KR100257305B1 - 열처리장치 및 그의 크리닝 방법 - Google Patents
열처리장치 및 그의 크리닝 방법 Download PDFInfo
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- KR100257305B1 KR100257305B1 KR1019930028339A KR930028339A KR100257305B1 KR 100257305 B1 KR100257305 B1 KR 100257305B1 KR 1019930028339 A KR1019930028339 A KR 1019930028339A KR 930028339 A KR930028339 A KR 930028339A KR 100257305 B1 KR100257305 B1 KR 100257305B1
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- KR
- South Korea
- Prior art keywords
- gas supply
- reaction gas
- supply pipe
- reaction
- control device
- Prior art date
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- 238000000034 method Methods 0.000 title claims description 66
- 238000004140 cleaning Methods 0.000 title claims description 39
- 238000010438 heat treatment Methods 0.000 title claims description 39
- 239000012495 reaction gas Substances 0.000 claims abstract description 155
- 238000006243 chemical reaction Methods 0.000 claims abstract description 66
- 239000007789 gas Substances 0.000 claims abstract description 63
- 239000011261 inert gas Substances 0.000 claims abstract description 44
- 238000011144 upstream manufacturing Methods 0.000 claims abstract description 44
- 235000012431 wafers Nutrition 0.000 description 12
- 238000009792 diffusion process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- BUMGIEFFCMBQDG-UHFFFAOYSA-N dichlorosilicon Chemical compound Cl[Si]Cl BUMGIEFFCMBQDG-UHFFFAOYSA-N 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000002341 toxic gas Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
Claims (10)
- 반응가스 공급배관 및 처리가스 배출관이 접속된 반응용기와, 반응가스 공급배관에 장착된 유량 제어장치를 갖춘 열처리장치의 크리닝 방법에 있어서, 상기 처리가스 배출관 내를 진공흡인함과 동시에, 상기 반응가스 공급배관내에 상기 유량제어장치보다 상류측으로부터 불활성가스를 도입해서, 상기 반응가스 공급배관내 및 상기 반응용기 내의 반응가스를 불활성가스로 치환하고, 그로부터 비기체 잔류물을 제거하는 제 1 의 공정과, 상기 처리가스 배출관 내를 진공흡인함과 동시에, 상기 반응가스 공급배관을 유량 제어장치의 하류측상의 한 폐쇄점에서 차단하고, 상기 폐쇄점의 하류측의 반응가스 공급배관내 및 반응용기 내를 진공흡인함과 동시에 비기체 잔류물을 제거하고, 상기 유량제어장치의 상류측의 반응가스 공급배관내를 진공흡인하는 제 2의 공정으로 이루어지는 열처리장치의 크리닝 방법.
- 제1항에 있어서, 제 2 의 공정에서, 유량제어장치의 상류측의 반응가스 공급배관내는, 반응가스 공급배관과 처리가스 배출관을 연이어 통하는 바이패스배관을 통해서, 처리가스 배출관내의 진공흡인과 동시에 진공흡인됨을 특징으로 하는 열처리장치의 크리닝 방법.
- 제1항에 있어서, 제 2 의 공정에서, 유량제어장치의 상류측의 반응가스 공급배관내는, 처리가스 배출관과 독립해서 진공흡인됨을 특징으로 하는 열처리장치의 크리닝 방법.
- 제1항에 있어서, 제 1 의 공정과 제 2 의 공정으로서 이루어지는 싸이클을, 10회 이상 반복함을 특징으로 하는 열처리 장치의 크리닝 방법.
- 제4항에 있어서, 1 싸이클 중의 제 1 공정 및 제 2 공정은 모두 5초이내에 행하여짐을 특징으로 하는 열처리장치의 크리닝 방법.
- 제4항에 있어서, 제 1 공정에서, 반응용기 및 반응가스 공급배관(내는 1500 내지 1900 Torr로 기압되고, 제 2 공정에서는, 반응용기 및 반응가스 공급배관내는 300 Torr이하로 감압됨을 특징으로 하는 열처리 장치의 크리닝 방법.
- 반응용기와, 상기 반응용기에 접속된 반응가스 공급배관과, 상기 반응용기에 접속된 처리가스 배출과, 반응가스 공급배관에 장착된 유량 제어장치와, 반응가스 공급배관의 유량 제어장치보다 상류측에, 반응가스공급밸브를 통해서 접속된 반응가스 공급수단과, 반응가스 공급배관의 유량 제어장치보다 상류측에, 불활성가스 공급밸브를 통해서 접속된 불활성가스 공급수단과, 처리가스 배출관에 장착된 진공펌프와, 반응가스 공급배관의 유량 제어장치보다 상류측과, 진공펌프를 접속하기 위하여 처리가스 배출관의 진공펌프보다 상츄측에 접속되어, 진공펌프가 유량제어장치의 내부 및 상기 유량제어장치의 상류측에 있는 반응가스 공급배관의 일부의 내부를 진공흡인할 수 있도록 하는 바이패스 배관과, 유량제어장치의 하류측에 있는 반응가스 공급배관의 일부에 설치된 반응가스 공급배관; 및 바이패스배관에 바련된 바이패스배관밸브를 포함하여 구성되는 것을 특징으로 하는 열처리장치.
- 제7항에 있어서, 반응가스 공급배관의 유량 제어장치 보다 하류측에 장착된 필터를 더욱 포함하여 구성되는 것을 특징으로 하는 열처리장치.
- 반응용기와, 상기 반응용기에 접속된 반응가스 공급배관과, 상기 반응용기에 접속된 처리가스 배출과, 반응가스 공급배관에 장착된 유량 제어장치와, 반응가스 공급배관의 유량제어장치보다 상류측에, 반응가스공급밸브를 통해서 접속된 반응가스 공급수단과, 반응가스 공급배관의 유량제어장치보다 상류측에, 불활성가스 공급밸브를 통해서 접속된 불활성가스 공급수단과, 처리가스 배출관에 장착된 제 1 진공펌프와, 유량제어장치의 상류측에 반응가스 공급배관에 진공펌프밸브를 통하여 접속되어, 진공펌프가 유량제어장치의 내부 및 상기 유량제어장치의 상류측에 있는 반응가스 공급배관의 일부의 내부를 진공흡인할 수 있도록 하는 제 2 진공펌프 및, 유량제어장치의 하류측에 반응가스 공급배관에 설치된 반응가스배관밸브를 포함하여 구성되는 것을 특징으호 하는 열처리장치.
- 제9항에 있어서, 반응가스 공급배관의 유량 제어장치보다 하류측에 장착된 필터를 더욱 포함하여 구성되는 것을 특징으로 하는 열처리장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP92-354909 | 1992-12-18 | ||
JP35490992 | 1992-12-18 |
Publications (1)
Publication Number | Publication Date |
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KR100257305B1 true KR100257305B1 (ko) | 2000-05-15 |
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KR1019930028339A KR100257305B1 (ko) | 1992-12-18 | 1993-12-18 | 열처리장치 및 그의 크리닝 방법 |
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US (2) | US5427625A (ko) |
KR (1) | KR100257305B1 (ko) |
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US5250323A (en) * | 1989-10-30 | 1993-10-05 | Kabushiki Kaisha Toshiba | Chemical vapor growth apparatus having an exhaust device including trap |
JPH04135601A (ja) * | 1990-09-26 | 1992-05-11 | Tokyo Electron Sagami Ltd | トラップ装置のクリーニング方法 |
JPH04295089A (ja) * | 1991-03-26 | 1992-10-20 | Kokusai Chodendo Sangyo Gijutsu Kenkyu Center | 酸化物超電導膜製造装置 |
JP3156326B2 (ja) * | 1992-01-07 | 2001-04-16 | 富士通株式会社 | 半導体成長装置およびそれによる半導体成長方法 |
JPH0613361A (ja) * | 1992-06-26 | 1994-01-21 | Tokyo Electron Ltd | 処理装置 |
US5427625A (en) * | 1992-12-18 | 1995-06-27 | Tokyo Electron Kabushiki Kaisha | Method for cleaning heat treatment processing apparatus |
-
1993
- 1993-12-09 US US08/163,799 patent/US5427625A/en not_active Expired - Lifetime
- 1993-12-18 KR KR1019930028339A patent/KR100257305B1/ko not_active IP Right Cessation
-
1995
- 1995-03-28 US US08/411,899 patent/US5554226A/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100977819B1 (ko) * | 2007-04-02 | 2010-08-24 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치 및 반도체 장치의 제조 방법 |
KR100977818B1 (ko) * | 2007-04-02 | 2010-08-24 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치 및 반도체 장치의 제조 방법 |
US8235001B2 (en) | 2007-04-02 | 2012-08-07 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus and method for manufacturing semiconductor device |
US8367566B2 (en) | 2007-04-02 | 2013-02-05 | Hitachi Kokusai Electric Inc. | Method for manufacturing semiconductor device and method for processing substrate |
Also Published As
Publication number | Publication date |
---|---|
US5554226A (en) | 1996-09-10 |
US5427625A (en) | 1995-06-27 |
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