L process progress counts the number of abnormal bad blocks. If it exceeds the maximum bad block limit (determined by the NAND f 1 ash manufacturer), it is determined as a defective product; if it is not exceeded, it is a normal product. 〇: According to the 2 NAND flash memory f ° type / repair / burning / analysis four-in-one device described in item 1 of the scope of the patent application, the mainboard's repair procedure is to test the NAND flash memory ( Smart media package) Connected to the motherboard, after performing the test procedure, if it is abnormal, it is impossible 1227 Rite 'Replacement page < 0. Sixth, the patent application scope repairer; if it is normal, check the memory size, if it exceeds 64M.bytes, write to the FAT 16 directory; if it does not exceed, write to the fat directory, so, Complete the repair. ^ According to the application = N A⑽ Flash memory test / repair / 纟 ▲ 明 as described in item 10 of the patent scope ^ ^ A 70 recording / analysis four-in-one device The γ and NAND flash memory that can read the ID can be used to optimize the MND flash memory (NAND flash X force guilty 'can repair the NAND flash memory to the second most Sadly, the method is to wipe the erase block first, then all the bytes (byte) in the 21 block (Mock). If there are more than ^ byte groups, the value is not "〇. xf f ”, then mark this: block bl〇Ck) as a bad block, otherwise mark this block (Mock) as a good block, regardless of the initial 2 patent application N-gate flash memory as described in the first item of the scope: j / repair / burning / analysis four-in-one device, in which the burning process of the motherboard, jdL t) The flash memory is connected to the motherboard. U detects the structure of the n ^ nd flash memory to determine the structure type, and downloads the program to be burned to the micro-board of the motherboard through the γ ^ interface. The second and fifth domains of the processor; determine whether the programming type is a boot loader plus ima ge 'if yes', then add a & large ^ small Bo. J shift s, And download lmage to the new RAM buffer bit Page 24 1227497 π. Amend a ψ,; ^ ν 5 ¾¾, No. 6, patent application scope, and address, and then directly select the programming and execute the programming; if not, directly select the programming type To perform the burning. 1 3. According to the NAND gate flash memory test / repair / burning / analysis quartet / device described in item 2 of the scope of the patent application, the burning of the motherboard supports two kinds of interfaces as ^ to be burned. For recorded programs or data, one is UART, ^, 〇々 surface. The other is USB® 1 4. According to the NAND gate flash memory test / repair / burning / analysis quartet / device described in item 丄 of the patent application scope, the analysis program of the motherboard has a block data type Analysis, first connect the NAND flash memory to be tested to the motherboard, detect 1 D of the NAND flash memory and select the data structure; then scan the block (bl0Ck) and determine the block (block) Whether all the bits in the field are "丨"; if yes, it is recorded as an unused block (Mock); if not, it is recorded as a block with data (b 1 ock); repeat this Move to the last block and display all block numbers of the two data types. Page 25 1227497 a ^ i258 ^ T Scope of patent application ~ .............. White, Shikou strike 1 If none is ^, record as unfinished Pages used (such as P); old $ 100,] α has been recorded as the page where the data exists (repeat to lP ^), all pages of the three types of data are edited (Ipage number). : Test data:: Analysis of uAND free flash memory described in item 15 of the patent scope: "Yaoluo" analyzes a four-in-one device, in which the NAND flash memory of the motherboard is actuated Volume analysis method, this knife analysis method uses a comparison method, which first reads out the non-working ΑΝ 卟 record = data in the body, and then burns the program written by the customer to another 1 = and the same type of NAND On the flash memory; = read it out, if the content and address of the first and last data of the flash memory between the two NAND are the same, it is expressed as the N and The flash memory is good; if the contents of the first data (^ lQek 0, page 0) are different, it means that the programming is unsuccessful, that is, there is a problem with the programming tool; if the first data is the same but the last Different addresses appear in a lump sum, which means that the customer's programming method is wrong. 7. According to the NAND gate flash memory test 4 / repair / burning / analysis four-in-one device described in item 1 of the scope of patent application, the analysis method of the motherboard's analysis program includes searching for useful blocks (Find val id blocks), verify each bloc, and check whether all Bytes in the block have a value other than "0xf f". If it exists, it means that this block has been used and is a useful block. Page 26 1227497 Case No. 92125¾ ^ VI. Patent Application Range 8. According to the patented chromium m, π =, χ a, t ~ NAND gate flash memory test / repair as described in item 17 / v ^ Fan recording / analyzing four-in-one device. The analysis method of the motherboard analysis program includes searching for useful pages (Find == uPages), scanning all pages in the block, and searching for internal pages based on internal corruption. It is expected that the rules are human & 丨, Tian AA Stone Horse King is a page of 1, all pages are 丨 丨 〇 丨 丨 and useful shell noodles. 2. I: According to the NAND flash flash i repair / burning / analysis four-in-one device described in item 18 of the scope of patent application, the method of (P) r = t 1 analysis includes printing all pages. The '1, Pages' spare area' on the spare area surface) displays all the pager ship areas in the block, so as to understand the situation of the fast and strict distribution of the entire NAND gate. 〇 、 4Youcaiqian NAND gate flash memory described by the Lord Kui I #,, T # Item 19 in the profit-seeking range ^ 2 $ copy / programming / analysis four-in-one device, of which the main board page) sequence analysis method includes dumping any page content (Dump any The i in the domain displays all the pages in the NAND free flash memory and the spare area. The sub-material is displayed in hexadecimal machine code to check whether the arbitrary bit and the J-material are correct. Just test 2NAND flash memory according to item 1 of the scope of patent application ^ Setting / burning / analyzing quad / device, where the software has Page 27 1227497 Case No. 92125835 η Revision VI. The patent application scope of the anti-theft copy function is time-effective, which uses the microprocessor of the motherboard to generate a timely clock (rea 1 timec 1 0ck), and set the time Synchronize it with local standard time and set a usable period on the motherboard software. Φ Page 28 Day 奂 -Τ, Month of the Year Double Official 12 (‘Φ