KR102017672B1 - 상 변화를 겪는 변형 재료를 이용하여 전자 부품들을 캡슐화하기 위한 방법 및 장치 - Google Patents
상 변화를 겪는 변형 재료를 이용하여 전자 부품들을 캡슐화하기 위한 방법 및 장치 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/1701—Component parts, details or accessories; Auxiliary operations using a particular environment during moulding, e.g. moisture-free or dust-free
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
- B29C2045/14663—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame the mould cavity walls being lined with a film, e.g. release film
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C2791/00—Shaping characteristics in general
- B29C2791/004—Shaping under special conditions
- B29C2791/005—Using a particular environment, e.g. sterile fluids other than air
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/02—Transfer moulding, i.e. transferring the required volume of moulding material by a plunger from a "shot" cavity into a mould cavity
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
Abstract
Description
도 2a 및 2b는 종래 기술의 캡슐화 프로세스의 연속 단계들 동안 전자 부품들을 갖는 캐리어의 2개의 상이한 상면도들을 나타내고,
도 3은 본 발명에 따른 캐리어 상에 장착되는 전자 부품들을 캡슐화하기 위한 장치의 개략 측면도를 나타내고,
도 4a 및 4b는 본 발명에 따른 캐리어 상에 장착되는 전자 부품들을 캡슐화하기 위한 장치의 개략 측면도들을 나타내고, 여기서 장치에는 또한 필름 재료를 위한 피드(feed)가 제공되고,
도 5는 캡슐화 재료를 위한 소위 "탑 에지(top edge)" 피드를 갖는 본 발명에 따른 캡슐화 장치의 변형 실시예의 일부를 지나는 단면도를 나타낸다.
Claims (15)
- 캐리어(carrier) 상에 장착되는 전자 부품들을 캡슐화(encapsulating)하기 위한 방법으로서,
A) 캡슐화하기 위한 전자 부품을 상기 캐리어에 연결되는 몰드 캐비티(mould cavity) 내에 배치하는 공정 단계,
B) 액체 캡슐화 재료로 상기 몰드 캐비티를 충전하는 공정 단계, 및
C) 상기 몰드 캐비티 내의 상기 캡슐화 재료를 적어도 부분적으로 경화시키는 공정 단계로서, 공정 단계 B) 동안 캡슐화 재료로 상기 몰드 캐비티를 충전하기 전에 변형 재료(reduction material)가 상기 몰드 캐비티에 도입되고, 변형 재료가 공정 단계 B) 동안 상 변화(phase change)를 겪어 상기 변형 재료의 체적이 감소하고,
필름 재료는 전자 부품들을 갖는 상기 캐리어와, 상기 캐리어에 연결되는 상기 몰드 캐비티 사이에 배열되고, 상기 액체 캡슐화 재료는 상기 캐리어와 상기 필름 재료 사이에 공급되고 상기 변형 재료는 상기 필름과 상기 몰드 캐비티 사이에 보유되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 삭제
- 제 1 항에 있어서,
상기 변형 재료는 공정 단계 B)에 따라 캡슐화 재료로 상기 몰드 캐비티의 충전 중 기체상(gas phase)으로부터 응결하는(condense) 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 기체상으로 상기 몰드 캐비티에 능동적으로(actively) 운반되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 미스트(mist)로서 상기 몰드 캐비티에 능동적으로 보유되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 그것이 상기 몰드 캐비티에 능동적으로 운반될 때 액체상(liquid phase)으로 되어 있는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 그것이 상기 몰드 캐비티에 능동적으로 운반될 때 고체상(solid phase)으로 되어 있는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 H2O(물) 및 C2H5OH(에탄올)의 그룹으로부터 선택되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
부압(underpressure)이 공정 단계 B)에 따라 캡슐화 재료로 상기 몰드 캐비티의 충전 전 또는 충전 중 상기 몰드 캐비티에 가해지는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
부압(underpressure)이 상기 몰드 캐비티로의 상기 변형 재료의 도입 전 또는 도입 중 상기 몰드 캐비티에 가해지는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 제 1 항 또는 제 3 항에 있어서,
상기 변형 재료는 상기 몰드 캐비티가 폐쇄되기 전에 가스들을 위한 흡입 개구(suction opening)를 통해 상기 몰드 캐비티에 공급되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 방법. - 캐리어 상에 장착되는 전자 부품들을 캡슐화하기 위한 장치에 있어서,
- 서로에 대해 변위 가능하고 폐쇄 위치에서 전자 부품을 둘러싸기 위한 적어도 하나의 몰드 캐비티를 규정하는 몰드 부품들,
- 상기 몰드 캐비티에 연결되는 캡슐화 재료를 위한 공급 수단(feed means) 및
- 상기 몰드 캐비티에 연결되는 변형 재료를 위한 공급 수단을 포함하고,
상기 장치에는 또한 상기 몰드 부품들 사이에 필름 재료를 공급하기 위한 공급 수단이 더 제공되고,
변형 재료를 위한 상기 공급 수단 및 캡슐화 재료를 위한 상기 공급 수단은 필름 재료를 위한 상기 공급 수단에 의해 공급되는 상기 필름의 대향측들 상에 위치되는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 장치. - 삭제
- 삭제
- 제 12 항에 있어서,
변형 재료를 위한 상기 공급 수단은 필름 재료 상에 상기 변형 재료를 배열하도록 되어 있는 것을 특징으로 하는, 전자 부품들을 캡슐화하기 위한 장치.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2007614 | 2011-10-18 | ||
NL2007614A NL2007614C2 (nl) | 2011-10-18 | 2011-10-18 | Werkwijze en inrichting voor het met behulp van een reductie-materiaal dat een faseovergang ondergaat omhullen van elektronische componenten. |
PCT/NL2012/050724 WO2013066162A1 (en) | 2011-10-18 | 2012-10-18 | Method and device for encapsulating electronic components using a reduction material which undergoes a phase change |
Publications (2)
Publication Number | Publication Date |
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KR20140079453A KR20140079453A (ko) | 2014-06-26 |
KR102017672B1 true KR102017672B1 (ko) | 2019-09-03 |
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KR1020147012095A KR102017672B1 (ko) | 2011-10-18 | 2012-10-18 | 상 변화를 겪는 변형 재료를 이용하여 전자 부품들을 캡슐화하기 위한 방법 및 장치 |
Country Status (10)
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JP (1) | JP6133879B2 (ko) |
KR (1) | KR102017672B1 (ko) |
CN (1) | CN103874569B (ko) |
DE (1) | DE112012004392B4 (ko) |
GB (1) | GB2516148B (ko) |
MY (1) | MY165079A (ko) |
NL (1) | NL2007614C2 (ko) |
PH (1) | PH12014500748A1 (ko) |
SG (1) | SG2014011431A (ko) |
WO (1) | WO2013066162A1 (ko) |
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NL2016011B1 (en) * | 2015-12-23 | 2017-07-03 | Besi Netherlands Bv | Press, actuator set and method for encapsulating electronic components with at least two individual controllable actuators. |
DE102017216711A1 (de) * | 2017-09-21 | 2019-03-21 | Robert Bosch Gmbh | Vorrichtung und Verfahren zur Herstellung von mit einer Gießmasse zumindest bereichsweise überdeckten Bauelementen |
DE102023200536A1 (de) | 2023-01-24 | 2024-07-25 | BSH Hausgeräte GmbH | Verfahren zum spezifischen Spritzgießen von Haushaltsgeräte-Kunststoffbauteilen, sowie Spritzgießmaschine |
NL2034976B1 (en) * | 2023-06-02 | 2024-12-11 | Besi Netherlands Bv | Method and system for pre-conditioning a mould cavity of a mould for encapsulating electronic components |
Citations (5)
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US20020025352A1 (en) | 2000-08-22 | 2002-02-28 | Fumio Miyajima | Method of resin molding and resin molding machine |
JP2002176067A (ja) * | 2000-12-11 | 2002-06-21 | Apic Yamada Corp | 樹脂封止方法及び樹脂封止装置 |
JP2006198813A (ja) * | 2005-01-18 | 2006-08-03 | Hitachi Chem Co Ltd | 封止成形方法及び封止成形装置 |
US20090097139A1 (en) | 2007-10-15 | 2009-04-16 | Masanori Minamio | Optical device and manufacturing method thereof |
WO2011008098A2 (en) * | 2009-07-17 | 2011-01-20 | Fico B.V. | Method and device for encapsulating electronic components with controlled gas pressure |
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DE1554851A1 (de) * | 1966-04-16 | 1970-01-22 | Phoenix Gummiwerke Ag | Verfahren zum Einspritzen einer plastischen Kautschuk- oder Kunststoffmischung in eine Hohlform |
JPS6297812A (ja) * | 1985-10-23 | 1987-05-07 | Mitsubishi Electric Corp | 樹脂成形方法 |
NL9400119A (nl) * | 1994-01-27 | 1995-09-01 | 3P Licensing Bv | Werkwijze voor het met een hardende kunststof omhullen van een electronische component, electronische componenten met kunststofomhulling verkregen door middel van deze werkwijze en matrijs voor het uitvoeren der werkwijze. |
DE4427309C2 (de) | 1994-08-02 | 1999-12-02 | Ibm | Herstellung eines Trägerelementmoduls zum Einbau in Chipkarten oder andere Datenträgerkarten |
JP3407987B2 (ja) * | 1994-08-18 | 2003-05-19 | Towa株式会社 | 樹脂封止成形用金型の保管方法及び電子部品の樹脂封止成形方法 |
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2011
- 2011-10-18 NL NL2007614A patent/NL2007614C2/nl not_active IP Right Cessation
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2012
- 2012-10-18 MY MYPI2014000972A patent/MY165079A/en unknown
- 2012-10-18 DE DE112012004392.8T patent/DE112012004392B4/de active Active
- 2012-10-18 CN CN201280050764.0A patent/CN103874569B/zh not_active Expired - Fee Related
- 2012-10-18 KR KR1020147012095A patent/KR102017672B1/ko active IP Right Grant
- 2012-10-18 WO PCT/NL2012/050724 patent/WO2013066162A1/en active Application Filing
- 2012-10-18 JP JP2014537018A patent/JP6133879B2/ja not_active Expired - Fee Related
- 2012-10-18 GB GB1407324.1A patent/GB2516148B/en not_active Expired - Fee Related
- 2012-10-18 PH PH1/2014/500748A patent/PH12014500748A1/en unknown
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Patent Citations (5)
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US20020025352A1 (en) | 2000-08-22 | 2002-02-28 | Fumio Miyajima | Method of resin molding and resin molding machine |
JP2002176067A (ja) * | 2000-12-11 | 2002-06-21 | Apic Yamada Corp | 樹脂封止方法及び樹脂封止装置 |
JP2006198813A (ja) * | 2005-01-18 | 2006-08-03 | Hitachi Chem Co Ltd | 封止成形方法及び封止成形装置 |
US20090097139A1 (en) | 2007-10-15 | 2009-04-16 | Masanori Minamio | Optical device and manufacturing method thereof |
WO2011008098A2 (en) * | 2009-07-17 | 2011-01-20 | Fico B.V. | Method and device for encapsulating electronic components with controlled gas pressure |
Also Published As
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GB201407324D0 (en) | 2014-06-11 |
CN103874569B (zh) | 2017-02-15 |
MY165079A (en) | 2018-02-28 |
JP2014530510A (ja) | 2014-11-17 |
DE112012004392B4 (de) | 2021-10-28 |
NL2007614C2 (nl) | 2013-04-22 |
KR20140079453A (ko) | 2014-06-26 |
JP6133879B2 (ja) | 2017-05-24 |
WO2013066162A1 (en) | 2013-05-10 |
SG2014011431A (en) | 2014-06-27 |
PH12014500748A1 (en) | 2014-05-12 |
CN103874569A (zh) | 2014-06-18 |
DE112012004392T5 (de) | 2014-07-10 |
GB2516148A (en) | 2015-01-14 |
GB2516148B (en) | 2016-10-26 |
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