TW202031856A - Workpiece processing sheet - Google Patents
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- TW202031856A TW202031856A TW108138577A TW108138577A TW202031856A TW 202031856 A TW202031856 A TW 202031856A TW 108138577 A TW108138577 A TW 108138577A TW 108138577 A TW108138577 A TW 108138577A TW 202031856 A TW202031856 A TW 202031856A
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
- C09J7/381—Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
- C09J7/385—Acrylic polymers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/40—Additional features of adhesives in the form of films or foils characterized by the presence of essential components
- C09J2301/416—Additional features of adhesives in the form of films or foils characterized by the presence of essential components use of irradiation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Adhesive Tapes (AREA)
- Dicing (AREA)
Abstract
Description
本發明,係關於適於使用於切割(dicing)的工件加工用片材。The present invention relates to a sheet for workpiece processing suitable for use in dicing.
矽、砷化鎵等半導體晶圓及各種組件類(以下,此些有時總稱為「工件」),係先以大直徑之狀態製造,再將此切開分離(切割)為元件小片(以下,有稱為「晶片」)並同時各個分離(取晶(pickup))之後,再移往其後之步驟之黏片步驟。當中,半導體晶圓等工件,係以黏貼在包含基材及黏著劑層之工件加工用片材上之狀態,再進行切割、清洗、乾燥、擴片、取晶及黏片的各個步驟。此工件加工用片材,需要加工時將工件良好地保持在該片材上,亦需要有由該片材分離加工後之工件時可容易地分離之性能。Semiconductor wafers such as silicon and gallium arsenide and various components (hereinafter, these are sometimes collectively referred to as "workpieces") are first manufactured in a large diameter state, and then this is cut and separated (diced) into small components (hereinafter, There is a sticking step called "chip") and after each separation (pickup) at the same time, then move to the subsequent step. Among them, semiconductor wafers and other workpieces are stuck on a workpiece processing sheet including a substrate and an adhesive layer, and then undergo the various steps of cutting, cleaning, drying, expanding, crystal taking, and bonding. The sheet for processing workpieces needs to hold the workpiece on the sheet well during processing, and it also needs to have the ability to easily separate the processed workpiece from the sheet.
對於如上方式所得之晶片,亦有之後,再實施加熱處理之情況。例如,對晶片,施以蒸鍍、濺鍍、脫濕之烘烤等之處理。以及,預設晶片在高溫環境下使用之情況,而進行加熱試驗以証實在該環境下之信賴性。通常,此些加熱處理,係將獲得之晶片裝載在加熱托盤上之狀態操作。For the wafers obtained in the above method, there are cases where heat treatment is performed afterwards. For example, the wafer is subjected to treatments such as evaporation, sputtering, and dehumidification baking. And, preset the chip to be used in a high-temperature environment, and conduct a heating test to verify the reliability in the environment. Generally, these heating treatments are performed in a state where the obtained wafers are loaded on a heating tray.
近年來,在工件加工用片材上進行如上的晶片之加熱處理,已進行探討。亦即,探討在工件加工用片材上,切割工件之後,所得之晶片不需要轉移至加熱托盤,而裝載在工件加工用片材上直接對晶片進行加熱處理。該情形下,可以簡化步驟。In recent years, the heating treatment of the above-mentioned wafers on the workpiece processing sheet has been studied. That is, it is discussed that after cutting the workpiece on the workpiece processing sheet, the obtained wafer does not need to be transferred to the heating tray, but is loaded on the workpiece processing sheet to directly heat the wafer. In this case, the steps can be simplified.
專利文獻1至3中,係揭示設定進行如上述之加熱處理的黏著片材。特別是,在專利文獻1中揭示之黏著片材,含有由基材層及放射線硬化型黏著劑構成之黏著劑層,該黏著劑層貼合後對SUS304之黏著力為0.5N/20mm以上,且至樹脂封裝步驟完成之時為止會受刺激而硬化,形成對組件之剝離力為2.0N/20mm以下之層。又,專利文獻2中揭示之黏著片材,黏著劑層,係由含有特定之黏著劑成分及特定之四唑化合物的黏著劑組合物所形成。又,專利文獻3中揭示之黏著片材,係在耐熱性基材上,形成有由含有特定之丙烯酸系聚合物、能量線聚合性寡聚物、特定之聚合起始劑及交聯劑的黏著劑層形成用材料所形成之黏著劑層。 [先前技術文獻] [專利文獻]Patent Documents 1 to 3 disclose adhesive sheets set to be subjected to the above-mentioned heat treatment. In particular, the adhesive sheet disclosed in Patent Document 1 contains an adhesive layer composed of a substrate layer and a radiation-curing adhesive, and the adhesive layer has an adhesive force of 0.5N/20mm or more to SUS304 after being laminated. And until the resin encapsulation step is completed, it will be stimulated and hardened to form a layer with a peel force of 2.0N/20mm or less to the component. In addition, in the adhesive sheet disclosed in Patent Document 2, the adhesive layer is formed of an adhesive composition containing a specific adhesive component and a specific tetrazole compound. In addition, the adhesive sheet disclosed in Patent Document 3 is formed on a heat-resistant substrate, and is formed of a specific acrylic polymer, an energy-ray polymerizable oligomer, a specific polymerization initiator, and a crosslinking agent. Adhesive layer formed by the material for forming the adhesive layer. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本特許第5144634號 [專利文獻2]日本特許第5555578號 [專利文獻3]日本特許第5565173號[Patent Document 1] Japanese Patent No. 5144634 [Patent Document 2] Japanese Patent No. 5555578 [Patent Document 3] Japanese Patent No. 5565173
[發明欲解決之課題][The problem to be solved by the invention]
然而,如上述情形之晶片之加熱處理,在以往之工件加工用片材上施行時,由於經過加熱,使工件加工用片材對晶片之黏著力提高的結果,會有加熱處理後,無法由該片材良好地撿取晶片的問題。此類問題,即使使用如專利文獻1至3所揭示,具有特定的耐熱性之黏著片材亦無法充分解決。However, when the wafer heating treatment in the above-mentioned case is performed on the conventional workpiece processing sheet, the adhesion of the workpiece processing sheet to the wafer is increased due to heating. The sheet picks up the wafer well. Such problems cannot be sufficiently solved even if an adhesive sheet with specific heat resistance is used as disclosed in Patent Documents 1 to 3.
本發明,鑑於實際情況如此,因此目的欲提供即使在工件加工之時對該工件可發揮充分之黏著力,在經過加熱處理之後,加工後之工件亦可良好地分離之工件加工用片材。 [解決課題之手段]In view of the actual situation, the purpose of the present invention is to provide a sheet for workpiece processing that can exhibit sufficient adhesion to the workpiece even when the workpiece is processed, and after heat treatment, the processed workpiece can be separated well. [Means to solve the problem]
為達成上述目的,本發明之第1種,係提供一種工件加工用片材,其係具有基材及積層在前述基材之一面上的黏著劑層之工件加工用片材,其特徵為前述黏著劑層,係由活性能量線硬化性黏著劑所構成;且在前述工件加工用片材對矽晶圓之黏著力為F0,而由前述工件加工用片材貼合在矽晶圓所構成之積層體在150℃下加熱1小時後,再以活性能量線照射構成前述積層體的前述黏著劑層之後,前述工件加工用片材對矽晶圓的黏著力為F2時,前述黏著力F0為600mN/25mm以上、20000mN/25mm以下,前述黏著力F2對前述黏著力F0之比值(F2/F0)為0.66以下(發明1)。In order to achieve the above-mentioned object, the first aspect of the present invention provides a sheet for processing a workpiece, which is a sheet for processing a workpiece having a substrate and an adhesive layer laminated on one surface of the substrate. The adhesive layer is composed of an active energy ray curable adhesive; and the adhesive force of the aforementioned workpiece processing sheet to the silicon wafer is F0, and the aforementioned workpiece processing sheet is attached to the silicon wafer After heating the laminate at 150°C for 1 hour, and then irradiating the adhesive layer constituting the laminate with active energy rays, when the adhesive force of the workpiece processing sheet to the silicon wafer is F2, the adhesive force F0 For 600mN/25mm or more and 20000mN/25mm or less, the ratio (F2/F0) of the aforementioned adhesive force F2 to the aforementioned adhesive force F0 is 0.66 or less (Invention 1).
上述發明(發明1)之工件加工用片材,由於上述之黏著力F0係在上述範圍,因此在工件加工時,對該工件可發揮充分之黏著力。另一方面,由於黏著劑層係由活性能量線硬化性黏著劑所構成,同時上述黏著力之比值(F2/F0)又在上述範圍,因此即使是在加工後之工件為黏貼的狀態下加熱工件加工用片材之情況,經過之後照射活性能量線,亦可充分降低對加工後之工件的黏著力,因此使加工後之工件可以良好地分離。In the above-mentioned invention (Invention 1), since the above-mentioned adhesive force F0 is in the above-mentioned range, the sheet for workpiece processing of the above-mentioned invention (Invention 1) can exhibit sufficient adhesive force to the workpiece when the workpiece is processed. On the other hand, since the adhesive layer is composed of an active energy ray-curable adhesive, and the ratio of the above-mentioned adhesive force (F2/F0) is in the above-mentioned range, even if the workpiece is heated after processing, it is stuck. In the case of the sheet material for workpiece processing, the active energy rays can be irradiated after passing through, and the adhesion to the processed workpiece can be sufficiently reduced, so that the processed workpiece can be separated well.
上述發明(發明1)中,在前述工件加工用片材在150℃下加熱1小時後,前述黏著劑層在23℃下之楊氏係數(Young's modulus)為E1,而前述工件加工用片材在150℃下加熱1小時後,再以活性能量線照射構成前述工件加工用片材的前述黏著劑層之後,前述黏著劑層在23℃下之楊氏係數為E2時,前述楊氏係數E2對前述楊氏係數E1之比值(E2/E1),以13以上為佳(發明2)。In the above invention (Invention 1), after the sheet for workpiece processing is heated at 150°C for 1 hour, the Young's modulus of the adhesive layer at 23°C is E1, and the sheet for workpiece processing After heating at 150°C for 1 hour, and then irradiating the adhesive layer constituting the workpiece processing sheet with active energy rays, when the Young's coefficient of the adhesive layer at 23°C is E2, the Young's coefficient E2 The ratio of the aforementioned Young's coefficient E1 (E2/E1) is preferably 13 or more (Invention 2).
上述發明(發明1、2)中,前述工件加工用片材中前述黏著劑層在23℃下之楊氏係數為E0,而前述工件加工用片材在150℃下加熱1小時後,前述黏著劑層在23℃下之楊氏係數為E1時,前述楊氏係數E1相對前述楊氏係數E0之比值(E1/E0),以2.0以上為佳(發明3)。In the above inventions (Inventions 1 and 2), the Young's coefficient of the adhesive layer in the workpiece processing sheet at 23°C is E0, and the workpiece processing sheet is heated at 150°C for 1 hour. When the Young's coefficient of the agent layer at 23°C is E1, the ratio of the aforementioned Young's coefficient E1 to the aforementioned Young's coefficient E0 (E1/E0) is preferably 2.0 or more (Invention 3).
本發明之第2種,係提供一種工件加工用片材,其係具有基材及積層在前述基材之一面上的黏著劑層之工件加工用片材,其特徵為前述黏著劑層,係由活性能量線硬化性黏著劑所構成;前述活性能量線硬化性黏著劑之玻璃轉變溫度為-50℃以上、10℃以下;且前述活性能量線硬化性黏著劑,為含有包含具極性基之單體作為構成單體的丙烯酸系共聚物(發明4)。The second aspect of the present invention provides a sheet for processing a workpiece, which is a sheet for processing a workpiece having a substrate and an adhesive layer laminated on one surface of the substrate, characterized in that the adhesive layer is It is composed of an active energy ray curable adhesive; the glass transition temperature of the active energy ray curable adhesive is above -50 ℃ and 10 ℃ or less; and the active energy ray curable adhesive contains a polar group An acrylic copolymer in which the monomer is a constituent monomer (Invention 4).
上述發明(發明4)中,前述丙烯酸系共聚物,以在側鏈上導入具有活性能量線硬化性之官能基為佳(發明5)。In the above invention (Invention 4), it is preferable that the acrylic copolymer has a functional group having active energy ray curability introduced into the side chain (Invention 5).
上述發明(發明1至5)中,以係切割片材為佳(發明6)。 發明之效果Among the above inventions (Inventions 1 to 5), a diced sheet is preferable (Invention 6). Effect of invention
本發明之工件加工用片材,不但在工件加工時對該工件可發揮充分之黏著力,而且經過加熱處理後,亦可良好地分離加工後之工件。The sheet for workpiece processing of the present invention can not only exert sufficient adhesion to the workpiece when the workpiece is processed, but also can well separate the processed workpiece after being heated.
以下,針對本發明之實施形態加以說明。 本實施形態之工件加工用片材,包含基材及積層在基材之一面上的黏著劑層。而且,該黏著劑層,係由活性能量線硬化性黏著劑所構成。Hereinafter, embodiments of the present invention will be described. The sheet for workpiece processing of this embodiment includes a substrate and an adhesive layer laminated on one surface of the substrate. Furthermore, the adhesive layer is composed of an active energy ray-curable adhesive.
1.工件加工用片材之性質 (1)黏著力 本實施形態之工件加工用片材,在工件加工用片材對矽晶圓之黏著力為F0時,黏著力F0,以600mN/25mm以上為佳,特別以900mN/25mm以上更佳,1200mN/25mm以上再更佳。又,黏著力F0,以20000mN/25mm以下為佳,特別以5000mN/25mm以下更佳,3000mN/25mm以下再更佳。其中,上述黏著力F0,係指針對未經後述之加熱或活性能量線照射處理的工件加工用片材測定之初始之黏著力。1. The nature of the sheet for workpiece processing (1) Adhesion For the workpiece processing sheet of this embodiment, when the adhesion force of the workpiece processing sheet to the silicon wafer is F0, the adhesion force F0 is preferably 600mN/25mm or more, especially 900mN/25mm or more, 1200mN/ More than 25mm is even better. In addition, the adhesion force F0 is preferably 20,000mN/25mm or less, particularly preferably 5,000mN/25mm or less, and more preferably 3000mN/25mm or less. Among them, the above-mentioned adhesive force F0 refers to the initial adhesive force measured on the workpiece processing sheet that has not been subjected to heating or active energy ray irradiation treatment as described later.
本實施形態之工件加工用片材,由於黏著力F0在上述範圍,因此工件可以良好地保持在工件加工用片材上。因此,在工件加工時,即使發生如因加工導致的衝擊之情況,亦可良好地抑制加工後之工件之移動或脫落。特別是,在黏著力F0為600mN/25mm以上時,加工時可容易良好地保持工件。另一方面,由於黏著力F0為20000mN/25mm以下,對工件加工用片材進行後述之活性能量線照射時,可容易地充分降低對加工後之工件的黏著力,因此,可容易地由工件加工用片材分離加工後之工件。Since the sheet for workpiece processing of this embodiment has an adhesive force F0 in the above range, the workpiece can be held well on the sheet for workpiece processing. Therefore, during the processing of the workpiece, even if the impact caused by the processing occurs, the movement or falling of the workpiece after the processing can be suppressed well. In particular, when the adhesion force F0 is 600mN/25mm or more, the workpiece can be easily and well held during processing. On the other hand, since the adhesion force F0 is 20000mN/25mm or less, when the sheet for workpiece processing is irradiated with active energy rays described later, the adhesion to the workpiece after processing can be easily and sufficiently reduced. Therefore, the workpiece can be easily removed The processed work piece is separated from the processing sheet.
本實施形態之工件加工用片材,在工件加工用片材貼合在矽晶圓所構成之積層體在經過150℃下加熱1小時後,再以活性能量線照射構成此積層體的黏著劑層之後,工件加工用片材對矽晶圓的黏著力為F2時,黏著力F2對上述黏著力F0之比值(F2/F0),以0.66以下為佳,特別以0.2以下更佳,0.15以下再更佳。該比值(F2/F0)為0.66以下時,可容易地良好地兼具在加工時保持工件、及可在照射活性能量線後分離加工後的工件。特別是,即使在加工後之工件黏貼在工件加工用片材上之狀態,使該工件加工用片材曝露在加熱處理下之情形時,亦可容易地由工件加工用片材良好地分離加工後之工件。又,上述比值(F2/F0)之下限值方面並無特別之限定,例如可為0.01以上。In the work-processing sheet of this embodiment, a laminated body formed by bonding the work-processing sheet to a silicon wafer is heated at 150°C for 1 hour, and then irradiated with active energy rays to the adhesive constituting the laminated body After layering, when the adhesion force of the workpiece processing sheet to the silicon wafer is F2, the ratio of the adhesion force F2 to the aforementioned adhesion force F0 (F2/F0) is preferably 0.66 or less, especially 0.2 or less, and 0.15 or less Better still. When the ratio (F2/F0) is 0.66 or less, it is possible to easily and well hold the workpiece during processing and to separate the processed workpiece after the active energy ray is irradiated. In particular, even when the processed workpiece is stuck on the workpiece processing sheet, when the workpiece processing sheet is exposed to heat treatment, it can be easily separated and processed from the workpiece processing sheet. After the workpiece. In addition, the lower limit of the ratio (F2/F0) is not particularly limited, and may be 0.01 or more, for example.
本實施形態之工件加工用片材,上述之黏著力F2,以1000mN/25mm以下為佳,特別以500mN/25mm以下更佳,150mN/25mm以下再更佳。又,黏著力F2,以30mN/25mm以上為佳。黏著力F2在上述範圍時,可容易地調整比值(F2/F0)在上述範圍。For the workpiece processing sheet of the present embodiment, the above-mentioned adhesive force F2 is preferably 1000mN/25mm or less, particularly preferably 500mN/25mm or less, and even more preferably 150mN/25mm or less. In addition, the adhesive force F2 is preferably 30mN/25mm or more. When the adhesion force F2 is in the above range, the ratio (F2/F0) can be easily adjusted in the above range.
本實施形態之工件加工用片材,在工件加工用片材黏貼在矽晶圓所構成之積層體在150℃下加熱1小時後之工件加工用片材對矽晶圓的黏著力為F1時,黏著力F1,以1000mN/25mm以上為佳,特別以2300mN/25mm以上更佳。又,黏著力F1,以5000mN/25mm以下為佳。黏著力F1在上述範圍時,可容易地調整比值(F2/F0)在上述範圍。The workpiece processing sheet of this embodiment is when the adhesion force of the workpiece processing sheet to the silicon wafer after the laminated body formed by adhering the workpiece processing sheet to the silicon wafer is heated at 150°C for 1 hour is F1 , Adhesive force F1, preferably above 1000mN/25mm, especially above 2300mN/25mm. In addition, the adhesive force F1 is preferably 5000mN/25mm or less. When the adhesion force F1 is in the above range, the ratio (F2/F0) can be easily adjusted in the above range.
又,上述之黏著力F0、F1及F2之各測定方法,詳細地如後述之試驗例中之記載。In addition, the measurement methods of the above-mentioned adhesive forces F0, F1, and F2 are detailed as described in the test example described later.
(2)楊氏係數 本實施形態之工件加工用片材,在工件加工用片材經過150℃下加熱1小時後,黏著劑層在23℃下之楊氏係數為E1,而工件加工用片材經過150℃下加熱1小時後,再以活性能量線照射構成該工件加工用片材的黏著劑層之後,該黏著劑層在23℃下之楊氏係數為E2時,上述楊氏係數E2對上述楊氏係數E1之比值(E2/E1),以13以上為佳,特別以15以上更佳,18以上再更佳。(2) Young's coefficient For the workpiece processing sheet of this embodiment, after the workpiece processing sheet is heated at 150°C for 1 hour, the Young's coefficient of the adhesive layer at 23°C is E1, and the workpiece processing sheet is heated at 150°C After 1 hour, the adhesive layer constituting the workpiece processing sheet is irradiated with active energy rays. When the Young's coefficient of the adhesive layer at 23° C. is E2, the Young's coefficient E2 is relative to the Young's coefficient E1 The ratio (E2/E1) is preferably 13 or more, especially 15 or more, and 18 or more.
如前述之情形,本實施形態中之黏著劑層,係由活性能量線硬化性黏著劑所構成。一般,存在活性能量線硬化性黏著劑中用於達成活性能量線硬化性的成分,係藉由加熱進行特定之反應,藉此進行黏著劑之硬化。例如,在上述成分為丙烯醯基(acryloyl)之情形時,會有藉由加熱使該丙烯醯基中的碳-碳雙鍵裂解,而進行聚合反應之情形。該情形下,在因加熱使上述成分進行反應之情形,之後即使再照射活性能量線,亦無法再良好地使黏著劑層進一步硬化。然而,在本實施形態之工件加工用片材中,在比值(E2/E1)在上述範圍時,即使在進行加熱處理後,亦可容易地以照射活性能量線,良好地降低黏著力。如此,可有效地抑制在照射活性能量線前,加工後之工件預料外之脫落等。As in the foregoing case, the adhesive layer in this embodiment is composed of an active energy ray-curable adhesive. Generally, there are components in active energy ray curable adhesives that are used to achieve active energy ray curability, and a specific reaction is performed by heating, thereby curing the adhesive. For example, when the above-mentioned component is an acryloyl group, the carbon-carbon double bond in the acryloyl group may be cleaved by heating, and the polymerization reaction may proceed. In this case, in the case where the above-mentioned components are reacted by heating, even if the active energy rays are irradiated thereafter, the adhesive layer cannot be cured further well. However, in the workpiece processing sheet of the present embodiment, when the ratio (E2/E1) is in the above range, even after the heat treatment, the active energy rays can be easily irradiated, and the adhesive force can be reduced favorably. In this way, it is possible to effectively prevent the workpiece from falling off unexpectedly before and after the active energy ray is irradiated.
又,上述比值(E2/E1)之上限值方面並無特別之限定,例如可為25以下。In addition, the upper limit of the ratio (E2/E1) is not particularly limited, and it may be 25 or less, for example.
本實施形態之工件加工用片材,在工件加工用片材中之黏著劑層在23℃下之楊氏係數為E0時,上述楊氏係數E1對該楊氏係數E0之比值(E1/E0),以2.0以上為佳,特別以2.3以上更佳,2.6以上再更佳。又,上述楊氏係數E0,意指針對未經加熱或活性能量線照射之處理的黏著劑層所測定之初始之楊氏係數。In the sheet for workpiece processing of this embodiment, when the Young's coefficient of the adhesive layer in the sheet for workpiece processing is E0 at 23°C, the ratio of the Young's coefficient E1 to the Young's coefficient E0 (E1/E0 ), preferably 2.0 or more, especially 2.3 or more, and 2.6 or more. In addition, the aforementioned Young's coefficient E0 means the initial Young's coefficient measured on the adhesive layer that has not been heated or irradiated with active energy rays.
一般而言,黏著劑經過加熱會軟化,而有增加對接著體之密貼性的傾向。然而,本實施形態之工件加工用片材中,由於比值(E1/E0)在上述範圍,因此不易發生因加熱使黏著劑軟化,而可以有效地抑制過度提高由加熱處理所致之密貼性。結果,可容易地在對黏著劑層照射活性能量線後,良好地分離加工後之工件。Generally speaking, the adhesive will soften after heating, and there is a tendency to increase the adhesion to the adhesive body. However, in the sheet for workpiece processing of this embodiment, since the ratio (E1/E0) is in the above range, it is unlikely that the adhesive will soften due to heating, and it is possible to effectively prevent excessive increase in adhesion due to heat treatment . As a result, after the adhesive layer is irradiated with active energy rays, the processed workpiece can be separated well.
又,上述比值(E1/E0)之上限值方面並無特別之限定,例如可為3.5以下。In addition, the upper limit of the ratio (E1/E0) is not particularly limited, and may be 3.5 or less, for example.
本實施形態之工件加工用片材,上述楊氏係數E0,以2.0MPa以上為佳,特別以2.3MPa以上更佳,2.5MPa以上再更佳。又,楊氏係數E0,以15MPa以下為佳,特別以10MPa以下更佳,5MPa以下再更佳。楊氏係數E0在上述範圍時,可容易地調整比值(E1/E0)在上述範圍。In the sheet for workpiece processing of the present embodiment, the Young's coefficient E0 is preferably 2.0 MPa or more, especially 2.3 MPa or more, and even more preferably 2.5 MPa or more. In addition, the Young's coefficient E0 is preferably 15 MPa or less, particularly 10 MPa or less, and even more preferably 5 MPa or less. When Young's coefficient E0 is in the above range, the ratio (E1/E0) can be easily adjusted in the above range.
本實施形態之工件加工用片材,上述楊氏係數E1,以5.0MPa以上為佳,特別以6.0MPa以上更佳,7.0MPa以上再更佳。又,楊氏係數E1,以100MPa以下為佳,特別以50MPa以下更佳,10MPa以下再更佳。楊氏係數E1在上述範圍時,可容易地調整各比值(E2/E1)及比值(E1/E0)在上述範圍。In the sheet material for workpiece processing of this embodiment, the Young's coefficient E1 is preferably 5.0 MPa or more, particularly 6.0 MPa or more, and even more preferably 7.0 MPa or more. In addition, the Young's coefficient E1 is preferably 100 MPa or less, particularly preferably 50 MPa or less, and even more preferably 10 MPa or less. When Young's coefficient E1 is in the above range, the ratio (E2/E1) and the ratio (E1/E0) can be easily adjusted in the above range.
本實施形態之工件加工用片材,上述楊氏係數E2,以100MPa以上為佳,特別以130MPa以上更佳,140MPa以上再更佳。又,楊氏係數E2,以300MPa以下為佳,特別以250MPa以下更佳,200MPa以下再更佳。楊氏係數E2在上述範圍時,可容易地調整比值(E2/E1)在上述範圍。In the sheet for workpiece processing of the present embodiment, the Young's coefficient E2 is preferably 100 MPa or more, particularly preferably 130 MPa or more, and even more preferably 140 MPa or more. In addition, the Young's coefficient E2 is preferably 300 MPa or less, particularly preferably 250 MPa or less, and even more preferably 200 MPa or less. When Young's coefficient E2 is in the above range, the ratio (E2/E1) can be easily adjusted in the above range.
又,上述之楊氏係數E0、E1及E2之各測定方法,詳細地如後述之試驗例中之記載。In addition, the measurement methods of the Young's coefficients E0, E1, and E2 described above are as described in the test examples described later in detail.
2.工件加工用片材之構成組件 (1)基材 本實施形態之工件加工用片材中,基材,只要在使用工件加工用片材之步驟中可發揮所期望的機能,而最好對黏著劑層之硬化所照射之活性能量線可發揮良好的透光性,同時具有特定的耐熱性即可,並無特別之限定。2. Components of sheet material for workpiece processing (1) Substrate In the work-processing sheet of this embodiment, the base material can exhibit the desired function in the step of using the work-processing sheet, and it is preferable that the active energy rays irradiated by the hardening of the adhesive layer can perform well. It is only necessary to have specific heat resistance at the same time, and there is no particular limitation.
例如,基材,係以主材為樹脂系之材料的樹脂薄膜為佳,作為具體例,可舉如乙烯-乙酸乙烯酯共聚物薄膜;乙烯-(甲基)丙烯酸共聚物薄膜、乙烯-(甲基)丙烯酸甲酯共聚物薄膜、其他之乙烯-(甲基)丙烯酸酯共聚物薄膜等之乙烯系共聚物薄膜;聚乙烯薄膜、聚丙烯薄膜、聚丁烯薄膜、聚丁二烯薄膜、聚甲基戊烯薄膜、乙烯-降莰烯共聚物薄膜、降莰烯樹脂薄膜、環烯烴樹脂薄膜等之聚烯烴系薄膜;聚氯化乙烯薄膜、氯化乙烯共聚物薄膜等之聚氯化乙烯系薄膜;聚對苯二甲酸乙二酯薄膜、聚對苯二甲酸丁二酯薄膜、聚對苯二甲酸環己烷二甲酯、聚萘二甲酸乙二酯等之聚酯系薄膜;(甲基)丙烯酸酯共聚物薄膜;聚胺酯薄膜;聚醯亞胺薄膜;聚苯乙烯薄膜;聚碳酸酯薄膜;氟樹脂薄膜;聚苯硫醚(polyphenylene sulfide)薄膜等。聚乙烯薄膜之例,可舉如低密度聚乙烯(LDPE)薄膜、直鏈低密度聚乙烯(LLDPE)薄膜、高密度聚乙烯(HDPE)薄膜等。又,亦可使用此等物之交聯薄膜、離子聚合物薄膜之改質薄膜。又,基材,亦可為以複數積層上述薄膜而成之積層薄膜。此類積層薄膜中,構成各層之材料可為相同種類,亦可為不同種類。作為基材,上述薄膜中,由活性能量線之透光性及耐熱性良好之觀點而言,以使用經退火處理過之聚酯系薄膜、具有耐熱性之聚酯系薄膜、聚碳酸酯薄膜、聚苯硫醚薄膜、環烯烴樹脂薄膜較佳。再者,本案說明書中之「(甲基)丙烯酸」,係指丙烯酸及甲基丙烯酸之雙方。其它類似之用語亦相同。For example, the substrate is preferably a resin film whose main material is a resin-based material. Specific examples include ethylene-vinyl acetate copolymer film; ethylene-(meth)acrylic acid copolymer film, ethylene-( Ethylene copolymer films such as methyl meth)acrylate copolymer films and other ethylene-(meth)acrylate copolymer films; polyethylene film, polypropylene film, polybutene film, polybutadiene film, Polyolefin-based films such as polymethylpentene film, ethylene-norbornene copolymer film, norbornene resin film, cycloolefin resin film, etc.; polychlorinated vinyl chloride film, chlorinated ethylene copolymer film, etc. Ethylene film; Polyester film such as polyethylene terephthalate film, polybutylene terephthalate film, polycyclohexane dimethyl terephthalate, polyethylene naphthalate, etc.; (Meth) acrylate copolymer film; polyurethane film; polyimide film; polystyrene film; polycarbonate film; fluororesin film; polyphenylene sulfide film, etc. Examples of polyethylene films include low-density polyethylene (LDPE) films, linear low-density polyethylene (LLDPE) films, and high-density polyethylene (HDPE) films. In addition, cross-linked films of these substances and modified films of ionic polymer films can also be used. In addition, the substrate may be a laminated film obtained by laminating the above-mentioned films in plural. In this type of laminated film, the materials constituting each layer may be of the same type or different types. As a base material, among the above films, from the viewpoint of good light transmittance and heat resistance of active energy rays, annealed polyester film, heat resistant polyester film, and polycarbonate film are used. , Polyphenylene sulfide film and cycloolefin resin film are preferred. Furthermore, "(meth)acrylic acid" in the specification of this case refers to both acrylic acid and methacrylic acid. Other similar terms are also the same.
基材,亦可含有抗燃劑、塑形劑、防帶電劑、潤滑劑、抗氧化劑、著色劑、紅外線吸收劑、紫外線吸收劑、離子螯合劑等之各種添加劑。此些添加劑之含量,並無特別之限定,而以在基材中可以發揮期望之機能之範圍為佳。The substrate may also contain various additives such as flame retardants, plasticizers, antistatic agents, lubricants, antioxidants, colorants, infrared absorbers, ultraviolet absorbers, ion chelating agents and the like. The content of these additives is not particularly limited, and is preferably within a range that can exhibit desired functions in the substrate.
在基材積層黏著劑層之表面上,為提高與黏著劑層之密貼性,亦可施以塗底處理、電暈處理、電漿處理等之表面處理。On the surface of the base material laminated adhesive layer, in order to improve the adhesion with the adhesive layer, surface treatment such as primer treatment, corona treatment, plasma treatment, etc. can also be applied.
基材之厚度,可視使用工件加工用片材之方法適當地設定,通常,以20μm以上為佳,特別以25μm以上更佳。又,該厚度,通常,以450μm以下為佳,特別以300μm以下更佳。The thickness of the substrate can be appropriately set depending on the method of using the workpiece processing sheet. Generally, it is preferably 20 μm or more, and more preferably 25 μm or more. In addition, the thickness is generally preferably 450 μm or less, and more preferably 300 μm or less.
(2)黏著劑層 本實施形態之工件加工用片材中,黏著劑層,係由活性能量線硬化性黏著劑所構成。由於由活性能量線硬化性黏著劑構成黏著劑層,可以照射活性能量線使黏著劑層硬化,而降低對工件加工用片材之接著體的黏著力。此情形下,可容易地由工件加工用片材分離加工後之工件。(2) Adhesive layer In the workpiece processing sheet of this embodiment, the adhesive layer is composed of an active energy ray-curable adhesive. Since the adhesive layer is composed of an active energy ray-curable adhesive, the active energy ray can be irradiated to harden the adhesive layer and reduce the adhesive force to the bonding body of the sheet for workpiece processing. In this case, the processed workpiece can be easily separated from the workpiece processing sheet.
又,本實施形態中之黏著劑層,以可達成前述之黏著力為佳。由該觀點言之,本實施形態中之黏著劑層,以構成該黏著劑層之活性能量線硬化性黏著劑的玻璃轉變溫度,為-50℃以上、10℃以下,同時活性能量線硬化性黏著劑,含有包含具極性基之單體作為構成單體的丙烯酸系共聚物較佳。具有以此類活性能量線硬化性黏著劑構成之黏著劑層,可容易地使工件加工用片材達成前述之黏著力。In addition, the adhesive layer in this embodiment is preferably capable of achieving the aforementioned adhesive force. From this point of view, the adhesive layer in the present embodiment has a glass transition temperature of the active energy ray-curable adhesive that constitutes the adhesive layer, which is above -50°C and 10°C or less, and the active energy ray hardenability The adhesive preferably contains an acrylic copolymer containing a monomer having a polar group as a constituent monomer. With an adhesive layer composed of such an active energy ray-curable adhesive, it is possible to easily achieve the aforementioned adhesive force for the workpiece processing sheet.
由工件加工用片材可更容易地達成前述黏著力之觀點言之,上述玻璃轉變溫度,特別以-20℃以上為佳,-15℃以上更佳。又,在同樣之觀點上,上述玻璃轉變溫度,又特別以5℃以下為佳,3℃以下更佳。再者,上述玻璃轉變溫度之測定方法,詳細地如後述之試驗例中之記載。From the viewpoint that the aforementioned adhesive force can be achieved more easily from the sheet for workpiece processing, the above-mentioned glass transition temperature is particularly preferably -20°C or higher, and more preferably -15°C or higher. In addition, from the same viewpoint, the above-mentioned glass transition temperature is particularly preferably 5°C or less, and more preferably 3°C or less. In addition, the measurement method of the said glass transition temperature is as described in the test example mentioned later in detail.
構成黏著劑層的活性能量線硬化性黏著劑,可以具活性能量線硬化性的聚合物作為主成分,亦可以活性能量線非硬化性聚合物(即不具活性能量線硬化性的聚合物)與含至少1種以上之具活性能量線硬化性基的單體及/或寡聚物之混合物作為主成分。The active energy ray curable adhesive constituting the adhesive layer can be a polymer with active energy ray curability as the main component, or an active energy ray non-curable polymer (that is, a polymer without active energy ray curability) and A mixture containing at least one or more monomers and/or oligomers having active energy ray hardening groups as the main component.
以下首先,對活性能量線硬化性黏著劑,以具活性能量線硬化性的聚合物作為主成分之情形加以說明。Hereinafter, first, the case where the active energy ray-curable adhesive has an active energy ray-curable polymer as the main component will be described.
具活性能量線硬化性的聚合物,以側鏈上導入含活性能量線硬化性的官能基(活性能量線硬化性基)之(甲基)丙烯酸酯(共)聚合物(A)(以下有時稱為「活性能量線硬化性聚合物(A)」)為佳。此類活性能量線硬化性聚合物(A),以由含有含官能基的單體單位之丙烯酸系共聚物(a1)與含有與該官能基鍵結的官能基之含不飽合基化合物(a2)反應而獲得為佳。Active energy ray-curable polymer, with active energy ray-curable functional group (active energy ray-curable group) introduced into the side chain (meth)acrylate (co)polymer (A) (there are below It is better to call it "active energy ray curable polymer (A)"). This type of active energy ray curable polymer (A) consists of an acrylic copolymer (a1) containing a functional group-containing monomer unit and an unsaturated group-containing compound (a1) containing a functional group bonded to the functional group ( a2) The reaction is better.
作為上述含官能基的單體,以分子內含:聚合性的雙鍵及羥基、羧基、胺基、醯胺基、苯甲基、環氧丙基等之官能基的單體為佳,其中,以使用含官能基為羥基的單體(含羥基單體)較佳。As the above-mentioned functional group-containing monomers, monomers containing polymerizable double bonds and functional groups such as hydroxyl, carboxyl, amino, amido, benzyl, and glycidyl groups in the molecule are preferred. It is better to use monomers containing functional groups as hydroxyl groups (hydroxyl-containing monomers).
作為上述含羥基單體,可舉如:(甲基)丙烯酸-2-羥基乙酯、(甲基)丙烯酸-2-羥基丙酯、(甲基)丙烯酸-3-羥基丙酯、(甲基)丙烯酸-2-羥基丁酯、(甲基)丙烯酸-3-羥基丁酯、(甲基)丙烯酸-4-羥基丁酯等,其中,以使用丙烯酸-2-羥基乙酯較佳。又,此些可單獨或以2種以上組合使用。Examples of the above-mentioned hydroxyl-containing monomers include: 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate, (methyl) ) 2-hydroxybutyl acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc. Among them, 2-hydroxyethyl acrylate is preferably used. Moreover, these can be used individually or in combination of 2 or more types.
作為上述含羧基單體,可舉如:丙烯酸、甲基丙烯酸、丁烯酸、順丁烯二酸、依康酸、檸康酸等乙烯性不飽和羧酸。此些可單獨使用,亦可以2種以上組合使用。Examples of the carboxyl group-containing monomer include ethylenically unsaturated carboxylic acids such as acrylic acid, methacrylic acid, crotonic acid, maleic acid, itaconic acid, and citraconic acid. These can be used alone or in combination of two or more kinds.
作為上述含胺基單體或含醯胺基單體,可舉如:(甲基)丙烯酸胺基乙酯、(甲基)丙烯酸正丁基胺基乙酯等。此些可單獨使用,亦可以2種以上組合使用。Examples of the above-mentioned amine group-containing monomers or amide group-containing monomers include aminoethyl (meth)acrylate, n-butylaminoethyl (meth)acrylate, and the like. These can be used alone or in combination of two or more kinds.
上述丙烯酸系共聚物(a1),由含上述官能基之單體所衍生之構成單位,以含量1質量%以上為佳,特別是含量5質量%以上更佳,含量10質量%以上再更佳。又,丙烯酸系共聚物(a1),由含上述官能基之單體所衍生之構成單位,以含量35質量%以下為佳,特別是含量30質量%以下更佳。丙烯酸系共聚物(a1)所含之含官能基之單體在上述範圍時,可容易地形成所期望之活性能量線硬化性聚合物(A)。The above-mentioned acrylic copolymer (a1) is a structural unit derived from a monomer containing the above-mentioned functional group. The content is preferably at least 1% by mass, especially at least 5% by mass, and even more preferably at least 10% by mass. . In addition, the acrylic copolymer (a1), which is a structural unit derived from a monomer containing the aforementioned functional group, preferably has a content of 35% by mass or less, and more preferably a content of 30% by mass or less. When the functional group-containing monomer contained in the acrylic copolymer (a1) is in the above range, the desired active energy ray curable polymer (A) can be easily formed.
丙烯酸系共聚物(a1),如前所述,作為構成聚合物之單體單位,以含有含極性基之單體(含極性基單體)為佳。此情形時,可以提高所得之活性能量線硬化性黏著劑的極性,因此可容易地達成前述之黏著力。The acrylic copolymer (a1), as described above, preferably contains a polar group-containing monomer (polar group-containing monomer) as a monomer unit constituting the polymer. In this case, the polarity of the obtained active energy ray-curable adhesive can be increased, so the aforementioned adhesive force can be easily achieved.
作為含極性基單體之例,可舉如:丙烯醯基嗎福啉、丙烯酸異莰酯、甲基丙烯酸甲酯、乙酸乙烯酯、丙烯酸苯甲酯、甲基丙烯酸環氧丙酯等,其中,特別以使用丙烯醯基嗎福啉或丙烯酸異莰酯較佳。Examples of polar group-containing monomers include acryloylmorpholine, isobornyl acrylate, methyl methacrylate, vinyl acetate, benzyl acrylate, glycidyl methacrylate, etc. In particular, it is better to use acrylomorpholine or isobornyl acrylate.
丙烯酸系共聚物(a1),由上述含極性基之單體所衍生之構成單位,以含量3.0質量%以上為佳,特別是含量5.0質量%以上更佳,含量8.0質量%以上再更佳。又,丙烯酸系共聚物(a1),由上述含極性基之單體所衍生之構成單位,以含量12.0質量%以下為佳。丙烯酸系共聚物(a1)在含有在上述範圍之上述含極性基單體時,可以有效地提高所得之活性能量線硬化性黏著劑的極性,因此可容易地達成前述之黏著力。The acrylic copolymer (a1), a constituent unit derived from the above-mentioned polar group-containing monomer, preferably has a content of 3.0% by mass or more, particularly preferably a content of 5.0% by mass or more, and even more preferably a content of 8.0% by mass or more. In addition, the acrylic copolymer (a1), a structural unit derived from the above-mentioned polar group-containing monomer, preferably has a content of 12.0% by mass or less. When the acrylic copolymer (a1) contains the above-mentioned polar group-containing monomer in the above-mentioned range, the polarity of the obtained active energy ray-curable adhesive can be effectively increased, and therefore the aforementioned adhesive force can be easily achieved.
又,丙烯酸系共聚物(a1),作為構成聚合物之單體單位,以含有用以調整活性能量線硬化性黏著劑之玻璃轉變溫度(Tg)的單體(Tg調整單體)為佳。此情形下,可使所得之活性能量線硬化性黏著劑,容易地具有前述之玻璃轉變溫度(Tg)。作為兼具Tg調整單體的較佳之單體之例,可舉如前述含極性基單體所舉之例,其中,特別以使用丙烯醯基嗎福啉或丙烯酸異莰酯較佳。In addition, the acrylic copolymer (a1), as a monomer unit constituting the polymer, preferably contains a monomer (Tg adjusting monomer) for adjusting the glass transition temperature (Tg) of the active energy ray curable adhesive. In this case, the resulting active energy ray-curable adhesive can easily have the aforementioned glass transition temperature (Tg). As examples of preferable monomers having both Tg adjusting monomers, the polar group-containing monomers mentioned above can be cited. Among them, it is particularly preferable to use acrylomorpholine or isobornyl acrylate.
上述Tg調整單體的玻璃轉變溫度,以30℃以上為佳,特別以50℃以上更佳,90℃以上又更佳。又,Tg調整單體的玻璃轉變溫度,以200℃以下為佳,特別以180℃以下更佳,150℃以下又更佳。使用具有此些範圍之玻璃轉變溫度的Tg調整單體時,可容易地調整活性能量線硬化性黏著劑之玻璃轉變溫度在前述之範圍。又,本案說明書中,對於單體之玻璃轉變溫度,係指以單由該單體所構成之同質聚合物所測定之玻璃轉變溫度。The glass transition temperature of the aforementioned Tg adjusting monomer is preferably 30°C or higher, especially 50°C or higher, and more preferably 90°C or higher. In addition, the Tg adjusts the glass transition temperature of the monomer, preferably 200°C or less, particularly preferably 180°C or less, and more preferably 150°C or less. When a Tg adjusting monomer having a glass transition temperature in these ranges is used, the glass transition temperature of the active energy ray-curable adhesive can be easily adjusted within the aforementioned range. In addition, in the specification of this case, the glass transition temperature of a monomer refers to the glass transition temperature measured by a homogeneous polymer composed of the monomer alone.
又,上述之Tg調整單體的溶解參數(SP值),以9.8以上為佳,特別以9.9以上更佳,10.0以上又更佳。Tg調整單體的SP值在9.8以上時,可容易地調整工件加工用片材之黏著力在前述之範圍,特別可容易地調整初始黏著力F0在前述之範圍。因此,在加工時可容易地保持工件在工件加工用片材上。又,溶解參數(SP值)之上限值方面並無特別之限定,例如可為11以下。In addition, the above-mentioned Tg adjusts the dissolution parameter (SP value) of the monomer, preferably 9.8 or more, particularly preferably 9.9 or more, and more preferably 10.0 or more. When the SP value of the Tg adjusting monomer is above 9.8, the adhesive force of the workpiece processing sheet can be easily adjusted within the aforementioned range, and the initial adhesive force F0 can be easily adjusted within the aforementioned range. Therefore, the workpiece can be easily held on the workpiece processing sheet during processing. In addition, the upper limit of the dissolution parameter (SP value) is not particularly limited, and it may be 11 or less, for example.
丙烯酸系共聚物(a1),由上述Tg調整單體所衍生之構成單位,以含量3.0質量%以上為佳,特別是含量5.0質量%以上更佳,含量8.0質量%以上再更佳。又,丙烯酸系共聚物(a1),由上述Tg調整單體所衍生之構成單位,以含量12.0質量%以下為佳。丙烯酸系共聚物(a1)在含有上述範圍之Tg調整單體時,可容易地調整所得之活性能量線硬化性黏著劑的玻璃轉變溫度在前述之範圍。The acrylic copolymer (a1), a structural unit derived from the above-mentioned Tg adjusting monomer, preferably has a content of 3.0% by mass or more, particularly preferably a content of 5.0% by mass or more, and even more preferably a content of 8.0% by mass or more. In addition, the acrylic copolymer (a1), a constituent unit derived from the above-mentioned Tg adjusting monomer, preferably has a content of 12.0% by mass or less. When the acrylic copolymer (a1) contains the Tg adjusting monomer in the above range, the glass transition temperature of the obtained active energy ray-curable adhesive can be easily adjusted within the above range.
丙烯酸系共聚物(a1),作為構成聚合物之單體單位,以使用烷基之碳數為1至20之(甲基)丙烯酸烷基酯單體為佳。作為此類(甲基)丙烯酸烷基酯單體,特別以烷基之碳數為1至18之(甲基)丙烯酸烷基酯單體更佳。又,由可容易地獲得耐熱性良好之黏著劑之觀點言之,以烷基之碳數為8以上之(甲基)丙烯酸烷基酯單體較佳。作為烷基之碳數為1至20之(甲基)丙烯酸烷基酯單體之較佳之例,可舉如:甲基丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸-2-乙基己酯等。此些可以1種單獨使用,亦可以2種以上組合使用。The acrylic copolymer (a1), as a monomer unit constituting the polymer, preferably uses an alkyl (meth)acrylate monomer having an alkyl group of 1 to 20 carbon atoms. As such an alkyl (meth)acrylate monomer, an alkyl (meth)acrylate monomer having an alkyl group of 1 to 18 carbon atoms is particularly preferred. In addition, from the viewpoint of easily obtaining an adhesive with good heat resistance, an alkyl (meth)acrylate monomer having an alkyl group with 8 or more carbon atoms is preferred. As a preferable example of the alkyl (meth)acrylate monomer with the carbon number of the alkyl group being 1 to 20, for example, methyl methacrylate, ethyl (meth)acrylate, and propylene (meth)acrylate can be mentioned. Ester, n-butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, etc. These can be used individually by 1 type, and can also be used in combination of 2 or more types.
丙烯酸系共聚物(a1),由上述之烷基之碳數為1至20之(甲基)丙烯酸烷基酯單體所衍生之構成單位,以含量50質量%以上為佳,特別是含量60質量%以上更佳,含量70質量%以上再更佳。又,丙烯酸系共聚物(a1),由上述之烷基之碳數為1至20之(甲基)丙烯酸烷基酯單體所衍生之構成單位,以含量99質量%以下為佳,特別是含量95質量%以下更佳,含量90質量%以下再更佳。The acrylic copolymer (a1) is a structural unit derived from the above-mentioned alkyl (meth)acrylic acid alkyl ester monomer with a carbon number of 1 to 20. The content is preferably at least 50% by mass, especially the content is 60 It is more preferable that the mass% is more than 70 mass%. In addition, the acrylic copolymer (a1) is a structural unit derived from the above-mentioned alkyl (meth)acrylic acid alkyl ester monomer having a carbon number of 1 to 20, and the content is preferably 99% by mass or less, especially The content is more preferably 95% by mass or less, and even more preferably the content is 90% by mass or less.
丙烯酸系共聚物(a1),以由以上說明之單體或其衍生物以常法共聚而獲得為佳,此類單體之外,亦可以分子內含脂環構造之單體(含脂環構造單體)、二甲基丙烯醯胺、甲酸乙烯酯、苯乙烯等共聚。The acrylic copolymer (a1) is preferably obtained by copolymerizing the above-described monomers or their derivatives by conventional methods. In addition to such monomers, monomers with alicyclic structures (including alicyclic Structural monomer), dimethyl acrylamide, vinyl formate, styrene and other copolymers.
作為上述含脂環構造單體之例,可舉如:(甲基)丙烯酸環己酯、(甲基)丙烯酸二環戊酯、(甲基)丙烯酸金剛烷酯、(甲基)丙烯酸異莰酯、(甲基)丙烯酸二環戊酯(dicyclopentanyl (meth)acrylate)、(甲基)丙烯酸二環戊烯氧基乙酯(dicyclopentenyloxyethyl (meth)acrylate)等。此些可以1種單獨使用,亦可以2種以上組合使用。Examples of the above-mentioned alicyclic structural monomers include: cyclohexyl (meth)acrylate, dicyclopentyl (meth)acrylate, adamantyl (meth)acrylate, isocampan (meth)acrylate Ester, dicyclopentanyl (meth)acrylate, dicyclopentenyloxyethyl (meth)acrylate, etc. These can be used individually by 1 type, and can also be used in combination of 2 or more types.
以上述含有含官能基的單體單位之丙烯酸系共聚物(a1)與含有與該官能基鍵結的官能基之含不飽合基化合物(a2)反應,即可獲得活性能量線硬化性聚合物(A)。The acrylic copolymer (a1) containing the functional group-containing monomer unit is reacted with the unsaturated group-containing compound (a2) containing the functional group bonded to the functional group to obtain active energy ray curable polymerization物(A).
含不飽合基化合物(a2)所含的官能基,可視丙烯酸系共聚物(a1)所含的含官能基的單體單位之官能基的種類,適當地選擇。例如,在丙烯酸系共聚物(a1)所含的官能基為羥基、胺基或醯胺基之情形,含不飽合基化合物(a2)所含的官能基以異氰酸酯基或環氧基為佳;在丙烯酸系共聚物(a1)所含的官能基為環氧丙基之情形,含不飽合基化合物(a2)所含的官能基以胺基、羧基或吖丙啶基(aziridinyl)為佳。The functional group contained in the unsaturated group-containing compound (a2) may be appropriately selected depending on the type of the functional group of the functional group-containing monomer unit contained in the acrylic copolymer (a1). For example, when the functional group contained in the acrylic copolymer (a1) is a hydroxyl group, an amino group or an amide group, the functional group contained in the unsaturated group-containing compound (a2) is preferably an isocyanate group or an epoxy group ; In the case where the functional group contained in the acrylic copolymer (a1) is a glycidyl group, the functional group contained in the unsaturated group-containing compound (a2) is an amino group, a carboxyl group or an aziridinyl group (aziridinyl) good.
再者上述含不飽合基化合物(a2)中,活性能量線聚合性之碳-碳雙鍵,以1分子中至少含有1個,以含有1至6個為佳,含有1至4個再更佳。作為此類含不飽合基化合物(a2)之具體例,可舉如:異氰酸-2-甲基丙烯醯氧基乙酯、異氰酸甲基異丙烯基-α,α-二甲基苯甲酯、甲基丙烯醯基異氰酸酯、異氰酸烯丙酯、異氰酸-1,1-(二丙烯醯氧基甲基)乙酯;以二異氰酸酯化合物或聚異氰酸酯化合物與(甲基)丙烯酸羥基乙酯反應所得之丙烯醯基單異氰酸酯化合物;二異氰酸酯化合物或聚異氰酸酯化合物與多元醇化合物及(甲基)丙烯酸羥基乙酯反應所得之丙烯醯基單異氰酸酯化合物;(甲基)丙烯酸環氧丙酯;(甲基)丙烯酸、(甲基)丙烯酸-2-(1-吖丙啶基)乙酯、2-乙烯基-2-噁唑啉、2-異丙烯基-2-噁唑啉等。Furthermore, in the above-mentioned unsaturated group-containing compound (a2), the active energy ray polymerizable carbon-carbon double bond contains at least one in a molecule, preferably 1 to 6, and 1 to 4 more Better. As specific examples of such unsaturated group-containing compounds (a2), for example, isocyanate-2-methacryloxyethyl, isocyanate methyl isopropenyl-α,α-dimethyl Methyl benzyl, methacryloyl isocyanate, allyl isocyanate, 1,1-(diacryloyloxymethyl) ethyl isocyanate; with diisocyanate compound or polyisocyanate compound and (form (M) Acrylic monoisocyanate compound obtained by reacting hydroxyethyl acrylate; Acrylic monoisocyanate compound obtained by reacting diisocyanate compound or polyisocyanate compound with polyol compound and hydroxyethyl (meth)acrylate; (methyl) Glycidyl acrylate; (meth)acrylic acid, (meth)acrylic acid-2-(1-aziridinyl)ethyl, 2-vinyl-2-oxazoline, 2-isopropenyl-2- Oxazoline and so on.
上述含不飽合基化合物(a2),以使用相對上述丙烯酸系共聚物(a1)之含官能基單體的莫耳數,為50莫耳%以上為佳,特別是60莫耳%以上更佳,70莫耳%以上再更佳。又,上述含不飽合基化合物(a2),以使用相對上述丙烯酸系共聚物(a1)之含官能基單體的莫耳數,為95莫耳%以下為佳,特別是93莫耳%以下更佳,90莫耳%以下再更佳。The unsaturated group-containing compound (a2) is preferably 50 mol% or more relative to the number of moles of the functional group-containing monomer of the acrylic copolymer (a1), especially 60 mol% or more. Better, more than 70 mol% is even better. In addition, the above-mentioned unsaturated group-containing compound (a2) is preferably 95 mol% or less, especially 93 mol%, relative to the number of moles of the functional group-containing monomer of the acrylic copolymer (a1). The following is better, and 90 mol% or less is even better.
丙烯酸系共聚物(a1)與含不飽合基化合物(a2)之反應中,可視丙烯酸系共聚物(a1)所含之官能基與含不飽合基化合物(a2)所含之官能基的組合,適當選擇反應之溫度、壓力、溶劑、時間、催化劑之有無、催化劑之種類。此情形下,存在於丙烯酸系共聚物(a1)中之官能基會與含不飽合基化合物(a2)中之官能基反應,使不飽合基導入丙烯酸系共聚物(a1)中之側鏈,獲得活性能量線硬化性聚合物(A)。In the reaction between the acrylic copolymer (a1) and the unsaturated group-containing compound (a2), the difference between the functional group contained in the acrylic copolymer (a1) and the functional group contained in the unsaturated group-containing compound (a2) can be seen Combination, appropriate selection of reaction temperature, pressure, solvent, time, presence or absence of catalyst, and type of catalyst. In this case, the functional groups existing in the acrylic copolymer (a1) will react with the functional groups in the unsaturated group-containing compound (a2) to introduce the unsaturated groups into the acrylic copolymer (a1) Chain to obtain active energy ray-curable polymer (A).
此情形下獲得之活性能量線硬化性聚合物(A)的重量平均分子量(Mw),以1萬以上為佳,特別以15萬以上更佳,20萬以上再更佳。又,該重量平均分子量(Mw),以150萬以下為佳,特別以100萬以下更佳。再者,本案說明書中之重量平均分子量(Mw),係以膠體過濾層析法(GPC法)測定後再換算為標準聚苯乙烯之值。The weight average molecular weight (Mw) of the active energy ray curable polymer (A) obtained in this case is preferably 10,000 or more, especially 150,000 or more, and more preferably 200,000 or more. In addition, the weight average molecular weight (Mw) is preferably 1.5 million or less, and more preferably 1 million or less. Furthermore, the weight average molecular weight (Mw) in the specification of this case is measured by colloidal filtration chromatography (GPC method) and then converted into standard polystyrene values.
活性能量線硬化性黏著劑,即使主成分為活性能量線硬化性聚合物(A)之具活性能量線硬化性的聚合物,活性能量線硬化性黏著劑,亦可再含有活性能量線硬化性之單體及/或寡聚物(B)。Active energy ray hardening adhesive, even if the main component is active energy ray hardening polymer (A), the active energy ray hardening adhesive can also contain active energy ray hardening The monomer and/or oligomer (B).
作為活性能量線硬化性之單體及/或寡聚物(B),可使用如:多元醇與(甲基)丙烯酸之酯等。As active energy ray curable monomers and/or oligomers (B), for example, esters of polyols and (meth)acrylic acid can be used.
作為該活性能量線硬化性之單體及/或寡聚物(B),可舉如:(甲基)丙烯酸環己酯、(甲基)丙烯酸異莰酯等之單官能性丙烯酸酯類;三羥甲基丙烷三(甲基)丙烯酸酯、新戊四醇三(甲基)丙烯酸酯、新戊四醇四(甲基)丙烯酸酯、二新戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、二羥甲基三環癸烷二(甲基)丙烯酸酯等之多官能性丙烯酸酯類;聚酯寡聚(甲基)丙烯酸酯、聚脲烷寡聚(甲基)丙烯酸酯等。Examples of the active energy ray-curable monomer and/or oligomer (B) include monofunctional acrylates such as cyclohexyl (meth)acrylate and isobornyl (meth)acrylate; Trimethylolpropane tri(meth)acrylate, neopentaerythritol tri(meth)acrylate, neopentaerythritol tetra(meth)acrylate, dineopentylerythritol hexa(meth)acrylate, 1,4-Butanediol di(meth)acrylate, 1,6-hexanediol di(meth)acrylate, polyethylene glycol di(meth)acrylate, dimethylol tricyclodecane Multifunctional acrylates such as di(meth)acrylate; polyester oligo(meth)acrylate, polyurethane oligo(meth)acrylate, etc.
在對活性能量線硬化性聚合物(A),調製活性能量線硬化性之單體及/或寡聚物(B)之情形,活性能量線硬化性黏著劑中活性能量線硬化性之單體及/或寡聚物(B)之含量,以相對活性能量線硬化性聚合物(A)100質量份,超過0質量份為佳,特別以60質量份以上更佳。又,該含量,以相對活性能量線硬化性聚合物(A)100質量份,為250質量份以下為佳,特別以200質量份以下更佳。In the case of preparing active energy ray-curable polymer (A), active energy ray-curable monomer and/or oligomer (B), active energy ray-curable monomer in the active energy ray-curable adhesive And/or the content of the oligomer (B) is preferably more than 0 parts by mass relative to 100 parts by mass of the active energy ray-curable polymer (A), especially 60 parts by mass or more. In addition, the content is preferably 250 parts by mass or less with respect to 100 parts by mass of the active energy ray curable polymer (A), and more preferably 200 parts by mass or less.
其中,在使活性能量線硬化性黏著劑硬化所使用之活性能量線為紫外線之情形時,以再添加光聚合起始劑(C)為佳,在使用該光聚合起始劑(C)時,可減少聚合硬化時間及光線照射量。Among them, when the active energy ray used for curing the active energy ray curable adhesive is ultraviolet light, it is better to add a photopolymerization initiator (C). When the photopolymerization initiator (C) is used , Can reduce the polymerization hardening time and light exposure.
本實施形態中之光聚合起始劑(C),以5%重量損失溫度為200℃以上為佳,特別以210℃以上更佳,220℃以上再更佳。在使用顯示5%重量損失溫度為200℃以上的光聚合起始劑(C)時,可容易地調整工件加工用片材的黏著力在前述範圍,特別是,可容易地調整經過加熱及照射活性能量線後之黏著力F2在前述範圍。此情形下,即使在進行加熱處理之情形下,亦可容易地由工件加工用片材分離加工後之工件。又,5%重量損失溫度之上限值,並無特別之限定,例如以300℃以下為佳,特別以280℃以下更佳,250℃以下再更佳。再者,上述5%重量損失溫度之測定方法,詳細地如後述之實施例中之記載。The photopolymerization initiator (C) in this embodiment preferably has a 5% weight loss temperature of 200°C or higher, particularly preferably 210°C or higher, and even more preferably 220°C or higher. When the photopolymerization initiator (C) exhibiting a 5% weight loss temperature of 200°C or higher is used, the adhesive force of the workpiece processing sheet can be easily adjusted within the aforementioned range. In particular, it can be easily adjusted after heating and irradiation The adhesive force F2 after the active energy line is in the aforementioned range. In this case, even in the case of heat treatment, the processed workpiece can be easily separated from the workpiece processing sheet. In addition, the upper limit of the 5% weight loss temperature is not particularly limited. For example, it is preferably 300°C or less, particularly 280°C or less, and even more preferably 250°C or less. In addition, the method for measuring the above-mentioned 5% weight loss temperature is described in detail in the examples described later.
光聚合起始劑(C)之具體例,可舉如:二苯酮、苯乙酮、安息香(benzoin)、安息香甲基醚、安息香乙基醚、安息香異丙基醚、安息香異丁基醚、安息香苯甲酸(benzoin benzoic acid)、安息香苯甲酸甲酯、安息香二甲縮酮、2,4-二乙基硫雜蒽銅、1-羥基環己基苯基酮、苯甲基二苯基硫(benzyldiphenyl sulfide)、單硫化四甲基硫蘭(tetramethylthiuram monosulfide)、偶氮二異丁腈、苯甲基-(benzyl)、二苯甲基-(dibenzyl)、二乙醯基-(diacetyl)、β-綠蒽醌、氧化(2,4,6-三甲基苯甲基二苯基)膦((2,4,6-trimethyl benzyl diphenyl) phosphine oxide)、2-苯并噻唑-N,N-二乙基二硫胺甲酸酯(2-benzothiazole-N, N-diethyldithiocarbamate)、寡聚{2-羥基-2-甲基-1-[4-(1-丙烯基)苯基]丙酮}(oligo{2-hydroxy-2-methyl-1-[4-(1-propenyl)phenyl] propanone})、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]苯基}-2-甲基-丙烷-1-酮等。其中,以使用2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]苯基}-2-甲基-丙烷-1-酮較佳。此些可單獨使用,亦可以2種以上併用。Specific examples of the photopolymerization initiator (C) include: benzophenone, acetophenone, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether , Benzoin benzoic acid (benzoin benzoic acid), benzoin methyl benzoate, benzoin dimethyl ketal, 2,4-diethylthioxanthene copper, 1-hydroxycyclohexyl phenyl ketone, benzyl diphenyl sulfide (benzyldiphenyl sulfide), tetramethylthiuram monosulfide, azobisisobutyronitrile, benzyl-(benzyl), dibenzyl-(dibenzyl), diacetyl-(diacetyl), β-green anthraquinone, oxidized (2,4,6-trimethyl benzyl diphenyl) phosphine oxide ((2,4,6-trimethyl benzyl diphenyl) phosphine oxide), 2-benzothiazole-N,N -Diethyldithiocarbamate (2-benzothiazole-N, N-diethyldithiocarbamate), oligomer {2-hydroxy-2-methyl-1-[4-(1-propenyl)phenyl]acetone} (oligo{2-hydroxy-2-methyl-1-[4-(1-propenyl)phenyl] propanone}), 2,2-dimethoxy-1,2-diphenylethane-1-one, 2-Hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2-methyl-propan-1-one and the like. Among them, the use of 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2-methyl-propane-1-one is more good. These may be used alone or in combination of two or more kinds.
光聚合起始劑(C),使用之量以相對活性能量線硬化性聚合物(A)(在調製活性能量線硬化性之單體及/或寡聚物(B)之情形,為活性能量線硬化性聚合物(A)與活性能量線硬化性之單體及/或寡聚物(B)之合計量100質量份)100質量份,為0.1質量份以上為佳,特別以0.5質量份以上更佳。又,光聚合起始劑(C),使用之量以相對活性能量線硬化性聚合物(A)(在調製活性能量線硬化性之單體及/或寡聚物(B)之情形,為活性能量線硬化性聚合物(A)與活性能量線硬化性之單體及/或寡聚物(B)之合計量100質量份)100質量份,為10質量份以下為佳,特別以6質量份以下更佳。The photopolymerization initiator (C) is used in an amount relative to the active energy ray curable polymer (A) (in the case of the active energy ray curable monomer and/or oligomer (B), it is the active energy The total amount of linear curable polymer (A) and active energy ray curable monomer and/or oligomer (B) 100 parts by mass) 100 parts by mass, preferably 0.1 parts by mass or more, especially 0.5 parts by mass The above is better. In addition, the photopolymerization initiator (C) is used in an amount relative to the active energy ray-curable polymer (A) (in the case of the active energy ray-curable monomer and/or oligomer (B), it is The total amount of active energy ray curable polymer (A) and active energy ray curable monomer and/or oligomer (B) 100 parts by mass) 100 parts by mass, preferably 10 parts by mass or less, especially 6 Parts by mass or less is better.
活性能量線硬化性黏著劑中,除上述成分以外,亦可再適當調製其他之成分。作為其他之成分,可舉如:活性能量線非硬化性聚合物成分或寡聚物成分(D)、交聯劑(E)等。In the active energy ray curable adhesive, in addition to the above-mentioned components, other components can be appropriately prepared. Examples of other components include active energy ray non-curable polymer components or oligomer components (D), crosslinking agents (E), and the like.
作為活性能量線非硬化性聚合物成分或寡聚物成分(D),可舉如:聚丙烯酸酯、聚酯、聚胺酯、聚碳酸酯、聚烯烴等,以重量平均分子量(Mw)為3000至250萬之聚合物或寡聚物為佳。在活性能量線硬化性黏著劑中調製該成分(D)時,可改善硬化前之黏著性及剝離性、硬化後之強度、與其他層之接著性、保存安定性等。該成分(D)之調製量並無特別之限定,相對活性能量線硬化性聚合物(A)100質量份,可在超過0質量份、50質量份以下之範圍中適當地決定。Examples of the active energy ray non-curable polymer component or oligomer component (D) include: polyacrylate, polyester, polyurethane, polycarbonate, polyolefin, etc., with a weight average molecular weight (Mw) of 3000 to 2.5 million polymers or oligomers are better. When the component (D) is prepared in an active energy ray curable adhesive, it can improve the adhesion and peelability before curing, the strength after curing, the adhesion to other layers, and the storage stability. The preparation amount of the component (D) is not particularly limited, and it can be appropriately determined in the range of more than 0 parts by mass and 50 parts by mass relative to 100 parts by mass of the active energy ray curable polymer (A).
作為交聯劑(E),可使用具有與活性能量線硬化性聚合物(A)等所含之官能基的反應性之多官能性化合物。作為此類多官能性化合物之例,可舉如:異氰酸酯化合物、環氧化合物、胺化合物、三聚氰胺化合物、吖丙烷化合物、聯胺化合物、醛化合物、噁唑啉化合物、金屬醇鹽化合物、金屬螯合化合物、金屬鹽、銨鹽、反應性苯酚樹脂等。As the crosslinking agent (E), a polyfunctional compound having reactivity with a functional group contained in the active energy ray curable polymer (A) or the like can be used. Examples of such polyfunctional compounds include isocyanate compounds, epoxy compounds, amine compounds, melamine compounds, propylene compounds, hydrazine compounds, aldehyde compounds, oxazoline compounds, metal alkoxide compounds, and metal chelate compounds. Compound compounds, metal salts, ammonium salts, reactive phenol resins, etc.
交聯劑(E)之調製量,以相對活性能量線硬化性聚合物(A)100質量份,為0.01質量份以上為佳,特別以1質量份以上更佳。又,交聯劑(E)之調製量,以相對活性能量線硬化性聚合物(A)100質量份,為20質量份以下為佳,特別以17質量份以下更佳。The preparation amount of the crosslinking agent (E) is preferably 0.01 parts by mass or more relative to 100 parts by mass of the active energy ray curable polymer (A), and more preferably 1 part by mass or more. In addition, the preparation amount of the crosslinking agent (E) is preferably 20 parts by mass or less with respect to 100 parts by mass of the active energy ray curable polymer (A), and more preferably 17 parts by mass or less.
其次,以下再對活性能量線硬化性黏著劑,主成分為活性能量線非硬化性聚合物成分與含至少1種以上之活性能量線硬化性基的單體及/或寡聚物之混合物之情形,加以說明。Secondly, the following is the active energy ray curable adhesive, the main component is a mixture of active energy ray non-curable polymer components and monomers and/or oligomers containing at least one active energy ray curable group Circumstances, explain.
作為活性能量線非硬化性聚合物成分,可使用如前述之丙烯酸系共聚物(a1)之相同之成分。As the active energy ray non-curable polymer component, the same components as the aforementioned acrylic copolymer (a1) can be used.
含至少1種以上之活性能量線硬化性基的單體及/或寡聚物,可選擇前述之成分(B)之相同之物。活性能量線非硬化性聚合物成分及含至少1種以上之活性能量線硬化性基的單體及/或寡聚物之調製比例,相對活性能量線非硬化性聚合物成分100質量份,含至少1種以上之活性能量線硬化性基的單體及/或寡聚物以1質量份以上為佳,特別以60質量份以上更佳。又,該調製比例,相對於活性能量線非硬化性聚合物成分100質量份,含至少1種以上之活性能量線硬化性基的單體及/或寡聚物,以200質量份以下為佳,特別以160質量份以下更佳。The monomer and/or oligomer containing at least one or more active energy ray hardening groups can be selected from the same thing as the aforementioned component (B). The preparation ratio of the active energy ray non-curable polymer component and the monomer and/or oligomer containing at least one or more active energy ray curable groups, relative to 100 parts by mass of the active energy ray non-curable polymer component, contains The monomer and/or oligomer of at least one active energy ray curable group is preferably 1 part by mass or more, particularly 60 parts by mass or more. In addition, the preparation ratio is preferably 200 parts by mass or less of monomers and/or oligomers containing at least one active energy ray curable group relative to 100 parts by mass of the active energy ray non-curable polymer component. , Particularly more preferably 160 parts by mass or less.
該情形下,如同上述,可適當調製光聚合起始劑(C)或交聯劑(E)。In this case, as described above, the photopolymerization initiator (C) or the crosslinking agent (E) can be appropriately prepared.
黏著劑層之厚度,以1μm以上為佳,5μm以上更佳。又,該厚度,以50μm以下為佳,40μm以下更佳。黏著劑層之厚度在上述範圍時,可容易地達成前述之黏著力。The thickness of the adhesive layer is preferably 1 μm or more, more preferably 5 μm or more. In addition, the thickness is preferably 50 μm or less, and more preferably 40 μm or less. When the thickness of the adhesive layer is in the above range, the aforementioned adhesive force can be easily achieved.
(3)剝離片材 本實施形態之工件加工用片材,至以黏著劑層中與基材相反側之面(以下,有時稱為「黏著面」)黏貼在工件上為止之間,為保護該表面之目的,亦可在該表面上積層剝離片材。剝離片材可為任意之構成,例如可以塑膠薄膜經過剝離劑等加以剝離處理。作為塑膠薄膜之具體例,可舉如:聚乙烯對苯二甲酸酯、聚丁烯對苯二甲酸酯、聚乙烯對萘二甲酸酯等之聚酯薄膜;及聚丙烯或聚乙烯等之聚烯烴薄膜。剝離劑,可使用:矽氧烷系、氟素系、長鏈烷系等,其中,以低價且可得到安定之性能之矽氧烷系較佳。剝離片材之厚度並無特別之限定,通常可為20μm以上、250μm以下。(3) Peeling sheet The workpiece processing sheet of this embodiment is used to protect the surface between the surface of the adhesive layer opposite to the substrate (hereinafter, sometimes referred to as "adhesive surface"). A release sheet may be laminated on the surface. The release sheet may have any configuration, for example, a plastic film may be peeled off with a release agent. Specific examples of plastic films include polyester films such as polyethylene terephthalate, polybutylene terephthalate, and polyethylene terephthalate; and polypropylene or polyethylene Such as polyolefin film. The release agent can be used: silicone-based, fluorine-based, long-chain alkane-based, etc. Among them, silicone-based products that are inexpensive and can obtain stable performance are preferred. The thickness of the release sheet is not particularly limited, but it can usually be 20 μm or more and 250 μm or less.
(4)其他之組件 本實施形態之工件加工用片材,亦可在黏著劑層中之黏著面上積層接著劑層。該情形下,本實施形態之工件加工用片材,在具有如上述之接著劑層時,即可使用為切割/黏晶片材。此類工件加工用片材,在將工件黏貼在接著劑層中之與黏著劑層相反側之面上,以同時切割該工件及接著劑層時,即可獲得片材個別化而積層接著劑層之晶片。該晶片,藉由該經過片材個別化之接著劑層,使該晶片可以容易地對承載之對象固定。作為構成上述接著劑層之材料,以使用含熱塑性樹脂及低分子量之熱硬化性接著成分者、或含B階段(B stage)(半硬化狀)的熱硬化型接著成分等為佳。(4) Other components In the sheet for workpiece processing of this embodiment, an adhesive layer may be laminated on the adhesive surface of the adhesive layer. In this case, the workpiece processing sheet of this embodiment can be used as a dicing/bonding wafer when it has the adhesive layer as described above. For this kind of workpiece processing sheet, when the workpiece is pasted on the surface of the adhesive layer opposite to the adhesive layer to cut the workpiece and the adhesive layer at the same time, the individualized sheet can be obtained to laminate the adhesive Layer of wafers. The chip can be easily fixed to the object to be carried by the adhesive layer that is individualized by the sheet. As the material constituting the adhesive layer, it is preferable to use a thermosetting adhesive component containing a thermoplastic resin and low molecular weight, or a thermosetting adhesive component containing a B stage (semi-hardened).
又,本實施形態之工件加工用片材之中,黏著劑層中之黏著面亦可積層保護膜形成層。該情形下,本實施形態之工件加工用片材,可使用作為保護膜形成兼切割用片材。此類工件加工用片材,係在保護膜形成層中與黏著劑層相反側之面上黏貼工件,因此同時切割該工件及保護膜形成層,所獲得的晶片即會積層經過片材個別化之保護膜形成層。作為該片材,以使用在其一面上形成電路者為佳,該情形下,通常,在與形成該電路之面的相反側之面上會積層保護膜形成層。經過片材個別化之保護膜形成層,以預定之切割硬化,因而可在晶片上形成具有充分之耐久性的保護膜。保護膜形成層,以由未硬化之硬化性接著劑構成為佳。In addition, in the sheet for workpiece processing of this embodiment, a protective film forming layer may be laminated on the adhesive surface of the adhesive layer. In this case, the work processing sheet of this embodiment can be used as a protective film formation and cutting sheet. This kind of workpiece processing sheet is to stick the workpiece on the side opposite to the adhesive layer in the protective film forming layer, so the workpiece and the protective film forming layer are cut at the same time, and the obtained wafer will be laminated and individualized by the sheet The protective film forming layer. As the sheet, it is preferable to use one having a circuit formed on one surface. In this case, usually, a protective film forming layer is laminated on the surface opposite to the surface on which the circuit is formed. The protective film forming layer that has been individualized by the sheet is hardened by a predetermined cutting, so that a protective film with sufficient durability can be formed on the wafer. The protective film forming layer is preferably composed of an uncured curable adhesive.
又,本實施形態之工件加工用片材,黏著力方面以滿足前述之條件為佳,在對黏著劑層積層上述之接著劑層或保護膜形成層之情形時,黏著劑層在積層此些層之前,以滿足前述之黏著力為佳。In addition, the sheet material for workpiece processing of this embodiment preferably satisfies the aforementioned conditions in terms of adhesion. When the adhesive layer or protective film forming layer is laminated on the adhesive layer, the adhesive layer is laminated Before layering, it is better to satisfy the aforementioned adhesion.
3.工件加工用片材之製造方法 本實施形態之工件加工用片材的製造方法並無特別之限定,本實施形態之工件加工用片材,以在基材之一面上積層黏著劑層而製造為佳。3. Manufacturing method of sheet for workpiece processing The manufacturing method of the work processing sheet of the present embodiment is not particularly limited. The work processing sheet of the present embodiment is preferably manufactured by laminating an adhesive layer on one surface of the base material.
將黏著劑層積層在基材之一面上,可以一般已知之方法實施。例如,以將在剝離片材上形成之黏著劑層,轉塗在基材之一面上為佳。該情形時,先調配含有構成黏著劑層之黏著劑組合物、及另外視其需要之溶劑或分散溶劑的塗佈液,剝離片材經過剝離處理之面(以下有時稱為「剝離面」)上,再以模具塗佈機、淋幕式塗佈機、噴塗塗佈機、狹縫塗佈機、刮刀塗佈機等塗佈該塗佈液形成塗膜,該塗膜經過乾燥,即可形成黏著劑層。塗佈液,只要可以塗佈即可,性質形態上並無特別之限定,在含有用以形成黏著劑層的成分作為溶質之情形,有時亦可以含有分散溶質。該積層體中之剝離片材可以視為工程材料予以剝離,亦可在至工件加工用片材黏貼在工件上為止之間,也可使用以保護黏著劑層的黏著面。Laminating the adhesive on one surface of the substrate can be implemented by a generally known method. For example, it is better to transfer the adhesive layer formed on the release sheet to one surface of the substrate. In this case, first prepare a coating solution containing the adhesive composition constituting the adhesive layer and another solvent or dispersion solvent as necessary, and peel off the surface of the sheet after the peeling treatment (hereinafter sometimes referred to as "peeling surface") ), and then apply the coating liquid with a die coater, curtain coater, spray coater, slit coater, knife coater, etc. to form a coating film, and the coating film is dried, namely Can form an adhesive layer. The coating liquid may be applied as long as it can be applied, and is not particularly limited in terms of properties. When it contains a component for forming the adhesive layer as a solute, it may contain a dispersed solute in some cases. The peeling sheet in the laminate can be regarded as an engineering material to be peeled off, and it can also be used to protect the adhesive surface of the adhesive layer until the workpiece processing sheet is attached to the workpiece.
在用以形成黏著劑層的塗佈液含有交聯劑之情形時,可以改變上述之乾燥條件(溫度、時間等)、或以另外設置之加熱處理,使塗膜內之活性能量線硬化性聚合物(A)或活性能量線非硬化性聚合物與交聯劑進行交聯反應,以在黏著劑層內形成為期望之存在密度而形成交聯構造。為使該交聯反應可以充分進行,在以上述方法等將黏著劑層積層在基材上之後,亦可以將所得之工件加工用片材,以如靜置於23℃、相對濕度50%之環境數日進行熟成。When the coating solution used to form the adhesive layer contains a crosslinking agent, the above drying conditions (temperature, time, etc.) can be changed, or additional heating treatment can be used to make the active energy rays in the coating hardenable The polymer (A) or the active energy ray non-curing polymer undergoes a cross-linking reaction with the cross-linking agent to form a desired density in the adhesive layer to form a cross-linked structure. In order to allow the crosslinking reaction to proceed sufficiently, after laminating the adhesive on the substrate by the above-mentioned method or the like, the resulting workpiece processing sheet may be placed at 23°C and 50% relative humidity. The environment is matured in a few days.
代替如上述將剝離片材上形成之黏著劑層轉塗在基材之一面上,亦可直接在基材上形成黏著劑層。該情形下,係將用以形成前述之黏著劑層的塗佈液塗佈在基材之一面上以形成塗膜,再經過乾燥該塗膜,形成黏著劑層。Instead of transferring the adhesive layer formed on the release sheet to one surface of the substrate as described above, the adhesive layer can also be directly formed on the substrate. In this case, the coating solution used to form the aforementioned adhesive layer is coated on one surface of the substrate to form a coating film, and then the coating film is dried to form the adhesive layer.
4.工件加工用片材之使用方法 本實施形態之工件加工用片材,可使用以加工工件。亦即,以本實施形態之工件加工用片材之黏著面黏貼在工件之後,可以在工件加工用片材上進行工件之加工。根據該加工,本實施形態之工件加工用片材,可使用為背面研磨片材、切割片材、擴片片材、取晶片材。其中,工件之例如:半導體晶圓、半導體封裝體等半導體組件;玻璃板等玻璃組件。4. How to use sheets for workpiece processing The sheet for workpiece processing of this embodiment can be used to process workpieces. That is, after the adhesive surface of the workpiece processing sheet of this embodiment is adhered to the workpiece, the workpiece can be processed on the workpiece processing sheet. According to this processing, the workpiece processing sheet of the present embodiment can be used as a back grinding sheet, a dicing sheet, an expanded sheet, and a wafer removal sheet. Among them, workpieces include semiconductor components such as semiconductor wafers and semiconductor packages; glass components such as glass plates.
又,本實施形態之工件加工用片材,在具備前述之接著劑層之情形時,該工件加工用片材,可作為切割/黏晶片材使用。又,本實施形態之工件加工用片材,在具備前述之保護膜形成層之情形時,該工件加工用片材,可作為保護膜形成兼切割用片材使用。In addition, when the workpiece processing sheet of this embodiment is provided with the aforementioned adhesive layer, the workpiece processing sheet can be used as a dicing/bonding wafer. In addition, when the work processing sheet of the present embodiment includes the aforementioned protective film forming layer, the work processing sheet can be used as a protective film forming and cutting sheet.
在本實施形態之工件加工用片材上工件之加工完成,由加工後之工件分離工件加工用片材之情形時,以在該分離前對工件加工用片材中之黏著劑層照射活性能量線為佳。此情形下,可使黏著劑層硬化,因此良好地降低工件加工用片材對加工後之工件的黏著力,可容易地使加工後之工件分離。When the processing of the workpiece on the workpiece processing sheet of this embodiment is completed, and the workpiece processing sheet is separated from the processed workpiece, the adhesive layer in the workpiece processing sheet is irradiated with active energy before the separation Line is better. In this case, the adhesive layer can be hardened, so the adhesive force of the workpiece processing sheet to the processed workpiece can be well reduced, and the processed workpiece can be easily separated.
作為上述之活性能量線,可使用如電磁波或帶電粒子束之中具有能量量子者,具體地,可使用紫外線、電子束等。特別是,以容易操作之紫外線較佳。照射紫外線,可以高壓汞燈、氙氣燈、LED等作業,紫外線的照射量,照度以50mW/cm2 以上、1000mW/cm2 以下為佳。又,照光量以50mJ/cm2 以上為佳,特別以80mJ/cm2 以上更佳,200mJ/cm2 以上再更佳。又,照光量以10000mJ/cm2 以下為佳,特別以5000mJ/cm2 以下更佳,2000mJ/cm2 以下再更佳。另一方面,照射電子束,可以電子束加速器等作業,電子束之照射量,以10krad以上、1000krad以下為佳。As the above-mentioned active energy rays, for example, electromagnetic waves or charged particle beams having energy quantum can be used. Specifically, ultraviolet rays, electron beams, etc. can be used. In particular, ultraviolet rays that are easy to handle are preferred. Irradiation of ultraviolet light can be operated by high-pressure mercury lamp, xenon lamp, LED, etc. The amount of ultraviolet radiation is preferably 50mW/cm 2 or more and 1000mW/cm 2 or less. Further, according to the light amount of 50mJ / cm 2 or more preferably, in particular, more preferably at 80mJ / cm 2 or more, 200mJ / 2 or more and still more preferably cm. In addition, the amount of illuminating light is preferably 10000 mJ/cm 2 or less, particularly preferably 5000 mJ/cm 2 or less, and even more preferably 2000 mJ/cm 2 or less. On the other hand, electron beam irradiation can be performed using an electron beam accelerator, etc. The irradiation amount of the electron beam is preferably 10 krad or more and 1000 krad or less.
本實施形態之工件加工用片材,在使黏著力F0在前述範圍時,在工件之加工時,可對該工件發揮充分之黏著力,亦可良好地抑制工件或加工後之工件之移動/脫落之不良情況。又,在黏著劑層由活性能量線硬化性黏著劑構成,同時黏著力之比值F2/F0在前述範圍時,即使是在黏貼加工後之工件之狀態下加熱工件加工用片材之情形,之後經過照射活性能量線,亦可充分降低對加工後之工件的黏著力,因此可良好地撿取加工後之工件。因此,本實施形態之工件加工用片材,可適於使用於在工件或加工後之工件黏貼在工件加工用片材上之狀態下,在高溫環境下曝露工件加工用片材之類的用途。特別是,本實施形態之工件加工用片材,適於使用於在工件加工用片材上進行矽晶圓等之切割,以對所得之晶片,在工件加工用片材上進行加熱處理之類的用途。When the sheet material for workpiece processing of this embodiment has the adhesion force F0 in the aforementioned range, sufficient adhesion force can be exerted on the workpiece during the processing of the workpiece, and the movement of the workpiece or the workpiece after processing can be well suppressed/ Bad condition of shedding. In addition, when the adhesive layer is composed of an active energy ray-curable adhesive, and the ratio of the adhesive force F2/F0 is in the aforementioned range, even if the workpiece processing sheet is heated while the workpiece is pasted, then After the active energy rays are irradiated, the adhesion to the processed workpiece can be sufficiently reduced, so the processed workpiece can be picked up well. Therefore, the workpiece processing sheet of this embodiment can be used for applications such as exposing the workpiece processing sheet in a high temperature environment in a state where the workpiece or the processed workpiece is stuck on the workpiece processing sheet . In particular, the workpiece processing sheet of the present embodiment is suitable for dicing silicon wafers, etc. on the workpiece processing sheet, to heat the obtained wafers on the workpiece processing sheet, etc. the use of.
以使用本實施形態之工件加工用片材為切割片材,同時使用在切割後,以晶片黏貼在工件加工用片材上且接進行加熱處理之用途時,作為其加熱條件方面,加熱溫度例如以40℃以上為佳,特別以80℃以上更佳,100℃以上再更佳。又,該加熱溫度,以150℃以下為佳,特別以130℃以下更佳,120℃以下再更佳。再者,加熱時間例如以3分鐘以上為佳,特別以10分鐘以上更佳,30分鐘以上再更佳。又,該加熱時間,以60分鐘以下為佳,特別以50分鐘以下更佳,40分鐘以下再更佳。本實施形態之工件加工用片材,即使在以如上之條件加熱之情形時,亦可良好地分離晶片。When the workpiece processing sheet of the present embodiment is used as a dicing sheet, and the wafer is attached to the workpiece processing sheet after dicing and then subjected to heat treatment, as the heating conditions, the heating temperature is for example It is preferably above 40°C, particularly preferably above 80°C, and even more preferably above 100°C. In addition, the heating temperature is preferably 150°C or less, particularly preferably 130°C or less, and even more preferably 120°C or less. Furthermore, the heating time is preferably 3 minutes or more, particularly 10 minutes or more, and more preferably 30 minutes or more. In addition, the heating time is preferably 60 minutes or less, particularly preferably 50 minutes or less, and even more preferably 40 minutes or less. The workpiece processing sheet of this embodiment can separate wafers well even when heated under the above conditions.
以上說明之實施形態,係以容易理解本發明而敘述,但本發明並不為敘述所限定。因此,上述實施形態所揭示之各部分,其宗旨亦包含屬本發明技術範圍之全部設計上之變更及同等者。The above-described embodiments are described for easy understanding of the present invention, but the present invention is not limited by the description. Therefore, the purpose of each part disclosed in the above embodiment also includes all design changes and equivalents falling within the technical scope of the present invention.
例如,在基材與黏著劑層之間、或在與基材之黏著劑層相反側之面上,亦可設置其他之層。 實施例For example, other layers may be provided between the substrate and the adhesive layer, or on the surface opposite to the adhesive layer of the substrate. Example
以下,以實施例等進一步具體說明本發明,惟本發明之範圍並不限定於此些實施例等。Hereinafter, the present invention will be described in further detail with examples, but the scope of the present invention is not limited to these examples.
[實施例1] (1)黏著劑組合物之調配 先以丙烯酸-2-乙基己酯70質量份、丙烯醯基嗎福啉10質量份及丙烯酸-2-羥基乙酯20質量份共聚所得之丙烯酸系共聚物,與相對該丙烯酸系共聚物之丙烯酸-2-羥基乙酯之莫耳數為90莫耳%的甲基丙烯醯氧基乙基異氰酸酯(MOI)反應,可獲得活性能量線硬化性聚合物。此活性能量線硬化性聚合物之重量平均分子量(Mw)在以後述之方法測定時,為83萬。[Example 1] (1) Preparation of adhesive composition First, the acrylic copolymer obtained by copolymerizing 70 parts by mass of 2-ethylhexyl acrylate, 10 parts by mass of acryloylmorpholine and 20 parts by mass of 2-hydroxyethyl acrylate, and the acrylic copolymer The reaction of methacryloxyethyl isocyanate (MOI) with 90 mol% of 2-hydroxyethyl acrylate can obtain an active energy ray-curable polymer. The weight average molecular weight (Mw) of this active energy ray curable polymer was 830,000 when measured by the method described later.
以所得之活性能量線硬化性聚合物100質量份(換算為固形成分,以下相同)與交聯劑之含六亞甲基二異氰酸酯的脂族系異氰酸酯(日本聚胺酯工業公司製造,製品名為「Coronate HX」)1.2質量份、光聚合起始劑之2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]苯基}-2-甲基-丙烷-1-酮(BASF公司製造,製品名為「Omnirad 127」,5%重量損失溫度:220℃)1.2質量份於溶劑中混合,可得黏著劑組合物。再者,光聚合起始劑之5%重量損失溫度,係使用示差熱-熱重量同時分析裝置(SHIMADZU公司製造,製品名為「DTG-60」),以昇溫速度5℃/分鐘由室溫加熱至300℃測定。100 parts by mass of the obtained active energy ray-curable polymer (converted to solid content, the same below) is used as a crosslinking agent containing hexamethylene diisocyanate-containing aliphatic isocyanate (manufactured by Japan Polyurethane Industry Co., Ltd., product name " Coronate HX") 1.2 parts by mass, photopolymerization initiator of 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2 -Methyl-propan-1-one (manufactured by BASF, product name "Omnirad 127", 5% weight loss temperature: 220°C) 1.2 parts by mass are mixed in a solvent to obtain an adhesive composition. In addition, the 5% weight loss temperature of the photopolymerization initiator was determined by using a differential thermal-thermogravimetric simultaneous analysis device (manufactured by SHIMADZU, product name "DTG-60"), and the temperature was increased from room temperature at a temperature increase rate of 5°C/min. Heat to 300°C for measurement.
(2)黏著劑層之形成 對於在厚度38μm之聚乙烯對苯二甲酸酯薄膜之一面上形成矽氧烷系之剝離劑層的剝離片材(LINTEC公司製造,製品名為「SP-PET381031」)之剝離面上,塗佈上述黏著劑組合物,經過加熱而乾燥之後,再於23℃、50%RH之條件下熟成7日,可在剝離片材上形成厚度5μm之黏著劑層。(2) Formation of adhesive layer Coat the release surface of a release sheet (manufactured by LINTEC Corporation, product name "SP-PET381031") with a silicone release agent layer formed on one side of a polyethylene terephthalate film with a thickness of 38 μm. The above-mentioned adhesive composition is heated and dried, and then aged for 7 days under the conditions of 23°C and 50% RH to form an adhesive layer with a thickness of 5 μm on the release sheet.
(3)工件加工用片材之製作 以上述步驟(2)中形成之黏著劑層之剝離片材的相反側之面,與作為基材的厚度75μm之具耐熱性之聚酯系薄膜(Kurabo公司製造,製品名為「Torcena」)的一面貼合,可得到工件加工用片材。(3) Production of sheets for workpiece processing Take the adhesive layer formed in the above step (2) on the opposite side of the release sheet, and the base material is a 75μm heat-resistant polyester film (manufactured by Kurabo, product name "Torcena") Attach one side of the sheet to obtain a sheet for workpiece processing.
其中,前述之重量平均分子量(Mw),為使用膠體過濾層析(GPC)測定(GPC測定)再換算為標準聚苯乙烯之重量平均分子量。Among them, the aforementioned weight average molecular weight (Mw) is measured (GPC measurement) using colloidal filtration chromatography (GPC) and then converted into the weight average molecular weight of standard polystyrene.
[實施例2至8及比較例1至4] 除變更丙烯酸系共聚物的組成及重量平均分子量如表1所示,同時變更黏著劑組合物之組成如表2所示以外,如同實施例1製造工件加工用片材。[Examples 2 to 8 and Comparative Examples 1 to 4] Except that the composition and weight average molecular weight of the acrylic copolymer were changed as shown in Table 1, and the composition of the adhesive composition was changed as shown in Table 2, the workpiece processing sheet was produced as in Example 1.
[試驗例1](黏著劑之玻璃轉變溫度的測定) 積層多層以實施例及比較例中所製造之工件加工用片材的黏著劑層,製作厚度800μm之黏著劑層的積層體。然後,以該黏著劑層的積層體切出直徑10mm之圓形,獲得測定用之試樣。再對該測定用之試樣,使用動態黏彈性測定裝置(TA Instruments公司製造,製品名為「ARES」),以頻率1Hz、測定溫度範圍-50至150℃、昇溫速度3℃/min之條件測定tanδ,以其最高波峰之溫度為Tg。其結果如表3所示。[Test Example 1] (Measurement of the glass transition temperature of the adhesive) Laminating multiple layers Using the adhesive layers of the workpiece processing sheets produced in the examples and comparative examples, a laminate of an adhesive layer with a thickness of 800 μm was produced. Then, a circle with a diameter of 10 mm was cut out from the laminate of the adhesive layer to obtain a sample for measurement. Then use a dynamic viscoelasticity measuring device (manufactured by TA Instruments, product name "ARES") for the sample used for the measurement at a frequency of 1 Hz, a measurement temperature range of -50 to 150°C, and a temperature rise rate of 3°C/min. Measure tanδ, and take the temperature of its highest peak as Tg. The results are shown in Table 3.
[試驗例2](黏著力的測定) 以實施例及比較例中所製造之工件加工用片材,裁切成寬度25mm之條狀。然後由所得之條狀的工件加工用片材剝離剝離片材,以露出之黏著劑層的黏著面,面對經過鏡面加工之矽晶圓之該鏡面,在溫度23℃、相對濕度50%之環境下,以2kg橡膠滾筒黏貼,經過靜置20分鐘後,作為測定用試樣。[Test Example 2] (Measurement of Adhesion) The workpiece processing sheets manufactured in the Examples and Comparative Examples were cut into strips with a width of 25 mm. Then peel off the strip from the obtained strip-shaped workpiece processing sheet to expose the adhesive surface of the adhesive layer facing the mirror surface of the mirror-finished silicon wafer at a temperature of 23°C and a relative humidity of 50%. In the environment, it was pasted with a 2kg rubber roller, and after standing for 20 minutes, it was used as a measurement sample.
然後再對所得之測定用試樣,使用萬能拉力試驗機(ORIENTEC公司製造,製品名為「TENSILON UTM-4-100」),由矽晶圓,以剝離速度300mm/min、剝離角度180°剝離工件加工用片材,再以依據JIS Z0237:2009之180°拉力剝離法,測定對矽晶圓的黏著力(mN/25mm)。並以此獲得之黏著力為黏著力F0,其結果如表3所示。Then, using a universal tensile testing machine (manufactured by ORIENTEC, the product name is "TENSILON UTM-4-100"), the obtained measurement sample is peeled from the silicon wafer at a peeling speed of 300mm/min and a peeling angle of 180° The sheet material used for workpiece processing is measured by the 180° tensile peeling method according to JIS Z0237:2009 to measure the adhesion force (mN/25mm) to the silicon wafer. And the adhesive force obtained by this is the adhesive force F0, and the results are shown in Table 3.
之後,以如上述所獲得之測定用試樣,以烘箱在150℃下加熱1小時。對該經過加熱後之測定用試樣,如上測定對矽晶圓的黏著力(mN/25mm)。以如此獲得之黏著力為黏著力F1,其結果如表3所示。After that, the sample for measurement obtained as described above was heated in an oven at 150°C for 1 hour. For the heated test sample, the adhesion to the silicon wafer (mN/25mm) was measured as above. Taking the adhesive force obtained in this way as the adhesive force F1, the results are shown in Table 3.
然後,以如上述所獲得之測定用試樣,以烘箱在150℃下加熱1小時。並且,對黏著劑層,隔著基材,以以下之條件進行紫外線照射。對該測定用試樣,如上測定對矽晶圓的黏著力(mN/25mm)。以如此獲得之黏著力為黏著力F2,其結果如表3所示。 >紫外線照射條件> ・使用高壓汞燈 ・照度230mW/cm2 、照光量190mJ/cm2 ・UV照度/照光量計使用EYE GRAPHICS公司製造之「UVPF-A1」Then, the sample for measurement obtained as described above was heated in an oven at 150°C for 1 hour. In addition, the adhesive layer was irradiated with ultraviolet rays under the following conditions via the base material. For this measurement sample, the adhesive force (mN/25mm) to the silicon wafer was measured as described above. Taking the adhesive force obtained in this way as the adhesive force F2, the results are shown in Table 3. >Ultraviolet radiation conditions> ・Using high-pressure mercury lamp ・Illumination 230mW/cm 2 , Illumination 190mJ/cm 2・UV illuminance/illumination meter using "UVPF-A1" manufactured by EYE GRAPHICS
同時,再以如上所得之3種黏著力,分別計算黏著力F2對黏著力F0之比值(F2/F0)、及黏著力F0對黏著力F1之比值(F0/F1)。其結果如表3所示。At the same time, calculate the ratio of the adhesion force F2 to the adhesion force F0 (F2/F0) and the ratio of the adhesion force F0 to the adhesion force F1 (F0/F1) using the three types of adhesion obtained above. The results are shown in Table 3.
[試驗例3](黏著劑之楊氏係數的測定) 針對各實施例及比較例,準備複數個以如實施例1之上述步驟(2)製作的黏著劑層與剝離片材之積層體。然後,在該積層體中積層預定數目之黏著劑層,製作成由厚度為200μm之黏著劑層所構成的測定用黏著劑層試樣。[Test Example 3] (Measurement of Young's Coefficient of Adhesive) For each of the Examples and Comparative Examples, a plurality of laminates of the adhesive layer and the release sheet produced in the above step (2) of Example 1 were prepared. Then, a predetermined number of adhesive layers were laminated on the laminate to produce an adhesive layer sample for measurement composed of an adhesive layer with a thickness of 200 μm.
該所得之測定用黏著劑層試樣,使用萬能拉力試驗機(島津製作所公司製造,製品名為「AUTOGRAPH AG-1S」),以23℃環境下、夾頭間距離30mm、速度200mm/分鐘拉伸,之後由所得之應力-形變曲線求出楊氏係數(MPa)。以如此所得之結果為楊氏係數E0,其結果如表3所示。The obtained adhesive layer sample for measurement was pulled using a universal tensile tester (manufactured by Shimadzu Corporation, product name "AUTOGRAPH AG-1S") at a temperature of 23°C with a distance between chucks of 30 mm and a speed of 200 mm/min. Stretch, and then calculate the Young’s coefficient (MPa) from the resulting stress-deformation curve. The result obtained in this way is the Young's coefficient E0, and the result is shown in Table 3.
又,以上述所得之測定用黏著劑層試樣,以烘箱在150℃下加熱1小時。對該加熱後之測定用黏著劑層試樣,如上述求出楊氏係數(MPa)。以如此所得之結果為楊氏係數E1,其結果如表3所示。In addition, the adhesive layer sample for measurement obtained above was heated at 150°C for 1 hour in an oven. For the heated adhesive layer sample for measurement, the Young's coefficient (MPa) is calculated as described above. The result obtained in this way is the Young's coefficient E1, and the result is shown in Table 3.
並且,以如上述所得之測定用黏著劑層試樣,以烘箱在150℃下加熱1小時。同時,對該加熱後之測定用黏著劑層試樣,以以下之條件進行紫外線照射。對該測定用黏著劑層試樣,如上述求出楊氏係數(MPa)。以如此所得之結果為楊氏係數E2,其結果如表3所示。 >紫外線照射條件> ・使用高壓汞燈 ・照度230mW/cm2 、照光量580mJ/cm2 ・UV照度/照光量計使用EYE GRAPHICS公司製造之「UVPF-A1」In addition, the adhesive layer sample for measurement obtained as described above was heated in an oven at 150°C for 1 hour. At the same time, the heated adhesive layer sample for measurement was irradiated with ultraviolet rays under the following conditions. For the sample of the adhesive layer for measurement, the Young's coefficient (MPa) was determined as described above. The result obtained in this way is Young's coefficient E2, and the result is shown in Table 3. >Ultraviolet radiation conditions> ・Using a high-pressure mercury lamp ・Illumination 230mW/cm 2 , Illumination 580mJ/cm 2・UV illuminance/illumination meter using "UVPF-A1" manufactured by EYE GRAPHICS
再者,以如上所得之3種楊氏係數,分別計算楊氏係數E1對楊氏係數E0之比值(E1/E0)、及楊氏係數E2對楊氏係數E1之比值(E2/E1)。其結果如表3所示。Furthermore, the ratio of Young's coefficient E1 to Young's coefficient E0 (E1/E0) and the ratio of Young's coefficient E2 to Young's coefficient E1 (E2/E1) are calculated using the three Young's coefficients obtained above. The results are shown in Table 3.
[試驗例4](初始黏著性之評量) 自實施例及比較例中製造之工件加工用片材剝離剝離片材,再對露出之黏著劑層的露出面,使用膠帶黏貼機(LINTEC公司製造,製品名為「Adwill RAD 2500m/12」),黏貼於經過#2000研磨之6吋矽晶圓(厚度:350 μm)之研磨面上。然後,再使用切割機(DISCO公司製造,製品名為「DFD-6362」),以以下之切割條件下,進行在切開面供給流水下並由6吋矽晶圓側切開的切割。[Test Example 4] (Evaluation of initial adhesion) Peel off the release sheet from the workpiece processing sheet manufactured in the Examples and Comparative Examples, and then use a tape sticking machine (manufactured by LINTEC, product name "Adwill RAD 2500m/12") on the exposed surface of the exposed adhesive layer , Paste on the polished surface of a 6-inch silicon wafer (thickness: 350 μm) polished by #2000. Then, using a dicing machine (manufactured by DISCO, the product name is "DFD-6362"), under the following cutting conditions, the cutting surface is supplied with running water and cut from the side of the 6-inch silicon wafer.
>切割條件> ・切割機:DISCO公司製造,DFD-6362 ・刀片:DISCO公司製造,NBC-2H 2050 27HECC ・刀片寬度:0.025至0.030mm ・刀尖露出量:0.640至0.760mm ・刀片轉速:50000rpm ・切削速度:20mm/sec ・切割深度:由工件加工用片材中黏著劑層側的表面相對於基材為20μm ・流水供給量:1.0L/min ・流水溫度:室溫 ・切割尺寸:2mm×2mm>Cutting conditions> ・Cutting machine: DFD-6362 made by DISCO ・Blade: made by DISCO, NBC-2H 2050 27HECC ・Blade width: 0.025 to 0.030mm ・The amount of tip exposure: 0.640 to 0.760mm ・Blade speed: 50000rpm ・Cutting speed: 20mm/sec ・Cutting depth: 20μm from the surface of the adhesive layer side of the workpiece processing sheet to the base material ・Flow water supply: 1.0L/min ・Water temperature: room temperature ・Cutting size: 2mm×2mm
之後,再以目視觀察經過切割步驟獲得之晶片貼著之工件加工用片材,計算切割步驟中由工件加工用片材脫落之晶片之個數,該個數除以切割步驟中之切割數目,可求出晶片脫離率(單位:%)。基於該計算之結果,依照以下之基準,評量初始黏著性。評量之結果如表3所示。○ : 晶片脫離率,未達10%。 ╳: 晶片脫離率,為10%以上。Then, visually observe the workpiece processing sheet on which the wafer obtained through the cutting step is attached, calculate the number of wafers that fall off the workpiece processing sheet in the cutting step, and divide the number by the number of cuts in the cutting step, The wafer detachment rate (unit: %) can be calculated. Based on the results of this calculation, evaluate the initial adhesion according to the following criteria. The evaluation results are shown in Table 3. ○ : The wafer detachment rate is less than 10%. ╳ : The wafer detachment rate is more than 10%.
[試驗例5](取晶合適性之評量) 使用實施例及比較例中製造之工件加工用片材,除變更切割尺寸為10mm×10mm以外,如試驗例4進行切割。[Test Example 5] (Assessment of suitability of crystal selection) Using the workpiece processing sheets manufactured in the Examples and Comparative Examples, cutting was performed as in Test Example 4, except that the cutting size was changed to 10 mm×10 mm.
在切割完了後,將承載晶片狀態之工件加工用片材放入烘箱。於150℃下加熱1小時。然後,對工件加工用片材中之黏著劑層,隔著基材,以以下之條件進行紫外線照射。 >紫外線照射條件> ・使用高壓汞燈 ・照度230mW/cm2 、照光量190mJ/cm2 ・UV照度/照光量計使用EYE GRAPHICS公司製造之「UVPF-A1」After the cutting is completed, the wafer-bearing workpiece processing sheet is placed in the oven. Heat at 150°C for 1 hour. Then, the adhesive layer in the sheet for workpiece processing was irradiated with ultraviolet rays under the following conditions through the substrate. >Ultraviolet radiation conditions> ・Using high-pressure mercury lamp ・Illumination 230mW/cm 2 , Illumination 190mJ/cm 2・UV illuminance/illumination meter using "UVPF-A1" manufactured by EYE GRAPHICS
由紫外線照射後之工件加工用片材,撿取100個晶片,依照以下之基準,評量取晶之合適性。其結果如表3所示。 ◎:100個之中,可良好取晶之晶片個數,為95個以上。○ : 100個之中,可良好取晶之晶片個數,未達95個、80個以上。 ╳: 100個之中,可良好取晶之晶片個數,未達80個。Pick up 100 wafers from the workpiece processing sheet after ultraviolet radiation, and evaluate the suitability of the wafers according to the following standards. The results are shown in Table 3. ◎: Among 100, the number of wafers with good crystal picking is more than 95. ○ : Among 100, the number of wafers that can obtain good crystals is less than 95 or more than 80. ╳ : Among 100, the number of wafers that can be obtained well is less than 80.
再者,表1及表2中記載之簡稱等詳細如下。 〔活性能量線硬化性聚合物之組成〕 2EHA:丙烯酸-2-乙基己酯 BA:丙烯酸丁酯 ACMO:丙烯醯基嗎福啉(SP值:10.1,玻璃轉變溫度:145℃) MMA:甲基丙烯酸甲酯(SP值:9.5,玻璃轉變溫度:105℃) IBXA:丙烯酸異莰酯(SP值:10.2,玻璃轉變溫度:94℃) HEA:丙烯酸-2-羥基乙酯 MOI:甲基丙烯醯氧基乙基異氰酸酯 〔光聚合起始劑〕 Omnirad 127:2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]苯基}-2-甲基-丙烷-1-酮(BASF公司製造,製品名為「Omnirad 127」,5%重量損失溫度:220℃) Omnirad TPO:氧化-2,4,6-三甲基苯甲醯基二苯基膦(BASF公司製造,製品名為「Omnirad TPO」,5%重量損失溫度:225℃)In addition, the abbreviations etc. described in Table 1 and Table 2 are detailed as follows. 〔Composition of active energy ray curable polymer〕 2EHA: 2-ethylhexyl acrylate BA: Butyl acrylate ACMO: Acrylic morpholine (SP value: 10.1, glass transition temperature: 145°C) MMA: methyl methacrylate (SP value: 9.5, glass transition temperature: 105°C) IBXA: Isocamyl acrylate (SP value: 10.2, glass transition temperature: 94°C) HEA: 2-hydroxyethyl acrylate MOI: Methacryloxyethyl isocyanate 〔Photopolymerization initiator〕 Omnirad 127: 2-hydroxy-1-{4-[4-(2-hydroxy-2-methyl-propanyl)-benzyl]phenyl}-2-methyl-propan-1-one (BASF Manufactured by the company, the product name is "Omnirad 127", 5% weight loss temperature: 220℃) Omnirad TPO: Oxidized-2,4,6-trimethylbenzyldiphenylphosphine (manufactured by BASF, product name "Omnirad TPO", 5% weight loss temperature: 225°C)
[表1]
[表2]
[表3]
由表3可知,實施例中所得之工件加工用片材,初始黏著性優良,在工件加工時可良好地將工件保持在片材上。又,實施例中所得之工件加工用片材,取晶之合適性優良,亦即,在取晶時,顯示對加工後之工件可良好地降低黏著力。 [產業上利用之可能性]It can be seen from Table 3 that the sheet for workpiece processing obtained in the examples has excellent initial adhesion and can hold the workpiece on the sheet well during processing of the workpiece. In addition, the sheet material for workpiece processing obtained in the examples has excellent suitability for crystal extraction, that is, when crystals are acquired, it is shown that the adhesion to the processed workpiece can be reduced well. [Possibility of Industrial Use]
因此,本發明之工件加工用片材,可適於使用在切割上。Therefore, the sheet for workpiece processing of the present invention can be suitably used for cutting.
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JP2004119780A (en) | 2002-09-27 | 2004-04-15 | Nitto Denko Corp | Working method of semiconductor wafer |
JP4643360B2 (en) * | 2005-05-24 | 2011-03-02 | 株式会社イーテック | Adhesive resin composition, and adhesive sheet and method for producing the same |
JP4970863B2 (en) | 2006-07-13 | 2012-07-11 | 日東電工株式会社 | Workpiece processing method |
JP4781185B2 (en) | 2006-07-18 | 2011-09-28 | 日東電工株式会社 | Heat-resistant dicing tape or sheet |
JP7106244B2 (en) * | 2015-10-29 | 2022-07-26 | 三菱ケミカル株式会社 | Adhesive composition, peelable adhesive obtained using the same, peelable adhesive sheet, and method of using the peelable adhesive sheet |
-
2019
- 2019-10-11 CN CN201980074603.7A patent/CN113016055A/en active Pending
- 2019-10-11 KR KR1020247021552A patent/KR20240110981A/en not_active Application Discontinuation
- 2019-10-11 WO PCT/JP2019/040322 patent/WO2020100491A1/en active Application Filing
- 2019-10-11 JP JP2020556712A patent/JP7382690B2/en active Active
- 2019-10-11 KR KR1020217008157A patent/KR102680601B1/en active IP Right Grant
- 2019-10-25 TW TW108138577A patent/TW202031856A/en unknown
Also Published As
Publication number | Publication date |
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CN113016055A (en) | 2021-06-22 |
JPWO2020100491A1 (en) | 2021-09-30 |
JP7382690B2 (en) | 2023-11-17 |
WO2020100491A1 (en) | 2020-05-22 |
KR102680601B1 (en) | 2024-07-03 |
KR20210088525A (en) | 2021-07-14 |
KR20240110981A (en) | 2024-07-16 |
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