JPH05326845A - Semiconductor integrated circuit device - Google Patents

Abstract

PURPOSE:To find correctly the actually used time of a semiconductor device as base data in the market of the semiconductor device. CONSTITUTION:An input signal is adjusted by a frequency adjusting part 1 and is calculated by a counter 3. After the calculation ends, data is stored in a memory 4 and when the calculation is again started, the data is read in the counter 3 from the memory 4 and the calculation is started. Base data on the reliability of a semiconductor device can be correctly found and can be applied wide in a field which is required for a high reliability.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device.

[0002]

2. Description of the Related Art A conventional measuring instrument, by adding a pulse generating circuit 26 and a counter 3 to a SYN detecting circuit 18 and an ETB detecting circuit 20 for synchronizing information as shown in FIG.
It was possible to measure the actual usage time of the line by data transmission (for example, Japanese Examined Patent Publication No. 59-34026). Also,
19 is a set circuit, 21 is a reset circuit, 22 is a NAN
D circuit, 23 is a reception register, 24 is a control channel detection circuit, and 25 is a character buffer.

The operation will be described. STY detection circuit 1
8, the start of data transmission is determined, and the result is reported to the SET circuit 19. As a result, the signal from the pulse generator 26 is counted by the counter 3 to obtain the accumulation. The end of data transmission is determined by the ETB detection circuit 20, and the counter 3 stops counting by the signal of the reset circuit 21.

[0004]

It is important to estimate how the failure mode of a semiconductor device in the market will change due to differences in use conditions, environmental conditions, etc., and feed it back to the causal system. However, in order to collect / analyze data in the market and pursue the cause, it is difficult to accurately determine the operating time of the semiconductor device.

Conventionally, the life of semiconductor devices has been estimated mainly based on the results of reliability tests. Environmental tests and electrical tests are performed by tests such as high temperature operation, temperature cycle, and electrostatic discharge withstand capability, and reliability prediction and failure mode estimation of semiconductor devices after market shipment are performed. Moreover, although the failure rate in the field is calculated, it is important to obtain the actual failure rate in order to obtain accurate data.

The conventional device for accumulating the actual use time has the following drawbacks. That is, in addition to the existing device, a device having an integrating function was required. Since it does not have a memory function, it is not possible to turn off the power of a device that has an integrating function. There were drawbacks such as.

An object of the present invention is to provide a semiconductor integrated circuit device capable of integrating actual use time.

[0008]

In order to achieve the above-mentioned object, a semiconductor integrated circuit device according to the present invention comprises means for counting a power-on time in a semiconductor element in which a predetermined circuit element is incorporated, and based on the count value. And a means for accumulating the real-time use of the semiconductor integrated circuit.

[0009]

In the semiconductor device in which the predetermined circuit device is incorporated, a function for counting the power-on time and a function for accumulating the actual use time of the semiconductor integrated circuit are built in, and the actual use time is accurately obtained.

[0010]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described with reference to the drawings.

(Embodiment 1) FIG. 1 is a block diagram showing a clock function unit according to Embodiment 1 of the present invention. In the figure,
The clock function unit 1 of the present invention includes a frequency adjustment unit 2, a counter 3, and a memory 4.

The signal from the input terminal is adjusted by the frequency adjusting unit 2 to a clock having a constant frequency, and the counter 3 counts based on the output of the frequency adjusting unit 2. The count result of the counter 3 is stored in the non-volatile memory 4, and the count value is output if necessary.

FIG. 2 shows a detailed block diagram of this embodiment to explain the operation. At the same time when the power is turned on, the rise detection circuit 5 detects the rise of the power, opens the control function 6 with the output signal, and writes / reads the previous count value from the nonvolatile memory (eg, EEPROM) 4 to the counter 3. Read out.

Since the rising edge detection circuit 5 is a circuit which detects a rising edge and outputs one pulse, as soon as a value is written from the writable / readable nonvolatile memory 4 to the counter 3, the control function 6 is closed. Write / read is possible so that no value is entered from the nonvolatile memory 4.

On the other hand, the counter 3 adds to the previous count value based on the signal of the frequency adjusting section 2. When the frequency adjusting unit 2 receives a clock for one hour from the input terminal, it sends a signal for opening the write control function 9 of the writable / readable nonvolatile memory 4. And counter 3
Is written in the writable / readable nonvolatile memory 4 via the memory bus 7.

As a result, the counter 3 has 16 bits and can be used for about 7 to 8 years. Further, the control function 8 can be opened as necessary to read the counting result up to that point. The function of the totalizer can be realized by repeating the above.

FIG. 3 shows a time chart of the operation in FIG. At the same time as the rise detection circuit 5 starts up, the control function 6 opens and closes immediately. A value is read from the writable / readable non-volatile memory 4 to the counter 3 and counting is started. At this time, the signal of the write control function 9 is closed, and the writable / readable nonvolatile memory 4
No value is written to.

After one hour, a signal is output from the frequency adjusting unit 2, the write control function 9 is opened, and the count value at that time is written in the writable / readable nonvolatile memory 4. The same is repeated thereafter.

(Embodiment 2) FIG. 2 used in Embodiment 1 is used. This is an example of using a commercial power source, but the operation is the same as that of the first embodiment.

At the same time when the power is turned on, the rise detection circuit 5
Detects the rise of the power supply, opens the control function 6 with the output signal, and reads the previous count value from the writable / readable nonvolatile memory 4 to the counter 3.

FIG. 4 shows a detailed circuit diagram of the zero-cross detection circuit 10. The AC power supply 11 is a voltage conversion circuit 12. Through the capacitor 13, the input voltage of the semiconductor integrated circuit device falls within the standard range, and the zero-cross detection circuit 10 is connected from the input terminal.
to go into.

The input terminal is biased to about 1/2 V _DD by the inverter 14 and the resistance element 15 whose output is connected to the input. Therefore, the signal changes around 1/2 V _DD, and the waveform is shaped by the inverter 16.

As described above, the signal converted from the alternating current into the clock corresponding to the commercial frequency is sent to the frequency adjusting section 2 through the zero-cross detection circuit 10, and the counter 3 adds it to the previous count value based on the signal. Go Hereinafter, Example 1
Works the same as.

The circuit block configuration is the same as that of the first embodiment, but when a commercial power source is used, there are the following advantages. There is no need to change from AC to DC, and it can be widely used for personal computers and home appliances. Since the frequency is stable, more accurate time can be counted.

[0025]

As described above, the present invention has the function of accumulating the actual use time of the semiconductor integrated circuit by incorporating the clocking means and the memory function. In the past, a functional device capable of integrating by using a memory was added, but in the present invention, it can be incorporated and can be handled independently of an existing circuit. Since the count value is written in the memory, the number of digits of the counter can be reduced. Has the effect.

By the way, the record of the actual use time of the semiconductor integrated circuit is important as basic data of reliability in the market. In general, it is often difficult to accurately determine the operating time in the market, but in the present invention, it is easily possible by incorporating an integrating meter. Therefore, failure rate (definition of failure rate is defined by: failure rate = number of failures / operating time)
Can be accurately determined.

The semiconductor device of the present invention can be widely used in fields requiring high reliability. By using this semiconductor device, field data can be accumulated, which improves the operating environment of the semiconductor device and the semiconductor device itself. Greatly available for improvement.

[Brief description of drawings]

FIG. 1 is a block diagram showing a clock function unit according to a first embodiment of the present invention.

FIG. 2 is a diagram showing a detailed view of a timing function unit shown in FIG.

FIG. 3 is a time chart of the operation in FIG.

FIG. 4 is a circuit diagram showing details of a zero-cross detection circuit according to a second embodiment of the present invention.

FIG. 5 is a block diagram of a conventional example.

[Explanation of symbols]

 1 Clock Function Section 2 Frequency Adjustment Section 3 Counter 4 Writable / Readable Nonvolatile Memory 5 Rise Detection Circuit 6 Control Function 7 Memory Bus 8 Control Function 9 Write Control Signal 10 Zero Cross Detection Circuit 11 AC Power Supply 12 Voltage Conversion Circuit 13 Capacitor 14 Inverter 15 Resistance element 16 Inverter

Claims (1)

[Claims] 1. A semiconductor device having a predetermined circuit device incorporated therein, comprising means for counting power-on time and means for accumulating real-time use of the semiconductor integrated circuit based on the counted value. Integrated circuit device.