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JPS52131751A - Measuring method for thickness of transparent film - Google Patents

Measuring method for thickness of transparent film

Info

Publication number
JPS52131751A
JPS52131751A JP4927376A JP4927376A JPS52131751A JP S52131751 A JPS52131751 A JP S52131751A JP 4927376 A JP4927376 A JP 4927376A JP 4927376 A JP4927376 A JP 4927376A JP S52131751 A JPS52131751 A JP S52131751A
Authority
JP
Japan
Prior art keywords
thickness
measuring method
transparent film
film
enbedding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4927376A
Other languages
Japanese (ja)
Other versions
JPS5549241B2 (en
Inventor
Hiroshi Maejima
Shoichi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4927376A priority Critical patent/JPS52131751A/en
Publication of JPS52131751A publication Critical patent/JPS52131751A/en
Publication of JPS5549241B2 publication Critical patent/JPS5549241B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To simplify the measurement of the thickness of a thin film of several μm formed on a substrate made up of glass or similar substrance, by forming a metal thin layer on the film, enbedding the treated substrate in an organic high-molecule substance, thereafter grinding it.
COPYRIGHT: (C)1977,JPO&Japio
JP4927376A 1976-04-27 1976-04-27 Measuring method for thickness of transparent film Granted JPS52131751A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4927376A JPS52131751A (en) 1976-04-27 1976-04-27 Measuring method for thickness of transparent film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4927376A JPS52131751A (en) 1976-04-27 1976-04-27 Measuring method for thickness of transparent film

Publications (2)

Publication Number Publication Date
JPS52131751A true JPS52131751A (en) 1977-11-04
JPS5549241B2 JPS5549241B2 (en) 1980-12-11

Family

ID=12826224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4927376A Granted JPS52131751A (en) 1976-04-27 1976-04-27 Measuring method for thickness of transparent film

Country Status (1)

Country Link
JP (1) JPS52131751A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57122507U (en) * 1981-01-26 1982-07-30
FI65949C (en) * 1982-10-27 1984-08-10 Kalervo Virtanen SIGNALING FOR FORDON
JPS6225282A (en) * 1985-07-26 1987-02-03 Roudoushiyou Sangyo Anzen Kenkyusho Contacting detecting device
JPH0314480U (en) * 1989-06-26 1991-02-14

Also Published As

Publication number Publication date
JPS5549241B2 (en) 1980-12-11

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