JPH07110302A - Defect detector for transparent board - Google Patents
Defect detector for transparent boardInfo
- Publication number
- JPH07110302A JPH07110302A JP25606593A JP25606593A JPH07110302A JP H07110302 A JPH07110302 A JP H07110302A JP 25606593 A JP25606593 A JP 25606593A JP 25606593 A JP25606593 A JP 25606593A JP H07110302 A JPH07110302 A JP H07110302A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- inspected
- transparent
- light source
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、例えば、ガラスあるい
はプラスチックなどの板状の透明物体における種々の欠
陥を検出する検出装置に使用して好適な透明板の欠陥検
出装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a transparent plate defect detecting device suitable for use in a detecting device for detecting various defects in a plate-shaped transparent object such as glass or plastic.
【0002】[0002]
【従来の技術】従来より、板状透明の被検査物体に照明
光を当て、その反射光または透過光をテレビカメラによ
り撮像し、その信号を電子回路により検出し、被検査物
体の欠陥を検出する欠陥検出装置が提案されている。2. Description of the Related Art Conventionally, a plate-like transparent object to be inspected is illuminated with illumination light, the reflected light or transmitted light is imaged by a television camera, and the signal is detected by an electronic circuit to detect defects in the object to be inspected. There is proposed a defect detection device that does.
【0003】図4および図5に、従来の板状透明物体の
欠陥検査に用いられる透明板の欠陥検出装置の側面図を
示す。図4および図5において、1は板状透明の被検査
物体であり、図示しない搬送装置により所定方向に搬送
される。2はテレビカメラであり、一般の白黒用テレビ
カメラである。3は欠陥検出回路であり、微分回路等で
構成され、テレビカメラ2の撮像信号から被検査物体1
の欠陥を検出する回路である。FIG. 4 and FIG. 5 are side views of a conventional transparent plate defect detection device used for defect inspection of a plate-shaped transparent object. 4 and 5, reference numeral 1 denotes a plate-shaped transparent object to be inspected, which is conveyed in a predetermined direction by a conveying device (not shown). Reference numeral 2 denotes a television camera, which is a general black and white television camera. Defect detection circuit 3 is composed of a differentiating circuit and the like.
It is a circuit for detecting the defect of.
【0004】4は照明光源であり、例えば、ストロボ光
からなり、図示しない搬送装置により搬送される被検査
物体1に対して、テレビカメラ2の撮像信号に同期しな
がら発光するものである。5は光拡散板であり、すりガ
ラスなどで構成され、照明光源4のストロボ光を拡散さ
せるものである。Reference numeral 4 denotes an illumination light source, which is composed of, for example, strobe light, and emits light in synchronization with an image pickup signal of the television camera 2 with respect to an object to be inspected 1 conveyed by a conveying device (not shown). Reference numeral 5 is a light diffusion plate, which is made of frosted glass or the like and diffuses the strobe light of the illumination light source 4.
【0005】図4は反射型の透明板の欠陥検出装置であ
り、図5は透過型の透明板の欠陥検出装置であり、図5
に示す透明板の欠陥検出装置が、図4に示す透明板の欠
陥検出装置と異なる点は、テレビカメラ2および欠陥検
出回路3を被検査物体1に対して照明光源4および光拡
散板5を設けた側と反対の側に設けた点である。FIG. 4 is a reflection type transparent plate defect detecting device, and FIG. 5 is a transmission type transparent plate defect detecting device.
The defect detection apparatus for a transparent plate shown in FIG. 4 differs from the defect detection apparatus for a transparent plate shown in FIG. This is the point provided on the side opposite to the side provided.
【0006】上述の図4に示した反射型の透明板の欠陥
検出装置は、照明光源4よりの光を被検査物体1に照射
し、その被検査物体1の表面の反射光をテレビカメラ2
でとらえて欠陥を検出するもので、主として被検査物体
1の表面上の欠陥、例えば、表面の凹凸等の有無を検査
するものである。The above-described reflection type transparent plate defect detecting apparatus shown in FIG. 4 irradiates the object 1 to be inspected with light from the illumination light source 4, and the television camera 2 reflects the light reflected from the surface of the object 1 to be inspected.
To detect a defect, and mainly to inspect for a defect on the surface of the object 1 to be inspected, for example, the presence or absence of unevenness on the surface.
【0007】また、上述の図5に示した透過型の欠陥検
出装置は照明光源4による被検査物体1の透過光をテレ
ビカメラ2でとらえて欠陥を検出するもので、主として
被検査物体1内の黒い異物などを検出するものに用いら
れるものである。図4および図5に示したいずれの欠陥
検出装置においても、照明光源4と被検査物体1との間
には、光拡散板5を設けて、被検査物体1には拡散光が
照射されるように構成されている。The above-described transmission type defect detection apparatus shown in FIG. 5 detects a defect by catching the transmitted light of the object 1 to be inspected by the illumination light source 4 with the television camera 2, and mainly in the object 1 to be inspected. It is used for detecting black foreign matter. In any of the defect detection devices shown in FIGS. 4 and 5, a light diffusion plate 5 is provided between the illumination light source 4 and the inspection object 1 and the inspection object 1 is irradiated with diffused light. Is configured.
【0008】[0008]
【発明が解決しようとする課題】しかし、上述した図4
に示した従来の反射型の欠陥検出装置では、被検査物体
1の表面の反射光をテレビカメラ2でとらえて欠陥を検
出するので、被検査物体1の表面の欠陥しか検出できな
いという不都合があった。また、図6に示すように、上
述した図5に示した従来の透過型の欠陥検出装置では、
被検査物体1内の欠陥として表面の凸部6および凹部7
そして内部の気泡8が存在するとすると、これらの欠陥
は、図6の矢印に示すように、被検査物体1内における
欠陥部に対して、その周辺により照明光源4よりの透過
された光の乱反射光により、明るく照射され、明暗のコ
ントラストがつかず、欠陥部としての区別がつかない。
従って、気泡の検出ができず、黒い異物の検出しかでき
ないという不都合があった。However, the above-mentioned FIG.
In the conventional reflection-type defect detection device shown in FIG. 1, the reflected light on the surface of the object to be inspected 1 is captured by the television camera 2 to detect the defect. It was Further, as shown in FIG. 6, in the conventional transmission type defect detection apparatus shown in FIG.
As defects in the object 1 to be inspected, convex portions 6 and concave portions 7 on the surface
If the bubbles 8 inside are present, these defects are diffusely reflected by the illumination light source 4 by the periphery of the defect portion in the inspected object 1 as shown by the arrow in FIG. It is illuminated brightly by light, and contrast of light and dark cannot be obtained, and it cannot be distinguished as a defective portion.
Therefore, there is an inconvenience that bubbles cannot be detected and only black foreign matter can be detected.
【0009】本発明は、かかる点に鑑みてなされたもの
であり、被検査物体内の欠陥を容易に検出できる安価な
透明板の検出装置の提供を目的とする。The present invention has been made in view of the above points, and an object thereof is to provide an inexpensive transparent plate detecting apparatus capable of easily detecting a defect in an object to be inspected.
【0010】[0010]
【課題を解決するための手段】本発明の透明板の欠陥検
出装置は、例えば、図1から図3に示す如く、透明板の
被検査物体1の欠陥を検出する透明板の欠陥検出装置に
おいて、被検査物体1の一方の側より照明光を当てる照
明光源4と、照明光源4による被検査物体1の透過光を
他方の側より撮像するテレビカメラ2と、被検査物体1
と照明光源4の間に透明部11aと不透明部11bを有
するマスク11とを設けたものである。A transparent plate defect detecting apparatus according to the present invention is a transparent plate defect detecting apparatus for detecting a defect of an object 1 to be inspected, as shown in FIGS. , An illumination light source 4 which applies illumination light from one side of the inspected object 1, a television camera 2 which images the transmitted light of the inspected object 1 by the illumination light source 4 from the other side, and the inspected object 1
And a mask 11 having a transparent portion 11a and an opaque portion 11b between the illumination light source 4 and the light source 4.
【0011】また、本発明の透明板の欠陥検出装置は、
例えば、図1から図3に示す如く、マスク11の不透明
部11bはストライプ状に設けられたものである。The transparent plate defect detection apparatus of the present invention is
For example, as shown in FIGS. 1 to 3, the opaque portion 11b of the mask 11 is provided in a stripe shape.
【0012】また、本発明の透明板の欠陥検出装置は、
例えば、図1から図3に示す如く、マスク11の不透明
部11bはメッシュ状に設けられたものである。Further, the transparent plate defect detecting apparatus of the present invention is
For example, as shown in FIGS. 1 to 3, the opaque portion 11b of the mask 11 is provided in a mesh shape.
【0013】[0013]
【作用】本発明によれば、被検査物体1と照明光源4の
間に透明部11aと不透明部11bを有するマスク11
を設けたので、被検査物体内1にマスク11の透明部1
1aによる明部9とマスク11の不透明部11bによる
暗部10とを生じさせ、被検査物体1内の気泡8に暗部
10からは光が当たらないので、これが陰影となり、気
泡8の輪郭をコントラストのある像として検出すること
ができる。According to the present invention, the mask 11 having the transparent portion 11a and the opaque portion 11b between the object 1 to be inspected and the illumination light source 4 is provided.
Since the transparent portion 1 of the mask 11 is provided inside the inspected object 1,
A bright portion 9 due to 1a and a dark portion 10 due to the opaque portion 11b of the mask 11 are generated, and since the bubble 8 in the inspected object 1 is not irradiated with light from the dark portion 10, it becomes a shadow, and the contour of the bubble 8 is contrasted. It can be detected as a certain image.
【0014】また、本発明によれば、マスク11の不透
明部11bはストライプ状に設けられたので、被検査物
体内1にマスク11の透明部11aによる明部9とマス
ク11の不透明部11bによる暗部10とをストライプ
状に生じさせ、被検査物体1内の気泡8に暗部10から
は光が当たらないので、これが陰影となり、気泡8の輪
郭をコントラストのある像として検出することができ
る。Further, according to the present invention, since the opaque portion 11b of the mask 11 is provided in a stripe shape, the transparent portion 11a of the mask 11 causes the bright portion 9 and the opaque portion 11b of the mask 11 in the inspected object 1. Since the dark portion 10 and the dark portion 10 are formed in a stripe shape and the light is not emitted from the dark portion 10 to the bubble 8 in the inspected object 1, this becomes a shadow, and the outline of the bubble 8 can be detected as an image with contrast.
【0015】また、本発明によれば、マスク11の不透
明部11bはメッシュ状に設けられたので、被検査物体
1内に透明部11aによる明部9と不透明部11bによ
る暗部10とをメッシュ状に生じさせ、被検査物体1内
の気泡8に暗部10からは光が当たらないので、これが
陰影となり、気泡8の輪郭をコントラストのある像とし
て検出することができる。Further, according to the present invention, since the opaque portion 11b of the mask 11 is provided in a mesh shape, the light portion 9 by the transparent portion 11a and the dark portion 10 by the opaque portion 11b are mesh-shaped in the object 1 to be inspected. Since the light is not emitted from the dark portion 10 to the bubble 8 in the inspected object 1, it becomes a shadow, and the contour of the bubble 8 can be detected as an image with contrast.
【0016】[0016]
【実施例】以下本発明に係る検出装置の一実施例を、図
1から図3に従い詳細に説明する。なお、図4から図6
において示した従来の透明板の欠陥検出装置に対応する
部分には同一の符号を付して、詳細な説明は省略する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the detection device according to the present invention will be described in detail below with reference to FIGS. 4 to 6
Portions corresponding to the conventional transparent plate defect detection device shown in 1 are denoted by the same reference numerals and detailed description thereof will be omitted.
【0017】図1に本発明の透明板の欠陥検出装置の実
施例の一つの構成を示す。1は板状透明の被検査物体で
あり、図示しない搬送装置により所定方向に搬送され
る。2はテレビカメラであり、一般の白黒用テレビカメ
ラである。3は欠陥検出回路であり、微分回路等で構成
され、テレビカメラ2の撮像信号から被検査物体1の欠
陥を検出する回路である。FIG. 1 shows one construction of an embodiment of the transparent plate defect detecting apparatus of the present invention. Reference numeral 1 denotes a plate-shaped transparent object to be inspected, which is conveyed in a predetermined direction by a conveying device (not shown). Reference numeral 2 denotes a television camera, which is a general black and white television camera. Reference numeral 3 denotes a defect detection circuit, which is composed of a differentiating circuit or the like and is a circuit for detecting a defect of the inspected object 1 from an image pickup signal of the television camera 2.
【0018】4は照明光源であり、例えば、ストロボ光
からなり、図示しない搬送装置により搬送される被検査
物体1に対して、テレビカメラ2の撮像信号に同期しな
がら発光するものである。5は光拡散板であり、すりガ
ラスなどで構成され、照明光源4のストロボ光を拡散さ
せるものである。Reference numeral 4 denotes an illumination light source, which is composed of, for example, strobe light, and emits light in synchronization with an image pickup signal of the television camera 2 with respect to an object to be inspected 1 conveyed by a conveying device (not shown). Reference numeral 5 is a light diffusion plate, which is made of frosted glass or the like and diffuses the strobe light of the illumination light source 4.
【0019】図1に示した本発明の透明板の欠陥検出装
置の実施例が、図4および図5で示した従来の透明板の
欠陥検出装置と異なる点は、被検査物体1と光拡散板5
との間に透明部11aおよび不透明部11bを有するス
トライプ状またはメッシュ状のマスク11を設けた点で
ある。図2Aはストライプ状のマスク、図2Bはメッシ
ュ状のマスクを示すものである。The embodiment of the defect detecting device for a transparent plate of the present invention shown in FIG. 1 is different from the conventional defect detecting device for a transparent plate shown in FIGS. Board 5
The point is that a stripe-shaped or mesh-shaped mask 11 having a transparent portion 11a and an opaque portion 11b is provided between and. 2A shows a stripe-shaped mask, and FIG. 2B shows a mesh-shaped mask.
【0020】上述のように、図2Aに示したようなスト
ライプ状のマスクを用いた場合には、光拡散板5により
拡散された照明光源4のストロボ光がマスク11に照射
されるので、被検査物体1にはマスク11の透明部11
aおよび不透明部11bによるストライプ状のパターン
の照明がなされる。As described above, when the stripe-shaped mask as shown in FIG. 2A is used, the strobe light of the illumination light source 4 diffused by the light diffusing plate 5 is applied to the mask 11, so that the mask 11 is exposed. The transparent portion 11 of the mask 11 is provided on the inspection object 1.
Illumination of a striped pattern is performed by a and the opaque portion 11b.
【0021】これにより、図3に示すように、被検査物
体1内にマスク11の透明部11aによる明部9とマス
ク11の不透明部11bによる暗部10とを交互にスト
ライプ状に生じ、被検査物体1内の気泡8に暗部10か
らは光が当たらないので、これが陰影となり、気泡8の
輪郭をコントラストのある像として検出することができ
る。As a result, as shown in FIG. 3, the transparent portion 11a of the mask 11 and the bright portion 9 of the mask 11 and the dark portion 10 of the opaque portion 11b of the mask 11 are alternately formed in stripes in the object 1 to be inspected. Since light does not strike the bubble 8 in the object 1 from the dark portion 10, it becomes a shadow, and the contour of the bubble 8 can be detected as an image with contrast.
【0022】さらに、被検査物体1は、その先端から終
端まで、図示しない搬送装置によりマスク11の透明部
11aおよび不透明部11bによるストライプと直行す
る方向に搬送される。ここで、搬送のピッチは、透明部
11aおよび不透明部11bのストライプのピッチと一
致させることにより、被検査物体1の先端から終端まで
をすべて検査することができる。つまり、マスク11の
透明部11aによる明部9が被検査物体1内にすべて生
じるように搬送する。Further, the object 1 to be inspected is conveyed from the front end to the end thereof in a direction orthogonal to the stripe formed by the transparent portion 11a and the opaque portion 11b of the mask 11 by a conveying device (not shown). Here, by matching the conveyance pitch with the pitch of the stripes of the transparent portion 11a and the opaque portion 11b, it is possible to inspect all of the object 1 to be inspected from the front end to the end. In other words, the transparent portion 11a of the mask 11 is conveyed so that the bright portion 9 is entirely generated in the inspected object 1.
【0023】また、上述のように、図2Bに示したよう
なメッシュ状のマスクを用いた場合には、光拡散板5に
より拡散された照明光源4のストロボ光がマスク11に
照射されるので、被検査物体1にはマスク11の透明部
11aおよび不透明部11bによるメッシュ状のパター
ンの照明がなされる。Further, as described above, when the mesh-shaped mask as shown in FIG. 2B is used, the strobe light of the illumination light source 4 diffused by the light diffusion plate 5 is applied to the mask 11. The inspected object 1 is illuminated with a mesh-shaped pattern by the transparent portion 11a and the opaque portion 11b of the mask 11.
【0024】これにより、図3に示すように、被検査物
体1内にマスク11の透明部11aによる明部9とマス
ク11の不透明部11bによる暗部10とをメッシュ状
に生じ、被検査物体1内の気泡8に暗部10からは光が
当たらないので、これが陰影となり、気泡8の輪郭をコ
ントラストのある像として検出することができる。As a result, as shown in FIG. 3, a bright portion 9 by the transparent portion 11a of the mask 11 and a dark portion 10 by the opaque portion 11b of the mask 11 are formed in a mesh shape in the object 1 to be inspected. Since the light is not emitted from the dark portion 10 to the bubbles 8 therein, this becomes a shadow, and the outline of the bubbles 8 can be detected as an image with contrast.
【0025】さらに、被検査物体1は、その先端から終
端まで、図示しない搬送装置により所定方向に搬送され
る。ここで、搬送のピッチは、透明部11aおよび不透
明部11bのメッシュのピッチと一致させることによ
り、被検査物体1の先端から終端までをすべて検査する
ことができる。つまり、マスク11の透明部11aによ
る明部9が被検査物体1内にすべて生じるように搬送す
る。Further, the object 1 to be inspected is conveyed in a predetermined direction from its leading end to its trailing end by a conveying device (not shown). Here, by matching the conveyance pitch with the mesh pitch of the transparent portion 11a and the opaque portion 11b, it is possible to inspect all of the object 1 to be inspected from the front end to the end. In other words, the transparent portion 11a of the mask 11 is conveyed so that the bright portion 9 is entirely generated in the inspected object 1.
【0026】この場合、メッシュ状のマスク11はスト
ライプ状のマスク11に比べて、欠陥部分の周囲をスポ
ット状に暗部10で取り囲むので、更に欠陥部分の輪郭
に一層明暗のコントラストが強まり、欠陥部分の検出を
容易にすることができる。In this case, since the mesh-shaped mask 11 is surrounded by the dark portion 10 in a spot shape around the defect portion as compared with the stripe-shaped mask 11, the contour of the defect portion further has a bright and dark contrast, and the defect portion is further enhanced. Can be easily detected.
【0027】また、上例では、メッシュ状のマスク11
はストライプ状のマスク11を直行させるようにして作
成してメッシュの形状を4角形とした例を示したが、メ
ッシュの形状は6角形、8角形、その他の多角形、およ
び丸でも良い。In the above example, the mesh-shaped mask 11
Shows an example in which the stripe-shaped mask 11 is formed so as to be orthogonal and the shape of the mesh is a quadrangle, but the shape of the mesh may be a hexagon, an octagon, another polygon, or a circle.
【0028】また、マスク11は被検査物体1から充分
に離れた距離に設けるのがよい。被検査物体1に接近し
てテレビカメラ2の焦点の合致部分に入ると、マスク1
1のストライプ状またはメッシュ状のパターンの白黒の
境界線が欠陥検出回路3によって誤って欠陥部分として
検知されてしまうからである。The mask 11 is preferably provided at a distance sufficiently away from the object 1 to be inspected. When the object 1 to be inspected is approached and the focus of the TV camera 2 is entered, the mask 1
This is because the black and white boundary line of the stripe-shaped or mesh-shaped pattern 1 is erroneously detected as a defective portion by the defect detection circuit 3.
【0029】従って、テレビカメラ2からみたマスク1
1は焦点の外れた、ぼけた像として写ることがよい。つ
まり、マスク11を被検査物体1に接近して、テレビカ
メラ2の焦点の合致部分に設けた場合には、この白黒の
境界線を検出してしまう現象を阻止するために、図2C
に示すように、白黒の境界のはっきりした線ではなく、
透明部11aおよび不透明部11bの間を徐々にぼかし
てマスク11を構成すれば良い。Therefore, the mask 1 seen from the TV camera 2
1 is best taken as an out-of-focus, blurred image. That is, in order to prevent the black and white boundary line from being detected when the mask 11 is provided in the focus-matching portion of the television camera 2 close to the inspected object 1, as shown in FIG.
, As shown in
The mask 11 may be formed by gradually blurring between the transparent portion 11a and the opaque portion 11b.
【0030】なお、マスク11の不透明部11bの大き
さは検出すべき欠陥の大きさに対応させればよいが、マ
スク11の不透明部11bの黒線の太さは、通常の場
合、1ミリメートル乃至2ミリメートルくらいが適切で
あることがわかった。Although the size of the opaque portion 11b of the mask 11 may correspond to the size of the defect to be detected, the thickness of the black line of the opaque portion 11b of the mask 11 is usually 1 mm. It has been found that ~ 2 millimeters is suitable.
【0031】また、上例では、被検査物体1を図示しな
い搬送装置により搬送する例を示したが、被検査物体1
を固定してマスク11を被検査物体1を図示しない搬送
装置により搬送して、両者を相対的にずらせて検査を行
うようにしてもよいことはいうまでもない。In the above example, the object 1 to be inspected is conveyed by the not-shown conveying device.
Needless to say, the mask 11 may be fixed and the object 1 to be inspected may be conveyed by a conveying device (not shown), and the two may be relatively displaced to perform the inspection.
【0032】このように、メッシュ状またはストライプ
状のマスク11を被検査物体1と照明光源4の間に挿入
することにより、透明板の被検査物体1内の欠陥を容易
に検出でき、安価に装置を構成することができる。As described above, by inserting the mesh-shaped or stripe-shaped mask 11 between the object 1 to be inspected and the illumination light source 4, the defect in the object 1 to be inspected on the transparent plate can be easily detected, and the cost can be reduced. The device can be configured.
【0033】また、本発明は上述の実施例に限らず本発
明の要旨を逸脱することなく種々の構成を取り得ること
はいうまでもない。Needless to say, the present invention is not limited to the above-described embodiments, and various configurations can be adopted without departing from the gist of the present invention.
【0034】[0034]
【発明の効果】本発明によれば、被検査物体と照明光源
の間に透明部と不透明部を有するマスクを設けたので、
被検査物体内にマスクの透明部による明部とマスクの不
透明部による暗部とを生じさせ、被検査物体内の気泡に
暗部からは光が当たらないので、これが陰影となり、気
泡の輪郭をコントラストのある像として検出することが
できる。According to the present invention, since the mask having the transparent portion and the opaque portion is provided between the object to be inspected and the illumination light source,
A bright part due to the transparent part of the mask and a dark part due to the opaque part of the mask are generated in the object to be inspected, and the air bubbles in the object to be inspected are not exposed to light from the dark part. It can be detected as a certain image.
【0035】また、本発明によれば、マスクの不透明部
はストライプ状に設けられたので、被検査物体内にマス
クの透明部による明部とマスクの不透明部による暗部と
を交互にストライプ状に生じさせ、被検査物体内の気泡
に暗部からは光が当たらないので、これが陰影となり、
気泡の輪郭をコントラストのある像として検出すること
ができる。Further, according to the present invention, since the opaque portions of the mask are provided in stripes, the light portions due to the transparent portions of the mask and the dark portions due to the opaque portions of the mask are alternately arranged in stripes in the object to be inspected. Since the light is not emitted from the dark part to the air bubbles in the object to be inspected, this becomes a shadow,
The contour of the bubble can be detected as a contrasting image.
【0036】また、本発明によれば、マスクの不透明部
はメッシュ状に設けられたので、被検査物体内に透明部
による明部と不透明部による暗部とをメッシュ状に生じ
させ、被検査物体内の気泡に暗部からは光が当たらない
ので、これが陰影となり、気泡の輪郭をコントラストの
ある像として検出することができる。Further, according to the present invention, since the opaque portion of the mask is provided in a mesh shape, a bright portion due to a transparent portion and a dark portion due to an opaque portion are generated in a mesh shape in the object to be inspected, and the object to be inspected is formed. Since the light does not reach the air bubbles in the body from the dark part, it becomes a shadow, and the outline of the air bubbles can be detected as an image with contrast.
【図1】本発明の透明板の欠陥検出装置の一実施例の構
成を示す側面図である。FIG. 1 is a side view showing a configuration of an embodiment of a transparent plate defect detection apparatus of the present invention.
【図2】本発明の透明板の欠陥検出装置の一実施例のマ
スクを示す図であり、図2Aはストライプ状マスク、図
2Bはメッシュ状マスク、図2Cは白黒の境界のぼけた
ストライプ状マスクである。2A and 2B are views showing a mask of an embodiment of a transparent plate defect detection apparatus of the present invention, FIG. 2A is a stripe mask, FIG. 2B is a mesh mask, and FIG. 2C is a stripe pattern with blurred black and white boundaries. It is a mask.
【図3】本発明の透明板の欠陥検出装置の一実施例の動
作を説明する図である。FIG. 3 is a diagram for explaining the operation of an embodiment of the transparent plate defect detection apparatus of the present invention.
【図4】従来の透明板の欠陥検出装置の例の構成を示す
側面図である。FIG. 4 is a side view showing a configuration of an example of a conventional transparent plate defect detection apparatus.
【図5】従来の透明板の欠陥検出装置の他の例の構成を
示す側面図である。FIG. 5 is a side view showing the configuration of another example of a conventional transparent plate defect detection apparatus.
【図6】従来の透明板の欠陥検出装置の動作を説明する
図である。FIG. 6 is a diagram illustrating the operation of a conventional transparent plate defect detection apparatus.
1 被検査物体 2 テレビカメラ 3 欠陥検出回路 4 照明光源 5 光拡散板 6 凸部 7 凹部 8 気泡 9 明部 10 暗部 11 マスク 11a 透明部 11b 不透明部 DESCRIPTION OF SYMBOLS 1 Inspected object 2 TV camera 3 Defect detection circuit 4 Illumination light source 5 Light diffusing plate 6 Convex part 7 Concave part 8 Bubble 9 Bright part 10 Dark part 11 Mask 11a Transparent part 11b Opaque part
Claims (3)
明板の欠陥検出装置において、 前記被検査物体の一方の側より照明光を当てる照明光源
と、 前記照明光源による前記被検査物体の透過光を他方の側
より撮像するテレビカメラと、 前記被検査物体と前記照明光源の間に透明部と不透明部
を有するマスクとを設けたことを特徴とする透明板の欠
陥検出装置。1. A defect detecting device for a transparent plate for detecting a defect of an inspected object of a transparent plate, comprising: an illumination light source for applying illumination light from one side of the inspected object; A defect detecting device for a transparent plate, comprising: a television camera that images transmitted light from the other side; and a mask having a transparent portion and an opaque portion between the object to be inspected and the illumination light source.
状に設けられたことを特徴とする請求項1記載の透明板
の欠陥検出装置。2. The defect detecting device for a transparent plate according to claim 1, wherein the opaque portion of the mask is provided in a stripe shape.
に設けられたことを特徴とする請求項1記載の透明板の
欠陥検出装置。3. The defect detecting device for a transparent plate according to claim 1, wherein the opaque portion of the mask is provided in a mesh shape.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25606593A JPH07110302A (en) | 1993-10-13 | 1993-10-13 | Defect detector for transparent board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25606593A JPH07110302A (en) | 1993-10-13 | 1993-10-13 | Defect detector for transparent board |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07110302A true JPH07110302A (en) | 1995-04-25 |
Family
ID=17287417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25606593A Pending JPH07110302A (en) | 1993-10-13 | 1993-10-13 | Defect detector for transparent board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07110302A (en) |
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