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JPS60225022A - Abnormality diagnostic circuit of double sensor system - Google Patents

Abnormality diagnostic circuit of double sensor system

Info

Publication number
JPS60225022A
JPS60225022A JP8031084A JP8031084A JPS60225022A JP S60225022 A JPS60225022 A JP S60225022A JP 8031084 A JP8031084 A JP 8031084A JP 8031084 A JP8031084 A JP 8031084A JP S60225022 A JPS60225022 A JP S60225022A
Authority
JP
Japan
Prior art keywords
sensor
difference
abnormality
sensors
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8031084A
Other languages
Japanese (ja)
Inventor
Tomoo Kumamaru
熊丸 智雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP8031084A priority Critical patent/JPS60225022A/en
Publication of JPS60225022A publication Critical patent/JPS60225022A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/08Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for safeguarding the apparatus, e.g. against abnormal operation, against breakdown

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)

Abstract

PURPOSE:To discriminate the abnormality of either one of two sensors by detecting abnormality, in a double system sensor comprising two sensors, by taking the sum and difference of the outputs of the two sensors and detecting the polarities of the change amounts of the sum and difference. CONSTITUTION:Two sensors A, B are provided to a plant 1 and biases C, -C are added to the outputs thereof while outputs SA+C, SB-C are inputted to an average processing part 2 and outputted as a sensor signal S=(SA+SB)/2. Further, said outputs are inputted to a difference signal detection part 4 and the difference D=(SA-SB)+2C thereof is calculated. Next, the change amount DELTAD of the difference D is compared with a prescribed value eta to detect abnormality. The change amount DELTAS of output S and the output DELTAD are inputted to an abnormality discrimination part 6 and the abnormality of either one of sensors is detected from the positive and negative combination of the change amounts DELTAS, DELTAD. For example, if both of the change amounts DELTAS, DELTAD are +, it is judged that the output of the sensor A is excessive and, if the change amount DELTAS is + and the change amount DELTAD is -, it is judged that the output of the sensor B is excessive. Because the change amounts of the sum and difference of the sensor outputs are calculated, and abnormal sensor can be detected.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は二重化センサ系の異常を検知して、どちらのセ
ンサが異常であるかを判別する二重化センサ系の異常診
断回路に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an abnormality diagnostic circuit for a dual sensor system that detects an abnormality in the dual sensor system and determines which sensor is abnormal.

し発明の技術的背景とその問題点〕 二重化センサ系の異常診断回路の従来の一例を第1図に
示す。
[Technical background of the invention and its problems] An example of a conventional abnormality diagnosis circuit for a dual sensor system is shown in FIG.

第1図においてプラント1の二重化センサA。In FIG. 1, duplex sensor A of plant 1.

Bのうちセンサ人の出力Sムがセンサ信号として出力さ
れ、センサAとセンサBの出力SA、SBが比較回路2
1および判別回路22より成る不一致検出回路加に入力
され、その差によって不一致が判別され、これIこよっ
て二重化センサの異常を検出している。
Of B, the output S of the sensor person is output as a sensor signal, and the outputs SA and SB of sensor A and sensor B are sent to the comparator circuit 2.
1 and a discrimination circuit 22, and a mismatch is determined based on the difference between them, and an abnormality in the duplex sensor is thereby detected.

しかしながら上記第1図の回路では、両方のセンサの不
一致を検出するだけであり、どちらのセンサが異常かを
判別することはできない。
However, the circuit shown in FIG. 1 only detects a mismatch between the two sensors, and cannot determine which sensor is abnormal.

し発明の目的〕 本発明は、二重化センサの異常を、どちらのセンサが異
常かの判別を含めて検知できる二重化センサ系の異常診
断回路を提供することを目的としている。
OBJECTS OF THE INVENTION It is an object of the present invention to provide a duplex sensor system abnormality diagnostic circuit that can detect an abnormality in a duplex sensor, including determining which sensor is abnormal.

〔発明の概要〕[Summary of the invention]

本発明は、2つのセンサから成る二重化センサの異常を
検知する二重化センサ系の異常診断回路1こおいて、2
つのセンサの出力の和および差をサンプリングステップ
ごとに記憶してそのステップごとの変化量を算出する比
較演算部と、差の変化量が所定値以上のときセンサ異常
と判別すると共に差の変化量の極性および和の変化量の
極性から異常センサおよびその異常方向を弁別する異常
判別部を備え、これによって二重化センサ系のセンサ異
常をどちらのセンサが異常かを含めて検知できるように
したものであり、さらに異常センサが弁別されたとき健
全側のセンサからセンサ出力を取出すセンサ切換部を設
けたものである。
The present invention provides an abnormality diagnosis circuit 1 for a duplex sensor system that detects an abnormality in a duplex sensor consisting of two sensors.
A comparison calculation unit that stores the sum and difference between the outputs of two sensors for each sampling step and calculates the amount of change for each step, and determines that the sensor is abnormal when the amount of change in the difference is equal to or greater than a predetermined value, and also determines the amount of change in the difference. It is equipped with an abnormality determination section that discriminates the abnormal sensor and its abnormal direction from the polarity of the polarity and the polarity of the amount of change in the sum.This makes it possible to detect sensor abnormalities in the dual sensor system, including which sensor is abnormal. In addition, a sensor switching unit is provided to extract the sensor output from the healthy sensor when an abnormal sensor is discriminated.

〔発明の実施例〕[Embodiments of the invention]

本発明の一実施例を第2図に示す。 An embodiment of the present invention is shown in FIG.

第2図において、プラント1の二重化センサA。In FIG. 2, duplex sensor A of plant 1.

Bの中のセンサAにはプラス側にバイアスCがかけられ
、センサBにはマイナス側に同じノくイアスーCがかけ
られ、その出力Sム+Cと5B−Cが平均処SA+SB 理部2を介して平均され、その平均値 2 がセンサ信
号Sとして出力される。
A bias C is applied to the positive side of the sensor A in B, and the same bias C is applied to the negative side of the sensor B, and the outputs S+C and 5B-C are subjected to averaging processing SA+SB processing section 2. The average value 2 is output as the sensor signal S.

この場合センサA、Bが共1こ正常であれば5A−81
1である。
In this case, if both sensors A and B are normal, 5A-81
It is 1.

上記センサ出力SA+C,8B−Cは差信号検知部4に
入力されてその差 D= (sA+c) −(SII−C) =(sム−8
B)+20が算出される。
The above sensor outputs SA+C and 8B-C are input to the difference signal detection section 4, and the difference D= (sA+c) - (SII-C) = (smu-8
B) +20 is calculated.

差信号検知部4はさらに上記の差りをサンプリングして
前回のDと今回のDとを比較し、その差△Dを規定値η
と比較し、ΔD≧η(Sム−S、が増加傾向)かΔD≦
η(8A−’I’sが減の傾向)かを判別し、それぞれ
の判別結果1こ応じて(→、(−)の信号を異常の値お
よび今回の値は信号記憶部5を介しておよび直接に異常
判別部6に入力されてその差△Sによって前回の値と今
回の値が比較され、上昇傾向すなわちΔS>Oのとき(
→、下降傾向すなわちΔSく0のとき(→と判別される
The difference signal detection unit 4 further samples the above difference, compares the previous D and the current D, and sets the difference △D to a specified value η.
Compared to
η (8A-'I's is a decreasing trend), and depending on each determination result, (→, (-) signal is an abnormal value and the current value is stored in the signal storage unit 5. and is directly input to the abnormality determination unit 6, and the previous value and current value are compared based on the difference ΔS, and when there is an upward trend, that is, ΔS>O (
→, when there is a downward trend, that is, ΔS is 0 (→ is determined).

異常判別部6はさらに上記△Dの極性と△Sの極性とか
ら異常センサを判別する。
The abnormality determination unit 6 further determines the abnormal sensor based on the polarity of ΔD and the polarity of ΔS.

すなわち△Sが(ト)で△Dが(+)のときはセンサA
の出力過大、ΔSが(→でΔDが(→のときはセンサB
の出力過大、ΔSが(→でΔDが(→のときはセンサB
の出力過小、ΔSが←)でΔDが(→のときはセンサA
の出力過小と判別して異常センサ検知信号を出力する。
In other words, when △S is (g) and △D is (+), sensor A
Excessive output, when ΔS is (→ and ΔD is (→), sensor B
Excessive output, when ΔS is (→ and ΔD is (→), sensor B
If the output is too low, ΔS is ←) and ΔD is (→), sensor A
It determines that the output is too low and outputs an abnormal sensor detection signal.

第3図は本発明の他の実施例を示すもので、第2図の回
路にさらにセンサ切換部7を設け、常時は平均処理部2
の出力をセンサ信号として用いると共に、センサ異常が
検出されたときは、正常なセンサ側に切換えて、その出
力をセンサ信号として用いている。
FIG. 3 shows another embodiment of the present invention, in which a sensor switching section 7 is further provided in the circuit of FIG.
The output of the sensor is used as the sensor signal, and when a sensor abnormality is detected, the sensor is switched to the normal sensor side and the output is used as the sensor signal.

第4図は、さらに本発明の他の実施例を示しており、こ
の場合は、第2図における△Sの判別をサンプリング周
期の数ステップの値を用いて行9と共に、△Dの判別に
タイマ要素を追加して異常検知の時間遅れを持たせてい
る。
FIG. 4 shows yet another embodiment of the present invention, in which the determination of ΔS in FIG. A timer element is added to provide a time delay for abnormality detection.

また、第5図は本発明における異常診断部をマイクロコ
ンピュータで構成した場合を示している。
Further, FIG. 5 shows a case where the abnormality diagnosis section in the present invention is configured by a microcomputer.

すなわち第2図1こおける差信号検知部4、信号記憶部
5、異常判別部6がメモリ9、CPUl0とアナログ入
力回路8、ディジタル出力回路を含むインタフェースを
用いて構成できる。
That is, the difference signal detection section 4, signal storage section 5, and abnormality determination section 6 shown in FIG.

第6図はその演算処理動作を示すフローチャートであり
、第2図の場合と同じ演算動作が行われる。
FIG. 6 is a flowchart showing the arithmetic processing operation, and the same arithmetic operation as in the case of FIG. 2 is performed.

し発明の効果〕 以上説明したように本発明によれば、二重化センサ系の
異常をどのセンサが異常かを弁別して検知できると共に
、必要に応じてセンサ出力を健全側に自動切換でき、こ
れによってプラントの信頼性と稼動率を向上する合理的
な二重化センサ系の異常診断回路が得られる。
[Effects of the Invention] As explained above, according to the present invention, it is possible to detect an abnormality in a duplex sensor system by distinguishing which sensor is abnormal, and also to automatically switch the sensor output to the healthy side as necessary. A reasonable abnormality diagnosis circuit for a redundant sensor system that improves plant reliability and operation rate can be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

m1図は従来の二重化センサ系の異常診断回路の一例を
示す系統図、第2図〜第5図はそれぞれ本発明の各実施
例を示す系統図、第6図は第5図におけるマイクロコン
ピュータの演算動作を示すフローチャートである。 1 プラント 2 平均処理部 3 異常診断部 4 差信号検知部 5 信号記憶部 6 異常判別部 7 センサ切換部 9 メモリ 10 cpu (8733) 代理人 弁理士 猪 股 祥 晃 (は
が1名〕第 1 凶 第 2 図 第 3 図 第 4 図 第 5 図 第 6 図
Fig. m1 is a system diagram showing an example of an abnormality diagnosis circuit of a conventional dual sensor system, Figs. It is a flowchart showing calculation operation. 1 Plant 2 Average processing unit 3 Abnormality diagnosis unit 4 Difference signal detection unit 5 Signal storage unit 6 Abnormality determination unit 7 Sensor switching unit 9 Memory 10 CPU (8733) Agent Patent attorney Yoshiaki Inomata (1 person) 1st Figure 2 Figure 3 Figure 4 Figure 5 Figure 6

Claims (2)

【特許請求の範囲】[Claims] (1)2つのセンサから成る二重化センサ切換部を検知
する二重化センサ系の異常診断回路において、上記2つ
のセンサの出力の和および差をサンプリングステップご
とに記憶して上記和および差のステップごとの変化量を
算出する比較演算部と、上記差の変化量が所定値以上と
きセンサ異常と判別すると共に、上記差の変化の極性お
よび上紀和の変化量の極性とから異常センサおよび異常
方向を弁別する異常判別部を備えたことを性徴とする二
重化センサ系の異常診断回路。
(1) In an abnormality diagnosis circuit of a duplex sensor system that detects a duplex sensor switching section consisting of two sensors, the sum and difference of the outputs of the two sensors are stored for each sampling step, and the sum and difference of the above sum and difference are calculated for each step. A comparison calculation unit that calculates the amount of change, and determines that the sensor is abnormal when the amount of change in the difference is greater than or equal to a predetermined value, and also discriminates the abnormal sensor and the direction of the abnormality based on the polarity of the change in the difference and the polarity of the amount of change in the upper Ki sum. A redundant sensor system abnormality diagnostic circuit characterized by having an abnormality discrimination section that detects the abnormality.
(2)異常センサが弁別されたとき、他全側のセンサか
らセンサ出力を取出すセンサ切換部を設けた特許請求の
範囲第1項記載の二重化センサ系の異常診断回路。
(2) An abnormality diagnosis circuit for a dual sensor system according to claim 1, further comprising a sensor switching unit that extracts sensor output from all other sensors when an abnormal sensor is discriminated.
JP8031084A 1984-04-23 1984-04-23 Abnormality diagnostic circuit of double sensor system Pending JPS60225022A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8031084A JPS60225022A (en) 1984-04-23 1984-04-23 Abnormality diagnostic circuit of double sensor system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8031084A JPS60225022A (en) 1984-04-23 1984-04-23 Abnormality diagnostic circuit of double sensor system

Publications (1)

Publication Number Publication Date
JPS60225022A true JPS60225022A (en) 1985-11-09

Family

ID=13714689

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8031084A Pending JPS60225022A (en) 1984-04-23 1984-04-23 Abnormality diagnostic circuit of double sensor system

Country Status (1)

Country Link
JP (1) JPS60225022A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02253281A (en) * 1989-03-28 1990-10-12 Ricoh Co Ltd Method for controlling picture density of copying machine
JP2010517167A (en) * 2007-01-25 2010-05-20 フィッシャー−ローズマウント・システムズ・インコーポレーテッド Process variable transmitter validation
CN103954315A (en) * 2014-04-25 2014-07-30 西安航空动力股份有限公司 Online detecting method of data collecting system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02253281A (en) * 1989-03-28 1990-10-12 Ricoh Co Ltd Method for controlling picture density of copying machine
JP2010517167A (en) * 2007-01-25 2010-05-20 フィッシャー−ローズマウント・システムズ・インコーポレーテッド Process variable transmitter validation
CN103954315A (en) * 2014-04-25 2014-07-30 西安航空动力股份有限公司 Online detecting method of data collecting system

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