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JPH0898395A - Circuit breaker with open-phase protecting function - Google Patents

Circuit breaker with open-phase protecting function

Info

Publication number
JPH0898395A
JPH0898395A JP6936695A JP6936695A JPH0898395A JP H0898395 A JPH0898395 A JP H0898395A JP 6936695 A JP6936695 A JP 6936695A JP 6936695 A JP6936695 A JP 6936695A JP H0898395 A JPH0898395 A JP H0898395A
Authority
JP
Japan
Prior art keywords
circuit
voltage
phase
detection
open
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6936695A
Other languages
Japanese (ja)
Other versions
JP3319906B2 (en
Inventor
Takeshi Tanaka
毅 田中
Masataka Kanda
雅隆 神田
Hitoshi Makinaga
仁 牧永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP06936695A priority Critical patent/JP3319906B2/en
Publication of JPH0898395A publication Critical patent/JPH0898395A/en
Application granted granted Critical
Publication of JP3319906B2 publication Critical patent/JP3319906B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE: To provide a circuit breaker with open-phase protecting function against which plurality of delay time can be set in a detecting stage and operating time of which can be easily set. CONSTITUTION: An open-phase detecting circuit section A is provided with first and second detection circuits I and II and, when a load voltage exceeds reference voltages Vs1 and Vs2 which are respectively set to the circuit I and II, the charging of the capacitors C3 and C4 of delay circuits 4a and 4b is started. Therefore, two detecting stages are provided and the delay circuit 4b which corresponds to the second detection circuit II set to the higher reference voltage is made to reach the corresponding threshold level Vth4 in a shorter time than the other delay circuit 4a by making the magnitudes of the charging currents to or capacitances of the capacitors C3 and C4 of the circuits 4a and 4b different from each other.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、単相3線式電源相の欠
相を検出した場合に電路を遮断する欠相保護機能付き遮
断器に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit breaker with an open phase protection function, which shuts off an electric circuit when an open phase of a single-phase 3-wire power supply phase is detected.

【0002】[0002]

【従来の技術】従来この種の欠相保護機能付き遮断器に
おいては、負荷側の中性線と各相との間の負荷電圧と、
基準電圧とを比較して、負荷電圧が基準電圧を越えると
電路に挿入してある主接点を開放して電源遮断を行い負
荷を保護している。しかしながら例えば定格電圧の15
0%の電圧と、200%の電圧が印加された場合にも同
一時間で遮断してしまい、近年の家電製品のようにマイ
クロコンピュータを搭載して過電圧耐圧が低下している
ものが負荷の場合、負荷を十分に保護できないという問
題があった。
2. Description of the Related Art Conventionally, in this type of circuit breaker with an open phase protection function, the load voltage between the neutral line on the load side and each phase,
When the load voltage exceeds the reference voltage by comparing with the reference voltage, the main contact inserted in the circuit is opened to shut off the power to protect the load. However, for example, the rated voltage of 15
When 0% voltage and 200% voltage are applied, they are cut off at the same time, and the load is the one that the microcomputer is equipped with and the overvoltage withstand voltage is lowered like the recent home appliances. However, there was a problem that the load could not be sufficiently protected.

【0003】そこで、本出願人は、特開平5−2906
85号に示すものを提案している。このものは負荷側の
中性線と各相との間の負荷電圧と基準電圧とを比較して
負荷電圧が基準電圧以上になると一定電流でコンデンサ
を充電してコンデンサの電圧が一定以上に達するまで欠
相検出信号の出力を遅延させる構成を持つものである。
Therefore, the present applicant has filed Japanese Patent Application Laid-Open No. 5-2906.
No. 85 is proposed. This one compares the load voltage between the load side neutral line and each phase with the reference voltage, and when the load voltage exceeds the reference voltage, the capacitor is charged with a constant current and the voltage of the capacitor reaches a certain level or more. The output of the open phase detection signal is delayed until then.

【0004】[0004]

【発明が解決しようとする課題】上記の特開平5−29
0685号に示す従来例は欠相時に負荷にかかる電圧の
値に応じた遅延時間を確保し、保護性能の向上を図った
ものであるが、しかしながら動作時間の設定が困難であ
った。本発明は上記問題点に鑑みて為されたもので、請
求項1の発明の目的とするところは、複数の検出段階を
持ち、各検出段階で遅延時間を設定できる欠相保護機能
付き遮断器を提供するにある。
DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention
In the conventional example shown in No. 0685, the delay time corresponding to the value of the voltage applied to the load at the time of phase loss is secured to improve the protection performance, but it is difficult to set the operation time. The present invention has been made in view of the above problems, and an object of the present invention is to provide a circuit breaker with an open phase protection function, which has a plurality of detection stages and can set a delay time at each detection stage. To provide.

【0005】請求項2の発明の目的とするところは、請
求項1の発明の目的に加えて負荷保護をより確実にした
欠相保護機能付き遮断器を提供するにある。請求項3の
発明の目的とするところは、請求項1又は請求項2の発
明の目的に加えて部品点数を少なくした欠相保護機能付
き遮断器を提供するにある。請求項4の発明の目的とす
るところは、請求項3の発明の目的に加えて、欠相遮断
後、欠相状態のまま再投入され際に即欠相検出が行えて
負荷保護が図れる欠相保護機能付き遮断器を提供するに
ある。
An object of the invention of claim 2 is to provide a circuit breaker with an open-phase protection function, which is more reliable than the object of the invention of claim 1 and has more reliable load protection. The object of the invention of claim 3 is to provide a circuit breaker with an open phase protection function in which the number of parts is reduced in addition to the object of the invention of claim 1 or claim 2. The object of the invention of claim 4 is, in addition to the object of the invention of claim 3, is that a missing phase can be detected immediately after the open phase is shut off and the load can be protected when the power is turned on again. It is to provide a circuit breaker with a phase protection function.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に請求項1の発明では、負荷側の中性線と各相との間の
負荷電圧と基準電圧とを比較して負荷電圧が基準電圧以
上になると欠相を検出する検出回路と、この検出回路が
欠相検出すると検出回路からの一定電流でコンデンサを
充電してコンデンサの電圧が一定以上に達するまで欠相
検出信号の出力を遅延させる遅延回路とを有した欠相検
出手段と、この欠相検出手段から出力される欠相検出信
号にてオンするスイッチ手段と、このスイッチ手段で励
磁される主接点の引外しコイルとを備え、引外しコイル
の励磁によって電路に挿入された主接点を開放する欠相
保護機能付き遮断器において、上記欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
たものである。
In order to achieve the above object, the invention of claim 1 compares the load voltage between the neutral wire on the load side and each phase with the reference voltage, and the load voltage is the reference. When the voltage exceeds the voltage, the detection circuit detects the open phase, and when this detection circuit detects the open phase, the capacitor is charged with a constant current from the detection circuit and the output of the open phase detection signal is delayed until the voltage of the capacitor reaches a certain level or higher. And a switch circuit that is turned on by a phase loss detection signal output from the phase loss detection means, and a trip coil of a main contact excited by the switch means. , In the circuit breaker with open-phase protection function that opens the main contact inserted in the circuit by the excitation of the trip coil, the open-phase detection means have different reference voltages, and are broken when the load voltage exceeds the reference voltage. Detect phase That those having at least two detection circuits.

【0007】請求項2の発明では、請求項1の発明にお
いて、前記検出回路の少なくとも一つに、基準電圧以上
の負荷電圧が検出されると、当該検出回路からの一定電
流とともに前記コンデンサへ負荷電圧に応じた電流を流
す充電制御手段を備えたものである。請求項3の発明で
は、前記遅延回路は、各検出回路に対して共通とし、各
検出回路が欠相検出すると夫々に対応して一定電流で共
通のコンデンサを充電するものである。
According to a second aspect of the present invention, in the first aspect of the present invention, when a load voltage higher than a reference voltage is detected in at least one of the detection circuits, a load is applied to the capacitor together with a constant current from the detection circuit. It is provided with a charge control means for supplying a current according to the voltage. According to the invention of claim 3, the delay circuit is common to each detection circuit, and when each detection circuit detects a phase loss, a common capacitor is charged with a constant current corresponding to each.

【0008】請求項4の発明では、基準電圧が高い方の
検出回路の基準電圧を電源投入時から一定率で上昇させ
て定常値に達するまでの時間を、他方の検出回路の基準
電圧が定常値に達するまでの時間よりも遅くしたもので
ある。
According to the present invention, the reference voltage of the detection circuit having the higher reference voltage rises at a constant rate from when the power is turned on until it reaches the steady value, and the reference voltage of the other detection circuit becomes steady. It is slower than the time to reach the value.

【0009】[0009]

【作用】請求項1の発明によれば、欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
ているので、複数の検出段階を持つことができ、各検出
段階で遅延時間を設定することが可能となる。
According to the invention of claim 1, the open-phase detecting means has at least two detection circuits each having a different reference voltage and detecting the open-phase when the load voltage exceeds the reference voltage. It is possible to have a plurality of detection stages, and it becomes possible to set a delay time at each detection stage.

【0010】請求項2の発明によれば、請求項1又は請
求項2の発明において、前記検出回路の少なくとも一つ
に、所定電圧以上の負荷電圧が検出されると、前記遅延
回路からの一定電流とともに前記コンデンサへ負荷電圧
に応じた電流を流す充電制御手段を備えたものであるか
ら、負荷電圧が所定電圧以上になるとコンデンサの充電
を早めることができて、負荷保護をより確実なものとす
ることができる。
According to the invention of claim 2, in the invention of claim 1 or 2, when a load voltage of a predetermined voltage or more is detected in at least one of the detection circuits, a constant voltage from the delay circuit is detected. Since the device is provided with a charging control means for supplying a current according to the load voltage to the capacitor together with the current, the charging of the capacitor can be accelerated when the load voltage becomes equal to or higher than a predetermined voltage, and the load protection can be made more reliable. can do.

【0011】請求項3の発明によれば、遅延回路は、各
検出回路が夫々の基準電圧以上になると各検出回路から
一定電流で共通のコンデンサを充電するので、遅延回路
を共通化できて回路部品の点数を削減できる。請求項4
の発明によれば、請求項3の発明において、基準電圧が
高い方の検出回路の基準電圧を電源投入時から一定率で
上昇させて定常値に達するまでの時間を、他方の検出回
路の基準電圧が定常値に達するまでの時間よりも遅くし
たので、定常時において基準電圧の高い方の検出回路が
電源投入時には他方の検出開路が欠相を検出するタイミ
ングよりも早い時期で欠相を検出することが可能とあん
り、そのため欠相状態で電源が投入された場合にあって
も、即時に欠相検出が行えて速やかに負荷保護が図れ、
特に欠相遮断後、欠相原因が除去されないまま再投入さ
れた場合にも確実に負荷保護が図れる。
According to the third aspect of the present invention, the delay circuit charges the common capacitor with a constant current from each detection circuit when each detection circuit becomes higher than the respective reference voltage. The number of parts can be reduced. Claim 4
According to the invention of claim 3, in the invention of claim 3, the time until the reference voltage of the detection circuit having the higher reference voltage is increased from the power-on at a constant rate to reach a steady value is the reference of the other detection circuit. Since the voltage is slower than the time it takes to reach the steady value, the detection circuit with the higher reference voltage detects the open phase earlier than the timing when the other detection open circuit detects the open phase when the power is turned on in the steady state. Therefore, even if the power is turned on in the open phase state, the open phase can be detected immediately and the load can be protected immediately.
In particular, even after the interruption of the open phase, the load can be surely protected even if the cause of the open phase is not turned off and then the power is turned on again.

【0012】[0012]

【実施例】以下、本発明の実施例を図面を参照して説明
する。 (実施例1)図2は本発明の基本となる回路構成を示し
ており、単相3線の各電路L1 ,L 2 及び中性線路Nに
は主接点S1 を夫々挿入してある。一点鎖線の枠で囲ま
れた部分は中性欠相保護回路を示しており、この保護回
路内では電路L1 ,L2 がダイオードDBにより全波整
流されて欠相検出回路部Aの端子、間に入力し、ま
た中性線路Nからの検出線Lnは、電路L1 ,L2 間に
接続した抵抗R1 、R 2 (=R1 )の分圧点に接続さ
れ、この分圧点は更に抵抗R3 を通じて欠相検出回路部
1の検出端子に接続してある。
Embodiments of the present invention will now be described with reference to the drawings.
To do. (Embodiment 1) FIG. 2 shows a basic circuit configuration of the present invention.
And each single-phase three-wire electric circuit L1, L 2And on the neutral line N
Is the main contact S1Are inserted respectively. Surrounded by a dashed-dotted frame
The part indicated by the broken line shows the neutral phase loss protection circuit.
Electric line L in the road1, L2Is full-wave rectified by diode DB
Input to the terminal of the open-phase detection circuit section A,
The detection line Ln from the neutral line N is1, L2Between
Connected resistance R1, R 2(= R1) Connected to the dividing point
This voltage division point is the resistance R3Through open phase detection circuit
1 is connected to the detection terminal.

【0013】検出端子の電圧は電源及び負荷が正常に
接続されている場合には振幅の揃った脈流電圧が現れる
ことになるが、中性線路Nが断線して欠相が生じると、
1相、L2 相の負荷による分圧比によって交互に大小
となる脈流電圧になり、この端子の電位が所定レベル
を越えると欠相検出回路部Aで欠相検出が行われて欠相
検出信号が出力端子より出力され、この欠相検出信号
でスイッチング手段であるサイリスタSCRをオンさ
せ、上記の引外しコイルCLに励磁電流を流して主接点
1 の開放を行い、負荷保護を図るのである。尚ZNR
1 …はサージ吸収素子である。
As for the voltage of the detection terminal, a pulsating current voltage having a uniform amplitude appears when the power source and the load are normally connected. However, when the neutral line N is disconnected and a phase loss occurs,
The pulsating voltage becomes large and small alternately due to the voltage division ratio due to the load of the L 1 phase and the L 2 phase, and when the potential of this terminal exceeds a predetermined level, the open phase detection circuit section A detects the open phase and the open phase occurs. A detection signal is output from the output terminal, and the thyristor SCR that is switching means is turned on by this open-phase detection signal, and an exciting current is passed through the trip coil CL to open the main contact S 1 to protect the load. Of. ZNR
1 is a surge absorbing element.

【0014】ここで、本実施例における欠相検出回路部
Aは図1に示すように構成してある。つまり端子は定
電圧回路1の入力端に、端子はグランドに接続され、
ダイオードブリッジDBからの脈流電圧を一定電圧の直
流に変換して欠相検出回路部Aの各回路への動作電源を
得ている。
Here, the open phase detection circuit portion A in this embodiment is constructed as shown in FIG. In other words, the terminal is connected to the input terminal of the constant voltage circuit 1, the terminal is connected to the ground,
The pulsating current voltage from the diode bridge DB is converted into a direct current of a constant voltage to obtain an operating power source for each circuit of the open phase detection circuit section A.

【0015】検出端子は、比較器2a,2bの非反転
端子に夫々接続され、検出端子の電圧が比較器2a,
2bの反転端子に印加してある基準電圧Vs1 ,Vs2
と比較されるようになっている。比較器2a,2bは波
形整形回路3a,3bとで、夫々第1、第2の検出回路
I,IIを構成しており、欠相が生じて検出端子に図3
(a)に示すような脈流電圧が現れ、比較器2a或いは
比較器2bの基準電圧Vs1 或いはVs2 以上になる
と、比較器2a或いは2bよりその期間中検出出力が発
生する。
The detection terminals are connected to the non-inverting terminals of the comparators 2a and 2b, respectively, and the voltage at the detection terminals is equal to that of the comparators 2a and 2b.
Reference voltages Vs 1 and Vs 2 applied to the inverting terminal of 2b
Is being compared with. The comparators 2a and 2b and the waveform shaping circuits 3a and 3b constitute first and second detection circuits I and II, respectively.
When the pulsating current voltage as shown in (a) appears and becomes equal to or higher than the reference voltage Vs 1 or Vs 2 of the comparator 2a or 2b, the comparator 2a or 2b produces a detection output during that period.

【0016】波形整形回路3a(或いは3b)は図5に
示すように構成されており、比較器2a(或いは2b)
の出力が”H”になると、コンデンサC1 (或いは
2 )の電荷をノットゲートを介して放電し、負荷電圧
が基準電圧Vs1 或いはVs2 以下になって比較器2a
(或いは2b)の出力が”L”になると定電流源20に
よりコンデンサC1 (或いはC2 )を図3(b)或いは
(c)に示すように充電する。そしてこの電圧が波形整
形回路3a(或いは3b)内の比較器21のスレッショ
ルドレベルVth1 (或いはVth2 )を越えた場合に
比較器21より”L”出力が発生し、以下時には”H”
出力が発生する。ここでコンデンサC1 (或いはC2
の充電がスレッショルドレベルVth1 (或いはVth
2 )を越えるには少なくとも交流電源周波数の3サイク
ル以上、負荷電圧が基準電圧Vs1 或いはVs2 以下を
継続することが必要となるように設定している。
The waveform shaping circuit 3a (or 3b) is constructed as shown in FIG. 5, and the comparator 2a (or 2b).
When the output of the capacitor becomes "H", the electric charge of the capacitor C 1 (or C 2 ) is discharged through the knot gate, the load voltage becomes the reference voltage Vs 1 or Vs 2 or less, and the comparator 2a.
When the output of (or 2b) becomes "L", the constant current source 20 charges the capacitor C 1 (or C 2 ) as shown in FIG. 3 (b) or (c). When this voltage exceeds the threshold level Vth 1 (or Vth 2 ) of the comparator 21 in the waveform shaping circuit 3a (or 3b), the comparator 21 outputs "L", and in the following case, "H".
Output is generated. Where capacitor C 1 (or C 2 )
Is charged at the threshold level Vth 1 (or Vth
In order to exceed 2 ), the load voltage must be kept below the reference voltage Vs 1 or Vs 2 for at least 3 cycles of the frequency of the AC power supply.

【0017】波形整形回路3a,3bの出力は夫々遅延
回路4a,4bに接続されており、この波形整形回路3
a,3bの比較器21の”H”出力を受けて遅延回路4
a,4bは図3(d)(e)に示すように夫々に設けて
あるコンデンサC3 ,C4 を定電流で充電するようにな
っている。つまり図5に示すように遅延回路4a(或い
は4b)は比較器21の出力が”H”になると、コンデ
ンサC3 (或いはC4)を定電流源22により一定電流
で充電する。このコンデンサC3 ,C4 の電圧は比較器
5a,5bで、スレッショルドレベルVth3 ,Vth
4 と比較されるようになっており、このスレッショルド
レベルVth3 ,Vth4 をコンデンサC3 ,C4 の電
圧が越えたえたときに比較器5a,5bから”H”信号
を出力する。
The outputs of the waveform shaping circuits 3a and 3b are connected to the delay circuits 4a and 4b, respectively.
The delay circuit 4 receives the "H" output of the comparators 21a and 32b.
As shown in FIGS. 3 (d) and 3 (e), a and 4b are configured to charge the capacitors C 3 and C 4 respectively provided with a constant current. That delay circuit 4a (or 4b) as shown in FIG. 5 comes to output "H" of the comparator 21, is charged with a constant current by the capacitor C 3 (or C 4) a constant current source 22. The voltages of the capacitors C 3 and C 4 are supplied to the comparators 5a and 5b, and the threshold levels Vth 3 and Vth
4 is adapted to be compared, and outputs a signal "H" from the comparator 5a, 5b when the threshold level Vth 3, Vth 4 is the voltage of the capacitor C 3, C 4 and withstand exceeded.

【0018】比較器5a,5bの出力はオアゲート6を
介して出力回路7に入力しており、出力回路7は何れか
の比較器5a,5bの出力が”H”になると、欠相検出
信号を図3(f)に示すように出力端子より出力す
る。このように本実施例では第1、第2の検出回路I、
IIを備え、夫々において設定してある基準電圧Vs1
Vs2 を負荷電圧が越えたときに、遅延回路4a,4b
におけるコンデンサC3 ,C4 の充電を開始するもの
で、複数(実施例では2)の検出段階を持ち、また夫々
に対応する遅延回路4a、4bのコンデンサC 3 ,C4
に対する充電電流の大きさ或いはコンデンサの容量を異
ならせ、高い基準電圧を設定している側の第2の検出回
路に対応する遅延回路4bの方が充電開始から短い時間
でスレッショルドレベルVth3 に達するようにしてあ
る。従って負荷電圧が高い場合には短時間で欠相検出信
号が発生し、速やかに負荷保護が図れ、逆に負荷電圧が
低い場合には欠相検出信号が発生するまでの時間が長く
して、一過性による動作等を防いで信頼性を高めてい
る。
The outputs of the comparators 5a and 5b are supplied to the OR gate 6.
Is input to the output circuit 7 via any of the output circuits 7.
When the outputs of the comparators 5a and 5b of “H” become “H”, open phase detection
Output the signal from the output terminal as shown in Fig. 3 (f).
It As described above, in this embodiment, the first and second detection circuits I,
II, and the reference voltage Vs set in each1
Vs2Delay voltage 4a, 4b when the load voltage exceeds
Capacitor C in3, CFourTo start charging
And has a plurality of detection stages (2 in the embodiment), and
C of the delay circuits 4a and 4b corresponding to 3, CFour
The charging current or the capacity of the capacitor
Normalize, the second detection time on the side where the high reference voltage is set
The delay circuit 4b corresponding to the road has a shorter time from the start of charging.
At threshold level Vth3To reach
It Therefore, if the load voltage is high, the open phase detection signal
Occurs, load protection can be achieved quickly, and conversely the load voltage
If it is low, it takes a long time to generate the open-phase detection signal.
In order to improve reliability by preventing transient operations, etc.
It

【0019】図4は本実施例における保護領域を示して
おり、X1 は第1の検出回路I、X 2 は第2の検出回路
IIの保護領域を示す。 (実施例2)上記実施例1の欠相検出回路部Aでは第
1、第2の検出回路に対応して遅延回路4a,4bを設
けたが、本実施例では図6に示すように遅延回路4a,
4bを共通化して一つの遅延回路4と、比較器5とで欠
相検出信号の遅延を行い、回路部品数の低減を図ってい
る。
FIG. 4 shows the protected area in this embodiment.
Cage, X1Is the first detection circuit I, X 2Is the second detection circuit
The protected area of II is shown. (Embodiment 2) In the open phase detection circuit section A of Embodiment 1,
Delay circuits 4a and 4b are provided corresponding to the first and second detection circuits.
However, in this embodiment, as shown in FIG. 6, the delay circuit 4a,
4b is shared and one delay circuit 4 and comparator 5 are omitted.
The phase detection signal is delayed to reduce the number of circuit components.
It

【0020】つまり本実施例では波形整形回路3a,3
bの出力を遅延回路4が受けてコンデンサC5 を充電す
るようになっており、第1の検出回路I側の波形整形回
路3aの出力を受けて図7(d)に示すように遅延回路
4はコンデンサC5 の充電を開始し、その後第2の検出
回路II側の検出レベルを越えたとき波形整形回路3bの
出力を受けて充電電流を増加させ、コンデンサC5 を充
電するのである。この場合遅延回路4には各波形成形回
路3a,3bに対応する定電流源22を備え、その電流
を加算するようになっている。
That is, in this embodiment, the waveform shaping circuits 3a, 3
The delay circuit 4 receives the output of b to charge the capacitor C 5 , and receives the output of the waveform shaping circuit 3a on the side of the first detection circuit I to delay the delay circuit as shown in FIG. 7 (d). 4 starts charging the capacitor C 5 , and thereafter, when the detection level on the second detection circuit II side is exceeded, receives the output of the waveform shaping circuit 3b to increase the charging current and charges the capacitor C 5 . In this case, the delay circuit 4 is provided with a constant current source 22 corresponding to each of the waveform shaping circuits 3a and 3b, and the currents thereof are added.

【0021】そして第2の検出回路II側の波形整形回路
3bの出力を受けると、コンデンサC5 の充電電圧の上
昇が速くなり、その分比較器5のスレッショルドレベル
Vth5 を越えるまでの時間が短縮され、図7(e)に
示す出力回路7からの欠相検出信号の出力されるまでの
時間が早くなる。尚第1、第2の検出回路I、IIの動作
は実施例1と同様に動作するもので、図7(a)は検出
端子の電圧と、比較器2a,2bの基準電圧Vs1
Vs2 との関係を示し、図7(b)(c)は、図3
(b)(c)と同様に夫々波形整形回路3a,3bの動
作状態の波形を示している。
When the output of the waveform shaping circuit 3b on the second detection circuit II side is received, the charging voltage of the capacitor C 5 rises faster, and the time until it exceeds the threshold level Vth 5 of the comparator 5 is correspondingly increased. The time is shortened and the time until the output of the open phase detection signal from the output circuit 7 shown in FIG. The operation of the first and second detection circuits I and II is similar to that of the first embodiment. FIG. 7A shows the voltage of the detection terminal and the reference voltage Vs 1 of the comparators 2a and 2b.
FIG. 7B and FIG. 7C show the relationship with Vs 2 .
Similar to (b) and (c), the waveforms of the operating states of the waveform shaping circuits 3a and 3b are shown.

【0022】図8は本実施例における保護領域を示して
おり、X1 は第1の検出回路I、X 2 は第2の検出回路
IIの保護領域を示す。 (実施例3)本実施例の欠相検出回路部Aは実施例1の
回路構成を基本とするとともに、図9に示すように負荷
電圧が基準電圧Vs1 以上となったときに行われる図1
0(d)に示す定電流I1 による遅延回路4aのコンデ
ンサC3 の充電に加え、負荷電圧の大きさに対応した電
流I2 を図10(e)に示すようにコンデンサC3 に流
して充電する電圧−電流変換回路8を第1の検出回路I
に付設したものである。
FIG. 8 shows the protected area in this embodiment.
Cage, X1Is the first detection circuit I, X 2Is the second detection circuit
The protected area of II is shown. (Third Embodiment) The open-phase detection circuit section A of this embodiment is the same as that of the first embodiment.
Based on the circuit configuration, as shown in Fig. 9, load
Voltage is reference voltage Vs1Figure 1 performed when the above
Constant current I shown in 0 (d)1Delay circuit 4a
Sensor C3In addition to charging the
Flow I2As shown in FIG.3Flow
The voltage-current conversion circuit 8 that is charged by charging the first detection circuit I
It was attached to.

【0023】つまり本実施例では比較器2aの基準電圧
Vs1 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZを電圧−電流変換回路8の入力側に接続して負
荷電圧がツエナー電圧を越えると、このツエナーダイオ
ードDZを介して入力される電圧の大きさに応じた電流
2 を図10(e)に示すように遅延回路4aのコンデ
ンサC3 に流して充電するのである。
That is, in this embodiment, when a zener diode DZ having a zener voltage equal to the reference voltage Vs 1 of the comparator 2a is connected to the input side of the voltage-current conversion circuit 8 and the load voltage exceeds the zener voltage, The current I 2 according to the magnitude of the voltage input via the Zener diode DZ is supplied to the capacitor C 3 of the delay circuit 4a for charging as shown in FIG. 10 (e).

【0024】従って、図10(a)に示す負荷電圧のレ
ベルが高くなると、それに対応してコンデンサC3 を充
電する充電電流が増大して、図10(f)に示すコンデ
ンサC3 の電圧の上昇が早くなって、比較器2aのスレ
ッショルドレベルVth3 に達するまでの時間が短縮さ
れる。つまり負荷電圧に応じて遅延動作時間を可変する
ことができるのである。
Therefore, when the level of the load voltage shown in FIG. 10A becomes higher, the charging current for charging the capacitor C 3 correspondingly increases, and the voltage of the capacitor C 3 shown in FIG. The rising speed is shortened, and the time required to reach the threshold level Vth 3 of the comparator 2a is shortened. That is, the delay operation time can be changed according to the load voltage.

【0025】尚第2の検出回路II側の動作は実施例1に
準じており、図10(g)に示す遅延回路4bのコンデ
ンサC4 の充電電圧は比較器5bでスレッショルドレベ
ルVth4 と比較される。比較器5a,5bの出力はオ
アゲート6を通じて出力回路7に入り、出力回路7は比
較器5a,5bの何れかの出力が”H”になったときに
図10(h)に示す欠相検出信号を出力する。
The operation on the second detection circuit II side is in accordance with the first embodiment, and the charging voltage of the capacitor C 4 of the delay circuit 4b shown in FIG. 10 (g) is compared with the threshold level Vth 4 by the comparator 5b. To be done. The outputs of the comparators 5a and 5b enter the output circuit 7 through the OR gate 6, and the output circuit 7 detects the phase loss shown in FIG. 10 (h) when either of the outputs of the comparators 5a and 5b becomes "H". Output a signal.

【0026】尚図10(b)(c)は、図3(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。図11は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路IIの保護領域を示す。 (実施例4)本実施例の欠相検出回路部Aは実施例2の
回路構成に実施例3の回路構成を加えたもので、図12
に示すように負荷電圧が基準電圧Vs1 以上となったと
きに負荷電圧の大きさに対応した図13(e)に示す電
流I2 を遅延回路4のコンデンサC5 に流して充電する
電圧−電流変換回路8を付設したものである。
10 (b) and 10 (c) are shown in FIG. 3 (b).
Similar to (c), the waveforms of the operating states of the waveform shaping circuits 3a and 3b are shown. FIG. 11 shows a protection region in this embodiment, where X 1 is the first detection circuit I and X 2 is the second detection circuit.
2 shows a protection area of the detection circuit II of FIG. (Fourth Embodiment) The open-phase detection circuit portion A of the present embodiment is obtained by adding the circuit configuration of the third embodiment to the circuit configuration of the second embodiment.
When the load voltage becomes equal to or higher than the reference voltage Vs 1 as shown in FIG. 13, the voltage I 2 corresponding to the magnitude of the load voltage and flowing in the capacitor C 5 of the delay circuit 4 to charge the current I 2 − A current conversion circuit 8 is additionally provided.

【0027】つまり本実施例では比較器2aの基準電圧
Vs1 と同じ電圧のツエナー電圧とするツエナーダイオ
ードDZを電圧−電流変換回路8の入力側に接続して負
荷電圧がツエナー電圧を越えると、このツエナーダイオ
ードDZを介して入力される電圧の大きさに応じた電流
2 を図13(e)に示すように遅延回路4のコンデン
サC5 に流して充電するのである。
That is, in this embodiment, when a zener diode DZ having a zener voltage equal to the reference voltage Vs 1 of the comparator 2a is connected to the input side of the voltage-current conversion circuit 8 and the load voltage exceeds the zener voltage, A current I 2 according to the magnitude of the voltage input through the Zener diode DZ is passed through the capacitor C 5 of the delay circuit 4 to charge it as shown in FIG. 13 (e).

【0028】従って、波形整形回路3a,3bの出力を
受けて遅延回路4のコンデンサC5に図13(d)に示
す定電流I1 が流れて充電されるのに加えて図13
(a)に示す負荷電圧のレベルに応じた電流I2 がコン
デンサC5 を充電するため、その分図13(f)に示す
コンデンサC5 の電圧の上昇が早くなり、比較器5のス
レッショルドレベルVth5 に達するまでの時間が短縮
される。つまり負荷電圧に応じて遅延動作時間を可変す
ることができるのである。
Therefore, in addition to receiving the outputs of the waveform shaping circuits 3a and 3b, the capacitor C 5 of the delay circuit 4 is charged by the constant current I 1 shown in FIG.
Since the current I 2 corresponding to the level of the load voltage illustrated in (a) charges the capacitor C 5, increase in the voltage of the capacitor C 5 is faster shown in the-figures 13 (f), the threshold level of the comparator 5 The time to reach Vth 5 is shortened. That is, the delay operation time can be changed according to the load voltage.

【0029】尚第1、第2の検出回路I、IIの動作は実
施例1、2に準じているため、構成及び動作の説明は省
略する。尚図13(b)(c)は、図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図13(g)は出力回路7の欠相検出信号を示
す。
Since the operations of the first and second detection circuits I and II are similar to those of the first and second embodiments, the description of the configuration and operation will be omitted. 13B and 13C show the waveforms of the operation states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3B and 3C, and FIG. Indicates a signal.

【0030】図14は本実施例における保護領域を示し
ており、X1 は第2の検出回路I、X2 は第2の検出回
路IIの保護領域を示す。以上のように構成された本実施
例は実施例2の特徴と実施例3の特徴とを併せ持つこと
になる。 (実施例5)実施例3における電圧−電流変換回路8は
第1の検出回路Iに付設したものであるが、本実施例は
図15に示すように第2の検出回路IIに付設したもので
ある。つまり本実施例では負荷電圧が基準電圧Vs2
上となったときに行われる図16(d)に示す定電流I
1 による遅延回路4bのコンデンサC4 の充電に加え、
基準電圧Vs2 以上の負荷電圧の大きさに対応した電流
2 を図16(e)に示すようにコンデンサC4 に流し
て充電するようにしている。
FIG. 14 shows the protection region in this embodiment, where X 1 is the second detection circuit I and X 2 is the protection region of the second detection circuit II. The present embodiment configured as described above has the characteristics of the second embodiment and the characteristics of the third embodiment. (Fifth Embodiment) The voltage-current conversion circuit 8 in the third embodiment is attached to the first detection circuit I, but this embodiment is attached to the second detection circuit II as shown in FIG. Is. That is, in this embodiment, the constant current I shown in FIG. 16D, which is performed when the load voltage becomes equal to or higher than the reference voltage Vs 2 .
In addition to charging the capacitor C 4 of the delay circuit 4b by 1 ,
The current I 2 corresponding to the magnitude of the load voltage equal to or higher than the reference voltage Vs 2 is supplied to the capacitor C 4 for charging as shown in FIG. 16 (e).

【0031】つまり本実施例では比較器2bの基準電圧
Vs2 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZ’を電圧−電流変換回路8の入力側に接続して
負荷電圧がツエナー電圧を越えると、このツエナーダイ
オードDZ’を介して入力される電圧の大きさに応じた
電流I2 を図16(e)に示すように遅延回路4bのコ
ンデンサC4 に流して充電するのである。
That is, in the present embodiment, a zener diode DZ 'having a zener voltage equal to the reference voltage Vs 2 of the comparator 2b is connected to the input side of the voltage-current conversion circuit 8 and the load voltage exceeds the zener voltage. The current I 2 according to the magnitude of the voltage input through the Zener diode DZ ′ is supplied to the capacitor C 4 of the delay circuit 4b for charging as shown in FIG. 16 (e).

【0032】従って、図16(a)に示す基準電圧Vs
2 以上の負荷電圧が発生すると負荷電圧に応じてコンデ
ンサC4 を充電する充電電流が増大し、図16(g)に
示すコンデンサC4 の電圧の上昇が早くなり、比較器5
bのスレッショルドレベルVth4 に達するまでの時間
が短縮される。つまり負荷電圧に応じて遅延動作時間を
可変することができるのである。
Therefore, the reference voltage Vs shown in FIG.
2 or more and the load voltage is generated increases the charging current for charging the capacitor C 4 in accordance with the load voltage, increase in the voltage of the capacitor C 4 shown in FIG. 16 (g) is fast, the comparator 5
The time required to reach the threshold level Vth 4 of b is shortened. That is, the delay operation time can be changed according to the load voltage.

【0033】尚第2の検出回路I側の動作は実施例1に
準じており、図16(f)に示す遅延回路4aのコンデ
ンサC3 の充電電圧は比較器2aでスレッショルドレベ
ルVth3 と比較される。比較器5a,5bの出力はオ
アゲート6を通じて出力回路7に入り、出力回路7は比
較器5a,5bの何れかの出力が”H”になったときに
図16(h)に示す欠相検出信号を出力する。
The operation on the second detection circuit I side is in accordance with the first embodiment, and the charging voltage of the capacitor C 3 of the delay circuit 4a shown in FIG. 16 (f) is compared with the threshold level Vth 3 by the comparator 2a. To be done. The outputs of the comparators 5a and 5b enter the output circuit 7 through the OR gate 6, and the output circuit 7 detects the open phase shown in FIG. 16 (h) when either of the outputs of the comparators 5a and 5b becomes "H". Output a signal.

【0034】尚図16(b)(c)は、図3(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。図17は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路IIの保護領域を示す。 (実施例6)本実施例の欠相検出回路部Aは実施例2の
回路構成に実施例5の回路構成を加えたもので、図18
に示すように負荷電圧が基準電圧Vs2 以上となったと
きに負荷電圧の大きさに対応した電流I2 を図19
(e)に示すように遅延回路4のコンデンサC5 に流し
て充電する電圧−電流変換回路8を付設したものであ
る。
16 (b) and 16 (c) are shown in FIG. 3 (b).
Similar to (c), the waveforms of the operating states of the waveform shaping circuits 3a and 3b are shown. FIG. 17 shows a protection area in this embodiment, where X 1 is the first detection circuit I and X 2 is the second detection circuit I.
2 shows a protection area of the detection circuit II of FIG. (Embodiment 6) The open-phase detection circuit portion A of this embodiment is obtained by adding the circuit configuration of the fifth embodiment to the circuit configuration of the second embodiment.
As shown in FIG. 19, when the load voltage becomes equal to or higher than the reference voltage Vs 2, the current I 2 corresponding to the magnitude of the load voltage is shown in FIG.
As shown in (e), a voltage-current conversion circuit 8 for charging the capacitor C 5 of the delay circuit 4 by charging it is additionally provided.

【0035】つまり本実施例では比較器2bの基準電圧
Vs2 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZ’を電圧−電流変換回路8の入力側に接続して
負荷電圧がツエナー電圧を越えると、このツエナーダイ
オードDZを介して入力される電圧の大きさに応じた電
流I2 を図19(e)に示すように遅延回路4のコンデ
ンサC5 に流して充電するのである。
That is, in this embodiment, when a zener diode DZ 'having a zener voltage equal to the reference voltage Vs 2 of the comparator 2b is connected to the input side of the voltage-current conversion circuit 8 and the load voltage exceeds the zener voltage. The current I 2 corresponding to the magnitude of the voltage input through the Zener diode DZ is supplied to the capacitor C 5 of the delay circuit 4 to charge it as shown in FIG. 19 (e).

【0036】従って、波形整形回路3a,3bの出力を
受けて遅延回路4のコンデンサC5に図19(d)又は
(f)に示す定電流I1 又I3 が流れて充電されるのに
加えて図19(a)に示す基準電圧Vs2 以上の負荷電
圧に応じた電流I2 がコンデンサC5 を充電するため、
その分図19(g)に示すコンデンサC5 の電圧の上昇
が早くなり、比較器5のスレッショルドレベルVth5
も達するまでの時間が短縮される。つまり負荷電圧に応
じて遅延動作時間を可変することができるのである。
Accordingly, the constant current I 1 or I 3 shown in FIG. 19 (d) or (f) flows through the capacitor C 5 of the delay circuit 4 in response to the outputs of the waveform shaping circuits 3a and 3b to charge it. In addition, since the current I 2 corresponding to the load voltage equal to or higher than the reference voltage Vs 2 shown in FIG. 19A charges the capacitor C 5 ,
As a result, the voltage of the capacitor C 5 shown in FIG. 19 (g) rises faster, and the threshold level Vth 5 of the comparator 5 is increased.
It takes less time to reach. That is, the delay operation time can be changed according to the load voltage.

【0037】尚第1、第2の検出回路I、IIの動作は実
施例1、2に準じているため、構成及び動作の説明は抄
訳する。尚図19(b)(c)は、図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図19(g)は出力回路7の欠相検出信号を示
す。
Since the operations of the first and second detection circuits I and II are the same as those of the first and second embodiments, the description of the structure and operation will be omitted. 19B and 19C show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, similarly to FIGS. 3B and 3C, and FIG. 19G shows the phase loss detection of the output circuit 7. Indicates a signal.

【0038】図20は本実施例における保護領域を示し
ており、X1 は第1の検出回路I、X2 は第2の検出回
路IIの保護領域を示す。以上のように構成された本実施
例は実施例2の特徴と実施例5の特徴とを併せ持つこと
になる。 (実施例7)本実施例の欠相検出回路部Aは実施例5の
構成に図21に示すように比較器2c、波形整形回路3
cからなる第3の検出回路III と、それに対応する遅延
回路4c、比較器5cを加え、オアーゲート6に3入力
のものを使用したものである。
FIG. 20 shows the protection area in this embodiment, where X 1 is the first detection circuit I and X 2 is the second detection circuit II. The present embodiment configured as described above has the characteristics of the second embodiment and the characteristics of the fifth embodiment. (Embodiment 7) The phase loss detection circuit section A of this embodiment has the same structure as that of the embodiment 5 as shown in FIG.
A third detection circuit III composed of c, a delay circuit 4c and a comparator 5c corresponding thereto are added, and an OR gate 6 having three inputs is used.

【0039】つまり第3の検出回路III の比較器2cは
図22(a)に示すように基準電圧Vs3 以上の負荷電
圧が検出端子に入力すると検出出力を発生する。対応
する波形整形回路3cは図22(d)に示すようにコン
デンサC6 の充電、放電を比較器5cの検出出力に応じ
て行い、スレッショルドレベルVth6 をコンデンサC
6 の電圧が越えていない場合に出力を遅延回路4cに与
える。遅延回路4cはこの出力を受けて一定電流でコン
デンサC7 を図22(i)に示すように充電する。比較
器5cはこのコンデンサC7 の電圧がスレッショルドレ
ベルVth7 を越えたときに”H”信号をオアゲート6
に出力するのである。
That is, the comparator 2c of the third detection circuit III generates a detection output when a load voltage equal to or higher than the reference voltage Vs 3 is input to the detection terminal as shown in FIG. 22 (a). The corresponding waveform shaping circuit 3c charges and discharges the capacitor C 6 according to the detection output of the comparator 5c as shown in FIG. 22 (d), and sets the threshold level Vth 6 to the capacitor C 6.
When the voltage of 6 does not exceed, the output is given to the delay circuit 4c. The delay circuit 4c receives this output and charges the capacitor C 7 with a constant current as shown in FIG. 22 (i). Comparator 5c is an OR gate the "H" signal when the voltage of the capacitor C 7 exceeds the threshold level Vth 7 6
Output to.

【0040】つまりこの第3の検出回路III 及び遅延回
路4c、比較器5cの動作は第1、第2の検出回路I,
IIと同様な動作を為すのである。そして比較器2a乃至
5cの何れかから”H”信号が出力すると、出力回路7
は図22(j)に示すように欠相検出信号を出力する。
尚図22(b)(c)は図3(b)(c)と同様に夫々
波形整形回路3a,3bの動作状態の波形を示し、図2
2(e)は波形整形回路3bの出力に対応する遅延回路
4bのコンデンサC4 に流す定電流I1 を示し、図22
(f)は電圧−電流変換回路8によるコンデンサC4
流す電流I2 を示し、また図22(g)(h)は夫々遅
延回路4a,4bのコンデンサC3 ,C4 の電圧を示
す。
That is, the operations of the third detection circuit III, the delay circuit 4c, and the comparator 5c are as follows.
It performs the same operation as II. When the "H" signal is output from any of the comparators 2a to 5c, the output circuit 7
Outputs an open phase detection signal as shown in FIG.
22 (b) and 22 (c) show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3 (b) and 3 (c).
22 (e) shows the constant current I 1 flowing through the capacitor C 4 of the delay circuit 4b corresponding to the output of the waveform shaping circuit 3b, and FIG.
22 (f) shows the current I 2 flowing through the capacitor C 4 by the voltage-current conversion circuit 8, and FIGS. 22 (g) and 22 (h) show the voltages of the capacitors C 3 and C 4 of the delay circuits 4a and 4b, respectively.

【0041】本実施例によれば実施例5の特徴に加えて
検出段階を3段に増やしたもので、動作時間の設定をよ
りやり易くしている。図23は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路II、X3 は第3の検出回路III の保護領域を
示す。 (実施例9)本実施例の欠相検出回路部Aは実施例6の
構成に図24に示すように比較器2c、波形整形回路3
cからなる第3の検出回路III と、それに対応する遅延
回路4c、比較器5cを加えたものである。
According to this embodiment, in addition to the features of the fifth embodiment, the number of detection stages is increased to three, which makes it easier to set the operating time. FIG. 23 shows a protection area in this embodiment, where X 1 is the first detection circuit I and X 2 is the second detection circuit I.
The detection circuits II and X 3 of 3 indicate protection regions of the third detection circuit III. (Ninth Embodiment) The open phase detection circuit section A of this embodiment has the same structure as that of the sixth embodiment as shown in FIG.
A third detection circuit III composed of c, a delay circuit 4c and a comparator 5c corresponding thereto are added.

【0042】この第3の検出回路III の動作は実施例8
と同じものであり、この第3の検出回路III の波形整形
回路3cの出力を受けた遅延回路4は、第1、第2の検
出回路I,IIの波形整形回路3a,3bの出力に対応し
た図25(e)(f)に示す定電流I1 ,I2 による充
電、更に図25(g)に示す電圧−電流変換回路8によ
る電流I3 による充電に加えて、図25(h)に示す定
電流I4 による充電を行い、図25(i)に示すコンデ
ンサC5 の充電電圧の上昇を早め、比較器5のスレッシ
ョルドレベルVth5 を越えるまでの時間を早め、図2
5(j)に示す出力回路7から出力する欠相検出信号を
発生させるまでの遅延時間を可変している。
The operation of the third detection circuit III is the eighth embodiment.
The delay circuit 4 receives the output of the waveform shaping circuit 3c of the third detection circuit III and corresponds to the outputs of the waveform shaping circuits 3a and 3b of the first and second detection circuits I and II. In addition to the charging by the constant currents I 1 and I 2 shown in FIGS. 25 (e) and (f) and the charging by the current I 3 by the voltage-current conversion circuit 8 shown in FIG. 25 (g), FIG. It was charged by constant current I 4 shown in FIG. 25 accelerate the rise of the charging voltage of the capacitor C 5 shown in (i), accelerating the time to exceed the threshold level Vth 5 of comparator 5, FIG. 2
The delay time until the open phase detection signal output from the output circuit 7 shown in FIG. 5 (j) is generated is variable.

【0043】尚図25(a)は検出端子に入力する負
荷電圧を、また図25(b)(c)は図3(b)(c)
と同様に夫々波形整形回路3a,3bの動作状態の波形
を示し、図25(d)は波形整形回路3cの動作状態の
波形を示している。本実施例は実施例6の特徴と実施例
8の特徴を併せ持つものである。 (実施例10)本実施例の欠相検出回路部Aは実施例1
の構成に図26に示すように比較器2c、波形整形回路
3cからなる第3の検出回路III と、それに対応する遅
延回路4c、比較器5cを加え、オアーゲート6に3入
力のものを使用したものである。第3の検出回路III の
動作は実施例8と同じあるからその説明は省略する。
Note that FIG. 25A shows the load voltage input to the detection terminal, and FIGS. 25B and 25C show FIGS. 3B and 3C.
Similarly, the waveforms of the operating states of the waveform shaping circuits 3a and 3b are shown, and FIG. 25D shows the operating state of the waveform shaping circuit 3c. This embodiment has the characteristics of the sixth embodiment and the characteristics of the eighth embodiment. (Embodiment 10) The open phase detection circuit unit A of this embodiment is the same as that of Embodiment 1.
As shown in FIG. 26, a third detection circuit III including a comparator 2c and a waveform shaping circuit 3c, a delay circuit 4c and a comparator 5c corresponding thereto are added to the configuration of FIG. 26, and an OR gate 6 having three inputs is used. It is a thing. Since the operation of the third detection circuit III is the same as that of the eighth embodiment, its explanation is omitted.

【0044】図27(a)は検出端子に入力する負荷
電圧を、また図27(b)(c)は図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図29(d)は波形整形回路3cの動作状態の波
形を示し、図27(e)(f)(g)は夫々遅延回路5
a,5b,5cのコンデンサC3 ,C4 ,C7 を示し、
図27(h)は出力回路7の欠相検出信号を示す。
FIG. 27 (a) shows the load voltage input to the detection terminal, and FIGS. 27 (b) and 27 (c) show the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3 (b) and 3 (c). 29 (d) shows the waveform of the operation state of the waveform shaping circuit 3c, and FIGS. 27 (e) (f) (g) shows the delay circuit 5 respectively.
a, 5b and 5c capacitors C 3 , C 4 and C 7 ,
FIG. 27H shows the open phase detection signal of the output circuit 7.

【0045】而して本実施例では検知段階が3段とな
り、保護領域が図28に示すようになる。尚X1 は第1
の検出回路I、X2 は第2の検出回路II、X3 は第3の
検出回路III の保護領域を示す。 (実施例11)本実施例の欠相検出回路部Aは実施例2
の構成に図29に示すように比較器2c、波形整形回路
3cからなる第3の検出回路III と、それに対応する遅
延回路4c、比較器5cを加え、オアーゲート6に3入
力のものを使用したものである。換言すれば実施例10
における遅延回路と、その後ろの比較器を夫々一つと
し、オアゲートを不要にしたものである。
Thus, in this embodiment, the number of detection stages is three, and the protection area is as shown in FIG. X 1 is the first
Detection circuits I and X 2 of the second detection circuit II and X 3 of the third detection circuit III are protection regions. (Embodiment 11) The open phase detection circuit section A of this embodiment is the same as the embodiment 2.
As shown in FIG. 29, a third detection circuit III including a comparator 2c and a waveform shaping circuit 3c, a delay circuit 4c and a comparator 5c corresponding to the third detection circuit III are added, and an OR gate 6 having three inputs is used. It is a thing. In other words, Example 10
There is one delay circuit and one comparator behind it, eliminating the need for an OR gate.

【0046】尚第3の検出回路III の動作は実施例8と
同じあるからその説明は省略する。而して本実施例では
実施例10に比べて回路部品数が削減できることにな
る。図30(a)は検出端子に入力する負荷電圧を、
また図30(b)(c)は図3(b)(c)と同様に夫
々波形整形回路3a,3bの動作状態の波形を示し、図
30(d)は波形整形回路3cの動作状態の波形を示
し、図30(e)は遅延回路5のコンデンサCを示し、
図30(f)は出力回路7の欠相検出信号を示す。
Since the operation of the third detection circuit III is the same as that of the eighth embodiment, its explanation is omitted. Therefore, in this embodiment, the number of circuit components can be reduced as compared with the tenth embodiment. FIG. 30A shows the load voltage input to the detection terminal as
30B and 30C show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, similarly to FIGS. 3B and 3C, and FIG. 30D shows the operating state of the waveform shaping circuit 3c. FIG. 30 (e) shows the waveform of the capacitor C of the delay circuit 5,
FIG. 30 (f) shows the open phase detection signal of the output circuit 7.

【0047】(実施例12)本実施例の欠相検出回路部
Aの構成は図31に示すように実施例2の構成におい
て、定常時の基準電圧が検出回路Iの比較器2aの定常
時の基準電圧Vs1 よりも高い検出回路IIの比較器2b
では、電源投入から一定率で基準電圧値を上昇させて定
常時の基準電圧Vs2 に達するまでの時間を検出回路I
の比較器2aの基準電圧Vs1 の立ち上がりよりも遅く
している。具体的には端子、の電圧、つまり外部に
両端子間に図2に示すように接続されているコンデ
ンサC0の電圧を抵抗R1 、R2 で分圧し、その分圧電
圧で基準電圧Vs2 を得るようにしたものである。
(Embodiment 12) As shown in FIG. 31, the structure of the open-phase detection circuit section A of this embodiment is the same as that of Embodiment 2 except that the reference voltage in the steady state is the reference voltage of the comparator 2a of the detection circuit I in the steady state. Comparator 2b of the detection circuit II higher than the reference voltage Vs 1 of
Then, the time from when the power is turned on until the reference voltage value is raised at a constant rate to reach the reference voltage Vs 2 in the steady state is detected by the detection circuit I.
Of the reference voltage Vs 1 of the comparator 2a of FIG. Specifically, the voltage of the terminal, that is, the voltage of the capacitor C 0 externally connected between both terminals as shown in FIG. 2, is divided by the resistors R 1 and R 2 , and the reference voltage Vs is obtained by the divided voltage. It is the one to get 2 .

【0048】従って主接点S1 が投入されて電源が供給
されると検出回路Iの比較器2aの基準電圧Vs1 は図
32(a)に示すように即時に立ち上がるが、検出回路
IIの比較器2aの基準電圧Vs2 は外付けのコンデンサ
0 の充電電圧の上昇に伴って一定率で上昇して所定電
圧に達するまでに時間がかかることになる。従って、欠
相が発生している状態で主接点S1 が投入されると、検
出端子の電圧が、比較器2bの基準電圧Vs2 を即越
えて、比較器2bより検出出力が発生する。この検出出
力を受けて図32(d)に示すように遅延回路4はコン
デンサC5 の充電を開始し、その後検出回路I側の波形
整形回路3aの出力を受けて充電電流を増加させ、コン
デンサC5 を充電するのである。
Therefore, when the main contact S 1 is turned on and power is supplied, the reference voltage Vs 1 of the comparator 2a of the detection circuit I immediately rises as shown in FIG.
The reference voltage Vs 2 of the II comparator 2a rises at a constant rate as the charging voltage of the external capacitor C 0 rises, and it takes time to reach a predetermined voltage. Therefore, when the main contact S 1 is turned on while the phase loss occurs, the voltage at the detection terminal immediately exceeds the reference voltage Vs 2 of the comparator 2b, and the detection output is generated from the comparator 2b. Upon receiving this detection output, the delay circuit 4 starts charging the capacitor C 5 as shown in FIG. 32D, and then receives the output of the waveform shaping circuit 3a on the detection circuit I side to increase the charging current and than is to charge the C 5.

【0049】つまり電源投入時から早い時期にコンデン
サC5 の充電電圧が比較器5のスレッショルドレベルV
th5 を越えて図32(e)に示す出力回路7からの欠
相検出信号の出力されるこにになり、欠相状態で主接点
1 が投入された場合には即時に欠相を検出して回路遮
断を行い、速やかに負荷の保護が図れるのである。尚基
準電圧Vs2 が立ち上がってからの欠相発生時の動作は
実施例2と同じであるため、その説明は省略する。
That is, the charging voltage of the capacitor C 5 is the threshold level V of the comparator 5 early after the power is turned on.
th 5 the past becomes the this output phase loss detection signal from the output circuit 7 shown in FIG. 32 (e), the open phase immediately when the main contact point S 1 is being turned in the open phase state The circuit is cut off upon detection, and the load can be promptly protected. Since the operation when the open phase occurs after the reference voltage Vs 2 rises is the same as that of the second embodiment, the description thereof will be omitted.

【0050】尚図32(b)(c)は、図7(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。また図33は本実施例における保
護領域を示しており、X1 は第1の検出回路I、X2
第2の検出回路IIの保護領域を示し、X3 は電源投入時
の第2の検出回路IIの保護領域を示す。
32 (b) and (c) are shown in FIG. 7 (b).
Similar to (c), the waveforms of the operating states of the waveform shaping circuits 3a and 3b are shown. Further, FIG. 33 shows a protection region in this embodiment, where X 1 is the protection region of the first detection circuit I, X 2 is the protection region of the second detection circuit II, and X 3 is the second protection region when the power is turned on. The protection area of the detection circuit II is shown.

【0051】[0051]

【発明の効果】請求項1の発明は、欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
ているので、複数の検出段階を持つことができ、各検出
段階で遅延時間を設定することが可能となるという効果
がある。
According to the invention of claim 1, the open-phase detecting means has at least two detection circuits each having a different reference voltage and detecting the open-phase when the load voltage exceeds the reference voltage. It is possible to have a plurality of detection stages, and it is possible to set a delay time at each detection stage.

【0052】請求項2の発明は、請求項1又は請求項2
の発明において、前記検出回路の少なくとも一つに、所
定電圧以上の負荷電圧が検出されると、前記遅延回路か
らの一定電流とともに前記コンデンサへ負荷電圧に応じ
た電流を流す充電制御手段を備えたものであるから、負
荷電圧が所定電圧以上になるとコンデンサの充電を早め
ることができて、負荷保護をより確実なものとすること
ができる。
The invention of claim 2 is claim 1 or claim 2.
In the invention described above, in at least one of the detection circuits, when a load voltage equal to or higher than a predetermined voltage is detected, a charging control means for flowing a current according to the load voltage to the capacitor together with a constant current from the delay circuit is provided. Therefore, when the load voltage becomes equal to or higher than the predetermined voltage, the capacitor can be charged faster, and the load protection can be made more reliable.

【0053】請求項3の発明は、前記遅延回路を、各検
出回路に対して共通とし、各検出回路が欠相検出すると
夫々に対応して一定電流で共通のコンデンサを充電する
ので、遅延回路を共通化できて回路部品の点数を削減で
きるという効果がある。請求項4の発明は、請求項3の
発明において、基準電圧が高い方の検出回路の基準電圧
を電源投入時から一定率で上昇させて定常値に達するま
での時間を、他方の検出回路の基準電圧が定常値に達す
るまでの時間よりも遅くしたので、定常時において基準
電圧の高い方の検出回路が電源投入時には他方の検出開
路が欠相を検出するタイミングよりも早い時期で欠相を
検出することが可能とあんり、そのため欠相状態で電源
が投入された場合にあっても、即時に欠相検出が行えて
速やかに負荷保護が図れ、特に欠相遮断後、欠相原因が
除去されないまま再投入された場合にも確実に負荷保護
が図れるという効果がある。
According to a third aspect of the invention, the delay circuit is common to each detection circuit, and when each detection circuit detects a phase loss, a common capacitor is charged with a constant current corresponding to each of the detection circuits. This has the effect of making it possible to reduce the number of circuit components. According to a fourth aspect of the invention, in the third aspect of the invention, the time from when the reference voltage of the detection circuit having the higher reference voltage is raised to a steady value after the power is turned on is increased at a constant rate. Since the time required for the reference voltage to reach the steady value was delayed, the open circuit detects the open phase earlier than the timing when the detection circuit with the higher reference voltage detects the open phase when the power is turned on in the steady state. Therefore, even if the power is turned on in the open phase state, the open phase can be detected immediately and the load can be protected promptly.Especially after the open phase cutoff, the cause of the open phase is removed. The effect is that load protection can be surely achieved even if the power is re-applied without being turned on.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1の欠相検出回路部の回路構成
図である。
FIG. 1 is a circuit configuration diagram of a phase loss detection circuit unit according to a first embodiment of the present invention.

【図2】同上の全体の回路構成図である。FIG. 2 is an overall circuit configuration diagram of the same as above.

【図3】同上の動作説明用波形図である。FIG. 3 is a waveform diagram for explaining the operation of the above.

【図4】同上の保護領域説明図である。FIG. 4 is an explanatory diagram of a protection area of the above.

【図5】同上の要部の具体回路図である。FIG. 5 is a specific circuit diagram of a main part of the above.

【図6】本発明の実施例2の欠相検出回路部の回路構成
図である。
FIG. 6 is a circuit configuration diagram of an open phase detection circuit unit according to a second embodiment of the present invention.

【図7】同上の動作説明用波形図である。FIG. 7 is a waveform diagram for explaining the same operation as above.

【図8】同上の保護領域説明図である。FIG. 8 is an explanatory diagram of a protection area of the above.

【図9】本発明の実施例3の欠相検出回路部の回路構成
図である。
FIG. 9 is a circuit configuration diagram of an open phase detection circuit unit according to a third embodiment of the present invention.

【図10】同上の動作説明用波形図である。FIG. 10 is a waveform diagram for explaining the operation of the above.

【図11】同上の保護領域説明図である。FIG. 11 is an explanatory diagram of the above protected area.

【図12】本発明の実施例4の欠相検出回路部の回路構
成図である。
FIG. 12 is a circuit configuration diagram of an open phase detection circuit unit according to a fourth embodiment of the present invention.

【図13】同上の動作説明用波形図である。FIG. 13 is a waveform diagram for explaining the operation of the above.

【図14】同上の保護領域説明図である。FIG. 14 is an explanatory diagram of a protection area of the above.

【図15】本発明の実施例5の欠相検出回路部の回路構
成図である。
FIG. 15 is a circuit configuration diagram of an open phase detection circuit unit according to a fifth embodiment of the present invention.

【図16】同上の動作説明用波形図である。FIG. 16 is a waveform diagram for explaining the operation of the above.

【図17】同上の保護領域説明図である。FIG. 17 is an explanatory diagram of the above protected area.

【図18】本発明の実施例6の欠相検出回路部の回路構
成図である。
FIG. 18 is a circuit configuration diagram of an open phase detection circuit unit according to a sixth embodiment of the present invention.

【図19】同上の動作説明用波形図である。FIG. 19 is a waveform diagram for explaining the same operation as above.

【図20】同上の保護領域説明図である。FIG. 20 is an explanatory diagram of the above protection area.

【図21】本発明の実施例7の欠相検出回路部の回路構
成図である。
FIG. 21 is a circuit configuration diagram of an open phase detection circuit unit according to a seventh embodiment of the present invention.

【図22】同上の動作説明用波形図である。FIG. 22 is a waveform diagram for explaining the operation of the above.

【図23】同上の保護領域説明図である。FIG. 23 is an explanatory diagram of the above protection area.

【図24】本発明の実施例8の欠相検出回路部の回路構
成図である。
FIG. 24 is a circuit configuration diagram of an open phase detection circuit unit according to an eighth embodiment of the present invention.

【図25】同上の動作説明用波形図である。FIG. 25 is a waveform diagram for explaining the same operation as above.

【図26】同上の保護領域説明図である。FIG. 26 is an explanatory diagram of the above protected area.

【図27】本発明の実施例9の欠相検出回路部の回路構
成図である。
FIG. 27 is a circuit configuration diagram of an open-phase detection circuit unit according to a ninth embodiment of the present invention.

【図28】同上の保護領域説明図である。FIG. 28 is an explanatory diagram of a protection area of the above.

【図29】本発明の実施例10の欠相検出回路部の回路
構成図である。
FIG. 29 is a circuit configuration diagram of an open phase detection circuit unit according to the tenth embodiment of the present invention.

【図30】同上の動作説明用波形図である。FIG. 30 is a waveform diagram for explaining the same operation as above.

【図31】本発明の実施例11の欠相検出回路部の回路
構成図である。
FIG. 31 is a circuit configuration diagram of an open phase detection circuit unit according to an eleventh embodiment of the present invention.

【図32】同上の動作説明用波形図である。FIG. 32 is a waveform diagram for explaining the same operation as above.

【図33】同上の保護領域説明図である。FIG. 33 is an explanatory diagram of a protection area of the above.

【符号の説明】[Explanation of symbols]

1 定電圧回路 2a,2b 比較器 3a,3b 波形整形回路 4a,4b 遅延回路 5a,5b 比較器 6 オアゲート 7 出力回路 I,II 検出回路 A 欠相検出回路部 C1 乃至C4 コンデンサ Vs1 ,Vs2 基準電圧 Vth3 スレッショルドレベル1 constant voltage circuit 2a, 2b comparator 3a, 3b waveform shaping circuit 4a, 4b delay circuit 5a, 5b comparator 6 OR gate 7 output circuit I, II detection circuit A open-phase detection circuit section C 1 to C 4 capacitor Vs 1 , Vs 2 reference voltage Vth 3 threshold level

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】負荷側の中性線と各相との間の負荷電圧と
基準電圧とを比較して負荷電圧が基準電圧以上になると
欠相を検出する検出回路と、この検出回路が欠相検出す
ると一定電流でコンデンサを充電してコンデンサの電圧
が一定以上に達するまで欠相検出信号の出力を遅延させ
る遅延回路とを有した欠相検出手段と、この欠相検出手
段から出力される欠相検出信号にてオンするスイッチ手
段と、このスイッチ手段で励磁される主接点の引外しコ
イルとを備え、引外しコイルの励磁によって電路に挿入
された主接点を開放する欠相保護機能付き遮断器におい
て、上記欠相検出手段には夫々異なる基準電圧を持ち負
荷電圧が基準電圧以上となった時に欠相を検出する少な
くとも2つの検出回路を有して成ることを特徴とする欠
相保護機能付き遮断器。
1. A detection circuit for detecting a phase loss when the load voltage between a load-side neutral wire and each phase is compared with a reference voltage and the load voltage becomes equal to or higher than the reference voltage. When the phase is detected, the capacitor is charged with a constant current and the phase loss detecting means having a delay circuit for delaying the output of the phase loss detecting signal until the voltage of the capacitor reaches a certain level or more, and the phase loss detecting means outputs the signal. Equipped with a switch means that turns on when there is an open phase detection signal, and a trip coil for the main contact that is excited by this switch means. With the open phase protection function that opens the main contact that is inserted in the electrical circuit by exciting the trip coil. In the circuit breaker, the open-phase detection means includes at least two detection circuits that have different reference voltages and detect the open-phase when the load voltage exceeds the reference voltage. Shield with function Vessel.
【請求項2】前記検出回路の少なくとも一つに、所定電
圧以上の負荷電圧が検出されると、当該検出回路からの
一定電流とともに前記コンデンサへ負荷電圧に応じた電
流を流す充電制御手段を備えたことを特徴とする欠相保
護機能付き遮断器。
2. When at least one of the detection circuits detects a load voltage equal to or higher than a predetermined voltage, a charging control means for flowing a constant current from the detection circuit and a current according to the load voltage to the capacitor is provided. Circuit breaker with open-phase protection feature.
【請求項3】前記遅延回路は、各検出回路に対して共通
とし、各検出回路が欠相検出すると夫々に対応して一定
電流で共通のコンデンサを充電することを特徴とする請
求項1又は2記載の欠相保護機能付き遮断器。
3. The delay circuit is commonly used for each detection circuit, and when each detection circuit detects a phase loss, a common capacitor is charged with a constant current corresponding to each of the detection circuits. Circuit breaker with the open-phase protection function described in 2.
【請求項4】基準電圧が高い方の検出回路の基準電圧を
電源投入時から一定率で上昇させて定常値に達するまで
の時間を、他方の検出回路の基準電圧が定常値に達する
までの時間よりも遅くしたことを特徴とする請求項3記
載の欠相保護機能付き遮断器。
4. The time required for the reference voltage of the detection circuit having the higher reference voltage to rise to a steady value after the power is turned on at a constant rate until the reference voltage of the other detection circuit reaches the steady value. The circuit breaker with the open-phase protection function according to claim 3, wherein the circuit breaker is delayed from the time.
JP06936695A 1994-07-26 1995-03-28 Circuit breaker with open phase protection Expired - Lifetime JP3319906B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP06936695A JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP17454194 1994-07-26
JP6-174541 1994-07-26
JP06936695A JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Publications (2)

Publication Number Publication Date
JPH0898395A true JPH0898395A (en) 1996-04-12
JP3319906B2 JP3319906B2 (en) 2002-09-03

Family

ID=26410568

Family Applications (1)

Application Number Title Priority Date Filing Date
JP06936695A Expired - Lifetime JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Country Status (1)

Country Link
JP (1) JP3319906B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101021259B1 (en) * 2009-05-20 2011-03-11 김동균 Onen phase relay circuit and open phase warning circuit for three phase motor
JP2014143860A (en) * 2013-01-24 2014-08-07 Furuno Electric Co Ltd Overcurrent protective device and marine electric apparatus with the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101021259B1 (en) * 2009-05-20 2011-03-11 김동균 Onen phase relay circuit and open phase warning circuit for three phase motor
JP2014143860A (en) * 2013-01-24 2014-08-07 Furuno Electric Co Ltd Overcurrent protective device and marine electric apparatus with the same

Also Published As

Publication number Publication date
JP3319906B2 (en) 2002-09-03

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