JPS55152474A - Partial discharge detection circuit - Google Patents
Partial discharge detection circuitInfo
- Publication number
- JPS55152474A JPS55152474A JP6044479A JP6044479A JPS55152474A JP S55152474 A JPS55152474 A JP S55152474A JP 6044479 A JP6044479 A JP 6044479A JP 6044479 A JP6044479 A JP 6044479A JP S55152474 A JPS55152474 A JP S55152474A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- currents
- caused
- diodes
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE: To improve derection sensitivity, by using diodes to compose a circuit in which electrical current flowing branch paths are changed depending on the direction of a pulse current and by separating external noises.
CONSTITUTION: A basic circuit is composed of diodes 1A, 1B, 1C, 1D, 1E, 1F. Terminals A, B, C are connected to a bypass capacitor CA, a sample equivalent capacitor CB and an equivalent impedance member ZP, respectively. The distribution of currents, which are caused when the capacitor CB is partially discharged, is identical with that of currents which are caused when a series circuit comprising a very small capacitor CP and a pulse generator PG is coupled in parallel with the capacitor CB. When the pulse generator produces a positive voltage pulse, currents i1, i2, i3 are caused due to the rectifying action of the diodes 1AW1F as shown by full lines in Fig. When the pulse generator produces a negative voltage pulse, other currents i1', i2', i3' are caused as shown by dotted lines in Fig. When the positive voltage pulse is produced, a current flows from the capacitor CB to the diode 1A but no noise flows through the diode. The current of the diode 1A is detected. This results in improving sensitivity.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6044479A JPS55152474A (en) | 1979-05-18 | 1979-05-18 | Partial discharge detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6044479A JPS55152474A (en) | 1979-05-18 | 1979-05-18 | Partial discharge detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55152474A true JPS55152474A (en) | 1980-11-27 |
Family
ID=13142446
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6044479A Pending JPS55152474A (en) | 1979-05-18 | 1979-05-18 | Partial discharge detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55152474A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60236074A (en) * | 1984-05-09 | 1985-11-22 | Nippon Keisokki Seizosho:Kk | Optical-electric conversion tuning type partial discharge measuring device |
| JP2019090693A (en) * | 2017-11-15 | 2019-06-13 | 株式会社明電舎 | Partial discharge detector |
| EP3674721A1 (en) * | 2018-12-28 | 2020-07-01 | Palo Alto Research Center Incorporated | Partial discharge transducer |
| US11067610B2 (en) | 2018-12-28 | 2021-07-20 | Palo Alto Research Center Incorporated | Partial discharge detector |
| US11486919B2 (en) | 2019-10-24 | 2022-11-01 | Palo Alto Research Center Incorporated | Partial discharge sensor |
-
1979
- 1979-05-18 JP JP6044479A patent/JPS55152474A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60236074A (en) * | 1984-05-09 | 1985-11-22 | Nippon Keisokki Seizosho:Kk | Optical-electric conversion tuning type partial discharge measuring device |
| JPH0522874B2 (en) * | 1984-05-09 | 1993-03-30 | Nippon Keisokuki Seizosho Kk | |
| JP2019090693A (en) * | 2017-11-15 | 2019-06-13 | 株式会社明電舎 | Partial discharge detector |
| EP3674721A1 (en) * | 2018-12-28 | 2020-07-01 | Palo Alto Research Center Incorporated | Partial discharge transducer |
| US11067610B2 (en) | 2018-12-28 | 2021-07-20 | Palo Alto Research Center Incorporated | Partial discharge detector |
| US11287463B2 (en) | 2018-12-28 | 2022-03-29 | Palo Alto Research Center Incorporated | Partial discharge transducer |
| US11802901B2 (en) | 2018-12-28 | 2023-10-31 | Xerox Corporation | Partial discharge transducer |
| US11486919B2 (en) | 2019-10-24 | 2022-11-01 | Palo Alto Research Center Incorporated | Partial discharge sensor |
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