JPS62189732A - Cleaning apparatus for semiconductor wafer - Google Patents
Cleaning apparatus for semiconductor waferInfo
- Publication number
- JPS62189732A JPS62189732A JP3155786A JP3155786A JPS62189732A JP S62189732 A JPS62189732 A JP S62189732A JP 3155786 A JP3155786 A JP 3155786A JP 3155786 A JP3155786 A JP 3155786A JP S62189732 A JPS62189732 A JP S62189732A
- Authority
- JP
- Japan
- Prior art keywords
- hanger
- cleaning
- pure water
- carrier
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 70
- 239000004065 semiconductor Substances 0.000 title claims description 14
- 235000012431 wafers Nutrition 0.000 claims description 43
- 239000007788 liquid Substances 0.000 claims description 23
- 238000005507 spraying Methods 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 31
- 238000007599 discharging Methods 0.000 abstract description 5
- 239000000428 dust Substances 0.000 abstract description 4
- 239000003814 drug Substances 0.000 abstract 3
- 239000000843 powder Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 description 32
- 238000000034 method Methods 0.000 description 6
- 239000000969 carrier Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Cleaning By Liquid Or Steam (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
足業上辺主皿l立
本発明は、半導体装置の製造過程において半導体ウェハ
(以下小にウェハと称する)の洗浄工程で利用される半
導体ウェハ用洗浄装置に係り、特にウェハが収納された
ウェハキャリアを搭載したキャリアハンガーに対して洗
浄液をかける洗浄液放出手段を備えたものに関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a cleaning device for semiconductor wafers (hereinafter simply referred to as wafers) used in the cleaning process of semiconductor wafers (hereinafter referred to as wafers) in the manufacturing process of semiconductor devices. The present invention relates to a device including a cleaning liquid discharging means for spraying cleaning liquid onto a carrier hanger on which a wafer carrier containing wafers is mounted.
従未久仮玉
例えば半導体装置の製造過程において、ウェハに所定の
デバイスを種々な工程を経て順次形成させる際、各デバ
イス形成工程のそれぞれの間にウェハを洗浄する工程を
介在させている。ウェハの洗浄工程では、適数枚のウェ
ハをウェハキャリアに収納した状態で、薬液−純水一薬
液一純水・・・といった具合に薬液槽および純水槽に交
互に浸漬させる方式がとられる。このような方式では、
複数個のウェハキャリアを一度に各洗浄槽に浸漬させる
ため、例えば第3図に示すようなキャリアハンガー5に
前記ウェハキャリアを搭載させて、これを適宜なハンガ
ー移送機でもって前記各洗浄槽に順次移送させて浸漬さ
せていくのが一般的である。BACKGROUND ART For example, in the process of manufacturing semiconductor devices, when predetermined devices are sequentially formed on a wafer through various steps, a step of cleaning the wafer is interposed between each device forming step. In the wafer cleaning process, a suitable number of wafers are housed in a wafer carrier and are alternately immersed in a chemical bath and a pure water bath in the following manner: chemical solution, pure water, chemical solution, pure water, and so on. In such a method,
In order to immerse a plurality of wafer carriers in each cleaning tank at the same time, the wafer carriers are mounted on a carrier hanger 5 as shown in FIG. Generally, the materials are transferred and immersed in sequence.
洗浄工程の流れを説明する。まず、キャリアハンガー5
の取手部51をハンガー移送機のチャック機構で保持し
て、薬液槽内に浸漬させてウェハを薬液洗浄する。薬液
槽では薬液を約80℃に恒温して気泡を発生させること
でウェハを洗浄させるのが能率的でもあり一般的でもあ
る。この後、再びキャリアハンガー5の取手部51を前
記チャック機構で保持して薬液槽から取り出す。これを
ハンガー移送機でもって純水槽がある場所にまで移送さ
せてから、該純水槽にキャリアハンガー5を浸漬させて
、ウェハおよびキャリアハンガー5に付着している薬液
を洗い流す。The flow of the cleaning process will be explained. First, carrier hanger 5
The handle portion 51 of the wafer is held by the chuck mechanism of the hanger transfer machine, and the wafer is immersed in a chemical solution tank to clean the wafer with the chemical solution. In a chemical bath, it is both efficient and common to clean the wafer by heating the chemical solution at a constant temperature of about 80° C. to generate bubbles. Thereafter, the handle portion 51 of the carrier hanger 5 is held by the chuck mechanism again and the carrier hanger 5 is taken out from the chemical tank. The wafer is transported by a hanger transfer machine to a place where a pure water tank is located, and then the carrier hanger 5 is immersed in the pure water tank to wash away the chemical solution adhering to the wafer and the carrier hanger 5.
ところで、各洗浄槽内の洗浄液の量は、キャリアハンガ
ー5を洗浄槽へ浸漬させる際にチャック機構が前記洗浄
槽内の洗浄液に触れないように、キャリアハンガー5を
洗浄槽門番こ浸漬させた状態でキャリアハンガー5の取
手部51が露出する程度にさせている。By the way, the amount of cleaning liquid in each cleaning tank is determined by the amount of cleaning liquid in the cleaning tank when the carrier hanger 5 is immersed in the cleaning tank so that the chuck mechanism does not touch the cleaning liquid in the cleaning tank when the carrier hanger 5 is immersed in the cleaning tank. The handle portion 51 of the carrier hanger 5 is exposed.
■(′″゛ □占
しかしながら、薬液槽内において発生させている気泡が
薬液表面ではじけるため、キャリアハンガー5の取手部
51およびその周辺に薬液が不意に付着してしまう。勿
論、上述したように、キャリアハンガー5およびウェハ
に付着している薬液は純水槽で洗い流すが、純水の量も
上記のように設定されζいるためにキャリアハンガー5
の取手部51およびその周辺に不意に付着した薬液を洗
い流せない。このようにキャリアハンガー5に薬液が付
着していると、次に浸漬すべき薬液槽内の異なる薬液と
反応して、ウェハに形成しているデバイスに支障をきた
すおそれがあるので好ましくない。■('''゛ □Trust) However, since the air bubbles generated in the chemical tank burst on the surface of the chemical, the chemical suddenly adheres to the handle 51 of the carrier hanger 5 and its surroundings.Of course, as mentioned above, The chemical solution adhering to the carrier hanger 5 and the wafer is washed away in a pure water tank, but since the amount of pure water is also set as above, the carrier hanger 5
The chemical solution that accidentally adheres to the handle portion 51 and its surroundings cannot be washed away. If a chemical solution adheres to the carrier hanger 5 in this way, it is undesirable because it may react with a different chemical solution in the chemical solution tank to be immersed next and cause problems to the devices formed on the wafer.
そのため、純水の量を多くして前記薬液を洗い流すこと
が考えられるが、洗浄槽を大型にしなければならないと
共に、キャリアハンガー5の浸漬時にハンガー移送機の
チャック機構が純水に触れる9ととなり、チャック機構
が持つ微少な粉塵などが純水中に混入するから好ましく
ない。Therefore, it is conceivable to increase the amount of pure water to wash away the chemical solution, but this would require a larger cleaning tank and the chuck mechanism of the hanger transfer machine would come into contact with the pure water 9 when the carrier hanger 5 is immersed. This is undesirable because fine dust from the chuck mechanism gets mixed into the pure water.
このように、純水槽内の純水の量の設定に関して上記説
明したような相反する問題を生じる。In this way, conflicting problems as explained above arise regarding setting the amount of pure water in the pure water tank.
本発明は上記事情に鑑みて創案されたもので、チャック
機構が持つ微少な粉塵が純水中に混入されることなく、
キャリアハンガーの取手部およびその周辺に不意に付着
した薬液を簡単に洗い流すことができる半導体ウェハ用
洗浄装置を提供することを目的としている。The present invention was devised in view of the above circumstances, and it prevents minute dust from the chuck mechanism from being mixed into pure water.
It is an object of the present invention to provide a cleaning device for semiconductor wafers that can easily wash away chemical liquid that accidentally adheres to the handle portion of a carrier hanger and its surroundings.
U朽占゛ ゛るζめの−1
本発明にかかる半導体ウェハ用洗浄装置は、半導体ウェ
ハが適数枚収納されたウェハキャリアを搭載したキャリ
アハンガーの上端側にある取手部をハンガー移送機のチ
ャック機構で保持して、種々な洗浄液を収納した複数の
洗浄槽に対して順次移送して浸漬させる半導体ウェハ用
洗浄装置であって、前記キャリアハンガーの取手部およ
びその周辺に対して洗浄液をかける洗浄液放出手段を前
記チャック機構に設けた構成にしている。The cleaning device for semiconductor wafers according to the present invention has a handle on the upper end side of a carrier hanger on which a wafer carrier in which an appropriate number of semiconductor wafers is stored is connected to a handle of a hanger transfer machine. A cleaning device for semiconductor wafers that is held by a chuck mechanism and sequentially transferred to and immersed in a plurality of cleaning tanks containing various cleaning solutions, wherein the cleaning solution is applied to the handle portion of the carrier hanger and its surroundings. A cleaning liquid discharge means is provided in the chuck mechanism.
1刑
洗浄液放出手段から洗浄液を放出させると、キャリアハ
ンガーの取手部およびその周辺に対して前記洗浄液がか
かる。When the cleaning liquid is discharged from the cleaning liquid discharge means, the cleaning liquid is applied to the handle portion of the carrier hanger and its surrounding area.
1扇訓
以下図面を参照して本発明の一実施例について説明する
。第1図で例示している半導体ウェハ用洗浄装置におい
て、符号1はハンガー移送機を示しており、その下部に
はチャック機構2を備えている。ここで説明するハンガ
ー移送#111は、例えば薬液および純水が別々に収納
された2つの洗浄槽3.4間においてキャリアハンガー
5(第3図参照)を移送させるようになっている。そし
て、ハンガー移送機lは、常時において洗浄槽3.4の
上方中間地点Pに位置し、破線で示すような径路に沿っ
て移動するように適宜に遠隔操作されるように構°成さ
れている。1. An embodiment of the present invention will be described below with reference to the drawings. In the semiconductor wafer cleaning apparatus illustrated in FIG. 1, reference numeral 1 indicates a hanger transfer machine, and a chuck mechanism 2 is provided at the bottom of the hanger transfer machine. The hanger transfer #111 described here is designed to transfer the carrier hanger 5 (see FIG. 3) between two cleaning tanks 3.4 in which, for example, a chemical solution and pure water are stored separately. The hanger transfer machine 1 is always located at an intermediate point P above the cleaning tank 3.4, and is configured to be remotely controlled as appropriate so as to move along the path shown by the broken line. There is.
さて、チャック機構2は第2図(a)および(b)に示
すように、それぞれ平行に架設される操作環21.22
と、操作環21.22に固定されて連動する側面視略逆
さ凹状の可動片23.24とから構成されている。Now, as shown in FIGS. 2(a) and 2(b), the chuck mechanism 2 has operating rings 21 and 22 installed in parallel, respectively.
and a movable piece 23.24 which is fixed to and interlocks with the operating ring 21.22 and has a substantially inverted concave shape when viewed from the side.
このチャック機構2には、洗浄液を放出させる洗浄液放
出手段6が取りつけられている。前記の操作環21.2
2はそれぞれの軸を中心として回動されるものであって
、矢印A方向に回転させると可動片23.24を矢印B
方向に所定角度回動させることができる。可動片23.
24の各突き合わせ面には、両者を突き合わせた状態に
て逆さ凸状の開口が形成される切欠部23a、24aを
有している(第2図(bl参照)。この切欠部23a、
24aに、第3図に示すキャリアハンガー5の上端側に
ある取手部51が保持されるのである。そして、洗浄液
放出手段6としては、本実施例において十字状のシャワ
ー配管を用いており、シャワー配管の洗浄液放出孔は下
方に開口しているので、下方に洗浄液が放出されるよう
になっている。即ち、洗浄液放出手段6は、丁度、キャ
リアハンガー5の取手部51およびその周辺に洗浄液を
かけるようにチャック機構2に取りつけられている。A cleaning liquid discharge means 6 for discharging cleaning liquid is attached to this chuck mechanism 2. Said operating ring 21.2
2 are rotated around their respective axes, and when rotated in the direction of arrow A, the movable pieces 23 and 24 move in the direction of arrow B.
It can be rotated by a predetermined angle in the direction. Movable piece 23.
Each abutting surface of 24 has notches 23a and 24a in which an inverted convex opening is formed when the two abut against each other (see FIG. 2 (bl)).
24a holds the handle portion 51 on the upper end side of the carrier hanger 5 shown in FIG. In this embodiment, a cross-shaped shower pipe is used as the cleaning liquid discharge means 6, and the cleaning liquid discharge hole of the shower pipe opens downward, so that the cleaning liquid is discharged downward. . That is, the cleaning liquid discharging means 6 is attached to the chuck mechanism 2 so as to spray the cleaning liquid onto the handle portion 51 of the carrier hanger 5 and its surroundings.
このような洗浄装置を用いてウェハを洗浄する手順につ
いて述べる。約20〜30枚のウェハ7が収納されたウ
ェハキャリア8をキャリアハンガー5に搭載する。キャ
リアハンガー5の取手部51をチャック機構2でもって
保持して、矢印の如く径路に沿って薬液が入れられた洗
浄槽3に浸漬させてから、キャリアハンガー5をチャッ
ク機構2から解放する。このチャック機構2をハンガー
移送機1と共に上昇させて中間地点Pに戻す。この洗浄
槽3内では薬液を約80℃に恒温して気泡を発生させる
ことでウェハ7を洗浄するため、どうしても、気泡が薬
液表面ではじけてキャリアハンガー5の取手部51およ
びその周辺に不意に付着することは避けられない。A procedure for cleaning wafers using such a cleaning device will be described. A wafer carrier 8 containing about 20 to 30 wafers 7 is mounted on a carrier hanger 5. The handle part 51 of the carrier hanger 5 is held by the chuck mechanism 2, and the carrier hanger 5 is immersed in the cleaning tank 3 containing the chemical solution along the path as shown by the arrow, and then the carrier hanger 5 is released from the chuck mechanism 2. This chuck mechanism 2 is raised together with the hanger transfer machine 1 and returned to the intermediate point P. In this cleaning tank 3, the wafer 7 is cleaned by keeping the chemical solution at a constant temperature of about 80° C. and generating air bubbles. Therefore, the air bubbles inevitably burst on the surface of the chemical solution and cause unexpected damage to the handle portion 51 of the carrier hanger 5 and its surroundings. Adhesion is inevitable.
薬液洗浄を終えてから、キャリアハンガー5およびウェ
ハ7に付着している薬液を純水で洗い流すため、再びチ
ャック機構2でキャリアハンガー5の取手部51を保持
して洗浄槽3から取り出し、ハンガー移送機1によって
キャリアハンガー5を破線で示す径路に沿って矢印の如
く移送させて純水を収納させた洗浄槽4(具体例を第4
図に示している)内に浸漬させる。こうしてから、キャ
リアハンガー5をチャック機構2から解放して、チャッ
ク機構2をキャリアハンガー5の上方で停止させておき
、洗浄液放出手段6から純水を放出して、キャリアハン
ガー5の取手部51およびその周辺に不意に付着した薬
液を洗い流す。これと同時に、第4図に示すように洗浄
槽4内にて、その底面から純水を出し入れして、洗浄槽
4のフランジ部41に純°水をオーバフローさせるよう
な方式でもって、キャリアハンガー5およびウェハ7に
付着している薬液を洗い流す。なお、第4図において洗
浄槽4のシャワー配管42は、純水の出し入れ時にウェ
ハ7に純水をかけるものである。After finishing the chemical cleaning, in order to wash away the chemical adhering to the carrier hanger 5 and the wafer 7 with pure water, hold the handle 51 of the carrier hanger 5 again with the chuck mechanism 2, take it out from the cleaning tank 3, and transfer the hanger. The carrier hanger 5 is transferred by the machine 1 as shown by the arrow along the path indicated by the broken line to the cleaning tank 4 (a specific example is the fourth cleaning tank 4) containing pure water.
(as shown in the figure). Thereafter, the carrier hanger 5 is released from the chuck mechanism 2, the chuck mechanism 2 is stopped above the carrier hanger 5, pure water is discharged from the cleaning liquid discharge means 6, and the handle portion 51 of the carrier hanger 5 and Wash away any chemical solution that accidentally adheres to the area. At the same time, as shown in FIG. 4, pure water is put in and taken out from the bottom of the cleaning tank 4, and the carrier hanger is made to overflow into the flange 41 of the cleaning tank 4. 5 and the wafer 7 are washed away. In addition, in FIG. 4, the shower pipe 42 of the cleaning tank 4 is used to spray pure water onto the wafer 7 when taking out the pure water.
このような手順により、薬液−純水→薬液−純水・・・
といった具合に繰り返して種々な薬液でもってウェハを
多数回にわたって洗浄させる。Through these steps, chemical solution - pure water → chemical solution - pure water...
The wafer is repeatedly cleaned with various chemical solutions many times.
なお、本発明は上記実施例で説明したチャック機構2に
限定されるものでなく、さらに洗浄液放出手段6もシャ
ワー配管だけに限定されないことは言うまでもない。It should be noted that the present invention is not limited to the chuck mechanism 2 described in the above embodiment, and it goes without saying that the cleaning liquid discharge means 6 is not limited to only the shower piping.
発訓久班来
本発明の半導体ウェハ用洗浄装置では、キャリアハンガ
ーの取手部およびその周辺に対して、チャック機構に設
けた洗浄液放出手段でもって洗aE液をかけるように構
成している。このため、薬液が収納された洗浄槽から純
水が収納された洗浄槽にキャリアハンガーを移したとき
に、キャリアハンガ一本体およびウェハに付着している
薬液を洗い流すことは勿論、純水を収納している洗浄槽
を大型にせず、しかもチャック機構が持つ微少な粉塵を
純水中に混入させずにキャリアハンガーの取手部および
その周辺に不意に付着した薬液をも簡単に洗い流すよう
にできる。The cleaning device for semiconductor wafers of the present invention is configured so that the cleaning aE solution is sprayed onto the handle portion of the carrier hanger and its surroundings by a cleaning solution discharge means provided in the chuck mechanism. Therefore, when the carrier hanger is transferred from a cleaning tank containing a chemical solution to a cleaning tank containing pure water, it is possible to not only wash away the chemical solution attached to the carrier hanger itself and the wafer, but also to store the pure water. To easily wash away a chemical solution accidentally attached to a handle part of a carrier hanger and its surroundings without increasing the size of a washing tank and without mixing minute dust of a chuck mechanism into pure water.
第1図は本発明の一実施例の洗浄装置を示す概略図、第
2図(a)は同洗浄装置のチャック機構の全体を示す斜
視図、第2図tb+は同チャック機構に対する洗浄液放
出手段の取付状態を示す斜視説明図、第3図はキャリア
ハンガーを示す斜視図、第4図は純水が収納される洗浄
槽の具体例を示す図である。
1・・・ハンガー移送機
2・・・チャック機構
3.4・・・洗浄槽
5・・・キャリアハンガー
51・・・取手部
6・・・洗浄液放出手段
7・・・ウエハ
8・・・ウェハキャリア。
特許出願人 ローム株式会社
代理人 弁理士 大 西 孝 治
第1図FIG. 1 is a schematic diagram showing a cleaning device according to an embodiment of the present invention, FIG. 2(a) is a perspective view showing the entire chuck mechanism of the same cleaning device, and FIG. 2 tb+ is a cleaning liquid discharge means for the chuck mechanism. FIG. 3 is a perspective view showing a carrier hanger, and FIG. 4 is a diagram showing a specific example of a cleaning tank in which pure water is stored. 1... Hanger transfer machine 2... Chuck mechanism 3.4... Cleaning tank 5... Carrier hanger 51... Handle portion 6... Cleaning liquid discharge means 7... Wafer 8... Wafer career. Patent Applicant: ROHM Co., Ltd. Agent, Patent Attorney: Takaharu Ohnishi Figure 1
Claims (1)
を搭載したキャリアハンガーの上端側にある取手部をハ
ンガー移送機のチャック機構で保持して、種々な洗浄液
を収納した複数の洗浄槽に対して順次移送して浸漬させ
る半導体ウェハ用洗浄装置において、前記キャリアハン
ガーの取手部およびその周辺に対して洗浄液をかける洗
浄液放出手段を前記チャック機構に設けていることを特
徴とする半導体ウェハ用洗浄装置。(1) Hold the handle on the upper end side of the carrier hanger with a wafer carrier containing an appropriate number of semiconductor wafers using the chuck mechanism of the hanger transfer machine, and attach it to multiple cleaning tanks containing various cleaning solutions. A cleaning apparatus for semiconductor wafers in which the semiconductor wafers are sequentially transferred and immersed in the carrier hanger, wherein the chuck mechanism is provided with a cleaning liquid discharge means for spraying the cleaning liquid onto the handle portion of the carrier hanger and its surroundings. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61031557A JPH084080B2 (en) | 1986-02-14 | 1986-02-14 | Semiconductor wafer cleaning equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61031557A JPH084080B2 (en) | 1986-02-14 | 1986-02-14 | Semiconductor wafer cleaning equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62189732A true JPS62189732A (en) | 1987-08-19 |
JPH084080B2 JPH084080B2 (en) | 1996-01-17 |
Family
ID=12334479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61031557A Expired - Lifetime JPH084080B2 (en) | 1986-02-14 | 1986-02-14 | Semiconductor wafer cleaning equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH084080B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6433312A (en) * | 1987-07-29 | 1989-02-03 | Giken Seisakusho Kk | Steel tubular pile and sheathing wall therewith |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5685948U (en) * | 1979-12-04 | 1981-07-10 | ||
JPS58114042U (en) * | 1982-01-28 | 1983-08-04 | 海上電機株式会社 | Silicon wafer cleaning equipment |
JPS61249581A (en) * | 1985-04-30 | 1986-11-06 | ホ−ヤ株式会社 | Washer |
-
1986
- 1986-02-14 JP JP61031557A patent/JPH084080B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5685948U (en) * | 1979-12-04 | 1981-07-10 | ||
JPS58114042U (en) * | 1982-01-28 | 1983-08-04 | 海上電機株式会社 | Silicon wafer cleaning equipment |
JPS61249581A (en) * | 1985-04-30 | 1986-11-06 | ホ−ヤ株式会社 | Washer |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6433312A (en) * | 1987-07-29 | 1989-02-03 | Giken Seisakusho Kk | Steel tubular pile and sheathing wall therewith |
Also Published As
Publication number | Publication date |
---|---|
JPH084080B2 (en) | 1996-01-17 |
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