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JPH0247525A - Light beam diameter measuring device - Google Patents

Light beam diameter measuring device

Info

Publication number
JPH0247525A
JPH0247525A JP19791388A JP19791388A JPH0247525A JP H0247525 A JPH0247525 A JP H0247525A JP 19791388 A JP19791388 A JP 19791388A JP 19791388 A JP19791388 A JP 19791388A JP H0247525 A JPH0247525 A JP H0247525A
Authority
JP
Japan
Prior art keywords
light beam
original
transparent flat
plates
beam diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19791388A
Other languages
Japanese (ja)
Inventor
Hiroyasu Sasaki
博康 佐々木
Shigemitsu Yamada
山田 繁光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP19791388A priority Critical patent/JPH0247525A/en
Publication of JPH0247525A publication Critical patent/JPH0247525A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To make it easy to set a light beam in the central part of a visual field by providing two transparent flat plates in an optical path of the light beam to a two-dimensional image pickup element so that the axes of rotation of the plates are specified. CONSTITUTION:The radius of a light beam 10 is magnified by a lens 30 and picked up on a two-dimensional image pickup element 41 of a TV camera 40, a signal from the camera 40 is processed by a beam radius calculating device 42, and the radius of the beam 10 is measured therefrom. On the occasion, two transparent flat plates 20a and 20b are provided rotatably in the course of an optical path of the beam 10, the axes of rotation of the plates are made to intersect the optical axis of the beam 10 perpendicularly, and the axes of the flate plates 20a and 20b are made to intersect each other perpendicularly.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、元ビームの径を2次元撮像センサによって測
定する装置に係り、特に光学式記録再生装置などで使用
されているレーザ尤の径が精度良好にして測定されるよ
プにした元ビーム径測定装置に関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a device for measuring the diameter of an original beam using a two-dimensional imaging sensor, and in particular to a device for measuring the diameter of an original beam using a two-dimensional imaging sensor, and in particular for measuring the diameter of a laser beam used in an optical recording/reproducing device. This invention relates to a device for measuring the diameter of an original beam that can be measured with good accuracy.

〔従来の技術〕[Conventional technology]

固体撮像素子を受光センサとした光ビーム径測定装置で
は、一般に各画素での光強度が計測されろことによって
、元ビーム径が算出されるようになっている。例えば、
特開昭59−44628号公報においては、量大出力レ
ベルを有する画素の位置と、最大出力レベルの1/e″
の出力レベルを有する画素の位置とから光ビーム径が算
出されるようになっている。また、%開開60−256
019号公報による場合には、水平、垂!i[2方向の
光強度分布を記憶しておき、ある閾値を越える光強度の
画素数から元ビーム径が算出されるようになっている。
In a light beam diameter measuring device using a solid-state image sensor as a light receiving sensor, the original beam diameter is generally calculated by measuring the light intensity at each pixel. for example,
In Japanese Unexamined Patent Publication No. 59-44628, the position of a pixel having a large output level and 1/e'' of the maximum output level are disclosed.
The light beam diameter is calculated from the position of the pixel having the output level. Also, % opening 60-256
According to Publication No. 019, horizontal, vertical! i [The light intensity distribution in two directions is memorized, and the original beam diameter is calculated from the number of pixels whose light intensity exceeds a certain threshold.

これら公報では倒れも光ビーム径の算出は、画素を基本
単位として行なわれていることから、画素の大きさ以上
に精度は上がらず、画素の大きさ程度の誤差が生じるこ
とになる。したがって、測定誤差を小さくするには、測
足値を大きくすべく撮偉素子受元面上に投写される光ビ
ーム像を拡大し、画素相当の誤差を相対的に小さくなる
ようにすればよく、これはレンズ等を用いろことで容易
−となっている。このため、特開昭59−44628号
公報による場合、撮像素子の前面には元ビーム拡大用レ
ンズが設けられたものとなっている。
In these publications, the calculation of the optical beam diameter is performed using the pixel as a basic unit, so the accuracy does not increase beyond the size of the pixel, and an error equivalent to the size of the pixel occurs. Therefore, in order to reduce the measurement error, the light beam image projected onto the sensor receiving surface can be enlarged to increase the measured value, and the error corresponding to the pixel can be made relatively small. This can be easily done by using a lens or the like. For this reason, in the case of Japanese Patent Laid-Open No. 59-44628, a lens for enlarging the original beam is provided in front of the image sensor.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、拡大された光ビーム像を撮像素子に投影
する場合には、元ビームをとらえて径を測定する視野を
狭くすることになる。例えば、撮像素子の受光部の大き
さが8.8 x 6.6 mであっても元ビームが10
倍に拡大される場合には、視野は0.88 x O,6
6wmと穫めて小さくなるものでちる。
However, when projecting an enlarged light beam image onto an image sensor, the field of view for capturing the original beam and measuring the diameter becomes narrower. For example, even if the size of the light receiving part of the image sensor is 8.8 x 6.6 m, the original beam is
When magnified twice, the field of view is 0.88 x O,6
It is 6wm and becomes small when harvested.

視野が狭ければ、元ビームの光軸のずれによっては元ビ
ームが撮像素子に投影されなくなつfCジ。
If the field of view is narrow, the original beam may no longer be projected onto the image sensor due to a shift in the optical axis of the original beam.

投影された元ビーム像に欠けが生じ易くなるというもの
である。そこで、視野中央部に光ビームをとらえる作業
が必要となるが、視野が小さいため、元ビームを視野内
に入射せしめることは容易でなく、その作業性はいきお
い低下し友ものとなっている。
This means that the projected original beam image is likely to be chipped. Therefore, it is necessary to capture the light beam in the center of the field of view, but since the field of view is small, it is not easy to make the original beam enter the field of view, and the work efficiency is greatly reduced.

本発明の目的は、元ビーム像の拡大によって視野が狭く
なる場合であっても、容易に元ビームを視野内にとらえ
ろことが可能とされfC,元ビーム径測定装置を供する
にある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an fC and original beam diameter measuring device that can easily capture the original beam within the field of view even when the field of view becomes narrow due to expansion of the original beam image.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的は、2次元撮像素子への光ビーム元路中に、そ
の光ビーム光軸に回転軸が直交する状態で、相互に回転
軸が直交する少な(とも2つの透明平板が回動自在に設
けられることで達成される。
The above purpose is to enable two transparent flat plates (both of which are rotatable) whose rotational axes are orthogonal to each other, with the rotational axis perpendicular to the optical axis of the light beam, during the path of the light beam to the two-dimensional image sensor. This is achieved by establishing a

〔作用〕[Effect]

光ビーム元軸に対し透明平板が直交する状態にある場合
は、元ビームは単に透明平板を介し直進するも、透明平
板が直交しない状態にある場合には、元ビームは屈折の
法則により透明平板からはその元ビーム元軸が元の元ビ
ーム元鋤に平行とされ几状態で、それより僅かに偏位し
た状態で出射されろというものである。その偏位量は透
明平板の回動状態によるが、その偏位方向は一定である
ことから、偏位方向が相互に直交する状態で少t(とも
2つの透明平板が回動自在に設けられろ場合は、2つの
透明平板の回動状態の調整如何によって、元ビームは2
仄元撮像素子に状態良好にして入射せしめられろもので
ある。
When the transparent flat plate is perpendicular to the light beam original axis, the original beam simply travels straight through the transparent flat plate, but when the transparent flat plate is not perpendicular to the original axis, the original beam travels straight through the transparent flat plate due to the law of refraction. This means that the original beam axis should be parallel to the original beam axis and should be emitted in a state slightly deviated from that direction. The amount of deviation depends on the rotating state of the transparent flat plate, but since the direction of the deviation is constant, the deviation direction is perpendicular to each other for a small amount of t (in both cases, the two transparent flat plates are rotatably provided). In this case, depending on the adjustment of the rotational state of the two transparent flat plates, the original beam can be divided into two
The light must be in good condition to be incident on the original image sensor.

〔実施例〕〔Example〕

以下、本発明を第1図から第5図により説明する。 The present invention will be explained below with reference to FIGS. 1 to 5.

先ず本発明の原理について説明すれば、第2図に示すよ
うに光ビーム10は一般にレンズ30でそのビーム径が
拡大され之うえ、TV右カメラ0におけろ2次元撮像素
子41上で元ビーム拡大投影像11として撮像、検出さ
れろようになっている。TV右カメラ0からのビデオ信
号はビーム径″X/fl装f!t42で所定に処理され
ることによって、光ビーム10のビーム径が精度良好に
して測定されるようになっているものであるが、2次元
撮像素子41での元ビーム拡大投影像11の位置は、党
ビーム10の光路途中に挿入された透明平板20の回動
状態によって変更され得るというものである。透明平板
20自体はその回転軸が元ビーム10元軸に直交する状
態で支持枠22に回動自在として支持されており、回転
つまみ21によってその回動状態は容易に変更可とされ
ているものである。
First, to explain the principle of the present invention, as shown in FIG. It is designed to be imaged and detected as an enlarged projected image 11. The video signal from the TV right camera 0 is processed in a predetermined manner by the beam diameter "X/fl device f!t42, so that the beam diameter of the light beam 10 can be measured with good accuracy. However, the position of the original beam enlarged projection image 11 on the two-dimensional image sensor 41 can be changed by the rotating state of the transparent flat plate 20 inserted in the optical path of the secondary beam 10.The transparent flat plate 20 itself It is rotatably supported by a support frame 22 with its rotation axis perpendicular to the original axis of the original beam 10, and its rotation state can be easily changed using a rotation knob 21.

したがって、もしも透明平板20が光ビーム10光軸に
対し直交する状態にある場合に、光ビーム拡大投影像1
1の全体が2次元撮像素子41上にある場合は、この状
態で光ビーム10のビーム径は測定されることにtろ(
g 51fflla+参照)。LかLながら1元ビーム
拡大投杉俊11の一部でも2次元撮像素子41上よりX
方向にはみ出るよりてあれば(第3図[bl参照)、透
明平板20を適当に回動せしめることによって、元ビー
ム拡大投影像11はその全体が2次元撮像素子41上に
位置させられたうえ撮像、検出されることが可能となる
ものである(第3図1cI参照)。
Therefore, if the transparent flat plate 20 is in a state perpendicular to the optical axis of the light beam 10, the light beam enlarged projected image 1
1 is entirely on the two-dimensional image sensor 41, the beam diameter of the light beam 10 is measured in this state.
g 51fflla+). X
If the beam protrudes in the direction (see FIG. 3 [bl]), by appropriately rotating the transparent flat plate 20, the entire original beam enlarged projected image 11 can be positioned on the two-dimensional image pickup device 41. This enables imaging and detection (see FIG. 3, 1cI).

以上のよつに元ビーム10の元軸がX方向に偏位してい
る場合には、透明平板20を適当に回動せしめろことに
よってそのビーム径は測定可能となるが、一般的には元
ビーム10の元軸はX方向に、あるいはx、X方向に同
時に偏位している場合もあり得るから、X方向、X方向
それぞれに対応して透明平板?設ければよいことになる
。第1図はその場合での構F′N、を示したものである
。透明平板20a、20bはそれぞれy方向、X方向対
応に設けられたものであり、これによ!ll′ytビー
ム10の元軸が如回なる方向に偏位していようとも、元
ビーム10のビーム径が画定可となるものである。即ち
、透明平板20a、20bの何れか、または双方の回動
状態を同時に調整することによっては、光ビーム拡大投
影像11の全体が2次元撮像素子41上に位置され得、
この状態で光ビーム10のビーム径が測されるものであ
る。
As described above, when the original axis of the original beam 10 is deviated in the X direction, the beam diameter can be measured by appropriately rotating the transparent flat plate 20, but in general, Since the original axis of the original beam 10 may be deviated in the X direction, or in the x and It would be a good idea to set one up. FIG. 1 shows the structure F'N in that case. The transparent flat plates 20a and 20b are provided corresponding to the y direction and the x direction, respectively. Regardless of the direction in which the original axis of the ll'yt beam 10 is deviated, the beam diameter of the original beam 10 can be defined. That is, by simultaneously adjusting the rotational state of either or both of the transparent flat plates 20a and 20b, the entire light beam enlarged projection image 11 can be positioned on the two-dimensional image sensor 41,
In this state, the beam diameter of the light beam 10 is measured.

〔発明の効果〕〔Effect of the invention〕

以上説明し念ように、元ビームはその光軸が、これとは
平行とされた他の光軸に任意に偏位され得るから、元ビ
ーム像全体を2次元撮像孝子上に容易に位置させた状態
でビーム径が測定されることになる。
As explained above, since the optical axis of the original beam can be arbitrarily shifted to another optical axis parallel to this, the entire original beam image can be easily positioned on the two-dimensional imaging device. The beam diameter will be measured in this state.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は1本発明による光ビーム径測足装置の一例での
構取を示す図、第2図、第3図(α)、lbl、lcl
は、その原理を説明するための図である。 10・・・元ビーム、11・・・元ビーム拡大投影像、
20 α 子、 20b・・・透明平板、4 2・・・ビーム径算出装置。 ・・・2次元撮像素
Fig. 1 is a diagram showing the configuration of an example of the optical beam diameter footing device according to the present invention, Fig. 2, Fig. 3 (α), lbl, lcl.
is a diagram for explaining the principle. 10... Original beam, 11... Original beam enlarged projection image,
20 α child, 20b...transparent flat plate, 4 2...beam diameter calculation device. ...2D image sensor

Claims (1)

【特許請求の範囲】[Claims] 1、2次元撮像素子に光ビームを入射せしめることによ
つて、該光ビームの径が測定されるべくなした光ビーム
径測定装置であつて、2次元撮像素子への光ビーム光路
中に、該光ビーム光軸に回転軸が直交し、かつ相互に回
転軸が直交する少なくとも2つの透明平板が回動自在に
設けられてなる構成を特徴とする光ビーム径測定装置。
1. A light beam diameter measuring device designed to measure the diameter of a light beam by making the light beam incident on a two-dimensional image sensor, which includes: A light beam diameter measuring device characterized by a structure comprising rotatably provided at least two transparent flat plates whose rotational axes are orthogonal to the optical axis of the light beam and whose rotational axes are orthogonal to each other.
JP19791388A 1988-08-10 1988-08-10 Light beam diameter measuring device Pending JPH0247525A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19791388A JPH0247525A (en) 1988-08-10 1988-08-10 Light beam diameter measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19791388A JPH0247525A (en) 1988-08-10 1988-08-10 Light beam diameter measuring device

Publications (1)

Publication Number Publication Date
JPH0247525A true JPH0247525A (en) 1990-02-16

Family

ID=16382355

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19791388A Pending JPH0247525A (en) 1988-08-10 1988-08-10 Light beam diameter measuring device

Country Status (1)

Country Link
JP (1) JPH0247525A (en)

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