JPS6482646A - Connection of integrated circuit element - Google Patents
Connection of integrated circuit elementInfo
- Publication number
- JPS6482646A JPS6482646A JP62241716A JP24171687A JPS6482646A JP S6482646 A JPS6482646 A JP S6482646A JP 62241716 A JP62241716 A JP 62241716A JP 24171687 A JP24171687 A JP 24171687A JP S6482646 A JPS6482646 A JP S6482646A
- Authority
- JP
- Japan
- Prior art keywords
- bumps
- lead
- electrodes
- integrated circuit
- circuit element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
Landscapes
- Wire Bonding (AREA)
Abstract
PURPOSE:To easily connect the electrodes of an integrated circuit element to opponent conductors by forming by plating outer and inner lead bumps at both ends of a finger lead. CONSTITUTION:A tape carrier 1 is formed by laminating in advance the patterns of finger leads 2 to be connected to the electrodes 5 of an IC chip 4 on both side polyimide films. Windows are opened on both side faces to expose both ends of the lead 2. The exposed both ends are Ni-plated as diffusion preventive layers 21, then Au-plated on the Ni films, one of which becomes outer lead bumps 91 and the other of which becomes inner lead bumps 92. The electrodes 5 of the chip 4 are superposed on the bumps 91, conductors 8 to be connected are positioned on the bumps 92, and simultaneously connected by applying heat and pressure thereto by a bonding tool.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62241716A JPS6482646A (en) | 1987-09-25 | 1987-09-25 | Connection of integrated circuit element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62241716A JPS6482646A (en) | 1987-09-25 | 1987-09-25 | Connection of integrated circuit element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6482646A true JPS6482646A (en) | 1989-03-28 |
Family
ID=17078472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62241716A Pending JPS6482646A (en) | 1987-09-25 | 1987-09-25 | Connection of integrated circuit element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6482646A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0878472A (en) * | 1994-09-05 | 1996-03-22 | Hitachi Cable Ltd | Semiconductor device and base body therefor |
US5504035A (en) * | 1989-08-28 | 1996-04-02 | Lsi Logic Corporation | Process for solder ball interconnecting a semiconductor device to a substrate using a noble metal foil embedded interposer substrate |
EP0683517A3 (en) * | 1994-05-09 | 1997-04-02 | Nec Corp | Semiconductor device having semiconductor chip bonded to circuit board through bumps and process of mounting thereof. |
KR100236885B1 (en) * | 1996-02-01 | 2000-01-15 | 다니구찌 이찌로오 | Semiconductor device and fabrication method thereof |
CN105491643A (en) * | 2014-09-15 | 2016-04-13 | 酷派软件技术(深圳)有限公司 | Dynamic network selection method and device, and terminal equipment |
-
1987
- 1987-09-25 JP JP62241716A patent/JPS6482646A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5504035A (en) * | 1989-08-28 | 1996-04-02 | Lsi Logic Corporation | Process for solder ball interconnecting a semiconductor device to a substrate using a noble metal foil embedded interposer substrate |
EP0683517A3 (en) * | 1994-05-09 | 1997-04-02 | Nec Corp | Semiconductor device having semiconductor chip bonded to circuit board through bumps and process of mounting thereof. |
JPH0878472A (en) * | 1994-09-05 | 1996-03-22 | Hitachi Cable Ltd | Semiconductor device and base body therefor |
KR100236885B1 (en) * | 1996-02-01 | 2000-01-15 | 다니구찌 이찌로오 | Semiconductor device and fabrication method thereof |
CN105491643A (en) * | 2014-09-15 | 2016-04-13 | 酷派软件技术(深圳)有限公司 | Dynamic network selection method and device, and terminal equipment |
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