SG32591G - Testing apparatus - Google Patents

Testing apparatus

Info

Publication number: SG32591G
Authority: SG; Singapore
Prior art keywords: testing apparatus; testing
Prior art date: 1984-04-16

Application number

SG325/91A

Original Assignee

Mars Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1984-04-16

Filing date

1991-05-02

Publication date

1991-06-21

1991-05-02 Application filed by Mars Inc filed Critical Mars Inc

1991-06-21 Publication of SG32591G publication Critical patent/SG32591G/en

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

SG325/91A 1984-04-16 1991-05-02 Testing apparatus SG32591G (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
GB848409794A GB8409794D0 (en)	1984-04-16	1984-04-16	Testing apparatus

Publications (1)

Publication Number	Publication Date
SG32591G true SG32591G (en)	1991-06-21

Family

ID=10559700

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
SG325/91A SG32591G (en)	1984-04-16	1991-05-02	Testing apparatus

Country Status (4)

Country	Link
JP (1)	JPS6117074A (en)
KR (1)	KR850007309A (en)
GB (1)	GB8409794D0 (en)
SG (1)	SG32591G (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
KR100506287B1 (en) *	1998-02-11	2005-11-11	삼성전자주식회사	Short presence tester and method

1984
- 1984-04-16 GB GB848409794A patent/GB8409794D0/en active Pending
1985
- 1985-04-16 KR KR1019850002541A patent/KR850007309A/en not_active Application Discontinuation
- 1985-04-16 JP JP60079447A patent/JPS6117074A/en active Pending
1991
- 1991-05-02 SG SG325/91A patent/SG32591G/en unknown

Also Published As

Publication number	Publication date
JPS6117074A (en)	1986-01-25
KR850007309A (en)	1985-12-02
GB8409794D0 (en)	1984-05-23

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