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JPS5271289A - Surface inspection device - Google Patents

Surface inspection device

Info

Publication number
JPS5271289A
JPS5271289A JP14812775A JP14812775A JPS5271289A JP S5271289 A JPS5271289 A JP S5271289A JP 14812775 A JP14812775 A JP 14812775A JP 14812775 A JP14812775 A JP 14812775A JP S5271289 A JPS5271289 A JP S5271289A
Authority
JP
Japan
Prior art keywords
inspection device
surface inspection
standard pattern
light
visibility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14812775A
Other languages
Japanese (ja)
Inventor
Takahiko Inari
Mitsuhito Kamei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP14812775A priority Critical patent/JPS5271289A/en
Publication of JPS5271289A publication Critical patent/JPS5271289A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To make possible the detection of fine defects such as of painted plates or the like by radiating the surface of an object to be examined with the light of a preset standard pattern, converting the reflected light to video signals and detecting the visibility of the standard pattern contours.
JP14812775A 1975-12-11 1975-12-11 Surface inspection device Pending JPS5271289A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14812775A JPS5271289A (en) 1975-12-11 1975-12-11 Surface inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14812775A JPS5271289A (en) 1975-12-11 1975-12-11 Surface inspection device

Publications (1)

Publication Number Publication Date
JPS5271289A true JPS5271289A (en) 1977-06-14

Family

ID=15445852

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14812775A Pending JPS5271289A (en) 1975-12-11 1975-12-11 Surface inspection device

Country Status (1)

Country Link
JP (1) JPS5271289A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2449883A1 (en) * 1979-02-20 1980-09-19 Hajime Industries DEFECT DETECTION SYSTEM
JPS56159769A (en) * 1980-05-13 1981-12-09 Fujitsu Ltd Ejection and reception system for medium
US4636648A (en) * 1984-09-20 1987-01-13 Nippon Soken, Inc. Coating quality measuring device
US4682041A (en) * 1984-09-20 1987-07-21 Nippon Soken, Inc. Coating quality measuring device and method
JPS63100308A (en) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd Surface defect inspecting instrument
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
JPH05505677A (en) * 1990-05-18 1993-08-19 ホーゴベンス・グループ・ベー・ブイ Method and apparatus for determining the imageability of surfaces

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2449883A1 (en) * 1979-02-20 1980-09-19 Hajime Industries DEFECT DETECTION SYSTEM
JPS56159769A (en) * 1980-05-13 1981-12-09 Fujitsu Ltd Ejection and reception system for medium
US4636648A (en) * 1984-09-20 1987-01-13 Nippon Soken, Inc. Coating quality measuring device
US4682041A (en) * 1984-09-20 1987-07-21 Nippon Soken, Inc. Coating quality measuring device and method
JPS63100308A (en) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd Surface defect inspecting instrument
JPH05505677A (en) * 1990-05-18 1993-08-19 ホーゴベンス・グループ・ベー・ブイ Method and apparatus for determining the imageability of surfaces
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system

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