JPS57130358A - Full automatic ion implantation device - Google Patents
Full automatic ion implantation deviceInfo
- Publication number
- JPS57130358A JPS57130358A JP1501881A JP1501881A JPS57130358A JP S57130358 A JPS57130358 A JP S57130358A JP 1501881 A JP1501881 A JP 1501881A JP 1501881 A JP1501881 A JP 1501881A JP S57130358 A JPS57130358 A JP S57130358A
- Authority
- JP
- Japan
- Prior art keywords
- implantation
- ion beam
- ion implantation
- control computer
- ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
PURPOSE:To implant ions automatically by using a computer for operations such as generation of plasma, extraction of an ion beam, mass analysis of ions, setting of acceleration voltage, and ion implantation in a specimen. CONSTITUTION:An acceleration power supply 50 is set at a predetermined value by a control computer 20 through a beam line controller 43. After mass analysis, an ion beam is accelerated to a predetermined value by an accelerator 49, is emitted into a beam line section 40, and is focused to an optimum condition by a lens electrode 41. Then, the ion beam is scanned electrostatically by a scanner 42 controlled by the control computer 20. The ion beam injected into an end station 44 is illuminated on an inserted specimen 46, and the ion implantation is continued until a predetermined quantity of implantation is reached. Setting of the implantation quantity and monitoring of the current value are conducted through measurement by a dosimeter 48 and control by the control computer 20.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1501881A JPS57130358A (en) | 1981-02-05 | 1981-02-05 | Full automatic ion implantation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1501881A JPS57130358A (en) | 1981-02-05 | 1981-02-05 | Full automatic ion implantation device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57130358A true JPS57130358A (en) | 1982-08-12 |
JPH0234151B2 JPH0234151B2 (en) | 1990-08-01 |
Family
ID=11877118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1501881A Granted JPS57130358A (en) | 1981-02-05 | 1981-02-05 | Full automatic ion implantation device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57130358A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60107246A (en) * | 1983-08-15 | 1985-06-12 | アプライド マテリアルズ インコ−ポレ−テツド | Ion source device |
JPS60232656A (en) * | 1984-04-28 | 1985-11-19 | Nissin Electric Co Ltd | Ion implanting equipment |
JPS62108440A (en) * | 1985-11-06 | 1987-05-19 | Hitachi Ltd | Fine machining device |
JPS62117247A (en) * | 1985-11-18 | 1987-05-28 | Tokyo Electron Ltd | Ion implantation system |
JPS62142151U (en) * | 1986-03-03 | 1987-09-08 | ||
JPS63146337A (en) * | 1986-12-08 | 1988-06-18 | Fuji Electric Co Ltd | Ion beam device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS507797U (en) * | 1973-05-21 | 1975-01-27 | ||
JPS5021673A (en) * | 1973-05-23 | 1975-03-07 | ||
JPS5569370U (en) * | 1978-11-08 | 1980-05-13 | ||
JPS5569950A (en) * | 1978-11-20 | 1980-05-27 | Mitsubishi Electric Corp | Control method of analytical magnet and its device |
-
1981
- 1981-02-05 JP JP1501881A patent/JPS57130358A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS507797U (en) * | 1973-05-21 | 1975-01-27 | ||
JPS5021673A (en) * | 1973-05-23 | 1975-03-07 | ||
JPS5569370U (en) * | 1978-11-08 | 1980-05-13 | ||
JPS5569950A (en) * | 1978-11-20 | 1980-05-27 | Mitsubishi Electric Corp | Control method of analytical magnet and its device |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60107246A (en) * | 1983-08-15 | 1985-06-12 | アプライド マテリアルズ インコ−ポレ−テツド | Ion source device |
JPH0531259B2 (en) * | 1983-08-15 | 1993-05-12 | Applied Materials Inc | |
JPS60232656A (en) * | 1984-04-28 | 1985-11-19 | Nissin Electric Co Ltd | Ion implanting equipment |
JPS62108440A (en) * | 1985-11-06 | 1987-05-19 | Hitachi Ltd | Fine machining device |
JPS62117247A (en) * | 1985-11-18 | 1987-05-28 | Tokyo Electron Ltd | Ion implantation system |
JPS62142151U (en) * | 1986-03-03 | 1987-09-08 | ||
JPS63146337A (en) * | 1986-12-08 | 1988-06-18 | Fuji Electric Co Ltd | Ion beam device |
Also Published As
Publication number | Publication date |
---|---|
JPH0234151B2 (en) | 1990-08-01 |
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