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JPH0397688A - Distribution cylinder for single crystal pulling up device - Google Patents

Distribution cylinder for single crystal pulling up device

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Publication number
JPH0397688A
JPH0397688A JP23353089A JP23353089A JPH0397688A JP H0397688 A JPH0397688 A JP H0397688A JP 23353089 A JP23353089 A JP 23353089A JP 23353089 A JP23353089 A JP 23353089A JP H0397688 A JPH0397688 A JP H0397688A
Authority
JP
Japan
Prior art keywords
cylinder
single crystal
window
graphite
window hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23353089A
Other languages
Japanese (ja)
Other versions
JPH0688864B2 (en
Inventor
Tetsuhiro Oda
小田 哲宏
Atsushi Iwasaki
淳 岩崎
Hiroshi Uchikawa
啓 内川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Priority to JP23353089A priority Critical patent/JPH0688864B2/en
Publication of JPH0397688A publication Critical patent/JPH0397688A/en
Publication of JPH0688864B2 publication Critical patent/JPH0688864B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To prevent the decrease in the oxygen concn. in a single crystal and the deposition of SiO on a pulling up shaft, etc., without increasing the flow rate of an inert gas by providing a quartz window plate covering the window holes formed in the lower end part of the gas distribution cylinder made of graphite. CONSTITUTION:A sub-chamber 14 and the top end aperture of a long cylinder 40 made of graphite are connected to the top end aperture 12 part of a main chamber 10 internally provided with a crucible 22. The cylinder 40 concentrically encloses the single crystal 36 to be pulled up perpendicularly upward and has the window hole 40a for observation on the lower side surface. A cylinder 42 made of graphite, the outside diameter of which is approximately equal to the inside diameter of the cylinder 40 is also provided with the window hole 42a of the same shape as the shape of the window hole 40a on the side surface. The edge part of the quartz window plate 44 is fitted to a groove frame 42b in the edge part thereof. The cylinder 42 is fitted into the cylinder 40 in this state. The cylinder 42 is detained to the cylinder 40 by aligning the window holes 42a, 40a. Gaseous Ar is supplied form an inlet joint 14a and while the single crystal 36 is observed through the window plate 44 from the peep hole 10b, the single crystal is grown.

Description

【発明の詳細な説明】 「産業上の利用分野] 本発明はCZ法による単結晶引上装置に用いられ、垂直
上方に引き上げられる単結晶を同心に包囲し、内部に不
活性ガスが流下される単結晶引上装置用整流筒に関する
[Detailed Description of the Invention] "Industrial Application Field" The present invention is used in a single crystal pulling device using the CZ method, which concentrically surrounds a single crystal that is being pulled vertically upward, and an inert gas is flowed down inside. The present invention relates to a rectifier tube for a single crystal pulling device.

[従来の技術1 Ci Z法により、石英坩堝内の81融液かSSi単結
晶を引き上げる際、石英坩堝とSi融液との反応により
、揮発性SiOが生戒され、坩堝端縁、S i qi結
晶、引=L軸及びチャンバ内壁に析出する。
[Conventional technology 1] When pulling an SSi single crystal from the 81 melt in a quartz crucible using the Ci Z method, volatile SiO is released by the reaction between the quartz crucible and the Si melt, and the edge of the crucible, Si The qi crystal is deposited on the L axis and the inner wall of the chamber.

回Φ1′.シながら上昇する引上軸に析出したS10は
、上方蓋邪の気密用シールリングにより掻き落とされ、
F方の融液に落込み、育成中の単結晶に欠陥が生ずる。
Times Φ1′. The S10 deposited on the lifting shaft that moves upward is scraped off by the airtight seal ring on the upper lid.
It falls into the melt on the F side and causes defects in the single crystal being grown.

そこで、引上軸と同軸に、チャンバ内に整流筒を融液面
上150〜350mmまで垂下させ、1−,方から整流
筒内に八rガスを流下させ、融液面から蒸発したSiO
をArガスとともにチャンバT’部から排出させる方法
が提案されている(特公昭5 ,3 − 6 5 1 
1号公報)。
Therefore, a rectifying cylinder is suspended in the chamber coaxially with the pulling axis to a height of 150 to 350 mm above the melt surface, and 8r gas is allowed to flow down into the rectifying cylinder from the direction 1-, and the SiO evaporated from the melt surface is
A method has been proposed in which Ar gas is discharged from the T' part of the chamber together with Ar gas (Japanese Patent Publication No. 5, 3-65-1).
Publication No. 1).

他方、この整流筒の下端を外上方に折り返した形状のカ
ラーを付設することにより、固液界面付近の巾結晶の」
二下方向温度勾配を大きくして、結晶戊長速度を大きく
するとともに、単結晶中の酸素濃度を低くして酸化誘起
欠陥(OrSF)及びスワール欠陥を低減させ、しかも
上記SiO排出効果を高める方法が提案されている(特
開昭6465086号公報)。
On the other hand, by attaching a collar shaped like the lower end of this rectifying cylinder folded outward and upward, it is possible to reduce the width of crystals near the solid-liquid interface.
2. A method of increasing the downward temperature gradient to increase the crystal explantation rate, lowering the oxygen concentration in the single crystal to reduce oxidation-induced defects (OrSF) and swirl defects, and increasing the SiO evacuation effect described above. has been proposed (Japanese Unexamined Patent Publication No. 6465086).

このような整流筒は,、耐熱性、加工容易性及びコスト
の観点から、黒鉛で形成するのが好ましいが、引き上げ
直後のSi単結晶の形状を観察したり、固液界面の直径
を光学的に計測することができず、直径の自動制御や良
好なS1単結晶育戊の妨げになる。そこで、整流筒の下
端部に窓穴を形威ずることが上記公報において提案され
ている。
It is preferable to form such a rectifying cylinder with graphite from the viewpoints of heat resistance, ease of processing, and cost. Therefore, automatic diameter control and good S1 single crystal growth are hindered. Therefore, the above-mentioned publication proposes forming a window hole in the lower end of the rectifier tube.

[発明が解決しようとする課題] ところが、窓穴を形戊すると、整流筒の下端開口から流
出するArガスの流量が少なくなり、上記効果が低減す
ることになる。例えば、融液表面からの酸素蒸発量が少
なくなって、S i rQ結晶の酸素濃度が大きくなる
。具体的には、酸素濃度を1 8 ppma以下にする
ことが困難となり、高集積化を推進しているデバイスメ
ーカの最近の要求に応えることができない。このような
問題点は、Arガスの流量を大きくすることにより解決
される。
[Problems to be Solved by the Invention] However, when the window hole is formed, the flow rate of the Ar gas flowing out from the lower end opening of the rectifier tube decreases, and the above-mentioned effect is reduced. For example, the amount of oxygen evaporated from the melt surface decreases, and the oxygen concentration of the S i rQ crystal increases. Specifically, it becomes difficult to reduce the oxygen concentration to 1 8 ppma or less, making it impossible to meet the recent demands of device manufacturers who are promoting higher integration. Such problems can be solved by increasing the flow rate of Ar gas.

しかし、実際に行なってみると、後述の実験例に示すよ
うに、この量は大量、例えば2 0 O R /+ni
nにもなりコスト高となることがわかった。チャンバ(
炉)内の圧力を下げて酸素蒸発量を増やすこともできる
が、石英坩堝とSi融液との反応が大きくなって石英坩
堝の寿命が短くなり、コスト高となる。
However, in actual practice, as shown in the experimental example below, this amount is large, for example 20 O R /+ni
It has been found that the cost is high due to the number of times n. Chamber (
Although it is possible to increase the amount of oxygen evaporation by lowering the pressure inside the furnace, the reaction between the quartz crucible and the Si melt increases, which shortens the life of the quartz crucible and increases costs.

本発明の目的は、このような問題点に鑑み、不活性ガス
の流量を大きくすることなくかつ上記各効果を低減させ
ずに、単結晶の形状を観察することができ、しかも、製
作容易で大幅なコスト高と?;らない単結晶引上装置用
整流筒を提供することにある。
In view of these problems, it is an object of the present invention to provide a method that allows the shape of a single crystal to be observed without increasing the flow rate of inert gas and without reducing the above-mentioned effects, and which is easy to manufacture. Significantly higher costs? ;An object of the present invention is to provide a rectifier tube for a single crystal pulling device that does not require a single crystal puller.

1課題を解決するための手段] この目的を達戊するために、本発明に係る単結晶引上装
置用整流筒では、坩堝が内設されたメインチャンバの上
端開口部に上端開口部が接続され屯直上方に引き上げら
れる単結晶を同心に包囲しF部側而に窓孔が形威された
第1の黒鉛製円筒と、該窓孔を覆う石英製窓板とを備え
ている。
[Means for Solving Problem 1] In order to achieve this object, in the rectifier tube for a single crystal pulling device according to the present invention, the upper end opening is connected to the upper end opening of the main chamber in which the crucible is installed. It is equipped with a first graphite cylinder that concentrically surrounds the single crystal that is being pulled directly above the turret and has a window hole formed on the side of the F section, and a quartz window plate that covers the window hole.

具体的な窓板取付構造は、例えば、内径が前記円筒の外
径に略等しく前記窓孔に対応した窓孔が形成された第2
の黒鉛製円筒を、該両窓孔を一致させて前記第1の円筒
に嵌入係止し、該第1の円筒と該第2の円筒の接合面の
該窓孔縁邪に溝を形1+見し、該溝に前記窓板の縁部が
嵌入した構造となっている。
A specific window plate mounting structure includes, for example, a second window plate in which a window hole corresponding to the window hole is formed, the inner diameter of which is approximately equal to the outer diameter of the cylinder.
A graphite cylinder is fitted and locked into the first cylinder with both window holes aligned, and a groove is formed in the shape of 1+ at the edge of the window hole on the joint surface of the first cylinder and the second cylinder. The structure is such that the edge of the window plate fits into the groove.

他の具体的な窓板取付構造では、前記窓板を、外径が前
記第1の円筒の内径に略等しい円筒で構戊し、これを前
記第Iの円筒に嵌入係止した構造となっている。
In another specific window plate mounting structure, the window plate is constituted by a cylinder whose outer diameter is approximately equal to the inner diameter of the first cylinder, and this is fitted and locked into the first cylinder. ing.

なお、整流筒下端に、外側上方へ突出した黒鉛製カラー
を取り付けてもよい。
Note that a graphite collar that protrudes outward and upward may be attached to the lower end of the rectifier tube.

また、必要性は少ないが、整流筒やこのカラーの表面を
SiCでコーティングして劣化をより小さくするように
してもよい。
Further, although it is not necessary, the surfaces of the rectifier tube and this collar may be coated with SiC to further reduce deterioration.

「作用〕 撃流筒に窓孔を形成しているので、引き上げ直後σ)S
i?l1結晶の形状を観察することができ、直径の光学
的計測が可能となり、また、良好なS1単結晶を育戊す
ることが可能となる。
``Effect'' Since a window hole is formed in the shotgun, immediately after lifting σ)S
i? The shape of the L1 crystal can be observed, the diameter can be optically measured, and a good S1 single crystal can be grown.

この窓孔は窓板で覆われているので、整流筒内を流下す
る不活性ガスは全て整流筒の下端と融液面との間を通り
、不活性ガスの流量を特に大きくしなくても、単結晶内
の酸素濃度を低減でき、弓1二軸等へのSi○析出を防
止でき、かつ、単結晶或長速度を大きくすることができ
る。
Since this window hole is covered with a window plate, all the inert gas flowing down inside the straightening cylinder passes between the bottom end of the straightening cylinder and the melt surface, so there is no need to increase the flow rate of the inert gas. , the oxygen concentration within the single crystal can be reduced, SiO precipitation on the bow 1 biaxes etc. can be prevented, and the single crystal length velocity can be increased.

また、整流筒の材料としては、耐熱性があり不純物を放
出しないものが要求され、セラミック等も考えられるが
、本体の円筒を成形容易で安価な黒鉛で形威し、窓孔部
分のみ、すなわち必要部分のみを石英で覆っているので
、整流筒全体としては、製作容易であり、かつ、大幅な
コスト高とならない。
In addition, the material for the rectifier tube must be heat resistant and do not emit impurities, and ceramics may be considered, but the cylinder of the main body is made of graphite, which is easy to form and inexpensive, and only the window hole part, i.e. Since only the necessary parts are covered with quartz, the entire rectifier tube is easy to manufacture and does not require a significant increase in cost.

[実施例1 以下、図面に基づいて本発明の実施例を説明する。[Example 1 Embodiments of the present invention will be described below based on the drawings.

(1)第I実施例 第1図は単結晶引上装置用整流筒の使用状態を示す。(1) Example I FIG. 1 shows the state in which the rectifier cylinder for a single crystal pulling apparatus is used.

メインチャンバ10の上端開口12には、サブチャンバ
14が接続されている。サブチャンバ14の側壁には八
「ガス供給用の入口ジョイント14aが形成され、メイ
ンチャンバ10の底面には八「ガス吸引排出用の排出孔
10aが形戊され、メインチャンバ10の肩邪には引上
単結晶観察用の覗き窓10b及び固液界面の直径計測用
ITVが対向配置される別の覗き窓(不図示)が設けら
れている。このメインチャンバ10内には、昇降及び回
転可能な昇降回転軸l6の上端にテーブルl8が固着さ
れ、このテーブル18上に黒鉛坩堝20が載置され、黒
鉛坩堝20内に石英坩堝22が嵌合されている。黒鉛坩
堝20の周囲はヒーク24で囲繞され、ヒータ24の周
囲は黒鉛断熱壁2Gで囲繞されている。石英坩堝22内
に多結晶S1を入れ、ヒータ24に電力を供給すると、
このS1が溶解され融液28となる。
A subchamber 14 is connected to the upper end opening 12 of the main chamber 10 . An inlet joint 14a for gas supply is formed in the side wall of the sub-chamber 14, and an exhaust hole 10a is formed in the bottom of the main chamber 10 for sucking and discharging gas. A viewing window (not shown) is provided in which a viewing window 10b for observing the pulled single crystal and an ITV for measuring the diameter of the solid-liquid interface are arranged facing each other. A table 18 is fixed to the upper end of the vertical axis 16, and a graphite crucible 20 is placed on the table 18, and a quartz crucible 22 is fitted into the graphite crucible 20. The heater 24 is surrounded by a graphite heat insulating wall 2G. When the polycrystal S1 is placed in the quartz crucible 22 and power is supplied to the heater 24,
This S1 is melted and becomes a melt 28.

一方、サブチャンバl4の中心線に沿って」二下勤され
る引上軸30の下端には、種ホルダ32を介して種麩晶
34が保持されている。
On the other hand, a seed wheat crystal 34 is held via a seed holder 32 at the lower end of a pulling shaft 30 which is moved along the center line of the subchamber l4.

また、メインチャンバ10の上端開口部には、整流筒3
8の本体である黒鉛製長円筒40の上端開口が接続され
ている。この長円筒40は、引上f* 3 0と同心に
垂直に配置されている。長円筒41+ 1:’)長さは
、長円筒40の下端から融液28の表向までの距離が5
〜100mmになるようにする。
Further, a rectifying tube 3 is provided at the upper end opening of the main chamber 10.
The upper end opening of an elongated graphite cylinder 40, which is the main body of No. 8, is connected. This long cylinder 40 is arranged perpendicularly and concentrically with the pull-up f*30. The length of the long cylinder 41+1:') is the distance from the lower end of the long cylinder 40 to the surface of the melt 28.
-100mm.

また、長円簡の内径は、整流筒38の内面と単結晶36
の表面との最短距離が5〜100++++nになるよう
にする。
In addition, the inner diameter of the ellipse is the inner diameter of the rectifying tube 38 and the single crystal 36.
The shortest distance to the surface is 5 to 100+++n.

14円筒4 0 0) T部側面には、観察用の窓孔4
0aが形成されている。長円筒40の下端には、縮径し
て半径方向内側に向いた係止部40bが形成されている
14 cylinder 400) There is a window hole 4 for observation on the side of the T part.
0a is formed. At the lower end of the long cylinder 40, a locking portion 40b is formed with a reduced diameter and facing inward in the radial direction.

第2図に示す如く、外径が長円筒40の内径に略等しい
黒鉛製短円筒42の側面にも、窓孔40aと同一形状の
窓孔42aが形成されている。短円筒42の外周面の窓
孔42affl部には溝枠42bが形成されており、こ
れに石英製窓板44の縁部が嵌合される。この状態で、
短円筒42が長円筒40内に嵌入され、窓孔42aと窓
孔40aとを一致させた状態で短円筒42が長円筒40
の係止部40bにより係止される。第3図は、この係止
状懐での、窓部を通る横断面を示す。
As shown in FIG. 2, a window hole 42a having the same shape as the window hole 40a is also formed on the side surface of a short graphite cylinder 42 whose outer diameter is approximately equal to the inner diameter of the long cylinder 40. A groove frame 42b is formed in the window hole 42affl portion of the outer peripheral surface of the short cylinder 42, and the edge of the quartz window plate 44 is fitted into this. In this state,
The short cylinder 42 is inserted into the long cylinder 40, and the short cylinder 42 is inserted into the long cylinder 40 with the window hole 42a and the window hole 40a aligned.
It is locked by the locking part 40b. FIG. 3 shows a cross section through the window at this locking pocket.

係止部40bの外周面には、第1図に示す如く、この外
周面と同一傾斜を有する中空円錐台状の黒鉛製カラー4
6の小径側端部が接合されている。
As shown in FIG. 1, on the outer circumferential surface of the locking portion 40b, there is a hollow truncated conical graphite collar 4 having the same slope as the outer circumferential surface.
The small diameter side ends of No. 6 are joined.

次に、上記の如く構成された本実施例の動作を説明する
Next, the operation of this embodiment configured as described above will be explained.

メインチャンバ10内を真空ボンブで減圧し、サブチャ
ンバ14の人口ジョイント14aからArガスを供給し
、メインチャンバ10の排出孔10aからArガスを吸
引排出させる。八「ガスの供給量又は排出量を調節して
、メインチャンバ10内の圧力を1 0 0 mbar
程度にする。次に、ヒータ24に電力を供給して石英坩
堝22内の多結晶ンリコンを加熱溶融し、融液28を形
成する。次に、引上軸3゛0を下降させて種結晶34を
融液28内に漬け、引き上げて単結晶36を育成する。
The pressure inside the main chamber 10 is reduced using a vacuum bomb, Ar gas is supplied from the artificial joint 14a of the subchamber 14, and the Ar gas is suctioned and discharged from the exhaust hole 10a of the main chamber 10. 8. Adjust the gas supply or discharge amount to bring the pressure inside the main chamber 10 to 100 mbar.
to a certain degree. Next, power is supplied to the heater 24 to heat and melt the polycrystalline silicon in the quartz crucible 22 to form a melt 28. Next, the pulling shaft 3'0 is lowered to immerse the seed crystal 34 in the melt 28 and pulled up to grow a single crystal 36.

この際、作業者はメインチャンバ10のaキfi I0
bから窓板44を通して単結晶36を観察しながら、良
好な単結晶36が育戊されるように各種制御!設を調節
(自動制御量を補正)する。
At this time, the operator must open the aki fi I0 of the main chamber 10.
While observing the single crystal 36 through the window plate 44 from b, various controls are carried out so that a good single crystal 36 is grown! Adjust the settings (correct the automatic control amount).

方、八「ガスは整流筒38内を流下し、その全てが整流
筒38の下端と融液28の表面との間を通り、カラー4
6の外面と石英坩堝22の内面との間を通って石英坩堝
22から排出され、下降して俳出孔10aから吸引排出
される。
On the other hand, the gas flows down inside the straightening tube 38, and all of it passes between the lower end of the straightening tube 38 and the surface of the melt 28, and the gas flows down into the straightening tube 38, passing between the lower end of the straightening tube 38 and the surface of the melt 28, and passing through the collar 4.
The liquid is discharged from the quartz crucible 22 by passing between the outer surface of the quartz crucible 6 and the inner surface of the quartz crucible 22, descends, and is sucked and discharged from the extraction hole 10a.

したがって、融液28と石英坩堝22との反応にまり生
威された揮発性SiOは、このArガスの流れにのって
排出孔10aから排出され、石英坩堝22の内周面、カ
ラー46の外面、単結晶3(;、種ホルダ32及び引上
軸30等に510が析出するのを防止することができる
。また、このA「ガスの流れにより融液28から蒸発す
る酸素量が多くなり、単結晶36の酸素濃度が低くなる
ので、酸化誘導欠陥及びスワール欠陥が低減される。
Therefore, the volatile SiO produced by the reaction between the melt 28 and the quartz crucible 22 is discharged from the discharge hole 10a along with the Ar gas flow, and is discharged from the inner peripheral surface of the quartz crucible 22 and the collar 46. It is possible to prevent 510 from being deposited on the outer surface, the single crystal 3 (;, the seed holder 32, the pulling shaft 30, etc.). Since the oxygen concentration in the single crystal 36 is lowered, oxidation-induced defects and swirl defects are reduced.

また、単結晶36の周囲を覆うようにArガスが通るの
で、単結晶36が冷却される。さらに、カラー46は、
融液28から直接受ける輻射熱及び石英坩堝22の内面
・で反射された輻射熱を吸収して加熱されるが、Arガ
スにより冷却されるので、長円筒40の下部の温度はカ
ラー46を設けない場合よりも相当低くなる。したがっ
て、固液界面付近の単結晶36の上下方向温度勾配が大
きくなり、単結晶36の或長速度が大きくなる。こ0)
ことは、単結晶36の単位長さ当たりの酸素取り込み量
が少なくなることを意味し、単結晶36の酸素濃度低減
に寄与する。
Further, since the Ar gas passes around the single crystal 36, the single crystal 36 is cooled. Furthermore, the color 46 is
Although it is heated by absorbing the radiant heat directly received from the melt 28 and the radiant heat reflected from the inner surface of the quartz crucible 22, it is cooled by Ar gas, so the temperature at the bottom of the long cylinder 40 is lower than when the collar 46 is not provided. It will be considerably lower than Therefore, the temperature gradient in the vertical direction of the single crystal 36 near the solid-liquid interface increases, and a certain longitudinal velocity of the single crystal 36 increases. ko0)
This means that the amount of oxygen taken in per unit length of the single crystal 36 is reduced, which contributes to reducing the oxygen concentration of the single crystal 36.

(2)第2実施例 第1図は第2実施例の整流筒の下端部横断面を示ず。(2) Second embodiment FIG. 1 does not show a cross section of the lower end of the rectifying cylinder of the second embodiment.

この整流筒では、第l実施例よりも狭い矩形の窓孔40
cを黒鉛製長円筒窓40Aの下部側面に3箇所形成し、
これに対応して黒鉛製短円筒42Aにも矩形の窓孔42
cを3箇所形戊し、各短円筒42Aの外周面の窓孔42
c縁部に溝枠42dを形成し、各溝枠42dに平らな矩
形の石英製窓板44Aを嵌め入れている。
In this rectifier tube, the rectangular window hole 40 is narrower than that in the first embodiment.
c is formed at three locations on the lower side surface of the graphite long cylindrical window 40A,
Correspondingly, a rectangular window hole 42 is also provided in the graphite short cylinder 42A.
c is formed in three places, and a window hole 42 is formed on the outer peripheral surface of each short cylinder 42A.
A groove frame 42d is formed on the c edge, and a flat rectangular quartz window plate 44A is fitted into each groove frame 42d.

この第2実施例では、平らな窓板を用いているので第1
実施例よりも制作容易であり、かつ、整流筒をより安価
に構或することができる。
In this second embodiment, since a flat window plate is used, the first
It is easier to manufacture than the embodiment, and the rectifier tube can be constructed at a lower cost.

(3)第3実施例 第5図は本発明の第3実施例の下部構成を示す。(3) Third embodiment FIG. 5 shows the lower structure of a third embodiment of the present invention.

長円筒40は第1実施例のものと同一形状であるが、短
円筒42及び窓板44の代わりに、外径が長円筒40の
内径に略等しい石英製円筒形窓板44aを長円筒40内
に嵌入係止させている。
The long cylinder 40 has the same shape as that of the first embodiment, but instead of the short cylinder 42 and the window plate 44, a cylindrical window plate 44a made of quartz whose outer diameter is approximately equal to the inner diameter of the long cylinder 40 is attached to the long cylinder 40. It is inserted and locked inside.

この第3実施例では、任意の窓孔の形状に対し同一形状
の窓板44aを用いることができるという利点がある。
This third embodiment has the advantage that the window plate 44a having the same shape can be used for any window hole shape.

(4)実験例 次に、実験例を説明する。(4) Experimental example Next, an experimental example will be explained.

(A)比較の基準となる条件は次の通りである。(A) The criteria for comparison are as follows.

A「ガス流m       :1001!/minメイ
ンチャンバ10内圧力: 1 0 0mbar整流筒3
8の内径:200mm ゜整流筒38の下端から融液面28の表面までの初期距
離 :30mm 窓孔40aの而積:200cm”(必要充分な面積)窓
板44なし 単結晶36の直径: 6inch 上記条件の下で、単結晶3日の直胴部10cm以降の酸
素濃度は20ppmaであった。また、この直胴部の横
断面における酸素濃度分布の分敗DD= 1 0 0 
(CC−CP)/Ccは15%であった。ここに、 Co :中心の酸素濃度 〔,,:周面から中心側へ3mmの位置の酸素濃度であ
る。酸sa度は、この最大値を基準値以下にすることが
要求されるので、分敗Dを小さくする必要がある。
A: Gas flow m: 1001!/min Main chamber 10 internal pressure: 100 mbar Rectifier tube 3
Inner diameter of 8: 200 mm Initial distance from the lower end of rectifying cylinder 38 to the surface of melt surface 28: 30 mm Volume of window hole 40a: 200 cm" (necessary and sufficient area) Diameter of single crystal 36 without window plate 44: 6 inch Under the above conditions, the oxygen concentration after 10 cm of the straight body part on the third day of the single crystal was 20 ppma. Also, the distribution of oxygen concentration in the cross section of this straight body part DD = 1 0 0
(CC-CP)/Cc was 15%. Here, Co: Oxygen concentration at the center [,,: Oxygen concentration at a position 3 mm from the peripheral surface to the center side. Since the maximum acid sa level is required to be below the reference value, it is necessary to reduce the division D.

(B)上記基準条件のうち、Arガス流星のみを2 0
 0 4!/minに変えた場合、酸素濃度を約1.5
 ppma低下させることができた。しかし、上記分敗
Dは20%と悪化した。
(B) Among the above standard conditions, only Ar gas meteors are
0 4! /min, the oxygen concentration is approximately 1.5
It was possible to lower ppma. However, the loss D mentioned above worsened to 20%.

(C)上記(A>の基準条件において、窓孔に窓板を取
り付け、他を同一条件にした場合、酸素a度を約31ρ
ma低下させることができた。また、上記分散Dは13
%で、僅かに改善された。
(C) Under the above standard conditions (A>), when a window plate is attached to the window hole and other conditions are the same, the oxygen a degree is approximately 31ρ
It was possible to lower ma. Moreover, the above dispersion D is 13
% was slightly improved.

[発明の効果コ 以上説明した如く、本発明に係る単結晶引上装置用整流
筒では、下端部に窓孔を設け、この窓孔を窓板で覆って
いるので、整流筒内を流下する不活性ガスは全て整流筒
の下端と融液面との間を通り、不活性ガスの流量を特に
大きくしなくても、引I;軸等にSi○が析出するのを
防止でき、単結晶の成長速度を大きくすることができ、
さらに、酸化誘導欠陥及びスワール欠陥を低減させるこ
とができ、また、本体の円筒を戊形容易で安価な黒鉛で
形成し、窓孔部分のみ、すなわち必要部分のみ4石英で
覆っているので、整流筒全体としては、製作容易であり
、かつ、大幅なコスト高とならないという優れた効果を
奏する。
[Effects of the Invention] As explained above, in the straightening tube for a single crystal pulling device according to the present invention, a window hole is provided at the lower end and this window hole is covered with a window plate, so that the flow down inside the straightening tube is All of the inert gas passes between the lower end of the rectifier cylinder and the melt surface, and even without increasing the flow rate of the inert gas, it is possible to prevent Si○ from depositing on the pull axis, etc. can increase the growth rate of
Furthermore, oxidation-induced defects and swirl defects can be reduced, and since the cylinder of the main body is made of graphite, which is easy to shape and is inexpensive, and only the window hole portion, that is, the necessary portion is covered with quartz, the rectification is reduced. The cylinder as a whole has excellent effects in that it is easy to manufacture and does not require a significant increase in cost.

【図面の簡単な説明】[Brief explanation of drawings]

第1図乃至第3図は本発明に係る単結晶引上装置用整流
筒の第1実施例に係り、 第1図は整流筒の使用状態を示す概略縦断面図、第2図
は整流筒の下部構成を示す分解斜視図、第3図は第2図
の組、付け状態での■−m線断面図である。 第4図は本発明の第2実施例に係る整流筒の下部構成を
示す横断面図である。 第5図は本発明の第3実施例に係る整流筒の下部構成を
示す分解斜視図である。 図中、 10はメインチャンバ I2は開口 14はサブチャンバ 22は石英坩堝 28は融液 30は引上軸 36は単結晶 38は整流筒 40は黒鉛製長円筒 40a,40c,42a,42cは窓孔42、42Aは
黒鉛製短円筒 42b,42dは溝枠 44、44A,44Bは石英製窓板 46は黒鉛製カラー
1 to 3 relate to a first embodiment of the rectifying tube for a single crystal pulling device according to the present invention, FIG. 1 is a schematic vertical cross-sectional view showing the condition in which the rectifying tube is used, and FIG. FIG. 3 is an exploded perspective view showing the lower structure of FIG. FIG. 4 is a cross-sectional view showing the lower structure of the rectifier tube according to the second embodiment of the present invention. FIG. 5 is an exploded perspective view showing the lower structure of the rectifier tube according to the third embodiment of the present invention. In the figure, 10 is the main chamber I2, the opening 14 is the subchamber 22, the quartz crucible 28, the melt 30, the pulling shaft 36, the single crystal 38, the rectifying cylinder 40, the long graphite cylinders 40a, 40c, 42a, 42c are windows. Holes 42, 42A are graphite short cylinders 42b, 42d are groove frames 44, 44A, 44B are quartz window plate 46 is graphite collar

Claims (1)

【特許請求の範囲】 1)、坩堝(22)が内設されたメインチャンバ(10
)の上端開口(12)部に上端開口部が接続され、垂直
上方に引き上げられる単結晶(36)を同心に包囲し、
下部側面に窓孔(40a)40c)が形成された第1の
黒鉛製円筒(40、40A)と、 該窓孔を覆う石英製窓板(44、44A、44B)と、 を有することを特徴とする単結晶引上装置用整流筒。 2)、外径が前記円筒の内径に略等しく、前記窓孔(4
0a、40c)に対応した窓孔(42a)42c)が形
成された第2の黒鉛製円筒(42、42A)が、該両窓
孔を一致させて前記第1の円筒(40、40A)に嵌入
係止され、 該第1の円筒と該第2の円筒の接合面の該窓孔縁部に溝
(42b、42d)が形成され、該溝に前記窓板(44
、44A)の縁部が嵌入されたことを特徴とする請求項
1記載の単結晶引上装置用整流筒。 3)、前記窓板(44B)は、内径が前記第1の円筒(
40)の外形に略等しい円筒であり、前記第1の円筒に
嵌入係止されて前記窓孔(40a)を覆うことを特徴と
する請求項1記載の単結晶引上装置用整流筒。
[Claims] 1) A main chamber (10) in which a crucible (22) is installed;
) whose upper end opening is connected to the upper end opening (12) and concentrically surrounds the single crystal (36) that is pulled vertically upward;
A first graphite cylinder (40, 40A) with window holes (40a, 40c) formed in the lower side surface, and a quartz window plate (44, 44A, 44B) that covers the window hole. A rectifier tube for single crystal pulling equipment. 2), the outer diameter is approximately equal to the inner diameter of the cylinder, and the window hole (4
A second graphite cylinder (42, 42A) in which window holes (42a, 42c) corresponding to 0a, 40c) are formed is attached to the first cylinder (40, 40A) with both window holes aligned. Grooves (42b, 42d) are formed in the edge of the window hole on the joint surface of the first cylinder and the second cylinder, and the window plate (44) is fitted and locked in the groove.
, 44A) are fitted into the straightening tube for a single crystal pulling apparatus according to claim 1. 3) The window plate (44B) has an inner diameter similar to that of the first cylinder (44B).
2. The rectifier tube for a single crystal pulling apparatus according to claim 1, wherein the rectifier tube is a cylinder having a substantially same outer shape as the first cylinder, and is fitted and locked in the first cylinder to cover the window hole (40a).
JP23353089A 1989-09-09 1989-09-09 Rectifier for single crystal pulling equipment Expired - Lifetime JPH0688864B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23353089A JPH0688864B2 (en) 1989-09-09 1989-09-09 Rectifier for single crystal pulling equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23353089A JPH0688864B2 (en) 1989-09-09 1989-09-09 Rectifier for single crystal pulling equipment

Publications (2)

Publication Number Publication Date
JPH0397688A true JPH0397688A (en) 1991-04-23
JPH0688864B2 JPH0688864B2 (en) 1994-11-09

Family

ID=16956489

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23353089A Expired - Lifetime JPH0688864B2 (en) 1989-09-09 1989-09-09 Rectifier for single crystal pulling equipment

Country Status (1)

Country Link
JP (1) JPH0688864B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0633962U (en) * 1992-10-09 1994-05-06 コマツ電子金属株式会社 Semiconductor single crystal manufacturing equipment
WO2001081661A1 (en) * 2000-04-25 2001-11-01 Shin-Etsu Handotai Co.,Ltd. Silicon single-crystal wafer, method for producing silicon single crystal, and method for fabricating silicon single-crystal wafer
WO2002103092A1 (en) * 2001-06-14 2002-12-27 Shin-Etsu Handotai Co., Ltd. Production device for semiconductor single crystal and production method for semiconductor single crystal using it
JP2011057467A (en) * 2009-09-07 2011-03-24 Sumco Techxiv株式会社 Single crystal pulling apparatus
DE112009001431T5 (en) 2008-07-01 2011-06-16 Shin-Etsu Handotai Co., Ltd. Single-crystal manufacturing apparatus and single-crystal manufacturing method
JP2012219000A (en) * 2011-04-13 2012-11-12 Shin Etsu Handotai Co Ltd Method for controlling heater output and single crystal producing apparatus
KR101435172B1 (en) * 2012-10-08 2014-09-01 웅진에너지 주식회사 Heat shield structure for silicon ingot grower
JP2020132462A (en) * 2019-02-18 2020-08-31 信越半導体株式会社 Silicon single crystal lifting device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0633962U (en) * 1992-10-09 1994-05-06 コマツ電子金属株式会社 Semiconductor single crystal manufacturing equipment
WO2001081661A1 (en) * 2000-04-25 2001-11-01 Shin-Etsu Handotai Co.,Ltd. Silicon single-crystal wafer, method for producing silicon single crystal, and method for fabricating silicon single-crystal wafer
JP4096557B2 (en) * 2000-04-25 2008-06-04 信越半導体株式会社 Silicon single crystal wafer, silicon single crystal manufacturing method, and silicon single crystal wafer manufacturing method
WO2002103092A1 (en) * 2001-06-14 2002-12-27 Shin-Etsu Handotai Co., Ltd. Production device for semiconductor single crystal and production method for semiconductor single crystal using it
DE112009001431T5 (en) 2008-07-01 2011-06-16 Shin-Etsu Handotai Co., Ltd. Single-crystal manufacturing apparatus and single-crystal manufacturing method
US8236104B2 (en) 2008-07-01 2012-08-07 Shin-Etsu Handotai Co., Ltd. Single-crystal manufacturing apparatus and single-crystal manufacturing method
JP2011057467A (en) * 2009-09-07 2011-03-24 Sumco Techxiv株式会社 Single crystal pulling apparatus
JP2012219000A (en) * 2011-04-13 2012-11-12 Shin Etsu Handotai Co Ltd Method for controlling heater output and single crystal producing apparatus
KR101435172B1 (en) * 2012-10-08 2014-09-01 웅진에너지 주식회사 Heat shield structure for silicon ingot grower
JP2020132462A (en) * 2019-02-18 2020-08-31 信越半導体株式会社 Silicon single crystal lifting device

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