TW218055B - - Google Patents
Info
- Publication number
- TW218055B TW218055B TW082102306A TW82102306A TW218055B TW 218055 B TW218055 B TW 218055B TW 082102306 A TW082102306 A TW 082102306A TW 82102306 A TW82102306 A TW 82102306A TW 218055 B TW218055 B TW 218055B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1062—Channel region of field-effect devices of charge coupled devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Ceramic Engineering (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019920005608A KR960002645B1 (ko) | 1992-04-03 | 1992-04-03 | 전하 전송장치 및 고체 촬상장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW218055B true TW218055B (zh) | 1993-12-21 |
Family
ID=19331361
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW082102306A TW218055B (zh) | 1992-04-03 | 1993-03-26 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5359213A (zh) |
JP (1) | JP3589472B2 (zh) |
KR (1) | KR960002645B1 (zh) |
DE (1) | DE4310915B4 (zh) |
TW (1) | TW218055B (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5492852A (en) * | 1993-10-07 | 1996-02-20 | Nec Corporation | Method for fabricating a solid imaging device having improved smear and breakdown voltage characteristics |
US5625210A (en) * | 1995-04-13 | 1997-04-29 | Eastman Kodak Company | Active pixel sensor integrated with a pinned photodiode |
KR0172854B1 (ko) * | 1995-08-02 | 1999-02-01 | 문정환 | 씨씨디 고체촬상소자 및 그의 신호처리방법 |
WO1997009818A1 (en) * | 1995-08-21 | 1997-03-13 | Starcam Systems, Inc. | High-speed high-resolution multi-frame real-time digital camera |
US6320617B1 (en) | 1995-11-07 | 2001-11-20 | Eastman Kodak Company | CMOS active pixel sensor using a pinned photo diode |
US6297070B1 (en) | 1996-12-20 | 2001-10-02 | Eastman Kodak Company | Active pixel sensor integrated with a pinned photodiode |
US5903021A (en) * | 1997-01-17 | 1999-05-11 | Eastman Kodak Company | Partially pinned photodiode for solid state image sensors |
US5963251A (en) * | 1997-02-03 | 1999-10-05 | Trw Inc. | Frame transfer readout correction |
US6492694B2 (en) | 1998-02-27 | 2002-12-10 | Micron Technology, Inc. | Highly conductive composite polysilicon gate for CMOS integrated circuits |
JP2001156284A (ja) * | 1999-11-25 | 2001-06-08 | Sanyo Electric Co Ltd | 固体撮像素子及びその製造方法 |
US20070131992A1 (en) * | 2005-12-13 | 2007-06-14 | Dialog Semiconductor Gmbh | Multiple photosensor pixel image sensor |
US20080136933A1 (en) * | 2006-12-11 | 2008-06-12 | Digital Imaging Systems Gmbh | Apparatus for controlling operation of a multiple photosensor pixel image sensor |
US20100094340A1 (en) * | 2008-10-15 | 2010-04-15 | Tyco Healthcare Group Lp | Coating compositions |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU535604A1 (ru) * | 1974-08-09 | 1976-11-15 | Предприятие П/Я В-2892 | Регистр сдвига на приборах с зар довой св зью |
US4613895A (en) * | 1977-03-24 | 1986-09-23 | Eastman Kodak Company | Color responsive imaging device employing wavelength dependent semiconductor optical absorption |
US4223329A (en) * | 1978-06-30 | 1980-09-16 | International Business Machines Corporation | Bipolar dual-channel charge-coupled device |
US4229754A (en) * | 1978-12-26 | 1980-10-21 | Rockwell International Corporation | CCD Imager with multi-spectral capability |
NL8101883A (nl) * | 1981-04-16 | 1982-11-16 | Philips Nv | Ladingsgekoppelde inrichting. |
JPS58138187A (ja) * | 1982-02-12 | 1983-08-16 | Toshiba Corp | 固体イメ−ジセンサ |
DE3418778A1 (de) * | 1984-05-19 | 1985-11-21 | Josef Dr. 8048 Haimhausen Kemmer | Ccd-halbleiterbauelement |
DD247327A1 (de) * | 1986-03-31 | 1987-07-01 | Werk Fernsehelektronik Veb | Ueberlaufanordnung fuer ladungssammelnde halbleitergebiete |
JP2822393B2 (ja) * | 1988-07-30 | 1998-11-11 | ソニー株式会社 | 固体撮像装置及びその駆動方法 |
JPH0278278A (ja) * | 1988-09-13 | 1990-03-19 | Nec Corp | 赤外線センサ |
KR920007355B1 (ko) * | 1990-05-11 | 1992-08-31 | 금성일렉트론 주식회사 | Ccd영상 소자의 구조 및 제조방법 |
-
1992
- 1992-04-03 KR KR1019920005608A patent/KR960002645B1/ko not_active IP Right Cessation
-
1993
- 1993-03-26 TW TW082102306A patent/TW218055B/zh not_active IP Right Cessation
- 1993-03-30 US US08/040,072 patent/US5359213A/en not_active Expired - Lifetime
- 1993-04-02 DE DE4310915A patent/DE4310915B4/de not_active Expired - Lifetime
- 1993-04-02 JP JP09843093A patent/JP3589472B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3589472B2 (ja) | 2004-11-17 |
DE4310915A1 (de) | 1993-10-07 |
KR930022571A (ko) | 1993-11-24 |
JPH06151808A (ja) | 1994-05-31 |
US5359213A (en) | 1994-10-25 |
DE4310915B4 (de) | 2006-08-24 |
KR960002645B1 (ko) | 1996-02-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |