JPS60253883A - Constant current load/constant voltage applied current measuring apparatus - Google Patents
Constant current load/constant voltage applied current measuring apparatusInfo
- Publication number
- JPS60253883A JPS60253883A JP59110379A JP11037984A JPS60253883A JP S60253883 A JPS60253883 A JP S60253883A JP 59110379 A JP59110379 A JP 59110379A JP 11037984 A JP11037984 A JP 11037984A JP S60253883 A JPS60253883 A JP S60253883A
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- Prior art keywords
- current
- voltage
- constant
- constant current
- switch
- Prior art date
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Abstract
Description
【発明の詳細な説明】
「産業上の利用分野」
この発明は例えば半導体論理回路の集積回路に対する直
流特性試験は用いられ、定流電流を測定対象へ負荷電流
として供給することができ、かっ流を測定する定電流負
荷兼定電圧印加電流測定器に関する。 ゛
「従来技術」 ゛ □
半導体論理集積回路の直流特性試験°′においては、被
試験半導体(測定対縁)に対して定電流を印加した時の
その印加端子に発生する電圧を測定し、捷た定電圧を印
加した時にその印加端子に流れる電流を測定することが
行われる。このような直流特性を測定する定電流定電圧
測定器は、従来においては第3図に示すように構成され
ていた。Detailed Description of the Invention "Industrial Application Field" This invention is used, for example, in DC characteristic testing of integrated circuits of semiconductor logic circuits. This invention relates to a constant current load/constant voltage applied current measuring device for measuring constant current load and constant voltage applied current.゛``Prior art'' ゛ □ In DC characteristic testing of semiconductor logic integrated circuits, the voltage generated at the application terminal when a constant current is applied to the semiconductor under test (the other side to be measured) is measured, and the voltage generated at the application terminal is measured. When a constant voltage is applied, the current flowing through the application terminal is measured. Conventionally, a constant current/constant voltage measuring device for measuring such DC characteristics has been constructed as shown in FIG.
即ち例えばデジタル値を設定すると、これに対応した定
電圧又は定電流を出力するD/A変換器11の出力が抵
抗器12を通じて演算増幅器13の反転入力側に供給さ
れる。演算増幅器13の非反転入力側は接地されておシ
、出力側は電流検出用抵抗器14を通じ、更にスイッチ
15を通じて験半導体論理回路素子(以下被試験素子又
は被測定素子と記す)17が接続される。この出力端子
16はスイッチ18 f: iMじてバッファ回路19
に接続され、バッファ回路19の出力は抵抗器21を通
じ、更にスイッチ22を通じて演算増幅器13の反転入
力側に接続されている。演算増幅器13の出力側は抵抗
器23を通じて演算増幅器24の非反転入力側に接続さ
れ、この非反転入力側は抵抗器25を通じて接地される
。又バッファ回路19の出力は抵抗器26を通じて演算
増幅器24の反転入力側に接続され、この反転入力側と
演算増幅器24の出力側との間に、帰還抵抗器27が接
続される。これら抵抗器23,25,26.27及び演
算増幅器24は電流検出回路28を構成している。演算
増幅器24の出力側はスイッチ29を通じてA/D変換
器31に接続される。バッファ回路19の出力はスイッ
チ32を通じてA/D変換器31に接続される。更に演
算増幅器13の反転入力側はスイッチ33を通じ、更に
抵抗器34をimじて演算増幅器24の出力側に接続さ
れている。That is, for example, when a digital value is set, the output of the D/A converter 11, which outputs a constant voltage or constant current corresponding to the digital value, is supplied to the inverting input side of the operational amplifier 13 through the resistor 12. The non-inverting input side of the operational amplifier 13 is grounded, and the output side is connected to a test semiconductor logic circuit element (hereinafter referred to as an element under test or an element under test) 17 through a current detection resistor 14 and a switch 15. be done. This output terminal 16 is connected to a switch 18 f: iM, which is a buffer circuit 19.
The output of the buffer circuit 19 is connected to the inverting input side of the operational amplifier 13 through a resistor 21 and a switch 22. The output side of the operational amplifier 13 is connected through a resistor 23 to the non-inverting input side of an operational amplifier 24, and this non-inverting input side is connected to ground through a resistor 25. Further, the output of the buffer circuit 19 is connected to the inverting input side of the operational amplifier 24 through a resistor 26, and a feedback resistor 27 is connected between this inverting input side and the output side of the operational amplifier 24. These resistors 23, 25, 26, 27 and operational amplifier 24 constitute a current detection circuit 28. The output side of operational amplifier 24 is connected to A/D converter 31 through switch 29 . The output of buffer circuit 19 is connected to A/D converter 31 through switch 32. Furthermore, the inverting input side of the operational amplifier 13 is connected through a switch 33 and further through a resistor 34 to the output side of the operational amplifier 24.
試験を行う場合においてはスイッチ15 、18は常に
ONとされておき、この状態で、定電圧を被試験素子1
7に印加してその時出力端子16に流れる電流を測定す
るには、スイッチ22と29とをONとし、スイッチ3
2.33はOFFとする。との場合抵抗器12及び21
.更にD/A変換器11の出力電圧によって決捷る定電
圧が出力端子16に現われ、これが被試験素子1・7に
印加される。この時、被試験素子17に流れる電流は電
流検出用抵抗器14を通る。この抵抗器14の両端間の
電圧が電流検出回路28により検出され、その出力はA
/D変換器31においてデジタル信号に変換され、これ
が表示される。出力端子16の電圧とバッファ回路19
の出力電圧の出力電圧とが等しく、従って電流検出回路
28で検出した電流検出用抵抗器14の両端電圧と、抵
抗器14の抵抗値とから出力端子16を流れる電流を知
ることができる。When performing a test, the switches 15 and 18 are always turned on, and in this state, a constant voltage is applied to the device under test 1.
To measure the current applied to output terminal 7 and flowing to output terminal 16 at that time, switches 22 and 29 are turned on, and switch 3 is turned on.
2.33 is set to OFF. In the case of resistors 12 and 21
.. Furthermore, a constant voltage determined by the output voltage of the D/A converter 11 appears at the output terminal 16, and is applied to the devices under test 1 and 7. At this time, the current flowing through the device under test 17 passes through the current detection resistor 14. The voltage across this resistor 14 is detected by a current detection circuit 28, and its output is A
The signal is converted into a digital signal by the /D converter 31, and this is displayed. Voltage of output terminal 16 and buffer circuit 19
Therefore, the current flowing through the output terminal 16 can be determined from the voltage across the current detection resistor 14 detected by the current detection circuit 28 and the resistance value of the resistor 14.
被試験素子17に対して定電流を供給してその時の出力
端子16の電圧を測定するには、スイッチ22.29を
OFFとし、スイッチ32.33をONとする。この時
A/D変換器11の出力電圧、抵抗器12.34及び1
4の各抵抗値によって決められる定電流が被試験素子1
7に供給される。この時の出力端子16の電圧がバッフ
ァ回路19を通じ、更にスイッチ32を通じてA/D変
換器31に供給されて測定される。To supply a constant current to the device under test 17 and measure the voltage at the output terminal 16 at that time, switch 22.29 is turned OFF and switch 32.33 is turned ON. At this time, the output voltage of A/D converter 11, resistors 12, 34 and 1
A constant current determined by each resistance value of 4 is applied to the device under test 1.
7. The voltage at the output terminal 16 at this time is supplied to the A/D converter 31 through the buffer circuit 19 and the switch 32 for measurement.
一方、機能試験を行う際に被試験素子に規定の負荷条件
tqえるため、つまシ負荷を与えた状態の試験を行うた
め、被試験素子17の各端子ピンと対応してそれぞれ定
電流負荷回路が設けられ、被試験素子の各端子ビンにそ
れぞれ予め決められた定電流を流すようにした試験装置
がある。即ち第4図に示すように高電位の電源端子41
に接続された定電流源42はダイオードブリッジ43の
互に陽極が接続された接続端に接続され、ダイオードブ
リッジ43の互に陰極が接続された接続端は定電流#4
4を通じて低電位の電源端子45に接続される。ダイオ
ードブリッジ43の一方の陰極及び陽極の接続端は電流
入出力端子46に接続され、この電流入出力端子46は
被試験素子17に接続される。更にダイオードブリッジ
43の池の陰極陽極接続端はバッファ回路47の出力側
に接続され、バッファ回路47の入力側は切替電圧端子
48に接続されている。On the other hand, since the specified load condition tq is applied to the device under test when performing a functional test, a constant current load circuit is connected to each terminal pin of the device under test 17 in order to perform the test with a limited load applied. There is a test device in which a predetermined constant current is applied to each terminal bin of the device under test. That is, as shown in FIG. 4, the high potential power supply terminal 41
The constant current source 42 connected to the diode bridge 43 is connected to the connection end where the anodes are connected to each other, and the connection end of the diode bridge 43 where the cathodes are connected to each other is connected to the constant current source #4.
4 to a low potential power supply terminal 45. One cathode and anode connection end of the diode bridge 43 is connected to a current input/output terminal 46, and this current input/output terminal 46 is connected to the device under test 17. Furthermore, the cathode and anode connection ends of the pond of the diode bridge 43 are connected to the output side of the buffer circuit 47, and the input side of the buffer circuit 47 is connected to the switching voltage terminal 48.
例えば定電流源42.44の定電流匝は等しい値とされ
、切替電圧端子48に与える電圧Vjを制御して、例え
ば入出力端子46の電圧よりも高くすると定電流42の
定電流の一部又は全部が入出力端子46よシ被試験素子
17に供給される。切替電圧端子48の電圧Vtを入出
力端子46の電圧よりも下げると、定電流源42の定電
流の一部又は全部をバッファ回路47側に引き込むと入
出力端子46を通じて被試験素子17よシ定電流源44
に電流が流れる。つまり定電流源44の電流が被試験素
子17に供給される。このように被試験素子17に定電
流負荷を与えた状態において、その時の入出力端子46
の電圧を比較器49.51に。For example, the constant current values of the constant current sources 42 and 44 are set to the same value, and if the voltage Vj applied to the switching voltage terminal 48 is controlled to be higher than, for example, the voltage of the input/output terminal 46, a part of the constant current of the constant current 42 Alternatively, all the signals are supplied to the device under test 17 through the input/output terminal 46. When the voltage Vt of the switching voltage terminal 48 is lowered than the voltage of the input/output terminal 46, part or all of the constant current of the constant current source 42 is drawn into the buffer circuit 47 side, and the voltage is transferred from the device under test 17 through the input/output terminal 46. Constant current source 44
A current flows through. In other words, the current from the constant current source 44 is supplied to the device under test 17. In this state where a constant current load is applied to the device under test 17, the input/output terminal 46 at that time
voltage to comparator 49.51.
てそれぞれ電圧vh及びこれよりも低い電圧V、と比較
して端子46の電圧がvh以上か、vノ以下か、Vh−
V、!間かの判定が行われる。Vh-
V,! A determination is made as to whether or not it is time.
このように定電流負荷回路が設けられているから、定電
流を被試験素子17に印加してその時の入出力端子46
の電圧を測定し、又は電圧範囲を判定することによって
定電流印加電圧測定を行うことが可能となる。Since the constant current load circuit is provided in this way, a constant current is applied to the device under test 17 and the input/output terminal 46 at that time is
By measuring the voltage or determining the voltage range, it becomes possible to perform constant current applied voltage measurement.
「発明が解決しようとする問題点」
しかし定電流負荷回路では定電圧印加電流測定を行うこ
とができない。このため従来においては第3図に示した
直流特性試験器を用いていた。この直流特性試験器は演
算増幅器13,19は比較的大きい電流を供給する必要
があり、このため高価なものとなり、またスイッチの数
も多く、この点からも価格の高いものであった。被試験
素子17として測定端子の多いものを試験する場合にお
いては各端子を順次切替えて測定すると、測定時間が長
くなシ、何台も直流特性試験器を用いると、全体として
著しく高価なものになる。``Problems to be Solved by the Invention'' However, with a constant current load circuit, constant voltage applied current measurement cannot be performed. For this reason, conventionally, a DC characteristic tester shown in FIG. 3 has been used. In this DC characteristic tester, the operational amplifiers 13 and 19 were required to supply relatively large currents, which made them expensive, and the number of switches was large, which also made them expensive. When testing a device under test 17 that has a large number of measurement terminals, switching each terminal one after another will take a long time to measure, and using multiple DC characteristic testers will make the entire device extremely expensive. Become.
この発明の目的は定電圧印加電流ff1lJ定及び定電
流印加電圧測定の何れをも行うことができ、しかも安価
に構成することができ、従って多数の端子や、或は多く
の被測定対象を同時に試験することを安価な装置で行う
ことができ、しかも測定時間を大幅に減少することが可
能となる定電流負荷兼定電圧印加電流測定器を提供する
ものである。The purpose of this invention is to be able to perform both constant voltage applied current ff1lJ constant current applied voltage measurement and constant current applied voltage measurement, and can be constructed at low cost, so that many terminals or many objects to be measured can be measured simultaneously. An object of the present invention is to provide a constant current load/constant voltage applied current measuring device that allows testing to be performed using an inexpensive device and further reduces measurement time significantly.
「問題点を解決するための手段」
この発明によれば高電位側の定電流回路及び低電位側の
定電流回路を、ダイオードブリッジに演算増幅器を通じ
て切替電圧を印加することによって電流切替を行う定電
流負荷回路において、演算増幅器の反転入力側を定電流
負荷回路の電流人出端と、ダイオードブリッジの切替電
圧設定端とにスイッチによって切替えることができるよ
うに構成される。また演算増幅器の出力電流を電流検出
回路で検出することができるようにされる。"Means for Solving the Problem" According to the present invention, a constant current circuit on a high potential side and a constant current circuit on a low potential side are switched by applying a switching voltage to a diode bridge through an operational amplifier. The current load circuit is configured such that the inverting input side of the operational amplifier can be switched between a current output terminal of the constant current load circuit and a switching voltage setting terminal of the diode bridge. Further, the output current of the operational amplifier can be detected by a current detection circuit.
「実施例」
第1図はこの発明による定電流負荷兼定電圧印加電流測
定器の一例を示し、第3図及び第4図と対応する部分に
は同一符号を付けである。この実施例においては、演算
増幅器52が設けられ、これは第4図に示した回路にお
けるバッファ回路47の演算増幅器と同様に端子48の
切替電圧Viをダイオードブリッジ43に設定するため
のものでおり、演算増幅器52の非反転入力側は切替電
圧設定端子48に接続され、反転入力側はスイッチ53
を通じて電流入出力端子46に接続され、またスイッチ
54を通じてダイオードブリッジ43の切替電圧設定端
55、つまシ演算増幅器52の出力側と接続される側に
接続される。更に演算増幅器52の出力側は電流検出用
抵抗器14金通じてダイオードブリッジ43の切替電圧
設定端55に接続される。電流検出用抵抗器14の両端
は電流検出回路28に接続され、電流検出回路28の出
力はA/D変換器31に接続される。この例においては
電流検出用抵抗器14のダイオードブリッジ43側はバ
ッファ回路56を通じて電流検出回路28に接続されて
いる。Embodiment FIG. 1 shows an example of a constant current load/constant voltage applied current measuring device according to the present invention, and parts corresponding to those in FIGS. 3 and 4 are given the same reference numerals. In this embodiment, an operational amplifier 52 is provided, which is used to set the switching voltage Vi at the terminal 48 to the diode bridge 43, similar to the operational amplifier of the buffer circuit 47 in the circuit shown in FIG. , the non-inverting input side of the operational amplifier 52 is connected to the switching voltage setting terminal 48, and the inverting input side is connected to the switch 53.
It is connected to the current input/output terminal 46 through the switch 54, and to the side connected to the switching voltage setting end 55 of the diode bridge 43 and the output side of the operational amplifier 52 through the switch 54. Furthermore, the output side of the operational amplifier 52 is connected to a switching voltage setting terminal 55 of the diode bridge 43 through a current detection resistor made of 14-karat gold. Both ends of the current detection resistor 14 are connected to a current detection circuit 28 , and the output of the current detection circuit 28 is connected to an A/D converter 31 . In this example, the diode bridge 43 side of the current detection resistor 14 is connected to the current detection circuit 28 through a buffer circuit 56.
この構成において定電流負荷回路として動作させる場合
は、スイッチ53をOFFとしてスイッチ54をONと
する。これにより演算増幅器52の反転入力側は1電流
検出用抵抗器14とダイオードブリッジ43の接続点5
5に接続され、しかも電流検出用抵抗器14の抵抗値は
小さな値であり、よって演算増幅器52は第4図におけ
るバッファ回路47と同様に作用し、第4図に示した回
路と同様になシ、端子48における設定電圧Vt(i−
切替えることによって定電流源42の定電流を入出力端
子46を通じて被測定素子17に供給し、又は定電流源
44の定電流を被電流素子17に供給することができる
。つまり定電流を被測定素子17に負荷電流として供給
することができ、必要に応じてこの時の端子46の電圧
を測定することによって定電流供給電圧測定を行うこと
ができる。この場合において被測定素子17が論理回路
の場合は比較器49.51によって電圧がvh〜V、間
がVh R上か、V、u下かの判定をするのみでもよい
。When operating this configuration as a constant current load circuit, the switch 53 is turned off and the switch 54 is turned on. As a result, the inverting input side of the operational amplifier 52 is connected to the connection point 5 between the current detection resistor 14 and the diode bridge 43.
5, and the resistance value of the current detection resistor 14 is a small value. Therefore, the operational amplifier 52 functions in the same manner as the buffer circuit 47 in FIG. , set voltage Vt(i-
By switching, the constant current of the constant current source 42 can be supplied to the device to be measured 17 through the input/output terminal 46, or the constant current of the constant current source 44 can be supplied to the device to be measured 17. In other words, a constant current can be supplied to the device under test 17 as a load current, and if necessary, the constant current supply voltage can be measured by measuring the voltage at the terminal 46 at this time. In this case, if the device under test 17 is a logic circuit, the comparators 49, 51 may only determine whether the voltage is between vh and V and whether the voltage is above VhR or below V and u.
定電圧印加電流測定を行う場合は、スイッチ54をOF
Fとしてスイッチ53をONとする。この場合定電圧回
路となり、切替電圧設定端子48の電EVtが入出力端
子46に印加され、これが被測定素子17に与えられる
。定電流源42.44の定電流値を等しくすることによ
って入出力端子46に流れる電流Idと、電流検出用抵
抗器14に流れる電流■、とが等しくなる。従って定電
!EVjを被測定素子17に印加した時に入出力端子4
6に流れる電流を、電流検出用抵抗器14の両端間の電
圧を電流検出回路28で検出してA/D変換器31で測
定することができる。When performing constant voltage applied current measurement, switch 54 is turned OFF.
F and the switch 53 is turned on. In this case, it becomes a constant voltage circuit, and the voltage EVt of the switching voltage setting terminal 48 is applied to the input/output terminal 46, and this is applied to the device under test 17. By making the constant current values of the constant current sources 42 and 44 equal, the current Id flowing through the input/output terminal 46 and the current ■ flowing through the current detection resistor 14 become equal. Therefore constant voltage! When EVj is applied to the device under test 17, the input/output terminal 4
6 can be measured by the A/D converter 31 by detecting the voltage across the current detection resistor 14 with the current detection circuit 28.
この電流検出回路28の出力をA/D変換器31に供給
するととなく、例えば第2図に示すようにその出力をス
イッチ57によシ入出力端子46の電圧と切替えてアナ
ログ比較器49.51に供給して、比較器49.51の
何れからか例えば高レベルが得られたら、オア回路58
より被測定素子17が不良であることを示す信号を出力
するようにすることもできる。つまり従来における定電
流負荷試験に用いるアナログ比較器49.51を利用し
、またその時の基準電圧vh、Viを基鋸として測定す
ることもできる。In addition to supplying the output of this current detection circuit 28 to the A/D converter 31, the output is switched to the voltage at the input/output terminal 46 by a switch 57 as shown in FIG. 51 and if a high level is obtained from either of the comparators 49 and 51, the OR circuit 58
It is also possible to output a signal indicating that the device under test 17 is defective. That is, it is also possible to measure using the analog comparators 49 and 51 used in conventional constant current load tests, and using the reference voltages vh and Vi at that time as a base saw.
「発明の効果」
思上述べたようにこの発明によれば従来からアナログ試
験装置によく用いられている定電流負荷回路に定電流検
出回路28とスイッチ53 、54との僅かなものを付
加するのみで構成することができ、第3図に示した従来
の直流特性試験器と比べその構成が簡単で、特に演算増
幅器としては演算増幅器52のみが多少電流を必要とし
、高価なものになるが、第3図における演算増幅器13
゜19のように二つも必要とせず、また従来はスイッチ
22.29.32 、’33の4個を必要としたが、ス
イッチ53.54の2個のみで良く、それだけ安価に構
成することができる。従ってこのように比較的安価に構
成できるため、多数のビン端子や被測定素子に対して同
時にそれぞれ格別に設けて測定を行うことができ、短時
間で測定が可能となる。``Effects of the Invention'' As mentioned above, according to the present invention, only a constant current detection circuit 28 and switches 53 and 54 are added to the constant current load circuit that has been conventionally commonly used in analog test equipment. Compared to the conventional DC characteristic tester shown in FIG. 3, the structure is simpler than the conventional DC characteristic tester shown in FIG. , operational amplifier 13 in FIG.
Unlike ゜19, two switches are not required, and conventionally four switches 22, 29, 32 and '33 are required, but only two switches 53 and 54 are required, and the configuration can be made at a lower cost. can. Therefore, since the structure can be constructed at a relatively low cost, a large number of pin terminals and devices to be measured can be individually provided and measured at the same time, and measurement can be performed in a short time.
第1図はこの発明による定電流負荷兼定電圧印加電流測
定器の一例を示す接続図、第2図はその一部変形例を示
す接続図、第3図は従来の定電圧印加電流測定及び定電
流印加電圧測定器を示す接続図、第4図は従来の定電流
負荷回路を示す接続図である。
14:電流検出用抵抗器、17:被測定素子、28:電
流検出回路、32:高電位側の定電流源、、 44 :
低電位側の定電流源、46:電流入出力端子、48:切
替電圧設定端子。
特許出願人 タケダ理研工業株式会社
代 理 人 草 野 卓
ムー ノ刊Fig. 1 is a connection diagram showing an example of a constant current load/constant voltage applied current measuring device according to the present invention, Fig. 2 is a connection diagram showing a partial modification thereof, and Fig. 3 is a connection diagram showing a conventional constant voltage applied current measurement and constant voltage applied current measuring device. A connection diagram showing a current applied voltage measuring device, and FIG. 4 is a connection diagram showing a conventional constant current load circuit. 14: Current detection resistor, 17: Device under test, 28: Current detection circuit, 32: Constant current source on high potential side, 44:
Constant current source on low potential side, 46: Current input/output terminal, 48: Switching voltage setting terminal. Patent applicant: Takeda Riken Kogyo Co., Ltd. Agent: Taku Kusano Published by Muno
Claims (1)
位側に接続された第2定電流回路、これら定電流回路の
電流を電流入出力端子へ切替供給するダイオードブリッ
ジ、そのダイオードブリッジに対して切替設定電圧を与
える演算増幅器にょシ構成された定電流負荷回路と、上
記演算増幅器の反転入力側を、上記電流入出力端子と上
記ダイオードブリッジの切替電圧設定端とに切替接続す
るスイッチと、上記演算増幅器の出力電流を検出する回
路とを具備する定電流負荷兼定電圧印加電流測定器0(1) A first constant current circuit connected to the high potential side, a second constant current circuit connected to the low potential side, a diode bridge that switches and supplies the current of these constant current circuits to the current input/output terminal, and the diode bridge. a constant current load circuit configured with an operational amplifier that provides a switching setting voltage to the switch; and a switch that selectively connects the inverting input side of the operational amplifier to the current input/output terminal and the switching voltage setting terminal of the diode bridge. and a circuit for detecting the output current of the operational amplifier.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59110379A JPS60253883A (en) | 1984-05-30 | 1984-05-30 | Constant current load/constant voltage applied current measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59110379A JPS60253883A (en) | 1984-05-30 | 1984-05-30 | Constant current load/constant voltage applied current measuring apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60253883A true JPS60253883A (en) | 1985-12-14 |
JPS649594B2 JPS649594B2 (en) | 1989-02-17 |
Family
ID=14534313
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59110379A Granted JPS60253883A (en) | 1984-05-30 | 1984-05-30 | Constant current load/constant voltage applied current measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60253883A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01131468A (en) * | 1987-11-16 | 1989-05-24 | Yokogawa Hewlett Packard Ltd | Current loading and voltage driver circuit |
JPH11174127A (en) * | 1997-12-09 | 1999-07-02 | Hitachi Electron Eng Co Ltd | Load-current output circuit to electronic device and ic tester |
JPH11174128A (en) * | 1997-12-09 | 1999-07-02 | Hitachi Electron Eng Co Ltd | Load-current output circuit to electronic device and ic tester |
CN108168385A (en) * | 2018-03-20 | 2018-06-15 | 中国工程物理研究院化工材料研究所 | There is the high current constant current tester for loading Auto-matching |
-
1984
- 1984-05-30 JP JP59110379A patent/JPS60253883A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01131468A (en) * | 1987-11-16 | 1989-05-24 | Yokogawa Hewlett Packard Ltd | Current loading and voltage driver circuit |
JPH11174127A (en) * | 1997-12-09 | 1999-07-02 | Hitachi Electron Eng Co Ltd | Load-current output circuit to electronic device and ic tester |
JPH11174128A (en) * | 1997-12-09 | 1999-07-02 | Hitachi Electron Eng Co Ltd | Load-current output circuit to electronic device and ic tester |
CN108168385A (en) * | 2018-03-20 | 2018-06-15 | 中国工程物理研究院化工材料研究所 | There is the high current constant current tester for loading Auto-matching |
CN108168385B (en) * | 2018-03-20 | 2023-07-07 | 中国工程物理研究院化工材料研究所 | Heavy current constant current tester with load automatic matching function |
Also Published As
Publication number | Publication date |
---|---|
JPS649594B2 (en) | 1989-02-17 |
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