JPS5690373A - Digitizing processing system for binary pattern - Google Patents
Digitizing processing system for binary patternInfo
- Publication number
- JPS5690373A JPS5690373A JP16802279A JP16802279A JPS5690373A JP S5690373 A JPS5690373 A JP S5690373A JP 16802279 A JP16802279 A JP 16802279A JP 16802279 A JP16802279 A JP 16802279A JP S5690373 A JPS5690373 A JP S5690373A
- Authority
- JP
- Japan
- Prior art keywords
- binary
- window
- coded picture
- inputted
- shift register
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Image Analysis (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Processing (AREA)
Abstract
PURPOSE: To convert a large amount of binary two-dimensional pattern information into a relatively small amount of numeric information nearly simultaneously with image pickup operation, by fetching binary-coded picture signals in all areas in frames successively into a window consisting of parallel outputs of a shift register group.
CONSTITUTION: Data of seven-by-seven elements from which parallel outputs of shift register group 7 can be extracted are inputted from an input terminal from picture signals and this element group is regarded as a window. Then, binary-coded picture signal 6 from ITV camera 2 is inputted to the shift register group with a shift clock signal, so that the binary-coded picture signal of an area of seven-by- seven picture elements at the left upper end will be inputted. Every time an advance is made by one clock, the window moves to right and, after reaching the right upper end, moves to the part under the left upper end. Thus, binary-coded picture signals of all areas in frames appear in the window successively. For this purpose, the output of the window is led to a logic circuit that detects the angle of a pattern, so that a large amount of binary two-dimensional pattern information can be converted into a relatively small amount of numeric information nearly simultaneously with image pickup operation.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54168022A JPS5914782B2 (en) | 1979-12-24 | 1979-12-24 | Binary pattern digitization processing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54168022A JPS5914782B2 (en) | 1979-12-24 | 1979-12-24 | Binary pattern digitization processing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5690373A true JPS5690373A (en) | 1981-07-22 |
JPS5914782B2 JPS5914782B2 (en) | 1984-04-06 |
Family
ID=15860350
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54168022A Expired JPS5914782B2 (en) | 1979-12-24 | 1979-12-24 | Binary pattern digitization processing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5914782B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5833835A (en) * | 1981-08-24 | 1983-02-28 | Hitachi Ltd | Pattern inspection |
JPS58134429A (en) * | 1982-02-04 | 1983-08-10 | Nippon Kogaku Kk <Nikon> | Testing device for defect of pattern |
JPS58199528A (en) * | 1982-05-18 | 1983-11-19 | Nippon Kogaku Kk <Nikon> | Defect inspecting device for pattern |
JPS59108171A (en) * | 1982-12-14 | 1984-06-22 | Omron Tateisi Electronics Co | Method for extracting singular point of pattern |
-
1979
- 1979-12-24 JP JP54168022A patent/JPS5914782B2/en not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5833835A (en) * | 1981-08-24 | 1983-02-28 | Hitachi Ltd | Pattern inspection |
JPS58134429A (en) * | 1982-02-04 | 1983-08-10 | Nippon Kogaku Kk <Nikon> | Testing device for defect of pattern |
JPH0480427B2 (en) * | 1982-02-04 | 1992-12-18 | Nippon Kogaku Kk | |
JPS58199528A (en) * | 1982-05-18 | 1983-11-19 | Nippon Kogaku Kk <Nikon> | Defect inspecting device for pattern |
JPS59108171A (en) * | 1982-12-14 | 1984-06-22 | Omron Tateisi Electronics Co | Method for extracting singular point of pattern |
JPH0354384B2 (en) * | 1982-12-14 | 1991-08-20 |
Also Published As
Publication number | Publication date |
---|---|
JPS5914782B2 (en) | 1984-04-06 |
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