JPS63187254A - Electrophotographic sensitive body - Google Patents
Electrophotographic sensitive bodyInfo
- Publication number
- JPS63187254A JPS63187254A JP1989387A JP1989387A JPS63187254A JP S63187254 A JPS63187254 A JP S63187254A JP 1989387 A JP1989387 A JP 1989387A JP 1989387 A JP1989387 A JP 1989387A JP S63187254 A JPS63187254 A JP S63187254A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- surface layer
- electrophotographic photoreceptor
- gas
- photoreceptor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010410 layer Substances 0.000 claims abstract description 74
- 239000002344 surface layer Substances 0.000 claims abstract description 39
- 230000004888 barrier function Effects 0.000 claims abstract description 19
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 15
- 239000004065 semiconductor Substances 0.000 claims abstract description 12
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 9
- 229910052796 boron Inorganic materials 0.000 claims abstract description 5
- 238000010030 laminating Methods 0.000 claims abstract description 5
- 108091008695 photoreceptors Proteins 0.000 claims description 53
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 28
- 239000010409 thin film Substances 0.000 claims description 16
- 230000000737 periodic effect Effects 0.000 claims description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 4
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 239000001301 oxygen Substances 0.000 claims description 4
- 229910052760 oxygen Inorganic materials 0.000 claims description 4
- 229910021424 microcrystalline silicon Inorganic materials 0.000 abstract description 4
- 229910017875 a-SiN Inorganic materials 0.000 abstract 2
- 239000007789 gas Substances 0.000 description 38
- 239000000969 carrier Substances 0.000 description 22
- 238000006243 chemical reaction Methods 0.000 description 14
- 239000002585 base Substances 0.000 description 12
- 238000000034 method Methods 0.000 description 9
- 239000010408 film Substances 0.000 description 8
- 239000002994 raw material Substances 0.000 description 8
- 238000012360 testing method Methods 0.000 description 8
- 230000035945 sensitivity Effects 0.000 description 7
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 229910000077 silane Inorganic materials 0.000 description 5
- -1 CciS Inorganic materials 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 238000005299 abrasion Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- FKNIDKXOANSRCS-UHFFFAOYSA-N 2,3,4-trinitrofluoren-1-one Chemical compound C1=CC=C2C3=C([N+](=O)[O-])C([N+]([O-])=O)=C([N+]([O-])=O)C(=O)C3=CC2=C1 FKNIDKXOANSRCS-UHFFFAOYSA-N 0.000 description 2
- 206010034972 Photosensitivity reaction Diseases 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 230000036211 photosensitivity Effects 0.000 description 2
- 229920003227 poly(N-vinyl carbazole) Polymers 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 101000797951 Anguilla japonica Galactose-binding lectin l-1 Proteins 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910004014 SiF4 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000010306 acid treatment Methods 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000000053 physical method Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000005488 sandblasting Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- ABTOQLMXBSRXSM-UHFFFAOYSA-N silicon tetrafluoride Chemical compound F[Si](F)(F)F ABTOQLMXBSRXSM-UHFFFAOYSA-N 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000007847 structural defect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/043—Photoconductive layers characterised by having two or more layers or characterised by their composite structure
- G03G5/0433—Photoconductive layers characterised by having two or more layers or characterised by their composite structure all layers being inorganic
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08214—Silicon-based
- G03G5/08264—Silicon-based comprising seven or more silicon-based layers
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photoreceptors In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、帯電特性、暗減衰特性、光感度特性及び耐環
境性等が優れた電子写真感光体に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an electrophotographic photoreceptor having excellent charging characteristics, dark decay characteristics, photosensitivity characteristics, environmental resistance, and the like.
[従来の技術]
水素(H)を含有するアモルファスシリコン(以下、a
−8i:Hと略す)は、近年、光電変換材料として注目
されており、太陽電池、薄膜トランジスタ、及びイメー
ジセンサ等のほか、電子写真プロセスの感光体に応用さ
れている。[Prior art] Amorphous silicon (hereinafter referred to as a) containing hydrogen (H)
-8i:H) has recently attracted attention as a photoelectric conversion material, and has been applied to photoreceptors in electrophotographic processes as well as solar cells, thin film transistors, and image sensors.
従来、電子写真感光体の光導電層を構成する材料として
、CciS、Zn0%Se、若しくは5e−Te等の無
機材料又はポリ−N−ビニルカルバゾール(PVCZ)
若しくはトリニトロフルオレノン(TNF)等の有機材
料が使用されていた。Conventionally, inorganic materials such as CciS, Zn0%Se, or 5e-Te, or poly-N-vinylcarbazole (PVCZ) have been used as materials constituting the photoconductive layer of electrophotographic photoreceptors.
Alternatively, organic materials such as trinitrofluorenone (TNF) have been used.
しかしながら、a−81:Hはこれらの無機材料又は有
機材料に比して、無公害物質であるため回収処理の必要
がないこと、可視光領域で高い分光感度を有すること、
並びに表面硬度が轟く耐摩耗性及び耐衝撃性が優れてい
ること等の利点を有している。このため、a−8i:H
は電子写真プロセスの感光体材料として注目されている
。However, compared to these inorganic or organic materials, a-81:H is a non-polluting substance, so there is no need for recovery treatment, and it has high spectral sensitivity in the visible light region.
It also has advantages such as excellent abrasion resistance and impact resistance due to its surface hardness. Therefore, a-8i:H
is attracting attention as a photoreceptor material for electrophotographic processes.
このa−8t:Hは、カールソン方式に基づく感光体の
材料として検討が進められているが、この場合、感光体
特性として抵抗及び光感度が高いことが要求される。し
かしながら、この両特性を単一の感光体層で満足させる
ことが困難であるため、光導電層と導電性支持体との間
に障壁層を設け、かつ表面保護、反射防止および表面電
位の向上等の目的のために、光導電層上に表面層を設け
た積層型の構造にすることにより、このような要求を満
足させている。This a-8t:H is being studied as a material for a photoreceptor based on the Carlson method, but in this case, the photoreceptor is required to have high resistance and photosensitivity. However, it is difficult to satisfy both of these characteristics with a single photoreceptor layer, so a barrier layer is provided between the photoconductive layer and the conductive support, and the surface protection, antireflection, and surface potential are improved. For these purposes, such requirements are satisfied by forming a laminated structure in which a surface layer is provided on the photoconductive layer.
[発明が解決しようとする問題点] ところで、従来、表面層としてはa−3iC。[Problem to be solved by the invention] By the way, a-3iC has conventionally been used as the surface layer.
a−8i N、 a−8i O等からなる絶縁性単一層
が用いられているが、このような表面層にはダングリン
グボンドやボイド等の構造欠陥が多く存在しているため
、感光体特性に好ましくない影響を与えている。例えば
、感光体を帯電し、光照射をした場合、光導電層で光キ
ャリアが発生する。光キャリアのうち正孔は導電性支持
体に向かって走行し、電子は表面層に向かって走行する
。この場合、電子は表面層をトンネル効果で通過し、感
光体表面の電荷を中和する。従って、表面層の膜厚が厚
い場合には、キャリアは表面層を通過できず、感度が悪
くなり、画像メモリを生じてしまう。また、上述のよう
に表面層は多くの欠陥を含んでいるため、キャリアが欠
陥にトラップされ、残留電位の上昇を招いてしまう。更
に、次サイクルで光照射を行なうと、表面層にトラップ
されたキャリアの一部が感光体表面に向かって走行し、
表面電荷を中和するため、帯電能の低下を生じてしまう
。An insulating single layer made of a-8i N, a-8i O, etc. is used, but such a surface layer has many structural defects such as dangling bonds and voids, which may affect the photoreceptor characteristics. is having an unfavorable impact on For example, when a photoreceptor is charged and irradiated with light, photocarriers are generated in the photoconductive layer. Among the photocarriers, holes travel toward the conductive support, and electrons travel toward the surface layer. In this case, electrons tunnel through the surface layer and neutralize the charge on the surface of the photoreceptor. Therefore, if the surface layer is thick, carriers cannot pass through the surface layer, resulting in poor sensitivity and image memory. Furthermore, as described above, since the surface layer contains many defects, carriers are trapped in the defects, resulting in an increase in residual potential. Furthermore, when light irradiation is performed in the next cycle, some of the carriers trapped in the surface layer travel toward the photoreceptor surface.
Since the surface charge is neutralized, the charging ability decreases.
逆に、表面層が薄い場合には、感光体の表面電位が低下
し、複写機やプリンタ等のブOセス設計に負担を生じて
しまう。On the other hand, if the surface layer is thin, the surface potential of the photoreceptor decreases, creating a burden on the design of a copying machine, printer, or the like.
本発明は、このような事情に鑑みなされたものであって
、帯電能が優れており、残留電位が低く、かつ高感度の
電子写真感光体を提供することを目的とする。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an electrophotographic photoreceptor that has excellent charging ability, low residual potential, and high sensitivity.
[発明の構成コ
(問題点を解決するための手段)
本発明者らは、種々研究を重ねた結果、電子写真感光体
の表面層として超格子構造を用いることにより、上記目
的を達成し得ることを見出し、本発明を完成するに至っ
た。[Configuration of the Invention (Means for Solving Problems) As a result of various studies, the present inventors have discovered that the above object can be achieved by using a superlattice structure as the surface layer of an electrophotographic photoreceptor. This discovery led to the completion of the present invention.
即ち、本発明の電子写真感光体は、導電性支持体、光導
電層および表面層を有する電子写真感光体において、前
記表面層は、窒素を含む非晶質シリコン薄膜と主として
硼素と窒素からなる半導体薄膜とを交互に積層して構成
され、かつそれぞれの薄膜の膜厚が30〜500人であ
ることを特徴とする。That is, the electrophotographic photoreceptor of the present invention is an electrophotographic photoreceptor having a conductive support, a photoconductive layer, and a surface layer, wherein the surface layer is composed of an amorphous silicon thin film containing nitrogen and mainly boron and nitrogen. It is characterized in that it is constructed by alternately laminating semiconductor thin films, and each thin film has a thickness of 30 to 500 layers.
窒素を含む非晶質シリコン(a−8iN)@膜中の窒素
濃度は、好ましくは1〜301N子%、より好ましくは
5〜15原子%である。The nitrogen concentration in the nitrogen-containing amorphous silicon (a-8iN) film is preferably 1 to 301 N atoms, more preferably 5 to 15 at. %.
(作 用)
本発明の電子写真感光体では、表面層が超格子構造を有
しており、超格子構造を構成する薄膜では量子効果によ
りキャリアの寿命はバルク層より5〜10倍長い。また
、それぞれの薄膜は膜厚が薄いため、キャリアはトンネ
ル効果によって容易にIII中を通り抜けることができ
るので、キャリアの実効移動度はバルク層における移動
度に等しく、即ち、キャリアの走行性に優れている。(Function) In the electrophotographic photoreceptor of the present invention, the surface layer has a superlattice structure, and the lifetime of carriers in the thin film constituting the superlattice structure is 5 to 10 times longer than that in the bulk layer due to quantum effects. In addition, since each thin film is thin, carriers can easily pass through III due to the tunnel effect, so the effective mobility of carriers is equal to the mobility in the bulk layer, that is, carriers have excellent mobility. ing.
このように、表面層におけるキャリアの寿命が長く、か
つキャリアの走行性が優れているため、電子写真感光体
の感度は著しく向上することになる。As described above, since the life of the carrier in the surface layer is long and the carrier has excellent running properties, the sensitivity of the electrophotographic photoreceptor is significantly improved.
(実施例)
第1図は、本発明の一実施例になる電子写真感光体の断
面構造を示す図である。同図において、1は導電性支持
体である。該導電性支持体の上には障壁層2が形成され
、その上には光導電層3が形成されている。更に、光導
電層3の上には表面層4が形成されている。(Example) FIG. 1 is a diagram showing a cross-sectional structure of an electrophotographic photoreceptor according to an example of the present invention. In the figure, 1 is a conductive support. A barrier layer 2 is formed on the conductive support, and a photoconductive layer 3 is formed thereon. Furthermore, a surface layer 4 is formed on the photoconductive layer 3.
以下、第1図に示す電子写真感光体の構成について、よ
り詳細に説明する。Hereinafter, the structure of the electrophotographic photoreceptor shown in FIG. 1 will be explained in more detail.
導電性支持体1は、通常はアルミニウム製のドラムで構
成される。The conductive support 1 usually consists of a drum made of aluminum.
障壁層2はμc−8i(微結晶シリコン)やa−3i:
l−1を用いて形成してもよく、またa−BN:H(窒
素および水素を添加したアモルファス硼素)を使用して
もよい。更に、絶縁性の膜を用いてもよい。例えば、μ
c−8i:H又はa−8I:Hに炭素C1窒素N及び酸
素0から選択された元素の一種以上を含有させることに
より、高抵抗の絶縁性障壁層を形成することができる。The barrier layer 2 is made of μc-8i (microcrystalline silicon) or a-3i:
It may be formed using a-BN:H (amorphous boron to which nitrogen and hydrogen are added). Furthermore, an insulating film may be used. For example, μ
A high-resistance insulating barrier layer can be formed by containing one or more elements selected from carbon, C, nitrogen, N, and oxygen in c-8i:H or a-8I:H.
障壁層2の膜厚は100人〜10μ−が好ましい。The thickness of the barrier layer 2 is preferably 100 μm to 10 μm.
μc−8tは、粒径が約数十オングストロームの微結晶
のシリコンと非晶質シリコンとの混合層により形成され
ているものと考えられ、以下のような物性上の特徴を有
している。第一に、X線回折測定では2θが28〜28
.5°付近にある結晶回折パターンを示し、ハローのみ
が現れる無定形のa−3iから明確に区別される。第二
に、μc−8iの暗抵抗は10”Ω・α以上に調整する
ことができ、暗抵抗が106Ω・1のポリクリスタリン
シリコンからも明確に区別される。μc-8t is considered to be formed of a mixed layer of microcrystalline silicon and amorphous silicon with a grain size of about several tens of angstroms, and has the following physical characteristics. First, in X-ray diffraction measurement, 2θ is 28 to 28
.. It shows a crystal diffraction pattern around 5° and is clearly distinguished from amorphous a-3i, in which only a halo appears. Second, the dark resistance of μc-8i can be adjusted to more than 10”Ω·α, and it is clearly distinguished from polycrystalline silicon, which has a dark resistance of 10 6 Ω·1.
上記障壁層2は、導電性支持体1と光導電層3との間の
電荷の流れを抑制することにより感光体表面の電荷保持
機能を高め、感光体の帯電能を高めるために形成される
ものである。従って、半導体層を障壁層に用いてカール
ソン方式の感光体を構成する場合には、表面に帯電させ
た電荷の保持能力を低下させないために、障壁層2をP
型またはN型とする。即ち、感光体表面を正帯電させる
に表面を負帯電させる場合には障壁層2をN型とし、表
面電荷を中和するホールが光導電層へ注入されるのを防
止する。障壁112から注入されるキャリアは光の入射
で光導電層3内に発生するキャリアに対してノイズとな
るから、上記のようにしてキャリアの注入を防止するこ
とは感度の向上をもたらす。なお、μc−8t:Hやa
−8i:HをP型にするためには、周期律表の第■族に
属する元素、例えば硼素B、アルミニウムAJL1ガリ
ウムQa、インジウムIn、及びタリウム74等をドー
ピングすることが好ましい。また、μC−8i:Hやa
−8i:HをN型にするためには周期律表の第V族に属
する元素、例えば窒素、燐P。The barrier layer 2 is formed in order to suppress the flow of charges between the conductive support 1 and the photoconductive layer 3, thereby increasing the charge retention function of the photoreceptor surface and increasing the charging ability of the photoreceptor. It is something. Therefore, when forming a Carlson type photoreceptor using a semiconductor layer as a barrier layer, the barrier layer 2 must be made of
type or N type. That is, when the surface of the photoreceptor is charged negatively rather than positively charged, the barrier layer 2 is made of N type to prevent holes that neutralize the surface charge from being injected into the photoconductive layer. Since carriers injected from the barrier 112 become noise with respect to carriers generated in the photoconductive layer 3 upon incidence of light, preventing carrier injection as described above improves sensitivity. In addition, μc-8t:H or a
In order to make -8i:H P-type, it is preferable to dope it with an element belonging to Group Ⅰ of the periodic table, such as boron B, aluminum AJL1 gallium Qa, indium In, and thallium 74. Also, μC-8i:H and a
-8i: To make H type N-type, use an element belonging to Group V of the periodic table, such as nitrogen or phosphorus P.
砒素AS1アンチモンsb、及びビスマス81等をドー
ピングすることが好ましい。It is preferable to dope with arsenic AS1 antimony sb, bismuth 81, or the like.
障壁層2の上に形成される光導電113は、a−8i:
H又はμc−8i:Hにより構成することができる。The photoconductor 113 formed on the barrier layer 2 is a-8i:
H or μc-8i:H.
光導電層3に光が入射するとキャリアが発生し、このキ
ャリアのうち一方の極性のものは感光体表面の帯電電荷
と中和し、他方の極性のものは光導電層3を走行して導
電性支持体に到達する。When light enters the photoconductive layer 3, carriers are generated. Among these carriers, carriers of one polarity neutralize the charges on the surface of the photoreceptor, and carriers of the other polarity travel on the photoconductive layer 3 and become conductive. Reach the sexual support.
光導電層の上に表面層4が形成されている。表面層4は
、a−s + N : H薄膜およびa−BN薄膜を交
互に積層してなる超格子構造を有している。A surface layer 4 is formed on the photoconductive layer. The surface layer 4 has a superlattice structure formed by alternately laminating a-s+N:H thin films and a-BN thin films.
光導電層3を構成するa−3i:H等は、その屈折率が
3乃至3.4と比較的大きいため、表面での光反射が起
きやすい。このような光反射が生じると、光導電層3に
吸収される光量の割合いが低下し、光損失が大きくなる
。このため、表面1!f4を設けて反射を防止すること
としている。また、表面層4を設けることにより、光導
電層3が損傷から保護される。さらに、表面層を形成す
ることにより、帯電能が向上し、表面に電荷がよくのる
ようになる。Since a-3i:H and the like constituting the photoconductive layer 3 have a relatively large refractive index of 3 to 3.4, light reflection easily occurs on the surface. When such light reflection occurs, the proportion of the amount of light absorbed by the photoconductive layer 3 decreases, increasing optical loss. For this reason, surface 1! f4 is provided to prevent reflection. Also, by providing the surface layer 4, the photoconductive layer 3 is protected from damage. Furthermore, by forming the surface layer, the charging ability is improved, and the charge can be easily deposited on the surface.
障壁層2、光導′Ili層3および表面層4を構成する
a−8i :H,a−8iN:Hおよびμc−8i:H
における水、素の含有量は、0.01〜30原子%が好
ましく、1〜25原子%がより好ましい。このような水
素の含有量により、シリコンのダングリングボンドが補
償され、暗抵抗と明抵抗とが調和のとれたものとなり、
光導電特性が向上する。a-8i:H, a-8iN:H and μc-8i:H constituting the barrier layer 2, the light guiding layer 3 and the surface layer 4
The content of water and element in is preferably 0.01 to 30 at%, more preferably 1 to 25 at%. This hydrogen content compensates for the dangling bonds of silicon, and balances the dark and bright resistances.
Photoconductive properties are improved.
a−8i:H層をグロー放電分解法により成膜するには
、原料としてS (H4及び3i2Hs等のシラン類ガ
スを反応室に導入し、高周波によりグロー放電すること
により薄層中にHを添加することができる。必要に応じ
て、シラン類のキャリアガスとして水素又はヘリウムガ
スを使用することができる。一方、S i F4ガス及
びS i Cf4ガス等のハロゲン化ケイ素を原料ガス
として使用することができる。また、シラン類ガスとハ
ロゲン化ケイ素ガスとの混合ガスで反応させても、同様
にHを含有するa−3i:)−1を成膜することができ
る。なお、グロー放電分解法によらず、例えば、スパッ
タリング等の物理的な方法によってもこれ等の薄層を形
成することができる。a-8i: To form the H layer by glow discharge decomposition, S (H4 and silane gases such as 3i2Hs) are introduced into the reaction chamber as raw materials, and H is produced in the thin layer by glow discharge using high frequency. If necessary, hydrogen or helium gas can be used as a carrier gas for silanes.On the other hand, silicon halides such as SiF4 gas and SiCf4 gas can be used as a raw material gas. Furthermore, a-3i:)-1 containing H can be similarly formed by reacting with a mixed gas of a silane gas and a silicon halide gas. Note that these thin layers can be formed not by the glow discharge decomposition method but also by a physical method such as sputtering.
表面層4を構成する一方の4瑛であるa−8iN:Hを
形成するには、上述の方法において、原料ガス中1cN
2 o、Nf−1s 、NO2、N2等を添加すればよ
い。In order to form a-8iN:H which is one of the four layers constituting the surface layer 4, in the above-mentioned method, 1 cN in the raw material gas is added.
2o, Nf-1s, NO2, N2, etc. may be added.
μc−3+層も、a−3i:Hと同様に、高周波グロー
放電分解法により、シランガスを原料として、成膜する
ことができる。この場合に、支持体の温度をa−8t
:Hを形成する場合よりも高く設定し、高周波電力も
a−8i:Hの場合よりも高く設定すると、μC−3i
:)(を形成しやすくなる。また、支持体濃度及び高周
波電力を高くすることにより、シランガスなどの原料ガ
スの流量を増大させることができ、その結果、成膜速度
を早くすることができる。また、原料ガスのSiHs及
び5)2H6等の高次のシランガスを水素で希釈したガ
スを使用することにより、μC−8i:)−1を一層高
効率で形成することができる。Similarly to a-3i:H, the μc-3+ layer can also be formed using silane gas as a raw material by the high-frequency glow discharge decomposition method. In this case, the temperature of the support is set to a-8t
:H is set higher than in the case of forming a-8i:H, and the high frequency power is also set higher than in the case of a-8i:H.
:) (). Also, by increasing the support concentration and high frequency power, the flow rate of raw material gas such as silane gas can be increased, and as a result, the film formation rate can be increased. Further, by using a gas obtained by diluting SiHs as a raw material gas and a high-order silane gas such as 5)2H6 with hydrogen, μC-8i:)-1 can be formed with higher efficiency.
このように構成される電子写真感光体の表面を、コロナ
放電により約500Vの正電圧で帯電させた状態で光(
hν)が入射すると、光導電層3において電子と正孔の
キャリアが発生する。この伝導帯の電子は、感光体内の
電界により表面層4側に向けて加速され、正孔は導電性
支持体1側に向けて加速される。この場合、従来の高抵
抗の絶縁性単一層からなる表面層を用いると、前述のよ
うに、膜厚が厚いと光導電層から表面へ流れるキャリア
が表面層を通過できず、その結果、感度が悪くなり、ま
たダングリングボンド等の欠陥にキャリアがトラップさ
れ、残留電位の上昇を招いてしまう。一方、膜厚が薄い
と感光体の表面電位が低下し、複写機やプリント等のプ
ロセス設計に負担を生じてしまう。これに対し、本発明
の感光体のように、表面層を超格子構造とするとポテン
シャル井戸層においては、量子効果のために、超格子構
造でない単一層の場合に比して、キャリアの寿命が5乃
至10倍と長い。また、超格子構造においては、バンド
ギャップの不連続性により、周期的なバリア層が形成さ
れるが、キャリアはトンネル効果で容易にバイアス層を
通り抜けるので、キャリアの実効移動度はバルクにおけ
る移動度と同等であり、キャリアの走行性が優れている
。以上のごとく、薄層を積層した超格子構造によれば、
高光導電特性を得ることができ、従来の感光体よりも鮮
明な画像を得ることができる。The surface of the electrophotographic photoreceptor constructed in this manner is charged with a positive voltage of approximately 500 V by corona discharge, and then exposed to light (
hv), electron and hole carriers are generated in the photoconductive layer 3. Electrons in the conduction band are accelerated toward the surface layer 4 side by the electric field within the photoreceptor, and holes are accelerated toward the conductive support 1 side. In this case, if a conventional surface layer consisting of a single high-resistance insulating layer is used, as mentioned above, if the film is thick, carriers flowing from the photoconductive layer to the surface cannot pass through the surface layer, resulting in sensitivity In addition, carriers are trapped in defects such as dangling bonds, leading to an increase in residual potential. On the other hand, if the film thickness is thin, the surface potential of the photoreceptor decreases, creating a burden on process design for copying machines, printing, etc. On the other hand, when the surface layer has a superlattice structure as in the photoreceptor of the present invention, the lifetime of carriers in the potential well layer becomes shorter than that of a single layer without a superlattice structure due to quantum effects. It is 5 to 10 times longer. In addition, in a superlattice structure, a periodic barrier layer is formed due to discontinuity in the band gap, but carriers easily pass through the bias layer due to the tunnel effect, so the effective mobility of carriers is determined by the mobility in the bulk. The carrier has excellent runnability. As mentioned above, according to the superlattice structure made of laminated thin layers,
It is possible to obtain high photoconductivity properties, and it is possible to obtain clearer images than conventional photoreceptors.
以下に第3図を参照し、上記実施例の電子写真感光体を
グロー放電法により製造する装置、並びに製造方法を説
明する。同図において、ガスボンベ21,22.23.
24には、例えば夫々S i H4、B2 Hs 1H
2、CH4等の原料ガスが収容されている。これらガス
ボンベ内のガスは、流量調整用のバルブ26及び配管2
7を介して混合器28に供給されるようになっている。Referring to FIG. 3, an apparatus and a manufacturing method for manufacturing the electrophotographic photoreceptor of the above embodiment by a glow discharge method will be described below. In the figure, gas cylinders 21, 22, 23.
24, for example, S i H4, B2 Hs 1H, respectively.
2. Contains raw material gas such as CH4. The gas in these gas cylinders is controlled by a valve 26 for flow rate adjustment and piping 2.
7 to a mixer 28.
各ボンベには圧力計25が設置されており、該圧力計2
5を監視しつつパルプ26を調整することにより混合器
28に供給する各原料ガスの流量及び混合比を調節でき
る。混合器28にて混合されたガスは反応容器29に供
給される。反応容器29の底部31には、回転軸30が
鉛直方向の回りに回転可能に取付けられている。該回転
軸30の上端に、円板状の支持台32がその面を回転軸
30に垂直にして固定されている。反応容器29内には
、円筒状の電極33がその軸中心を回転軸30の軸中心
と一致させて底部31上に設置されている。A pressure gauge 25 is installed in each cylinder, and the pressure gauge 25 is installed in each cylinder.
By adjusting the pulp 26 while monitoring 5, the flow rate and mixing ratio of each raw material gas supplied to the mixer 28 can be adjusted. The gases mixed in the mixer 28 are supplied to a reaction vessel 29. A rotating shaft 30 is attached to the bottom 31 of the reaction vessel 29 so as to be rotatable around the vertical direction. A disk-shaped support 32 is fixed to the upper end of the rotating shaft 30 with its surface perpendicular to the rotating shaft 30. Inside the reaction vessel 29, a cylindrical electrode 33 is installed on the bottom 31 with its axial center aligned with the axial center of the rotating shaft 30.
感光体のドラム基体34が支持台32上にその軸中心を
回転軸30の軸中心と一致させて載置されており、この
ドラム基体34の内側にはドラム基体加熱用のヒータ3
5が配設されている。電極33とドラム基体34との間
には高周波電源36が接続されており、電極33および
ドラム基体34間に高周波電流が供給されるようになっ
ている。回転軸30はモータ38により回転駆動される
。反応容器29内の圧力は圧力計37により監視され、
反応容器29はゲートパルプ38を介して真空ポンプ等
の適宜の排気手段に連結されている。A drum base 34 of a photoreceptor is placed on a support base 32 with its axial center aligned with the axial center of the rotating shaft 30, and a heater 3 for heating the drum base is installed inside the drum base 34.
5 are arranged. A high frequency power source 36 is connected between the electrode 33 and the drum base 34, so that a high frequency current is supplied between the electrode 33 and the drum base 34. The rotating shaft 30 is rotationally driven by a motor 38. The pressure inside the reaction vessel 29 is monitored by a pressure gauge 37,
The reaction vessel 29 is connected to a suitable evacuation means such as a vacuum pump via a gate pulp 38.
上記製造装置により感光体を製造する場合には、反応容
器29内にドラム基体34を設置した後、ゲートバルブ
39を開にして反応容器29内を約0.1Torrの圧
力以下に排気する。次いで、ボンベ21,22.23.
24から所要の反応ガスを所定の混合比で混合して反応
容器29内に導入する。この場合に、反応容器29内に
導入するガス流量は反応容器29内の圧力が0.1乃至
1.。When manufacturing a photoreceptor using the above manufacturing apparatus, the drum base 34 is placed in the reaction vessel 29, and then the gate valve 39 is opened to evacuate the inside of the reaction vessel 29 to a pressure of about 0.1 Torr or less. Next, cylinders 21, 22, 23.
24, the required reaction gases are mixed at a predetermined mixing ratio and introduced into the reaction vessel 29. In this case, the flow rate of the gas introduced into the reaction container 29 is such that the pressure inside the reaction container 29 ranges from 0.1 to 1. .
T orrになるように設定する。次いで、モータ38
を作動させてドラム基体34を回転させ、ヒータ35に
よりドラム基体34を一定温度に加熱すると共に、高周
波電源36により電極33とドラム基体34との−に高
周波lI流を供給して、両者間にグロー放電を形成する
。これにより、ドラム基体34上にμC−8i:Hやa
−3i:)(が堆積する。なお、原料ガス中にN201
NH3、N 02 s N2 、CH4、C2H4,0
2カス等を使用することにより、窒素、炭素、酸素をμ
C−8i:Hヤa−8i:H中に含有させることができ
る。Set it so that it becomes Torr. Next, the motor 38
is activated to rotate the drum base 34, and the heater 35 heats the drum base 34 to a constant temperature, and the high frequency power supply 36 supplies a high frequency I current between the electrode 33 and the drum base 34 to create a current between them. Forms a glow discharge. As a result, μC-8i:H and a
-3i: ) (is deposited. Note that N201 in the source gas
NH3, N 02 s N2 , CH4, C2H4,0
Nitrogen, carbon, and oxygen can be
C-8i:H can be contained in a-8i:H.
このように、この発明に係る電子写真感光体は、クロー
ズドシステムの製造装置で製造することができるため、
人体に対して安全である。As described above, since the electrophotographic photoreceptor according to the present invention can be manufactured using a closed system manufacturing apparatus,
Safe for humans.
次に、この発明に係る電子写真感光体を成膜し、電子写
真特性を試験した結果について説明する。Next, the results of testing the electrophotographic properties of an electrophotographic photoreceptor according to the present invention formed into a film will be described.
試験例1
必要に応じて、干渉防止のために、酸処理、アルカリ処
理及びサンドブラスト処理を施した直径が80履、幅が
350Hのアルミニウム製ドラム基体を反応容器内に装
着し、反応容器を約104トルの真空度に排気した。ド
ラム基体を250℃に加熱し、10rpgiで自転させ
つつ、S I H4ガスを500SCCM、B2 H6
ガスをSiH4ガスに対する流量比で10°1という流
量で反応器内に導入し、反応器内の圧力を1Torrに
調節し、13.56MHzの高周波電力を印加してプラ
ズマを発生させ、ドラム基体上にP型a−3i:Hから
なる障壁層を形成した。Test Example 1 If necessary, to prevent interference, an aluminum drum base with a diameter of 80mm and a width of 350H, which has been subjected to acid treatment, alkali treatment, and sandblasting, is installed in the reaction vessel. The vacuum was evacuated to 104 torr. While heating the drum base to 250°C and rotating it at 10 rpm, 500 SCCM of S I H4 gas, B2 H6
Gas was introduced into the reactor at a flow rate ratio of 10°1 to SiH4 gas, the pressure inside the reactor was adjusted to 1 Torr, and a high frequency power of 13.56 MHz was applied to generate plasma. A barrier layer made of P-type a-3i:H was formed.
次いで、SiH+ガスを500SCCM、H2ガスを2
00SCCM、B2 H6ガスをSiH+ガスとの流量
比10−6で反応器内に導入し、500Wの高周波電力
を加えて30μ−のi型a−8i:Hからなる光導電層
を形成した。Next, 500 SCCM of SiH+ gas and 2
00SCCM, B2 H6 gas was introduced into the reactor at a flow rate ratio of 10-6 to SiH+ gas, and a high frequency power of 500 W was applied to form a photoconductive layer consisting of 30 μ- i type a-8i:H.
次ニ、8 i H4カスを1508CCM1H2ガスを
150SCCM、N2ガスを300SCCM導入し、3
00Wの高周波電力を印加して50人のa−8I N
: Hiil膜(窒素濃度3原子%)を形成した。次い
で、5I84ガスを0とし、N2で希釈された5%82
8a ガス!250sccM、H2ガスe300scc
M、N2 ガス@150SCCM導入し、400Wの高
周波電力を印加して50人のa−8NW111を形成し
た。このような操作を繰返し、10層のa−8iN:)
−11膜と10層のBN薄膜からなる1 000人の表
面層を形成した。Next, 8 i Introduced 1508 CCM of H4 gas, 150 SCCM of H2 gas, and 300 SCCM of N2 gas, and
50 people a-8I N by applying 00W high frequency power
: A Hiil film (nitrogen concentration: 3 at.%) was formed. Then the 5I84 gas was zeroed and the 5%82 diluted with N2
8a Gas! 250sccM, H2 gas e300scc
M, N2 gas @ 150 SCCM was introduced, and 400 W of high frequency power was applied to form 50 A-8NW111. Repeat this operation to create 10 layers of a-8iN:)
A surface layer of 1,000 layers was formed consisting of -11 film and 10 layers of BN thin film.
このようにして形成した感光体表面を約500■で正帯
電し、白色光をを露光すると、この光は光導電層で吸収
され、電子正孔対のキャリアが発生する。この試験例に
おいては、多数のキャリアが発生し、キャリアの寿命が
高く、高い走行性が得られた。これにより、鮮明で高品
質の画像が得られた。また、この試験例で製造された感
光体を、繰返し帯電させたところ、転写画像の再現性及
び安定性は極めて良好であり、更に、耐コロナ性、耐湿
性及び耐摩耗性等の耐久性が優れていることが実証され
た。When the surface of the photoreceptor thus formed is positively charged at about 500 μm and exposed to white light, this light is absorbed by the photoconductive layer and carriers of electron-hole pairs are generated. In this test example, a large number of carriers were generated, the carriers had a long life, and high running performance was obtained. This resulted in clear, high-quality images. In addition, when the photoreceptor manufactured in this test example was repeatedly charged, the reproducibility and stability of the transferred image were extremely good, and the durability such as corona resistance, moisture resistance, and abrasion resistance was also improved. Proven to be excellent.
試験例2
表面層を3種類の薄膜の超格子構造により構成したこと
を除いて、試験例1と同様の手順で電子写真感光体を製
造した。3種類の薄膜は、2種類の5)1mを試験例1
と同様a−8iN:H(窒素濃度3@子%)とa−BN
により構成し、3番目の薄膜をa−8iN:H(窒素濃
度8原子%〉により構成した。この薄膜は、SiH+ガ
スを150SCCM%H2ガ2f300sccM1N2
ガスを3008CCM導入し、400Wの高周波電力を
印加することにより得られた。3番目の1111の膜厚
は50人であり、表面層全体の膜厚は2500人であっ
た。Test Example 2 An electrophotographic photoreceptor was manufactured in the same manner as in Test Example 1, except that the surface layer was composed of a superlattice structure of three types of thin films. The three types of thin films were two types of 5) 1m in Test Example 1.
Same as a-8iN:H (nitrogen concentration 3@%) and a-BN
The third thin film was made of a-8iN:H (nitrogen concentration 8 at%).This thin film was made of SiH+ gas at 150SCCM%H2Ga2f300sccM1N2
This was obtained by introducing 3008 CCM of gas and applying 400 W of high frequency power. The thickness of the third layer 1111 was 50 layers, and the thickness of the entire surface layer was 2500 layers.
このようにして製造された感光体は、半導体レーザの発
振波長である780乃至790n−の長波長光に対して
も高い感度を有する。この感光体を半導体レーザプリン
タに搭載してカールソンプロセスにより画像を形成した
ところ、感光体表面の露光量が25ergdである場合
でも、鮮明で高解像度の画像を得ることができた。The photoreceptor manufactured in this manner has high sensitivity even to long wavelength light of 780 to 790 nm, which is the oscillation wavelength of a semiconductor laser. When this photoreceptor was installed in a semiconductor laser printer and an image was formed by the Carlson process, a clear, high-resolution image could be obtained even when the exposure amount on the photoreceptor surface was 25 ergd.
この感光体を繰返し帯電したところ、転写画像の再現性
及び安定性が高く、耐コロナ性、耐湿性及び耐摩耗性な
どの耐久性が優れていた。When this photoreceptor was repeatedly charged, the transferred image had high reproducibility and stability, and had excellent durability such as corona resistance, moisture resistance, and abrasion resistance.
なお、薄層の種類は、上記試験例のように2種類および
3種類に限らず、更にそれ以上の種類の薄層を繰返し積
層してもよい。要するに、a−8iN薄層とBN薄層の
境界が形成されれば良い。Note that the types of thin layers are not limited to two and three types as in the above test example, and more types of thin layers may be repeatedly laminated. In short, it is sufficient if the boundary between the a-8iN thin layer and the BN thin layer is formed.
[発明の効果]
本発明によれば、表面層に超格子構造を用いているため
、表面層におけるキャリアの走行性が良好であるととも
にキャリアの寿命が長く、かつ帯電特性の優れた電子写
真感光体を得ることができる。[Effects of the Invention] According to the present invention, since a superlattice structure is used in the surface layer, carrier mobility in the surface layer is good, the carrier has a long life, and an electrophotographic photosensitive material with excellent charging characteristics can be obtained. You can get a body.
第1図は本発明の実施例に係る電子写真感光体一
を示す断面図、第?図は本発明の実施例に係る電子写真
感光体の製造装置を示す図である。
1・・・導電性支持体、2・・・障壁層、3・・・光導
電層、4・・・表面層。
出願人代理人 弁理士 鈴江武彦
第 1 凶
第2図FIG. 1 is a sectional view showing an electrophotographic photoreceptor according to an embodiment of the present invention. The figure shows an apparatus for manufacturing an electrophotographic photoreceptor according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Conductive support body, 2... Barrier layer, 3... Photoconductive layer, 4... Surface layer. Applicant's agent Patent attorney Takehiko Suzue No. 1 No. 2
Claims (8)
子写真感光体において、前記表面層は、窒素を含む非晶
質シリコン薄膜と主として硼素と窒素からなる半導体薄
膜とを交互に積層して構成され、かつそれぞれの薄膜の
膜厚が30〜500Åであることを特徴とする電子写真
感光体。(1) In an electrophotographic photoreceptor having a conductive support, a photoconductive layer, and a surface layer, the surface layer is formed by alternately laminating an amorphous silicon thin film containing nitrogen and a semiconductor thin film mainly composed of boron and nitrogen. 1. An electrophotographic photoreceptor characterized in that each thin film has a thickness of 30 to 500 Å.
する元素から選択された少なくとも一種の元素を含むこ
とを特徴とする特許請求の範囲第1項記載の電子写真感
光体。(2) The electrophotographic photoreceptor according to claim 1, wherein the surface layer contains at least one element selected from elements belonging to Group III or V of the periodic table.
属する元素から選択された少なくとも一種の元素を含む
ことを特徴とする特許請求の範囲第1項記載の電子写真
感光体。(3) The electrophotographic photoreceptor according to claim 1, wherein the photoconductive layer contains at least one element selected from elements belonging to Group III or V of the periodic table. .
少なくとも一種を含むことを特徴とする特許請求の範囲
第1項記載の電子写真感光体。(4) The electrophotographic photoreceptor according to claim 1, wherein the photoconductive layer contains at least one of carbon, oxygen, and nitrogen.
又は少なくとも一部が微結晶化した半導体からなること
を特徴とする特許請求の範囲第1項記載の電子写真感光
体。(5) The electrophotographic photoreceptor according to claim 1, wherein at least a portion of the photoconductive layer is made of an amorphous semiconductor or at least a portion of a microcrystalline semiconductor.
導体又は少なくとも一部が微結晶化した半導体からなる
障壁層を有することを特徴とする特許請求の範囲第1項
記載の電子写真感光体。(6) A barrier layer made of an amorphous semiconductor or at least a partially microcrystalline semiconductor is provided between the conductive support and the photoconductive layer. electrophotographic photoreceptor.
する元素から選択された少なくとも一種の元素を含むこ
とを特徴とする特許請求の範囲第1項記載の電子写真感
光体。(7) The electrophotographic photoreceptor according to claim 1, wherein the barrier layer contains at least one element selected from elements belonging to Group III or V of the periodic table.
なくとも一種を含むことを特徴とする特許請求の範囲第
1項記載の電子写真感光体。(8) The electrophotographic photoreceptor according to claim 1, wherein the barrier layer contains at least one of carbon, oxygen, and nitrogen.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989387A JPS63187254A (en) | 1987-01-30 | 1987-01-30 | Electrophotographic sensitive body |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989387A JPS63187254A (en) | 1987-01-30 | 1987-01-30 | Electrophotographic sensitive body |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63187254A true JPS63187254A (en) | 1988-08-02 |
Family
ID=12011874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989387A Pending JPS63187254A (en) | 1987-01-30 | 1987-01-30 | Electrophotographic sensitive body |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63187254A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6740977B2 (en) * | 2002-04-24 | 2004-05-25 | Samsung Electronics Co., Ltd. | Insulating layers in semiconductor devices having a multi-layer nanolaminate structure of SiNx thin film and BN thin film and methods for forming the same |
EP1788117A1 (en) * | 2005-11-18 | 2007-05-23 | United Technologies Corporation | Multilayered boron nitride/silicon nitride coatings |
-
1987
- 1987-01-30 JP JP1989387A patent/JPS63187254A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6740977B2 (en) * | 2002-04-24 | 2004-05-25 | Samsung Electronics Co., Ltd. | Insulating layers in semiconductor devices having a multi-layer nanolaminate structure of SiNx thin film and BN thin film and methods for forming the same |
EP1788117A1 (en) * | 2005-11-18 | 2007-05-23 | United Technologies Corporation | Multilayered boron nitride/silicon nitride coatings |
US7510742B2 (en) | 2005-11-18 | 2009-03-31 | United Technologies Corporation | Multilayered boron nitride/silicon nitride fiber coatings |
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