TW200411788A - Manufacturing method for MCM package - Google Patents
Manufacturing method for MCM package Download PDFInfo
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- TW200411788A TW200411788A TW091137927A TW91137927A TW200411788A TW 200411788 A TW200411788 A TW 200411788A TW 091137927 A TW091137927 A TW 091137927A TW 91137927 A TW91137927 A TW 91137927A TW 200411788 A TW200411788 A TW 200411788A
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- intermediate carrier
- package
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- manufacturing
- chip
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Wire Bonding (AREA)
Abstract
Description
200411788 五、發明說明(1) (一)、【發明所屬之技術領域】 本發明係關於一種半導體封裝構造之製造方法,尤 於一種利用中間載板條之多晶片封裝構造之製造方、去200411788 V. Description of the invention (1) (1), [Technical field to which the invention belongs] The present invention relates to a method for manufacturing a semiconductor package structure, and more particularly to a method for manufacturing a multi-chip package structure using an intermediate carrier strip.
(一)、L先前技術J 近年來’由於電子產品的設計逐漸朝向面積小、 輕、厚度薄、高功能及高效能等趨勢開發,故半導體= 已朝向系統模組構造發展,以使半導體構裝之生產制、生衣 測試流程能更為簡化更有效率。一般而言,多晶 t及 造係由至少兩封裝體組合而成,其係可為一平面模式衣構 (side-by-side type),如圖1所示,兩封裝髀 =列巧於載板13上,並經導電元件14(^ 平 广通。此外,多晶片封裝構造亦可為—立體堆疊_卜界 (stack-type,如圖2所示)或可為一具 堆疊模式封裝構造(如圖3〜圖4所示)。 曰反之立體 首先,请參照圖2,第一封裝體2 1係由一一 以覆晶方式電性連接於第一載板211上, 弟一 b日片212 由-第二晶片222以覆晶方式電性 ^ 裝體22則 其中,第一封裝體21及第二封裝體22 、弟—載板221上。 是=片封裝體(MCM package)。第===體或 一導電元件213(如銲球)於其下表面(未另包含第 與第二封裝體22電性導通。而第圖中)用以 電元件223於其下表面(未標示於圖中)衣體用亦包含-第二導 體21及第二封裝體22之訊號 )用以將第-封裝 1逆通傳遞,如與母板或 200411788 五、發明說明(2) ' ---- 其他之電子元件電性連接。 士接=,請參照圖3及圖4,係為上述之另一種堆疊模式 封裝構造,需說明的是,圖3及圖4中各元件之參考符號係 與圖2中f各元件之參考符號相對應。中間載板具有一^、 口 201、,’#第二封裝體中之第二晶片222係容置於該開口2〇1 中,,藉由一中間载板單元20與第一封裝體21連接。其 中,第一封裝體21另包含第一導電元件213(如銲球)於其 下表面(未。標示於圖中)用以與中間載板單元2 〇電性導通, 中間,板單元20下表面形成有第三導電元件23(如銲球)用 以與第一封裝體22電性導通。而第二封裝體Μ亦形成一 二導電元件223於其下表面,用以將第二封裝體22之訊號 及第一封裝體21之訊號藉由中間載板單元20及向外界連通 傳遞,如與母板或其他之電子元件電性連接。 •其中,如圖3所示之多晶片封裝構造之封裝步驟如 I丄Ϊ先,提供一中間載板單元20、第一封裝體21及第二 、衣_22,其分別形成有第一導電元件213及第二導電元 件2f 3—於其上。接著’提供一治具板24(如圖5所示),並 將第一封I體22藉治具板24上之突出墊241 (其高度約略大 於此多晶片封裝構造完成封裝後之整體高 仰4之開口 242中。之後,將中間載板 工裝體22上,而使第二封裝體22中之第二晶片222容 壯㈣1 口 2〇1中’並藉第三導電元件23暫時固定於第二封 =2之第二載板221上。接著,第一封裝體。則藉第一 V電元件213暫時固定於中間載板單元2〇上。(1) L. Previous technology J. In recent years, as the design of electronic products has been gradually developed toward the trend of small area, light weight, thin thickness, high function, and high performance, semiconductors = have been developed towards system module structures to enable semiconductor structures. The manufacturing process of garments and the testing of garments can be simplified and more efficient. Generally speaking, the polycrystalline silicon and the system are composed of at least two packages, which can be a side-by-side type. As shown in Figure 1, the two packages On the carrier board 13 and through the conductive element 14 (^ Pingguangtong. In addition, the multi-chip package structure can also be-three-dimensional stack_bujie (stack-type (as shown in Figure 2)) or a stack mode package configuration (shown in FIG 3 ~ FIG. 4). Conversely said perspective first, referring to FIG. 2, the first package body 21 by a system eleven electrically flip-chip connected to the first carrier plate 211, a brother b The solar chip 212 is made of the second chip 222 in a flip-chip manner. The mounting body 22 includes the first package 21 and the second package 22, and the carrier plate 221. Yes = chip package (MCM package) The first === body or a conductive element 213 (such as a solder ball) on its lower surface (excluding the second and second package bodies 22 being electrically conductive. The first figure) is used for the electrical element 223 on its lower surface ( (Not shown in the figure) the body also includes the signal of the second conductor 21 and the second package 22) used to pass the first package 1 back, such as with the motherboard or 200411788 (2) Description '---- the other electronic device is electrically connected. Shijie =, please refer to Figure 3 and Figure 4, which is another stacking mode package structure mentioned above. It should be noted that the reference symbols of each component in Figure 3 and Figure 4 are the reference symbols of each component in Figure 2 Corresponding. The intermediate carrier board has a port 201, and a second chip 222 in the second package body is received in the opening 201, and is connected to the first package body 21 through an intermediate carrier board unit 20. . Wherein, the first package 21 further includes a first conductive element 213 (such as a solder ball) on its lower surface (not shown in the figure) for electrical conduction with the intermediate carrier unit 20, and the middle of the board unit 20 A third conductive element 23 (such as a solder ball) is formed on the surface to be electrically conductive with the first package 22. The second package M also forms a second conductive element 223 on its lower surface for transmitting the signals of the second package 22 and the signals of the first package 21 through the intermediate carrier unit 20 and communicating with the outside, such as It is electrically connected with the motherboard or other electronic components. • Among them, the packaging steps of the multi-chip package structure shown in FIG. 3 are as follows: first, an intermediate carrier board unit 20, a first package body 21, a second, and a garment 22 are provided, which are respectively formed with a first conductive layer; The element 213 and the second conductive element 2f 3-on it. Then 'provide a jig board 24 (as shown in FIG. 5), and use the protruding pad 241 on the jig board 24 (its height is slightly larger than the overall height of the multi-chip package structure after packaging is completed). Into the opening 242 of the back 4. Then, the intermediate carrier board tooling body 22 is placed on the second carrier body 22, so that the second chip 222 in the second package body 22 can be held in a port 201, and temporarily fixed to the third conductive element 23 by Second seal = 2 on the second carrier board 221. Then, the first package body is temporarily fixed on the intermediate carrier board unit 20 by the first V electrical component 213.
200411788 五 -發明說明(3) " ----- 時對第一導電元件213及第二導電元件22 3進行一迴鲜+ 驟,以使第一封裝體21、中間載板單元2〇及第二 相互連接固著。 可衣體22 由於中間載板單元20之厚度相當小,且其無足夠*間 以供機具吸取以將其設置於第二封裝體22上。再者,$ :::元=第二封裝體22之大小相近,&中間載板單: 20人弟一封政體22連接設置時,較無法進行定位校正。因 此,如何解決上述問題實為本發明之主要精神所在。 有 裝構造 性,以 方法係 數個第 數個中 a 、一 體於該 中間載 該等第 置於膠 板單元 膜以形 單元係 、【發明 鑑於上述 之製造方 改善先前 包含下列 二封裝體 間載板單 内容】 課題,法,其 技術問 步驟: 及一中 本發明之目的 係利用所提供 題。本發明之 首先,提供複 間載板條,該 元,而每一該等中間 係提供一種多晶片封 之中間載板條的特 多晶片封裝構造製造 數個第一封裝體、複 第一表面及一第二表面 等中間載 板單元電 一封裝體 膜上,並 之第二表 成複數個 包含第一 接著 板單元 性連接 與中間 將該等 面上。 多晶片 封裝體 之第一表面上 。之後,提供 載板條藉該等 第二封裝體分 最後,分割該 封裝單元。其 、第二封裝體 中間載板條 載板單元係 ’设置該等第一封裝 以使其與對應之該等 一膠膜,將連接後之 第一封裝體之背面設 等中間載 並移除膠 中,每一多晶片封裝 及分割後之獨立中間 係具有複 具有一開 別設置於該 中間載板條200411788 5-Description of the invention (3) " ----- When the first conductive element 213 and the second conductive element 22 3 are refreshed, the first package 21 and the intermediate carrier unit 2 are processed. And the second interconnected and fixed. Since the thickness of the wearable body 22 is relatively small, and there is not enough time for the machine to pick it up to place it on the second package 22. In addition, $ ::: yuan = the size of the second package 22 is similar, & the middle carrier board list: When 20 people are connected to each other and the government body 22 is connected, it is impossible to perform positioning correction. Therefore, how to solve the above problems is the main spirit of the present invention. It has the structure and structure, with the number a in the method coefficients, integrated in the middle, and the first placed on the rubber plate unit film to form the unit system, [invention in view of the above-mentioned improvement of the manufacturer previously included the following two package body load Contents of the board] Questions, methods, and technical steps: And the purpose of the present invention is to use the questions provided. Firstly, the present invention provides a plurality of interlayer carrier strips, and each of these intermediate systems provides a multi-chip packaged multi-chip package with a special multi-chip package structure to manufacture a plurality of first packages and a plurality of first surfaces. And a second surface, such as an intermediate carrier board unit, on a package film, and the second table includes a plurality of unitary connections between the first bonding board and the middle surface. On the first surface of the multi-chip package. After that, a carrier strip is provided to borrow the second package body. Finally, the packaging unit is divided. The second package middle carrier strip carrier unit is provided with the first packages so that they correspond to the corresponding one of the adhesive films, and the back side of the first package after the connection is mounted and removed. In the glue, each multi-chip package and an independent intermediate system after the singulation has a plurality of openings disposed on the intermediate carrier strip.
200411788200411788
載板單元。 間具有-槽m間載板條',各個中間載板單元之 之空間以進行衝:統之獨立《中間載板單元具有更大 之空間以以切步驟。再*,由於中間載板條上有足夠 載板單元位r,⑪第―封裝體或第二封裝體與中間 免第二^ ^,較能利用定位點以進行定位校正,以避 題。或弟一封袭體設置於中間載板單元時之位置偏移問 (四)、【實施方式】 下將參妝相關圖式,說明依本發明較佳實施例之多 日日片封裝構造之製造方法。 士圖6至圖1 〇係揭示一種本發明較佳實施例之多晶片封 構造之製造方法。請參照圖6及圖7,首先,提供複數個 f -封裝體31及-中間載板條3 ’該中間载板條3係具有複 文個中間載板單τ〇30。其中’每一該等中間載板單元3〇係 具有-開口301、-第一表面302及一第二表面3〇3(如圖7 所示);而各個中間載板單元30間係具有一槽孔3〇4(sl〇t) ’亦可為一切割線(未標示於圖中)。第一封裝體3 1係至 少包含一第一晶片312及第一載板3u ,第一晶片312係與 第一載板3 11以覆晶封裝方式電性連接。惟上述之第一封 裝體亦可為一打線型式之封裝體,即第一晶片312亦可藉 打線方式與第一載板311電性連接(未標示於圖中)。其 中,第一封裝體31另包含第一導電元件313(如銲球)於第 200411788 五、發明說明(5) --- 一載板311之下表面。 接著,如圖7所示,該等第一封裝體3丨設置於該等中 間載板單元30之第一表面上302後,進行一迴銲步驟,以 使第一導電元件313能使該等第一封裝體31固接並電性連 接於對應之該等中間載板單元30。又,於迴銲步驟後,更 可進行一底膠(under-fill)填充步驟(未標示於圖中)於中 間載板單元30之第一表面3 0 2與第一封裝體31之第一載板 3 11之下表面間,以進一步加強第一封裝體3丨與中間載板 早元30之連接強度。 再者,如圖8所示,提供一膠膜4,將連接後之該等第 一封裝體3 1與中間載板條3翻覆之,以使該等第一封裝體 31中之第一晶片312之背面設置固定於膠膜4上。 之後’如圖9所示,提供複數個第二封裝體3 2,其係 至少包含一第二晶片322及第二載板321 ,而第二晶片322 係與第二載板3 2 1以覆晶封裝方式電性連接。其中,第二 封裝體32另包含第二導電元件323 (如銲球)於第二載板 321之下表面。接著,設置複數個第三導電元件3〇5(如銲 球)於該等中間載板單元3〇之第二表面3〇3上。將該等第二 封裝體32分別對應於該等開口 3〇1設置,並進行一迴銲動 作’以使該等第二封裝體32與該等中間載板單元3〇之第二 表面3 0 3相互連接。又,於迴銲步驟後,亦可進行一底膠 (under-fill)填充步驟(未標示於圖中)於中間載板單元3〇 之第二表面303與第一封裝體32之第二載板321之上表面 間’以進一步加強第二封裝體32與中間載板單元3〇之連接Carrier board unit. There are-slots m between the carrier strips, and the space of each intermediate carrier unit is to be punched: the independence of the system "the intermediate carrier unit has a larger space to cut the steps. Again *, because there is enough carrier unit r on the middle carrier strip, the first package or the second package and the middle are free of the second ^, it is better to use the positioning point for positioning correction to avoid problems. Or the position deviation of a single body when it is set on the intermediate carrier unit (four), [Embodiment] The related drawings of the makeup will explain the structure of the multi-day Japanese film packaging structure according to the preferred embodiment of the present invention. Production method. Figures 6 to 10 disclose a method for manufacturing a multi-chip package structure according to a preferred embodiment of the present invention. 6 and FIG. 7, first, a plurality of f-packages 31 and-intermediate carrier strips 3 are provided. The intermediate carrier strip 3 has a plurality of intermediate carrier plates τ〇30. Wherein, each of the intermediate carrier board units 30 has an opening 301, a first surface 302, and a second surface 300 (as shown in FIG. 7); and each intermediate carrier board unit 30 has a The slot hole 304 (slot) may also be a cutting line (not shown in the figure). The first package 31 includes at least a first chip 312 and a first carrier board 3u. The first chip 312 and the first carrier board 31 are electrically connected in a flip-chip package. However, the above-mentioned first package body may also be a wire-type package body, that is, the first chip 312 may also be electrically connected to the first carrier board 311 by wire bonding (not shown in the figure). Among them, the first package body 31 further includes a first conductive element 313 (such as a solder ball) in the 200411788 V. Description of the Invention (5) --- the lower surface of a carrier plate 311. Next, as shown in FIG. 7, after the first packages 3 丨 are disposed on the first surface 302 of the intermediate carrier units 30, a reflow step is performed to enable the first conductive elements 313 to enable the The first package 31 is fixed and electrically connected to the corresponding intermediate carrier units 30. Further, after the reflow step, but can be a primer (under-fill) filling step (not shown in the figures) intermediate the first surface 30 of the carrier plate unit 302 of the first package body 31 of the first The lower surface of the carrier plate 3 11 further strengthens the connection strength between the first package body 3 丨 and the intermediate carrier plate element 30. Furthermore, as shown in FIG. 8, an adhesive film 4 is provided, and the connected first package bodies 31 and the intermediate carrier strip 3 are turned over to make the first chip in the first package bodies 31. The back of 312 is fixed on the adhesive film 4. Afterwards, as shown in FIG. 9, a plurality of second packages 32 are provided, which include at least a second chip 322 and a second carrier board 321, and the second chip 322 is connected to the second carrier board 3 2 1. The chip package is electrically connected. Wherein the second package body 32 further comprises a second conductive element 323 (e.g., solder balls) to the second carrier plate 321 beneath the surface. Next, a plurality of third conductive elements 305 (such as solder balls) are disposed on the second surface 3O3 of the intermediate carrier units 30. The second packages 32 are respectively set to correspond to the openings 301, and a reflow operation is performed to make the second packages 32 and the second surface 30 of the intermediate carrier unit 30. 3 interconnected. In addition, after the re-soldering step, an under-fill filling step (not shown in the figure) may be performed on the second surface 303 of the intermediate carrier unit 30 and the second loading of the first package body 32. Between the upper surfaces of the boards 321 to further strengthen the connection between the second package body 32 and the intermediate carrier unit 30.
第12頁 200411788 五、發明說明(6) 強度。 承上所述之封裝步驟 ^ H ^ 進行-切割步驟,以;於中間載板條3上槽孔3〇4處 成複數個多晶片肖裝單ί :間載板條3並移除膠膜4以形 包含第-封裝體31、第-封每一多晶片封裝單元係 板單元30(如圖10所示)了2體=後之獨立中間載 切割線,則可利用切害刀=若:間載板單元3〇間為-驟。 刀或雷射切割之方法進行切割步 _最後’再將膠膜4移除以形成複數個多晶片封 το。其中’每—多晶片#裝單元係包含第—封裝體^ 一封裝體32及分割後之獨立中間載板單元3〇。 在上述之多晶片封裝構造之製造方法中,亦可在使 笨牛㈣3 ί 背面設置固著於膠膜4 士 V -後,先進行一中間載板條3之分割步驟,亦即先於 中間載板條3上之槽孔304處進行一切割步驟,以分判該中 間載板條3但不分割膠膜4,而使中間載板條形成複數個獨 間载板單元30後,再將該等第二封裝體32分別對應於 S等開口 3 〇 1設置,並進行一迴銲動作,以使該等第二封 I體32與該等中間載板單元3〇之第二表面3〇3相互連接: 此外,上述多晶片封裝構造之製造方法中,亦可藉該 等第一封裝體31與第一導電元件313先暫時固接並電性9連〆 接於對應之該等中間載板單元30後,再提供一膠膜4,將 連接後之該等第一封裝體31與中間載板條3翻覆之',以續 行第二封裝體3 2與中間載板條3之連接步驟,然後再進行Page 12 200 411 788 V. invention is described in (6) intensity. Carry out the encapsulation steps ^ H ^ performed-cutting step, in order to form a plurality of multi-wafer mounting orders at the slot 3 04 on the middle carrier strip 3: between the carrier strip 3 and remove the adhesive film 4 contains the first package body 31 and the first package body of each multi-chip package unit system board unit 30 (as shown in FIG. 10). If the body 2 is an independent middle-loaded cutting line, the cutter can be used. : 30 of the intermediate board units are -steps. The cutting step is performed by a knife or laser cutting method. Finally, the adhesive film 4 is removed to form a plurality of multi-wafer packages το. The 'per-multi-chip #' unit includes the first package body ^ a package body 32 and the separated intermediate carrier board unit 30. In the above-mentioned manufacturing method of the multi-chip package structure, the stupid cow ㈣ 3 ί can also be fixed on the adhesive film 4 V-, and then a step of dividing the middle carrier strip 3 is performed first, that is, before the middle A cutting step is performed at the slot 304 on the carrier strip 3 to judge the intermediate carrier strip 3 without dividing the adhesive film 4 so as to form the intermediate carrier strip into a plurality of independent carrier board units 30, and then The second packages 32 are respectively set to correspond to the openings S and so on S, and a reflow operation is performed to make the second packages 32 and the second surface 3 of the intermediate carrier unit 30. 3 Interconnection: In addition, in the manufacturing method of the above-mentioned multi-chip package structure, the first package body 31 and the first conductive element 313 can also be temporarily fixed and electrically connected to the corresponding intermediate carriers by the first package 31 and the first conductive element 313. After the board unit 30, an adhesive film 4 is provided to overturn the connected first packages 31 and the intermediate carrier strip 3 to continue the connection between the second package 32 and the intermediate carrier strip 3. Steps before proceeding
200411788 五、發明說明(7) ' - 一迴知步驟及一底膠(under_fill)填充步驟(未標示於圖 中),以進一步加強第一封裝體31、第二封裝體32與中間 載板單元3 0之連接強度。 由於中間載板條3中,各個中間載板單元3〇之間具有 一槽孔304,故比獨立之中間載板單元3〇具有更足夠之* 間用以進行衝切或切割步驟。再者,,亦可提供較大之: 二Γ邊置定位點,如設置於中間載板單工元曰 30之開301邊緣(未標示於圖中), 二封裝體32與中間載板單元3〇連接時 =體—31或弟 進行定位校正,以避免第—封裝;用疋位點以 於中間載板單元30時之位置偏移=或弟二封装體32設置 以上所述僅為舉例性,而 本發明之精神與範疇,而對其進=限,性者。任何未脫離 應包含於後附之申請專利範^中:之等效修改或變更,均200411788 V. Description of the invention (7) '-a step of knowing and an under_fill filling step (not shown in the figure) to further strengthen the first package 31, the second package 32 and the intermediate carrier unit 30 connection strength. Since the mid-carrier strip 3, each of the intermediate carrier plate means having a slot 304 between 3〇, so independent of the ratio of the intermediate carrier plate means having a step between more 3〇 * sufficient for performing the punching or cutting. In addition, it can also provide a larger one: two Γ side positioning points, such as the 301 edge (not shown in the figure) at the middle of the single carrier 30 yuan (not shown in the figure), two packages 32 and the middle carrier unit 3〇 When connected = body-31 or brother to perform positioning correction to avoid the first-package; use a position to shift the position of the middle carrier board unit 30 = or brother two package 32 set above is only an example Sex, and the spirit and scope of the present invention, and it is the limit, sex. Any equivalent modification or change that should be included in the attached patent application:
第14頁 200411788 圖式簡單說明 (伍)、【圖式之簡單說明】 圖1為一示意圖,顯示習知平面型(side-by-side type)之多晶片封裝構造。 圖2為一示意圖,顯示習知立體堆疊型(stack type) 之多晶片封裝構造。 圖3為一剖面示意圖,顯示習知之另一具有中間載板 之立體堆疊型(stack type)多晶片封裝構造。 圖4為一分解示意圖,顯示對應於圖3之多晶片封裝構 造。Page 14 200411788 Brief description of the drawings (Wu), [Simplified description of the drawings] Fig. 1 is a schematic diagram showing a conventional multi-chip package structure of a side-by-side type. FIG. 2 is a schematic diagram showing a conventional three-dimensional stack type multi-chip package structure. FIG. 3 is a schematic cross-sectional view showing another conventional three-dimensional stack type multi-chip package structure with an intermediate carrier board. FIG. 4 is an exploded view showing a multi-chip package structure corresponding to FIG. 3.
圖5為一示意圖,顯示一治具板之構造。 圖6至圖1 0為示意圖,顯示依本發明較佳實施例之多 晶片封裝構造之製造方法。 元件符號說明: 11 平面型多晶片封裝構造之第一封裝體 12 平面型多晶片封裝構造之第二封裝體 13 載板 14 導電元件FIG. 5 is a schematic diagram showing the structure of a fixture plate. 6 to 10 are schematic views showing a method for manufacturing a multi-chip package structure according to a preferred embodiment of the present invention. Description of component symbols: 11 First package of planar multi-chip package structure 12 Second package of planar multi-chip package structure 13 Carrier board 14 Conductive element
20 中間載板單元 201 中間載板之開口 21 第一封裝體 211 第一載板 212 第一晶片 213 第一導電元件20 Intermediate carrier unit 201 Opening of intermediate carrier 21 First package 211 First carrier 212 First wafer 213 First conductive element
第15頁 200411788 圖式簡單說明 22 第二封裝體 221 第二載板 222 第二晶片 223 第二導電元件 23 第三導電元件 24 治具板 241 突出墊 242 治具板之開口 3 中間載板條 30 中間載板單元 301 中間載板之開口 302 第一表面 303 第二表面 304 槽孔 305 第三導電元件 306 定位點 31 第一封裝體 311 第一載板 312 第一晶片 313 第一導電元件 32 第二封裝體 321 第二載板 322 第二晶片 323 第二導電元件Page 15 200411788 Brief description of the drawings 22 The second package 221 The second carrier board 222 The second wafer 223 The second conductive element 23 The third conductive element 24 The fixture plate 241 The protruding pad 242 The opening of the fixture plate 3 The middle carrier strip 30 Intermediate carrier board unit 301 Opening of intermediate carrier board 302 First surface 303 Second surface 304 Slot hole 305 Third conductive element 306 Anchor point 31 First package 311 First carrier plate 312 First wafer 313 First conductive element 32 Second package 321 Second carrier 322 Second wafer 323 Second conductive element
第16頁 200411788 圖式簡單說明 4 膠膜 画画關 第17頁Page 16 200411788 Simple illustration of the picture 4 Adhesive film Picture off Page 17
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