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JPS5537924A - Integrated circuit - Google Patents

Integrated circuit

Info

Publication number
JPS5537924A
JPS5537924A JP11068978A JP11068978A JPS5537924A JP S5537924 A JPS5537924 A JP S5537924A JP 11068978 A JP11068978 A JP 11068978A JP 11068978 A JP11068978 A JP 11068978A JP S5537924 A JPS5537924 A JP S5537924A
Authority
JP
Japan
Prior art keywords
change
integrated circuit
test
circuit
gates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11068978A
Other languages
Japanese (ja)
Inventor
Kyoji Tomita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11068978A priority Critical patent/JPS5537924A/en
Publication of JPS5537924A publication Critical patent/JPS5537924A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To test independently the respective integrated circuits mounted in the card and simply judge the condition of the card by providing a change-over circuit of the input and the output terminals for the integrated circuit portion.
CONSTITUTION: In accordance with the logic level 0 of the test mode signal impressed to the change-over terminal 301 of the integrated circuit 300, the inputs of the test input terminals 302W305 impressed to AND gates 312W315 of the input change-over circuit 310 are applied to the integrated circuit 320 and the output from the circuit portion 320 passes through the AND gates 342W345 of the output change-over circuit 330 and are taken out from the test output terminals 332W335. When the level of the terminal 301 is 1, the gates 316W319 and 346W349 are valid, and the signals of the input terminals 306W309 are taken out to the output terminals 336W339 through the circuit portion 320.
COPYRIGHT: (C)1980,JPO&Japio
JP11068978A 1978-09-11 1978-09-11 Integrated circuit Pending JPS5537924A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11068978A JPS5537924A (en) 1978-09-11 1978-09-11 Integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11068978A JPS5537924A (en) 1978-09-11 1978-09-11 Integrated circuit

Publications (1)

Publication Number Publication Date
JPS5537924A true JPS5537924A (en) 1980-03-17

Family

ID=14541943

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11068978A Pending JPS5537924A (en) 1978-09-11 1978-09-11 Integrated circuit

Country Status (1)

Country Link
JP (1) JPS5537924A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58100761A (en) * 1981-12-11 1983-06-15 Matsushita Electric Ind Co Ltd Inspecting device for integrated circuit element
JPS58127371U (en) * 1982-02-22 1983-08-29 日本電気株式会社 Output circuit
JPS60148138A (en) * 1984-01-13 1985-08-05 Sony Corp Integrated circuit having testing function
JPH0992787A (en) * 1995-09-28 1997-04-04 Nec Yamaguchi Ltd Semiconductor device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58100761A (en) * 1981-12-11 1983-06-15 Matsushita Electric Ind Co Ltd Inspecting device for integrated circuit element
JPH0472197B2 (en) * 1981-12-11 1992-11-17 Matsushita Electric Ind Co Ltd
JPS58127371U (en) * 1982-02-22 1983-08-29 日本電気株式会社 Output circuit
JPH0318954Y2 (en) * 1982-02-22 1991-04-22
JPS60148138A (en) * 1984-01-13 1985-08-05 Sony Corp Integrated circuit having testing function
JPH0583877B2 (en) * 1984-01-13 1993-11-29 Sony Corp
JPH0992787A (en) * 1995-09-28 1997-04-04 Nec Yamaguchi Ltd Semiconductor device

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