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JPH0333677A - Measuring apparatus for surface dose - Google Patents

Measuring apparatus for surface dose

Info

Publication number
JPH0333677A
JPH0333677A JP16687089A JP16687089A JPH0333677A JP H0333677 A JPH0333677 A JP H0333677A JP 16687089 A JP16687089 A JP 16687089A JP 16687089 A JP16687089 A JP 16687089A JP H0333677 A JPH0333677 A JP H0333677A
Authority
JP
Japan
Prior art keywords
dose
measured
state
source
shielding body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16687089A
Other languages
Japanese (ja)
Inventor
Toichi Murakami
村上 統一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP16687089A priority Critical patent/JPH0333677A/en
Publication of JPH0333677A publication Critical patent/JPH0333677A/en
Pending legal-status Critical Current

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  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To enable highly-precise evaluation of a does from the direction of a source without being affected by a background dose, by determining a difference in the dose between a state wherein a source shielding body is drawn into a main body and a state wherein it is drawn out therefrom. CONSTITUTION:A background shielding body 11 and a source shielding body 12 enclose a radiation detector 13, and the shielding body 12 can be drawn into and out of a main body 14. With a detecting element 10 brought into contact with the surface of an element 15 to be measured, a dose is measure din a state wherein the shielding body 12 is drawn into the main body 14, and it is store din an arithmetic unit 16. Next, the dose is measured in a state wherein the shielding body 12 is drawn out therefrom, and it is sent into the arithmetic unit 16. A dose from the direction of a source is evaluated by using the difference between the two doses. Thereby the dose of the source can be evaluated with high precision irrespective of the magnitude of a background dose.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は、複数の線源が混在する環境において特定の機
器・配管等、被測定部の表面線量を測定する表面線量測
定装置に関する。
[Detailed Description of the Invention] [Objective of the Invention] (Industrial Application Field) The present invention relates to a surface dose measurement method for measuring the surface dose of a part to be measured such as specific equipment or piping in an environment where a plurality of radiation sources coexist. Concerning a measuring device.

(従来の技術) 特定の機器・配管等の線量を測定する場合、第5図の模
式的に示す構成図に示すような表面線量測定装置lを使
用している。この表面線量測定装置1は本体2と検出部
3とから成り、本体2と検出部3は、ケーブル4で接続
されている。検出部3は半球状のバックグラウンド遮蔽
体5の中心に放射線検出器6が配置された構成であり、
これを機器・配管等、被測定部7の表面にあてがい、線
量を測定している。このとき、被測定部7の線源方向か
らの線量をS、それ以外の方向からの線量をB、バック
グラウンド遮蔽体5による減衰率をbとすると、 測定
される線量D2は以下のようになる。
(Prior Art) When measuring the dose of specific equipment, piping, etc., a surface dose measuring device 1 as shown in the schematic diagram of FIG. 5 is used. This surface dose measuring device 1 consists of a main body 2 and a detection section 3, and the main body 2 and the detection section 3 are connected by a cable 4. The detection unit 3 has a configuration in which a radiation detector 6 is arranged at the center of a hemispherical background shield 5,
This is applied to the surface of the part to be measured 7, such as equipment or piping, and the dose is measured. At this time, if the dose from the radiation source direction of the part to be measured 7 is S, the dose from other directions is B, and the attenuation rate due to the background shield 5 is b, then the measured dose D2 is as follows: Become.

D2=S十B−b そして、線量評価の際にはB−bが十分少さい(実際に
は遮蔽体の厚みが2〜3an鉛当量でb=0.2〜0.
4程度)と仮定して、この項を無視し、D2αSとみな
している。
D2 = S + B - b And when evaluating the dose, B - b is sufficiently small (actually, the thickness of the shield is 2 to 3 ann and the lead equivalent is b = 0.2 to 0.
4), this term is ignored and it is regarded as D2αS.

(発明が解決しようとする課題) 線源からの線量Sがバックグラウンドの線量Bに比べて
十分大きいときは問題ないが、BがSの173以上にな
ると測定線量D2はSより10%以上大きくなり線源に
よる線量を過大評価することになる。
(Problem to be solved by the invention) There is no problem when the dose S from the radiation source is sufficiently large compared to the background dose B, but when B becomes 173 or more of S, the measured dose D2 is more than 10% larger than S. This results in an overestimation of the dose due to the source.

本発明の目的は、バックグラウンド線量Bの大小にかか
わらず、線源方向の線量Sを精度良く評価できる表面線
量測定装置を得ることにある。
An object of the present invention is to obtain a surface dose measuring device that can accurately evaluate the dose S in the direction of the radiation source, regardless of the magnitude of the background dose B.

〔発明の構成〕[Structure of the invention]

(課題を解決するための手段) 上記目的を達成するために、本発明においては、第1の
状態で被測定部と放射線検出器との間に配置され第2の
状態で被測定部と放射線検出器との間から移動されある
いは取外される線源遮蔽体と、前記放射線検出器に対し
前記被測定部と反対の方向に配置され前記第1の状態で
前記放射線検出器を前記線源遮蔽体とで囲繞するバック
グラウンド遮蔽体と、前記第1の状態と第2の状態との
2つの状態について測定された線量値を演算処理し被測
定部からの線量を求める演算器とからなることを特徴と
する表面線量測定装置を提供する。
(Means for Solving the Problems) In order to achieve the above object, in the present invention, the radiation detector is arranged between the part to be measured and the radiation detector in the first state, and the part to be measured and the radiation detector in the second state. a radiation source shield that is moved or removed from between the radiation detector and the radiation source; It consists of a background shielding body surrounding the shielding body, and a computing unit that calculates the dose from the part to be measured by processing the dose values measured for the two states, the first state and the second state. Provided is a surface dose measuring device characterized by the following.

(作 用) 例えば、第1の状態、すなわち線源遮蔽体が配置された
状態で測定される線量Dlは、線源遮蔽体による減衰率
をa、線源方向からの線量をS、それ以外の方向からの
線量をB、バックグラウンド遮蔽体による減衰率をbと
すると、 D、 = S−a 十Ilb また線源遮蔽体が取外された状態(第2の状態)で測定
される線量D2は 4 D2=S十B−b となり、線源からの線量Sは減衰率aが既知であれば、
以下の式で求めることができる。
(Function) For example, the dose Dl measured in the first state, that is, the state in which the source shield is placed, is determined by the attenuation rate by the source shield being a, the dose from the direction of the source being S, and the other values. If the dose from the direction is B and the attenuation rate due to the background shield is b, then D, = S - a + Ilb Also, the dose measured with the source shield removed (second state) D2 becomes 4 D2 = S + B - b, and the dose S from the radiation source is if the attenuation rate a is known,
It can be calculated using the following formula.

(実施例) 以下、本発明の一実施例を第1図から第4図を参照して
説明する。
(Example) An example of the present invention will be described below with reference to FIGS. 1 to 4.

バックグラウンド遮蔽体11と線源遮蔽体12とこれら
の遮蔽体で囲まれた放射線検出器13とで検出部10が
構成されている。線源遮蔽体12は、本体14の中へ引
込むことができる構造となっている。検出部10を配管
・機器等、被測定部15の表面にあて、第2図(a)お
よび(b)に示すように、線源遮蔽体12を本体14内
に引込んだ状態(第2の状態)と本体14から引出した
状態(第1の状態)で線量を測定する。測定された線量
D□、D2を演算処理する演算器I6は、本体14内に
内蔵されている。
The detection unit 10 includes a background shield 11, a radiation source shield 12, and a radiation detector 13 surrounded by these shields. The source shield 12 is configured to be retractable into the body 14. The detection unit 10 is applied to the surface of the part to be measured 15 such as piping or equipment, and the radiation source shield 12 is retracted into the main body 14 (second The dose is measured in the state (state) and in the state pulled out from the main body 14 (first state). A computing unit I6 that processes the measured doses D□ and D2 is built into the main body 14.

第3図に示すように、線源遮蔽体12は、原子力発電所
での代表的エネルギーである0、5〜1.3M e V
  において線吸収係数の変化の少ない鉄製(μ=0.
42〜0.65(帥−1):平均0.530−1)とす
る。
As shown in FIG. 3, the radiation source shield 12 has a radiation source of 0.5 to 1.3 M e V, which is a typical energy in a nuclear power plant.
Made of iron with little change in linear absorption coefficient (μ=0.
42 to 0.65 (帥-1): average 0.530-1).

また遮蔽体2の厚みは、第4図に示すように、材料によ
るビルドアップを加味しても、放射線のエネルギーによ
る減衰率aの変化が少ない、2〜30程度とする。ここ
で遮蔽体2の肉厚を2.5印とすると、a =0.5と
なる。
As shown in FIG. 4, the thickness of the shielding body 2 is set to be approximately 2 to 30 mm, so that the attenuation rate a changes little due to the energy of the radiation even when the build-up due to the material is taken into account. Here, if the thickness of the shielding body 2 is 2.5 marks, then a =0.5.

検出部IOを被測定部15の表面にあて線源遮蔽体12
を本体14内に引込んだ状態(第2の状態)で線量を測
定する。この測定値D2を演算器16にメモリーしてお
く。
The detection unit IO is placed on the surface of the measurement target 15 and the radiation source shield 12
The dose is measured in a state where the device is retracted into the main body 14 (second state). This measured value D2 is stored in the calculator 16.

次に、線源遮蔽体I2を本体14内から引出した状態(
第1の状態)で線量を測定する。この測定値D□を演算
器16に送り、先のD2と演算処理を行ない線源からの
線量Sを次式により評価する。
Next, the source shield I2 is pulled out from inside the main body 14 (
The dose is measured in the first state). This measured value D□ is sent to the computing unit 16, where it is subjected to arithmetic processing with the previous D2, and the dose S from the radiation source is evaluated using the following equation.

S=□d −a 2(D、−D□) この実施例では、遮蔽体12に2.5cm厚の鉄を用い
、線源遮蔽体の有るときと無いときの2つの状態につい
て測定した線量から線源寄与の線量Sを評価する構成と
したので、バックグラウンドの線量Bの大きさやγ線の
エネルギーによる影響を受けずに精度よく線源寄与線量
Sを評価することができる。
S=□d -a 2 (D, -D□) In this example, 2.5 cm thick iron was used as the shield 12, and the dose was measured in two states: with and without the source shield. Since the configuration is such that the source-contributed dose S is evaluated from the above, the source-contributed dose S can be evaluated accurately without being influenced by the magnitude of the background dose B or the energy of γ-rays.

〔発明の効果〕〔Effect of the invention〕

本発明によれば線源遮蔽体の有無による線量側定植の差
から線源方向からの線量Sを評価するので、バックグラ
ウンド線量Bの大小にかかわらず線源線量Sを精度よく
評価することができる。
According to the present invention, the dose S from the source direction is evaluated based on the difference in the dose side emplacement due to the presence or absence of a source shield, so the source dose S can be evaluated accurately regardless of the magnitude of the background dose B. can.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る表面線量測定装置の一実施例の構
成図、第2図(a)及び第2図(b)は一実施例の使用
状態を表わす構成図、第3図は遮蔽材の種類による線吸
収係数のグラフ、第4図はガンマ線の減衰曲線のグラフ
、第5図は従来の表面線量測定装置の構成図である。 11・・・バックグラウンド遮蔽体、 12・・・線源遮蔽体、 7 13・・放射線検出器、 16・・・演算器。
FIG. 1 is a block diagram of an embodiment of the surface dose measuring device according to the present invention, FIGS. 2(a) and 2(b) are block diagrams showing the usage state of the embodiment, and FIG. 3 is a block diagram showing the usage state of the embodiment. FIG. 4 is a graph of the linear absorption coefficient depending on the type of material, FIG. 4 is a graph of the attenuation curve of gamma rays, and FIG. 5 is a configuration diagram of a conventional surface dose measuring device. DESCRIPTION OF SYMBOLS 11... Background shielding body, 12... Radiation source shielding body, 7 13... Radiation detector, 16... Arithmetic unit.

Claims (2)

【特許請求の範囲】[Claims] (1)第1の状態で被測定部と放射線検出器との間に配
置され第2の状態で被測定部と放射線検出器との間から
移動されあるいは取外される線源遮蔽体と、前記放射線
検出器に対し前記被測定部と反対の方向に配置され前記
第1の状態で前記放射線検出器を前記線源遮蔽体とで囲
繞するバックグラウンド遮蔽体と、前記第1の状態と第
2の状態との2つの状態について測定された線量値を演
算処理し被測定部からの線量を求める演算器とからなる
ことを特徴とする表面線量測定装置。
(1) a radiation source shield that is disposed between the part to be measured and the radiation detector in a first state and is moved or removed from between the part to be measured and the radiation detector in a second state; a background shield that is arranged in a direction opposite to the measured part with respect to the radiation detector and surrounds the radiation detector with the radiation source shield in the first state; 1. A surface dose measurement device comprising: a calculation unit that calculates the dose from the part to be measured by processing the dose values measured for the two states;
(2)前記演算器は、前記第1の状態で測定された線量
値をD_1、前記第2の状態で測定された線量値をD_
2、線源遮蔽体による減衰率をaとすると、被測定部か
らの線量Sを S=D_2−D_1/1−a なる式にて求めることを特徴とする請求項1記載の表面
線量測定装置。
(2) The computing unit sets the dose value measured in the first state to D_1 and the dose value measured in the second state to D_1.
2. The surface dose measuring device according to claim 1, wherein when the attenuation rate by the radiation source shield is a, the dose S from the part to be measured is determined by the following formula: S=D_2-D_1/1-a .
JP16687089A 1989-06-30 1989-06-30 Measuring apparatus for surface dose Pending JPH0333677A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16687089A JPH0333677A (en) 1989-06-30 1989-06-30 Measuring apparatus for surface dose

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16687089A JPH0333677A (en) 1989-06-30 1989-06-30 Measuring apparatus for surface dose

Publications (1)

Publication Number Publication Date
JPH0333677A true JPH0333677A (en) 1991-02-13

Family

ID=15839161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16687089A Pending JPH0333677A (en) 1989-06-30 1989-06-30 Measuring apparatus for surface dose

Country Status (1)

Country Link
JP (1) JPH0333677A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014106189A (en) * 2012-11-29 2014-06-09 Kajima Corp Radioactive concentration measurement device, spatial dose rate measurement device and radioactive concentration measurement method
JP2016510891A (en) * 2013-03-13 2016-04-11 マリンクロッド エルエルシー System and method for assaying eluates for technetium and molybdenum content
JP2020030169A (en) * 2018-08-24 2020-02-27 株式会社スリー・アール Surface dose rate measurement method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014106189A (en) * 2012-11-29 2014-06-09 Kajima Corp Radioactive concentration measurement device, spatial dose rate measurement device and radioactive concentration measurement method
JP2016510891A (en) * 2013-03-13 2016-04-11 マリンクロッド エルエルシー System and method for assaying eluates for technetium and molybdenum content
JP2020030169A (en) * 2018-08-24 2020-02-27 株式会社スリー・アール Surface dose rate measurement method

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