JPS5664337A - Radiation resist material and radiation resist pattern forming method - Google Patents
Radiation resist material and radiation resist pattern forming methodInfo
- Publication number
- JPS5664337A JPS5664337A JP14022679A JP14022679A JPS5664337A JP S5664337 A JPS5664337 A JP S5664337A JP 14022679 A JP14022679 A JP 14022679A JP 14022679 A JP14022679 A JP 14022679A JP S5664337 A JPS5664337 A JP S5664337A
- Authority
- JP
- Japan
- Prior art keywords
- radiation resist
- forming method
- pattern forming
- substrate
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Abstract
PURPOSE: To obtain a super minute pattern of high resolution and sensitivity with high reproducibility by applying a copolymer of methacrylic acid and methyl methacrylate to a substrate and irradiating it after heat treatment.
CONSTITUTION: A copolymer consisting of 95W85mol% methyl methacrylate and 5W15mol% methacrylic acid and having 30,000W100,000wt. average mol.wt. is dissolved in a solvent such as methyl cellosolve acetate, and this soln. is applied to a substrate to form a film. This film is then heat treated, irradiated to form a predetermined latent image, and developed by dipping in a developer such as methyl ethyl ketone or ethyl acetate. Thus, a resist sectional form having a vertical wall surface can be obtd. with high resolution (0.3W0.8μ), high sensitivity (7×10-6W 3×10-5C/cm2) and high reproducibility.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14022679A JPS5664337A (en) | 1979-10-29 | 1979-10-29 | Radiation resist material and radiation resist pattern forming method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14022679A JPS5664337A (en) | 1979-10-29 | 1979-10-29 | Radiation resist material and radiation resist pattern forming method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5664337A true JPS5664337A (en) | 1981-06-01 |
Family
ID=15263833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14022679A Pending JPS5664337A (en) | 1979-10-29 | 1979-10-29 | Radiation resist material and radiation resist pattern forming method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5664337A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58116532A (en) * | 1981-12-29 | 1983-07-11 | Fujitsu Ltd | Pattern formation |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS526203A (en) * | 1975-06-30 | 1977-01-18 | Ibm | Method of forming positive resist image |
JPS54133322A (en) * | 1978-04-07 | 1979-10-17 | Cho Lsi Gijutsu Kenkyu Kumiai | Positive type ionizing radiation sensitive resist |
-
1979
- 1979-10-29 JP JP14022679A patent/JPS5664337A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS526203A (en) * | 1975-06-30 | 1977-01-18 | Ibm | Method of forming positive resist image |
JPS54133322A (en) * | 1978-04-07 | 1979-10-17 | Cho Lsi Gijutsu Kenkyu Kumiai | Positive type ionizing radiation sensitive resist |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58116532A (en) * | 1981-12-29 | 1983-07-11 | Fujitsu Ltd | Pattern formation |
JPH0262859B2 (en) * | 1981-12-29 | 1990-12-26 | Fujitsu Ltd |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5754317A (en) | Method and device for forming pattern | |
JPS542720A (en) | Forming method of photopolymerized image | |
JPS5569265A (en) | Pattern-forming method | |
DE3541451A1 (en) | Process for producing a negative image | |
JPS5466829A (en) | Pattern formation materil | |
JPS561536A (en) | Manufacture of resist pattern | |
JPS5664337A (en) | Radiation resist material and radiation resist pattern forming method | |
JPS5276600A (en) | Solidifying method with cement of radioactive liquid waste | |
JPS5466776A (en) | Fine pattern forming method | |
JPS55156941A (en) | Micropattern forming method | |
JPS55163841A (en) | Method for electron beam exposure | |
JPS55134847A (en) | Manufacture of resist image | |
DE3020976C2 (en) | Process for increasing the processing latitude of photohardenable recording materials | |
JPS5552051A (en) | Radiation resist and formation method for radiation resist pattern | |
JPS5353314A (en) | Sensitive high polymer composition and picture imae forming method usingsaid composition | |
JPS56114943A (en) | Negative type resist material for electron beam | |
JPS556341A (en) | Developing method for electron beam resist | |
JPS56100417A (en) | Forming method for resist pattern | |
JPS5669625A (en) | Minute pattern forming method | |
JPS55134845A (en) | Electron beam resist | |
JPS558013A (en) | Semiconductor device manufacturing method | |
JPS57151310A (en) | Decorating method | |
JPS5516317A (en) | Method for forming fluorescent screen of color picture tube | |
JPS5558243A (en) | Highly sensitive positive resist composition | |
JPS55147624A (en) | Ionized radiation sensitive positive type resist |