Nothing Special   »   [go: up one dir, main page]

JPH0982719A - Method of flux transfer to electrode, manufacture of bump, and manufacturing equipment - Google Patents

Method of flux transfer to electrode, manufacture of bump, and manufacturing equipment

Info

Publication number
JPH0982719A
JPH0982719A JP8181004A JP18100496A JPH0982719A JP H0982719 A JPH0982719 A JP H0982719A JP 8181004 A JP8181004 A JP 8181004A JP 18100496 A JP18100496 A JP 18100496A JP H0982719 A JPH0982719 A JP H0982719A
Authority
JP
Japan
Prior art keywords
flux
electrode
substrate
electrodes
transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8181004A
Other languages
Japanese (ja)
Other versions
JP3540901B2 (en
Inventor
Kenji Shimokawa
健二 下川
Hideji Hashino
英児 橋野
Kohei Tatsumi
宏平 巽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP18100496A priority Critical patent/JP3540901B2/en
Publication of JPH0982719A publication Critical patent/JPH0982719A/en
Application granted granted Critical
Publication of JP3540901B2 publication Critical patent/JP3540901B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/11334Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3478Applying solder preforms; Transferring prefabricated solder patterns
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3489Composition of fluxes; Methods of application thereof; Other methods of activating the contact surfaces

Landscapes

  • Manufacturing Of Electrical Connectors (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To definitely transfer flux only to an electrode by dipping the tip portion of a projection from a transfer substrate in a flux bath, sticking the flux to the tip portion, thereafter positioning the tip portion of the projection to the electrode, and transferring the flux to the electrode of the transfer target. SOLUTION: A flux transfer substrate 11 is lowered and only the tip portion of a projection 12 of the transfer substrate 11 is dipped in flux 22. The substrate 11 is lowered toward an electrode 32, and flux 23 stuck to it transferred to an electrode pad 23. Each eutectic solder ball 51 is aligned with the position of each electrode pad 32 on which the flux was transferred. Balls 51 are pressed by an array substrate 41. The substrate 31 is conveyed to a furnace, solder balls 51 are heated and melted being heated to above the melting point of the solder balls 51, thereafter, the flux is washed and a solder bump 52 is formed. By doing this, the sticking of flux to the array substrate and the dropping of fine metal balls from the array substrate can be prevented.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は電極へのフラックス
転写方法、低融点合金または金属よりなる微細バンプの
製造方法ならびにこれらの製造装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for transferring a flux onto an electrode, a method for producing a fine bump made of a low melting point alloy or a metal, and an apparatus for producing these.

【0002】[0002]

【従来の技術】携帯型情報機器や携帯ビデオカメラ等の
普及に伴い、小型の半導体パッケージが求められてい
る。LSIの高性能化に伴い電極数も増加傾向にある。
このような小型でかつ多端子の実装を実現する方法とし
ては、狭ピッチの基板電極に直接チップを搭載するフリ
ップチップがある。また、端子の配置を周辺配置から面
配置にすることにより、極端な狭ピッチ化をせず多端子
化するBGA(ボールグリッドアレイ)やCSP(チッ
プサイズパッケージ)が開発されている。
2. Description of the Related Art With the widespread use of portable information devices, portable video cameras and the like, there is a demand for small semiconductor packages. The number of electrodes tends to increase as the performance of LSIs increases.
As a method for realizing such a small size and multi-terminal mounting, there is a flip chip in which a chip is directly mounted on a substrate electrode having a narrow pitch. In addition, BGA (ball grid array) and CSP (chip size package) have been developed in which the terminals are arranged from the peripheral arrangement to the surface arrangement and the number of terminals is increased without extremely narrowing the pitch.

【0003】上記のいずれの場合においても、半田等の
低融点合金あるいは金属よりなる接続端子(バンプ)を
基板等の電極に形成する必要がある。半田等の低融点合
金あるいは金属よりなるボールを用いてバンプを形成す
る方法は有力なバンプ形成法である。ボールよりバンプ
を形成する際には、電極との接合を十分確保するために
電極にフラックスを転写しボールを仮固定した後、ボー
ルをその融点以上の温度で加熱溶融して電極に接合させ
る必要がある。
In any of the above cases, it is necessary to form a connection terminal (bump) made of a low melting point alloy such as solder or a metal on an electrode such as a substrate. A method of forming bumps using balls made of a low melting point alloy such as solder or metal is an effective bump forming method. When forming bumps from balls, it is necessary to transfer the flux to the electrodes and temporarily fix the balls to ensure sufficient bonding with the electrodes, and then heat and melt the balls at a temperature above their melting point to bond them to the electrodes. There is.

【0004】しかしながら、フラックスが電極以外の部
分にも転写されていると、加熱溶融時にボールが電極か
ら流れ落ちてしまうという問題があった。これは、電極
部のみにフラックスを転写することで回避できる。すな
わち、米国特許5,284,287明細書には以下の方
法が開示されている。500〜700μm径の半田を配
列基板で保持し、ボールを保持したまま配列基板をフラ
ックスの充填されたフラックス浴上に移動し、配列基板
を押し下げていきそこに保持したボールの一部分をフラ
ックス中に浸し、そこにフラックスを付着させる。次
に、フラックスを付着させたボールを配列基板から基板
電極に押圧して仮固定する。したがって、フラックスは
ボールが仮固定されている電極のみへ供給されている。
この仮固定したボールを加熱溶融しても電極からのボー
ルの流れ落ちはない。
However, if the flux is transferred to a portion other than the electrode, there is a problem that the balls may flow down from the electrode during heating and melting. This can be avoided by transferring the flux only to the electrode part. That is, US Pat. No. 5,284,287 discloses the following method. Solder having a diameter of 500 to 700 μm is held by the array substrate, the array substrate is moved to a flux bath filled with flux while holding the balls, the array substrate is pushed down, and a part of the balls held there is placed in the flux. Dip and apply flux to it. Next, the balls to which the flux is attached are pressed from the array substrate to the substrate electrodes to be temporarily fixed. Therefore, the flux is supplied only to the electrodes on which the balls are temporarily fixed.
Even if this temporarily fixed ball is heated and melted, the ball does not flow down from the electrode.

【0005】[0005]

【発明が解決しようとする課題】上記の電極のみにフラ
ックスを転写する方法は、ボールの直径が500μm未
満になると困難になる。すなわち、ボールが小さくなる
とボールを保持する配列基板とフラックスへ浸すボール
の先端部分までの距離が短くなり、フラックス浴にボー
ルを浸した時に配列基板にもフラックスが付着してしま
うという問題がある。配列基板へのフラックスの付着は
次回のボール保持の際に、その部分へのボールの付着の
可能性があり電極へのバンプ形成の信頼性低下の原因と
なる。さらに、ボール径が小さくなるとボールの一部分
のみに制御性良くフラックスを付着させるのが困難にな
ってくる。すなわち、ボールにフラックスが付きすぎる
と、その粘着力によって配列基板からボールがフラック
ス浴中に脱落してしまう。
The method of transferring the flux only to the electrodes described above becomes difficult when the diameter of the ball is less than 500 μm. That is, as the balls become smaller, the distance between the array substrate holding the balls and the tip of the balls dipped in the flux becomes shorter, and there is a problem that the flux adheres to the array substrate when the balls are dipped in the flux bath. When the balls are held next time, the adhesion of the flux to the array substrate may cause the adhesion of the balls to that portion, which causes a decrease in the reliability of bump formation on the electrodes. Further, if the ball diameter becomes smaller, it becomes difficult to attach the flux to only a part of the ball with good controllability. That is, if too much flux is attached to the balls, the balls will fall from the array substrate into the flux bath due to the adhesive force.

【0006】本発明は、直径が500μm未満のボール
で基板等の電極にバンプを形成する方法において、電極
部のみに確実にフラックスを転写する方法、それを用い
たバンプの製造方法およびそれらを実現する製造装置を
提供するものである。
The present invention is a method of forming a bump on an electrode of a substrate or the like with a ball having a diameter of less than 500 μm, a method of reliably transferring a flux only to an electrode portion, a method of manufacturing a bump using the same, and realizing them. A manufacturing apparatus for

【0007】[0007]

【課題を解決するための手段】上記の課題を解決するた
めに本発明は、電極に対応する突起を有する転写基板の
突起先端部分をフラックス浴に浸して、フラックスをそ
の先端部に付着させ、しかる後、突起先端部と電極の位
置合わせを行い、その後、転写対象の電極にそのフラッ
クスを転写する方法を提供する。また、本発明は上記の
方法で電極にフラックスを転写し、しかる後、低融点合
金または金属よりなる微細金属ボールを電極に対応させ
て配列基板に一括して保持し、しかる後、配列基板に保
持した微細金属ボールとフラックスを転写した電極との
位置合わせを行ってから、微細金属ボールをフラックス
を転写した電極に押圧して一括仮固定し、しかる後、仮
固定した微細金属ボールをその融点以上の温度で加熱溶
融して電極に半田を接合することを特徴とする電極上へ
の低融点合金または金属よりなる微細金属バンプの製造
方法を提供する。
In order to solve the above-mentioned problems, according to the present invention, the protrusion tip portion of a transfer substrate having a protrusion corresponding to an electrode is dipped in a flux bath to attach the flux to the tip portion. After that, a method of aligning the tip of the protrusion with the electrode and then transferring the flux to the electrode to be transferred is provided. Further, the present invention transfers the flux to the electrode by the above method, and then holds the fine metal balls made of a low melting point alloy or metal collectively on the array substrate corresponding to the electrode, and then on the array substrate. After aligning the held fine metal balls with the flux-transferred electrodes, press the fine metal balls against the flux-transferred electrodes to temporarily temporarily fix them. Provided is a method for manufacturing a fine metal bump made of a low melting point alloy or metal on an electrode, which is characterized by heating and melting at the above temperature to bond solder to the electrode.

【0008】さらに、本発明は、突起を有する転写基板
と、前記転写基板の突起先端部にフラックスを付着させ
る機構と、前記突起先端部と前記電極の位置合わせを行
う機構と、前記付着させたフラックスを前記電極に転写
する機構とで構成されることを特徴とする半導体チッ
プ、フィルムキャリア、あるいは基板の電極へのフラッ
クス転写装置を提供する。また、前記電極へのフラック
ス転写装置と、低融点合金または金属よりなる微細金属
ボールを前記電極に対応させて配列基板に一括して保持
する機構と、前記配列基板に保持した前記微細金属ボー
ルと前記電極の位置合わせを行う機構と、前記微細金属
ボールを前記電極に押圧して一括仮固定する機構とを有
することを特徴とする微細金属バンプの製造装置を提供
するものである。
Further, according to the present invention, a transfer substrate having protrusions, a mechanism for adhering flux to the protrusion tips of the transfer substrate, a mechanism for aligning the protrusion tips with the electrodes, and the attachment are made. Provided is a flux transfer device for transferring an electrode of a semiconductor chip, a film carrier, or a substrate, which comprises a mechanism for transferring flux to the electrode. Further, a flux transfer device to the electrode, a mechanism for collectively holding the fine metal balls made of a low melting point alloy or metal on the array substrate corresponding to the electrodes, and the fine metal balls held on the array substrate. An apparatus for manufacturing fine metal bumps, comprising: a mechanism for aligning the electrodes, and a mechanism for pressing the fine metal balls against the electrodes to temporarily temporarily fix them.

【0009】[0009]

【発明の実施の形態】本発明では基板電極に対応する突
起を有する転写基板を使用する。前記転写基板の突起先
端部をフラックス浴に浸し、フラックスを突起先端部に
付着させ、その先端部と電極の位置を合わせた後、転写
対象の電極にそのフラックスを転写する。なお、本発明
は500μm未満の径のボールを対象としたものである
が、それ以上の径のボール(例えば760μm)に対し
ても有効に適用することができる。
BEST MODE FOR CARRYING OUT THE INVENTION In the present invention, a transfer substrate having protrusions corresponding to substrate electrodes is used. The tip of the protrusion of the transfer substrate is dipped in a flux bath, the flux is attached to the tip of the protrusion, the tip is aligned with the electrode, and then the flux is transferred to the electrode to be transferred. The present invention is intended for balls having a diameter of less than 500 μm, but can be effectively applied to balls having a diameter larger than that (for example, 760 μm).

【0010】突起の構造としては種々のものが考えられ
るが、その先端部分には電極を覆うのに必要かつ十分量
のフラックスが付着する必要がある。したがって、突起
先端付近の断面積は電極パッドと同等であるのが望まし
い。また、フラックス浴に容易にその先端のみを浸すた
めに、その高さは図1(a)に示すように200μm以
上、望ましくは500μm以上が必要である。転写基板
の突起先端部の形状は平坦であっても良いし曲率を持っ
ても良い。
Although various structures can be considered as the structure of the projection, it is necessary to attach a sufficient amount of flux to the tip of the projection to cover the electrode. Therefore, it is desirable that the cross-sectional area near the tip of the protrusion is the same as that of the electrode pad. Further, in order to easily immerse only the tip in the flux bath, its height needs to be 200 μm or more, preferably 500 μm or more, as shown in FIG. The shape of the tip of the protrusion of the transfer substrate may be flat or may have a curvature.

【0011】フラックス転写基板の材質としては突起状
構造が形成できれば何でも良く、ガラス等のセラミック
ス、ステンレス等の金属あるいはプラスチック等で作製
できる。フラックスを転写する電極が形成されている対
象は、半導体チップ、フィルムキャリアあるいは基板等
である。ここで基板とはガラスエポキシ、ガラス、セラ
ミックス等よりなるプリント基板あるいはポリイミド等
よりなるフレキシブル基板等のいずれでも良い。微細バ
ンプの材料としては種々の組成の半田や融点が400℃
以下の、いわゆる、低融点合金あるいは金属が使用でき
る。
Any material can be used as the material of the flux transfer substrate as long as it can form a protrusion structure, and it can be made of ceramics such as glass, metal such as stainless steel, or plastic. The target on which the electrode for transferring the flux is formed is a semiconductor chip, a film carrier, a substrate, or the like. Here, the substrate may be a printed circuit board made of glass epoxy, glass, ceramics or the like, or a flexible board made of polyimide or the like. As the material for the fine bumps, solders of various compositions and melting points of 400 ° C
The following so-called low melting point alloys or metals can be used.

【0012】本発明によるフラックスの転写装置は上記
の転写方法を実現するために以下の機構を基本として構
成される。 1.電極に対応した位置にフラックスを転写するための
突起を有する転写基板。 2.フラックス浴に転写基板の突起の先端部分のみを浸
す機構。 3.画像処理等によって転写基板の突起の先端部分と電
極の位置を認識し、両者の位置を一致させる機構。 4.突起の先端部にフラックスを付着させた転写基板
を、電極の位置に移動してフラックスを電極に転写する
機構。
The flux transfer apparatus according to the present invention is basically constructed by the following mechanism in order to realize the above transfer method. 1. A transfer substrate having protrusions for transferring flux at positions corresponding to the electrodes. 2. A mechanism to immerse only the tip of the protrusion on the transfer substrate in the flux bath. 3. A mechanism that recognizes the position of the tip of the protrusion on the transfer substrate and the position of the electrode by image processing, and matches the positions of both. 4. A mechanism that transfers the flux to the electrode by moving the transfer substrate with the flux attached to the tip of the protrusion to the position of the electrode.

【0013】ここで突起状12の転写基板11を保持す
る転写ヘッド61には、図2(a)に示すように弾性体
62よりなる平行化機構を付け加えることもできる。こ
の場合、基板等のフラックスを塗布すべき対象の平行度
が悪くても、図2(b)に示すように転写ヘッド61で
対象物63に対する平行度を取ることができ、均一な量
のフラックスを塗布することができる。ここで弾性体は
ばねでも良いし、ゴムのような高分子材料等でも良い。
Here, as shown in FIG. 2A, a parallelizing mechanism made of an elastic body 62 may be added to the transfer head 61 which holds the transfer substrate 11 having the projections 12. In this case, even if the parallelism of the object such as the substrate to which the flux is applied is poor, the parallelism with respect to the object 63 can be obtained by the transfer head 61 as shown in FIG. Can be applied. Here, the elastic body may be a spring or a polymer material such as rubber.

【0014】また、何度もフラックスを塗布している
と、転写基板11の突起12の先端部分にフラックスが
固着してしまう場合がある。このような時は、フラック
スを溶かす溶媒よりなる浴を設けておき、転写基板先端
部分をそこに浸して固着フラックスを除去することがで
きる。この際、溶媒に超音波を印加しておくと除去効率
が高まる。
If the flux is applied many times, the flux may adhere to the tip portions of the protrusions 12 on the transfer substrate 11. In such a case, a bath made of a solvent that dissolves the flux may be provided, and the tip portion of the transfer substrate may be immersed therein to remove the adhered flux. At this time, if ultrasonic waves are applied to the solvent, the removal efficiency increases.

【0015】本発明による半導体製造装置は上記のバン
プ製造方法を実現するために以下の機構を基本として構
成される。 1.上記のフラックスを電極のみに転写する転写装置。 2.微細金属ボールを搭載容器から、吸引力、静電気
力、あるいは磁気力等により配列基板の電極に対応した
位置に一括して保持する機構。 3.画像処理等によって配列基板に保持した微細金属ボ
ールと電極の位置を認識し、両者を一致させる機構。 4.支持台上に設置した半導体チップ、フィルムキャリ
ア、あるいは基板の電極に、配列基板に保持した微細金
属ボールを、フラックスの転写された電極に配列基板で
微細金属ボールを押圧し一括して仮固定する機構。
The semiconductor manufacturing apparatus according to the present invention is basically configured with the following mechanism to realize the above bump manufacturing method. 1. A transfer device that transfers the above flux only to the electrodes. 2. A mechanism to collectively hold the fine metal balls from the mounting container at a position corresponding to the electrodes on the array substrate by suction, electrostatic force, magnetic force, or the like. 3. A mechanism that recognizes the positions of the fine metal balls and electrodes held on the array substrate by image processing, and matches them. 4. The semiconductor chip, film carrier, or substrate electrode set on the support is used to temporarily fix the metal balls held by the array substrate to the electrodes on which the flux has been transferred. mechanism.

【0016】ここで、上下に転写基板を移動する転写装
置は、同じく上下に配列基板を移動する押圧して仮固定
する機構に付属しても良いし、独立であっても良い。両
者を独立に稼働させた場合、装置のスループットが向上
して生産性が上がる。また、ボールを電極に転写する際
は、配列基板が電極の位置まで移動しても良いし、電極
を持つ半導体チップ等を配列基板の位置まで移動しても
良い。上記の機構の他に、半導体チップ、フィルムキャ
リア、あるいは基板の搬送入機構を付設しても良い。ま
た、転写装置とバンプ製造装置の画像認識等は共用する
ことができる。さらに、支持台上に設置した半導体チッ
プ、フィルムキャリア、あるいは基板の加熱機構等を付
設しておけば、微細金属ボールの溶融を炉等に搬送せず
に本製造装置上で実行できる。
Here, the transfer device for moving the transfer substrate up and down may be attached to a mechanism for moving the array substrate up and down and temporarily fixing it, or may be an independent device. When both are operated independently, the throughput of the device is improved and the productivity is increased. Further, when the balls are transferred to the electrodes, the array substrate may be moved to the position of the electrodes, or a semiconductor chip having an electrode or the like may be moved to the position of the array substrate. In addition to the above-mentioned mechanism, a semiconductor chip, a film carrier, or a substrate carrying-in mechanism may be additionally provided. Further, the image recognition and the like of the transfer device and the bump manufacturing device can be shared. Further, if a semiconductor chip, a film carrier, a substrate heating mechanism, or the like installed on the support table is additionally provided, the melting of the fine metal balls can be performed on the present manufacturing apparatus without being conveyed to a furnace or the like.

【0017】扱う微細金属ボールが小さくなると、静電
気等で転写すべきボール以外の余分なボールが配列基板
やそれに保持されたボールに付着する場合がある。この
傾向はボール径が300μm以下になると現れやすく、
特にその径が150μm以下で著しくなる。このような
場合は本半導体製造装置の配列基板を保持する配列ヘッ
ドに、特開平7−226425号公報に開示されている
ような超音波振動による余分ボール除去機構を加えるこ
とによって、余分ボールを回避することができる。
When the fine metal balls to be handled become small, extra balls other than the balls to be transferred due to static electricity may adhere to the array substrate or the balls held by the array substrate. This tendency tends to appear when the ball diameter is 300 μm or less,
In particular, it becomes remarkable when the diameter is 150 μm or less. In such a case, extra balls are avoided by adding an extra ball removing mechanism by ultrasonic vibration to the array head that holds the array substrate of the present semiconductor manufacturing apparatus, as disclosed in JP-A-7-226425. can do.

【0018】[0018]

【実施例】本発明による電極部のみへのフラックス転写
方法、ならびにこれを用いた微細バンプの製造方法につ
いて図面に基づき詳細に説明する。図1の(a)〜
(j)は本発明による電極部分のみへのフラックス転写
方法とそれを使用した半田バンプの製造方法を示してい
る。転写対象のガラスエポキシよりなるプリント基板上
には350ケの電極が形成されている。1つの電極パッ
ドは50μm角の四角形よりなる。350ケの電極パッ
ドは100μmピッチの間隔で形成されている。共晶半
田ボール(Sn60wt%、Pb40wt%、融点188
℃、直径45μm)を用いてバンプを製造する。電極部
分のみフラックスを転写するには基板電極と同じ位置に
突起を有するフラックス転写基板を使用する。本実施例
ではこのフラックス転写基板はガラスを用いて作製され
ている。突起構造は断面直径が50μmで高さが500
μmの円柱状の形態をしている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A flux transfer method to only an electrode portion according to the present invention and a fine bump manufacturing method using the same will be described in detail with reference to the drawings. (A) of FIG.
(J) shows a flux transfer method only to the electrode portion according to the present invention and a solder bump manufacturing method using the flux transfer method. 350 electrodes are formed on a printed circuit board made of glass epoxy to be transferred. One electrode pad consists of a square of 50 μm square. The 350 electrode pads are formed at intervals of 100 μm pitch. Eutectic solder ball (Sn 60wt%, Pb 40wt%, melting point 188
The bumps are manufactured by using C. and a diameter of 45 μm). To transfer the flux only to the electrode part, a flux transfer substrate having a protrusion at the same position as the substrate electrode is used. In this embodiment, this flux transfer substrate is made of glass. The protrusion structure has a cross-sectional diameter of 50 μm and a height of 500.
It has a cylindrical shape of μm.

【0019】以下に、図に示した順に電極へのフラック
ス転写方法とその電極上への微細ボールバンプの製造方
法を述べる。 (a)フラックス転写基板11をフラックス22を充填
したフラックス浴21の上に移動させる。 (b)フラックス転写基板11をフラックス22に向か
って下降させ、転写基板11の突起12の先端部のみを
フラックス22に浸す。 (c)転写基板11を引き上げ突起12の先端部のみに
フラックス23を付着させる。 (d)転写基板11を基板31の電極部32の上まで移
動させ、突起12の先端部と電極パッド32の位置合わ
せを行う。 (e)転写基板11を電極32に向かって降下させ、電
極パッド32にフラックス23を接触させる。 (f)先端に付着したフラックス23を電極パッド32
に転写し転写基板11を退避させる。 (g)共晶半田ボール51を電極に対応したボール径よ
りも小さい孔42が開けてある配列基板41で一括して
吸引して保持した後、ボール51とフラックス24を転
写した電極パッド32の位置を合わせる。 (h)配列基板41をプリント基板31に向かって下降
させ配列基板41でボール51を押圧する。 (i)ボール51をフラックス24の転写された電極に
一括して仮固定し配列基板41を退避させる。 (j)ボール51が電極32に仮固定された基板31を
炉に搬送し、半田ボール51の融点以上の200℃で加
熱溶融し、その後、フラックスを洗浄すると基板電極部
分と十分に接合した微細な半田バンプ52を形成でき
る。
The method of transferring flux to the electrodes and the method of manufacturing fine ball bumps on the electrodes will be described below in the order shown in the figure. (A) The flux transfer substrate 11 is moved onto the flux bath 21 filled with the flux 22. (B) Flux The transfer substrate 11 is lowered toward the flux 22, and only the tips of the protrusions 12 of the transfer substrate 11 are immersed in the flux 22. (C) The transfer substrate 11 is pulled up, and the flux 23 is attached only to the tips of the protrusions 12. (D) The transfer substrate 11 is moved to a position above the electrode portion 32 of the substrate 31, and the tip end portion of the protrusion 12 and the electrode pad 32 are aligned. (E) The transfer substrate 11 is lowered toward the electrode 32, and the flux 23 is brought into contact with the electrode pad 32. (F) The flux 23 attached to the tip is attached to the electrode pad 32.
And the transfer substrate 11 is retracted. (G) After the eutectic solder balls 51 are collectively sucked and held by the array substrate 41 having the holes 42 smaller than the ball diameter corresponding to the electrodes, the balls 51 and the electrode pads 32 on which the flux 24 is transferred. Adjust the position. (H) The array substrate 41 is lowered toward the printed circuit board 31, and the array substrate 41 presses the balls 51. (I) The balls 51 are temporarily temporarily fixed to the electrodes on which the flux 24 has been transferred, and the array substrate 41 is retracted. (J) The substrate 31 in which the balls 51 are temporarily fixed to the electrodes 32 is conveyed to a furnace and is heated and melted at 200 ° C. which is higher than the melting point of the solder balls 51, and then the flux is washed to obtain a fine bond sufficiently bonded to the substrate electrode portion. The solder bumps 52 can be formed.

【0020】[0020]

【発明の効果】以上、説明したように本発明によれば、
フラックスを使用して500μm未満の微細金属ボール
を電極に接合して微細バンプを製造する際に、配列基板
へのフラックスの付着や配列基板からの微細金属ボール
の脱落を防止できる。フラックスを確実に転写した電極
上には、低融点合金あるいは金属よりなる微細金属ボー
ルを使用して微細バンプを製造できる。このような微細
バンプを接続させた半導体チップ、フィルムキャリア、
あるいは基板を用いれば面積の極めて小さな電子部品を
高い生産性で実装できる。
As described above, according to the present invention,
It is possible to prevent the adhesion of the flux to the array substrate and the detachment of the fine metal balls from the array substrate when manufacturing the fine bumps by bonding the fine metal balls of less than 500 μm to the electrodes using the flux. Fine bumps can be manufactured by using fine metal balls made of a low melting point alloy or a metal on the electrodes to which the flux is reliably transferred. A semiconductor chip, a film carrier, to which such fine bumps are connected,
Alternatively, if a substrate is used, an electronic component having an extremely small area can be mounted with high productivity.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のフラックスの転写工程((a)〜
(f))とバンプ製造工程((g)〜(j))を模式的
に示す図。
FIG. 1 is a step of transferring a flux of the present invention ((a) to
FIG. 3F is a diagram schematically showing (f)) and bump manufacturing steps ((g) to (j)).

【図2】本発明の突起状の転写基板を保持する転写ヘッ
ドの弾性体による平行化機構を示す図。
FIG. 2 is a diagram showing a parallelization mechanism by an elastic body of a transfer head that holds a protrusion-shaped transfer substrate of the present invention.

【符号の説明】[Explanation of symbols]

11 フラックス転写基板 12 突起構造 21 フラックス浴 22 フラックス 23 突起に付着したフラックス 24 電極に転写したフラックス 31 プリント基板 32 電極パッド 41 配列基板 42 吸着孔 51 低融点金属あるいは合金ボール 52 低融点金属あるいは合金バンプ 61 転写ヘッド 62 弾性体 63 フラックス塗布対象物 11 Flux Transfer Substrate 12 Protrusion Structure 21 Flux Bath 22 Flux 23 Flux Attached to Protrusion 24 Flux Transferred to Electrode 31 Printed Circuit Board 32 Electrode Pad 41 Array Substrate 42 Adsorption Hole 51 Low Melting Point Metal or Alloy Ball 52 Low Melting Point Metal or Alloy Bump 61 Transfer head 62 Elastic body 63 Flux application target

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/92 604H ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Office reference number FI technical display location H01L 21/92 604H

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 半導体チップ、フィルムキャリア、ある
いは基板の電極に、フラックスを転写装置により転写す
る方法であって、前記転写装置を構成する転写基板は前
記電極に対応する突起を有し、前記転写基板の突起の先
端部分をフラックス浴に浸して、フラックスを前記先端
部に付着させ、しかる後、前記転写基板の突起と前記電
極の位置合わせを行い、しかる後、前記付着させたフラ
ックスを前記電極に転写することを特徴とする電極への
フラックスの転写方法。
1. A method for transferring a flux to an electrode of a semiconductor chip, a film carrier, or a substrate by a transfer device, wherein a transfer substrate constituting the transfer device has a protrusion corresponding to the electrode, The tip of the protrusion of the substrate is immersed in a flux bath to attach the flux to the tip, and then the protrusion of the transfer substrate and the electrode are aligned, and then the attached flux is applied to the electrode. A method for transferring a flux to an electrode, which comprises transferring the flux to an electrode.
【請求項2】 請求項1記載の方法で半導体チップ、フ
ィルムキャリア、あるいは基板の電極にフラックスを転
写し、しかる後、低融点合金または金属よりなる微細金
属ボールを配列基板に一括して保持し、その後、前記配
列基板に保持した前記微細金属ボールと前記フラックス
を転写した電極との位置合わせを行い、しかる後、前記
配列基板に保持した微細金属ボールを前記フラックスを
転写した電極に押圧して一括仮固定し、しかる後、前記
仮固定した微細金属ボールをその融点以上の温度で加熱
溶融して電極に半田を接合することを特徴とする電極上
への低融点合金または金属よりなる微細金属バンプの製
造方法。
2. The method according to claim 1, wherein the flux is transferred to an electrode of a semiconductor chip, a film carrier, or a substrate, and then fine metal balls made of a low melting point alloy or metal are collectively held on the array substrate. After that, the fine metal balls held on the array substrate and the electrodes on which the flux has been transferred are aligned, and then the fine metal balls held on the array substrate are pressed against the electrodes on which the flux has been transferred. Temporarily fixing all at once, and then heating and melting the temporarily fixed fine metal balls at a temperature equal to or higher than the melting point to join the solder to the electrodes. Fine metal made of a low melting point alloy or metal on the electrodes. Bump manufacturing method.
【請求項3】 突起を有する転写基板と、前記転写基板
の突起先端部にフラックスを付着させる機構と、前記突
起先端部と前記電極の位置合わせを行う機構と、前記付
着させたフラックスを前記電極に転写する機構とで構成
されることを特徴とする半導体チップ、フィルムキャリ
ア、あるいは基板の電極へのフラックス転写装置。
3. A transfer substrate having protrusions, a mechanism for adhering flux to the protrusion tips of the transfer substrate, a mechanism for aligning the protrusion tips with the electrodes, and the attached flux for the electrodes. And a mechanism for transferring the flux to a semiconductor chip, a film carrier, or a flux transfer device to a substrate electrode.
【請求項4】 請求項3記載の電極へのフラックス転写
装置と、低融点合金または金属よりなる微細金属ボール
を前記電極に対応させて配列基板に一括して保持する機
構と、前記配列基板に保持した前記微細金属ボールと前
記電極の位置合わせを行う機構と、前記微細金属ボール
を前記電極に押圧して一括仮固定する機構とを有するこ
とを特徴とする微細金属バンプの製造装置。
4. An apparatus for transferring flux to an electrode according to claim 3, a mechanism for collectively holding fine metal balls made of a low melting point alloy or metal on the array substrate corresponding to the electrodes, and the array substrate. An apparatus for manufacturing fine metal bumps, comprising: a mechanism for aligning the held fine metal balls with the electrodes, and a mechanism for pressing the fine metal balls against the electrodes to temporarily temporarily fix them.
JP18100496A 1995-07-11 1996-07-10 Method of transferring flux to electrode and method of manufacturing bump Expired - Fee Related JP3540901B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18100496A JP3540901B2 (en) 1995-07-11 1996-07-10 Method of transferring flux to electrode and method of manufacturing bump

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP17521895 1995-07-11
JP7-175218 1995-07-11
JP18100496A JP3540901B2 (en) 1995-07-11 1996-07-10 Method of transferring flux to electrode and method of manufacturing bump

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2004015031A Division JP2004119999A (en) 1995-07-11 2004-01-23 Flux transferring device and apparatus for manufacturing fine metal bump

Publications (2)

Publication Number Publication Date
JPH0982719A true JPH0982719A (en) 1997-03-28
JP3540901B2 JP3540901B2 (en) 2004-07-07

Family

ID=26496550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18100496A Expired - Fee Related JP3540901B2 (en) 1995-07-11 1996-07-10 Method of transferring flux to electrode and method of manufacturing bump

Country Status (1)

Country Link
JP (1) JP3540901B2 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998009332A1 (en) * 1996-08-27 1998-03-05 Nippon Steel Corporation Semiconductor device provided with low melting point metal bumps and process for producing same
US6239013B1 (en) * 1998-02-19 2001-05-29 Texas Instruments Incorporated Method for transferring particles from an adhesive sheet to a substrate
WO2006112791A1 (en) * 2005-04-19 2006-10-26 Aurigin Technology Pte Ltd Pins for transferring material
KR100750048B1 (en) * 2000-12-29 2007-08-16 앰코 테크놀로지 코리아 주식회사 Solder Ball Bumping method for manufacturing semiconductor package
JP2014078585A (en) * 2012-10-10 2014-05-01 Ntn Corp Coating unit, coating device and transfer coating method
JP2014166626A (en) * 2013-02-01 2014-09-11 Ntn Corp Application unit, and apparatus and method for application using the same
US10892240B2 (en) 2018-03-20 2021-01-12 Toshiba Memory Corporation Semiconductor fabrication apparatus and semiconductor fabrication method
US20230007787A1 (en) * 2021-06-30 2023-01-05 Samsung Electronics Co., Ltd Flux dotting tool
US20230087608A1 (en) * 2020-03-27 2023-03-23 S.S.P. Inc. Flux tool using elastic pad

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1918991A3 (en) * 1996-08-27 2011-02-16 Nippon Steel Corporation Semiconductor device provided with low melting point metal bumps and process for producing same
US7045389B1 (en) 1996-08-27 2006-05-16 Nippon Steel Corporation Method for fabricating a semiconductor devices provided with low melting point metal bumps
US7045388B2 (en) 1996-08-27 2006-05-16 Nippon Steel Corporation Semiconductor device provided with low melting point metal bumps
WO1998009332A1 (en) * 1996-08-27 1998-03-05 Nippon Steel Corporation Semiconductor device provided with low melting point metal bumps and process for producing same
EP1918991A2 (en) * 1996-08-27 2008-05-07 Nippon Steel Corporation Semiconductor device provided with low melting point metal bumps and process for producing same
US6239013B1 (en) * 1998-02-19 2001-05-29 Texas Instruments Incorporated Method for transferring particles from an adhesive sheet to a substrate
KR100750048B1 (en) * 2000-12-29 2007-08-16 앰코 테크놀로지 코리아 주식회사 Solder Ball Bumping method for manufacturing semiconductor package
US8146793B2 (en) 2005-04-19 2012-04-03 Aurigin Technology Pte. Ltd. Pins for transferring material
WO2006112791A1 (en) * 2005-04-19 2006-10-26 Aurigin Technology Pte Ltd Pins for transferring material
JP2014078585A (en) * 2012-10-10 2014-05-01 Ntn Corp Coating unit, coating device and transfer coating method
JP2014166626A (en) * 2013-02-01 2014-09-11 Ntn Corp Application unit, and apparatus and method for application using the same
US10892240B2 (en) 2018-03-20 2021-01-12 Toshiba Memory Corporation Semiconductor fabrication apparatus and semiconductor fabrication method
US20230087608A1 (en) * 2020-03-27 2023-03-23 S.S.P. Inc. Flux tool using elastic pad
US11850683B2 (en) * 2020-03-27 2023-12-26 S.S.P. Inc. Flux tool using elastic pad
US20230007787A1 (en) * 2021-06-30 2023-01-05 Samsung Electronics Co., Ltd Flux dotting tool
US11818850B2 (en) * 2021-06-30 2023-11-14 Samsung Electronics Co., Ltd. Flux dotting tool

Also Published As

Publication number Publication date
JP3540901B2 (en) 2004-07-07

Similar Documents

Publication Publication Date Title
US5447886A (en) Method for mounting semiconductor chip on circuit board
US5861678A (en) Method and system for attaching semiconductor dice to substrates
US6107122A (en) Direct die contact (DDC) semiconductor package
JP3429953B2 (en) Method and apparatus for manufacturing fine metal bumps
KR19980042766A (en) Method and apparatus for attaching solder member to substrate
CN105938790B (en) Method for manufacturing semiconductor device
KR100592121B1 (en) No-clean flux for flip chip assembly
JP3540901B2 (en) Method of transferring flux to electrode and method of manufacturing bump
JPH04263433A (en) Formation of electric connection contact and manufacture of mounted substrate
JP3770496B2 (en) Method and apparatus for mounting conductive ball
KR100269032B1 (en) Transfer of flux onto the electrode and production of bumps on electrodes
JP2004119999A (en) Flux transferring device and apparatus for manufacturing fine metal bump
JPH04263434A (en) Formation of electric connection contact and manufacture of mounting board
JP4356077B2 (en) Method and apparatus for mounting conductive ball
JP3270813B2 (en) Semiconductor device and manufacturing method thereof
JP5177694B2 (en) Conductive ball mounting device
JPH11317469A (en) Conductive element array sheet and manufacture device thereof
JP4092707B2 (en) Method and apparatus for mounting conductive ball
JP4457354B2 (en) Conductive ball mounting device and alignment member incorporated in conductive ball mounting device
JP4478954B2 (en) Conductive ball mounting device
JPH05235103A (en) Ic mounting method
JP2001244286A (en) Method of forming globular electrode, projecting pole of semiconductor device, and mount substrate
JP4341036B2 (en) Method and apparatus for mounting conductive ball
JP3922768B2 (en) Bump forming method and apparatus
US7235429B2 (en) Conductive block mounting process for electrical connection

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20031125

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040123

A911 Transfer of reconsideration by examiner before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20040205

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20040302

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20040326

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R360 Written notification for declining of transfer of rights

Free format text: JAPANESE INTERMEDIATE CODE: R360

R371 Transfer withdrawn

Free format text: JAPANESE INTERMEDIATE CODE: R371

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090402

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090402

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100402

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110402

Year of fee payment: 7

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110402

Year of fee payment: 7

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120402

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130402

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130402

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140402

Year of fee payment: 10

LAPS Cancellation because of no payment of annual fees