KR20100037071A - 발열체 cvd 장치 - Google Patents
발열체 cvd 장치 Download PDFInfo
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- KR20100037071A KR20100037071A KR1020100016125A KR20100016125A KR20100037071A KR 20100037071 A KR20100037071 A KR 20100037071A KR 1020100016125 A KR1020100016125 A KR 1020100016125A KR 20100016125 A KR20100016125 A KR 20100016125A KR 20100037071 A KR20100037071 A KR 20100037071A
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- Prior art keywords
- heating element
- heating
- source gas
- substrate
- film
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- 238000010438 heat treatment Methods 0.000 title claims abstract description 164
- 239000000758 substrate Substances 0.000 claims abstract description 74
- 230000007246 mechanism Effects 0.000 claims description 23
- 230000003213 activating effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 18
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 11
- 230000008569 process Effects 0.000 abstract description 9
- 239000007789 gas Substances 0.000 description 65
- 239000010408 film Substances 0.000 description 63
- 238000005229 chemical vapour deposition Methods 0.000 description 53
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 23
- 229910052710 silicon Inorganic materials 0.000 description 23
- 239000010703 silicon Substances 0.000 description 23
- 239000002994 raw material Substances 0.000 description 19
- 239000010409 thin film Substances 0.000 description 16
- 230000015572 biosynthetic process Effects 0.000 description 15
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 14
- 229910000077 silane Inorganic materials 0.000 description 14
- 239000001257 hydrogen Substances 0.000 description 13
- 229910052739 hydrogen Inorganic materials 0.000 description 13
- 150000002431 hydrogen Chemical class 0.000 description 10
- YZCKVEUIGOORGS-UHFFFAOYSA-N Hydrogen atom Chemical compound [H] YZCKVEUIGOORGS-UHFFFAOYSA-N 0.000 description 7
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- 238000001994 activation Methods 0.000 description 4
- 238000004050 hot filament vapor deposition Methods 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 230000004913 activation Effects 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 3
- 229910010271 silicon carbide Inorganic materials 0.000 description 3
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 2
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 2
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 2
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 2
- 229910000078 germane Inorganic materials 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000009849 deactivation Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000007306 functionalization reaction Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
기판상에 실리콘막을 성막 중, 기판홀더와 발열체 사이의 공간을 둘러싸는 구조체의 내면을 적어도 200℃이상 바람직하게는 적어도 350℃이상으로 가열 유지하는 발열체 CVD 장치 및 이것을 이용한 CVD 방법.
Description
도 2는 원료가스 공급기의 단면 개략도,
도 3은 (a)는 본 발명의 발열체 CVD 장치에 있어서의 처리용기의 내부를 위에서 본 일부를 생략한 도면, (b)는 가열지그의 측면을 투시한 도면.
1 처리용기 2 배기계
3 가스 공급계 4 발열체
5 기판홀더 6 전력공급기구
7 가열기구 8 가열지그
9 기판 11 배기구
12 접속부 13 히터
14 센서 15 가열 온도 조절기
16 배선 17 방착판
21 진공펌프 22 배기속도 조정기
31a 가스 봄베 31b 가스 봄베
32 원료가스 공급기 33 배관
34 밸브 35 유량 조정기
61 배선 320 가스분출구멍
321 접속단자 322 원료가스 공급실
323 연결판
Claims (1)
- CVD 장치에 있어서,
처리용기;
상기 처리용기 내의 기판 홀더;
상기 처리용기에 접속되어 있고 상기 처리용기를 배기하는 배기계;
복수의 구멍이 구비된 가스분출면을 가지며 상기 구멍을 통해 원료가스를 상기 처리 용기내로 도입하도록 구성된 원료가스 공급기; 및
상기 처리용기 내의 전력공급기구로부터 공급된 전력에 의해 가열되도록 구성되어, 상기 구멍으로부터 상기 처리용기 내로 도입된 원료가스를 가열하여 상기 구멍으로부터 상기 처리용기 내로 도입된 상기 원료가스를 분해 또는 활성화 또는 분해 및 활성화하기 위한 발열체;를 포함하고,
상기 원료가스 공급기는 상기 가스분출면의 양쪽 측면 옆에 각각 배치된 두개의 전력공급 단자를 내부에 포함하여, 상기 발열체를 상기 전력공급 단자 사이에서 상기 가스분출면의 전방에서 뻗어나오도록 하여 착탈가능하게 유지하고 또한 상기 발열체를 상기 전력공급기구에 전기적으로 연결하고,
상기 원료가스 공급기 내부의 상기 전력공급 단자는 상기 처리용기로부터 구분된 공간에 위치됨으로써 상기 구멍으로부터 상기 처리용기 내로 도입된 원료가스와 접촉하는 것이 방지되는 것을 특징으로 하는 CVD 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001349075 | 2001-11-14 | ||
JPJP-P-2001-349075 | 2001-11-14 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020070237A Division KR20030040119A (ko) | 2001-11-14 | 2002-11-13 | 발열체 cvd 장치 및 이것을 이용한 발열체 cvd 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100037071A true KR20100037071A (ko) | 2010-04-08 |
KR100972962B1 KR100972962B1 (ko) | 2010-07-30 |
Family
ID=19161799
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020070237A KR20030040119A (ko) | 2001-11-14 | 2002-11-13 | 발열체 cvd 장치 및 이것을 이용한 발열체 cvd 방법 |
KR1020100016125A KR100972962B1 (ko) | 2001-11-14 | 2010-02-23 | 발열체 cvd 장치 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020070237A KR20030040119A (ko) | 2001-11-14 | 2002-11-13 | 발열체 cvd 장치 및 이것을 이용한 발열체 cvd 방법 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20060254516A1 (ko) |
EP (2) | EP2208806A1 (ko) |
KR (2) | KR20030040119A (ko) |
CN (1) | CN1276472C (ko) |
TW (1) | TWI245329B (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4157718B2 (ja) | 2002-04-22 | 2008-10-01 | キヤノンアネルバ株式会社 | 窒化シリコン膜作製方法及び窒化シリコン膜作製装置 |
JP3787816B2 (ja) * | 2002-10-04 | 2006-06-21 | キヤノンアネルバ株式会社 | 発熱体cvd装置 |
US7422983B2 (en) | 2005-02-24 | 2008-09-09 | International Business Machines Corporation | Ta-TaN selective removal process for integrated device fabrication |
CN100466164C (zh) * | 2005-12-08 | 2009-03-04 | 北京圆合电子技术有限责任公司 | 一种真空腔室的充气系统 |
JP4948021B2 (ja) * | 2006-04-13 | 2012-06-06 | 株式会社アルバック | 触媒体化学気相成長装置 |
US20100276002A1 (en) * | 2007-09-20 | 2010-11-04 | Nuofu Chen | Process and apparatus for producing polysilicon sheets |
AT519217B1 (de) | 2016-10-04 | 2018-08-15 | Carboncompetence Gmbh | Vorrichtung und Verfahren zum Aufbringen einer Kohlenstoffschicht |
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US3373198A (en) * | 1967-04-27 | 1968-03-12 | American Cyanamid Co | Substituted 5a, 11a-dehydro-6-epitetracyclines |
JPS59207620A (ja) * | 1983-05-10 | 1984-11-24 | Zenko Hirose | アモルフアスシリコン成膜装置 |
DE3539981C1 (de) * | 1985-11-11 | 1987-06-11 | Telog Systems Gmbh | Verfahren und Vorrichtung zur Behandlung von Halbleitermaterialien |
US5594280A (en) * | 1987-10-08 | 1997-01-14 | Anelva Corporation | Method of forming a thin film and apparatus of forming a metal thin film utilizing temperature controlling means |
JP2692326B2 (ja) * | 1990-02-16 | 1997-12-17 | 富士電機株式会社 | 触媒cvd装置 |
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WO1992016671A1 (en) * | 1991-03-20 | 1992-10-01 | Canon Kabushiki Kaisha | Method and device for forming film by sputtering process |
JP2532401Y2 (ja) * | 1991-04-16 | 1997-04-16 | ソニー株式会社 | バイアスecrプラズマcvd装置 |
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JP3165938B2 (ja) * | 1993-06-24 | 2001-05-14 | 東京エレクトロン株式会社 | ガス処理装置 |
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KR100302609B1 (ko) * | 1999-05-10 | 2001-09-13 | 김영환 | 온도가변 가스 분사 장치 |
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-
2002
- 2002-11-13 KR KR1020020070237A patent/KR20030040119A/ko not_active Application Discontinuation
- 2002-11-13 TW TW091133289A patent/TWI245329B/zh not_active IP Right Cessation
- 2002-11-14 CN CNB021504814A patent/CN1276472C/zh not_active Expired - Fee Related
- 2002-11-14 EP EP10003577A patent/EP2208806A1/en not_active Withdrawn
- 2002-11-14 EP EP02257886A patent/EP1312698A1/en not_active Withdrawn
-
2006
- 2006-07-20 US US11/489,522 patent/US20060254516A1/en not_active Abandoned
-
2010
- 2010-02-23 KR KR1020100016125A patent/KR100972962B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1276472C (zh) | 2006-09-20 |
TWI245329B (en) | 2005-12-11 |
EP2208806A1 (en) | 2010-07-21 |
US20060254516A1 (en) | 2006-11-16 |
EP1312698A1 (en) | 2003-05-21 |
KR100972962B1 (ko) | 2010-07-30 |
TW200300271A (en) | 2003-05-16 |
CN1419268A (zh) | 2003-05-21 |
KR20030040119A (ko) | 2003-05-22 |
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