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JPH05179428A - Thin film forming device - Google Patents

Thin film forming device

Info

Publication number
JPH05179428A
JPH05179428A JP11830591A JP11830591A JPH05179428A JP H05179428 A JPH05179428 A JP H05179428A JP 11830591 A JP11830591 A JP 11830591A JP 11830591 A JP11830591 A JP 11830591A JP H05179428 A JPH05179428 A JP H05179428A
Authority
JP
Japan
Prior art keywords
processing
thin film
substrate
film forming
substrate holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11830591A
Other languages
Japanese (ja)
Inventor
Hatsuhiko Shibazaki
初彦 柴崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11830591A priority Critical patent/JPH05179428A/en
Publication of JPH05179428A publication Critical patent/JPH05179428A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To provide the thin film forming device which enables the execution of plural different thin film forming stages, simplifies the construction of a vacuum generator, etc., can efficiently make operations and produces less dust. CONSTITUTION:Treating chambers 10 having opening surfaces 12 at one end and internally having thin film forming means 14 are fixed and installed at plural points on the circumference. A substrate holder 20 rotating around the center of the entire part of the treating chambers 10 is provided to face the opening surfaces 12 of the respective treating chambers 10. Plural treating substrates 30 can be mounted on the substrate holder 20 on the same circumference as the circumference of the treating chambers 10 on the plane opposite to the treating chambers 10 so that the opening surfaces 12 of the respective treating chambers 10 can be substantially closed by the substrate holder 20.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は薄膜形成装置に関し、
詳しくは、例えば、半導体装置を製造する際に、半導体
基板の表面に各種の金属や金属化合物などの薄膜を形成
するために用いられ、真空もしくは真空に近い制御され
た処理雰囲気で蒸着やスパッタリングなどによる薄膜形
成を行う装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film forming apparatus,
Specifically, for example, when manufacturing a semiconductor device, it is used for forming thin films of various metals and metal compounds on the surface of a semiconductor substrate, and deposition or sputtering is performed in a vacuum or a controlled processing atmosphere close to a vacuum. The present invention relates to an apparatus for forming a thin film by

【0002】[0002]

【従来の技術】薄膜形成装置は、半導体装置の製造技術
において、極めて重要な設備である。半導体装置では、
シリコンなどからなる基板の表面に、酸化膜などの絶縁
膜や、電極となる導電金属膜、半導体膜その他の各種機
能を有する薄膜を何層にも重ねて形成する必要がある。
各機能膜毎に膜の材料が異なったり、膜の形成方法や処
理条件が異なる。但し、多くの薄膜形成方法では、薄膜
形成を行う処理雰囲気を真空あるいは真空に近い減圧下
に維持しておくのが普通である。
2. Description of the Related Art A thin film forming apparatus is an extremely important facility in semiconductor device manufacturing technology. In semiconductor devices,
It is necessary to form an insulating film such as an oxide film, a conductive metal film serving as an electrode, a semiconductor film, and other thin films having various functions on the surface of a substrate made of silicon, etc., in multiple layers.
The film material differs for each functional film, and the film forming method and processing conditions also differ. However, in many thin film forming methods, it is usual to maintain the processing atmosphere for forming the thin film under vacuum or under reduced pressure close to vacuum.

【0003】半導体装置の製造ラインでは、各機能膜に
合わせて、それぞれ構造や処理条件等の異なる多数の薄
膜形成装置が設置されており、半導体基板を順次適当な
薄膜形成装置へと送り込んで、必要な処理工程を行わせ
るようにしている。
In a semiconductor device manufacturing line, a large number of thin film forming apparatuses having different structures and processing conditions are installed in accordance with each functional film. The semiconductor substrate is sequentially fed into an appropriate thin film forming apparatus, The necessary processing steps are carried out.

【0004】[0004]

【発明が解決しようとする課題】ところが、上記のよう
に、多数の薄膜形成装置を組み合わせて使用する場合、
それぞれの薄膜形成装置毎に、制御された一定容積以上
の処理雰囲気を作り出すための真空発生装置が必要にな
り、そのための設備コストおよび稼働コストが高くつく
という問題があった。また、各薄膜形成装置の作動機構
などから発生する粉塵が、半導体基板の表面に付着する
という問題もあった。
However, when a large number of thin film forming apparatuses are used in combination as described above,
Each thin film forming apparatus requires a vacuum generating device for creating a controlled processing atmosphere of a certain volume or more, and there is a problem that equipment cost and operating cost for that are high. Further, there is also a problem that dust generated from the operating mechanism of each thin film forming apparatus adheres to the surface of the semiconductor substrate.

【0005】さらに、半導体基板を、各薄膜形成装置の
処理室に出し入れする作業に手間がかかるという問題も
あった。これは、それぞれの薄膜形成装置で、処理室を
真空雰囲気に制御するには、基板の出し入れを行う開口
部を厳重な密閉構造にしておかなければならず、このよ
うな開口部の開閉操作には手間がかかり、作業時間が長
くなってしまうのである。また、このような開口部の密
閉構造もしくは開閉構造を各薄膜形成装置毎に設置して
おく必要があるので、この点でも設備コストを増大させ
ることになる。しかも、各開口部の開閉操作に伴って、
前記したような粉塵の発生が起きることになる。
Further, there is a problem that it takes time and effort to put the semiconductor substrate in and out of the processing chamber of each thin film forming apparatus. This is because in each thin film forming apparatus, in order to control the processing chamber to a vacuum atmosphere, the opening for loading and unloading the substrate must have a strict closed structure. Is time-consuming and takes a lot of time. Further, since it is necessary to install such a closed structure or opening / closing structure of the opening in each thin film forming apparatus, this also increases the equipment cost. Moreover, with the opening and closing operation of each opening,
The generation of dust as described above will occur.

【0006】そこで、この発明の課題は、上記した半導
体装置の製造ラインなどで使用され、複数の異なる薄膜
形成工程を行うことのできる薄膜形成装置であって、真
空発生装置などの構造が簡単で能率的に作業を行え、作
動機構からの粉塵の発生も少ない薄膜形成装置を提供す
るものである。
Therefore, an object of the present invention is a thin film forming apparatus used in the above-mentioned semiconductor device manufacturing line or the like and capable of performing a plurality of different thin film forming steps. It is intended to provide a thin film forming apparatus that can perform work efficiently and generate little dust from an operating mechanism.

【0007】[0007]

【課題を解決するための手段】上記課題を解決する、こ
の発明にかかる薄膜形成装置は、一端に開口面を有し内
部に薄膜形成手段を備えた処理室が、円周上の複数個所
に固定設置され、各処理室の開口面に対向して、処理室
全体の中心回りに回転する基板保持体を備え、基板保持
体には、処理室との対向面で処理室と同じ円周上に複数
の処理基板が搭載でき、各処理室の開口面が基板保持体
により実質的に密閉されるようになっている。
SUMMARY OF THE INVENTION In order to solve the above problems, a thin film forming apparatus according to the present invention has a plurality of processing chambers each having an opening surface at one end and a thin film forming means inside the chamber. The substrate holder is fixedly installed and faces the opening surface of each processing chamber and rotates around the center of the entire processing chamber. The substrate holding member has a surface facing the processing chamber on the same circumference as the processing chamber. A plurality of processing substrates can be mounted on the substrate, and the opening surface of each processing chamber is substantially sealed by the substrate holder.

【0008】処理室は、処理基板の表面に薄膜を形成す
るための、薄膜材料の蒸着源や電圧印加機構、加熱機
構、プラズマ発生機構、その他の通常の薄膜形成装置に
装備されている各種の機構を備えている。処理室には、
薄膜形成を行う際に必要な真空あるいは減圧雰囲気を作
るための真空発生機構も備えている。なお、1個所の真
空発生機構で、複数の処理室に同時に真空雰囲気を作る
ようにしてもよい。この発明では、同じ構造の薄膜形成
機構を備えた処理室を複数設けておいてもよいし、異な
る薄膜形成方法を行う構造の異なる薄膜形成機構を備え
た処理室を組み合わせて用いることもできる。
The processing chamber is used for forming a thin film on the surface of a processing substrate, a thin film material vapor deposition source, a voltage applying mechanism, a heating mechanism, a plasma generating mechanism, and various other types of thin film forming apparatuses equipped in a normal thin film forming apparatus. It has a mechanism. In the processing room,
It also has a vacuum generation mechanism for creating a vacuum or a reduced pressure atmosphere required when forming a thin film. It should be noted that a single vacuum generation mechanism may simultaneously create a vacuum atmosphere in a plurality of processing chambers. In the present invention, a plurality of processing chambers having the same thin film forming mechanism may be provided, or a combination of processing chambers having different thin film forming mechanisms for performing different thin film forming methods may be used in combination.

【0009】複数の処理室は、ひとつの円周上に固定設
置される。各処理室は円周上で等間隔に配置されている
のが好ましい。各処理室の一端には開口面が設けられ
る。この開口面に処理基板を配置した状態で、前記した
薄膜形成機構が機能するように構成されている。開口面
の形状および大きさは、処理基板よりも少し大きな程度
に設定される。開口面には、後述する基板保持体による
密閉状態が良好になるように、弾力的に変形して基板保
持体と密着するパッキン材などを装着しておくことがで
きる。また、後述する予備真空室などを設けておく場合
には、基板保持体と開口面の表面との間隙をある程度よ
りも小さくしておき、各処理室と予備真空室などとの間
に一定の差圧が生じるようにしておけば、基板保持体と
開口面が密着していなくても、各処理室の内部環境に悪
影響を生じない程度に、実質的に密閉された状態に維持
することが可能である。
A plurality of processing chambers are fixedly installed on one circumference. The processing chambers are preferably arranged at equal intervals on the circumference. An opening surface is provided at one end of each processing chamber. The thin film forming mechanism described above is configured to function with the processing substrate placed on the opening surface. The shape and size of the opening surface are set to be slightly larger than the processing substrate. A packing material or the like that is elastically deformed and adheres tightly to the substrate holder can be attached to the opening surface so that a sealed state by the substrate holder described later becomes good. In addition, when a preliminary vacuum chamber or the like described later is provided, the gap between the substrate holder and the surface of the opening surface is set to be smaller than a certain amount, and a constant space is provided between each processing chamber and the preliminary vacuum chamber. If a pressure difference is created, even if the substrate holder is not in close contact with the opening surface, it can be maintained in a substantially sealed state to the extent that it does not adversely affect the internal environment of each processing chamber. It is possible.

【0010】処理室の形状は、処理基板に対して目的と
する薄膜形成が行えれば、任意の形状でよいが、例え
ば、円筒形のものや、多数の処理室が互いに密接して環
状に配置され、個々の処理室が断面扇形の筒状をなすも
のなどが挙げられる。
The shape of the processing chamber may be any shape as long as a desired thin film can be formed on the processing substrate. For example, a cylindrical shape or a large number of processing chambers closely contacting each other in an annular shape. An example is one in which the processing chambers are arranged and each processing chamber has a fan-shaped cross section.

【0011】基板保持体は、モータ等で回転駆動され、
その回転する表面に、半導体基板などの薄膜形成を行う
処理基板を搭載できるようになっている。基板保持体
は、円周上に配置された処理室の開口面と対向する位置
で、処理室全体の中心回りに回転する。基板保持体の回
転は、一定角度毎の間欠回転が行えるようにしておく。
処理基板の搭載個所は、処理室との対向面で、処理室が
配置された円周と同じ半径の円周上に設定される。処理
基板の搭載個所は、前記円周上で処理室の設置間隔と同
じ間隔に配置しておくのが好ましい。また、処理室の設
置間隔に対して、2倍等の整数倍、あるいは、半分、3
分の1などの設置間隔で処理基板の搭載個所を配置して
おいてもよい。
The substrate holder is rotationally driven by a motor or the like,
A processing substrate for forming a thin film such as a semiconductor substrate can be mounted on the rotating surface. The substrate holder rotates around the center of the entire processing chamber at a position facing the opening surface of the processing chamber arranged on the circumference. The rotation of the substrate holder should be such that intermittent rotation can be performed at regular intervals.
The mounting location of the processing substrate is set on the circumference facing the processing chamber and having the same radius as the circumference in which the processing chamber is arranged. It is preferable that the processing substrates are mounted at the same intervals on the circumference as the processing chambers. In addition, the installation interval of the processing chamber is an integral multiple such as double, or half or three.
The processing substrate mounting locations may be arranged at intervals of one-half or the like.

【0012】基板保持体は、その回転面と直交する方向
すなわち回転軸の軸方向に移動自在にしておけば、基板
保持体を処理室の開口面に押し当てて確実に密閉した
り、基板保持体を処理室の開口面と接触せずに回転させ
たりすることができる。基板保持体を回転軸の軸方向に
移動させるには、シリンダ機構やカム機構などの通常の
機械装置における直線的な移動機構を備えておけばよ
い。
If the substrate holder is made movable in a direction orthogonal to its rotation surface, that is, in the axial direction of the rotation axis, the substrate holder is pressed against the opening surface of the processing chamber to surely seal or hold the substrate. The body can be rotated without coming into contact with the open surface of the processing chamber. In order to move the substrate holder in the axial direction of the rotating shaft, a linear moving mechanism in a normal mechanical device such as a cylinder mechanism or a cam mechanism may be provided.

【0013】処理基板は、シリコン、ガラス、セラミッ
ク、その他、目的や用途に応じて任意の基板材料からな
るものが使用され、矩形、円形、その他の任意の板形状
をなしている。
The processing substrate is made of silicon, glass, ceramics, or any other substrate material depending on the purpose and application, and has a rectangular, circular, or any other plate shape.

【0014】基板保持体の表面に半導体基板を搭載する
には、基板保持体の表面に、係合突起や係合溝など、処
理基板の外周縁などに係脱して処理基板を固定できる支
持手段を設けておけばよい。バネ等の弾力的な支持手段
を用いることもできる。このような処理基板の搭載構造
は、基本的には、通常の薄膜形成装置や半導体基板の処
理装置と同様の構造が採用できる。
In order to mount a semiconductor substrate on the surface of the substrate holder, a supporting means for fixing the processing substrate on the surface of the substrate holder by engaging and disengaging with the outer peripheral edge of the processing substrate such as engaging protrusions and engaging grooves. Should be provided. A resilient support means such as a spring can also be used. As a mounting structure of such a processing substrate, basically the same structure as a general thin film forming apparatus or a semiconductor substrate processing apparatus can be adopted.

【0015】前記したように、処理室は必要な真空雰囲
気に維持されるが、基板保持体の周囲を予備的な真空空
間もしくは減圧空間にしておくこともできる。すなわ
ち、各処理室の開口面から基板保持体を外周を囲む一定
容積の予備真空室を設けておけばよい。この予備真空室
は、薄膜形成工程を行う処理室ほど高い真空状態を維持
しておかなくてもよい。逆に、予備真空室を処理室より
も高い真空状態にして、薄膜形成処理に有害な粉塵やガ
スなどが予備真空室側から処理室側に流れ込まないよう
にすることも出来る。予備真空室には、処理基板を出し
入れする供給取出口を設けておく。
As described above, the processing chamber is maintained in a necessary vacuum atmosphere, but the periphery of the substrate holder can be set as a preliminary vacuum space or a reduced pressure space. That is, it is only necessary to provide a preliminary vacuum chamber having a constant volume, which surrounds the outer periphery of the substrate holder from the opening surface of each processing chamber. The preliminary vacuum chamber does not have to maintain a higher vacuum state than the processing chamber in which the thin film forming process is performed. On the contrary, the preliminary vacuum chamber may be set to a vacuum state higher than that of the processing chamber so that dust and gas harmful to the thin film forming process do not flow from the preliminary vacuum chamber side to the processing chamber side. The preliminary vacuum chamber is provided with a supply / eject port for taking in and out the processed substrate.

【0016】[0016]

【作用】基板保持体に複数の処理基板を搭載した状態
で、円周上に配置された処理室の各開口面を基板保持体
で密閉すれば、処理室の開口面と同じ円周上に搭載され
た処理基板は、開口面から処理室の内部に挿入された状
態になる。
When a plurality of processing substrates are mounted on the substrate holder, each opening surface of the processing chambers arranged on the circumference is sealed by the substrate holder, so that the same circumference as the opening surface of the processing chamber is obtained. The mounted processing substrate is inserted into the processing chamber through the opening surface.

【0017】基板保持体で密閉された処理室内を、薄膜
形成等に必要な真空雰囲気あるいは減圧雰囲気にした
後、薄膜形成手段を作動させて、基板保持体に搭載され
た処理基板に、所定の薄膜形成処理を施すことができ
る。各処理室毎に、別の薄膜処理を行えば、基板保持体
に搭載された各処理基板毎に別の薄膜処理工程が行われ
ることになる。
The processing chamber sealed by the substrate holder is made to have a vacuum atmosphere or a reduced pressure atmosphere necessary for thin film formation, and then the thin film forming means is operated to set a predetermined amount on the processing substrate mounted on the substrate holder. A thin film forming process can be performed. If another thin film processing is performed for each processing chamber, another thin film processing step is performed for each processing substrate mounted on the substrate holder.

【0018】1段階の薄膜処理工程が終了すれば、基板
保持体を各処理室の開口面から離して、各処理室の密閉
状態を解除して、基板保持体を所定角度だけ回転させ
る。また、基板保持体を囲む予備真空室を備えていて、
各処理室の真空圧の差が少ない場合には、基板保持体と
開口面との間に間隙があっても、その間隙が小さければ
各処理室内を実質的な密閉状態に保つことができるの
で、このようなわずかな間隙を保持したままで、基板保
持体を回転させてもよい。このようにして、各処理基板
を、順番に、次の薄膜形成工程を行う処理室の開口面と
対面する位置に移動させることができる。その後、前記
同様の手順で薄膜形成工程を行うことになる。
When the one-step thin film processing step is completed, the substrate holder is separated from the opening surface of each processing chamber, the sealed state of each processing chamber is released, and the substrate holder is rotated by a predetermined angle. In addition, a preliminary vacuum chamber surrounding the substrate holder is provided,
When the difference in vacuum pressure between the processing chambers is small, even if there is a gap between the substrate holder and the opening surface, if the gap is small, it is possible to keep each processing chamber in a substantially sealed state. The substrate holder may be rotated while maintaining such a slight gap. In this way, each processing substrate can be sequentially moved to a position facing the opening surface of the processing chamber where the next thin film forming step is performed. After that, the thin film forming step is performed in the same procedure as described above.

【0019】上記のような、基板保持体の間欠回転動作
と処理室における薄膜処理工程とを繰り返すことによっ
て、基板保持体に搭載された処理基板に、複数段階の薄
膜処理工程を施すことができる。
By repeating the intermittent rotation operation of the substrate holder and the thin film processing step in the processing chamber as described above, it is possible to perform a plurality of thin film processing steps on the processed substrate mounted on the substrate holder. ..

【0020】なお、所定の薄膜処理が完了した処理基板
は、基板保持体から取り外して回収すればよく、基板保
持体の処理基板を取り外した個所には新たな処理基板を
搭載して、前記のような薄膜形成工程を行う。
The processed substrate on which the predetermined thin film processing has been completed may be removed from the substrate holder and collected, and a new processed substrate may be mounted on the portion of the substrate holder where the processed substrate has been removed, and Such a thin film forming process is performed.

【0021】上記の方法では、基板保持体の作動によ
り、処理室の開口面の密封あるいは開放する開閉手段と
しての役割と、処理基板を各処理室に出し入れしたり、
処理基板を順次別の処理室へと移したりする役割の全て
を兼ねることができるので、各処理室毎に開閉手段を設
置したり、処理基板の取扱い手段を設置したりする必要
がなくなり、設備の簡略化および作業時間の短縮化が図
れる。しかも、粉塵の発生する原因となる作動機構が簡
略化あるいは省略されれば、粉塵の発生および半導体基
板への付着も減少することになる。
In the above method, the operation of the substrate holder serves as an opening / closing means for sealing or opening the opening surface of the processing chamber, and for loading / unloading the processing substrate into / from each processing chamber.
Since it can also have the role of sequentially moving the processing substrates to different processing chambers, there is no need to install an opening / closing means or a processing substrate handling means for each processing chamber, and the equipment can be used. Can be simplified and the working time can be shortened. Moreover, if the operating mechanism that causes dust is simplified or omitted, dust generation and adhesion to the semiconductor substrate are reduced.

【0022】[0022]

【実施例】ついで、この発明の実施例を図面を参照しな
がら以下に説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0023】図1および図2は、薄膜形成装置の全体構
造を示している。処理室10は概略円筒状をなし、上部
が開放されていて開口面12となっている。処理室10
の底部付近には、目的とする薄膜形成工程を行うのに必
要な蒸着源や加熱機構などからなる薄膜形成手段14が
装備されている。多数(図2では8個)の処理室10
が、同じ円周上に等間隔で配置されており、各処理室1
0の開口面12が同じ平面に並んでいる。処理室10に
は、処理室10内を所定の真空雰囲気に維持する真空発
生装置(図示せず)が連結されている。処理室10に不
活性ガスその他のガスを供給する必要がある場合には、
これらのガス供給装置も連結される。その他、処理室1
0には、薄膜形成に必要な各種の設備類を設置しておく
ことができる。処理室10の開口面12には円環状のパ
ッキン材16が装着されている。
1 and 2 show the overall structure of the thin film forming apparatus. The processing chamber 10 has a substantially cylindrical shape, and the upper portion thereof is open to form an opening surface 12. Processing room 10
A thin film forming means 14 including a vapor deposition source and a heating mechanism necessary for performing an intended thin film forming step is provided near the bottom of the. A large number (8 in FIG. 2) of processing chambers 10
Are arranged at equal intervals on the same circumference, and each processing chamber 1
The opening surfaces 12 of 0 are arranged in the same plane. A vacuum generating device (not shown) that maintains the inside of the processing chamber 10 in a predetermined vacuum atmosphere is connected to the processing chamber 10. When it is necessary to supply an inert gas or other gas to the processing chamber 10,
These gas supply devices are also connected. Others, processing room 1
Various equipments necessary for forming a thin film can be installed at 0. An annular packing material 16 is attached to the opening surface 12 of the processing chamber 10.

【0024】処理室10の上方には円板状の基板保持体
20が配置されている。基板保持体20は、複数の処理
室10が配置された円周の中心位置に設けられた回転軸
22の上端に取り付けられており、基板保持体20が水
平面内で回転するようになっている。回転軸22には、
モータ等の駆動手段(図示せず)が連結されている。ま
た、回転軸22は、シリンダ機構などで垂直方向に昇降
できるようになっている。モータや前記真空発生装置な
どの設備類は、処理室10下方の基台部50に収容され
ている。
A disk-shaped substrate holder 20 is arranged above the processing chamber 10. The substrate holder 20 is attached to the upper end of a rotary shaft 22 provided at the center of the circumference where a plurality of processing chambers 10 are arranged, and the substrate holder 20 is adapted to rotate in a horizontal plane. .. On the rotary shaft 22,
Driving means (not shown) such as a motor is connected. Further, the rotary shaft 22 can be vertically moved by a cylinder mechanism or the like. Equipment such as a motor and the vacuum generator is housed in a base 50 below the processing chamber 10.

【0025】基板保持体20の下面には、矩形状の処理
基板30が搭載される。処理基板30の搭載個所は、処
理室10が配置された円周と同じ半径の円周上に、処理
室10の設置間隔と同じ間隔で配置されており、図2に
示すように、各処理室10の真上に処理基板30が配置
されるようになっている。
A rectangular processing substrate 30 is mounted on the lower surface of the substrate holder 20. The mounting locations of the processing substrates 30 are arranged on the circumference having the same radius as the circumference in which the processing chamber 10 is arranged, at the same intervals as the installation intervals of the processing chambers 10. As shown in FIG. The processing substrate 30 is arranged directly above the chamber 10.

【0026】処理室10の上部付近から基板保持体20
の外周全体を含む空間を囲んで、予備真空室40が設け
られている。予備真空室40にも、処理室10と同様の
真空発生装置が接続されている。また、予備真空室40
には、処理基板30を出し入れするための供給排出口
(図示せず)を設けておく。
From the upper portion of the processing chamber 10 to the substrate holder 20.
A preliminary vacuum chamber 40 is provided so as to surround a space including the entire outer periphery of the. A vacuum generator similar to that in the processing chamber 10 is also connected to the preliminary vacuum chamber 40. In addition, the preliminary vacuum chamber 40
Is provided with a supply / discharge port (not shown) for taking in and out the processed substrate 30.

【0027】図3は、基板保持体20に処理基板30を
搭載するための構造を、下面側から見た状態で示してい
る。基板保持体20の表面には、処理基板30の外形よ
りも少し大きな矩形の凹入部24が設けられている。処
理基板30の外周縁に相当する位置には、頭部が拡大し
た固定ピン26が設けられている。固定ピン26の頭部
と凹入部24の底面との間に処理基板30が挟み込める
ようになっている。固定ピン26は、処理基板30の隣
接する2辺に対応する位置に設けられている。固定ピン
26が設けられていない側の辺には、板バネ28が取り
付けられている。板バネ28は、先端が処理基板30の
外周辺に当接して、処理基板30を固定ピン26側に向
かって弾力的に付勢できるようになっている。
FIG. 3 shows a structure for mounting the processing substrate 30 on the substrate holder 20 as viewed from the lower surface side. On the surface of the substrate holder 20, a rectangular recess 24 that is slightly larger than the outer shape of the processing substrate 30 is provided. A fixing pin 26 having an enlarged head is provided at a position corresponding to the outer peripheral edge of the processing substrate 30. The processing substrate 30 is sandwiched between the head of the fixing pin 26 and the bottom surface of the recess 24. The fixing pin 26 is provided at a position corresponding to two adjacent sides of the processing substrate 30. A leaf spring 28 is attached to the side on which the fixing pin 26 is not provided. The tip of the leaf spring 28 abuts on the outer periphery of the processing substrate 30 so that the processing substrate 30 can be elastically biased toward the fixing pin 26 side.

【0028】処理基板30を基板保持体20に搭載する
ときには、処理基板30の2辺を固定ピン26と凹入部
24の隙間に滑り込ませるようにした後、板バネ28を
処理基板30を固定ピン26側に押え付けるようにすれ
ば、処理基板30は定位置で固定される。処理基板30
を取り外すには、上記と逆の動作を行えばよい。
When the processing substrate 30 is mounted on the substrate holder 20, the two sides of the processing substrate 30 are slid into the gap between the fixing pin 26 and the recess 24, and then the leaf spring 28 is fixed to the processing substrate 30. If it is pressed against the 26 side, the processing substrate 30 is fixed at a fixed position. Processing substrate 30
To remove, the operation reverse to the above may be performed.

【0029】以上のような構造を有する薄膜形成装置の
作動について説明する。基板保持体20に処理基板30
を搭載した状態で、基板保持体20を予備真空室40内
で各処理室10の上方に配置する。基板保持体20に接
続された回転軸22を下降させると、基板保持体20の
下面が処理室10の開口面12に設けられたパッキン材
16に当接して、処理室10内を密閉する。基板保持体
20の下面に搭載された処理基板30は、それぞれ対面
する処理室10の内部に収容される。
The operation of the thin film forming apparatus having the above structure will be described. Processing substrate 30 on substrate holder 20
With the substrate mounted, the substrate holder 20 is arranged in the preliminary vacuum chamber 40 above each processing chamber 10. When the rotary shaft 22 connected to the substrate holder 20 is lowered, the lower surface of the substrate holder 20 contacts the packing material 16 provided on the opening surface 12 of the processing chamber 10 to seal the inside of the processing chamber 10. The processing substrates 30 mounted on the lower surface of the substrate holder 20 are housed inside the processing chambers 10 facing each other.

【0030】この状態で、処理室10内を真空排気した
り、真空排気すると同時に特定のガス成分を供給したり
して、薄膜形成に必要な制御された雰囲気を維持した状
態で、薄膜形成手段14により薄膜形成工程が行われ
る。処理基板30の表面には、所定の金属などからなる
薄膜が形成される。
In this state, the inside of the processing chamber 10 is evacuated, or a specific gas component is supplied at the same time as evacuated to maintain a controlled atmosphere necessary for forming a thin film. A thin film forming process is performed by 14. A thin film made of a predetermined metal or the like is formed on the surface of the processing substrate 30.

【0031】1段階の薄膜形成工程が終了すれば、基板
保持体20を上昇させて、処理室10内の密閉状態を解
除し、基板保持体20をパッキン材16から離した状態
で、回転軸22すなわち基板保持体20を一定角度回転
させる。なお、各処理室10の差圧が少なければ、基板
保持体20と開口面12の間に常に小さな間隙を保って
おいて、各処理室10を実質的な密閉状態に維持したま
まで、基板保持体20を上昇させることなく回転させて
もよい。基板保持体20の回転角度は、処理基板30が
ひとつの処理室10の真上から次の処理室10の真上ま
で移動するように設定されている。このとき、基板保持
体20を上昇させて処理室10内を開放しても、予備真
空室40に開放されるだけで、外部の大気が侵入するこ
とはないので、各処理室10の制御された雰囲気が大き
く乱される心配はない。また、基板保持体20と処理室
10の開口面12の間に小さな間隙をあけたままで、滑
らせるように回転させれば、処理室10の内部をほぼ密
閉したままの状態で、処理室10間における処理基板3
0の移し換えを行うことも可能である。
When the one-step thin film forming process is completed, the substrate holder 20 is lifted to release the hermetically sealed state in the processing chamber 10, and the substrate holder 20 is separated from the packing material 16. 22 That is, the substrate holder 20 is rotated by a certain angle. If the pressure difference between the processing chambers 10 is small, a small gap is always maintained between the substrate holder 20 and the opening surface 12 to maintain the substrate 10 in a substantially sealed state. The holder 20 may be rotated without raising it. The rotation angle of the substrate holder 20 is set so that the processing substrate 30 moves from directly above one processing chamber 10 to immediately above the next processing chamber 10. At this time, even if the substrate holder 20 is lifted and the inside of the processing chamber 10 is opened, it is only opened to the preliminary vacuum chamber 40, and the outside atmosphere does not enter. Therefore, each processing chamber 10 is controlled. There is no worry that the atmosphere will be greatly disturbed. Further, if a small gap is left between the substrate holder 20 and the opening surface 12 of the processing chamber 10 and the assembly is rotated so as to slide, the inside of the processing chamber 10 remains almost sealed and the processing chamber 10 is kept closed. Substrate 3 between
It is also possible to transfer 0.

【0032】その後、前記同様に、基板保持体20の下
降、処理室10内における所定の薄膜形成工程を行え
ば、処理基板30の表面には新たな薄膜が形成される。
このような工程を繰り返すことによって、処理基板30
の表面には目的とする複数層の薄膜が積層形成されるこ
とになる。
Thereafter, similarly to the above, if the substrate holder 20 is lowered and a predetermined thin film forming step in the processing chamber 10 is performed, a new thin film is formed on the surface of the processing substrate 30.
By repeating such steps, the processed substrate 30
A plurality of desired thin films are laminated on the surface of the.

【0033】処理基板30に対する薄膜形成工程が完了
すれば、基板保持体20から処理基板30を取り外し
て、処理基板30のみを予備真空室40から取り出す
か、基板保持体20全体を予備真空室40から取り出し
た後、基板保持体20から処理基板30を取り外すかし
て、処理基板30を回収すればよい。
When the thin film forming process for the processed substrate 30 is completed, the processed substrate 30 is removed from the substrate holder 20 and only the processed substrate 30 is taken out from the preliminary vacuum chamber 40, or the entire substrate holder 20 is preliminary vacuum chamber 40. After removing the processing substrate 30, the processing substrate 30 may be removed from the substrate holder 20 to recover the processing substrate 30.

【0034】[0034]

【発明の効果】以上に述べた、この発明にかかる薄膜形
成装置によれば、処理基板を搭載した基板保持体の作動
により、処理基板の処理室への出し入れ、処理室の密閉
および開放、複数の処理室間における処理基板の移し換
えなどが全て行われるので、極めて簡単な構造の設備で
効率的に、複数の処理室を用いた薄膜形成工程を行うこ
とができる。すなわち、従来の薄膜形成装置のように、
各処理工程毎に、別々の薄膜形成装置を用いたり、各処
理室毎にそれぞれ別の密閉手段や開閉手段を設置してお
いたり、各処理室間の処理基板の移送手段を外部に設置
しておいたりするような複雑で大がかりな設備が不要に
なり、処理室間における処理基板の移し換え作業も非常
に簡単になり、必要な作業時間も大幅に短縮されるので
ある。
As described above, according to the thin film forming apparatus of the present invention, the operation of the substrate holder on which the processing substrate is mounted causes the processing substrate to be taken in and out of the processing chamber, the processing chamber to be sealed and opened, and a plurality of processing chambers to be sealed. Since the processing substrates are all transferred between the processing chambers, it is possible to efficiently perform a thin film forming process using a plurality of processing chambers with equipment having an extremely simple structure. That is, like a conventional thin film forming apparatus,
Separate thin film forming equipment is used for each processing step, different sealing means and opening / closing means are installed for each processing chamber, and processing substrate transfer means between each processing chamber is installed outside. This eliminates the need for complicated and large-scale equipment such as storage, makes it very easy to transfer the processing substrates between processing chambers, and significantly reduces the required work time.

【0035】また、各種の作動機構が簡略化できたり省
略されれば、作動機構における粉塵の発生も減少し、粉
塵による薄膜形成処理への悪影響を大幅に削減できる。
Further, if the various operating mechanisms can be simplified or omitted, the generation of dust in the operating mechanism can be reduced, and the adverse effect of dust on the thin film forming process can be greatly reduced.

【0036】しかも、この発明では、各処理室は、互い
に確実に分離された密閉空間を形成することができるの
で、それぞれの処理室に異なる雰囲気環境を容易に設定
することができ、複数の処理室毎に最も適した雰囲気で
薄膜形成を行うことが可能になる。各処理室の容積は、
処理基板に対する薄膜形成工程に必要なだけの最小限の
容積しか必要としないので、真空排気などの作業も容易
に行え、真空発生装置などの設備も小型化できる。
Moreover, in the present invention, since each processing chamber can form a closed space which is surely separated from each other, different atmospheric environments can be easily set in each processing chamber, and a plurality of processings can be performed. It becomes possible to form a thin film in the most suitable atmosphere for each room. The volume of each processing chamber is
Since the minimum volume required for the thin film forming process on the processing substrate is required, work such as evacuation can be easily performed, and equipment such as a vacuum generator can be downsized.

【図面の簡単な説明】[Brief description of drawings]

【図1】 この発明の実施例を示す一部断面正面図FIG. 1 is a partially sectional front view showing an embodiment of the present invention.

【図2】 装置内部の一部切欠上面図FIG. 2 is a partially cutaway top view of the inside of the device.

【図3】 処理基板の支持手段を示す要部斜視図FIG. 3 is a perspective view of an essential part showing a supporting means of a processing substrate.

【符号の説明】[Explanation of symbols]

10 処理室 12 開口面 14 薄膜形成手段 20 基板保持体 30 処理基板 DESCRIPTION OF SYMBOLS 10 Processing chamber 12 Opening surface 14 Thin film forming means 20 Substrate holder 30 Processing substrate

フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/68 A 8418−4M Continuation of front page (51) Int.Cl. 5 Identification code Office reference number FI technical display location H01L 21/68 A 8418-4M

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 一端に開口面を有し内部に薄膜形成手段
を備えた処理室が、円周上の複数個所に固定設置され、
各処理室の開口面に対向して、処理室全体の中心回りに
回転する基板保持体を備え、基板保持体には、処理室と
の対向面で処理室と同じ円周上に複数の処理基板が搭載
でき、各処理室の開口面が基板保持体により実質的に密
閉されるようになっていることを特徴とする薄膜形成装
置。
1. A processing chamber having an opening surface at one end and having a thin film forming means inside is fixedly installed at a plurality of locations on a circumference,
A substrate holder that rotates around the center of the entire processing chamber is provided so as to face the opening surface of each processing chamber. The substrate holder has a plurality of treatments on the same circumference as the processing chamber on the surface facing the treatment chamber. A thin film forming apparatus, wherein a substrate can be mounted, and an opening surface of each processing chamber is substantially sealed by a substrate holder.
JP11830591A 1991-05-23 1991-05-23 Thin film forming device Pending JPH05179428A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11830591A JPH05179428A (en) 1991-05-23 1991-05-23 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11830591A JPH05179428A (en) 1991-05-23 1991-05-23 Thin film forming device

Publications (1)

Publication Number Publication Date
JPH05179428A true JPH05179428A (en) 1993-07-20

Family

ID=14733398

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11830591A Pending JPH05179428A (en) 1991-05-23 1991-05-23 Thin film forming device

Country Status (1)

Country Link
JP (1) JPH05179428A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07161801A (en) * 1993-12-02 1995-06-23 Nippon Telegr & Teleph Corp <Ntt> Substrate holder
JPH11502049A (en) * 1995-01-13 1999-02-16 ザクリイトエ アクトシオネルノエ オブスケストボ ナウクノ−プロイズボドストベナザ フイルマ ″アズ″ Equipment for processing wafers with plasma jet
EP1069599A3 (en) * 1999-07-15 2002-12-04 MooHan Co., Ltd Apparatus for deposition of thin films on wafers
JP2004273893A (en) * 2003-03-11 2004-09-30 Eiko Engineering Co Ltd Vacuum processor having a plurality of processing stations
JP2006274396A (en) * 2005-03-30 2006-10-12 Showa Shinku:Kk Method and apparatus for forming thin film
WO2015151676A1 (en) * 2014-03-31 2015-10-08 東京エレクトロン株式会社 Substrate processing system
JP2020204088A (en) * 2019-06-18 2020-12-24 采▲ぎょく▼科技股▲ふん▼有限公司VisEra Technologies Company Limited Coater

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07161801A (en) * 1993-12-02 1995-06-23 Nippon Telegr & Teleph Corp <Ntt> Substrate holder
JPH11502049A (en) * 1995-01-13 1999-02-16 ザクリイトエ アクトシオネルノエ オブスケストボ ナウクノ−プロイズボドストベナザ フイルマ ″アズ″ Equipment for processing wafers with plasma jet
US6845733B1 (en) 1995-01-13 2005-01-25 Samsung Electronics Co., Ltd. Device for treating planar elements with a plasma jet
EP1069599A3 (en) * 1999-07-15 2002-12-04 MooHan Co., Ltd Apparatus for deposition of thin films on wafers
JP2004273893A (en) * 2003-03-11 2004-09-30 Eiko Engineering Co Ltd Vacuum processor having a plurality of processing stations
JP2006274396A (en) * 2005-03-30 2006-10-12 Showa Shinku:Kk Method and apparatus for forming thin film
JP4737746B2 (en) * 2005-03-30 2011-08-03 株式会社昭和真空 Thin film forming method and apparatus
WO2015151676A1 (en) * 2014-03-31 2015-10-08 東京エレクトロン株式会社 Substrate processing system
JP2015198097A (en) * 2014-03-31 2015-11-09 東京エレクトロン株式会社 substrate processing system
CN106165082A (en) * 2014-03-31 2016-11-23 东京毅力科创株式会社 Base plate processing system
JP2020204088A (en) * 2019-06-18 2020-12-24 采▲ぎょく▼科技股▲ふん▼有限公司VisEra Technologies Company Limited Coater

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