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KR100369391B1 - Wire bonding apparatus for fabricating semiconductor package and method for fabricating semiconductor package thereof - Google Patents

Wire bonding apparatus for fabricating semiconductor package and method for fabricating semiconductor package thereof Download PDF

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Publication number
KR100369391B1
KR100369391B1 KR1019970079231A KR19970079231A KR100369391B1 KR 100369391 B1 KR100369391 B1 KR 100369391B1 KR 1019970079231 A KR1019970079231 A KR 1019970079231A KR 19970079231 A KR19970079231 A KR 19970079231A KR 100369391 B1 KR100369391 B1 KR 100369391B1
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South Korea
Prior art keywords
lead frame
preheating
semiconductor package
semiconductor
semiconductor chip
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KR1019970079231A
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Korean (ko)
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KR19990059036A (en
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우찬희
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앰코 테크놀로지 코리아 주식회사
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Priority to KR1019970079231A priority Critical patent/KR100369391B1/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Die Bonding (AREA)

Abstract

PURPOSE: A wire bonding apparatus for fabricating a semiconductor package and a method for fabricating a semiconductor package thereof are provided to reduce a time for semiconductor fabrication process by performing a curing process in a preheat portion. CONSTITUTION: A preheating portion is installed at one side of a bonding portion. The preheating portion preheats a lead frame before the lead frame is supplied to the bonding portion. The preheating portion is formed with a preheating plate(20). The preheating plate(20) is formed with a bottom plate(21), a cover(22), and a support portion(23). A heating coil is installed in the inside of the bottom plate(21) of the preheating plate(20). The heating coil is installed in the inside of the cover(22). The cover(22) and the support portion(23) are formed with one body.

Description

반도체 패키지 제조용 와이어 본딩 장치 및 그 반도체패키지의 제조 방법Wire bonding apparatus for semiconductor package manufacture and manufacturing method of the semiconductor package

본 발명은 반도체 패키지 제조용 와이어 본딩 장치 및 그 반도체패키지의 제조 방법에 관한 것으로, 더욱 상세하게는 다이본딩공정에서 리드프레임의 탑재판에부착되는 반도체칩의 경화를 와이어 본딩 장치에 설치된 예열부에서 경화시킬 수 있도록 예열판의 구조를 변경하여 반도체 패키지 제조공정의 시간을 단축시킴으로써, 생산성을 향상시킬 수 있는 반도체 패키지 제조용 와이어 본딩 장치 및 그 반도체패키지의 제조 방법에 관한 것이다.The present invention relates to a wire bonding device for manufacturing a semiconductor package and a method for manufacturing the semiconductor package. More particularly, the hardening of a semiconductor chip attached to a mounting plate of a lead frame in a die bonding step is cured in a preheating unit provided in the wire bonding device. The present invention relates to a wire bonding apparatus for manufacturing a semiconductor package and a method for manufacturing the semiconductor package, which can improve productivity by changing the structure of the preheating plate so as to shorten the time of the semiconductor package manufacturing process.

일반적으로 반도체 패키지의 제조공정은, 먼저 웨이퍼의 불량을 체크하는 원자재검사, 웨이퍼를 절단하여 반도체칩을 낱개로 분리하는 소잉공정, 낱개로 분리된 반도체칩을 리드프레임의 탑재판에 에폭시를 사용하여 부착시키는 다이본딩공정, 반도체칩 상에 구비된 칩패드와 리드프레임의 리드를 와이어로 연결시켜주는 와이어본딩공정, 반도체칩의 내부회로와 그외의 구성부품을 보호하기 위하여 봉지재로 그 외부를 감싸는 몰딩공정, 반도체 패키지를 식별할 수 있도록 반도체 패키지의 일면에 문자 및 기호를 새기는 마킹공정, 리드와 리드를 연결하고 있는 댐바를 커팅하는 트림공정 및 리드를 원하는 형태로 구부리는 포밍공정, 리드프레임으로 부터 낱개의 반도체 패키지로 분리하는 싱글레이션 공정, 상기 공정을 거쳐 완성된 패키지의 불량을 검사하는 공정으로 이루어진다.In general, the manufacturing process of a semiconductor package includes a raw material inspection for checking wafer defects first, a sawing process for cutting a wafer to separate the semiconductor chips into pieces, and using the epoxy on the lead frame mounting plate for the separated semiconductor chips. A die bonding process for attaching, a wire bonding process for connecting the lead of the chip pad and the lead frame provided on the semiconductor chip with a wire, and the outside of the encapsulation material wrapped around the outside to protect the internal circuit and other components of the semiconductor chip. Molding process, marking process to engrave letters and symbols on one side of semiconductor package to identify semiconductor package, trim process to cut dam bar connecting lead and lead, forming process to lead to desired shape, lead frame Single process to separate into single semiconductor package, defective package completed through the above process It comprises a checking process.

상기에 있어서, 다이본딩공정에서 리드프레임의 탑재판 위에 반도체칩을 부착하기 위한 에폭시는 오븐(Oven)이나 퍼니스(Furnace)에서 경화시키는 큐어공정을 거친 다음, 와이어본딩 공정에서 반도체칩 상에 구비된 칩패드와 리드프레임의 리드를 와이어로 연결시켜주는 것이다.In the above, the epoxy for attaching the semiconductor chip on the mounting plate of the lead frame in the die bonding process is subjected to a curing process to harden in an oven or furnace, and then provided on the semiconductor chip in the wire bonding process This is to connect the chip pad and lead frame leads with wires.

상기한 와이어본딩공정은 와이어본딩 장치에서 공정이 진행되는 것으로, 이러한 와어어본딩 장치에는 도 1에 도시된 바와같이 반도체칩(33)의 칩패드와리드(32)를 와이어(34)로 본딩할 때, 그 본딩력을 향상시키기 위한 예열판(20)이 설치된 예열부가 구비되어 있다.The wire bonding process is performed in a wire bonding apparatus, and the wire pad bonding the chip pad and the lead 32 of the semiconductor chip 33 to the wire 34 as shown in FIG. At this time, the preheating part provided with the preheating plate 20 for improving the bonding force is provided.

이러한 예열부의 예열판(20)은 내부에 히팅코일(24 ; Heating coil)이 설치된 평판으로 형성되어 단순히 리드프레임을 예열하도록 하여 상기한 리드프레임의 탑재판(31)에 부착된 반도체칩(33)을 함께 예열하도록 된 것이다.The preheating plate 20 of the preheating unit is formed of a flat plate having a heating coil 24 therein, and thus preheats the lead frame, so that the semiconductor chip 33 is attached to the mounting plate 31 of the lead frame. Preheated together.

그러나, 이러한 예열판(20)은 단순한 평판으로 형성되어 있음으로써, 열 손실이 커 리드프레임을 예열하는 데에는 많은 시간이 소요될 뿐만 아니라, 상기한 예열판(20)에서 리드프레임을 완전하게 예열하지 못하여 와이어본딩공정의 불량을 발생시키는 등의 문제점이 있었던 것이다.However, since the preheating plate 20 is formed of a simple flat plate, the heat loss is large, and it takes a long time to preheat the leadframe, and the preheating plate 20 does not completely preheat the leadframe. There was a problem such as causing a defect in the wire bonding process.

또한, 다이본딩공정에서 반도체칩을 부착시키기 위한 에폭시를 고온에서 경화될 수 있는 에폭시를 사용할 경우에도 즉, 속경화재의 에폭시를 사용할 경우에도 종래의 예열판에서는 상기한 에폭시를 경화시킬 수 없음으로써, 에폭시를 경화시키기 위해서는 필수적으로 오븐이나, 퍼니스를 사용한 큐어공정을 반드시 거쳐야 되므로 제조공정에 따른 작업시간이 길어져 생산성이 떨어지는 단점도 있었던 것이다.In addition, even when the epoxy for attaching the semiconductor chip in the die bonding process using an epoxy that can be cured at a high temperature, that is, even when using an epoxy of a fast curing material, the above-described epoxy can not be cured in the conventional preheating plate, In order to harden the epoxy, it is necessary to go through a curing process using an oven or a furnace, which has a disadvantage in that productivity is reduced due to a long working time according to the manufacturing process.

여기서, 상기 속경화제의 에폭시란 큐어링 에이젼트(curing agent) 및 촉매가 다른 통상의 에폭시에 비해 더욱 많이 포함되어 있어서, 보통 1~3분 이내에 경화되는 에폭시를 말한다.Here, the epoxy of the fastening agent is a curing agent (curing agent) and the catalyst is contained more than other conventional epoxy, it means an epoxy that is usually cured within 1 to 3 minutes.

본 발명의 목적은 이와 같은 문제점을 해소하기 위하여 발명된 것으로서, 다이본딩공정에서 리드프레임의 탑재판에 반도체칩을 부착시키기 위한 에폭시를 속경화제를 사용하여 부착시키는 한편, 이러한 속경화제를 와이어 본딩 장치에 설치된 예열부의 예열판에서 속경화시킬 수 있도록 함으로써, 반도체 패키지 제조공정의 시간을 단축시킴은 물론, 생산성을 향상시키고 신뢰성을 높이도록 된 반도체 패키지 제조용 와이어 본딩 장치 및 그 반도체패키지의 제조 방법을 제공함에 있다.An object of the present invention is to solve such a problem, while in the die bonding step to attach the epoxy for attaching the semiconductor chip to the mounting plate of the lead frame using a fast curing agent, while the fast curing agent to the wire bonding device The present invention provides a wire bonding apparatus for manufacturing a semiconductor package and a method of manufacturing the semiconductor package, which can be quickly cured by a preheating plate installed in the preheating unit, thereby shortening the time of the semiconductor package manufacturing process, improving productivity and increasing reliability. Is in.

이러한 목적을 달성하기 위한 본 발명의 구성은, 반도체칩이 부착된 리드프레임을 공급하는 로딩부와, 상기한 로딩부에 의해 공급된 리드프레임을 히팅코일(Heating Coil)이 내장된 예열판에서 일정온도로 예열하여 주는 예열부와, 상기한 예열부에서 일정온도로 예열된 리드프레임의 리드와 반도체칩 상의 칩패드를 와이어로 연결하는 본딩부와, 상기한 본딩부에서 와이어로 연결된 리드프레임을 배출하는 언로딩부로 이루어지는 반도체 패키지 제조용 와이어 본딩 장치에 있어서, 상기한 예열부의 히팅코일이 내장된 예열판은 리드프레임이 안착되는 바닥판의 상부로 지지대에 의해 덮개가 일체로 형성되고, 상기 덮개 및 바닥판의 내부에는 히팅코일이 내장되어 있는 것이다.The configuration of the present invention for achieving this object, the loading unit for supplying a lead frame with a semiconductor chip, and the lead frame supplied by the loading unit is fixed in a preheating plate with a heating coil (Heating Coil) built-in A preheating part for preheating by temperature, a bonding part for connecting a lead of the leadframe preheated to a predetermined temperature in the preheating part with a chip pad on a semiconductor chip, and a leadframe connected with a wire from the bonding part. In the wire bonding apparatus for manufacturing a semiconductor package comprising an unloading part, the preheating plate in which the heating coil is built in the preheating part is integrally formed by a support to the upper part of the bottom plate on which the lead frame is seated, and the cover and the bottom. Inside the plate is a heating coil.

또한, 상기한 구성에 의한 본 발명에 의한 반도체패키지의 제조 방법은, 웨이퍼의 불량을 체크하는 원자재검사, 웨이퍼를 절단하여 반도체칩을 낱개로 분리하는 소잉공정, 낱개로 분리된 반도체칩을 리드프레임의 탑재판에 에폭시를 사용하여 부착하는 다이본딩공정, 상기한 다이본딩공정에서 반도체칩을 부착하기 위한 에폭시를 경화시키는 큐어공정, 반도체칩 상에 구비된 칩패드와 리드프레임의 리드를 와이어로 연결시켜주는 와이어본딩공정, 반도체칩의 내부회로와 그 외의 구성부품을 보호하기 위하여 봉지재로 그 외부를 감싸는 몰딩공정, 반도체 패키지를 식별할 수 있도록 반도체 패키지의 일면에 문자 및 기호를 새기는 마킹공정, 리드와 리드를 연결하고 있는 댐바를 커팅하는 트림공정 및 리드를 원하는 형태로 구부리는 포밍공정, 리드프레임으로부터 낱개의 반도체 패키지로 분리하는 싱글레이션 공정으로 이루어지는 반도체 패키지의 제조 방법에 있어서, 상기한 다이본딩공정에서 반도체칩을 부착하는 에폭시는 속경화제를 이용하여 반도체칩을 부착하는 한편, 상기한 속경화제를 와이어본딩공정에서 리드프레임을 예열할 때 경화시키도록 된 것이다.In addition, the method for manufacturing a semiconductor package according to the present invention having the above-described configuration includes a raw material inspection for checking wafer defects, a sawing process for cutting a wafer to separate the semiconductor chips, and a lead frame for the separated semiconductor chips. Die bonding process for attaching epoxy to mounting plate, curing process for curing epoxy for attaching semiconductor chip in the die bonding process, chip pad provided on semiconductor chip and lead frame lead connected by wire Wire bonding process, molding process to wrap the outside with encapsulant to protect internal circuit and other components of semiconductor chip, marking process to inscribe letters and symbols on one side of semiconductor package to identify semiconductor package, Trim process of cutting the dam bar connecting lead and lead, forming process of bending lead to desired shape, lead In the method of manufacturing a semiconductor package, which comprises a singulation step of separating the semiconductor package into individual semiconductor packages, in the die bonding step, the epoxy to attach the semiconductor chip attaches the semiconductor chip using a fast curing agent, The curing agent is to be cured when the lead frame is preheated in the wire bonding process.

도 1은 종래 와이어 본딩 장치의 구성을 개략적으로 도시한 단면도1 is a cross-sectional view schematically showing the configuration of a conventional wire bonding apparatus

도 2는 본 발명에 따른 와이어 본딩 장치의 구성을 개략적으로 도시한 단면도2 is a cross-sectional view schematically showing the configuration of the wire bonding apparatus according to the present invention

도 3은 본 발명의 요부인 예열판의 구성을 나타낸 사시도3 is a perspective view showing the configuration of a preheating plate which is the main part of the present invention;

- 도면의 주요부분에 대한 부호의 설명 --Explanation of symbols for the main parts of the drawings-

10 - 본딩부 20 - 예열판10-bonding part 20-preheating plate

21 - 바닥판 22 - 덮개21-base plate 22-cover

23 - 지지대 24 - 히팅코일(Heating coil)23-Support 24-Heating coil

31 - 탑재판 32 - 리드31-Payload 32-Lead

33 - 반도체칩 34 - 와이어33-Semiconductor Chip 34-Wire

이하, 본 발명을 첨부된 도면을 참조하여 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

도 2는 본 발명에 따른 와이어 본딩 장치의 구성을 개략적으로 도시한 단면도이다. 도시된 바와 같이 본 발명에 따른 와이어 본딩 장치는 리드프레임의 탑재판(31)에 에폭시에 의해 부착된 반도체칩(33)의 칩패드와 리드프레임의 리드(32)를 와이어(34)로 연결하는 본딩부(10)가 설치되고, 이 본딩부(10)의 일측에 설치되어 상기 본딩부(10)로 리드프레임이 공급되기 전에 상기한 리드프레임을 예열할 수 있도록 히팅코일(24 ; Heating Coil)이 내장된 예열판(20)으로 이루어진 예열부가 설치된다. 또한, 상기한 예열부로 리드프레임을 공급하는 로딩부와, 상기한 본딩부(10)에서 본딩된 리드프레임을 배출하는 언로딩부가 설치됨은 당연하다.2 is a cross-sectional view schematically showing the configuration of the wire bonding apparatus according to the present invention. As shown, the wire bonding apparatus according to the present invention connects the chip pad of the semiconductor chip 33 attached to the mounting plate 31 of the lead frame by the epoxy and the lead 32 of the lead frame with a wire 34. Bonding unit 10 is installed, is installed on one side of the bonding unit 10 so that the heating coil (heating coil 24) to preheat the lead frame before the lead frame is supplied to the bonding unit 10 A preheating unit consisting of the built-in preheating plate 20 is installed. In addition, it is natural that the loading unit for supplying the lead frame to the preheating unit and the unloading unit for discharging the lead frame bonded by the bonding unit 10 are installed.

상기한 예열부의 예열판(20) 구성은, 도 3에 도시된 바와같이 리드프레임이 안착되는 바닥판(21)의 상부로 지지대(23)에 의해 덮개(22)가 일체로 형성되어 있고, 이러한 덮개(22) 및 바닥판(21)에는 히팅코일(24)이 내장되어 있는 것이다.In the configuration of the preheating plate 20 of the preheating unit, as shown in FIG. 3, the cover 22 is integrally formed by the support 23 at the upper portion of the bottom plate 21 on which the lead frame is seated. The heating coil 24 is built in the cover 22 and the bottom plate 21.

이와같이 구성된 본 발명은, 본딩부(10)에서 리드프레임의 탑재판(31)에 부착된 반도체칩(33)의 칩패드와 리드프레임의 리드(32)를 와이어로 본딩하기 전에 상기한 예열부의 예열판(20)으로 상기한 온로더에서 리드프레임을 공급하여 리드프레임을 예열하는 것이다. 이때, 상기한 예열판(20)은 바닥판(21)과 덮개(22)로 구성되어 있음으로써, 충분한 열을 공급하여 반도체칩(33)이 부착된 리드프레임을 예열시 열 손실이 적어 리드프레임을 빠른 시간 내에 예열할 수 있어 와이어본딩공정의 불량을 방지하고, 신뢰성을 향상시킬 수 있는 것이다.According to the present invention configured as described above, an example of the preheating unit described above before the bonding portion 10 bonds the chip pad of the semiconductor chip 33 attached to the mounting plate 31 of the lead frame and the lead 32 of the lead frame with wires. The lead frame is supplied from the on-loader to the hot plate 20 to preheat the lead frame. At this time, the preheating plate 20 is composed of the bottom plate 21 and the cover 22, so that sufficient heat is supplied so that the heat loss when preheating the lead frame to which the semiconductor chip 33 is attached, the lead frame It can be preheated in a short time to prevent the defect of the wire bonding process and improve the reliability.

또한, 이러한 예열판(20)은 다이본딩공정에서 반도체칩(33)을 부착시키기 위한 에폭시를 고온에서 경화될 수 있는 속경화제를 사용할 경우에 상기한 속경화제를 단시간 내에 속경화시킬 수 있음으로써, 에폭시를 경화시키기 위한 오븐이나, 퍼니스를 없앨 수 있어 제조공정에 따른 작업시간의 단축이 가능하다. 즉, 상기한 본딩부(10)에서 리드프레임에 형성되어 있는 하나의 유니트(Unit)를 본딩하기 위해서는 대략 50초 정도의 시간이 소요되므로 리드프레임에 있는 전체의 유니트를 전부 본딩하는 데에는 대략 3∼5분이 소요된다. 따라서, 속경화제의 경화시간은 1∼3분이면 충분함으로써, 본 발명의 예열부에서 충분히 경화시킬 수 있는 것이다.In addition, the preheating plate 20 can be quickly cured in a short time when using the fastening agent that can be cured at a high temperature of the epoxy for attaching the semiconductor chip 33 in the die bonding process, Oven for curing the epoxy and the furnace can be eliminated, it is possible to shorten the working time according to the manufacturing process. That is, it takes about 50 seconds to bond one unit formed in the lead frame in the bonding unit 10, and thus, it is about 3 to 4 to bond all the units in the lead frame. 5 minutes. Therefore, since hardening time of a fastening agent is 1-3 minutes, since it is enough, it can fully harden | cure in the preheating part of this invention.

이상의 설명에서 알 수 있듯이 본 발명의 반도체 패키지 제조용 와이어 본딩 장치 및 그 제조 방법에 의하면, 와이어본딩장치의 예열부에서 큐어공정을 할 수 있도록 함으로서, 반도체 패키지의 제조 공정 시간을 단축시켜 생산성을 향상시킴음 물론, 리드프레임의 예열 효과를 높여 신뢰성을 향상시킬 수 있는 효과가 있다.As can be seen from the above description, according to the wire bonding apparatus for manufacturing a semiconductor package of the present invention and the manufacturing method thereof, the curing process can be performed at the preheating part of the wire bonding apparatus, thereby shortening the manufacturing process time of the semiconductor package to improve productivity. Well, of course, there is an effect that can improve the reliability by increasing the preheating effect of the lead frame.

Claims (2)

반도체칩이 부착된 리드프레임을 공급하는 로딩부와, 상기한 로딩부에 의해 공급된 리드프레임을 히팅코일(Heating Coil)이 내장된 예열판에서 일정온도로 예열하여 주는 예열부와, 상기한 예열부에서 일정온도로 예열된 리드프레임의 리드와 반도체칩 상의 칩패드를 와이어로 연결하는 본딩부와, 상기한 본딩부에서 와이어로 연결된 리드프레임을 배출하는 언로딩부로 이루어지는 반도체 패키지 제조용 와이어 본딩 장치에 있어서,A loading part for supplying a lead frame to which a semiconductor chip is attached, a preheating part for preheating the lead frame supplied by the loading part to a predetermined temperature in a preheating plate with a heating coil, and the preheating. In the wire bonding device for semiconductor package manufacturing comprising a bonding portion for connecting the lead of the lead frame preheated to a predetermined temperature in the unit with the chip pad on the semiconductor chip, and an unloading portion for discharging the lead frame connected by the wire from the bonding portion In 상기한 예열부의 히팅코일이 내장된 예열판은 리드프레임이 안착되는 바닥판의 상부로 지지대에 의해 덮개가 일체로 형성되고, 상기 덮개 및 바닥판의 내부에는 히팅코일이 내장되어 있는 것을 특징으로 하는 반도체 패키지 제조용 와이어 본딩 장치.The preheating plate in which the heating coil with the heating coil is built is integrally formed by a support to an upper portion of the bottom plate on which the lead frame is seated, and the heating coil is built in the cover and the bottom plate. Wire bonding apparatus for semiconductor package manufacture. 웨이퍼의 불량을 체크하는 원자재검사, 웨이퍼를 절단하여 반도체칩을 낱개로 분리하는 소잉공정, 낱개로 분리된 반도체칩을 리드프레임의 탑재판에 에폭시를 사용하여 부착하는 다이본딩공정, 상기한 다이본딩공정에서 반도체칩을 부착하기 위한 에폭시를 경화시키는 큐어공정, 반도체칩 상에 구비된 칩패드와 리드프레임의 리드를 와이어로 연결시켜주는 와이어본딩공정, 반도체칩의 내부회로와 그 외의 구성부품을 보호하기 위하여 봉지재로 그 외부를 감싸는 몰딩공정, 반도체 패키지를 식별할 수 있도록 반도체 패키지의 일면에 문자 및 기호를 새기는 마킹공정, 리드와 리드를 연결하고 있는 댐바를 커팅하는 트림공정 및 리드를 원하는 형태로 구부리는 포밍공정, 리드프레임으로부터 낱개의 반도체 패키지로 분리하는 싱글레이션 공정으로 이루어지는 반도체 패키지의 제조 방법에 있어서,Raw material inspection to check wafer defects, sawing process of cutting wafers into individual pieces, die bonding process of attaching the separated semiconductor chips to the mounting plate of lead frame using epoxy, die-bonding described above Curing process for curing epoxy for attaching semiconductor chip in process, wire bonding process for connecting chip pad and lead frame lead provided on semiconductor chip with wire, protecting internal circuit and other components of semiconductor chip Molding process to enclose the outside with encapsulation material, marking process to inscribe letters and symbols on one surface of semiconductor package to identify semiconductor package, trim process to cut dam bar connecting lead and lead, and desired shape The bending process is a single process that separates the semiconductor package from the leadframe into individual semiconductor packages. A method of manufacturing a semiconductor package that is the lure, 상기한 다이본딩공정에서 반도체칩을 부착하는 에폭시는 속경화제를 이용하여 반도체칩을 부착하는 한편, 상기한 속경화제를 와이어본딩공정에서 리드프레임을 예열할 때 경화시키도록 된 것을 특징으로 하는 반도체 패키지의 제조 방법.The epoxy package attaching the semiconductor chip in the die bonding process is attached to the semiconductor chip using a fast curing agent, while the semiconductor package characterized in that the fastening agent is cured when preheating the lead frame in the wire bonding process Method of preparation.
KR1019970079231A 1997-12-30 1997-12-30 Wire bonding apparatus for fabricating semiconductor package and method for fabricating semiconductor package thereof KR100369391B1 (en)

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Publication number Priority date Publication date Assignee Title
KR20200001964U (en) 2019-02-26 2020-09-04 지이 일렉트리컬 엔지니어링 컴퍼니., 리미티드. Canned motor pump device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200001964U (en) 2019-02-26 2020-09-04 지이 일렉트리컬 엔지니어링 컴퍼니., 리미티드. Canned motor pump device

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