JPH08189939A - Probing characteristic testing device - Google Patents

Abstract

PURPOSE: To enable a probing characteristic testing device to test a circuit board to be tested even when the circuit board is a finely pitched circuit board by connecting the circuit board to an arbitrary test circuit by moving one or a plurality of probes on the connecting terminal of the circuit board and switching the connection between the connecting terminal and test circuit. CONSTITUTION: One or a plurality of probes 1 fetch or input signals while the probes 1 are moved on the connecting terminal 4 of a circuit board 3 to be tested by means of a moving mechanism 2. A multiplexer 5 which is a switching circuit switches the connecting terminal 4 to its corresponding test circuit 6 and the test circuit 6 performs tests by receiving or sending signals through the probes 1. When the circuit 6 performs the tests, a control circuit 7 successively stores test data and discriminated results on a discriminated-result table 8 by correlating the data and results with pin numbers and, upon completing the tests, output that the circuit board 3 is acceptable when the board 3 is acceptable. When the board 3 is unacceptable, the circuit 7 outputs the pin number, test data, and list of discriminated results.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probing characteristic test device for performing a test by moving a probe over a connection terminal on a circuit board under test.

[0002]

2. Description of the Related Art Conventionally, when testing a large number of pin terminals (connection terminals) on a printed circuit board, if the pin spacing is wide, a jig with pins matching the spacing between these pins is created and used for fixing. The test was conducted by simultaneously bringing the tool into contact with the pin terminals of the printed circuit board to be tested.

[0003]

However, the distance between the pin terminals of the printed circuit board is a fine pitch of 0.3 mm.
If this happens, the thickness of the jig pin and the probe diameter at its tip must be less than this pitch, making it difficult to create. There was a problem that it was difficult to make contact with the terminal.

The present invention solves these problems.
The object of the present invention is to enable a test by sequentially scanning one or a plurality of probes even on a fine pitch circuit board and connecting to any test circuit at any pitch.

[0005]

[Means for Solving the Problems] Means for solving the problems will be described with reference to FIG. In FIG. 1, a probe 1 is one or a plurality of probes, and moves over the connection terminals 4 of the circuit board under test 3 to extract or input a signal.

The moving mechanism 2 moves the probe 1 over the connection terminals 4 of the circuit board 3 under test. The circuit board under test 3 is a circuit board to be tested.

The multiplexer 5 is an example of a switching circuit, and switches a signal from the probe 1 to an arbitrary test circuit 6 or switches a signal from the arbitrary test circuit 6 and supplies the signal to the probe 1. is there.

The test circuit 6 supplies signals from the probe 1 or signals to the probe 1 to perform various tests. The control circuit 7 integrally controls the whole.

The judgment result table 8 stores test data and test results in association with pin numbers.

[0010]

According to the present invention, as shown in FIG.
One or a plurality of probes 1 are moved over the connection terminals 4 on the circuit board under test, and the multiplexer 5, which is a switching circuit, is switched and switched so as to connect the connection terminal 4 and the corresponding test circuit 6. The test circuit 6 receives or sends a signal through one or a plurality of probes 1 to perform a test.

At this time, the control circuit 7 sequentially stores the test result in the judgment result table 8 in association with the pin number and the test data and the judgment result. When failing, failing pin number,
A list of test data and judgment results is output.

In addition, one or a plurality of probes 1 are provided with fine balls or ball bearings at their tips to facilitate movement on the connection terminals 4. Therefore, even a fine-pitch circuit board can be sequentially scanned by one or a plurality of probes 1, and a test can be easily performed on a circuit board under test 3 having connection terminals 4 of any pitch. Becomes

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the operation of the embodiment having the configuration shown in FIG. 1 will be described in detail in the order shown in the flow chart of FIG.

In FIG. 2, S1 inputs the start point coordinates, the probe movement pitch, and the number of pins M. This is because the tester who is going to test the circuit board 3 under test of FIG. 1 selects, from the test screen (not shown), the starting point coordinates of the connection terminal 4 of the circuit board under test 3: : For example, p = 0.33 mm-The number of pins M is input and set.

In step S2, the probe is moved to the start point. This is because the moving mechanism 2 in FIG. 1 moves the probe 1 to the start point coordinates of the connection terminal 4 input in S1, and the pin No. , For example, to the position of m = 1.

S3 is finely adjusted by the optical microscope. In S2, the probe 1 is moved to the set start point by the moving mechanism 2 in S2, but as a precaution, the examiner is moved so that the probe 1 contacts the center of the connection terminal with the optical microscope. If there is a slight deviation, fine adjustment is performed to bring the probe 1 into contact with the center of the connection terminal 4.

S4 is the pin N currently being probed.
o. Initialize m = 1. In S5, the probe and the test circuit are connected by a switch matrix and tested. This is because the multiplexer (switch matrix) 5 in FIG. 1 switches to connect the probe 1 and the test circuit 6 specified by the test data, and then the switched test circuit 6 fetches a signal from the probe 1. , And sends a signal to test the circuit board 3 under test. For example, a test is performed by taking a signal from the probe 1 and measuring the voltage, current, waveform or the like, or sending a signal to the probe 1 and measuring the voltage, current, waveform, etc. at that time. It should be noted that the power supply, the ground line, etc. are supplied by a separately fixed probe or connector, and the signal (test data) is supplied by a fixed probe or connector to the connection terminal 4 that needs to be supplied with a signal. Alternatively, the signal from the connection terminal 4 may be taken out by 1 and tested. This may be arbitrarily selected so that it can be efficiently performed depending on the content of the test data of the circuit board 3 under test. In addition, FIG.
Although only the number of the probes is set, a plurality of the probes 1 may be used, and these may be scanned and brought into contact with the connection terminals 4 at arbitrary positions to perform the test.

S6 is a pin number. m, test data, and individual judgment result are saved. This is as a result of the test in S5. : M ・ Test data ・ Individual judgment result is stored as shown in the judgment result storage table 8 of FIG. 3 described later.

In S7, the probe and the test circuit are opened by the switch matrix. This is because the test is finished in the state where the probe 1 and the test circuit 6 are switched as specified by the test data in the switch matrix in S5.
Release both connections.

S8 is m = M, that is, the current connection terminal 4
And the maximum pin number M to be tested become equal, and it is determined whether the test has been completed for all the connection terminals. In the case of YES, it progresses to S11. In the case of NO, since the test of all the connection terminals 4 has not been completed yet, the process proceeds to S9.

In S9, m = m + 1 is set and the next pin number is set. In S10, the probe is moved by the pitch. In this, the moving mechanism 2 of FIG. 1 moves the probe 1 by the designated pitch (for example, p = 0.33 mm) and positions it at the next connection terminal 4. Then, the process returns to S5 and is repeated.

By the above S1 to S10, the probe 1 is sequentially moved and positioned by the moving mechanism 2 on the designated connection terminal 4 on the circuit board 3 under test in FIG. 1, and in this positioned state, The multiplexer 5 switches and connects the test circuit 6 designated by the test data and the probe 1, and the test circuit 6 takes in a signal from the probe 1 or sends a signal to the probe 1 to perform a test, and the result The above is stored in the judgment result storage table 8 and the measurement is repeated for all the connection terminals 4.

Next, in S11, a comprehensive judgment is made. Comprehensive judgment: ・ Pass / fail judgment.

At S12, the judgment result is displayed. The contents of the judgment result are as follows: In case of passing: -Only judgment result (this test circuit board 3 passes the test) 2. In case of failure: ・ Failure ・ Pin No.・ Display test data.

By the above S11 to S12, the judgment result of all the connection terminals 4 is obtained as a comprehensive judgment based on the test data of each connection terminal stored in the judgment result storage table 8 and the judgment result of the connection terminal 4 concerned. If it is within the standard, it is passed, and if even one connection terminal 4 is out of the standard, it is rejected, and the pin No. , Display a list of test data and test results (actual measured values). As a result, it becomes possible to automatically scan the connection terminals 4 of the circuit board 3 under test with the probe 1 in order, and how the pitch of the connection terminals 4 of the circuit board 3 under test changes. However, it became possible to have the versatility to perform the test automatically according to the pitch simply by setting the value.

FIG. 3 shows an example of the judgment result storage table of the present invention. This is information when tested in S6 of FIG. : M ・ Test data: ・ Judgment result: This is an example in which the following is stored: : M ・ Test data: D ・ Judgment result flag: Discriminate between standard / nonstandard and save the total judgment result. Here, the test data includes the standard value for measuring the signal taken out from the connection terminal 4 by the probe 1, the distinction between voltage / current / waveform, and which test circuit 6 (for example, the test circuit 6 for measuring voltage). , The test circuit 6 for measuring the current, the test circuit 6 for measuring the waveform (such as a digital oscilloscope), and whether to connect and switch is set in advance (this allows the multiplexer 5 to set the probe 1 to this setting). It automatically switches to the existing test circuit 6).

Further, the comprehensive judgment result is as described above.
Pin No. Passed when all the judgment results of are within the standard, 1
Even if it is out of the standard, it is rejected. Then, when outputting the determination result, based on the determination result storage table 8,
As described in S11 and S12 of FIG. 2 described above, the fact of passing is output, or the fact of failing and the nonstandard pin N
o. , Output a list of test data.

FIG. 4 shows an example of the structure of the probe tip of the present invention. Normally, the tip of the probe 1 uses a rounded gold wire tip or a rounded gold probe and slides on the connection terminal 4 of the circuit board 3 under test. An example is shown in which the ball 11 or the bearing 13 is attached to the tip to facilitate movement.

FIG. 4A shows an example in which the ball 11 is attached to the tip of the probe 1. In this example, as shown in the figure, the ball 11 of the sphere is attached to the tip so as not to come off, and the ball 11 is locally contacted by a spring 12 to make an electrical connection. The connection terminals 4 of the test circuit board 3 are electrically contacted well. The size of the ball 11 is the size of the connection terminal 4
Is smaller than the interval between the connection terminals 4, that is, the pitch, and has a small size that does not contact both of the adjacent connection terminals 4.
In addition, the ball 11 is plated with gold in order to make good electrical contact with the connection terminal 4 and has good electric conductivity.

As described above, since the small ball 11 is embedded in the tip of the probe 1 so as to be freely rotatable or slidable, the probe 1 smoothly moves (slides) on the connection terminal 4 of the circuit board 3 under test in FIG. In this case, the movement mechanism 2 can control the movement of the probe 1 to accurately align the probe 1 with the position of the predetermined connection terminal 4.

FIG. 4B shows an example in which the ball bearing 13 is attached to the tip of the probe 1. In this example,
As shown in the figure, a minute ball bearing 13 is attached to the tip so that the ball bearing 13 and the connection terminal 4 of the circuit board 3 under test are in good electrical contact with each other. The size of the ball bearing 13 is smaller than the distance between the connection terminals 4, that is, the pitch between the connection terminals 4, and is small enough not to contact both of the adjacent connection terminals 4. Also,
In order to make good electrical contact with the connection terminal 4, the ball bearing 13 has a portion that comes into contact with the connection terminal 4 and, if necessary, the ball itself is plated with gold to improve electric conductivity.

As described above, since the small ball bearing 13 is embedded in the tip of the probe 1 so as to be freely rotatable, it can be smoothly moved (slipped) on the connection terminal 4 of the circuit board 3 under test of FIG. 2 enables the probe 1 to be moved and controlled to be accurately aligned with the position of the predetermined connection terminal 4.

[0033]

As described above, according to the present invention,
Even with a fine-pitch circuit board, a configuration is adopted in which one or a plurality of probes 1 sequentially scan the connection terminals 4 of the circuit board 3 to be tested and switch to the corresponding test circuit 6 to perform the test. Therefore, the circuit board under test having connection terminals of any pitch can be easily tested. Due to these, (1) Even if the fine pitch (for example, pitch = 0.33 mm or less), which was impossible when the conventional probe was brought into contact with the connection terminals of all the circuit boards under test, It became possible to test by automatically contacting the probe with the connection terminal.

(2) Even if the pitch and the number of connection terminals of the circuit board under test are different, only by designating the pitch and the number, the probe is scanned at that pitch for that number and the test is performed automatically. It was possible to realize a versatile probe characteristic test device.

[Brief description of drawings]

FIG. 1 is a configuration diagram of an embodiment of the present invention.

FIG. 2 is a flowchart explaining the operation of the present invention.

FIG. 3 is an example of a determination result storage table of the present invention.

FIG. 4 is a structural example of a probe tip of the present invention.

[Explanation of symbols]

 1: Probe 2: Moving mechanism 3: Circuit board under test 4: Connection terminal 5: Multiplexer (switch matrix, switching circuit) 6: Test circuit 7: Control circuit 8: Judgment result table 11: Ball 12: Spring 13: Bearing

Claims (3)

[Claims] 1. A moving mechanism for moving one or a plurality of probes on a connection terminal on a circuit board under test, and a moving mechanism for moving one or more probes to a connection terminal on the circuit board under test. A switching circuit for switching to a corresponding test circuit in the state of being in contact with the test circuit, and a test circuit for performing a test by receiving or transmitting a signal through one or a plurality of probes by the test circuit switched by the switching circuit. And a probing characteristic test apparatus configured to output a result tested by the test circuit. 2. As a result of the above, the test data and the judgment result are sequentially stored in association with the connection terminal numbers, and when the test is completed, the test result is passed, and when the test is not completed, the connection terminal is rejected. The probing characteristic test device according to claim 1, wherein a list of numbers, test data, and judgment results is output. 3. The probe according to claim 1, wherein a fine ball or a ball bearing is provided at a tip of the probe to facilitate movement on the connection terminal.
The probing characteristic test device described.