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JPH1082626A - Fight-coupling apparatus for detection of inclination - Google Patents

Fight-coupling apparatus for detection of inclination

Info

Publication number
JPH1082626A
JPH1082626A JP23493496A JP23493496A JPH1082626A JP H1082626 A JPH1082626 A JP H1082626A JP 23493496 A JP23493496 A JP 23493496A JP 23493496 A JP23493496 A JP 23493496A JP H1082626 A JPH1082626 A JP H1082626A
Authority
JP
Japan
Prior art keywords
light
light receiving
light emitting
chip
emitting element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23493496A
Other languages
Japanese (ja)
Other versions
JP3228683B2 (en
Inventor
Hirofumi Shindo
弘文 進藤
Mitsuo Kobachi
光夫 小鉢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP23493496A priority Critical patent/JP3228683B2/en
Publication of JPH1082626A publication Critical patent/JPH1082626A/en
Application granted granted Critical
Publication of JP3228683B2 publication Critical patent/JP3228683B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19107Disposition of discrete passive components off-chip wires

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To stably and highly accurately detect the inclination of an object to be detected. SOLUTION: A light-emitting chip 20 is loaded at a non-receiving area 21z of a photodetecting face 21 of a photodetecting chip 2 so that photodetecting areas 21a-21d are located via an equal distance on a circumference centering an optical axis of the light-emitting chip 20. When a light from the light-emitting chip 20 is reflected at an object to be detected and brought into the photodetecting areas 21a-21d, signals corresponding to an inclination of the object to be detected are output from the photodetecing areas 21a-21d. A detection characteristic to the inclination of the object about an X-axis becomes nearly equal to that to the inclination about a Y-axis.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、小型のパーソナル
コンピュータのポインティングデバイス等に使用される
傾き検出用光結合装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tilt detecting optical coupling device used for a pointing device of a small personal computer.

【0002】[0002]

【従来の技術】近年、コンピュータを使用したゲーム機
が種々販売されている。この種のゲーム機においては、
ジョイスティックや入力パッド等の操作部を操作する
と、この操作部の傾きを傾き検出用センサにより検出
し、このときの検出信号に基づいて表示画面に表示され
るキャラクター等を移動させる構造となっている。傾き
検出用センサとしては、一般に操作部の電気的な接触を
伴う接触式のものが使用されているが、接触不良等によ
る誤動作が生じやすく信頼性に問題があるため、最近で
は信頼性の高い非接触式(光学式)のものが使用されて
きている。
2. Description of the Related Art In recent years, various game machines using computers have been sold. In this type of game machine,
When an operation unit such as a joystick or an input pad is operated, a tilt of the operation unit is detected by a tilt detection sensor, and a character or the like displayed on a display screen is moved based on a detection signal at this time. . As a sensor for detecting the inclination, a contact type sensor that generally involves electrical contact with the operation unit is used. However, since malfunction due to poor contact or the like is likely to occur, there is a problem in reliability. Non-contact (optical) types have been used.

【0003】また、パーソナルコンピュータにおける出
力装置の表示画面でのカーソル移動やポインティング等
を行うためにマウスを使用しているが、これはパーソナ
ルコンピュータとは分離して、操作板や机上等の平面上
を移動させることによって操作するため、近年需要が高
まっている携帯用の小型パーソナルコンピュータには使
用できない。そこで、小型パーソナルコンピュータにお
いては、キーボード内のキーの間にポインティングデバ
イスを配置したものがある。このポインティングデバイ
スとしては、光学式の傾き検出用センサに中空のスティ
ックを被せたものがあり、スティックを操作することに
よりスティックの天面(反射面)が傾き、この傾きを傾
き検出用センサにより検出し、このときの検出信号に基
づいて表示画面でのカーソル移動やポインティング等を
行うようになっている。
In addition, a mouse is used for moving a cursor, pointing, and the like on a display screen of an output device in a personal computer. This is separate from the personal computer and is used on a flat surface such as an operation panel or a desk. Since it is operated by moving a computer, it cannot be used for a portable small personal computer that has been increasing in demand in recent years. Therefore, some small personal computers have a pointing device arranged between keys in a keyboard. As this pointing device, there is a device in which a hollow stick is placed over an optical tilt detection sensor. By operating the stick, the top surface (reflection surface) of the stick is tilted, and the tilt is detected by the tilt detection sensor. Then, based on the detection signal at this time, cursor movement, pointing, and the like on the display screen are performed.

【0004】光電変換素子(受発光素子)を使用した従
来の光学式の傾き検出用センサは、図10,11,12
に示すように、発光素子(発光チップ)1と4セグメン
トの受光領域2a〜2dを有する受光素子(受光チッ
プ)2とが共通の搭載用リードフレーム3にダイボンド
され、これらが結線用リードフレーム4〜8に金線等の
ボンディングワイヤ9,10を介して接続され、レンズ
キャップ11により発光チップ1および受光チップ2が
覆われている。なお、各リードフレーム3〜8は、その
表面(チップ搭載面やボンディングワイヤ9,10が接
続される面)が露出した状態で熱可塑性樹脂からなる基
板12に埋め込まれた状態となっている。
A conventional optical inclination detecting sensor using a photoelectric conversion element (light receiving / emitting element) is shown in FIGS.
As shown in FIG. 2, a light emitting element (light emitting chip) 1 and a light receiving element (light receiving chip) 2 having four segments of light receiving areas 2a to 2d are die-bonded to a common mounting lead frame 3, and these are connected to a connection lead frame 4. 8 are connected via bonding wires 9 and 10 such as gold wires, and the lens cap 11 covers the light emitting chip 1 and the light receiving chip 2. Each of the lead frames 3 to 8 is embedded in a substrate 12 made of a thermoplastic resin with its surface (the surface on which the chip is mounted and the surface to which the bonding wires 9 and 10 are connected) exposed.

【0005】レンズキャップ11は、図11に示すよう
に、円筒状の側壁部13と、該側壁部13の一端を塞ぐ
凸レンズ14とが透光性樹脂により一体的に形成されて
なる。そして、側壁部13の開放した他端が基板12に
接着剤等により接着されている。
As shown in FIG. 11, the lens cap 11 has a cylindrical side wall 13 and a convex lens 14 closing one end of the side wall 13 integrally formed of a translucent resin. The other open end of the side wall 13 is bonded to the substrate 12 with an adhesive or the like.

【0006】そして、発光チップ1から出射した光は、
レンズキャップ11の凸レンズ14で集光され、ゲーム
機における操作部や小型パーソナルコンピュータにおけ
るスティック等の被検出物Sで反射して再び凸レンズ1
4で集光され、受光チップ2の各受光領域2a〜2dに
入射し、各受光領域2a〜2dから受光量に比例した電
流が流れ、この各電流値を処理回路で演算処理すること
により被検出物Sの傾き方向および傾き量を検出するこ
とができるようになっている。
The light emitted from the light emitting chip 1 is
The light is condensed by the convex lens 14 of the lens cap 11, is reflected by an operation unit in a game machine or an object S such as a stick in a small personal computer, and is again reflected by the convex lens
The light is condensed at 4 and is incident on each of the light receiving areas 2a to 2d of the light receiving chip 2, and a current proportional to the amount of received light flows from each of the light receiving areas 2a to 2d. The tilt direction and the tilt amount of the detection object S can be detected.

【0007】演算処理の方法としては、受光領域2aに
おける電流値をIa、受光領域2bにおける電流値をI
b、受光領域2cにおける電流値をIc、受光領域2d
における電流値Idとすると、被検出物SのX軸(図1
2参照)周りの傾き信号Sxを、 Sx=(Ia+Ic)−(Ib+Id) 同様にY軸(図12参照)周りの傾き信号Syを、 Sy=(Ia+Ib)−(Ic+Id) として求める。このときの傾き信号Sxから求められる
演算結果とX軸周りの実際の傾き角との関係は、図13
(a)に示すようなS字カーブの特性となり、傾き信号
Syから求められる演算結果とY軸周りの実際の傾き角
との関係は、図13(b)に示すようなS字カーブの特
性となるので、演算結果から得られる2方向の実際の傾
き角から被検出物Sの傾き方向および傾き量を求めるよ
うになっている。
As a method of the arithmetic processing, the current value in the light receiving region 2a is Ia, and the current value in the light receiving region 2b is Ia.
b, current value in light receiving area 2c is Ic, light receiving area 2d
, The X-axis of the object S (FIG. 1)
2) Sx = (Ia + Ic)-(Ib + Id) Similarly, a tilt signal Sy around the Y axis (see FIG. 12) is obtained as Sy = (Ia + Ib)-(Ic + Id). The relationship between the calculation result obtained from the tilt signal Sx at this time and the actual tilt angle around the X axis is shown in FIG.
13A, the relationship between the calculation result obtained from the tilt signal Sy and the actual tilt angle around the Y axis is as shown in FIG. 13B. Therefore, the tilt direction and the tilt amount of the detection target S are obtained from the actual tilt angles in two directions obtained from the calculation results.

【0008】この傾き検出用センサにおいては、発光チ
ップ1と受光チップ2の各受光領域2a〜2dとが別体
で離れており、しかもこれらが光学系の光軸からずれた
位置に配置されているため、図13からも明らかなよう
に、被検出物SのX軸周りの特性と、Y軸周りの特性と
が相違してしまい、高精度な傾き検出を行うことができ
なかった。
In this inclination detecting sensor, the light-emitting chip 1 and the light-receiving areas 2a to 2d of the light-receiving chip 2 are separate and separated from each other, and they are arranged at positions shifted from the optical axis of the optical system. Therefore, as is clear from FIG. 13, the characteristics of the object S around the X-axis and the characteristics around the Y-axis are different, and high-precision tilt detection cannot be performed.

【0009】また、上記相違は、受発光チップ1,2の
配置だけでなく、受発光チップ1,2と被検出物Sとの
距離のバラツキやレンズバラツキ等の要因も関係してく
るので、処理回路で補正しようとしても、その補正は非
常に困難であった。したがって、高精度な傾き検出を要
求される装置に対しては適用しにくく、汎用性に乏しか
った。
In addition, the above-mentioned difference is related not only to the arrangement of the light emitting / receiving chips 1 and 2 but also to factors such as variations in the distance between the light emitting / receiving chips 1 and 2 and the object S, and lens variations. Even if an attempt was made to make corrections with a processing circuit, the corrections were very difficult. Therefore, it is difficult to apply the present invention to a device that requires high-precision tilt detection, and is poor in versatility.

【0010】そこで、上記問題を解消すべく、特開昭6
2−69111号公報には、図14に示すように、発光
チップ15の周りに4個の受光チップ16が位置するよ
うにこれらを基板17に搭載して、発光チップ15の光
軸とレンズの光学中心とを一致させた傾き検出センサが
開示されている。この構造では、光学系の光軸に対して
各受光チップ16が光学的対称性を有することになり、
被検出物SのX軸周りの特性と、Y軸周りの特性とが同
等となり、検出精度の向上を図ることができる。
In order to solve the above problem, Japanese Patent Application Laid-Open No.
In Japanese Patent Application Laid-Open No. 2-69111, as shown in FIG. 14, four light receiving chips 16 are mounted on a substrate 17 so as to be positioned around the light emitting chip 15, and the optical axis of the light emitting chip 15 and the lens There is disclosed an inclination detection sensor in which an optical center is matched. In this structure, each light receiving chip 16 has optical symmetry with respect to the optical axis of the optical system,
The characteristics of the object S around the X-axis and the characteristics around the Y-axis become equal, and the detection accuracy can be improved.

【0011】[0011]

【発明が解決しようとする課題】しかしながら、特開昭
62−69111号公報の傾き検出センサにおいては、
発光チップ15および各受光チップ16を基板17の配
線パターンにボンディングワイヤを介して電気的に接続
している場合、発光チップ15からの光がボンディング
ワイヤで反射して、高精度な傾き検出を行うことができ
ないといった恐れがある。
However, in the inclination detecting sensor disclosed in JP-A-62-69111,
When the light emitting chip 15 and each light receiving chip 16 are electrically connected to the wiring pattern of the substrate 17 via a bonding wire, light from the light emitting chip 15 is reflected by the bonding wire, and highly accurate tilt detection is performed. There is a fear that they cannot do it.

【0012】また、発光チップ15の周りに4個の受光
チップ16を個別に配置しているので、発光チップ15
に対して各受光チップ16を夫々精度良く位置決めする
必要があり、その製造工程が煩雑で、信頼性に乏しいと
いった問題があった。
Since the four light receiving chips 16 are individually arranged around the light emitting chip 15, the light emitting chip 15
However, it is necessary to accurately position each of the light receiving chips 16, and the manufacturing process is complicated and the reliability is poor.

【0013】本発明は、上記に鑑み、製造工程の簡略化
およびコストダウンを図り得、安定して高精度な傾き検
出が可能な信頼性の高い傾き検出用光結合装置の提供を
目的とする。
SUMMARY OF THE INVENTION In view of the above, it is an object of the present invention to provide a highly reliable tilt detecting optical coupling device capable of simplifying the manufacturing process and reducing the cost, and capable of stably and accurately detecting a tilt. .

【0014】[0014]

【課題を解決するための手段】本発明による課題解決手
段は、発光素子と、受光面に複数の受光領域と非受光領
域とを有する受光素子とを備え、発光素子からの光が被
検出物で反射されて受光素子に入射したときに各受光領
域から被検出物の傾きに応じた信号を出力する光結合装
置において、受光素子の受光面の非受光領域に発光素子
が搭載されものである。そして、受光素子の各受光領域
は、発光素子の光軸を中心とした円周上に等間隔に配置
されており、光学系の光軸に対して各受光領域が光学的
対称性を有している。
According to the present invention, there is provided a light-emitting device, comprising: a light-emitting element; and a light-receiving element having a plurality of light-receiving areas and a non-light-receiving area on a light-receiving surface, and light from the light-emitting element is detected by an object. An optical coupling device that outputs a signal corresponding to the inclination of an object to be detected from each light receiving area when the light is reflected and incident on the light receiving element, wherein the light emitting element is mounted on a non-light receiving area of a light receiving surface of the light receiving element. . Each light receiving area of the light receiving element is arranged at equal intervals on a circumference centered on the optical axis of the light emitting element, and each light receiving area has optical symmetry with respect to the optical axis of the optical system. ing.

【0015】これにより、被検出物が傾いていないとき
には、発光素子から出射した光は、被検出物で反射して
受光素子の各受光領域に均等に入射し、各受光領域は受
光量に比例した均等な信号を出力する。一方、被検出物
が傾いたときには、被検出物の傾きに応じて各受光領域
における受光量が変化し、各受光領域における出力信号
に差が生じ、この出力信号を処理回路で演算処理するこ
とで被検出物のX軸周りの実際の傾き角とY軸周りの実
際の傾き角とを求め、これら傾き角から被検出物の傾き
方向および傾き量を検出することができる。
Thus, when the object is not tilted, the light emitted from the light emitting element is reflected by the object and uniformly incident on each light receiving area of the light receiving element, and each light receiving area is proportional to the amount of received light. Output a uniform signal. On the other hand, when the detected object is tilted, the amount of light received in each light receiving area changes according to the tilt of the detected object, and a difference occurs in an output signal in each light receiving area. The output signal is calculated by a processing circuit. Then, the actual tilt angle of the object to be detected around the X-axis and the actual tilt angle of the object to be detected around the Y-axis can be obtained, and the tilt direction and the amount of tilt of the object can be detected from these tilt angles.

【0016】また、発光素子を、光を一方向に集中して
出射する狭窄型としたり、発光素子を、側壁に遮光体を
設けた受光素子の凹みに配すると、発光素子から横方向
に出射した光が受光素子に直接入射してノイズ成分とし
て検出されるといった不具合を防止できる。
Further, when the light emitting element is of a constricted type in which light is concentrated and emitted in one direction, or when the light emitting element is arranged in a recess of a light receiving element provided with a light shielding body on a side wall, the light is emitted in a lateral direction from the light emitting element. It is possible to prevent such a problem that the incident light directly enters the light receiving element and is detected as a noise component.

【0017】さらに、受光素子の各受光領域の結線用電
極を発光素子から最も離間した位置に形成したり、受光
素子の受光面の非受光領域に発光素子の結線用電極がボ
ンディングワイヤを介して接続される配線パターンを形
成すると、各結線用電極に接続された各ボンディングワ
イヤが受光領域をまたぐことがなく、また各ボンディン
グワイヤの長さも短くすることができ、発光素子からの
光が各ボンディングワイヤで反射して受光領域に入射す
るのを極力防止することができる。
Further, the connection electrode of each light receiving area of the light receiving element is formed at a position most distant from the light emitting element, or the connection electrode of the light emitting element is connected to the non-light receiving area of the light receiving surface of the light receiving element via a bonding wire. When the wiring pattern to be connected is formed, each bonding wire connected to each connection electrode does not straddle the light receiving region, and the length of each bonding wire can be shortened. It can be prevented as much as possible from being reflected by the wire and entering the light receiving region.

【0018】[0018]

【発明の実施の形態】以下、本発明の実施形態を添付図
面に基づき詳細に説明する。図1は本発明の一実施形態
に係る傾き検出用光結合装置の横断面図、図2は同じく
その縦断面図、図3は発光チップおよび受光チップの平
面図、図4は受光チップの縦断面図である。
Embodiments of the present invention will be described below in detail with reference to the accompanying drawings. FIG. 1 is a cross-sectional view of a tilt detection optical coupling device according to an embodiment of the present invention, FIG. 2 is a longitudinal sectional view thereof, FIG. 3 is a plan view of a light emitting chip and a light receiving chip, and FIG. FIG.

【0019】これらの図を参照して、本実施形態の傾き
検出センサ(傾き検出用光結合装置)は、ゲーム機にお
ける操作部や小型パーソナルコンピュータにおけるステ
ィック等の被検出物Sに対して配置され、発光ダイオー
ドからなる発光素子(発光チップ)20と、受光面21
に4セグメントの受光領域21a〜21dと非受光領域
21zとを有する4分割フォトダイオードからなる受光
素子(受光チップ)22と、これらを覆うレンズキャッ
プ23とを備えている。
With reference to these drawings, the tilt detection sensor (tilt detecting optical coupling device) of the present embodiment is disposed on an operation unit in a game machine or an object S such as a stick in a small personal computer. , A light emitting element (light emitting chip) 20 composed of a light emitting diode, and a light receiving surface 21
A light receiving element (light receiving chip) 22 composed of a four-division photodiode having four segments of light receiving areas 21a to 21d and a non-light receiving area 21z, and a lens cap 23 covering these elements.

【0020】受光チップ22は、図1,2,4に示すよ
うに、搭載用リードフレーム30にAgペースト等の導
電性ペースト31にて接着されている。各受光領域21
a〜21dは、正方形かつ同面積に形成され、正方形の
受光面21の対角線上の四隅に配置されており、各受光
領域21a〜21dの結線用電極(パッド)32a〜3
2dが金線等のボンディングワイヤ33を介して結線用
リードフレーム34〜37に電気的に接続されている。
As shown in FIGS. 1, 2, and 4, the light receiving chip 22 is bonded to a mounting lead frame 30 with a conductive paste 31 such as an Ag paste. Each light receiving area 21
Reference numerals a to 21d are square and have the same area, are arranged at four diagonal corners of the square light receiving surface 21, and are provided with connection electrodes (pads) 32a to 32d for the respective light receiving regions 21a to 21d.
2d is electrically connected to connection lead frames 34 to 37 via bonding wires 33 such as gold wires.

【0021】そして、受光チップ22における受光領域
21a〜21d以外の非受光領域21zには、凸状のア
ルミニウム製のチップ搭載用配線パターン40と、長方
形状の配線パターンに形成されたアルミニウム製の中継
用パッド41とが設けられている。
In the non-light receiving area 21z of the light receiving chip 22 other than the light receiving areas 21a to 21d, a convex aluminum chip mounting wiring pattern 40 and an aluminum relay wiring formed in a rectangular wiring pattern are provided. Pads 41 are provided.

【0022】前記搭載用配線パターン40は、図3に示
すように、各受光領域21a〜21dから等距離の受光
面21の中央に配され発光チップ20が導電性ペースト
42にて接着される搭載部40aと、該搭載部40aに
連結され受光領域21a,21b間に配された配線部4
0bとからなる。また、前記中継用パッド41は、受光
領域21c,21d間に配され、発光チップ20の結線
用電極(パッド)20aがボンディングワイヤ43を介
して電気的に接続されている。
As shown in FIG. 3, the mounting wiring pattern 40 is disposed at the center of the light receiving surface 21 equidistant from each of the light receiving areas 21a to 21d, and the light emitting chip 20 is adhered by the conductive paste 42. Part 40a and wiring part 4 connected to the mounting part 40a and arranged between the light receiving regions 21a and 21b.
0b. The relay pad 41 is disposed between the light receiving regions 21 c and 21 d, and the connection electrode (pad) 20 a of the light emitting chip 20 is electrically connected via the bonding wire 43.

【0023】したがって、搭載用配線パターン40の搭
載部40a上の発光チップ20は、各受光領域21a〜
21dから等距離の受光面21の中央に位置する。換言
すると、各受光領域21a〜21dは、発光チップ20
の光軸を中心とした円周上に等間隔に配置されている。
Accordingly, the light emitting chip 20 on the mounting portion 40a of the mounting wiring pattern 40 is provided in each of the light receiving regions 21a to 21a.
It is located at the center of the light receiving surface 21 equidistant from 21d. In other words, each of the light receiving areas 21a to 21d is
Are arranged at equal intervals on a circumference centered on the optical axis.

【0024】なお、受光チップ22の受光面21が通常
のシリコン酸化膜のみからなっていると、導電性ペース
ト42の使用により短絡する恐れがあるため、図4に示
すように受光面21における受光領域21a〜21dお
よび配線パターン以外は、遮光性ポリイミド等による皮
膜44が施されて絶縁、遮光されている。これにより、
発光チップ20を導電性ペースト42にて接着する際の
短絡を防止することができ、しかも受光領域21a〜2
1d以外に当たった光がノイズ成分として検出されると
いった不具合も防止することができる。
If the light receiving surface 21 of the light receiving chip 22 is made of only a normal silicon oxide film, a short circuit may occur due to the use of the conductive paste 42. Therefore, as shown in FIG. Except for the regions 21a to 21d and the wiring pattern, a film 44 made of light-shielding polyimide or the like is applied to insulate and shield light. This allows
A short circuit when the light emitting chip 20 is adhered with the conductive paste 42 can be prevented, and the light receiving regions 21a to 2a can be prevented.
It is also possible to prevent such a problem that light hitting other than 1d is detected as a noise component.

【0025】そして、搭載用配線パターン40がボンデ
ィングワイヤ45を介して搭載用リードフレーム30に
電気的に接続され、中継用パッド41がボンディングワ
イヤ46を介して結線用リードフレーム47に電気的に
接続されている。なお、各リードフレーム30,34〜
37,47は、図2に示すように、その表面(チップ搭
載面やボンディングワイヤ33,45,46が接続され
る面)が露出した状態でポリフェニールサルファイト等
の熱可塑性樹脂からなる基板50に埋め込まれた状態と
なっている。
The mounting wiring pattern 40 is electrically connected to the mounting lead frame 30 via the bonding wire 45, and the relay pad 41 is electrically connected to the connection lead frame 47 via the bonding wire 46. Have been. Each of the lead frames 30, 34 to
As shown in FIG. 2, reference numerals 37 and 47 denote a substrate 50 made of a thermoplastic resin such as polyphenylsulfite in a state where its surface (the surface on which the chip is mounted and the surface to which the bonding wires 33, 45 and 46 are connected) is exposed. It is in a state embedded in.

【0026】前記レンズキャップ23は、円筒状の側壁
部51と、該側壁部51の一端を塞ぐ凸レンズ52とが
アクリルポリカーボネイト等の透光性樹脂により一体的
に形成されてなる。そして、凸レンズ52の光学中心と
発光チップ20の光軸とが一致するように、側壁部51
の開放した他端が基板50に接着剤等により接着されて
いる。
In the lens cap 23, a cylindrical side wall 51 and a convex lens 52 for closing one end of the side wall 51 are integrally formed of a translucent resin such as acrylic polycarbonate. Then, the side wall 51 is adjusted so that the optical center of the convex lens 52 and the optical axis of the light emitting chip 20 coincide with each other.
Open end is adhered to the substrate 50 by an adhesive or the like.

【0027】以上のような構成により、光学系の光軸に
対して受光チップ22の各受光領域21a〜21dが光
学的対称性を保ち、被検出物Sの傾きを検出する上で各
部材が理想的な配置となっている。しかしながら、発光
チップ20からの光がボンディングワイヤで反射して受
光領域21a〜21dに入射し、一部の受光領域21a
〜21dの受光量が他に比べて多くなったり、発光チッ
プ20からの光が直接受光チップ22の受光領域21a
〜21dに入射して、ノイズ成分として検出されるとい
った不具合が生じる。そこで、本実施形態の傾き検出用
光結合装置においては、これら不具合を解消するため
に、種々の対策が施されている。
With the above-described configuration, each of the light receiving areas 21a to 21d of the light receiving chip 22 maintains optical symmetry with respect to the optical axis of the optical system. It is an ideal arrangement. However, light from the light emitting chip 20 is reflected by the bonding wire and is incident on the light receiving regions 21a to 21d, and some of the light receiving regions 21a
21d, the light from the light emitting chip 20 is directly transmitted to the light receiving area 21a of the light receiving chip 22.
To 21d, and is detected as a noise component. Therefore, in the tilt detection optical coupling device of the present embodiment, various measures are taken to solve these problems.

【0028】まず、発光チップ20からの光がボンディ
ングワイヤで反射して受光領域21a〜21dに入射す
るのを防止する対策としては、受光チップ22の各受光
領域21a〜21dのパッド32a〜32dを発光チッ
プ20から最も離間した各受光領域21a〜21dの隅
部に形成している。これにより、各パッド32a〜32
dに接続された各ボンディングワイヤ33が受光領域2
1a〜21dをまたぐことがなく、例えばパッド32a
〜32dが受光領域21a〜21dの中央付近に形成さ
れているときと比べて、発光チップ20からの光が各ボ
ンディングワイヤ33で反射して各受光領域21a〜2
1dに入射する割合を小さくすることができる。
First, as a measure to prevent the light from the light emitting chip 20 from being reflected by the bonding wires and entering the light receiving areas 21a to 21d, the pads 32a to 32d of the light receiving areas 21a to 21d of the light receiving chip 22 are used. It is formed at the corner of each of the light receiving areas 21a to 21d furthest from the light emitting chip 20. Thereby, each of the pads 32a-32
d is connected to the light receiving region 2
1a to 21d, for example, the pad 32a
The light from the light emitting chip 20 is reflected by each bonding wire 33 and the light receiving regions 21a to 2d are compared with the case where the light receiving regions 21a to 21d are formed near the center of the light receiving regions 21a to 21d.
The ratio of incidence on 1d can be reduced.

【0029】また別の対策としては、受光チップ22に
おける非受光領域21zに中継用パッド41を形成し、
発光チップ20のパッド20aと中継用パッド41とを
ボンディングワイヤ43を介して接続し、さらに中継用
パッド41と結線用リードフレーム47とをボンディン
グワイヤ46を介して接続している。これにより、ボン
ディングワイヤ43,46が受光領域21a〜21dを
またぐことがなく、ボンディングワイヤ43,46の長
さも短くすることができ、発光チップ20のパッド20
aと結線用リードフレーム47とをボンディングワイヤ
を介して接続するときと比べて、発光チップ20からの
光が各ボンディングワイヤ43,46で反射して各受光
領域21a〜21dに入射する割合を小さくすることが
できる。しかも、安定したアセンブリ性を実現できる。
As another countermeasure, a relay pad 41 is formed in the non-light receiving area 21z of the light receiving chip 22,
The pad 20a of the light emitting chip 20 and the relay pad 41 are connected via a bonding wire 43, and the relay pad 41 and the connection lead frame 47 are connected via a bonding wire 46. As a result, the bonding wires 43 and 46 do not straddle the light receiving regions 21a to 21d, and the lengths of the bonding wires 43 and 46 can be reduced.
The ratio of the light from the light emitting chip 20 reflected by the bonding wires 43 and 46 and incident on the light receiving regions 21a to 21d is smaller than that in the case where the connection lead frame 47 is connected to the connection lead frame 47 via the bonding wire. can do. In addition, stable assembly properties can be realized.

【0030】次に、発光チップ20からの光が直接受光
チップ22の受光領域21a〜21dに入射するのを防
止する対策としては、発光チップ20としてエピタキシ
ャル成長により形成した通常の発光チップ20Aを使用
せずに、電流狭窄型の発光チップを使用している。これ
は、通常の発光チップ20Aと電流狭窄型の発光チップ
20とでは出射する光の強度分布が全く異なり、通常の
発光チップ20Aでは、図5(a)に示すように、横方
向に出射する光の量がかなり多く、受光領域21a〜2
1dに直接光が入射する可能性が高いのに対して、電流
狭窄型の発光チップ20では、図5(b)に示すよう
に、光を前方の一方向に集中して出射し、受光領域21
a〜21dに直接光が入射する可能性が低いからであ
る。
Next, as a measure for preventing light from the light emitting chip 20 from directly entering the light receiving regions 21a to 21d of the light receiving chip 22, a normal light emitting chip 20A formed by epitaxial growth is used as the light emitting chip 20. Instead, a current confinement type light emitting chip is used. This is because the intensity distribution of the emitted light is completely different between the normal light emitting chip 20A and the current confinement type light emitting chip 20, and the normal light emitting chip 20A emits in the lateral direction as shown in FIG. The amount of light is considerably large, and the light receiving regions 21a-2
While light is likely to be directly incident on 1d, the current confinement type light emitting chip 20 emits light concentrated in one direction in front as shown in FIG. 21
This is because it is unlikely that light is directly incident on a to 21d.

【0031】また、通常の発光チップ20Aを使用する
場合には、図6に示すように、受光チップ22の受光面
21において、通常の発光チップ20Aが搭載される受
光面21の中央にエッチング処理等で凹み60を形成し
ておき、さらに凹み60の壁面に遮光体61を設ける。
この遮光体61は、凹み60の壁面に発光チップ20A
からの光を遮光するとともに光の反射率の高い材料を薄
膜状にコーティングしてなる。そして、チップ搭載用配
線パターン40および中継用パッド41を形成して、発
光チップ20Aを凹み60に搭載する。これにより、発
光チップ20Aから横方向に出射した光が、受光チップ
22の内部を通過して受光領域21a〜21dに到達す
ることなく前方に反射され、電流狭窄型の発光チップ2
0を使用したときと同様の効果を得ることができる。
When a normal light emitting chip 20A is used, as shown in FIG. 6, an etching process is performed on the light receiving surface 21 of the light receiving chip 22 at the center of the light receiving surface 21 on which the normal light emitting chip 20A is mounted. The recess 60 is formed in advance, and a light shielding body 61 is provided on the wall surface of the recess 60.
The light-shielding body 61 has a light-emitting chip 20A
It is made by coating a material having a high light reflectance while shielding light from the light source into a thin film. Then, a chip mounting wiring pattern 40 and a relay pad 41 are formed, and the light emitting chip 20A is mounted in the recess 60. As a result, the light emitted laterally from the light emitting chip 20A is reflected forward without passing through the inside of the light receiving chip 22 and reaching the light receiving areas 21a to 21d.
The same effect as when 0 is used can be obtained.

【0032】さらに、図7に示すように、発光チップ2
0Aを遮光壁70で囲んでもよい。遮光壁70は、発光
チップ20Aから横方向に出射した光を遮光するととも
に上方に反射するよう構成されている。これによって
も、電流狭窄型の発光チップ20を使用したときと同様
の効果を得ることができる。
Further, as shown in FIG.
0A may be surrounded by a light shielding wall 70. The light shielding wall 70 is configured to shield light emitted from the light emitting chip 20A in the lateral direction and to reflect the light upward. With this, the same effect as when the current confinement type light emitting chip 20 is used can be obtained.

【0033】上記構成において、ゲーム機における操作
部や小型パーソナルコンピュータにおけるスティック等
の被検出物Sが傾いていないときには、発光チップ20
から出射した光は、レンズキャップ23の凸レンズ52
で集光され、被検出物Sで反射して再び凸レンズ52で
集光され、受光チップ22の各受光領域21a〜21d
に均等に入射し、各受光領域21a〜21dから受光量
に比例した均等な電流が流れる。
In the above configuration, when the object S such as the operation unit in the game machine or the stick in the small personal computer is not tilted, the light emitting chip 20 is used.
Is emitted from the convex lens 52 of the lens cap 23.
And is reflected by the object S to be collected again by the convex lens 52. Each of the light receiving areas 21a to 21d of the light receiving chip 22
And a uniform current proportional to the amount of received light flows from each of the light receiving areas 21a to 21d.

【0034】一方、被検出物Sが傾いたときには、被検
出物Sの傾きに応じて受光チップ22における受光量が
変化し、各受光領域21a〜21dから受光量に比例し
た電流が流れ、この各電流値をゲーム機や小型パーソナ
ルコンピュータに設けられた処理回路で演算処理するこ
とにより、被検出物Sの傾き方向および傾き量を検出す
ることができるようになっている。
On the other hand, when the object S is tilted, the amount of light received by the light receiving chip 22 changes according to the inclination of the object S, and a current proportional to the amount of light flows from each of the light receiving areas 21a to 21d. Each current value is arithmetically processed by a processing circuit provided in a game machine or a small personal computer, so that the direction and amount of inclination of the detection target S can be detected.

【0035】演算処理の方法としては、受光領域21a
における電流値をIA、受光領域21bにおける電流値
をIB、受光領域21cにおける電流値をIC、受光領
域21dにおける電流値IDとすると、被検出物SのX
軸(図8参照)周りの傾き信号SXを、 SX=(IA+IC)−(IB+ID) 同様にY軸(図8参照)の周りの傾き信号SYを、 SY=(IA+IB)−(IC+ID) として求める。このときの傾き信号SXから求められる
演算結果とX軸周りの実際の傾き角との関係は、図9
(a)に示すように、ある角度範囲までは一次関数的に
変化する特性となり、傾き信号SYから求められる演算
結果とY軸周りの実際の傾き角との関係は、図9(b)
に示すように、X軸のときと同様にある角度範囲までは
一次関数的に変化する特性となり、これら2方向の特性
はほぼ同等となる。そして、演算結果から得られる2方
向の実際の傾き角から被検出物Sの傾き方向および傾き
量を求めるようになっている。
As a method of the arithmetic processing, the light receiving area 21a
, The current value in the light receiving area 21b is IB, the current value in the light receiving area 21c is IC, and the current value ID in the light receiving area 21d is X.
SX = (IA + IC)-(IB + ID) Similarly, a tilt signal SY around the Y axis (see FIG. 8) is obtained as SY = (IA + IB)-(IC + ID). . The relationship between the calculation result obtained from the tilt signal SX at this time and the actual tilt angle around the X axis is shown in FIG.
As shown in FIG. 9A, the characteristic changes linearly up to a certain angle range, and the relationship between the calculation result obtained from the inclination signal SY and the actual inclination angle around the Y axis is shown in FIG.
As shown in FIG. 7, as in the case of the X-axis, the characteristic changes linearly up to a certain angle range, and the characteristics in these two directions are almost equal. Then, the inclination direction and the amount of inclination of the detection target S are obtained from the actual two inclination angles obtained from the calculation results.

【0036】このように、本実施形態の傾き検出光結合
装置においては、受光領域21a〜21dを有する受光
チップ22に発光チップ20が搭載されているので、従
来のように発光チップと受光チップの各受光領域とが別
体で離れているときと比べて、安定して高精度な傾き検
出が可能となる。また、従来のように発光チップの周り
に複数の受光チップを個別に配置するときと比べて、簡
単な作業で発光チップ20および受光チップ22の各受
光領域21a〜21dを夫々精度良く位置決めすること
ができる。したがって、製造工程の簡略化およびコスト
ダウンを図り得、信頼性の高い傾き検出用光結合装置を
提供することができる。
As described above, in the tilt detecting optical coupling device of the present embodiment, the light emitting chip 20 is mounted on the light receiving chip 22 having the light receiving areas 21a to 21d, so that the light emitting chip and the light receiving chip Compared to the case where each light receiving region is separated from each other, stable and highly accurate tilt detection can be performed. In addition, as compared with the case where a plurality of light receiving chips are individually arranged around the light emitting chip as in the related art, the light receiving areas 21a to 21d of the light emitting chip 20 and the light receiving chip 22 can be accurately positioned with a simple operation. Can be. Therefore, the manufacturing process can be simplified and the cost can be reduced, and a highly reliable tilt detecting optical coupling device can be provided.

【0037】また、受光チップ22の各受光領域21a
〜21dは、発光チップ20の光軸を中心とした円周上
に等間隔に配置され、しかもレンズキャップ23の凸レ
ンズ52の光学中心と発光チップ20の光軸とが一致し
ているので、光学系の光軸に対して受光チップ22の各
受光領域21a〜21dが光学的対称性を有し、被検出
物SのX軸周りの傾きに対しての特性とY軸周りの傾き
に対しての特性とが同等となり、より安定して高精度な
傾き検出が可能となる。
Each light receiving area 21a of the light receiving chip 22
21 d are arranged at equal intervals on the circumference around the optical axis of the light emitting chip 20, and the optical axis of the convex lens 52 of the lens cap 23 coincides with the optical axis of the light emitting chip 20. Each light receiving area 21a to 21d of the light receiving chip 22 has optical symmetry with respect to the optical axis of the system, and has a characteristic with respect to the inclination of the detection object S around the X axis and a characteristic with respect to the inclination around the Y axis. Are equivalent to each other, and more stable and accurate tilt detection is possible.

【0038】なお、本発明は、上記実施形態に限定され
るものではなく、本発明の範囲内で上記実施形態に多く
の修正および変更を加え得ることは勿論である。例え
ば、受光チップは、4分割フォトダイオードに限らず、
被検出物の傾きを検出できるように複数の受光領域を有
するものであればよい。また、受光チップの各受光領域
の形状や配置は上記実施形態に限定されるものではな
く、例えば各受光領域を円形として発光チップ20を囲
むように十字状に配置してもよい。
It should be noted that the present invention is not limited to the above-described embodiment, and it goes without saying that many modifications and changes can be made to the above-described embodiment within the scope of the present invention. For example, the light receiving chip is not limited to a four-division photodiode,
What is necessary is just to have a some light-receiving area so that the inclination of a to-be-detected object can be detected. In addition, the shape and arrangement of each light receiving region of the light receiving chip are not limited to the above-described embodiment. For example, each light receiving region may be circular and arranged in a cross shape so as to surround the light emitting chip 20.

【0039】[0039]

【発明の効果】以上の説明から明らかな通り、本発明に
よると、受光領域を有する受光素子に発光素子が搭載さ
れているので、従来のように発光チップと受光チップの
各受光領域とが別体で離れているときと比べて、安定し
て高精度な傾き検出が可能となる。また、従来のように
発光チップの周りに複数の受光チップを個別に配置する
ときと比べて、簡単な作業で発光素子および受光素子の
各受光領域を夫々精度良く位置決めすることができ、製
造工程の簡略化およびコストダウンを図り得、信頼性の
高い傾き検出用光結合装置を提供することができる。
As is apparent from the above description, according to the present invention, since the light-emitting element is mounted on the light-receiving element having the light-receiving area, the light-emitting chip and each light-receiving area of the light-receiving chip are separated from each other as in the prior art. Compared with a case where the user is away from the body, stable and accurate tilt detection can be performed. In addition, the light-emitting element and each light-receiving region of the light-receiving element can be accurately positioned by a simple operation, compared with a case where a plurality of light-receiving chips are individually arranged around the light-emitting chip as in the related art. Can be simplified and the cost can be reduced, and an optical coupling device for tilt detection with high reliability can be provided.

【0040】また、受光素子の各受光領域を、発光素子
の光軸を中心とした円周上に等間隔に配置すると、光学
系の光軸に対して受光素子の各受光領域が光学的対称性
を有し、被検出物のX軸周りの傾きに対しての特性とY
軸周りの傾きに対しての特性とが同等となり、より安定
して高精度な傾き検出が可能となる。
When the light receiving areas of the light receiving element are arranged at equal intervals on a circumference centered on the optical axis of the light emitting element, each light receiving area of the light receiving element is optically symmetric with respect to the optical axis of the optical system. Characteristic of the object with respect to the tilt around the X axis and Y
The characteristics with respect to the inclination around the axis are equivalent, and more stable and accurate inclination detection is possible.

【0041】さらに、発光素子を、光を一方向に集中し
て出射する狭窄型としたり、また発光素子を、側壁に遮
光体が設けられた受光素子の凹みに配すると、発光素子
から横方向に出射した光が受光素子の各受光領域に直接
入射してノイズ成分として検出されるといった不具合を
防止でき、より安定して高精度な傾き検出が可能とな
る。
Further, when the light emitting element is of a constricted type in which light is concentrated and emitted in one direction, or when the light emitting element is arranged in a recess of a light receiving element provided with a light shielding body on a side wall, the light emitting element can be moved in a lateral direction from the light emitting element. Can be prevented from being directly incident on each light receiving region of the light receiving element and detected as a noise component, and more stable and accurate tilt detection can be performed.

【0042】また、受光素子の各受光領域の結線用電極
を発光素子から最も離間した位置に形成したり、受光素
子の受光面の非受光領域に発光素子の結線用電極がボン
ディングワイヤを介して接続される配線パターンを形成
すると、各結線用電極に接続された各ボンディングワイ
ヤが受光領域をまたぐことがなく、また各ボンディング
ワイヤの長さも短くすることができ、発光素子からの光
が各ボンディングワイヤで反射して受光領域に入射する
のを極力防止することができ、より安定して高精度な傾
き検出が可能となる。
Further, the connection electrode of each light receiving area of the light receiving element is formed at a position farthest from the light emitting element, or the connection electrode of the light emitting element is connected to the non-light receiving area of the light receiving surface of the light receiving element via a bonding wire. When the wiring pattern to be connected is formed, each bonding wire connected to each connection electrode does not straddle the light receiving region, and the length of each bonding wire can be shortened. Reflection by the wire and incidence on the light receiving region can be prevented as much as possible, and more stable and accurate tilt detection can be performed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態に係る傾き検出用光結合装
置の横断面図
FIG. 1 is a cross-sectional view of a tilt detection optical coupling device according to an embodiment of the present invention.

【図2】同じくその縦断面図FIG. 2 is a longitudinal sectional view of the same.

【図3】発光チップおよび受光チップの平面図FIG. 3 is a plan view of a light emitting chip and a light receiving chip.

【図4】受光チップの縦断面図FIG. 4 is a longitudinal sectional view of a light receiving chip.

【図5】(a)は通常の発光チップにおける出射光の強
度分布を示す図、(b)は電流狭窄型の発光チップにお
ける出射光の強度分布を示す図
5A is a diagram illustrating an intensity distribution of emitted light in a normal light emitting chip, and FIG. 5B is a diagram illustrating an intensity distribution of emitted light in a current confinement type light emitting chip;

【図6】他の実施形態に係る傾き検出用光結合装置の受
光チップの縦断面図
FIG. 6 is a longitudinal sectional view of a light receiving chip of an optical coupling device for tilt detection according to another embodiment.

【図7】別の実施形態に係る傾き検出用光結合装置の受
光チップの縦断面図
FIG. 7 is a longitudinal sectional view of a light receiving chip of an optical coupler for tilt detection according to another embodiment.

【図8】被検出物の傾きの中心を示す図FIG. 8 is a diagram showing a center of inclination of an object to be detected;

【図9】(a)はX軸周りの傾き信号と実際の傾き角と
の関係を示す図、(b)はY軸周りの傾き信号と実際の
傾き角との関係を示す図
9A is a diagram illustrating a relationship between a tilt signal around an X axis and an actual tilt angle, and FIG. 9B is a diagram illustrating a relationship between a tilt signal around a Y axis and an actual tilt angle.

【図10】従来の傾き検出用光結合装置の横断面図FIG. 10 is a cross-sectional view of a conventional tilt detection optical coupling device.

【図11】同じくその縦断面図FIG. 11 is a longitudinal sectional view of the same.

【図12】被検出物の傾きの中心を示す図FIG. 12 is a diagram showing a center of inclination of an object to be detected;

【図13】(a)はX軸周りの傾き信号と実際の傾き角
との関係を示す図、(b)はY軸周りの傾き信号と実際
の傾き角との関係を示す図
13A is a diagram illustrating a relationship between a tilt signal around an X axis and an actual tilt angle, and FIG. 13B is a diagram illustrating a relationship between a tilt signal around a Y axis and an actual tilt angle.

【図14】他の従来の傾き検出用光結合装置における発
光チップおよび受光チップの平面図
FIG. 14 is a plan view of a light emitting chip and a light receiving chip in another conventional optical coupling device for detecting inclination.

【符号の説明】[Explanation of symbols]

20 発光素子 20a 発光素子の結線用電極 21 受光面 21a〜21d 受光領域 21z 非受光領域 22 受光素子 32a〜32d 各受光領域の結線用電極 41 中継用パッド 43 ボンディングワイヤ 60 凹み 61 遮光体 S 被検出物 REFERENCE SIGNS LIST 20 light emitting element 20 a light emitting element connection electrode 21 light receiving surface 21 a to 21 d light receiving area 21 z non-light receiving area 22 light receiving element 32 a to 32 d connection electrode 41 for each light receiving area 41 relay pad 43 bonding wire 60 dent 61 light shielding body S detected Stuff

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 発光素子と、受光面に複数の受光領域と
非受光領域とを有する受光素子とを備え、前記発光素子
からの光が被検出物で反射されて前記受光素子に入射し
たときに各受光領域から前記被検出物の傾きに応じた信
号を出力する光結合装置において、前記受光素子の受光
面の非受光領域に前記発光素子が搭載されたことを特徴
とする傾き検出用光結合装置。
1. A light-emitting element, comprising: a light-receiving element having a plurality of light-receiving regions and a non-light-receiving region on a light-receiving surface; when light from the light-emitting element is reflected by an object and enters the light-receiving element Wherein the light emitting element is mounted in a non-light receiving area on a light receiving surface of the light receiving element, wherein the light emitting element is mounted on a non-light receiving area of the light receiving surface of the light receiving element. Coupling device.
【請求項2】 前記受光素子の各受光領域は、前記発光
素子の光軸を中心とした円周上に等間隔に配置されたこ
とを特徴とする請求項1記載の傾き検出用光結合装置。
2. The optical coupling device for tilt detection according to claim 1, wherein the respective light receiving areas of the light receiving element are arranged at equal intervals on a circumference centered on an optical axis of the light emitting element. .
【請求項3】 前記発光素子は、光を一方向に集中して
出射する狭窄型とされたことを特徴とする請求項1また
は2記載の傾き検出用光結合装置。
3. The tilt detecting optical coupling device according to claim 1, wherein the light emitting element is of a constriction type that emits light in one direction by concentrating the light in one direction.
【請求項4】 前記発光素子は、前記受光素子の受光面
の非受光領域に形成された凹みに配され、該凹みの側壁
に前記発光素子からの光を遮光する遮光体が設けられた
ことを特徴とする請求項1または2記載の傾き検出用光
結合装置。
4. The light-emitting element is disposed in a recess formed in a non-light-receiving region of a light-receiving surface of the light-receiving element, and a light-shielding body that shields light from the light-emitting element is provided on a side wall of the recess. The optical coupling device for tilt detection according to claim 1 or 2, wherein:
【請求項5】 前記受光素子の各受光領域の結線用電極
が前記発光素子から最も離間した位置に形成されたこと
を特徴とする請求項1ないし4のいずれかに記載の傾き
検出用光結合装置。
5. The optical coupling for tilt detection according to claim 1, wherein a connection electrode of each light receiving region of the light receiving element is formed at a position farthest from the light emitting element. apparatus.
【請求項6】 前記受光素子の受光面の非受光領域に配
線パターンが形成され、前記発光素子の結線用電極がボ
ンディングワイヤを介して配線パターンに接続されたこ
とを特徴とする請求項1ないし5のいずれかに記載の傾
き検出用光結合装置。
6. A wiring pattern is formed in a non-light receiving area on a light receiving surface of the light receiving element, and a connection electrode of the light emitting element is connected to the wiring pattern via a bonding wire. 5. The optical coupling device for tilt detection according to any one of 5.
JP23493496A 1996-09-05 1996-09-05 Optical coupling device for tilt detection Expired - Fee Related JP3228683B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23493496A JP3228683B2 (en) 1996-09-05 1996-09-05 Optical coupling device for tilt detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23493496A JP3228683B2 (en) 1996-09-05 1996-09-05 Optical coupling device for tilt detection

Publications (2)

Publication Number Publication Date
JPH1082626A true JPH1082626A (en) 1998-03-31
JP3228683B2 JP3228683B2 (en) 2001-11-12

Family

ID=16978571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23493496A Expired - Fee Related JP3228683B2 (en) 1996-09-05 1996-09-05 Optical coupling device for tilt detection

Country Status (1)

Country Link
JP (1) JP3228683B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008117800A1 (en) * 2007-03-26 2008-10-02 Rintaro Nishina Reflective optical sensor
US8826129B2 (en) 2009-01-21 2014-09-02 International Business Machines Corporation Multi-touch device having a bot with local and remote capabilities

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008117800A1 (en) * 2007-03-26 2008-10-02 Rintaro Nishina Reflective optical sensor
JPWO2008117800A1 (en) * 2007-03-26 2010-07-15 仁科 ▲りん▼太郎 Reflective light sensor
US8826129B2 (en) 2009-01-21 2014-09-02 International Business Machines Corporation Multi-touch device having a bot with local and remote capabilities

Also Published As

Publication number Publication date
JP3228683B2 (en) 2001-11-12

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