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SG11201507175SA - Method and apparatus for low latency communication in an automatic testing system - Google Patents

Method and apparatus for low latency communication in an automatic testing system

Info

Publication number
SG11201507175SA
SG11201507175SA SG11201507175SA SG11201507175SA SG11201507175SA SG 11201507175S A SG11201507175S A SG 11201507175SA SG 11201507175S A SG11201507175S A SG 11201507175SA SG 11201507175S A SG11201507175S A SG 11201507175SA SG 11201507175S A SG11201507175S A SG 11201507175SA
Authority
SG
Singapore
Prior art keywords
low latency
testing system
automatic testing
latency communication
communication
Prior art date
Application number
SG11201507175SA
Inventor
Thien D Nguyen
George W Conner
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of SG11201507175SA publication Critical patent/SG11201507175SA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
SG11201507175SA 2013-03-15 2014-03-07 Method and apparatus for low latency communication in an automatic testing system SG11201507175SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/836,567 US9791511B2 (en) 2013-03-15 2013-03-15 Method and apparatus for low latency communication in an automatic testing system
PCT/US2014/021695 WO2014149975A1 (en) 2013-03-15 2014-03-07 Method and apparatus for low latency communication in an automatic testing system

Publications (1)

Publication Number Publication Date
SG11201507175SA true SG11201507175SA (en) 2015-10-29

Family

ID=51531675

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201507175SA SG11201507175SA (en) 2013-03-15 2014-03-07 Method and apparatus for low latency communication in an automatic testing system

Country Status (6)

Country Link
US (1) US9791511B2 (en)
JP (1) JP6473736B2 (en)
KR (1) KR102151416B1 (en)
CN (1) CN105074483B (en)
SG (1) SG11201507175SA (en)
WO (1) WO2014149975A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10962384B2 (en) 2016-10-28 2021-03-30 Insight Energy Ventures, Llc Method of disaggregating an energy usage signal of a usage area
EP3532961B1 (en) 2016-10-28 2023-06-28 Insight Energy Ventures, LLC Method of intelligent demand response
JP7316818B2 (en) * 2019-03-28 2023-07-28 株式会社アドバンテスト Waveform data acquisition module and test equipment
US11953518B2 (en) * 2020-12-30 2024-04-09 Star Technologies, Inc. Switching matrix system and operating method thereof for semiconductor characteristic measurement
TWI760157B (en) * 2021-03-24 2022-04-01 德律科技股份有限公司 System and method of testing a single dut through multiple cores in parallel

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0454320B1 (en) * 1990-04-20 1995-12-13 Texas Instruments Incorporated Scan test circuit for use with multiple frequency circuits
US5369624A (en) * 1993-03-26 1994-11-29 Siemens Medical Systems, Inc. Digital beamformer having multi-phase parallel processing
JP3329921B2 (en) * 1993-12-27 2002-09-30 株式会社東芝 Arithmetic unit
US6625557B1 (en) * 1998-07-10 2003-09-23 Ltx Corporation Mixed signal device under test board interface
US20040187049A1 (en) 2003-02-27 2004-09-23 Nptest, Inc. Very small pin count IC tester
US7080168B2 (en) 2003-07-18 2006-07-18 Intel Corporation Maintaining aggregate data counts for flow controllable queues
US20050207436A1 (en) 2004-03-18 2005-09-22 Anujan Varma Switching device based on aggregation of packets
EP1600784A1 (en) 2004-05-03 2005-11-30 Agilent Technologies, Inc. Serial/parallel interface for an integrated circuit
US7046027B2 (en) * 2004-10-15 2006-05-16 Teradyne, Inc. Interface apparatus for semiconductor device tester
CN101158708B (en) * 2007-10-23 2011-05-04 无锡汉柏信息技术有限公司 Multiple chips automatic test method based on programmable logic device
US7652598B2 (en) * 2007-10-26 2010-01-26 Tektronix, Inc. Serial data analysis improvement
EP2680131A4 (en) * 2011-02-21 2017-01-18 Nec Corporation Computation device and computation execution method

Also Published As

Publication number Publication date
CN105074483B (en) 2018-01-05
CN105074483A (en) 2015-11-18
US9791511B2 (en) 2017-10-17
KR20150131052A (en) 2015-11-24
US20140278177A1 (en) 2014-09-18
JP2016510899A (en) 2016-04-11
WO2014149975A1 (en) 2014-09-25
KR102151416B1 (en) 2020-09-03
JP6473736B2 (en) 2019-02-20

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