JPH0239425A - Apparatus for manufacturing semiconductor - Google Patents
Apparatus for manufacturing semiconductorInfo
- Publication number
- JPH0239425A JPH0239425A JP19043288A JP19043288A JPH0239425A JP H0239425 A JPH0239425 A JP H0239425A JP 19043288 A JP19043288 A JP 19043288A JP 19043288 A JP19043288 A JP 19043288A JP H0239425 A JPH0239425 A JP H0239425A
- Authority
- JP
- Japan
- Prior art keywords
- core tube
- tube
- furnace core
- nitrogen gas
- built
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000004065 semiconductor Substances 0.000 title claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 14
- 229910001873 dinitrogen Inorganic materials 0.000 claims abstract description 12
- 238000010438 heat treatment Methods 0.000 claims abstract description 9
- 235000012431 wafers Nutrition 0.000 claims abstract description 3
- 238000010926 purge Methods 0.000 claims 1
- 238000011109 contamination Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 2
- 239000012212 insulator Substances 0.000 abstract 1
- 239000011810 insulating material Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012774 insulation material Substances 0.000 description 2
- 238000002791 soaking Methods 0.000 description 2
- 230000036760 body temperature Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は拡散炉、減圧CVD炉、プラズマCvD炉等の
熱処理炉の炉芯管にてウェハーを処理する半導体製造装
置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a semiconductor manufacturing apparatus for processing wafers in a furnace core tube of a heat treatment furnace such as a diffusion furnace, a low pressure CVD furnace, or a plasma CVD furnace.
従来の炉芯管を用い熱処理を行う半導体の製造装置は、
第3図に示すようにヒータ一部1に熱電対6cが各々取
り付けられその中に炉芯管3Cを入れヒータ一部1と炉
芯管3Cの隙間を断熱材7にて密閉、固定しているが、
断熱材3Cの入れ方が悪かったりすると熱電対6Cが外
部雰囲気の影響を受け、温度が不安定を生じたり、又、
そうでない場合においても実際の炉体温度と炉芯管内部
温度との温度差が有り、プロセス上好ましくなく、炉芯
管3cが汚れるほど温度差は大きくなっていた。Semiconductor manufacturing equipment that performs heat treatment using a conventional furnace core tube is
As shown in FIG. 3, thermocouples 6c are attached to each heater part 1, and the furnace core tube 3C is inserted into each thermocouple, and the gap between the heater part 1 and the furnace core tube 3C is sealed and fixed with a heat insulating material 7. There are, but
If the insulation material 3C is inserted incorrectly, the thermocouple 6C will be affected by the external atmosphere, causing temperature instability, or
Even in cases where this is not the case, there is a temperature difference between the actual furnace body temperature and the furnace core tube internal temperature, which is unfavorable in terms of the process, and the more the furnace core tube 3c becomes dirty, the larger the temperature difference becomes.
又、温度コントロールに使用される熱電対6Cが還元性
雰囲気に弱く水素を使用する熱処理炉等では寿命も短か
く一年位で置換の必要が有り、炉芯管3cが直接ヒータ
一部1に触れたりする場合等も有り、ヒータ一部1より
のアウトガスにより炉芯管3cが汚染されていた。In addition, the thermocouple 6C used for temperature control is weak against reducing atmospheres and has a short lifespan in heat treatment furnaces that use hydrogen, requiring replacement after about a year. In some cases, the furnace core tube 3c was contaminated by outgas from the heater part 1.
上述したヒータ一部と炉芯管において、ヒーターよりの
アウトガスによる炉芯管の汚染が問題となっていた。又
、温度コントロールも従来方法だと、炉体のコントロー
ル温度と実際の炉芯管内部の温度差が問題となっていた
。Contamination of the furnace core tube by outgas from the heater has been a problem in the above-mentioned part of the heater and the furnace core tube. Furthermore, with conventional methods of temperature control, there was a problem with the difference between the controlled temperature of the furnace body and the actual temperature inside the furnace core tube.
上述した従来の炉芯管を用い、熱処理を行なう半導体の
製造装置の温度コントロール方式に比べ、本発明は、炉
芯管を二重にする構造として、その中に組み込み成熱電
対を入れ、窒素ガスにて置換するという相違点を有する
。Compared to the above-mentioned temperature control system for semiconductor manufacturing equipment that uses a conventional furnace core tube to perform heat treatment, the present invention has a structure in which the furnace core tube is doubled, a thermocouple is built into it, and nitrogen The difference is that replacement is performed with gas.
本発明の構成は炉芯管を用い、ヒータ一部で熱処理を行
う半導体製造装置において、前記炉芯管2を二重構造と
して、外側の炉芯管部に熱電対を挿入し、汚染防止策と
して炉芯管に窒素ガスを流す事を特徴とし温度コントロ
ールにおいてもより炉芯管に近付は温度を安定させる事
を特徴とする。The structure of the present invention is a semiconductor manufacturing apparatus that uses a furnace core tube and performs heat treatment in a part of the heater, in which the furnace core tube 2 has a double structure, a thermocouple is inserted into the outer furnace core tube part, and a contamination prevention measure is taken. It is characterized by flowing nitrogen gas through the furnace core tube, and its temperature control is characterized by stabilizing the temperature closer to the furnace core tube.
第1図は、本発明の一実施例で半導体装置の製造装置の
断面図である。同図において、本製造装置は本考案炉芯
管3aが二重炉芯管となっており、外側部は窒素ガス導
入管4aにより窒素ガスに置換された状態になっており
、温度のコントロール用熱電対は組み込み成熱電対6a
により制御されている。組み込み成熱電対6aも石英ガ
ラス管に組み込まれた状態の為、外部雰囲気にも影響を
受けずらい構造となっている。本発明の炉芯管3aの固
定はヒータ一部1に対して均熱管2の上に炉芯管3&を
乗せ断熱材7をつめ込み固定する。FIG. 1 is a sectional view of a semiconductor device manufacturing apparatus according to an embodiment of the present invention. In the same figure, in this manufacturing apparatus, the furnace core tube 3a of the present invention is a double furnace core tube, and the outer part is in a state where nitrogen gas is substituted by a nitrogen gas introduction tube 4a, and the furnace core tube 3a of the present invention is replaced with nitrogen gas, which is used for temperature control. The thermocouple is a built-in thermocouple 6a
controlled by. Since the built-in thermocouple 6a is also built into the quartz glass tube, the structure is not easily affected by the external atmosphere. The furnace core tube 3a of the present invention is fixed by placing the furnace core tube 3 & on top of the soaking tube 2 with respect to the heater part 1 and filling the heat insulating material 7 with it.
第2図は、本発明の他の実施例で半導体製造装置の断面
図である。炉芯管4bはヒータ一部1と断熱材7とによ
り固定され、炉芯管内部を真空状態にする為に、フロン
トハツチ板9、それに真空排気管8より構成されている
。温度フントロールについては組み込み成熱電対6bに
より安定しており、炉芯管の汚染防止として、窒素ガス
導入管4bより窒素ガスを導入、置換し、炉芯管の汚染
防止が出来る利点がある。FIG. 2 is a sectional view of a semiconductor manufacturing apparatus according to another embodiment of the present invention. The furnace core tube 4b is fixed by a heater part 1 and a heat insulating material 7, and is composed of a front hatch plate 9 and an evacuation pipe 8 in order to create a vacuum inside the furnace core tube. The temperature control is stabilized by the built-in thermocouple 6b, and there is an advantage that nitrogen gas can be introduced and replaced through the nitrogen gas introduction pipe 4b to prevent contamination of the furnace core tube.
以上説明した様に、本発明は炉芯管を用いて熱処理を行
う半導体製造装置において、ヒータ一部よりの炉芯管の
汚染を少なく出来、炉体の温度コントロールもよつ炉芯
管内部温度に近づける効果がある。As explained above, the present invention can reduce contamination of the furnace core tube from a part of the heater in semiconductor manufacturing equipment that performs heat treatment using a furnace core tube, and can also control the temperature of the furnace body. It has the effect of bringing it closer to
第1図は本発明の第1の実施例の半導体装置の製造装置
を示す断面図、第2図は本発明の第2の実施例の半導体
装置の製造装置を示す断面図、第3図は従来の姥例を示
す断面図である。
1・・・・・・ヒータ一部、2・・・・・・均熱管、3
a・・・・・・炉芯管、3b・・・・・・炉芯管、3C
・・・・・・従来炉芯管、4a・・・・・・窒素ガス導
入管、4b・・・・・・窒素ガス導入管、5・・・・・
・プロセスガス導入管、6a・・・・・・熱電対、6b
・・・・・・熱電対、6C・・・・・・熱電対、7・・
・・・・ヒータ一部断熱材、8・・・・・・真空排気管
。
代理人 弁理士 内 原 晋
/θ
フロントハツチ砿FIG. 1 is a cross-sectional view showing a semiconductor device manufacturing apparatus according to a first embodiment of the present invention, FIG. 2 is a cross-sectional view showing a semiconductor device manufacturing apparatus according to a second embodiment of the present invention, and FIG. It is a sectional view showing a conventional example. 1... Part of the heater, 2... Soaking tube, 3
a...Furnace core tube, 3b...Furnace core tube, 3C
...Conventional furnace core tube, 4a...Nitrogen gas introduction pipe, 4b...Nitrogen gas introduction pipe, 5...
・Process gas introduction pipe, 6a...Thermocouple, 6b
...Thermocouple, 6C...Thermocouple, 7...
... Heater part insulation material, 8 ... Vacuum exhaust pipe. Agent: Susumu Uchihara / θ Fronthatsushi, Patent Attorney
Claims (1)
ウェハーを処理する炉芯管を二重構造として、外側炉芯
管に温度コントロール熱電対を入れ、窒素ガスにてパー
ジする事を特徴とする半導体製造装置。In semiconductor manufacturing equipment that uses a furnace core tube and performs heat treatment,
Semiconductor manufacturing equipment characterized by having a double structure furnace core tube for processing wafers, a temperature control thermocouple inserted into the outer furnace core tube, and purging with nitrogen gas.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19043288A JPH0239425A (en) | 1988-07-28 | 1988-07-28 | Apparatus for manufacturing semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19043288A JPH0239425A (en) | 1988-07-28 | 1988-07-28 | Apparatus for manufacturing semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0239425A true JPH0239425A (en) | 1990-02-08 |
Family
ID=16258035
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19043288A Pending JPH0239425A (en) | 1988-07-28 | 1988-07-28 | Apparatus for manufacturing semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0239425A (en) |
-
1988
- 1988-07-28 JP JP19043288A patent/JPH0239425A/en active Pending
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