KR102364376B1 - Laser marking system with inspection and repair functions - Google Patents

Abstract

A laser marking system having an inspection and repair function is provided. A laser beam is emitted and a marking unit for marking a specific pattern on the object; and an image acquisition unit for acquiring a marking image of the marked object through the marking unit; And by comparing and analyzing the marking image of the object acquired through the image acquisition unit to determine whether the normal and abnormal marking, if the marking image of the object is abnormal marking, by forming reprocessing data to form the reprocessing data in the marking unit and a processing unit providing and a stage unit on which the object is disposed and on which the laser beam emitted through the laser generating unit is incident, and the beam splitter is, on the path of the laser beam emitted from the laser generating unit It is positioned so that the laser beam is reflected, the light of the image of the object incident from the stage is characterized in that it transmits, a laser marking system can be provided.

Description

LASER MARKING SYSTEM WITH INSPECTION AND REPAIR FUNCTIONS

The present invention relates to a laser marking system for marking characters, patterns, etc. on the surface of an object.

The laser marking system refers to a system that marks a product production number, model name, character or pattern by irradiating a laser beam on the surface of an object. Marking objects may include semiconductor wafers, plastics, steel, wood, and the like.

As an example of a conventional laser marking system, Korean Patent Registration No. 10-1245804 (registered on March 14, 2013) is known. This prior art is configured to determine whether the quality of the marking is defective by allowing the laser marking and the reading of the marking image to be performed together.

However, in the prior art, it is possible to determine whether a defect is present, but it is cumbersome in handling after the defect determination. That is, when a marking defect occurs, the user can recognize it through an alarm, etc., but there is no separate means or method for handling the defective product. Therefore, after the marking process is completed, the product is sorted and discarded, or the method of re-processing it by putting it back into the line according to the degree of defect is being used. This is quite inefficient in terms of consumption of raw materials or productivity.

In addition, the prior art uses a reading vision to determine whether there is a defect. Here, an image captured by the reading vision may be easily distorted and thus measurement precision may be lowered. Furthermore, in the image taken using the vision camera, the resolution of the image may be lowered because the focal length between the vision camera and each area (point) is different, and the illuminance may vary depending on the location of the light source, which may cause errors.

Meanwhile, the present prior art uses a method in which a laser beam passes through a beam splitter. In this case, an error in the marking position may occur due to the thickness of the beam splitter. That is, the laser beam incident on one surface of the beam splitter is refracted on one surface (incident surface) and the opposite surface (transmissive surface) according to the difference in refractive index between the atmosphere and the beam splitter material. Some deviation will occur in the position coming out through. Therefore, the marking may be made at a position slightly shifted from the initially set position. Although this is a minute error, it may cause deterioration or defects in the marking quality when marking parts with a small marking surface or small-sized characters.

Registered Patent No. 10-1245804 (Registered on March 14, 2013)

An object of the present invention is to provide a laser marking system capable of real-time inspection and reprocessing when laser marking an object.

According to an aspect of the present invention, a laser beam is emitted and a marking unit for marking a specific pattern on an object; and an image acquisition unit for obtaining a marking image of the marked object through the marking unit; And by comparing and analyzing the marking image of the object acquired through the image acquisition unit to determine whether the normal and abnormal marking, if the marking image of the object is abnormal marking, by forming reprocessing data to form the reprocessing data in the marking unit and a processing unit providing and a stage unit on which the object is disposed and on which the laser beam emitted through the laser generating unit is incident, and the beam splitter is, on the path of the laser beam emitted from the laser generating unit It is positioned so that the laser beam is reflected, the light of the image of the object incident from the stage is characterized in that it transmits, a laser marking system can be provided.

The laser marking system according to the embodiments of the present invention is formed such that a laser beam for marking an object does not pass through the beam splitter, but only passes through a reflected path. Accordingly, the error of the marking position due to transmission and refraction may be reduced.

In addition, the laser marking system according to embodiments of the present invention, along with the marking of the object, shooting and analysis of the marked image, correction and reprocessing according to the analysis result can be made at once. Accordingly, since there is no need for a separate reprocessing, work convenience can be improved, and it can also contribute to efficient use of raw materials or shortening of process time.

1 is a schematic diagram of a laser marking system according to an embodiment of the present invention.
FIG. 2 is a schematic diagram of a marking unit and an image acquisition unit of the laser marking system shown in FIG. 1 .
Figure 3 illustrates a marking image of an object in the process of being reprocessed according to the laser marking system shown in Figure 1.
4 is a flowchart illustrating an operation sequence of the laser marking system shown in FIG. 1 .

Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be noted that the following examples are provided to help the understanding of the present invention, and the scope of the present invention is not limited to the following examples. The following embodiments are provided to more completely explain the present invention to those with average knowledge in the relevant technical field, and detailed descriptions for known configurations that may unnecessarily obscure the technical gist of the present invention to be omitted.

1 is a schematic diagram of a laser marking system according to an embodiment of the present invention.

Referring to FIG. 1, the laser marking system 100 of this embodiment is a marking unit 110 for marking an object 10 by emitting a laser beam, and an image acquisition unit 120 for obtaining a marking image from the object 10 and a processing unit 130 capable of analyzing and reprocessing the acquired image.

The laser marking system 100 of this embodiment forms the marking unit 110, the image acquisition unit 120, and the processing unit 130 integrally, and simultaneously marks the laser on the object 10 and the image from the image acquisition unit 120 , and the captured image may be analyzed in the processing unit 130 . Therefore, by checking the process of marking on the object 10 in real time, it is possible to take immediate action when a defect occurs. In addition, since it is integrally formed, the working time can be shortened.

Each of the above components will be described in more detail as follows.

FIG. 2 is a schematic diagram of a marking unit and an image acquisition unit of the laser marking system shown in FIG. 1 .

Referring to FIG. 2 , the laser marking system 100 of this embodiment may include a marking unit 110 .

The marking unit 110 is configured to mark a marking image in a specific pattern on the object 10 . The marking unit 110 is the laser generating unit 111 from which the laser beam is emitted, the beam splitter 112 to which the emitted laser beam is reflected, and the angle of the laser beam reflected from the beam splitter 112 to the object 10 direction. A scanner 113 for refracting, a lens unit 114 for focusing the laser beam, a stage unit 115 on which the laser beam is irradiated and the object 10 is seated, and an illumination unit 116 for illuminating the object 10 may include

The laser generator 111 is formed in a structure in which a laser beam is generated and emitted to a beam splitter 112 to be described later. The laser generator 111 may be configured in one or a plurality of pieces. Preferably, the laser generator 111 may be disposed on the upper end of the beam splitter 112 so that the laser beam is emitted downward.

The beam splitter 112 may refract the laser emitted from the laser generator 111 toward a scanner 113 to be described later. In addition, the beam splitter 112 may transmit the light incident from the object 10 toward the image acquisition unit 120 to be described later. That is, the beam splitter 112 may be disposed on the path of the laser generator 111 and the image acquisition unit 120 to reflect the laser beam and transmit the light captured from the object 10 . .

To elaborate on the above, the conventional beam splitter transmits the laser beam and reflects the light of the marking image, so that a certain degree of error has been generated when the laser beam reaches the object. That is, due to the difference in refractive index proportional to the thickness of the beam splitter, a partial deviation occurs between the incident position and the transmitted position of the laser beam. On the other hand, the beam splitter 112 according to the present embodiment, on the contrary, reflects the laser beam and transmits the light of the marking image, thereby reducing the error of the marking position through the laser beam. That is, since the laser beam is reflected without passing through the beam splitter 112, an error in a marking position due to transmission and refraction can be reduced.

Meanwhile, the scanner 113 may be disposed on the side of the beam splitter 112 . The scanner 113 may have a predetermined space therein, and may include a plurality of mirrors 113 - 1 inside. The scanner 113 may reflect the laser beam reflected through the beam splitter 112 through the plurality of mirrors 113 - 1 to cause the lens unit 114 to be described later to sail out. Here, if necessary, each of the mirrors 113 - 1 may be rotated so that the laser beam may be emitted to the reference data position indicated by the reference data generating unit 131 .

The lens unit 114 may be disposed below the scanner 113 . The laser beam passing through the lens unit 114 may be focused through a stage unit 115 to be described later, and may mark a predetermined character, pattern, image, etc. on the object 10 . As the lens unit 114 in this embodiment, a known F-θ lens may be used.

The stage unit 115 may be formed as a planar space in which the upper part of the object 10 is disposed. A lighting unit 116 to be described later may be disposed around the stage unit 115 . If necessary, a groove or a protrusion for guiding the arrangement position of the object 10 may be formed in the stage unit 115 . In the stage unit 115 , a focused laser beam is incident through the lens unit 114 , and marking may be performed on the object 10 .

The illumination unit 116 may illuminate the object 10 disposed on the stage unit 115 to obtain a clear image. The lighting unit 116 may be disposed on the upper side of the stage unit 115 to illuminate the lower stage unit 115 or the object 10 disposed thereon.

Preferably, the lighting unit 116 may be formed to extend along the edge or circumference of the stage unit 115 , or a plurality of lighting units 116 may be disposed along the edge or circumference of the stage unit 115 . In the present embodiment, a case in which the plurality of linear lighting units 116 are disposed along the edge of the stage unit 115 is exemplified. In addition, the lighting unit 116 may be formed to illuminate in a downward direction toward the center of the stage unit 115 from the edge or periphery of the stage unit 115 . This makes it possible to illuminate the entire upper surface of the stage unit 115 with a more uniform illuminance to obtain a clearer image. Also, image distortion or error due to illuminance deviation may be reduced.

To elaborate on the above, in a conventional general case, the stage part is illuminated through a single light disposed on the upper side. This is due to the limited position of the illumination due to the lens unit disposed directly above the stage unit. However, in this case, a slight deviation may occur in the brightness of the object disposed on the stage due to the lighting position, and depending on some use environments, a shadow of the object is generated, thereby causing distortion or error in the photographed image. The arrangement of the lighting unit 116 of the present embodiment is based on these conventional problems, and while it can be implemented relatively simply and at low cost, it can effectively function to improve the quality of a photographed image.

Meanwhile, the laser marking system 100 of this embodiment may include an image acquisition unit 120 .

The image acquisition unit 120 may be disposed on the side of the marking unit 110 , and may capture the object 10 marked by the marking unit 110 . The marking image captured by the image acquisition unit 120 may be transmitted to the processing unit 130 and used for analysis. The image acquisition unit 120 may include a color filter 121 , an aperture 122 , a variable lens 123 , and a vision camera 124 .

The color filter 121 may extract light of a specific wavelength band from the marking image. That is, a marking image of the object 10 may be incident through the lens unit 114 by emitting light of a specific wavelength band that reacts according to the material of the object 10 through the lighting unit 116 . The incident marking image may be reflected to the beam splitter 112 through the scanner 113 , and may pass through the beam splitter 112 to be incident on the color filter 121 . Here, the color filter 121 may extract light of a specific wavelength band from the marking image, and the extracted light may be incident to an aperture 122 to be described later. The aperture 122 may adjust the amount of light of the incident marking image.

The variable lens 123 may adjust the focal length of the marking image in which the amount of light is adjusted through the aperture 122 . Preferably, the variable lens 123 may include an auto-focusing motor 123-1. In this case, the focus of the marking image may be automatically focused by the auto-focusing motor 123-1, and clear and clear imaging is possible.

To elaborate on the above, in the case of the conventional laser marking system 100, an auto-focusing device is not provided, so there is a problem in that distortion occurs when capturing an image of a marking object. However, the laser marking system 100 according to an embodiment of the present invention can prevent image distortion when capturing an image of the object 10 by mounting the auto-focusing motor 123-1 on the variable lens 123. there is.

Meanwhile, the vision camera 124 may capture a focused marking image through the variable lens 123 . The vision camera 124 may serve to capture and transmit a marking image of the object 10 . More specifically, the image of the object 10 captured by the vision camera 124 is transmitted to the image analysis unit 132 of the processing unit 130, so that the analysis of the marking image of the object 10 can be performed.

On the other hand, referring back to FIG. 1 , the laser marking system 100 of this embodiment may include a processing unit 130 .

The processing unit 130 may receive the reference data transmission and the marked image on the object 10 to the marking unit 110 , and transmit the analysis and reprocessing data back to the marking unit 110 . In more detail, the processing unit 130 includes a reference data generation unit 131 that transmits reference data to the marking unit 110, and an image analysis unit 132 that compares and analyzes the marking image of the object 10 with the reference data. and a reprocessing data generation unit 133 for generating and transmitting data for reprocessing to the marking unit 110 when a marking defect occurs on the object 10 .

The reference data generation unit 131 may transmit a specific pattern desired to be marked to the marking unit 110 in a step before the marking unit 110 marks. The specific pattern will be referred to as reference data. For example, the reference data generation unit 131 may transmit images such as pictures and photos and reference data such as text to the marking unit 110 . The marking unit 110 receiving the reference data from the reference data generating unit 131 may mark the reference data on the object 10 . The marked object 10 may acquire an image from the image acquisition unit 120 , and the acquired marking image may be transmitted to an image analysis unit 132 to be described later.

The image analysis unit 132 may compare and analyze the marking image acquired by the image acquisition unit 120 with reference data transmitted from the reference data generation unit 131 . That is, the image analysis unit 132 may determine whether normal or abnormal marking by comparing the reference data and the actual marking image. Through this, the image analysis unit 132 may check whether the object 10 is marked in the same way as the reference data or whether there is a part requiring reprocessing of the object 10 .

The reprocessing data generation unit 133 may generate data for reprocessing when it is determined that there is a portion requiring reprocessing because the marking image is marked abnormally through the image analysis unit 132 . The reprocessing data generated by the reprocessing data generating unit 133 may be transmitted to the marking unit 110 so that the reprocessing may be performed only on the portion requiring reprocessing in the marking image. Therefore, if a defect occurs during the marking process, it is possible to immediately reprocess. In addition, since the determination of whether there is a defect and partial reprocessing are performed during the processing process, it is possible to recycle the object 10 in which the marking defect has occurred without discarding it.

Figure 3 illustrates a marking image of an object in the process of being reprocessed according to the laser marking system shown in Figure 1.

Figure 3 (a) shows the reference data for processing on the object, Figure 3 (b) shows the screen inspected after marking the object. Figure 3 (c) shows the reprocessing data for reprocessing the object. Figure 3 (d) shows the object after the reprocessing is completed.

Referring to FIG. 3 , as shown in FIG. 3A , the reference data is transmitted to the marking unit 110 to instruct the object 10 to be marked. After marking the object 10 , the image acquired by the image acquisition unit 120 is analyzed by the image analysis unit 132 .

As shown in (b) of FIG. 3 , when a defective marking in which a part is missing is observed on the object 10 , the reprocessing data generating unit 133 extracts the unmarked part by comparing it with reference data to generate reprocessing data.

As shown in (c) of FIG. 3 , the reprocessing data generation unit 133 generates data requiring reprocessing due to partial omission of marking by comparing it with the reference data. The generated reprocessing data is transmitted to the marking unit 110 . The marking unit 110 receiving the reprocessing data reprocesses the shape of the reprocessing data on the object 10 marked as defective.

As shown in (d) of FIG. 3 , after reprocessing, the result of analyzing the image acquired by the image acquisition unit 120 by the image analysis unit 132 is checked. At this time, if the marking is the same as the reference data as shown in FIG. 3 (a), it is confirmed as normal marking and the marking of the object 10 is terminated. However, if it is determined again as defective marking, the above process may be repeated.

As such, in the prior art, when a marking defect occurs on the object 10, the object 10 marked with a defect is discarded or the object 10 is separately moved and reprocessed. Based on these conventional problems, the laser marking system 100 according to an embodiment of the present invention analyzes the marking process in real time without adding a separate device and process, and immediately reprocesses the defectively marked object 10 . can do. In addition, if reprocessing is performed on the object 10 marked badly in the same way as the reference data shape without generating reprocessing data, multiple marked portions may be peeled off or damaged. However, in the case of the present invention, since reprocessing data is separately generated and only the unmarked portion is reprocessed without multiple marking, reprocessing is possible without additional damage to the object 10 .

4 is a flowchart illustrating an operation sequence of the laser marking system shown in FIG. 1 .

Referring to FIG. 4 , an operation process of the laser marking system 100 will be described as follows.

First, the object 10 is mounted on the stage unit 115 (S-1). Then, before marking the reference data on the object 10, the marking position is inspected (S-2). At this time, if the marking position is not correct, the marking position is adjusted (S-21). After adjusting the marking position, the marking position is checked again (S-2). At this time, if the marking position is correctly placed, the marking starts and the marking is completed (S-3).

After marking, the image acquisition unit 120 acquires a marking image (S-4). In the image analysis unit 132, the position of the reference data and the acquired marking image is compared, and the quality is analyzed (S-5). At this time, if there is an error in the marking image, the error location and shape are analyzed (S-51). In addition, reprocessing is performed on the object 10 according to the data generated by the reprocessing data generating unit 133 according to the error location and shape (S-52). When the re-processing is completed, the position of the reference data and the marking image is compared again, and the quality is analyzed (S-5). When the marking of the object 10 is completed identically to the reference data, the marking process of the laser marking system 100 is completed.

As described above, the laser marking system 100 according to the embodiments of the present invention is formed so that the laser beam for marking the object 10 passes through only a reflected path without passing through the beam splitter 112 . do. Accordingly, the error of the marking position according to transmission and refraction can be reduced.

In addition, the laser marking system 100 according to embodiments of the present invention is characterized in that the marking device and the image analysis device are integrally formed, so that the marking process of the object 10 and the marked image can be analyzed at once. there is.

In addition, the laser marking system 100 according to the embodiments of the present invention, along with the marking on the object 10, shooting and analysis of the marked image, correction and reprocessing according to the analysis result can be made at once. Accordingly, since there is no need for a separate reprocessing, work convenience can be improved, and it can also contribute to efficient use of raw materials or shortening of process time.

In the above, although embodiments of the present invention have been described, those of ordinary skill in the art can add, change, delete or add components within the scope that does not depart from the spirit of the present invention described in the claims. It will be possible to variously modify and change the present invention by, etc., which will also be included within the scope of the present invention.

10: object
100: laser marking system 110: marking unit
111: laser generator 112: beam splitter
113: scanner 114: lens unit
115: stage unit 116: lighting unit
120: image acquisition unit 121: color filter
122: aperture 123: variable lens
124: vision camera 130: processing unit
131: reference data generation unit 132: image analysis unit

Claims (5)

a marking unit 110 to which a laser beam is emitted to mark a specific pattern on the object 10;
an image acquisition unit 120 for acquiring a marking image of the object 10 marked through the marking unit 110; and
By comparing and analyzing the marking image of the object 10 acquired through the image acquisition unit 120, it is determined whether normal and abnormal marking, and if the marking image of the object 10 is abnormal marking, reprocessing data and a processing unit 130 that forms and provides the reprocessing data to the marking unit 110;
The marking unit 110,
a laser generating unit 111 for emitting a laser beam in a downward direction;
a beam splitter 112 disposed below the laser generator 111 and laterally reflecting the laser beam emitted downward through the laser generator 111;
The scanner 113 is disposed on the side of the beam splitter 112 and includes a plurality of mirrors 113-1 therein, so that the laser beam is reflected by the mirror 113-1 and guided to a reference data position. ;
a lens unit 114 disposed below the scanner 113 and focusing the incident laser beam on the stage unit 115;
a stage unit 115 on which the object 10 is disposed on the upper side and the laser beam emitted through the laser generating unit 111 is incident; and
It is disposed on the periphery of the stage part 115, is disposed in the east, west, south and north directions, respectively, and is disposed on the upper plane of the stage part 115 to illuminate the stage part 115 from the upper side. Including; lighting unit 116;
The beam splitter 112,
Positioned on the path of the laser beam emitted from the laser generator 111, the laser beam is reflected, characterized in that the light of the image of the object 10 incident from the stage 115 is transmitted , laser marking system. The method according to claim 1,
The processing unit 130,
a reference data generation unit 131 for transmitting a specific pattern desired to be marked on the object 10 to the marking unit 110;
Comparing and analyzing the marking image of the object 10 acquired through the image acquisition unit 120 with the reference data of the reference data generation unit 131 to determine whether the object 10 is marked as normal or abnormal image analysis unit 132; and
When the object 10 is marked abnormally through the image analysis unit 132, a re-processing data generation unit 133 that forms data for re-processing and transmits it to the marking unit 110; Containing, laser marking system. The method according to claim 1,
The image acquisition unit 120,
Autofocusing motor (123-1) capable of continuously autofocusing; Including further, a laser marking system that can acquire a clear and clear image of the object (10). delete In the laser marking on the object 10 using the laser marking system of claim 1,
Step in which the object 10 is mounted on the stage unit 115;
a step of inspecting the position before marking the object (10);
The step of starting and completing the marking on the object (10);
acquiring an image marked on the object 10; and
Comparing and analyzing the position and quality of the image marked on the reference data and the object 10;
The step of checking the position,
When the position of the object 10 is not suitable, the step of adjusting the position of the object 10; further comprising,
The step of analyzing the location and quality,
If the position and quality of the image marked on the object (10) is inappropriate, the error position is analyzed; and
The object 10 is reprocessed; further comprising, a marking method of a laser marking device.

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