TW201306300A - Flip-chip light-emitting diode having epitaxy strengthening layer and fabrication method thereof - Google Patents
Flip-chip light-emitting diode having epitaxy strengthening layer and fabrication method thereof Download PDFInfo
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本發明係有關於一種具磊晶強化層之覆晶發光二極體及其製造方法,其係應用於強化覆晶發光二極體之磊晶結構的領域。 The present invention relates to a flip-chip light-emitting diode having an epitaxial enhancement layer and a method for fabricating the same, which are applied to the field of enhancing the epitaxial structure of a flip-chip light-emitting diode.
目前覆晶發光二極體3a之製造方法(如第一圖至第三圖所示),是先於一基板11a上形成一磊晶結構12a,再於該磊晶結構12a上分別形成一p型電極14a及一n型電極13a;之後在該p型電極14a及該n型電極13a上各形成一金屬凸塊16a,15a,如此形成一發光二極體結構1a(如第一圖所示);再將該發光二極體結構1a倒裝接合於一基座(submount)上2a(如第二圖所示),之後以雷射輔助剝離技術移除該基板11a,形成一覆晶發光二極體3a,但由於該磊晶結構12a為一薄層之結構,所以用雷射輔助剝離技術移除該基板11a時,時常會造成該磊晶結構12a的破裂(如第三圖所示)。傳統的填底膠技術雖可初步解決此磊晶結構破裂的問題,但底膠材料的瓶頸在於要同時達到低熱膨脹係數及低黏滯係數的要求是相當困難的,因為增加無機填充物的比例可以使材料的熱膨脹係數降低,但是同時也會提高材料的黏滯係數,造成填底膠的困難度上升。 The current method for manufacturing the flip-chip LED 3a (as shown in the first to third figures) is to form an epitaxial structure 12a on a substrate 11a, and then form a p on the epitaxial structure 12a. a type of electrode 14a and an n-type electrode 13a; then forming a metal bump 16a, 15a on the p-type electrode 14a and the n-type electrode 13a, thus forming a light-emitting diode structure 1a (as shown in the first figure) The flip-flop structure 1a is flip-chip bonded to a submount 2a (as shown in the second figure), and then the substrate 11a is removed by a laser-assisted lift-off technique to form a flip chip. The diode 3a, but since the epitaxial structure 12a is a thin layer structure, when the substrate 11a is removed by the laser-assisted lift-off technique, the epitaxial structure 12a is often broken (as shown in the third figure). ). Although the traditional primer technology can initially solve the problem of cracking of the epitaxial structure, the bottleneck of the primer material is that it is quite difficult to achieve the requirements of low thermal expansion coefficient and low viscosity coefficient at the same time, because the proportion of inorganic filler is increased. The coefficient of thermal expansion of the material can be lowered, but at the same time, the viscosity coefficient of the material is also increased, resulting in an increase in the difficulty of filling the primer.
本發明人有鑑於上述習知技術之缺點,故提供一種具磊晶強化層之覆晶發光二極體及其製造方法,其能強化該覆晶發光二極體之該磊晶結構,可避免用雷射輔助剝離技術或其他技術移除該基板時,所造成該磊晶結構的破裂,以提升製造覆晶發光二極體之良率。且材料選擇及開發無須考慮材料的黏滯係數,增加了材料應用的空間。 The present inventors have provided a flip-chip light-emitting diode having an epitaxial enhancement layer and a method for fabricating the same, which can enhance the epitaxial structure of the flip-chip light-emitting diode, and can avoid When the substrate is removed by a laser-assisted lift-off technique or other techniques, the epitaxial structure is broken to improve the yield of the flip-chip light-emitting diode. And material selection and development do not need to consider the viscosity coefficient of the material, increasing the space for material application.
本發明之主要目的,在於提供一種具磊晶強化層之覆晶發光二極體及其製造方法,其能強化該覆晶發光二極體之該磊晶結構,故可避免用雷射輔助剝離技術或其他技術移除該基板時,所造成該磊晶結構 的破裂,以提升製造覆晶發光二極體之良率。 The main object of the present invention is to provide a flip-chip light-emitting diode having an epitaxial enhancement layer and a method for fabricating the same, which can strengthen the epitaxial structure of the flip-chip light-emitting diode, thereby avoiding laser-assisted peeling The epitaxial structure is caused when the substrate is removed by technology or other techniques The rupture to improve the yield of the fabricated flip-chip light-emitting diode.
本發明之次要目的,在於提供一種具磊晶強化層之覆晶發光二極體及其製造方法,該磊晶強化層之熱膨脹係數與磊晶結構之熱膨脹係數有良好的匹配度,故能避免該具磊晶強化層之覆晶發光二極體經過多次熱循環後,因為熱膨脹係數不匹配所產生之應力,而破壞該具磊晶強化層之覆晶發光二極體,以提升該具磊晶強化層之覆晶發光二極體之可靠度。 A secondary object of the present invention is to provide a flip-chip light-emitting diode having an epitaxial enhancement layer and a method for fabricating the same, wherein the thermal expansion coefficient of the epitaxial enhancement layer has a good matching degree with the thermal expansion coefficient of the epitaxial structure, so The polycrystalline silicon-emitting diode with the epitaxial enhancement layer is prevented from being damaged by the thermal expansion coefficient after the thermal expansion coefficient is not matched, thereby destroying the flip-chip light-emitting diode with the epitaxial enhancement layer to enhance the Reliability of flip-chip LEDs with epitaxial enhancement layers.
本發明具磊晶強化層之覆晶發光二極體,其包括:一磊晶結構;一p型電極及一n型電極,分別連接於該磊晶結構之下方的兩側;二金屬凸塊,分別連接於該p型電極及該n型電極之下方;及一基座(submount),連接於該二金屬凸塊之下方;其中該磊晶結構之下方更連接一磊晶強化層,且該磊晶強化層與該基座之間具一間隙。 The flip chip light-emitting diode of the present invention has an epitaxial enhancement layer, comprising: an epitaxial structure; a p-type electrode and an n-type electrode respectively connected to two sides below the epitaxial structure; two metal bumps Connected to the p-type electrode and the n-type electrode respectively; and a submount connected under the two metal bumps; wherein the epitaxial structure is further connected with an epitaxial enhancement layer, and The epitaxial strengthening layer has a gap between the layer and the base.
本發明具磊晶強化層之覆晶發光二極體之製造方法,其步驟包括:於一基板上形成一磊晶結構;於該磊晶結構上分別形成一p型電極及一n型電極;在該p型電極及該n型電極上各形成一金屬凸塊;形成一磊晶強化層於該磊晶結構上,使該二金屬凸塊部分突出於該磊晶強化層外,形成一具磊晶強化層之發光二極體結構;將該具磊晶強化層之發光二極體結構倒裝接合於一基座上,且該磊晶強化層與該基座之間具一間隙;及移除該基板,形成一具磊晶強化層之覆晶發光二極體。 The method for manufacturing a flip-chip LED having an epitaxial enhancement layer comprises the steps of: forming an epitaxial structure on a substrate; forming a p-type electrode and an n-type electrode on the epitaxial structure; Forming a metal bump on each of the p-type electrode and the n-type electrode; forming an epitaxial enhancement layer on the epitaxial structure, causing the two-metal bump portion to protrude outside the epitaxial enhancement layer to form a a light-emitting diode structure of the epitaxial enhancement layer; the light-emitting diode structure having the epitaxial enhancement layer is flip-chip bonded to a pedestal, and a gap is formed between the epitaxial enhancement layer and the pedestal; The substrate is removed to form a flip-chip light emitting diode having an epitaxial enhancement layer.
本發明具磊晶強化層之覆晶發光二極體之另一製造方法,其步驟包括:於一基板上形成一磊晶結構;於該磊晶結構上分別形成一p型電極及一n型電極;形成一磊晶強化層於該磊晶結構上,並於該p型電極及該n型電極上方各形成一金屬凸塊容置區;在該p型電極及該n型電極上各形成一金屬凸塊於該金屬凸塊容置區內,且該二金屬凸塊部分突出於該磊晶強化層外形成一具磊晶強化層之發光二極體結構; 將該具磊晶強化層之發光二極體結構倒裝接合於一基座上;及移除該基板,形成一具磊晶強化層之覆晶發光二極體。 Another manufacturing method of the flip-chip LED having the epitaxial enhancement layer of the present invention comprises the steps of: forming an epitaxial structure on a substrate; forming a p-type electrode and an n-type on the epitaxial structure; An electrode is formed on the epitaxial structure, and a metal bump receiving region is formed on the p-type electrode and the n-type electrode; and the p-type electrode and the n-type electrode are respectively formed on the electrode a metal bump is disposed in the metal bump accommodating region, and the two metal bump portions protrude from the epitaxial strengthening layer to form a light emitting diode structure having an epitaxial strengthening layer; The LED structure with the epitaxial enhancement layer is flip-chip bonded to a pedestal; and the substrate is removed to form a flip-chip LED having an epitaxial enhancement layer.
茲為使 貴審查委員對本發明之技術特徵及所達成之功效更有進一步之瞭解與認識,謹佐以較佳之實施例圖及配合詳細之說明,說明如後: In order to give the reviewer a better understanding and understanding of the technical features of the present invention and the efficacies achieved, the following is a description of the preferred embodiment and a detailed description.
本發明具磊晶強化層之覆晶發光二極體3,其包括(如第六圖及第十圖所示):一磊晶結構12;一p型電極14及一n型電極13分別連接於該磊晶結構12之下方的兩側;二金屬凸塊16,15分別連接於該p型電極14及該n型電極13之下方;一磊晶強化層17連接於該磊晶結構12之下方,且該二金屬凸塊16,15部分突出於該磊晶強化層17外;及一基座(submount)2上之二導電接觸層22,21分別連接於該二金屬凸塊16,15之下方,又,磊晶強化層17並未接觸基座2,所以磊晶強化層17與基座2具一間隙d。 The flip-chip LED 3 with epitaxial enhancement layer of the present invention comprises (as shown in FIG. 6 and FIG. 10): an epitaxial structure 12; a p-type electrode 14 and an n-type electrode 13 are respectively connected On both sides of the epitaxial structure 12; two metal bumps 16, 15 are respectively connected under the p-type electrode 14 and the n-type electrode 13; an epitaxial enhancement layer 17 is connected to the epitaxial structure 12 Below, the two metal bumps 16 and 15 partially protrude outside the epitaxial enhancement layer 17; and two conductive contact layers 22 and 21 on a submount 2 are respectively connected to the two metal bumps 16 and 15 Below, the epitaxial enhancement layer 17 does not contact the susceptor 2, so the epitaxial enhancement layer 17 has a gap d with the susceptor 2.
其中該磊晶結構12由上至下包括:一n型氮化鎵層121;一發光層122設於該n型氮化鎵層121之下方;及一p型氮化鎵層123設於該發光層122之下方,且該n型電極13連接於該n型氮化鎵層121及該p型電極14連接於該p型氮化鎵層123。 The epitaxial structure 12 includes an n-type gallium nitride layer 121 from top to bottom, a light-emitting layer 122 disposed under the n-type gallium nitride layer 121, and a p-type gallium nitride layer 123 disposed thereon. Below the light-emitting layer 122, the n-type electrode 13 is connected to the n-type gallium nitride layer 121 and the p-type electrode 14 is connected to the p-type gallium nitride layer 123.
其中該磊晶強化層之熱膨脹係數為3-40 ppm/℃與該磊晶結構之熱膨脹係數為5-6 ppm/℃相匹配,可增加對高溫製程的相容性,提升該覆晶發光二極體之產率。 Wherein the epitaxial strengthening layer has a thermal expansion coefficient of 3-40 ppm/° C. and the epitaxial structure has a thermal expansion coefficient of 5-6 ppm/° C., which can increase the compatibility with the high temperature process and enhance the flip chip light emission. The yield of the polar body.
該磊晶強化層17之材料係選自環氧樹酯(epoxy)、壓克力樹酯(PMMA)、丙烯腈丁烯苯乙烯共聚合物(acrylonitrile butadiene styrene copolymer)、聚甲基丙烯酸甲酯(polymerethylmethacrylate)、聚砜物(polysulfones)、聚醚砜物(polyethersulfone)、聚醚醯亞胺(polyetherimides)、聚醯亞胺(polyimide)、聚醯胺醯亞胺(polyamideimide)、聚甲苯硫化物 (polyphenylene sulfide)、碳矽熱固型化合物(silicon-carbon thermosets)、氧化矽、氧化鋁、氮氧化矽、氧化鋅、氧化鉿、氧化鈦、氧化鉭、氯化鈣及硫化鋅所組成之群組中之混合的材料。且該金屬凸塊之材料為金、銀、銅、鎳金合金、錫金合金、錫銅合金或錫銀合金。 The material of the epitaxial strengthening layer 17 is selected from the group consisting of epoxy, acrylic resin (PMMA), acrylonitrile butadiene styrene copolymer, polymethyl methacrylate. (polymerethylmethacrylate), polysulfones, polyethersulfone, polyetherimides, polyimide, polyamideimide, polytoluene sulfide (polyphenylene sulfide), carbon-carbon thermosets, cerium oxide, aluminum oxide, cerium oxynitride, zinc oxide, cerium oxide, titanium oxide, cerium oxide, calcium chloride and zinc sulfide The mixed materials in the group. And the material of the metal bump is gold, silver, copper, nickel gold alloy, tin gold alloy, tin copper alloy or tin silver alloy.
本發明具磊晶強化層之覆晶發光二極體3之製造方法,其步驟包括(如第十一圖所示):S11於一基板11上形成一磊晶結構12;S12於該磊晶結構12上分別形成一p型電極14及一n型電極13;S13在該p型電極14及該n型電極13上各形成一金屬凸塊16,15;S14形成一磊晶強化層17於該磊晶結構12上,使該二金屬凸塊16,15部分突出於該磊晶強化層17外,形成一具磊晶強化層之發光二極體結構1(如第四圖所示);S15將該具磊晶強化層之發光二極體結構1倒裝接合於一基座2上(如第五圖所示)又,磊晶強化層17並未接觸基座2,所以磊晶強化層17與基座2之間具一間隙d;及S16移除該基板11,形成一具磊晶強化層之覆晶發光二極體3(如第六圖所示)。 The method for manufacturing a flip-chip LED 3 having an epitaxial enhancement layer according to the present invention comprises the steps (as shown in FIG. 11): S11 forms an epitaxial structure 12 on a substrate 11; S12 is on the epitaxial layer A p-type electrode 14 and an n-type electrode 13 are respectively formed on the structure 12; S13 forms a metal bump 16 and 15 on the p-type electrode 14 and the n-type electrode 13; S14 forms an epitaxial enhancement layer 17 The epitaxial structure 12 is such that the two metal bumps 16 and 15 protrude from the epitaxial enhancement layer 17 to form a light-emitting diode structure 1 having an epitaxial enhancement layer (as shown in the fourth figure); S15 flip-chip bonding the LED structure 1 with epitaxial enhancement layer to a pedestal 2 (as shown in FIG. 5), and the epitaxial enhancement layer 17 does not contact the susceptor 2, so the epitaxial enhancement A gap d is formed between the layer 17 and the susceptor 2; and S16 removes the substrate 11 to form a flip-chip LED 3 having an epitaxial enhancement layer (as shown in FIG. 6).
其中S14之步驟中,更包括使用旋轉塗佈、噴塗、乾膜壓合或印刷之方法,將該磊晶強化層形成於該磊晶結構上之步驟,且S14之步驟後更包括一熟化之步驟,該熟化之步驟和S15步驟於150-300℃同時進行;或該熟化之步驟和S15步驟於150-300℃同時進行後,再以100-180℃進行二次熟化之步驟。 The step of S14 further comprises the steps of forming the epitaxial strengthening layer on the epitaxial structure by spin coating, spraying, dry film pressing or printing, and further comprising a curing after the step of S14. In the step, the aging step and the S15 step are carried out simultaneously at 150-300 ° C; or the aging step and the S15 step are carried out simultaneously at 150-300 ° C, followed by a second aging step at 100-180 ° C.
本發明另一種具磊晶強化層之覆晶發光二極體之製造方法,其步驟包括(如第十二圖所示):S21於一基板11上形成一磊晶結構12;S22於該磊晶結構12上分別形成一p型電極14及一n型電極13; S23形成一磊晶強化層17於該磊晶結構12上,並於該p型電極14及該n型電極13上方各形成一金屬凸塊容置區171(如第七圖所示);S24在該p型電極14及該n型電極13上各形成一金屬凸塊16,15於該金屬凸塊容置區內,且該二金屬凸塊16,15部分突出於該磊晶強化層17外形成一具磊晶強化層之發光二極體結構1(如第八圖所示);S25將該具磊晶強化層之發光二極體結構1倒裝接合於一基座2上(如第九圖所示)又,磊晶強化層17並未接觸基座2,所以磊晶強化層17與基座2之間具一間隙d;及S26移除該基板11,形成一具磊晶強化層之覆晶發光二極體3(如第十圖所示)。 Another method for fabricating a flip-chip diode having an epitaxial enhancement layer according to the present invention comprises the steps of: (as shown in FIG. 12): S21 forms an epitaxial structure 12 on a substrate 11; S22 is on the Lei Forming a p-type electrode 14 and an n-type electrode 13 on the crystal structure 12; S23, an epitaxial enhancement layer 17 is formed on the epitaxial structure 12, and a metal bump accommodating region 171 is formed on the p-type electrode 14 and the n-type electrode 13 (as shown in FIG. 7); A metal bump 16 is formed on the p-type electrode 14 and the n-type electrode 13 in the metal bump receiving region, and the two metal bumps 16 and 15 partially protrude from the epitaxial enhancement layer 17 Forming an LED structure 1 having an epitaxial enhancement layer (as shown in FIG. 8); S25 flip-chip bonding the LED structure 1 having an epitaxial enhancement layer to a pedestal 2 (eg, The ninth figure shows that the epitaxial enhancement layer 17 does not contact the susceptor 2, so that there is a gap d between the epitaxial enhancement layer 17 and the susceptor 2; and S26 removes the substrate 11 to form an epitaxial layer. The flip-chip light-emitting diode 3 of the strengthening layer (as shown in the tenth figure).
其中S23步驟中,更包括使用旋轉塗佈、噴塗、乾膜壓合或印刷之方法,將該磊晶強化層形成於該磊晶結構上之步驟。 The step S23 further comprises the step of forming the epitaxial strengthening layer on the epitaxial structure by spin coating, spraying, dry film pressing or printing.
其中S24步驟後更包括一熟化之步驟,且該熟化之步驟和將該具磊晶強化層之發光二極體結構倒裝接合於該基座上之步驟於150-300℃同時進行;或該熟化之步驟和將該具磊晶強化層之發光二極體結構倒裝接合於該基座上之步驟於150-300℃同時進行後,再以100-180℃進行二次熟化之步驟。 The step S24 further includes a step of curing, and the step of curing and the step of flip-chip bonding the LED structure with the epitaxial layer to the pedestal are performed simultaneously at 150-300 ° C; or The step of aging and the step of flip-chip bonding the light-emitting diode structure having the epitaxial layer to the susceptor are carried out simultaneously at 150-300 ° C, followed by a second aging step at 100-180 ° C.
在透明的藍寶石基板(sapphire)上以有機金屬化學氣相沈積法(Metalorganic Chemical Vapor Deposition,MOCVD)磊晶成長一磊晶結構,包含n型氮化鎵層;一發光層及一p型氮化鎵層,以黃光微影技術定義晶片形狀,並利用ICP乾蝕刻技術將部分區塊之p型氮化鎵層及發光層移除,暴露出n型氮化鎵層後,在p型氮化鎵層及n型氮化鎵層上分別製作p型電極及n型電極;之後,在n型電極 及p型電極上分別製作錫鉛合金凸塊,錫金合金凸塊的形成可藉由黃光微影技術(photolithography)搭配濺鍍、蒸鍍或電鍍製程技術完成;錫金合金凸塊完成之後,以塗佈方式形成一磊晶強化層於該磊晶結構,錫金合金凸塊並突設於該磊晶強化層外,形成一具磊晶強化層之發光二極體結構。該磊晶強化層主要功能為強化經由雷射剝離技術將藍寶石基板移除後的磊晶結構,並且具有保護覆晶接點的功能,該磊晶強化層材質為添加矽化物填充物的環氧樹酯(Ablestik公司的產品UF8826,其詳細成分為公司機密無法得知),本實施例該磊晶強化層之熱膨脹係數為40 ppm/℃及本實施例磊晶結構之熱膨脹係數為5-6 ppm/℃。 Epitaxial growth of an epitaxial structure on a transparent sapphire substrate (Metalorganic Chemical Vapor Deposition, MOCVD), including an n-type gallium nitride layer; a light-emitting layer and a p-type nitride The gallium layer defines the shape of the wafer by yellow lithography, and removes the p-type gallium nitride layer and the light-emitting layer of the partial block by ICP dry etching to expose the n-type gallium nitride layer after the p-type gallium nitride a p-type electrode and an n-type electrode are respectively formed on the layer and the n-type gallium nitride layer; thereafter, at the n-type electrode And tin-lead alloy bumps are respectively formed on the p-type electrodes, and the formation of the tin-gold alloy bumps can be completed by photolithography combined with sputtering, evaporation or electroplating process; after the tin-gold alloy bumps are completed, coating is performed The method comprises forming an epitaxial enhancement layer on the epitaxial structure, and the tin-gold alloy bumps protrude from the epitaxial enhancement layer to form an LED structure with an epitaxial enhancement layer. The epitaxial strengthening layer mainly functions to strengthen the epitaxial structure after removing the sapphire substrate by the laser stripping technology, and has the function of protecting the flip-chip bonding material, and the epitaxial strengthening layer is made of an epoxy added with a telluride filling. The resin (UF8826 of Ablestik, whose detailed composition is not known by the company's secret), the thermal expansion coefficient of the epitaxial layer in this embodiment is 40 ppm/°C, and the thermal expansion coefficient of the epitaxial structure of this embodiment is 5-6. Ppm/°C.
將該具磊晶強化層之發光二極體結構倒裝並焊接於一具有線路設計的矽基材,且該磊晶強化層熟化過程可與焊接過程在150-300℃條件下同時進行10-120秒。 The LED structure with the epitaxial enhancement layer is flip-chip mounted and soldered to a germanium substrate having a line design, and the epitaxial enhancement layer curing process can be simultaneously performed at 150-300 ° C with the soldering process. 120 seconds.
之後,以雷射剝離技術將藍寶石基板移除,即形成本發明之具磊晶強化層之覆晶發光二極體。 Thereafter, the sapphire substrate is removed by a laser lift-off technique to form a flip-chip light-emitting diode of the present invention having an epitaxial enhancement layer.
綜上所述,本發明具磊晶強化層之覆晶發光二極體及其製造方法具有以下之優點: In summary, the flip chip light-emitting diode of the present invention having an epitaxial enhancement layer and a method for fabricating the same have the following advantages:
1.其能強化覆晶發光二極體之磊晶結構,故可避免用雷射輔助剝離技術或其他技術移除該基板時,所造成該磊晶結構的破裂,以提升覆晶發光二極體之製造良率。 1. It can strengthen the epitaxial structure of the flip-chip light-emitting diode, so it can avoid the crack of the epitaxial structure caused by the laser-assisted stripping technology or other techniques to remove the substrate, so as to enhance the flip-chip light-emitting diode. The manufacturing yield of the body.
2.本發明磊晶強化層之熱膨脹係數(CTE)和磊晶結構之熱膨脹係數有良好的匹配度,故能避免該具磊晶強化層之覆晶發光二極體經過多次的熱循環後,因為熱膨脹係數不匹配所產生之應力,而破壞該具磊晶強化層之覆晶發光二極體,以提升該具磊晶強化層之覆晶發光二極體之可靠度。 2. The thermal expansion coefficient (CTE) of the epitaxial enhancement layer of the present invention has a good matching degree with the thermal expansion coefficient of the epitaxial structure, so that the flip-chip light-emitting diode with the epitaxial enhancement layer can be prevented from undergoing multiple thermal cycles. Because the thermal expansion coefficient does not match the generated stress, the flip-chip light-emitting diode with the epitaxial enhancement layer is destroyed to improve the reliability of the flip-chip light-emitting diode with the epitaxial enhancement layer.
3.本發明磊晶強化層之材料選擇無須考慮其材料本身的黏滯係數大小,該強化層材料的製備可克服傳統底膠材料低黏滯係數的要求,產 業上更可靈活應用此一發明。 3. The material selection of the epitaxial strengthening layer of the present invention does not need to consider the viscosity coefficient of the material itself, and the preparation of the reinforcing layer material can overcome the requirement of low viscosity coefficient of the traditional primer material. This invention is more flexible in the industry.
故本發明實為一具有新穎性、進步性及可供產業上利用者,應符合我國專利法專利申請要件無疑,爰依法提出發明專利申請,祈 鈞局早日賜准專利,至感為禱。 Therefore, the present invention is a novelty, progressive and available for industrial use. It should be in accordance with the requirements of patent applications for patent law in China. It is undoubtedly to file an invention patent application according to law, and the Prayer Council will grant patents as soon as possible.
惟以上所述者,僅為本發明之較佳實施例而已,並非用來限定本發明實施之範圍,故舉凡依本發明申請專利範圍所述之構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。 However, the above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, so that the structures, features, and spirits described in the claims of the present invention are equally modified and modified. All should be included in the scope of the patent application of the present invention.
1a‧‧‧發光二極體結構 1a‧‧‧Lighting diode structure
11a‧‧‧基板 11a‧‧‧Substrate
12a‧‧‧磊晶結構 12a‧‧‧ epitaxial structure
13a‧‧‧n型電極 13a‧‧‧n type electrode
14a‧‧‧p型電極 14a‧‧‧p-type electrode
15a‧‧‧金屬凸塊 15a‧‧‧Metal bumps
16a‧‧‧金屬凸塊 16a‧‧‧Metal bumps
2a‧‧‧基座 2a‧‧‧Base
3a‧‧‧覆晶發光二極體 3a‧‧‧Flip-chip light-emitting diode
1‧‧‧具磊晶強化層之發光二極體結構 1‧‧‧Light-emitting diode structure with epitaxial enhancement layer
11‧‧‧基板 11‧‧‧Substrate
12‧‧‧磊晶結構 12‧‧‧ Epitaxial structure
121‧‧‧n型氮化鎵層 121‧‧‧n type gallium nitride layer
122‧‧‧發光層 122‧‧‧Lighting layer
123‧‧‧p型氮化鎵層 123‧‧‧p-type gallium nitride layer
13‧‧‧n型電極 13‧‧‧n type electrode
14‧‧‧p型電極 14‧‧‧p-type electrode
15‧‧‧金屬凸塊 15‧‧‧Metal bumps
16‧‧‧金屬凸塊 16‧‧‧Metal bumps
17‧‧‧磊晶強化層 17‧‧‧ Epitaxial enhancement layer
171‧‧‧金屬凸塊容置區 171‧‧‧Metal bump accommodating area
2‧‧‧基座 2‧‧‧Base
21‧‧‧導電接觸層 21‧‧‧Electrical contact layer
22‧‧‧導電接觸層 22‧‧‧Electrical contact layer
3‧‧‧具磊晶強化層之覆晶發光二極體 3‧‧‧Flip-chip light-emitting diode with epitaxial strengthening layer
第一圖為習知覆晶發光二極體之製造過程結構示意圖(一)。 The first figure is a schematic diagram of the manufacturing process of a conventional flip-chip light-emitting diode (1).
第二圖為習知覆晶發光二極體之製造過程結構示意圖(二)。 The second figure is a schematic diagram of the manufacturing process of the conventional flip chip light-emitting diode (2).
第三圖為習知覆晶發光二極體之製造過程結構示意圖(三)。 The third figure is a schematic diagram of the manufacturing process of the conventional flip chip light-emitting diode (3).
第四圖為本發明具磊晶強化層之覆晶發光二極體之製造過程結構示意圖(一)。 The fourth figure is a schematic structural view (1) of the manufacturing process of the flip chip light-emitting diode with the epitaxial enhancement layer of the present invention.
第五圖為本發明具磊晶強化層之覆晶發光二極體之製造過程結構示意圖(二)。 The fifth figure is a schematic structural view of the manufacturing process of the flip chip light-emitting diode with the epitaxial enhancement layer of the present invention (2).
第六圖為本發明具磊晶強化層之覆晶發光二極體之製造過程結構示意圖(三)。 The sixth figure is a schematic structural view (3) of the manufacturing process of the flip chip light-emitting diode with the epitaxial enhancement layer of the present invention.
第七圖為本發明具磊晶強化層之覆晶發光二極體之另一製造過程結構示意圖(一)。 The seventh figure is a schematic structural view (1) of another manufacturing process of the flip-chip LED having the epitaxial enhancement layer of the present invention.
第八圖為本發明具磊晶強化層之覆晶發光二極體之另一製造過程結構示意圖(二)。 The eighth figure is a schematic structural view of another manufacturing process of the flip-chip LED having the epitaxial enhancement layer of the present invention (2).
第九圖為本發明具磊晶強化層之覆晶發光二極體之另一製造過程結構示意圖(三)。 The ninth drawing is a schematic structural view (3) of another manufacturing process of the flip-chip LED having the epitaxial enhancement layer of the present invention.
第十圖為本發明具磊晶強化層之覆晶發光二極體之另一製造過程結構示意圖(四)。 The tenth figure is a structural diagram (4) of another manufacturing process of the flip chip light-emitting diode with the epitaxial enhancement layer of the present invention.
第十一圖為本發明具磊晶強化層之覆晶發光二極體之製造方法之步驟流程圖。 11 is a flow chart showing the steps of a method for manufacturing a flip-chip diode having an epitaxial enhancement layer according to the present invention.
第十二圖為本發明具磊晶強化層之覆晶發光二極體之另一製造方法之步驟流程圖。 Figure 12 is a flow chart showing the steps of another manufacturing method of the flip-chip LED having the epitaxial enhancement layer of the present invention.
12‧‧‧磊晶結構 12‧‧‧ Epitaxial structure
121‧‧‧n型氮化鎵層 121‧‧‧n type gallium nitride layer
122‧‧‧發光層 122‧‧‧Lighting layer
123‧‧‧p型氮化鎵層 123‧‧‧p-type gallium nitride layer
13‧‧‧n型電極 13‧‧‧n type electrode
14‧‧‧p型電極 14‧‧‧p-type electrode
15‧‧‧金屬凸塊 15‧‧‧Metal bumps
16‧‧‧金屬凸塊 16‧‧‧Metal bumps
17‧‧‧磊晶強化層 17‧‧‧ Epitaxial enhancement layer
2‧‧‧基座(submount) 2‧‧‧Submount
21‧‧‧導電接觸層 21‧‧‧Electrical contact layer
22‧‧‧導電接觸層 22‧‧‧Electrical contact layer
3‧‧‧具磊晶強化層之覆晶發光二極體 3‧‧‧Flip-chip light-emitting diode with epitaxial strengthening layer
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