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JPS60192353A - Sealing process of semiconductor device - Google Patents

Sealing process of semiconductor device

Info

Publication number
JPS60192353A
JPS60192353A JP59048722A JP4872284A JPS60192353A JP S60192353 A JPS60192353 A JP S60192353A JP 59048722 A JP59048722 A JP 59048722A JP 4872284 A JP4872284 A JP 4872284A JP S60192353 A JPS60192353 A JP S60192353A
Authority
JP
Japan
Prior art keywords
resin
hygroscopic
covered
semiconductor
water content
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59048722A
Other languages
Japanese (ja)
Inventor
Shingo Kawashima
進吾 川島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP59048722A priority Critical patent/JPS60192353A/en
Publication of JPS60192353A publication Critical patent/JPS60192353A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/16Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/26Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device including materials for absorbing or reacting with moisture or other undesired substances, e.g. getters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To block the passage of water content permeating along a lead terminal led out of a semiconductor pellets or a loading substrate by a method wherein a major sheathing resin is provided with a hygroscopic resin layer. CONSTITUTION:A connection between a lead terminal 3 and a metallic wire 5 is locally covered with a hygroscopic phenol resin 9 while the whole body is further covered with sheathing epoxy resin 7 for protection. Besides, the part near a conductive channel 8 connected to semiconductor pellets 2 and a metallic wire 5 is locally covered with hygroscopic phenol resin 9 while the whole body is further covered with the external resin 7 protection. Moreover, multiple semiconductor pellets 2 placed on an insulating substrate 1a are entirely covered with a hygroscopic resin layer 9. Through these procedures, the whole permeating water content may be absorbed into the hygroscopic resin to prevent the water content from permeating into a semiconductor device.

Description

【発明の詳細な説明】 イ、産業上の利用分野 本発明は、半導体ペレットを外部環境から保護するため
に、該ペレットを樹脂で包覆する樹脂制止方法に関する
DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a resin restraining method for covering semiconductor pellets with resin in order to protect the semiconductor pellets from the external environment.

口、従来技術 従来、半導体ペレットの封止技術は、耐湿性の向上を主
眼として開発が進められ、価格的な難点を無視すれば、
ある程度満足できる性能が得られるようになっている。
Conventional technology Conventionally, semiconductor pellet encapsulation technology has been developed with the main focus on improving moisture resistance, and if the cost disadvantage is ignored,
Performance that is satisfactory to some extent can be obtained.

しかし、一般に用いられているエポキシ樹脂などを用い
た樹脂封止では、より一層の耐湿性の改善が信頼性向上
の一つのポイントとなっている。
However, in resin sealing using commonly used epoxy resins, further improvement in moisture resistance is one of the keys to improving reliability.

従来の樹脂封止方法は、第1図の断面図に示すように、
金属の基板1の上に半導体ペレット2を載せ、外部との
接続のためのリード端子3とベレットの間を金線5など
によって接続し、この状態でエポキシなどの樹脂7を用
いて封止していた。
The conventional resin sealing method, as shown in the cross-sectional view of Figure 1,
A semiconductor pellet 2 is placed on a metal substrate 1, a lead terminal 3 for external connection and the pellet are connected using a gold wire 5, etc., and in this state, the pellet is sealed using a resin 7 such as epoxy. was.

また、あるいは第2図のように、絶縁基板1aの上に半
導体ペレット2を載せ、絶縁基板上の導電i88と半導
体ペレットの電極との間を金線5などで接続し、さらに
、半導体ペレット2をプリコート6で保護し、絶縁基板
1aの側部から導電路8を介してリード端子4により半
導体ペレット2の電極外部引出しを行いエポキシなどの
外装樹脂7を用いて封止しておった。
Alternatively, as shown in FIG. 2, the semiconductor pellet 2 is placed on the insulating substrate 1a, the conductive i88 on the insulating substrate and the electrode of the semiconductor pellet are connected with a gold wire 5, and then the semiconductor pellet 2 is placed on the insulating substrate 1a. The semiconductor pellet 2 was protected with a precoat 6, and the electrode of the semiconductor pellet 2 was led out from the side of the insulating substrate 1a via a conductive path 8 through a lead terminal 4, and the semiconductor pellet 2 was sealed using an exterior resin 7 such as epoxy.

しかし、これらの従来の封止方法では、リード端子と封
止樹脂、またはボンディング全線と封止樹脂との界面に
生じたすき間から浸入する水分を完全に防止できず、半
導体ペレットに到達した水分により半導体ペレットが汚
染されて、故障を生じるということがしばしば起り、樹
脂封止の問題とされていた。
However, these conventional sealing methods cannot completely prevent moisture from entering through gaps created at the interface between the lead terminal and the sealing resin, or between the entire bonding line and the sealing resin. Semiconductor pellets often become contaminated and fail, which has been considered a problem in resin encapsulation.

ハ6発明の目的 本発明の目的は、従来の樹脂封止の耐湿性の欠点を改善
した樹脂封止方法を提供するにある。
C.6 Purpose of the Invention An object of the present invention is to provide a resin sealing method that improves the moisture resistance disadvantage of conventional resin sealing.

二0発明の構成 本発明によれば、半導体ペレットから引き出されている
リード端子または、搭載基板などに沿って浸入する水分
の浸入通路を遮断するように、主外装樹脂層内に吸湿性
をもつ樹脂層を設ける半導体装置の封止方法が得られる
20 Structure of the Invention According to the present invention, the main exterior resin layer has hygroscopicity so as to block the entry path of moisture that enters along the lead terminal pulled out from the semiconductor pellet or the mounting board. A method for sealing a semiconductor device in which a resin layer is provided is obtained.

ホ、実施例 つぎに本発明を実施例により説明する。E, Example Next, the present invention will be explained by examples.

第3図は本発明の第1の実施例を説明するための断面図
である。第3図において、これを第1図の従来例と比べ
た場合、リード端子3の金線5との接続部を、吸湿性を
もった樹脂、例えばフェノール樹脂9により局部的に包
み、さらに外装エポキシ樹脂7で全体的に包覆し保護し
ている。
FIG. 3 is a sectional view for explaining the first embodiment of the present invention. In Fig. 3, when comparing this with the conventional example shown in Fig. 1, the connection part of the lead terminal 3 with the gold wire 5 is locally wrapped with a hygroscopic resin, for example, a phenol resin 9, and the exterior is further covered. It is entirely covered and protected with epoxy resin 7.

第4図は第2図の従来例に対応する第2の実施例で、半
導体ペレット2と金線5で接続した導電路8の、この接
続部近傍を吸湿性をもった樹脂9で局部的に被い、それ
から全体的に外装エポキシ樹脂7で包覆保論している。
FIG. 4 shows a second embodiment corresponding to the conventional example shown in FIG. Then, the entire exterior is covered with epoxy resin 7.

第5図は第3図と同様に、第1図の従来例に対応する第
3の実施例で、第5図においては、金属板lの上の半導
体ペレット2をそのまま吸湿性をもった樹脂9で局部的
に包み、それから外装エポキシ樹脂7で全体的に包覆保
護している。
Similar to FIG. 3, FIG. 5 shows a third embodiment corresponding to the conventional example shown in FIG. 1. In FIG. 9, and then covered and protected as a whole with exterior epoxy resin 7.

第6図は第4の実施例を説明するための断面図で、本例
では、絶縁基板1aの上に載置した複数個の半導体ペレ
ット2,2.・・・・・・に対し、これら全部を一括し
て囲むように、基板1aの上に築堤のように吸湿をもっ
た樹脂#9を設けている。
FIG. 6 is a cross-sectional view for explaining the fourth embodiment. In this embodiment, a plurality of semiconductor pellets 2, 2. . . . In contrast, a moisture-absorbing resin #9 is provided on the substrate 1a, like an embankment, so as to surround all of them at once.

へ1発明の効果 本発明の封止方法では、上記実施例の何れにも該当する
ところの、半導体ペレットから引き出されているリード
端子または該ペレットの搭載基板に沿って浸入する水分
の浸入通路を遮断するように、吸水性をもった樹脂の層
を設けているので、この浸入通路を浸入して来る水分に
対し、吸水性のat脂でこの水分全体を吸い込むことに
より、それから先へ水分が浸入するのは防止されること
になり、信頼性は向上する。
1. Effects of the Invention The sealing method of the present invention prevents moisture from entering along the lead terminal drawn out from the semiconductor pellet or the substrate on which the pellet is mounted, which corresponds to any of the above embodiments. A layer of water-absorbing resin is provided to block the moisture that enters through this infiltration path, and the water-absorbing AT fat absorbs all of the moisture, preventing moisture from flowing forward. Infiltration will be prevented and reliability will be improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は従来の封止方法を説明するための
樹脂封止半導体装置の断面図、第3図。 第4図、第5図および第6図はそれぞれ本発明の第1.
第2.第3および第4の実施例を説明するための樹脂封
止半導体装置の断面図である。 1.1a・・・・・・半導体ペレット搭載基板、2・・
・・・・半導体ベレッ)、3.4・・・・・・リード端
子、5・・・・・・金線、6・・・・・・プリコート、
7・・・・・・外装エポキシ樹脂、8・・・・・・導電
路、9・・・・・・吸水性をもった樹脂。
1 and 2 are cross-sectional views of a resin-sealed semiconductor device for explaining a conventional sealing method, and FIG. 3 is a cross-sectional view of a resin-sealed semiconductor device. 4, 5 and 6 respectively show the first embodiment of the present invention.
Second. FIG. 7 is a cross-sectional view of a resin-sealed semiconductor device for explaining third and fourth examples. 1.1a... Semiconductor pellet mounting board, 2...
... Semiconductor bellet), 3.4 ... Lead terminal, 5 ... Gold wire, 6 ... Precoat,
7... Exterior epoxy resin, 8... Conductive path, 9... Resin with water absorbing properties.

Claims (1)

【特許請求の範囲】[Claims] 半導体ペレットを樹脂で封止するに際し、前記半導体ペ
レットを搭載した基板または引出しリード端子などに沿
って浸入する水分の浸入通Mを遮断するように、主外装
樹脂層内に吸湿性をもった樹脂層を設けたことを特徴と
する半導体装置の封止方法。
When sealing the semiconductor pellet with resin, a hygroscopic resin is added in the main exterior resin layer so as to block the infiltration of moisture M from entering along the board on which the semiconductor pellet is mounted or the lead terminals. A method for sealing a semiconductor device, characterized by providing a layer.
JP59048722A 1984-03-14 1984-03-14 Sealing process of semiconductor device Pending JPS60192353A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59048722A JPS60192353A (en) 1984-03-14 1984-03-14 Sealing process of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59048722A JPS60192353A (en) 1984-03-14 1984-03-14 Sealing process of semiconductor device

Publications (1)

Publication Number Publication Date
JPS60192353A true JPS60192353A (en) 1985-09-30

Family

ID=12811184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59048722A Pending JPS60192353A (en) 1984-03-14 1984-03-14 Sealing process of semiconductor device

Country Status (1)

Country Link
JP (1) JPS60192353A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62183544A (en) * 1986-02-07 1987-08-11 Nec Corp Resin molded semiconductor device
EP0321083A2 (en) * 1987-12-16 1989-06-21 Ford Motor Company Limited Composite polymer/desiccant coatings for IC encapsulation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62183544A (en) * 1986-02-07 1987-08-11 Nec Corp Resin molded semiconductor device
EP0321083A2 (en) * 1987-12-16 1989-06-21 Ford Motor Company Limited Composite polymer/desiccant coatings for IC encapsulation

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