JPS63302342A - Instrument for measuring configuration of particle in gas - Google Patents
Instrument for measuring configuration of particle in gasInfo
- Publication number
- JPS63302342A JPS63302342A JP13801687A JP13801687A JPS63302342A JP S63302342 A JPS63302342 A JP S63302342A JP 13801687 A JP13801687 A JP 13801687A JP 13801687 A JP13801687 A JP 13801687A JP S63302342 A JPS63302342 A JP S63302342A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- particle
- particles
- measured
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title claims abstract description 37
- 230000005684 electric field Effects 0.000 claims abstract description 10
- 238000001514 detection method Methods 0.000 claims description 5
- 239000012798 spherical particle Substances 0.000 description 2
- 239000010425 asbestos Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052895 riebeckite Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、気体中の非球形粒子の形状を電気的に測定
する装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for electrically measuring the shape of non-spherical particles in a gas.
従来、粒子測定装置として各種のものが知られているが
1本発明によるような回転電場を利用した粒子の形状測
定装置は知られていない。Various types of particle measuring devices have been known in the past, but a particle shape measuring device that utilizes a rotating electric field, such as the one according to the present invention, is not known.
粒子測定を行う場合、アスベスト(石英)繊維片の検出
等の観点から、しばしば粒子の形状測定を行う必要性が
生じるが、従来、このような装置は提案されていない。When measuring particles, it is often necessary to measure the shape of the particles from the viewpoint of detecting asbestos (quartz) fiber pieces, etc., but no such device has been proposed so far.
本発明は気体中の粒子の形状を連続的に測定し得る装置
を提供することを目的とする。An object of the present invention is to provide an apparatus that can continuously measure the shape of particles in a gas.
本発明によれば、測定すべき試料ガスを清浄ガスで包ん
で吸入する内外二重管よりなる試料導入管と、直管の内
面に円周を等分して多数の電極を集列した分析室と、吸
引ポンプを順次連結するとともに、上記分析室側面にマ
イクロホンおよびこのマイクロホンに連なる波形解析装
置および粒子測定装置からなる検出機構を添設し、さら
に前記各電極を、これら電極中の対向位置にある2個を
常にその一組に限ってそれぞれ正極の高″市圧、負極の
高電圧を順次印加して粒子に回転を与えるべき回転電場
発生装置に接続してなる気体中の粒子の形状を測定する
装置が提供される。According to the present invention, there is provided a sample introduction tube consisting of an inner and outer double tube for inhaling the sample gas to be measured wrapped in clean gas, and an analysis in which a large number of electrodes are arranged on the inner surface of the straight tube, dividing the circumference equally. The chamber and the suction pump are sequentially connected, and a detection mechanism consisting of a microphone and a waveform analyzer and a particle measuring device connected to the microphone is attached to the side of the analysis chamber, and each of the electrodes is connected to the opposite position of the electrodes. The shape of particles in a gas is obtained by connecting a set of two of them to a rotating electric field generator that applies rotation to the particles by sequentially applying a high voltage to the positive electrode and a high voltage to the negative electrode. An apparatus for measuring is provided.
この発明の実施例を図面について説明すると、全体はそ
れぞれ直筒状の試料導入管1、分析室4、吸引部7を前
後端を順次つき合わせて配設するとともに、分析室4の
外側面に検出機構9を付設して形成されている。An embodiment of the present invention will be described with reference to the drawings. The entire structure includes a straight cylindrical sample introduction tube 1, an analysis chamber 4, and a suction section 7, which are arranged with their front and rear ends facing each other in sequence, and the detection is carried out on the outer surface of the analysis chamber 4. It is formed by adding a mechanism 9.
試料導入管1は、試料ガスすなわち測定すべき所要の粒
子を含んだガスを送り込む内管2と、この内管2を囲ん
で設けられた清浄ガスが通る外管3とからなる二重管と
して作られている。The sample introduction tube 1 is a double tube consisting of an inner tube 2 into which a sample gas, that is, a gas containing the required particles to be measured, is fed, and an outer tube 3 surrounding the inner tube 2 through which a clean gas passes. It is made.
分析室4は、直管内に多数個の棒状の電極5・・・を円
周等分位置に並列して円筒状に作られており、内部を試
料ガスが通過するようになっている。これら電極は円筒
中心を挾んで対向する2個を正負−組とする複数組によ
り形成され、別に設けた回転電場発生装置6を介してこ
れら、複数組の電極のうち、常にその任意の一組が電極
の一方に正極の高電圧、他の一方に負極の高電圧〃印加
され、かつ回転電場発生装置6のセグメントとブラシに
よる回転スイッチ機構の作動に応じて上記印加が最初の
一組の電極から隣接する次の一組の電極に次々と変って
行くようになっている。The analysis chamber 4 is formed into a cylindrical shape in which a large number of rod-shaped electrodes 5 are arranged in parallel at equal positions on the circumference in a straight tube, and a sample gas passes through the inside. These electrodes are formed of a plurality of pairs, with two electrodes facing each other across the center of the cylinder as a positive and negative pair. A high voltage of the positive electrode is applied to one of the electrodes, and a high voltage of the negative electrode is applied to the other, and in response to the operation of the rotary switch mechanism by the segments and brushes of the rotating electric field generator 6, the above application is applied to the first set of electrodes. The electrodes then change from one set of electrodes to the next adjacent set of electrodes.
吸引部7は、分析室4の他端に接続された吸引ポンプ8
を備え、流量計、フィルターなどが付設されている。The suction unit 7 includes a suction pump 8 connected to the other end of the analysis chamber 4.
Equipped with a flow meter, filter, etc.
検出機構9は、分析室4の側面に高感度のマイクロホン
10とこのマイクロホンに接続された波形解析装置11
および粒子測定装置12で構成されている。The detection mechanism 9 includes a highly sensitive microphone 10 on the side of the analysis chamber 4 and a waveform analyzer 11 connected to this microphone.
and a particle measuring device 12.
この発明は上記の溝底であって、試料導入管1の内管2
を測定ガスのダクトに接続し、吸引部7を作動させると
、吸引ポンプ8により内管2先端および外管3の導管3
′からそれぞれ測定ガスおよび濾過した清浄ガスが吸引
され、測定ガスはこの清浄ガスの引込作用により、強制
的に吸引され、−直線の流れとなって分析室4′内に流
入する。This invention provides the above-mentioned groove bottom, and the inner tube 2 of the sample introduction tube 1.
When connected to the measuring gas duct and actuating the suction unit 7, the suction pump 8 pumps the tip of the inner tube 2 and the conduit 3 of the outer tube 3.
A measuring gas and a filtered clean gas are respectively sucked from the analyzer chamber 4', and the measuring gas is forcibly sucked by the drawing action of the clean gas and flows into the analysis chamber 4' in a straight line.
分析室4では前記したように回転電場発生装置6を介し
て対向する2個の電極5,5に正極の高電圧ならびに負
極の高電圧が印加されており、この印加は次々と隣接す
る電極に移り変わって行くようになっているため、清浄
ガスに包まれて分析室4に流入した4Ij定ガス中の粒
子は流入時、正負極に形成されている電極に対して互に
引き合うように分極するが、次の瞬間には電極の正負が
隣接する電極に変わるため、分極した粒子は上記隣接電
極につられて角度を変えていき1次に再び角度を変えて
いき、こうして粒子が回転してその回転運動エネルギー
に応じて音波が発生する。したがってこの音波をマイク
ロホン10で捉え、波形解析装置12で解析することに
より粒子の形状を求めることができる。即ち1分極した
非球形粒子は回転電場内で回転させられるが、この時、
発生した音波を高感度マイクロホンで検出し、その波形
を解析することにより、粒子形状が判別できる。例えば
、波形の数、すなわち波数により粒子個数、波高値によ
り粒子の長径、電場的通過時間により粒子の空気力学的
粒径、又は空気抵抗が求まり、さらに全てのデータから
粒子の短径なども測定できることになる。In the analysis chamber 4, as described above, a high voltage of the positive electrode and a high voltage of the negative electrode are applied to the two opposing electrodes 5, 5 via the rotating electric field generator 6, and this application is applied to the adjacent electrodes one after another. Because the particles in the 4Ij constant gas, which is surrounded by clean gas and flows into the analysis chamber 4, are polarized so as to attract each other to the electrodes formed on the positive and negative electrodes when they flow in. However, in the next moment, the positive and negative sides of the electrode change to the adjacent electrode, so the polarized particle is pulled by the adjacent electrode and changes its angle, and then changes its angle again, and in this way, the particle rotates and its Sound waves are generated in response to rotational kinetic energy. Therefore, by capturing this sound wave with the microphone 10 and analyzing it with the waveform analyzer 12, the shape of the particle can be determined. That is, a single polarized non-spherical particle is rotated in a rotating electric field, but at this time,
By detecting the generated sound waves with a high-sensitivity microphone and analyzing their waveforms, particle shapes can be determined. For example, the number of particles, i.e., the wave number, determines the number of particles, the wave height determines the major axis of the particle, the electric field transit time determines the aerodynamic diameter or air resistance of the particle, and from all data, the minor axis of the particle can also be determined. It will be possible.
図面はこの発明の説明斜面図である。
1・・・試料導入管、2・・・内管、3・・・外管、4
・・・分析室、5・・・電極、6・・・回転電場発生装
置、7・・・吸引部、9・・・検出機構、10・・・マ
イクロホン、11・・・波形解析装置、12・・・粒子
測定装置。
特許出願人 工業技術院長 飯 塚 幸 三指定代理人
工業技術院公害資源研究所長中 村 悦□ 部
図面の;争刀
第 1 図
手 続 補 正 書(方式)
%式%
1、事件の表示
昭和62年特許願第138016号
2、発明の名称
気体中の粒子の形状を測定する装置
3、補正をする者
事件との関係 特許出願人
住 所 東京都千代田区霞が5!!1丁目3番1号氏
名 (114)工業技術院長 飯 塚 幸 三4、
指定代理人 〒151
一=下下
lトド・p′±1
′j、“−−−7゜
1(1,1
−F・i’iBt’u
′)
パー12
2’、2s
で。
九中
7、補正の内容
本願明細書中および図面において、以下のとおり補正を
行います。
(1)明細書第6頁第4行の「図面」を、「第1図」に
訂正します。
(2)図面を別紙のとおり訂正します。The drawing is an explanatory perspective view of the present invention. 1...Sample introduction tube, 2...Inner tube, 3...Outer tube, 4
... Analysis room, 5... Electrode, 6... Rotating electric field generator, 7... Suction part, 9... Detection mechanism, 10... Microphone, 11... Waveform analysis device, 12 ...Particle measuring device. Patent Applicant Kozo Iizuka, Director General of the Agency of Industrial Science and Technology Designated Agent Etsu Nakamura, Director, Pollution Resources Research Institute, Agency of Industrial Science and Technology 1962 Patent Application No. 138016 2, Title of Invention Device for Measuring the Shape of Particles in Gas 3, Relationship with the Amendment Case Patent Applicant Address 5 Kasumi, Chiyoda-ku, Tokyo! ! 1-3-1 Name (114) Director of the Agency of Industrial Science and Technology Kozo Iizuka 44,
Designated representative 〒151 1=lower ltodo・p′±1′j,”−−7゜1(1,1 −F・i'iBt'u′) Par 12 2', 2s. 9th 7. Contents of amendment The following amendments will be made to the specification and drawings: (1) "Drawing" on page 6, line 4 of the specification will be corrected to "Figure 1." (2) The drawing will be corrected as shown in the attached sheet.
Claims (1)
内外二重管よりなる試料導入管と、直管の内面に円周を
等分して多数の電極を集列した分析室と、吸引ポンプを
順次連結するとともに、上記分析室側面にマイクロホン
およびこのマイクロホンに連なる波形解析装置および粒
子測定装置からなる検出機構を添設し、さらに前記各電
極を、これら電極中の対向位置にある2個を常にその一
組に限ってそれぞれ正極の高電圧、負極の高電圧を順次
印加すべき回転電場発生装置に接続してなる気体中の粒
子の形状を測定する装置。(1) A sample introduction tube consisting of an inner and outer double tube that inhales the sample gas to be measured wrapped in clean gas, and an analysis chamber in which a large number of electrodes are arranged on the inner surface of the straight tube, dividing the circumference equally. The suction pumps are successively connected, and a detection mechanism consisting of a microphone and a waveform analyzer and a particle measuring device connected to the microphone is attached to the side of the analysis chamber, and each of the electrodes is connected to two A device for measuring the shape of particles in a gas, in which only one set of particles is connected to a rotating electric field generator that sequentially applies a high voltage to the positive electrode and a high voltage to the negative electrode.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13801687A JPS63302342A (en) | 1987-06-01 | 1987-06-01 | Instrument for measuring configuration of particle in gas |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13801687A JPS63302342A (en) | 1987-06-01 | 1987-06-01 | Instrument for measuring configuration of particle in gas |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63302342A true JPS63302342A (en) | 1988-12-09 |
JPH0377454B2 JPH0377454B2 (en) | 1991-12-10 |
Family
ID=15212087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13801687A Granted JPS63302342A (en) | 1987-06-01 | 1987-06-01 | Instrument for measuring configuration of particle in gas |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63302342A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100668787B1 (en) | 2005-01-25 | 2007-01-12 | 연세대학교 산학협력단 | Particle sampler for sampling particulate contaminants from inside of hard disk drive, and performance valuation device of the same |
JP2007263745A (en) * | 2006-03-28 | 2007-10-11 | Kurabo Ind Ltd | Method for measuring fibrous particles, and device |
US8274655B2 (en) | 2009-02-05 | 2012-09-25 | Massachusetts Institute Of Technology | Method and system for in situ aerosol thermo-radiometric analysis |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4633714A (en) * | 1985-08-13 | 1987-01-06 | University Of Arkansas | Aerosol particle charge and size analyzer |
-
1987
- 1987-06-01 JP JP13801687A patent/JPS63302342A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4633714A (en) * | 1985-08-13 | 1987-01-06 | University Of Arkansas | Aerosol particle charge and size analyzer |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100668787B1 (en) | 2005-01-25 | 2007-01-12 | 연세대학교 산학협력단 | Particle sampler for sampling particulate contaminants from inside of hard disk drive, and performance valuation device of the same |
JP2007263745A (en) * | 2006-03-28 | 2007-10-11 | Kurabo Ind Ltd | Method for measuring fibrous particles, and device |
US8274655B2 (en) | 2009-02-05 | 2012-09-25 | Massachusetts Institute Of Technology | Method and system for in situ aerosol thermo-radiometric analysis |
Also Published As
Publication number | Publication date |
---|---|
JPH0377454B2 (en) | 1991-12-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |