KR970019707A

KR970019707A - Automatic test apparatus and method using digital test fixture

Info

Publication number: KR970019707A
Application number: KR1019950030760A
Authority: KR
Inventors: 조인식
Original assignee: 김광호; 삼성전자 주식회사
Priority date: 1995-09-19
Filing date: 1995-09-19
Publication date: 1997-04-30

Abstract

1. 청구범위에 기재된 발명이 속한 기술분야1. TECHNICAL FIELD OF THE INVENTION

고장이 발생한 피시험 모듈에 대한 에러를 자동으로 진단하는 자동시험장치 및 방법에 관한 것이다.The present invention relates to an automatic test apparatus and a method for automatically diagnosing an error on a module under test.

2. 발명이 해결하려고 하는 기술적 과제2. The technical problem to be solved by the invention

본 발명은 디지털 시험치구를 이용하여 구장이 발생한 피시험모듈에 대한 에러를 자동으로 진단하는 자동시험장치 및 방법을 제공한다.The present invention provides an automatic test apparatus and method for automatically diagnosing an error for a module under test using a digital test fixture.

3. 발명의 해결방법의 요지3. Summary of Solution to Invention

진단 피시험모듈을 선택하여 상기 진단 피시험모듈의 고유번호와 전원입력단자의 단락 상태가 정상이면 상기 진단 피시험 모듈에 저원을 공급하고 디지털 시험치구 탐색보드를 수행하여 디지털 시험치구를 이용하여 에러감지시 에러메세지를 표시함으로서 해당 부품의 교체토록 한다.When the diagnostic test module is selected and the identification number of the module under test and the short-circuit state of the power input terminal are normal, supply a source to the module under test and perform a digital test fixture search board to perform an error using a digital test fixture. In case of detection, error message is displayed to replace the corresponding parts.

4. 발명의 중요한 용도4. Important uses of the invention

기능단위로 나뉘어지는 각종 피시험 모쥴에 대한 에러를 자동으로 진단하는 자동시험장치에 이용한다.It is used in the automatic test equipment for automatically diagnosing errors on various modules under test divided into functional units.

Description

Automatic test apparatus and method using digital test fixture.

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2도는 본 발명에 따른 디지털 시험치구를 이용한 자동시험장치의 블록 구성도,2 is a block diagram of an automatic test apparatus using a digital test fixture according to the present invention,

제3도는 본 발명에 따른 자동시험방법을 나타내는 흐름도.3 is a flowchart showing an automatic test method according to the present invention.

Claims

An automatic test apparatus for automatically diagnosing an error for various modules under test by using a digital test fixture, comprising a display unit and an automatic test program. A computer controlling the overall operation of checking for the presence of an error; A digital tester for measuring various electrical characteristics of a predicted failure part in the module under test under the control of the computer; And a digital test fixture for providing electrical connection by mechanical contact to each part between the digital tester and the diagnostic test module.

The component of claim 1, wherein the computer controls the digital tester to perform an automatic test of the diagnostic test module and respond to the selection of a digital test fixture detection mode upon detection of an error. Is measured by the digital tester to detect whether there is an abnormality, and the detection result is displayed on the display unit.

In an automatic test method of an automatic test apparatus for automatically diagnosing an error for various modules under test by using a digital test fixture, the diagnostic test module is responsive after the digital test fixture search mode is selected. Checking whether it is inserted into the digital test fixture; Diagnosing whether the module under test is inserted into the digital test fixture during the inspection, and whether the intrinsic number of the module under test is normal and whether the power module is short-circuited; Displaying a short circuit error message of a power input terminal in the module under test when an error is detected in the diagnosis process; Performing a selective function test to detect whether or not an abnormality of the module under test is detected by using a digital test fixture to predict a failure part; Automatic test method characterized in that the process of displaying a selection error message when detecting an error in the failure detection process.

※ Note: The disclosure is based on the initial application.