KR20180121608A - 부식 억제용 고분자 물질 및 조성물 - Google Patents
부식 억제용 고분자 물질 및 조성물 Download PDFInfo
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Abstract
Description
도 2는 다양한 MOF/에폭시 코팅된 알루미늄 코팅 기재의 NSS 시험에 대해 얻어진 결과를 나타낸다. 도 2a는 TT/에폭시 코팅이 12주 노출 후에 알루미늄 기재의 약간의 부식 억제를 제공함을 나타낸다. 도 2b는 LaTT/에폭시 코팅이 12주 노출 후에 알루미늄 기재의 중간의 부식 억제를 제공함을 나타낸다. 도 2c는 PrTT/에폭시 코팅이 12주 노출 후에 알루미늄 기재의 완전한 부식 억제를 제공함을 나타낸다. 도 2d는 ZnDMT/에폭시 코팅이 12주 노출 후에 알루미늄 기재의 중간의 부식 억제를 제공함을 나타낸다.
Claims (27)
- 부식 억제제를 포함하는 보호 조성물을 기재의 표면에 적용하는 단계를 포함하는 부식으로부터 기재를 보호하는 방법으로서,
부식 억제제는 금속 유기 골격체 (MOF)를 포함하고,
MOF는 적어도 1-, 2- 또는 3 차원 네트워크를 형성하기 위해 하나 이상의 유기 리간드에 각각 배위된 금속 이온 또는 금속 클러스터를 포함하며,
하나 이상의 유기 리간드는 임의로 치환된 아릴, 헤테로아릴 또는 헤테로시클릭 화합물로 이루어진 군으로부터 선택되고, 각각의 아릴, 헤테로아릴 또는 헤테로시클릭 화합물은 적어도 하나의 엑소시클릭 황 기를 포함하는 것을 특징으로 하는, 방법. - 제 1항에 있어서, 기재는 금속 기재인 것을 특징으로 하는, 방법.
- 제 2항에 있어서, 금속 기재는 금속 또는 알루미늄의 합금을 포함하는 것을 특징으로 하는, 방법.
- 제 1항에 있어서, 유기 리간드는 티올 및 티온으로부터 선택된 적어도 하나의 엑소시클릭 황 기를 포함하는 임의로 치환되고 임의로 융합된, 5- 또는 6-원 모노 또는 비시클릭 아릴, 헤테로아릴 또는 헤테로시클릭 화합물로부터 선택되는 것을 특징으로 하는, 방법.
- 제 1항 내지 제 4항 중 어느 한 항에 있어서, 적어도 하나의 엑소시클릭 황 기를 포함하는 하나 이상의 유기 리간드는 화학식 1의 화합물로부터 선택되는 것을 특징으로 하는, 방법:
[화학식 1]
여기서,
A는 임의로 하나 이상의 치환체로 치환되고, 임의로 하나 이상의 아릴 또는 헤테로아릴 고리와 융합되는, 5- 또는 6-원 아릴, 헤테로아릴 또는 헤테로시클릭 고리이며, 여기서 점선은 임의의 이중 결합을 나타내고;
X1은 N, NR1, O, S, CR2 및 CR3R4로 이루어진 군으로부터 선택되며;
X2는 N, NR5, O, S, CR6 및 CR7R8로 이루어진 군으로부터 선택되고;
X3은 N, NR9, CR10 및 CR11R12로 이루어진 군으로부터 선택되며;
R1, R5 및 R9는 각각 독립적으로 수소, 아미노, C1-C10 알킬, C2-C10 알케닐, C2-C10 알키닐, 아릴 및 헤테로아릴로 이루어진 군으로부터 선택되고, 여기서 각각의 아미노, 알킬, 알케닐, 알키닐, 아릴 또는 헤테로아릴 기는 임의로 치환되며;
R2, R3, R4, R6, R7, R8, R10, R11 및 R12는 각각 독립적으로 수소, 할로, 아미노, 티올, 티온, C1-C10 알킬, C2-C10 알케닐, C2-C10 알키닐, 아릴 및 헤테로아릴로 이루어진 군으로부터 선택되고, 여기서 각각의 아미노, 알킬, 알케닐, 알키닐, 아릴 또는 헤테로아릴 기는 임의로 치환될 수 있다. - 제 5항에 있어서, X1은 N, NH 및 S로 이루어진 군으로부터 선택되는 것을 특징으로 하는, 방법.
- 제 5항에 있어서, X3은 N 및 CR10으로 이루어진 군으로부터 선택되며, R10은 티올 및 티온으로부터 선택되는 것을 특징으로 하는, 방법.
- 제 5항에 있어서, X1은 N 및 S로 이루어진 군으로부터 선택되며, X3은 C-SH인 것을 특징으로 하는, 방법.
- 제 5항에 있어서, X1은 N이고, X2는 N이며, X3은 C-SH인 것을 특징으로 하는, 방법.
- 제 1항에 있어서, MOFs의 금속 이온 또는 금속 클러스터는 희토류 금속 및 전이 금속 중 적어도 하나로부터 선택되는 것을 특징으로 하는, 방법.
- 제 10항에 있어서, 하나 이상의 금속은 아연 및 La, Pr, Ce, Co, Y의 희토류 금속 및 이들의 조합으로 이루어진 군으로부터 선택되는 것을 특징으로 하는, 방법.
- 제 10항에 있어서, 금속은 Zn, Pr 및/또는 Ce으로 이루어진 군으로부터 선택되는 것을 특징으로 하는, 방법.
- 제 10항에 있어서, 금속은 Pr인 것을 특징으로 하는, 방법.
- 제 1항에 있어서, MOFs는 고체 입자의 형태인 것을 특징으로 하는, 방법.
- 제 14항에 있어서, 고체 입자의 평균 직경은 20 nm 내지 50 μm 범위의 크기를 갖는 것을 특징으로 하는, 방법.
- 제 14항에 있어서, 고체 입자의 평균 직경은 100 nm 내지 1 μm 범위의 크기를 갖는 것을 특징으로 하는, 방법.
- 금속 유기 골격체 (MOF)로부터 선택된 적어도 하나의 부식 억제제를 포함하는, 기재에 적용하기 위한 부식 억제 조성물로서,
MOF는 적어도 1-, 2- 또는 3 차원 네트워크를 형성하기 위해 하나 이상의 유기 리간드에 각각 배위된 금속 이온 또는 금속 클러스터를 포함하며,
하나 이상의 유기 리간드는 임의로 치환된 아릴, 헤테로아릴 또는 헤테로시클릭 화합물로 이루어진 군으로부터 선택되고, 각각의 아릴, 헤테로아릴 또는 헤테로시클릭 화합물은 적어도 하나의 엑소시클릭 황 기를 포함하는 것을 특징으로 하는, 조성물. - 제 17항에 있어서, 조성물은 필름-형성 유기 고분자를 포함하는 코팅 조성물인 것을 특징으로 하는, 조성물.
- 제 18항에 있어서, 필름-형성 유기 고분자는 하나 이상의 에폭시계 수지를 포함하는 것을 특징으로 하는, 조성물.
- 제 17항에 있어서, 조성물은 분말 코팅 조성물인 것을 특징으로 하는, 조성물.
- 제 17항에 있어서, 하나 이상의 안료, 충전제 및 증량제를 포함하는 하나 이상의 첨가제를 더 포함하는, 조성물.
- 제 17항에 있어서, MOF는 실질적으로 백색을 갖는 것을 특징으로 하는, 조성물.
- 제 22항에 있어서, 조성물은 실질적으로 임의의 안료 첨가제를 함유하지 않는 것을 특징으로 하는, 조성물.
- 필름-형성 유기 고분자 및 금속 유기 골격체 (MOF)로부터 선택된 적어도 하나의 부식 억제제를 혼합시켜 조성물을 형성하는 단계를 포함하는, 기재에 적용하기 위한 부식 억제 코팅 조성물의 제조 방법으로서,
MOF는 적어도 1-, 2- 또는 3 차원 네트워크를 형성하기 위해 하나 이상의 유기 리간드에 각각 배위된 금속 이온 또는 금속 클러스터를 포함하며,
하나 이상의 유기 리간드는 임의로 치환된 아릴, 헤테로아릴 또는 헤테로시클릭 화합물로 이루어진 군으로부터 선택되고, 각각의 아릴, 헤테로아릴 또는 헤테로시클릭 화합물은 적어도 하나의 엑소시클릭 황 기를 포함하는 것을 특징으로 하는, 방법. - 금속 유기 골격체 (MOF)를 포함하는 부식 억제 조성물로 코팅된 기재를 포함하는 코팅된 기재로서,
MOF는 적어도 1-, 2- 또는 3 차원 네트워크를 형성하기 위해 하나 이상의 유기 리간드에 각각 배위된 금속 이온 또는 금속 클러스터를 포함하며,
하나 이상의 유기 리간드는 임의로 치환된 아릴, 헤테로아릴 또는 헤테로시클릭 화합물로 이루어진 군으로부터 선택되고, 각각의 아릴, 헤테로아릴 또는 헤테로시클릭 화합물은 적어도 하나의 엑소시클릭 황 기를 포함하는 것을 특징으로 하는, 기재. - 제 25항에 있어서, 부식 억제 조성물은 기재의 표면에 직접 코팅으로 적용되는 것을 특징으로 하는, 코팅된 기재.
- 제 25항에 있어서, 기재는 금속 합금이고 부식 억제 조성물은 필름-형성 유기 고분자를 포함하는 것을 특징으로 하는, 코팅된 기재.
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