KR20090006688A - Probe unit and method for detecting device using the same - Google Patents
Probe unit and method for detecting device using the same Download PDFInfo
- Publication number
- KR20090006688A KR20090006688A KR1020070070285A KR20070070285A KR20090006688A KR 20090006688 A KR20090006688 A KR 20090006688A KR 1020070070285 A KR1020070070285 A KR 1020070070285A KR 20070070285 A KR20070070285 A KR 20070070285A KR 20090006688 A KR20090006688 A KR 20090006688A
- Authority
- KR
- South Korea
- Prior art keywords
- probe
- under test
- block
- device under
- main
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/2085—Special arrangements for addressing the individual elements of the matrix, other than by driving respective rows and columns in combination
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Optics & Photonics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to a probe device and a test method using the same, the probe device according to the invention, the probe unit base on which the device to be inspected is mounted and the adapter is mounted; A plurality of main blocks disposed on the adapter and moved back and forth independently of each other to vary positions; And a probe block installed in each of the plurality of main blocks, the probe block having a plurality of inspection tips for contacting the device under test and inspecting whether the device under test is defective. The position of the main block can be changed automatically, so it can be applied to pads of various intervals.
Description
The present invention relates to a probe device using a probe unit for inspecting the device under test and a test method using the same, and more particularly, to change the position of the main block to be mounted in the probe unit base automatically. The present invention relates to a probe device applicable to a pad and an inspection method using the same.
In general, a display device is used to display various types of information to a user. Recently, due to the development of the electronics industry and the increase in the amount of information, research and development of large-screen display devices have been actively conducted, and power consumption is small and large screens can be implemented. Flat display devices such as plasma display panel (PDP), liquid crystal display (LCD), or organic electroluminescence (EL) have been developed.
Referring to FIGS. 1 to 3, a conventional probe device applied to a device under test, such as an LCD, which is mainly used as an image display device such as a small TV or a laptop, will be described below.
1 is a plan view schematically showing a probe device of a flat panel display device according to the prior art.
2 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to the related art.
The probe device according to the prior art, as shown in Figs. 1 and 2, is provided with an adapter (by means of bolts or other fastening means 15 at the edge of the work stage, ie the probe unit base 11). 13 is installed, and the
Here, the plurality of
In addition, the device under
1 and 2, the probe apparatus according to the prior art has a main block (main block) so that the state of the device under
The lighting test method of the device under test will be described with reference to FIG. 3 as follows.
3 is a flowchart schematically illustrating a process of inspecting a defect of a flat panel display device using a probe device of a flat panel display device according to the related art.
Referring to FIG. 3, first, an adapter (13 of FIG. 1) for an inspected element (not shown; 31 of FIG. 1) for inspecting a defect is prepared and transported.
Then, after disassembling the adapter installed in the probe unit base (11 in Fig. 1), the new adapter carried is mounted. At this time, the adapter is provided with a plurality of main blocks (not shown; 17 in FIG. 1), and the main block has a plurality of inspection tips (not shown; 19a in FIG. 2). 1) 19) is provided.
Then, after loading the device under test into the probe unit base (11 in FIG. 1), the loading position is adjusted to a predetermined level corresponding to the position of the probe block of the main block.
Subsequently, the main block position and the probe block provided in the main block are precisely aligned according to the position of the new device under test.
Then, a plurality of
As described above, the probe device according to the prior art has the following problems.
The probe apparatus according to the prior art needs to disassemble the main block and reassemble it in a proper position when the position of the main block needs to be changed, that is, when the position of the main block that is already set is changed due to the change of the size of the device under test. There was a problem.
In addition, the probe device according to the prior art cannot use the same test tip when the device under test, i.e., the pad specifications (i.e., the number of blocks, the interval, etc.) are different for each panel.
In addition, the probe device according to the prior art should be mounted after replacing the entire main block when a panel having different pad specifications is loaded.
In addition, the probe device according to the prior art requires a precise machining within the tolerance range when manufacturing the main block, the manufacturing cost increases.
On the other hand, the probe device according to the prior art has a narrow space at the time of carrying the adapter for the replacement operation of the device to be inspected, the weight is large, there is a risk of accidents.
In addition, the probe device according to the prior art increases the amount of work and work time due to the removal / attachment of the adapter, the risk of component damage due to frequent replacement.
Accordingly, the present invention has been made to solve the above problems of the prior art, the object of the present invention is easy to adjust the position of the main blocks provided in the probe device probe device that can be appropriately applied to various pad spacing specifications and It provides an inspection method using the same.
In addition, another object of the present invention is to provide a probe device and an inspection method using the same, which can quickly and easily carry out the lighting inspection of panels having various specifications by changing the structure of the probe device to change the position of the main block.
Probe device according to the present invention for achieving the above object is a probe unit base on which the device under test is seated and the adapter is mounted; A plurality of main blocks disposed on the adapter and moved back and forth independently of each other to vary positions; And a probe block installed at each of the plurality of main blocks and provided with a plurality of inspection tips for contacting the device under test and inspecting whether the device under test is defective.
An inspection method using a probe device according to the present invention for achieving the above object comprises the steps of preparing a device to be inspected for inspecting for defects; Moving the main block by loading a recipe file storing a moving position of the main block; Aligning a probe block installed in the main block at a position of the automatically moved main block and having a plurality of inspection tips; Loading the device under test into a probe unit base; Moving the probe block to contact a plurality of test tips provided in the probe block with a test terminal provided in the device under test; And inspecting whether the device under test is defective by driving the device under test while the plurality of test tips provided in the probe block are in contact with the test terminal provided in the device under test. It is characterized by.
As described above, according to the probe apparatus and the inspection method using the same according to the present invention has the following effects.
The probe device and the inspection method using the same according to the present invention do not need to carry out work such as transportation / preliminary preparation of parts generated during the replacement of the existing model, and do not need to remove / attach the adapter in the probe unit base.
In addition, the probe device and the inspection method using the same according to the present invention can be easily applied to various pad spacing specifications because the position of the main blocks installed in the probe device can be easily adjusted.
In addition, the probe device and the inspection method using the same according to the present invention can easily and quickly proceed the lighting inspection of the panel having various specifications by changing the structure of the probe device to change the position of the main block.
In addition, the probe apparatus and the inspection method using the same according to the present invention can reduce the model replacement work time and the amount of work, and can reduce the risk of accidents due to the transport of the adapter to prepare the probe unit base replacement as in the past.
Hereinafter, a probe device and an inspection method using the same according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.
4 is a plan view schematically showing a probe device of a flat panel display device according to the present invention, and is a plan view showing a case of a probe device applied to a large flat panel display device.
5 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the present invention.
As shown in FIGS. 4 and 5, the probe device according to the present invention includes a plurality of
Here, the
In addition, the
In addition, the
At this time, the position of the
In addition, the
The plurality of
In addition, as illustrated in FIG. 5, the plurality of
The device under
In addition, the
As illustrated in FIG. 5, the probe device according to the present invention includes the plurality of
Meanwhile, a case in which the probe device according to the present invention is applied to a device under test of another specification (for example, a small size) of FIG. 4 will be described with reference to FIG. 6.
6 is a plan view schematically illustrating a probe device of a flat panel display device according to the present invention, and is a plan view illustrating a probe device applied to a small flat panel display device.
As shown in FIG. 6, the probe device according to the present invention has the same structure as that of the probe device applied to FIG. 4, and the device to be inspected applies a device having a smaller size than that of the device to be inspected applied to FIG. 4.
As shown in FIG. 6, since the width between the gate lines is narrow and the distance between the pads is narrow in the case of a small device under test, the corresponding inter-block distance between the probe blocks should be narrower than in the case of FIG. 4.
Accordingly, the
The
As a result, a work such as transporting parts or preparing the parts, which are generated when the model of the inspection device is replaced, becomes unnecessary as in the past, and an adapter detachment / attachment process in the probe unit base is unnecessary.
Meanwhile, referring to FIGS. 7 and 8, an embodiment of a coupling structure of a main block that automatically adjusts the position of the main block in order to inspect a device for defects when replacing a model as described above will be described below. same.
7 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to an exemplary embodiment of the present invention, in which a main block of the probe device is changed in position by driving a linear motor on a movement guide.
FIG. 8 is a cross-sectional view taken along the line VII-VII of FIG. 7, illustrating a coupling structure of the main block with the movement guide.
As illustrated in FIG. 7, a
In addition, as shown in FIG. 8, guide grooves 111a are formed at both lower sides of the
At this time, the moving
On the other hand, as another embodiment, the movement guide and the air floating device is mounted together on the
In addition, as another embodiment, it is also possible to control the forward and backward movement of the movement guide by using an acylinder that is connected and operated like a pump instead of the linear motor.
Therefore, even if the position of the
Thus, by driving the linear motor 151, the recipe file corresponding to the device under test of a desired specification can be loaded and the
Also, with reference to Figs. 9 and 10 for another embodiment of the coupling structure of the main block that automatically adjusts the position of the main block in order to check the defect of the device when the model is replaced as described above. Is as follows.
FIG. 9 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to another exemplary embodiment, wherein the probe block is changed by driving of a forward and reverse motor on a guide belt. Referring to FIG.
FIG. 10 is a cross-sectional view taken along the line VII-VII of FIG. 9, illustrating a coupling structure of the probe block with the guide belt.
As shown in FIG. 9, first and
Here, the
At this time, the
On the other hand, although not shown in the drawings, as another embodiment of the forward and reverse motor, the position of the main block precisely through the drive system using the forward and reverse motor, the ball screw and the movement guide to enable more precise position control of the main block. You can also control it.
Therefore, even if the position of the
Thus, by driving the forward and
The lighting inspection method of the device under test will be described with reference to FIG. 11 as follows.
11 is a flowchart schematically illustrating a process of inspecting whether a flat panel display device is defective by using the probe device of the flat panel display device according to the present invention.
Here, a case in which the position of the main block is adjusted by using the linear motor according to the embodiment of the present invention will be described.
Referring to FIG. 11, first, a device under test (not shown) 131 of FIG. 4 is prepared to inspect a defect.
Next, a recipe file which stores the moving position of the
Subsequently, at the position of the automatically moved main block (111 in FIG. 4), the
Then, after loading the panel under test (131 of FIG. 4) into the
Thereafter, the plurality of
On the other hand, while described above with reference to a preferred embodiment of the present invention, those skilled in the art various modifications of the present invention without departing from the spirit and scope of the invention described in the claims below And can be changed.
1 is a plan view schematically showing a probe device of a flat panel display device according to the prior art.
Figure 2 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the prior art.
3 is a flowchart schematically illustrating a process of inspecting whether a flat panel display device is defective by using a probe device of a flat panel display device according to the related art.
Figure 4 is a plan view schematically showing a probe device of a flat panel display device according to the present invention, a plan view showing a case of a probe device applied to a large flat panel display device.
5 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the present invention;
6 is a plan view schematically illustrating a probe device of a flat panel display device according to the present invention, and a plan view of a probe device applied to a small flat panel display device.
7 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to the present invention, wherein the main block of the probe device is changed in position by driving a linear motor on a movement guide;
FIG. 8 is a cross-sectional view taken along the line VII-VII of FIG. 7, illustrating a coupling structure of the main block with the movement guide. FIG.
FIG. 9 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to another exemplary embodiment of the present invention, wherein the main block is changed by driving of a forward and reverse motor on a guide belt; FIG.
10 is a cross-sectional view taken along the line VII-VII of FIG. 9, in which the main block is coupled to the guide belt.
11 is a flow chart schematically showing a process of inspecting whether a flat panel display device is defective by using the probe device of the flat panel display device according to the present invention.
-Code description of main parts of drawing-
101: probe unit base 103: adapter
105: movement guide 111: main block
113:
121: linear motor 123: connector
125: moving member 129: fastening means
131: device under
131b: top plate 133: gate line
135: test terminal (pad)
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070070285A KR20090006688A (en) | 2007-07-12 | 2007-07-12 | Probe unit and method for detecting device using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020070070285A KR20090006688A (en) | 2007-07-12 | 2007-07-12 | Probe unit and method for detecting device using the same |
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Publication Number | Publication Date |
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KR20090006688A true KR20090006688A (en) | 2009-01-15 |
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KR1020070070285A KR20090006688A (en) | 2007-07-12 | 2007-07-12 | Probe unit and method for detecting device using the same |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102654656A (en) * | 2011-04-21 | 2012-09-05 | 京东方科技集团股份有限公司 | Detecting device and working method thereof |
WO2017181755A1 (en) * | 2016-04-19 | 2017-10-26 | 京东方科技集团股份有限公司 | Adjustment device for lighting test and lighting test device |
CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
-
2007
- 2007-07-12 KR KR1020070070285A patent/KR20090006688A/en not_active Application Discontinuation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102654656A (en) * | 2011-04-21 | 2012-09-05 | 京东方科技集团股份有限公司 | Detecting device and working method thereof |
CN102654656B (en) * | 2011-04-21 | 2015-01-07 | 京东方科技集团股份有限公司 | Detecting device and working method thereof |
US9136088B2 (en) | 2011-04-21 | 2015-09-15 | Boe Technology Group Co., Ltd. | Detection apparatus and operating method |
WO2017181755A1 (en) * | 2016-04-19 | 2017-10-26 | 京东方科技集团股份有限公司 | Adjustment device for lighting test and lighting test device |
US20180068601A1 (en) * | 2016-04-19 | 2018-03-08 | Boe Technology Group Co., Ltd. | Adjustment device for light-on testing and light-on testing device |
US10565910B2 (en) | 2016-04-19 | 2020-02-18 | Boe Technology Group Co., Ltd. | Adjustment device for light-on testing and light-on testing device |
CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
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