JPS56107463A - Electron spectrometer - Google Patents
Electron spectrometerInfo
- Publication number
- JPS56107463A JPS56107463A JP16812280A JP16812280A JPS56107463A JP S56107463 A JPS56107463 A JP S56107463A JP 16812280 A JP16812280 A JP 16812280A JP 16812280 A JP16812280 A JP 16812280A JP S56107463 A JPS56107463 A JP S56107463A
- Authority
- JP
- Japan
- Prior art keywords
- electron spectrometer
- spectrometer
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB7941332 | 1979-11-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56107463A true JPS56107463A (en) | 1981-08-26 |
JPS626303B2 JPS626303B2 (en) | 1987-02-10 |
Family
ID=10509510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16812280A Granted JPS56107463A (en) | 1979-11-30 | 1980-12-01 | Electron spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56107463A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006008840A1 (en) * | 2004-07-15 | 2006-01-26 | National University Corporation NARA Institute of Science and Technology | Spherical aberration correction electrostatic lens, input lens, electron spectroscopic device, photoelectron microscope, and measurement system |
JP2015036670A (en) * | 2013-08-16 | 2015-02-23 | 日本電子株式会社 | Electron spectrometer |
JP2018119974A (en) * | 2018-02-28 | 2018-08-02 | シエンタ・オミクロン・アーベー | Analyser for particle spectrometer |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE12870629T1 (en) | 2012-03-06 | 2015-03-19 | Vg Scienta Ab | Analyzer arrangement for particle spectrometer |
JP5815826B2 (en) * | 2014-10-07 | 2015-11-17 | ヴィゲー・シエンタ・アーベー | Analytical equipment for particle spectrometer |
-
1980
- 1980-12-01 JP JP16812280A patent/JPS56107463A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006008840A1 (en) * | 2004-07-15 | 2006-01-26 | National University Corporation NARA Institute of Science and Technology | Spherical aberration correction electrostatic lens, input lens, electron spectroscopic device, photoelectron microscope, and measurement system |
US7655923B2 (en) | 2004-07-15 | 2010-02-02 | National University Corporation NARA Institute of Science and Technology | Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system |
JP4802340B2 (en) * | 2004-07-15 | 2011-10-26 | 国立大学法人 奈良先端科学技術大学院大学 | Spherical aberration correcting electrostatic lens, input lens, electron spectrometer, photoelectron microscope, and measurement system |
JP2015036670A (en) * | 2013-08-16 | 2015-02-23 | 日本電子株式会社 | Electron spectrometer |
JP2018119974A (en) * | 2018-02-28 | 2018-08-02 | シエンタ・オミクロン・アーベー | Analyser for particle spectrometer |
Also Published As
Publication number | Publication date |
---|---|
JPS626303B2 (en) | 1987-02-10 |
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