Nothing Special   »   [go: up one dir, main page]

KR20090006688A - Probe unit and method for detecting device using the same - Google Patents

Probe unit and method for detecting device using the same Download PDF

Info

Publication number
KR20090006688A
KR20090006688A KR1020070070285A KR20070070285A KR20090006688A KR 20090006688 A KR20090006688 A KR 20090006688A KR 1020070070285 A KR1020070070285 A KR 1020070070285A KR 20070070285 A KR20070070285 A KR 20070070285A KR 20090006688 A KR20090006688 A KR 20090006688A
Authority
KR
South Korea
Prior art keywords
probe
under test
block
device under
main
Prior art date
Application number
KR1020070070285A
Other languages
Korean (ko)
Inventor
송원준
Original Assignee
엘지디스플레이 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지디스플레이 주식회사 filed Critical 엘지디스플레이 주식회사
Priority to KR1020070070285A priority Critical patent/KR20090006688A/en
Publication of KR20090006688A publication Critical patent/KR20090006688A/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/2085Special arrangements for addressing the individual elements of the matrix, other than by driving respective rows and columns in combination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention relates to a probe device and a test method using the same, the probe device according to the invention, the probe unit base on which the device to be inspected is mounted and the adapter is mounted; A plurality of main blocks disposed on the adapter and moved back and forth independently of each other to vary positions; And a probe block installed in each of the plurality of main blocks, the probe block having a plurality of inspection tips for contacting the device under test and inspecting whether the device under test is defective. The position of the main block can be changed automatically, so it can be applied to pads of various intervals.

Description

PROBE UNIT AND METHOD FOR DETECTING DEVICE USING THE SAME}

The present invention relates to a probe device using a probe unit for inspecting the device under test and a test method using the same, and more particularly, to change the position of the main block to be mounted in the probe unit base automatically. The present invention relates to a probe device applicable to a pad and an inspection method using the same.

In general, a display device is used to display various types of information to a user. Recently, due to the development of the electronics industry and the increase in the amount of information, research and development of large-screen display devices have been actively conducted, and power consumption is small and large screens can be implemented. Flat display devices such as plasma display panel (PDP), liquid crystal display (LCD), or organic electroluminescence (EL) have been developed.

Referring to FIGS. 1 to 3, a conventional probe device applied to a device under test, such as an LCD, which is mainly used as an image display device such as a small TV or a laptop, will be described below.

1 is a plan view schematically showing a probe device of a flat panel display device according to the prior art.

2 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to the related art.

The probe device according to the prior art, as shown in Figs. 1 and 2, is provided with an adapter (by means of bolts or other fastening means 15 at the edge of the work stage, ie the probe unit base 11). 13 is installed, and the adapter 13 is provided with a plurality of main blocks 17 at regular intervals. In this case, the plurality of main blocks 17 are fixed to the adapter 13 by bolts or other fastening means (not shown).

Here, the plurality of main blocks 17 are provided with a probe block 19 having at least one inspection tip 19a in contact with the inspection terminal 35 of the device under test 31.

In addition, the device under test 31 includes a lower plate 31a, an upper plate 31b, and a liquid crystal layer (not shown) formed therebetween, and the lower plate 31a has a plurality of gate lines 33 and data. Lines (not shown) are vertically intersected, and ends of the plurality of gate lines 33 and data lines (not shown) are connected to the test terminal 35, respectively.

1 and 2, the probe apparatus according to the prior art has a main block (main block) so that the state of the device under inspection 31 is inspected before the device under inspection 31 is mounted. A plurality of test tips 19a provided in the probe block 19 of 17) are brought into contact with the test terminal 35 to test the lighting of the device under test 31.

The lighting test method of the device under test will be described with reference to FIG. 3 as follows.

3 is a flowchart schematically illustrating a process of inspecting a defect of a flat panel display device using a probe device of a flat panel display device according to the related art.

Referring to FIG. 3, first, an adapter (13 of FIG. 1) for an inspected element (not shown; 31 of FIG. 1) for inspecting a defect is prepared and transported.

Then, after disassembling the adapter installed in the probe unit base (11 in Fig. 1), the new adapter carried is mounted. At this time, the adapter is provided with a plurality of main blocks (not shown; 17 in FIG. 1), and the main block has a plurality of inspection tips (not shown; 19a in FIG. 2). 1) 19) is provided.

Then, after loading the device under test into the probe unit base (11 in FIG. 1), the loading position is adjusted to a predetermined level corresponding to the position of the probe block of the main block.

Subsequently, the main block position and the probe block provided in the main block are precisely aligned according to the position of the new device under test.

Then, a plurality of inspection tips 19a provided in the probe block (19 of FIG. 2) are brought into contact with the plurality of inspection terminals (35 of FIG. 2) of the device under test, so that the device under inspection (31 of FIG. 1) is defective. Check for presence

As described above, the probe device according to the prior art has the following problems.

The probe apparatus according to the prior art needs to disassemble the main block and reassemble it in a proper position when the position of the main block needs to be changed, that is, when the position of the main block that is already set is changed due to the change of the size of the device under test. There was a problem.

In addition, the probe device according to the prior art cannot use the same test tip when the device under test, i.e., the pad specifications (i.e., the number of blocks, the interval, etc.) are different for each panel.

In addition, the probe device according to the prior art should be mounted after replacing the entire main block when a panel having different pad specifications is loaded.

In addition, the probe device according to the prior art requires a precise machining within the tolerance range when manufacturing the main block, the manufacturing cost increases.

On the other hand, the probe device according to the prior art has a narrow space at the time of carrying the adapter for the replacement operation of the device to be inspected, the weight is large, there is a risk of accidents.

In addition, the probe device according to the prior art increases the amount of work and work time due to the removal / attachment of the adapter, the risk of component damage due to frequent replacement.

Accordingly, the present invention has been made to solve the above problems of the prior art, the object of the present invention is easy to adjust the position of the main blocks provided in the probe device probe device that can be appropriately applied to various pad spacing specifications and It provides an inspection method using the same.

In addition, another object of the present invention is to provide a probe device and an inspection method using the same, which can quickly and easily carry out the lighting inspection of panels having various specifications by changing the structure of the probe device to change the position of the main block.

Probe device according to the present invention for achieving the above object is a probe unit base on which the device under test is seated and the adapter is mounted; A plurality of main blocks disposed on the adapter and moved back and forth independently of each other to vary positions; And a probe block installed at each of the plurality of main blocks and provided with a plurality of inspection tips for contacting the device under test and inspecting whether the device under test is defective.

An inspection method using a probe device according to the present invention for achieving the above object comprises the steps of preparing a device to be inspected for inspecting for defects; Moving the main block by loading a recipe file storing a moving position of the main block; Aligning a probe block installed in the main block at a position of the automatically moved main block and having a plurality of inspection tips; Loading the device under test into a probe unit base; Moving the probe block to contact a plurality of test tips provided in the probe block with a test terminal provided in the device under test; And inspecting whether the device under test is defective by driving the device under test while the plurality of test tips provided in the probe block are in contact with the test terminal provided in the device under test. It is characterized by.

As described above, according to the probe apparatus and the inspection method using the same according to the present invention has the following effects.

The probe device and the inspection method using the same according to the present invention do not need to carry out work such as transportation / preliminary preparation of parts generated during the replacement of the existing model, and do not need to remove / attach the adapter in the probe unit base.

In addition, the probe device and the inspection method using the same according to the present invention can be easily applied to various pad spacing specifications because the position of the main blocks installed in the probe device can be easily adjusted.

In addition, the probe device and the inspection method using the same according to the present invention can easily and quickly proceed the lighting inspection of the panel having various specifications by changing the structure of the probe device to change the position of the main block.

In addition, the probe apparatus and the inspection method using the same according to the present invention can reduce the model replacement work time and the amount of work, and can reduce the risk of accidents due to the transport of the adapter to prepare the probe unit base replacement as in the past.

Hereinafter, a probe device and an inspection method using the same according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.

4 is a plan view schematically showing a probe device of a flat panel display device according to the present invention, and is a plan view showing a case of a probe device applied to a large flat panel display device.

5 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the present invention.

As shown in FIGS. 4 and 5, the probe device according to the present invention includes a plurality of adapters 103 and a plurality of probes mounted on the adapters 103 so as to be movable along the longitudinal direction of the adapters 103. It includes a main block 111 and a plurality of probe blocks 113 installed on each of the plurality of main blocks 111 and provided with a plurality of inspection tips 113a.

Here, the probe unit base 101 is formed to a maximum size in accordance with the size of the device under test, that is, the corresponding panel.

In addition, the main block 111 is mounted to the adapter 103 as a part for fixing the probe block 113 for applying a signal to the device under test 131.

In addition, the main block 111 is precisely driven by a drive control means such as a linear motor (see 121 in FIG. 7) to move according to the position of the test terminal 135 (that is, the pad) of the device under test 131. Controlled.

At this time, the position of the main block 111 is designed to register automatically as a recipe (recipe) according to the model of the device under test (131), to be automatically moved to the corresponding position.

In addition, the linear motor 121 should be a level that can satisfy the accuracy of up to ± 14μm.

The plurality of main blocks 111 are disposed to be spaced apart by a predetermined interval so as to be movable without being interfered with each other, and are seated on each of the plurality of movement guides 105 mounted to be spaced apart from the adapter 103, and the linear motor By the operation of the drive control means such as is moved in the front and rear direction on the movement guide 105. At this time, the movement guide 105 minimizes the occurrence of play due to the operation of the main block 111.

In addition, as illustrated in FIG. 5, the plurality of main blocks 111 may include a probe block 113 having at least one test tip 113a connected to the test terminal 135 of the device under test 131. It is provided.

The device under test 131 includes a lower plate 131a, an upper plate 131b, and a liquid crystal layer (not shown) formed therebetween, and the lower plate 131a includes a plurality of gate lines 133 and a date. Lines (not shown) are vertically intersected, and ends of the plurality of gate lines 133 and data lines (not shown) are respectively connected to the test terminal 135. In this case, the device under test 131 may be applied to a flat panel display device including a PDP and an organic EL, as well as other display devices, in addition to the LCD.

In addition, the probe block 113 provided with the plurality of inspection tips 113a is installed in the main block 111, and is detachable / attached, and configured to be replaced when necessary.

As illustrated in FIG. 5, the probe device according to the present invention includes the plurality of test tips 113a provided on the probe block 113 of the main block 111, and the device to be inspected. The inspection terminal 135 of (131) is brought into contact with each other to inspect the lighting of the inspected device 131 and inspect whether the inspected device 131 is defective.

Meanwhile, a case in which the probe device according to the present invention is applied to a device under test of another specification (for example, a small size) of FIG. 4 will be described with reference to FIG. 6.

6 is a plan view schematically illustrating a probe device of a flat panel display device according to the present invention, and is a plan view illustrating a probe device applied to a small flat panel display device.

As shown in FIG. 6, the probe device according to the present invention has the same structure as that of the probe device applied to FIG. 4, and the device to be inspected applies a device having a smaller size than that of the device to be inspected applied to FIG. 4.

As shown in FIG. 6, since the width between the gate lines is narrow and the distance between the pads is narrow in the case of a small device under test, the corresponding inter-block distance between the probe blocks should be narrower than in the case of FIG. 4.

Accordingly, the main block 111 is moved by loading a recipe file storing the moving position of the main block 111 in order to move the main block 111 in correspondence with the small sized device under test. .

The inspection tip 113a of the probe block 113 mounted on the automatically moved main block 111 is aligned to the position of the inspection terminal 135 of the device under test 131 to perform a defect inspection.

As a result, a work such as transporting parts or preparing the parts, which are generated when the model of the inspection device is replaced, becomes unnecessary as in the past, and an adapter detachment / attachment process in the probe unit base is unnecessary.

Meanwhile, referring to FIGS. 7 and 8, an embodiment of a coupling structure of a main block that automatically adjusts the position of the main block in order to inspect a device for defects when replacing a model as described above will be described below. same.

7 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to an exemplary embodiment of the present invention, in which a main block of the probe device is changed in position by driving a linear motor on a movement guide.

FIG. 8 is a cross-sectional view taken along the line VII-VII of FIG. 7, illustrating a coupling structure of the main block with the movement guide.

As illustrated in FIG. 7, a movable member 125 that is movable back and forth is inserted into the bottom groove 105a formed on the inner surface of the movable guide 105, and the main block 111 is installed in the movable member 125. The fastening means 129, such as a bolt or a fastening screw, is fixed to the coupling member is configured to move in accordance with the front and rear movement of the moving member (125).

In addition, as shown in FIG. 8, guide grooves 111a are formed at both lower sides of the main block 111 so that side surfaces of the movement guide 105 are inserted into the guide grooves 111a to allow the main grooves to be inserted into the main block 111. The block 111 is moved back and forth on the movement guide 105 without leaving the outside.

At this time, the moving member 125 to which the main block 111 is fixedly coupled is connected to the linear motor 121 through the connector 123 so that the moving member 125 is moved by the driving of the linear motor 121. The position of the main block 111 is changed by moving back and forth within 105.

On the other hand, as another embodiment, the movement guide and the air floating device is mounted together on the linear motor 121 itself may serve as a movement guide and a drive source at the same time.

In addition, as another embodiment, it is also possible to control the forward and backward movement of the movement guide by using an acylinder that is connected and operated like a pump instead of the linear motor.

Therefore, even if the position of the main block 111 is not changed by manual operation, the recipe storing the moving position of the main block 111 to correspond to the device under test of various specifications through the driving of the linear motor 151. You can create a file.

Thus, by driving the linear motor 151, the recipe file corresponding to the device under test of a desired specification can be loaded and the main block 111 can be accurately moved to a predetermined position so that the lighting test of the device under test can be easily and quickly performed. have.

Also, with reference to Figs. 9 and 10 for another embodiment of the coupling structure of the main block that automatically adjusts the position of the main block in order to check the defect of the device when the model is replaced as described above. Is as follows.

FIG. 9 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to another exemplary embodiment, wherein the probe block is changed by driving of a forward and reverse motor on a guide belt. Referring to FIG.

FIG. 10 is a cross-sectional view taken along the line VII-VII of FIG. 9, illustrating a coupling structure of the probe block with the guide belt.

As shown in FIG. 9, first and second pulleys 221 and 223 are provided at predetermined intervals, respectively, and the first pulley 221 is connected with a forward and reverse rotation motor 251 and the first and second pulleys 221. A guide belt 205 is mounted on the outer side of the two pulleys 221 and 223 to move forward and backward by a predetermined distance between the first and second pulleys 221 and 223 according to the driving of the forward and reverse rotation motor 251. Consists of. At this time, since the forward and reverse motor 251 is operated on the principle of rotating in the forward and reverse directions, the main block 211 is also guided by moving the guide belt 205 using the principle of rotation in the forward and reverse directions. As the belt 205 moves, it moves forward and backward.

Here, the main block 211 is coupled to the guide belt 205 by a fastening means 229 such as a bolt or a fastening screw to be movable together with the movement of the guide belt 205.

At this time, the guide belt 205 is inserted into and fixed in the guide groove 211a formed on the lower surface of the main block 211, as shown in Figure 10, the main block 211 is not separated to the outside of the guide It is moved by the desired position on the belt 205.

On the other hand, although not shown in the drawings, as another embodiment of the forward and reverse motor, the position of the main block precisely through the drive system using the forward and reverse motor, the ball screw and the movement guide to enable more precise position control of the main block. You can also control it.

Therefore, even if the position of the main block 211 is not changed by manual operation as in the prior art, in order to move the main block 211 to correspond to the device under inspection of various specifications through the driving of the reverse rotation motor 151 described above. A recipe file storing the moving position of the main block 211 can be made.

Thus, by driving the forward and reverse motor 251, the recipe file corresponding to the device under test of the desired specification can be loaded and the main block 211 can be moved accurately to a predetermined position. Can be.

The lighting inspection method of the device under test will be described with reference to FIG. 11 as follows.

11 is a flowchart schematically illustrating a process of inspecting whether a flat panel display device is defective by using the probe device of the flat panel display device according to the present invention.

Here, a case in which the position of the main block is adjusted by using the linear motor according to the embodiment of the present invention will be described.

Referring to FIG. 11, first, a device under test (not shown) 131 of FIG. 4 is prepared to inspect a defect.

Next, a recipe file which stores the moving position of the main block 111 in FIG. 4 is loaded to move the main block 111 in FIG. At this time, the main block 111 of FIG. 4 is moved by a desired position on the movement guide 105 by the movable member 125 which is moved according to the operation of the linear motor 151 of FIG.

Subsequently, at the position of the automatically moved main block (111 in FIG. 4), the probe block 113 mounted on the main block (111 in FIG. 4) and provided with a plurality of inspection tips 113a is accurately aligned.

Then, after loading the panel under test (131 of FIG. 4) into the probe unit base 101, the probe block 113 is moved and the plurality of test tips 113a provided in the probe block 113 are moved. The test terminal (135 in FIG. 5) provided on the panel (131 in FIG. 4), which is the device under test, is brought into contact with the pad.

Thereafter, the plurality of inspection tips 113a provided in the probe block 113 are in contact with the inspection terminal (135 of FIG. 5) provided in the panel (131 of FIG. 4), which is the device to be inspected. The panel (131 in FIG. 4) is driven to test whether the panel is defective.

On the other hand, while described above with reference to a preferred embodiment of the present invention, those skilled in the art various modifications of the present invention without departing from the spirit and scope of the invention described in the claims below And can be changed.

1 is a plan view schematically showing a probe device of a flat panel display device according to the prior art.

Figure 2 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the prior art.

3 is a flowchart schematically illustrating a process of inspecting whether a flat panel display device is defective by using a probe device of a flat panel display device according to the related art.

Figure 4 is a plan view schematically showing a probe device of a flat panel display device according to the present invention, a plan view showing a case of a probe device applied to a large flat panel display device.

5 is an enlarged plan view schematically showing a probe device of a flat panel display device according to the present invention;

6 is a plan view schematically illustrating a probe device of a flat panel display device according to the present invention, and a plan view of a probe device applied to a small flat panel display device.

7 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to the present invention, wherein the main block of the probe device is changed in position by driving a linear motor on a movement guide;

FIG. 8 is a cross-sectional view taken along the line VII-VII of FIG. 7, illustrating a coupling structure of the main block with the movement guide. FIG.

FIG. 9 is an enlarged plan view schematically illustrating a probe device of a flat panel display device according to another exemplary embodiment of the present invention, wherein the main block is changed by driving of a forward and reverse motor on a guide belt; FIG.

10 is a cross-sectional view taken along the line VII-VII of FIG. 9, in which the main block is coupled to the guide belt.

11 is a flow chart schematically showing a process of inspecting whether a flat panel display device is defective by using the probe device of the flat panel display device according to the present invention.

-Code description of main parts of drawing-

101: probe unit base 103: adapter

105: movement guide 111: main block

113: probe block 113a: inspection tip

121: linear motor 123: connector

125: moving member 129: fastening means

131: device under test 131a: lower plate

131b: top plate 133: gate line

135: test terminal (pad)

Claims (10)

A probe unit base on which the device under test is seated and an adapter is mounted; A plurality of main blocks disposed on the adapter, the plurality of main blocks being moved back and forth independently of each other to vary positions; And And a probe block installed on each of the plurality of main blocks and provided with a plurality of inspection tips for contacting the device under test and inspecting whether the device under test is defective. The probe apparatus of claim 1, wherein each of the plurality of main blocks is moved back and forth on the plurality of movement guides disposed at predetermined intervals on the adapter. 3. The probe apparatus according to claim 2, wherein a moving member which is moved back and forth in accordance with the driving of the linear drive motor is mounted in the moving guide. The probe apparatus of claim 1, wherein each of the plurality of main blocks is moved back and forth on a plurality of guide belts arranged at predetermined intervals on the adapter. The probe apparatus of claim 4, wherein the front and rear movement of the guide belt is performed by driving a forward and reverse rotation motor. Preparing an inspected device for inspecting for defects; Moving the main block by loading a recipe file storing a moving position of the main block; Aligning a probe block mounted to the main block at the position of the automatically moved main block and having a plurality of inspection tips; Loading the device under test into a probe unit base; Moving the probe block to contact a plurality of test tips provided in the probe block with a test terminal provided in the device under test; And And inspecting whether the device under test is defective by driving the device under test while the plurality of test tips provided in the probe block are in contact with the test terminal provided in the device under test. Inspection method using a probe device characterized in that. The test method according to claim 6, wherein each of the plurality of main blocks is moved back and forth on the plurality of movement guides arranged at a predetermined interval with the adapter disposed on the probe unit base. 8. The inspection method using a probe device according to claim 7, wherein the movement guide is provided with a moving member which is moved back and forth in accordance with the drive of the linear drive motor. The method according to claim 6, wherein each of the plurality of main blocks is moved back and forth on the plurality of guide belts arranged at predetermined intervals on the adapter. 10. The inspection method according to claim 9, wherein the front and rear movement of the guide belt is performed by driving a forward and reverse rotation motor.
KR1020070070285A 2007-07-12 2007-07-12 Probe unit and method for detecting device using the same KR20090006688A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020070070285A KR20090006688A (en) 2007-07-12 2007-07-12 Probe unit and method for detecting device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020070070285A KR20090006688A (en) 2007-07-12 2007-07-12 Probe unit and method for detecting device using the same

Publications (1)

Publication Number Publication Date
KR20090006688A true KR20090006688A (en) 2009-01-15

Family

ID=40487862

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070070285A KR20090006688A (en) 2007-07-12 2007-07-12 Probe unit and method for detecting device using the same

Country Status (1)

Country Link
KR (1) KR20090006688A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102654656A (en) * 2011-04-21 2012-09-05 京东方科技集团股份有限公司 Detecting device and working method thereof
WO2017181755A1 (en) * 2016-04-19 2017-10-26 京东方科技集团股份有限公司 Adjustment device for lighting test and lighting test device
CN111968556A (en) * 2020-08-28 2020-11-20 合肥维信诺科技有限公司 Detection apparatus for display panel

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102654656A (en) * 2011-04-21 2012-09-05 京东方科技集团股份有限公司 Detecting device and working method thereof
CN102654656B (en) * 2011-04-21 2015-01-07 京东方科技集团股份有限公司 Detecting device and working method thereof
US9136088B2 (en) 2011-04-21 2015-09-15 Boe Technology Group Co., Ltd. Detection apparatus and operating method
WO2017181755A1 (en) * 2016-04-19 2017-10-26 京东方科技集团股份有限公司 Adjustment device for lighting test and lighting test device
US20180068601A1 (en) * 2016-04-19 2018-03-08 Boe Technology Group Co., Ltd. Adjustment device for light-on testing and light-on testing device
US10565910B2 (en) 2016-04-19 2020-02-18 Boe Technology Group Co., Ltd. Adjustment device for light-on testing and light-on testing device
CN111968556A (en) * 2020-08-28 2020-11-20 合肥维信诺科技有限公司 Detection apparatus for display panel

Similar Documents

Publication Publication Date Title
KR101616564B1 (en) Probe Mobile Apparatus
KR101115874B1 (en) Apparatus for testing array
TWI401427B (en) Support for all size panel of worktable usingtesting device for display panel
KR101191343B1 (en) Array test apparatus
CN106873195B (en) Probe unit replacing device
KR101036112B1 (en) Apparatus for array test with auto changing unit of probe bar
KR20160035726A (en) Test Apparatus of Liquid Crystal Display Panel and Control Method Thereof
KR101035570B1 (en) Apparatus for changing automatic probe unit for lcd checking device
KR100732344B1 (en) Rotation inspecting apparatus of flat panel display
KR101286250B1 (en) Array test apparatus having multiple head unit
CN101299125B (en) Array tester
KR101588856B1 (en) Probe Unit Centering Apparatus of Liquid Crystal Display Panel Examination Apparatus
KR20080074560A (en) Array tester
KR20090006688A (en) Probe unit and method for detecting device using the same
KR100740010B1 (en) Inspecting system of flat panel display
JP2010014552A (en) Array test apparatus
KR20070117188A (en) Apparatus and method for inspection of display panel
KR20130056541A (en) Array test apparatus
KR101354956B1 (en) Cleaner for probe unit
KR101017626B1 (en) Alignment stage for lcd tester
KR100731308B1 (en) A support for all sizes panel of worktable using testing device for LCD
CN211207005U (en) Universal lighting fixture
KR100599489B1 (en) A transfer­robot for LCD inspecting line
KR101607089B1 (en) Cell Mounting Device of Liquid Crystal Display Panel Examination Apparatus
KR100352384B1 (en) Inspecting System for Liquid Crystal Display

Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination