JPH07169001A - Fdd frequency characteristics tester - Google Patents

Abstract

PURPOSE:To measure the frequency characteristics of a signal processing unit in an information storing/reproducing apparatus in an amplification process and test the signal processing unit surely, quickly and quantitatively. CONSTITUTION:A test program is downloaded from a personal computer 11 to a frequency characteristics controller 12 to set the conditions of the test of a signal processing unit 15, to perform the trial start of a network analyzer 13, to judge the measured data and, further, to control a sequence controller 16 for line control. The test data which are measured in accordance with the test program are inputted to the personal computer 11 through the frequency controller 12 and the personal computer 11 analyzes the frequency characteristics data which are the test results of the signal processing unit 15. Further, the analyzed frequency characteristics data are displayed and outputted as a hard body. The data are also utilized for the measurement after the storage.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an FDD frequency characteristic testing device for performing an operation test of a signal processing unit including an amplifier in a manufacturing process of a floppy disk device (FDD) such as a computer and a word processor.

[0002]

2. Description of the Related Art Conventional floppy disk devices (FD
In the manufacturing process of D), an operation test is continuously performed. In this operation test, a test based on a test program stored in a personal computer is performed, and the obtained test data is analyzed. In such a floppy disk device (FDD) to be tested, for example, a differential amplifier is provided for each of a plurality of recording / reproducing head coils, and a constant current power supply circuit serving as a constant current source of the plurality of differential amplifiers is provided. A signal processing unit is provided.

FIG. 7 is a block diagram showing the configuration of a conventional FDD frequency characteristic testing device. In FIG. 7, this example is provided with a keyboard, a display, a storage device, a printer, and the like, stores a test program, and analyzes the test data, and a personal computer 1 based on the test program from the personal computer 1. A function tester 2 for testing is provided. further,
The pinboard 3, the signal processing unit 4 of the FDD connected to the pinboard 3 in contact therewith, and the read / write (R
/ W) A dummy driver 5 is provided for testing the processing.

Next, the operation of this conventional configuration will be described. Download the test program from the personal computer 1 to the function tester 2. The test program downloaded to the function tester 2 is tested for the actual read / write (R / W) processing by using the dummy driver 5 with respect to the signal processing unit 4 of the FDD connected to the pin board 3, and the FDD is tested. The operation data of the amplifier in each signal processing unit 4 is fetched and confirmed by the personal computer 1 through the function tester 2 and stored in the storage device.

[0005]

[Problems to be Solved by the Invention]
The DD frequency characteristic testing device only checks the operation of the differential amplifier connected to the plurality of recording / reproducing head coils. Therefore, the quality of one of the input / output operations in the differential amplifier and the switching state of the gain of the differential amplifier cannot be confirmed. In addition, the operation of the low-pass filter that removes the noise of the playback signal from the recording / playback head coil, the consumption of the floppy disk (FD) (wear of the magnetic surface), and the confirmation of erroneous determination due to noise superposition on the signal processing path, etc. I couldn't.

The present invention solves such a conventional problem, and measures the frequency characteristic in the amplification processing of the signal processing unit in the floppy disk device to reliably, quickly and quantitatively test the signal processing unit. It is an object of the present invention to provide an excellent FDD frequency characteristic testing device that can be achieved.

[0007]

In order to achieve the above object, an FDD frequency characteristic test apparatus according to claim 1 stores a test program for testing the frequency characteristic of a signal processing unit in an information storage / reproduction apparatus. Moreover, the test analysis means for analyzing the obtained test data, the frequency characteristic control means for controlling the frequency characteristic based on the test data from the test analysis means, and the frequency characteristic of the signal processing unit are measured through the frequency characteristic control means. And a frequency characteristic measuring means for outputting the test data.

An FDD frequency characteristic test device according to a second aspect stores a test program for testing the frequency characteristic of a signal processing unit in an information storage / reproduction device, and a test analysis means for analyzing the obtained test data. A frequency characteristic control means for controlling the frequency characteristic based on the test data from the test analysis means; a frequency characteristic measuring means for outputting the test data obtained by measuring the frequency characteristic of the signal processing unit through the frequency characteristic control means; The measurement jig is provided with a plurality of pins that attach / detach to / from the circuit of the unit unit, and the sequence control means for continuously carrying and attaching / detaching the signal processing unit unit to / from the measurement jig. .

[0009]

With this structure, the FDD according to claim 1
The frequency characteristic test device controls the frequency characteristic based on the test data of the test program for testing the frequency characteristic of the signal processing unit, measures the frequency characteristic of the signal processing unit, and analyzes this test data. . Therefore, the frequency characteristic in the amplification processing of the signal processing unit in the information storage / reproduction device is measured, and the signal processing unit is tested reliably and quantitatively.

The FDD frequency characteristic test apparatus according to the second aspect controls the frequency characteristic in the same manner as the configuration according to the first aspect, measures the frequency characteristic of the signal processing unit, analyzes the test data, and The signal processing unit is continuously conveyed to and attached to the measuring jig that is attached to and detached from the circuit of the signal processing unit. Therefore, the frequency characteristic in the amplification processing of the signal processing unit in the floppy disk device is measured, the test of the signal processing unit is performed reliably and quantitatively, and the test is performed quickly.

[0011]

Embodiments of the FDD frequency characteristic testing apparatus of the present invention will be described below in detail with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of an embodiment of an FDD frequency characteristic testing device of the present invention. In FIG. 1, this FDD frequency characteristic testing device is provided with a personal computer 11 which stores a test program and analyzes test data. The personal computer 11 is provided with an operating keyboard 11a, a display device 11b, a storage device 11c, and a printer 11d.

Further, a personal computer 11 and an RS-232C interface are connected to the FDD frequency characteristic testing apparatus, and a frequency characteristic controller 12 for controlling the frequency characteristic to be tested, and the frequency characteristic controller 12 and the GP-IB interface are used. A network analyzer 13 that is connected and measures the frequency characteristics, and
There is provided a pin board 14 which is a measurement jig having a plurality of pins which is built in the DD and which is attached to and detached from and contacts the circuit of a signal processing unit including a differential amplifier, for example.

Further, for example, a signal processing unit 15 provided in an FDD that is carried on a manufacturing line of a factory and is attached to and detached from a pinboard 14 to test a frequency characteristic including a differential amplifier, and a manufacturing line control unit. A sequence controller 16 is provided.

Next, the operation of the configuration of this embodiment will be described. The personal computer 11 operates the frequency characteristic controller 1 by operating the keyboard 11a.
Download the test program to 2. The frequency characteristic controller 12 sets the test conditions of the signal processing unit 15, activates the test of the network analyzer 13 and determines the measurement data, and controls the sequence controller 16 for controlling the manufacturing line. The network analyzer 13 measures the frequency characteristics of the signal processing unit 15 in five test patterns described below. The production line control sequence controller 16 controls a production line (not shown) that conveys the signal processing unit 15, controls attachment / detachment of the signal processing unit 15 to / from the pin board 14, and outputs signals tested from the pin board 14. The acquisition of the frequency characteristic data of the processing unit 15 is controlled.

Next, the test of the signal processing unit 15 will be described. Under the control of the production line control sequence controller 16, the signal processing unit 15 is mounted on the pinboard 14 and the measurement of the frequency characteristic is started. This frequency characteristic is measured by one signal processing unit 1
The following five test patterns for 5 are performed. This test is 1 Mbyte (byte) processing (mode) and 2 Mbytes (byte)
The following test pattern (1) set on the track (Tr) of the floppy disk (FD) in the processing (mode)
~ (5). (1) 1M byte mode, inner circumference position (Tr = 0) (2) 1M byte mode, outer circumference position (Tr = 44) (3) 2M byte mode, inner circumference position (Tr = 0) (4) 2M byte mode , Intermediate position (Tr = 44) (5) 2M byte mode, outer peripheral position (Tr = 64) The above test patterns (1) to (5) are tested at frequencies of 62.5 kHz, 125 kHz, 250 kHz, 500.
The gain (db) is measured at 1 kHz and 1 MHz, and it is determined whether or not the gain position is within a predetermined plus or minus (±) gain position for each test pattern in (1) to (5).

FIG. 2 is a frequency characteristic diagram of the signal processing unit 15 measured at the inner peripheral position (Tr = 0) in the 1M byte mode (1), and FIG. 3 is the 1M byte mode in the outer peripheral position (2). Signal processing unit 15 measured at Tr = 44)
3 is a frequency characteristic diagram of FIG. Further, FIG. 4 is a frequency characteristic diagram of the signal processing unit 15 measured at (3) 2M byte mode, inner circumferential position (Tr = 0), and FIG. 5 is (4) 2M byte mode, intermediate position (Tr = 44) is a frequency characteristic diagram of the signal processing unit 15 measured in 44). Further, FIG. 6 is a frequency characteristic diagram of the signal processing unit 15 measured at (5) 2M byte mode, outer peripheral position (Tr = 64).

In FIG. 1, the measured data (gain dB) at each frequency (62.5 kHz to 1 MHz) is within the range of the preset upper limit (Δ) and lower limit (× dB) indicated by x. If yes, the signal processing unit 15 is determined to have good frequency characteristics. 1 indicates the average frequency characteristic when the frequency characteristics of the many signal processing units 15 are measured, and the + (plus) mark indicates when the frequency characteristics of the many signal processing units 15 are measured. Shows the maximum (gain dB) frequency characteristic within the allowable range of. Further, the- (minus) mark indicates the minimum (gain dB) frequency characteristic within the allowable range when measuring the frequency characteristic of many signal processing units 15. Figure 2
~ FIG. 6 is also the same.

In this way, the test data measured by the frequency characteristic controller 12 and the network analyzer 13 based on the test program is sent from the frequency characteristic controller 12 to the personal computer 11 through the RS-232C interface. In the personal computer 11, from the frequency characteristic controller 12,
The frequency characteristic data, which is the test result of the signal processing unit 15, is captured and analyzed. Further, the analyzed frequency characteristic data is displayed on the screen of the display 11b and is output as a hard copy by the printer 11d. In addition, it is stored and stored in the storage device 11c and used for the subsequent measurement.

As described above, in this embodiment, the frequency characteristic in the amplification processing of the signal processing unit 15 in the FDD is measured, and the test of the signal processing unit 15 when the FDD is mass-produced on the manufacturing line or the like is performed. You will be able to do it reliably, quickly and quantitatively.

[0021]

As is apparent from the above description, the FDD frequency characteristic test device according to the first aspect controls the frequency characteristic based on the test data of the test program for testing the frequency characteristic of the signal processing unit. Since the frequency characteristics of the signal processing unit are measured and this test data is analyzed, the frequency characteristics of the amplification processing of the signal processing unit in the information storage / reproducing device can be measured, and the test of the signal processing unit can be performed reliably and quantitatively. It has the effect that it can be achieved.

The FDD frequency characteristic test device according to the second aspect controls the frequency characteristic, measures the frequency characteristic of the signal processing unit, and analyzes the test data, as in the configuration according to the first aspect. At the same time, because the signal processing unit is continuously conveyed to and removed from the measurement jig that is attached to and detached from the circuit of the signal processing unit, the control is performed.
The frequency characteristic in the amplification processing of the signal processing unit in the information storage / reproducing apparatus is measured, and the signal processing unit can be tested reliably and quantitatively, and the test can be performed quickly.

[Brief description of drawings]

FIG. 1 is a block diagram showing the configuration of an embodiment of an FDD frequency characteristic testing device of the present invention.

FIG. 2 is a frequency characteristic diagram of a signal processing unit measured in a 1M byte mode and an inner peripheral position, which is used for explaining the operation of the embodiment.

FIG. 3 is a frequency characteristic diagram of the signal processing unit, which is used for explaining the operation of the embodiment and is measured in the 1 MB mode and the outer peripheral position.

FIG. 4 is a frequency characteristic diagram of the signal processing unit, which is used for explaining the operation of the embodiment and is measured in the 2M byte mode and the inner circumferential position.

FIG. 5 is a frequency characteristic diagram of the signal processing unit, which is used for explaining the operation of the embodiment and is measured in the 2M byte mode and the intermediate position.

FIG. 6 is a frequency characteristic diagram of the signal processing unit used in the description of the operation of the embodiment and measured in the 2M byte mode and the outer peripheral position.

FIG. 7 is a block diagram showing a configuration of a conventional FDD frequency characteristic test device.

[Explanation of symbols]

 11 personal computer 12 frequency characteristic controller 13 network analyzer 14 pin board 15 signal processing unit 16 sequence controller for manufacturing line control

Claims (2)

[Claims] 1. A test analysis means for storing a test program for testing a frequency characteristic of a signal processing unit in an information storage / reproduction device, and analyzing the obtained test data, and test data from the test analysis means. An FDD frequency characteristic testing device comprising frequency characteristic control means for controlling the frequency characteristic based on the above, and frequency characteristic measuring means for outputting test data obtained by measuring the frequency characteristic of the signal processing unit through the frequency characteristic control means. 2. Test analysis means for storing a test program for testing the frequency characteristic of a signal processing unit in an information storage / reproduction device, and analyzing the obtained test data, and test data from said test analysis means. Frequency characteristic control means for controlling the frequency characteristic based on the frequency characteristic control means, frequency characteristic measuring means for outputting test data obtained by measuring the frequency characteristic of the signal processing unit through the frequency characteristic control means, and attachment / detachment to the circuit of the signal processing unit. An FDD frequency characteristic testing device comprising a measuring jig having a plurality of pins that are in contact with each other, and sequence control means for continuously transporting and mounting the signal processing unit unit to and from the measuring jig.