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JPS6412245A - Particle analyzing device - Google Patents

Particle analyzing device

Info

Publication number
JPS6412245A
JPS6412245A JP62167520A JP16752087A JPS6412245A JP S6412245 A JPS6412245 A JP S6412245A JP 62167520 A JP62167520 A JP 62167520A JP 16752087 A JP16752087 A JP 16752087A JP S6412245 A JPS6412245 A JP S6412245A
Authority
JP
Japan
Prior art keywords
section
particle
optical system
inspected
scattered light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62167520A
Other languages
Japanese (ja)
Inventor
Shinichi Oe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP62167520A priority Critical patent/JPS6412245A/en
Publication of JPS6412245A publication Critical patent/JPS6412245A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To achieve a quantitative alignment, by a method wherein a particle to be inspected is irradiated with a light beam and a statistical numeric value is computed pertaining to the intensity of a signal of scattered light or fluorescence to adjust the state of alignment based on the results of the computation. CONSTITUTION:A laser beam L emitted from a laser light source 5 is reduced to an elliptic form with a condensing optical system 6 and made to irradiate a particle to be inspected flowing through a passage section 2 in a flowcell 1. Front scattered light obtained with the passage of the particle being inspected is detected with a photo-detector 8 through a front optical system 7 while side scattered light, fluorescence and the like are detected with a photo-detector 10 through a side optical system 9. Detection signals of the detectors 8 and 10 are processed by a signal processing section 11 to be inputted into an A/D convertor section 112 and a signal value being digitized is computed with a microcomputer section 13 to be shown on a display section 14 thereby enabling quantitative alignment.
JP62167520A 1987-07-03 1987-07-03 Particle analyzing device Pending JPS6412245A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62167520A JPS6412245A (en) 1987-07-03 1987-07-03 Particle analyzing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62167520A JPS6412245A (en) 1987-07-03 1987-07-03 Particle analyzing device

Publications (1)

Publication Number Publication Date
JPS6412245A true JPS6412245A (en) 1989-01-17

Family

ID=15851214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62167520A Pending JPS6412245A (en) 1987-07-03 1987-07-03 Particle analyzing device

Country Status (1)

Country Link
JP (1) JPS6412245A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170687A (en) * 2004-12-14 2006-06-29 Mitsui Eng & Shipbuild Co Ltd Flow sight meter and measurement method using flow sight meter
JP2009281753A (en) * 2008-05-20 2009-12-03 Hitachi Engineering & Services Co Ltd Microorganism testing device and microorganism testing chip
JP2013044585A (en) * 2011-08-23 2013-03-04 Hitachi Engineering & Services Co Ltd Microorganism inspection device and inspection method
JP2013057547A (en) * 2011-09-07 2013-03-28 Sony Corp Optical measuring apparatus, flow cytometer and optical measuring method
WO2013145836A1 (en) * 2012-03-30 2013-10-03 ソニー株式会社 Microchip optical measuring device and optical position adjustment method for said device
US9784660B2 (en) 2013-01-28 2017-10-10 Sony Corporation Microparticle sorting device, and method and program for sorting microparticles
US10132735B2 (en) 2012-03-30 2018-11-20 Sony Corporation Microparticle sorting device and method of optimizing fluid stream therein
JP2019020233A (en) * 2017-07-14 2019-02-07 株式会社堀場製作所 Monitor device for adjusting light irradiation in particle analyzer
US10309891B2 (en) 2013-10-16 2019-06-04 Sony Corporation Particle sorting apparatus, particle sorting method, and program
US10309892B2 (en) 2014-02-13 2019-06-04 Sony Corporation Particle sorting device, particle sorting method, program, and particle sorting system
US10386287B2 (en) 2014-09-05 2019-08-20 Sony Corporation Droplet sorting device, droplet sorting method and program
US10605714B2 (en) 2015-10-19 2020-03-31 Sony Corporation Image processing device, fine particle sorting device, and image processing method
US11193874B2 (en) 2012-03-30 2021-12-07 Sony Corporation Micro-particle sorting apparatus and method of determining a trajectory of an ejected stream carrying micro-particles

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170687A (en) * 2004-12-14 2006-06-29 Mitsui Eng & Shipbuild Co Ltd Flow sight meter and measurement method using flow sight meter
JP2009281753A (en) * 2008-05-20 2009-12-03 Hitachi Engineering & Services Co Ltd Microorganism testing device and microorganism testing chip
JP2013044585A (en) * 2011-08-23 2013-03-04 Hitachi Engineering & Services Co Ltd Microorganism inspection device and inspection method
JP2013057547A (en) * 2011-09-07 2013-03-28 Sony Corp Optical measuring apparatus, flow cytometer and optical measuring method
US10180676B2 (en) 2012-03-30 2019-01-15 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
US10859996B2 (en) 2012-03-30 2020-12-08 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
JPWO2013145836A1 (en) * 2012-03-30 2015-12-10 ソニー株式会社 Microchip type optical measuring apparatus and optical position adjusting method in the apparatus
US11193874B2 (en) 2012-03-30 2021-12-07 Sony Corporation Micro-particle sorting apparatus and method of determining a trajectory of an ejected stream carrying micro-particles
US9915935B2 (en) 2012-03-30 2018-03-13 Sony Corporation Microchip-type optical measuring apparatus and optical position adjusting method thereof
US10132735B2 (en) 2012-03-30 2018-11-20 Sony Corporation Microparticle sorting device and method of optimizing fluid stream therein
WO2013145836A1 (en) * 2012-03-30 2013-10-03 ソニー株式会社 Microchip optical measuring device and optical position adjustment method for said device
CN104204766A (en) * 2012-03-30 2014-12-10 索尼公司 Microchip optical measuring device and optical position adjustment method for the device
US10241025B2 (en) 2013-01-28 2019-03-26 Sony Corporation Microparticle sorting device, and method and program for sorting microparticles
US9784660B2 (en) 2013-01-28 2017-10-10 Sony Corporation Microparticle sorting device, and method and program for sorting microparticles
US11313784B2 (en) 2013-01-28 2022-04-26 Sony Corporation Microparticle sorting device, and method and program for sorting microparticles
US10309891B2 (en) 2013-10-16 2019-06-04 Sony Corporation Particle sorting apparatus, particle sorting method, and program
US10309892B2 (en) 2014-02-13 2019-06-04 Sony Corporation Particle sorting device, particle sorting method, program, and particle sorting system
US11119030B2 (en) 2014-02-13 2021-09-14 Sony Corporation Particle sorting device, particle sorting method, program, and particle sorting system
US10386287B2 (en) 2014-09-05 2019-08-20 Sony Corporation Droplet sorting device, droplet sorting method and program
US10876952B2 (en) 2014-09-05 2020-12-29 Sony Corporation Droplet sorting device, droplet sorting method and program
US10605714B2 (en) 2015-10-19 2020-03-31 Sony Corporation Image processing device, fine particle sorting device, and image processing method
US11204309B2 (en) 2015-10-19 2021-12-21 Sony Corporation Image processing device, fine particle sorting device, and image processing method
JP2019020233A (en) * 2017-07-14 2019-02-07 株式会社堀場製作所 Monitor device for adjusting light irradiation in particle analyzer

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