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JP7405560B2 - Resin compositions, resin films, and metal-clad laminates - Google Patents

Resin compositions, resin films, and metal-clad laminates Download PDF

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JP7405560B2
JP7405560B2 JP2019196673A JP2019196673A JP7405560B2 JP 7405560 B2 JP7405560 B2 JP 7405560B2 JP 2019196673 A JP2019196673 A JP 2019196673A JP 2019196673 A JP2019196673 A JP 2019196673A JP 7405560 B2 JP7405560 B2 JP 7405560B2
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resin film
spherical silica
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裕明 山田
麻織人 藤
宏遠 王
博之 出合
睦人 田中
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Nippon Steel Chemical and Materials Co Ltd
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Priority to CN202011170486.5A priority patent/CN112745676B/en
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
    • C08L79/08Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0366Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement reinforced, e.g. by fibres, fabrics
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2379/00Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen, or carbon only, not provided for in groups C08J2361/00 - C08J2377/00
    • C08J2379/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/003Additives being defined by their diameter
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/006Additives being defined by their surface area
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K7/00Use of ingredients characterised by shape
    • C08K7/16Solid spheres
    • C08K7/18Solid spheres inorganic

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laminated Bodies (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Description

本発明は、無機フィラーである球状シリカ粒子を含有する樹脂組成物、それを用いる樹脂フィルム及び金属張積層板に関する。 The present invention relates to a resin composition containing spherical silica particles as an inorganic filler, a resin film and a metal-clad laminate using the same.

近年、携帯電話、LED照明器具、自動車エンジン周り関連部品に代表されるように電子機器の小型化、軽量化に対する要求が高まってきている。それに伴い、機器の小型化、軽量化に有利なフレキシブル回路基板が電子技術分野において広く使用されるようになってきている。そして、その中でもポリイミドを絶縁層とするフレキシブル回路基板は、その耐熱性、耐薬品性などが良好なことから、広く用いられている。 In recent years, there has been an increasing demand for smaller and lighter electronic devices, such as mobile phones, LED lighting equipment, and parts related to automobile engines. Along with this trend, flexible circuit boards, which are advantageous for making devices smaller and lighter, have come to be widely used in the electronic technology field. Among these, flexible circuit boards having polyimide as an insulating layer are widely used because of their good heat resistance and chemical resistance.

一方、電気・電子機器の高性能化や高機能化に伴い、情報の高速伝送化が進展している。そのため、電気・電子機器に使用される部品や部材にも高速伝送への対応が求められている。そのような用途に使用される樹脂材料について、高速伝送化に対応した電気特性を有するように、低誘電率化、低誘電正接化を図る試みがなされている。その一例として、エポキシ樹脂、ポリイミド樹脂及び芳香族ポリアミド樹脂を含む樹脂混合物とイミダゾール系硬化触媒と無機フィラーを含む樹脂層を有し、高周波伝送に対応した誘電特性を有する樹脂付き銅箔が提案されている(例えば、特許文献1)。 On the other hand, as electrical and electronic devices become more sophisticated and functional, information transmission speeds are progressing. Therefore, parts and materials used in electrical and electronic equipment are also required to support high-speed transmission. Attempts have been made to reduce the dielectric constant and dielectric loss tangent of resin materials used in such applications so that they have electrical properties compatible with high-speed transmission. As an example, a resin-coated copper foil has been proposed that has a resin layer containing a resin mixture containing an epoxy resin, a polyimide resin, and an aromatic polyamide resin, an imidazole curing catalyst, and an inorganic filler, and has dielectric properties compatible with high frequency transmission. (For example, Patent Document 1).

国際公開WO2017/014079International publication WO2017/014079

特許文献1では、シリカなどの無機フィラーの添加によって樹脂層の誘電正接を低減できることが記載されているものの、その目的に適した無機フィラーの具体的な構成について詳細な検討はなされていない。また、無機フィラーの添加は、樹脂フィルムの折り曲げ性を低下させるなどの影響を及ぼすという問題があった。 Although Patent Document 1 describes that the dielectric loss tangent of the resin layer can be reduced by adding an inorganic filler such as silica, there is no detailed study on the specific structure of the inorganic filler suitable for that purpose. Furthermore, the addition of an inorganic filler has the problem of reducing the bendability of the resin film.

本発明の目的は、無機フィラーの添加によって折り曲げ性などの機械的特性を損なうことなく、誘電特性の改善が図られている樹脂組成物及び樹脂フィルムを提供することにある。 An object of the present invention is to provide a resin composition and a resin film whose dielectric properties are improved by adding an inorganic filler without impairing mechanical properties such as bendability.

本発明の樹脂フィルムは、単層又は複数層のポリイミド層を有する樹脂フィルムであって、
前記ポリイミド層の少なくとも1層が、球状シリカ含有ポリイミド層であり、前記球状シリカ含有ポリイミド層が、ポリアミド酸又はポリイミドと、球状シリカ粒子と、からなる樹脂組成物の硬化物である。本発明の樹脂フィルムは、レーザ回折散乱法による体積基準の粒度分布測定によって得られる前記球状シリカ粒子の頻度分布曲線が、下記の条件a~cを満たし、前記球状シリカ粒子の含有量が、該球状シリカ粒子と前記ポリアミド酸又は前記ポリイミドとの合計量に対し、20~65体積%の範囲内である。
a)累積値が50%となる平均粒子径D50が9.0~12.0μmの範囲内であること。
b)累積値が90%となる粒子径D90が15~20μmの範囲内であること。
c)累積値が100%となる粒子径D100が25μm以下であること。
The resin film of the present invention is a resin film having a single layer or multiple polyimide layers,
At least one of the polyimide layers is a spherical silica-containing polyimide layer, and the spherical silica-containing polyimide layer is a cured product of a resin composition comprising polyamic acid or polyimide and spherical silica particles. In the resin film of the present invention, the frequency distribution curve of the spherical silica particles obtained by volume-based particle size distribution measurement using a laser diffraction scattering method satisfies the following conditions a to c, and the content of the spherical silica particles satisfies the following conditions. The amount is within the range of 20 to 65% by volume based on the total amount of spherical silica particles and the polyamic acid or polyimide.
a) The average particle diameter D 50 at which the cumulative value is 50% is within the range of 9.0 to 12.0 μm.
b) The particle diameter D90 at which the cumulative value is 90% is within the range of 15 to 20 μm.
c) The particle diameter D100 at which the cumulative value is 100% is 25 μm or less.

本発明の樹脂フィルムは、前記球状シリカ粒子が、更に、下記の条件dを満たすものであってもよい。
d)頻度極大値F1及び頻度極大値F2を有し、前記F1が9.0~14.0μmの領域内、前記F2が0.5~3.0μmの領域内にあること。
In the resin film of the present invention, the spherical silica particles may further satisfy the following condition d.
d) It has a maximum frequency value F1 and a maximum frequency value F2, with F1 being in the range of 9.0 to 14.0 μm and F2 being in the range of 0.5 to 3.0 μm.

本発明の樹脂フィルムは、前記球状シリカ粒子が、更に、下記の条件eを満たすものであってもよい。
e)頻度極大値F1及び頻度極大値F2を有し、前記F1及びF2の比(F1/F2)が3~28の範囲内であること。
In the resin film of the present invention, the spherical silica particles may further satisfy the following condition e.
e) It has a maximum frequency value F1 and a maximum frequency value F2, and the ratio of F1 and F2 (F1/F2) is within the range of 3 to 28.

本発明の樹脂フィルムは、前記球状シリカ含有ポリイミド層の厚みが5~150μmの範囲内である。 In the resin film of the present invention, the thickness of the spherical silica-containing polyimide layer is within the range of 5 to 150 μm.

本発明の樹脂フィルムは、前記球状シリカ粒子の粒子径D100が前記球状シリカ含有ポリイミド層の厚みに対して0.05~0.7の範囲内であってもよい。 In the resin film of the present invention, the particle diameter D 100 of the spherical silica particles may be within a range of 0.05 to 0.7 relative to the thickness of the spherical silica-containing polyimide layer.

本発明の樹脂フィルムは、厚みが5~150μmの範囲内であり、前記球状シリカ含有ポリイミド層の厚みの割合が50%以上であってもよい。 The resin film of the present invention has a thickness within the range of 5 to 150 μm, and the thickness ratio of the spherical silica-containing polyimide layer may be 50% or more.

本発明の金属張積層板は、絶縁樹脂層と、前記絶縁樹脂層の少なくとも一方の面に積層された金属層と、を備えた金属張積層板であって、前記絶縁樹脂層が上記樹脂フィルムからなるものである。 The metal-clad laminate of the present invention is a metal-clad laminate comprising an insulating resin layer and a metal layer laminated on at least one surface of the insulating resin layer, wherein the insulating resin layer is formed of the resin film described above. It consists of

本発明の樹脂組成物は、条件a~cで表される特定の粒度分布を有する球状シリカ粒子を含有することによって、折り曲げ性などの機械的特性を低下させずに誘電特性を改善することが可能となる。そのため、本発明の樹脂組成物を使用した電気・電子機器や電子部品において、高速伝送化への対応が可能になるとともに信頼性を確保できる。 By containing spherical silica particles having a specific particle size distribution represented by conditions a to c, the resin composition of the present invention can improve dielectric properties without deteriorating mechanical properties such as bendability. It becomes possible. Therefore, in electric/electronic equipment and electronic parts using the resin composition of the present invention, it is possible to cope with high-speed transmission and ensure reliability.

以下、本発明の実施の形態について説明する。 Embodiments of the present invention will be described below.

[樹脂組成物]
本発明の一実施の形態に係る樹脂組成物は、ポリアミド酸又はポリイミドと、無機フィラーである球状シリカ粒子と、を含有する樹脂組成物である。樹脂組成物は、ポリアミド酸を含有するワニス(樹脂溶液)であってもよく、溶剤可溶性のポリイミドを含有するポリイミド溶液であってもよい。
[Resin composition]
A resin composition according to one embodiment of the present invention is a resin composition containing polyamic acid or polyimide and spherical silica particles that are an inorganic filler. The resin composition may be a varnish (resin solution) containing polyamic acid, or a polyimide solution containing solvent-soluble polyimide.

<ポリアミド酸又はポリイミド>
ポリイミドは、一般的に下記一般式(1)で表される。このようなポリイミドは、ジアミン成分と酸二無水物成分とを実質的に等モル使用し、有機極性溶媒中で重合させる公知の方法によって製造することができる。この場合、粘度を所望の範囲とするために、ジアミン成分に対する酸二無水物成分のモル比を調整してもよく、その範囲は、例えば0.980~1.03のモル比の範囲内とすることが好ましい。
<Polyamic acid or polyimide>
Polyimide is generally represented by the following general formula (1). Such a polyimide can be produced by a known method in which the diamine component and the acid dianhydride component are used in substantially equimolar amounts and polymerized in an organic polar solvent. In this case, the molar ratio of the acid dianhydride component to the diamine component may be adjusted in order to keep the viscosity within a desired range, and the range is, for example, within a molar ratio of 0.980 to 1.03. It is preferable to do so.

Figure 0007405560000001
Figure 0007405560000001

ここで、Arは芳香族環を1個以上有する4価の有機基であり、Arは芳香族環を1個以上有する2価の有機基である。そして、Arは酸二無水物の残基ということができ、Arはジアミンの残基ということができる。また、nは、一般式(1)の構成単位の繰返し数を表し、200以上、好ましくは300~1000の数である。 Here, Ar 1 is a tetravalent organic group having one or more aromatic rings, and Ar 2 is a divalent organic group having one or more aromatic rings. Ar 1 can be said to be a residue of an acid dianhydride, and Ar 2 can be said to be a residue of a diamine. Further, n represents the number of repeats of the structural unit of general formula (1), and is a number of 200 or more, preferably 300 to 1000.

酸二無水物としては、例えば、O(OC)-Ar-(CO)Oによって表される芳香族テトラカルボン酸二無水物が好ましく、下記芳香族酸無水物残基をArとして与えるものが例示される。 As the acid dianhydride, for example, an aromatic tetracarboxylic dianhydride represented by O(OC) 2 -Ar 1 -(CO) 2 O is preferable, and the aromatic acid anhydride residue shown below is represented by Ar 1. An example of what to give is given.

Figure 0007405560000002
Figure 0007405560000002

酸二無水物は、単独で又は2種以上混合して用いることができる。これらの中でも、ピロメリット酸二無水物(PMDA)、3,3',4,4'-ビフェニルテトラカルボン酸二無水物(BPDA)、3,3',4,4'-ベンゾフェノンテトラカルボン酸二無水物(BTDA)、3,3',4,4'-ジフェニルスルホンテトラカルボン酸二無水物(DSDA)、及び4,4'-オキシジフタル酸二無水物(ODPA)から選ばれるものを使用することが好ましい。 Acid dianhydrides can be used alone or in combination of two or more. Among these, pyromellitic dianhydride (PMDA), 3,3',4,4'-biphenyltetracarboxylic dianhydride (BPDA), and 3,3',4,4'-benzophenonetetracarboxylic dianhydride anhydride (BTDA), 3,3',4,4'-diphenylsulfonetetracarboxylic dianhydride (DSDA), and 4,4'-oxydiphthalic dianhydride (ODPA). is preferred.

ジアミンとしては、例えば、HN-Ar-NHによって表される芳香族ジアミンが好ましく、下記芳香族ジアミン残基をArとして与える芳香族ジアミンが例示される。 As the diamine, for example, an aromatic diamine represented by H 2 N--Ar 2 --NH 2 is preferable, and an aromatic diamine that gives the following aromatic diamine residue as Ar 2 is exemplified.

Figure 0007405560000003
Figure 0007405560000003

これらのジアミンの中でも、ジアミノジフェニルエーテル(DAPE)、2,2'-ジメチル-4,4'-ジアミノビフェニル(m-TB)、パラフェニレンジアミン(p-PDA)、1,3-ビス(4-アミノフェノキシ)ベンゼン(TPE-R)、1,3-ビス(3-アミノフェノキシ)ベンゼン(APB)、1,4-ビス(4-アミノフェノキシ)ベンゼン(TPE-Q)、2,2-ビス[4-(4-アミノフェノキシ)フェニル]プロパン(BAPP)、及び2,2-ビス(トリフルオロメチル)ベンジジン(TFMB)が好適なものとして例示される。 Among these diamines, diaminodiphenyl ether (DAPE), 2,2'-dimethyl-4,4'-diaminobiphenyl (m-TB), paraphenylenediamine (p-PDA), 1,3-bis(4-amino phenoxy)benzene (TPE-R), 1,3-bis(3-aminophenoxy)benzene (APB), 1,4-bis(4-aminophenoxy)benzene (TPE-Q), 2,2-bis[4 Suitable examples include -(4-aminophenoxy)phenyl]propane (BAPP) and 2,2-bis(trifluoromethyl)benzidine (TFMB).

ポリイミドは、酸二無水物とジアミン化合物を溶媒中で反応させ、前駆体であるポリアミド酸を生成したのち加熱閉環(イミド化)させることにより製造できる。例えば、酸二無水物とジアミン化合物をほぼ等モルで有機溶媒中に溶解させて、0~100℃の範囲内の温度で30分~24時間撹拌し重合反応させることでポリアミド酸が得られる。反応にあたっては、生成する前駆体が有機溶媒中に5~30重量%の範囲内、好ましくは10~20重量%の範囲内となるように反応成分を溶解する。重合反応に用いる有機溶媒としては、例えば、N,N-ジメチルホルムアミド(DMF)、N,N-ジメチルアセトアミド(DMAc)、N,N-ジエチルアセトアミド、N-メチル-2-ピロリドン(NMP)、2-ブタノン、ジメチルスルホキシド(DMSO)、ヘキサメチルホスホルアミド、N-メチルカプロラクタム、硫酸ジメチル、シクロヘキサノン、ジオキサン、テトラヒドロフラン、ジグライム、トリグライム、クレゾール等が挙げられる。これらの溶媒を2種以上併用することもでき、更にはキシレン、トルエンのような芳香族炭化水素の併用も可能である。また、このような有機溶媒の使用量としては特に制限されるものではないが、重合反応によって得られるポリアミド酸溶液の濃度が5~30重量%程度になるような使用量に調整して用いることが好ましい。 Polyimide can be produced by reacting an acid dianhydride and a diamine compound in a solvent to produce a polyamic acid precursor, followed by thermal ring closure (imidization). For example, a polyamic acid can be obtained by dissolving approximately equimolar amounts of an acid dianhydride and a diamine compound in an organic solvent, stirring at a temperature within the range of 0 to 100°C for 30 minutes to 24 hours, and causing a polymerization reaction. In the reaction, the reaction components are dissolved in the organic solvent so that the amount of the precursor to be produced is within the range of 5 to 30% by weight, preferably within the range of 10 to 20% by weight. Examples of organic solvents used in the polymerization reaction include N,N-dimethylformamide (DMF), N,N-dimethylacetamide (DMAc), N,N-diethylacetamide, N-methyl-2-pyrrolidone (NMP), 2 -butanone, dimethyl sulfoxide (DMSO), hexamethylphosphoramide, N-methylcaprolactam, dimethyl sulfate, cyclohexanone, dioxane, tetrahydrofuran, diglyme, triglyme, cresol and the like. Two or more of these solvents can be used in combination, and aromatic hydrocarbons such as xylene and toluene can also be used in combination. Further, the amount of such an organic solvent to be used is not particularly limited, but it should be adjusted to an amount such that the concentration of the polyamic acid solution obtained by the polymerization reaction is about 5 to 30% by weight. is preferred.

合成されたポリアミド酸は、通常、反応溶媒溶液として使用することが有利であるが、必要により濃縮、希釈又は他の有機溶媒に置換して樹脂組成物を形成することができる。ポリアミド酸をイミド化させる方法は、特に制限されず、例えば前記溶媒中で、80~400℃の範囲内の温度条件で1~24時間かけて加熱するといった熱処理が好適に採用される。 It is usually advantageous to use the synthesized polyamic acid as a reaction solvent solution, but if necessary, it can be concentrated, diluted, or substituted with another organic solvent to form a resin composition. The method of imidizing polyamic acid is not particularly limited, and for example, heat treatment such as heating in the above-mentioned solvent at a temperature within the range of 80 to 400° C. for 1 to 24 hours is preferably employed.

<球状シリカ粒子>
球状シリカ粒子は、形状が真球状に近いシリカ粒子で、平均長径と平均短径の比が1又は1に近いものをいう。球状シリカ粒子は、レーザ回折散乱法による体積基準の粒度分布測定によって得られる頻度分布曲線が下記の条件a~cを満たす。
a)累積値が50%となる平均粒子径D50が9.0~12.0μmの範囲内であること。
b)累積値が90%となる粒子径D90が15~20μmの範囲内であること。
c)累積値が100%となる粒子径D100が25μm以下であること。
<Spherical silica particles>
Spherical silica particles are silica particles that are nearly perfectly spherical in shape, and the ratio of the average major axis to the average minor axis is 1 or close to 1. For spherical silica particles, a frequency distribution curve obtained by volume-based particle size distribution measurement using a laser diffraction scattering method satisfies the following conditions a to c.
a) The average particle diameter D 50 at which the cumulative value is 50% is within the range of 9.0 to 12.0 μm.
b) The particle diameter D90 at which the cumulative value is 90% is within the range of 15 to 20 μm.
c) The particle diameter D100 at which the cumulative value is 100% is 25 μm or less.

条件aについては、球状シリカ粒子の平均粒子径D50が9.0に満たないと、誘電特性の向上効果が小さくなる。その一方で、平均粒子径D50が12.0μmを超えると、充填しづらくなったり、樹脂フィルムを形成したときに折り曲げ性が低下するなど機械的特性の維持が困難になる。
条件b、cについては、粒子径が15~25μmである球状シリカ粒子の存在比率を抑えるとともに、最大粒子径が25μm以下であることによって粗大粒子が排除されるため、樹脂フィルムを形成したときの折り曲げ性を良好なものとすることができる。
Regarding condition a, if the average particle diameter D 50 of the spherical silica particles is less than 9.0, the effect of improving dielectric properties becomes small. On the other hand, if the average particle diameter D 50 exceeds 12.0 μm, it becomes difficult to maintain mechanical properties such as filling becomes difficult and bendability decreases when a resin film is formed.
Regarding conditions b and c, the abundance ratio of spherical silica particles with a particle size of 15 to 25 μm is suppressed, and the maximum particle size of 25 μm or less eliminates coarse particles. Good bendability can be achieved.

また、球状シリカ粒子は、更に、下記の条件d及び条件eを満たすことが好ましい。
d)頻度極大値F1及び頻度極大値F2を有し、F1が9.0~14.0μmの領域内、F2が0.5~3.0μmの領域内にあること。
e)頻度極大値F1及び頻度極大値F2を有し、F1及びF2の比(F1/F2)が3~28の範囲内であること。
条件d及び条件eについては、球状シリカ粒子中に粒子径が0.5~3.0μmの範囲内の小さな球状シリカを一定量含有することによって、フィルム化したときの折り曲げ性の低下を抑制しつつ、誘電特性を更に向上させることができる。
Moreover, it is preferable that the spherical silica particles further satisfy the following conditions d and e.
d) It has a maximum frequency value F1 and a maximum frequency value F2, with F1 being in the range of 9.0 to 14.0 μm and F2 being in the range of 0.5 to 3.0 μm.
e) It has a maximum frequency value F1 and a maximum frequency value F2, and the ratio of F1 and F2 (F1/F2) is within the range of 3 to 28.
Regarding conditions d and e, by containing a certain amount of small spherical silica with a particle size in the range of 0.5 to 3.0 μm in the spherical silica particles, the decrease in bendability when formed into a film is suppressed. At the same time, the dielectric properties can be further improved.

なお、球状シリカ粒子は、市販品を適宜選定して用いることができる。例えば、球状クリストバライトシリカ粉末(日鉄ケミカル&マテリアル社製、商品名;CR10-20)、球状非晶質シリカ粉末(日鉄ケミカル&マテリアル社製、商品名;SC70-2)などを好ましく使用できる。これらは2種以上を併用できる。 Note that commercially available products can be appropriately selected and used as the spherical silica particles. For example, spherical cristobalite silica powder (manufactured by Nippon Steel Chemical & Materials, trade name: CR10-20), spherical amorphous silica powder (manufactured by Nippon Steel Chemical & Materials, trade name: SC70-2), etc. can be preferably used. . Two or more types of these can be used in combination.

<配合組成>
樹脂組成物における球状シリカ粒子の含有量は、該球状シリカ粒子とポリアミド酸又はポリイミドとの合計量に対し20~65体積%の範囲内であり、好ましくは30~60体積%の範囲内である。球状シリカ粒子の含有割合が20体積%に満たないと、誘電正接を低下させる効果が十分に得られなくなる。また、球状シリカ粒子の含有割合が65体積%を超えると、樹脂フィルムを形成したときに脆くなり、折り曲げ性が低下するとともに、樹脂フィルムを形成しようとする場合、樹脂組成物の粘度が高くなり、作業性も低下する。
<Blend composition>
The content of spherical silica particles in the resin composition is within the range of 20 to 65% by volume, preferably within the range of 30 to 60% by volume, based on the total amount of the spherical silica particles and polyamic acid or polyimide. . If the content of spherical silica particles is less than 20% by volume, the effect of lowering the dielectric loss tangent cannot be sufficiently achieved. Furthermore, if the content of spherical silica particles exceeds 65% by volume, the resin film will become brittle and have poor bending properties, and when attempting to form a resin film, the viscosity of the resin composition will increase. , workability also decreases.

本実施の形態の樹脂組成物は、有機溶媒を含有することができる。有機溶媒としては、例えば、N,N-ジメチルホルムアミド(DMF)、N,N-ジメチルアセトアミド(DMAc)、N,N-ジエチルアセトアミド、N-メチル-2-ピロリドン(NMP)、2-ブタノン、ジメチルスルホキシド(DMSO)、ヘキサメチルホスホルアミド、N-メチルカプロラクタム、硫酸ジメチル、シクロヘキサノン、ジオキサン、テトラヒドロフラン、ジグライム、トリグライム、クレゾール等が挙げられる。これらの溶媒を2種以上併用することもでき、更にはキシレン、トルエンのような芳香族炭化水素の併用も可能である。有機溶媒の含有量としては特に制限されるものではないが、ポリアミド酸又はポリイミドの濃度が5~30重量%程度になるような使用量に調整して用いることが好ましい。 The resin composition of this embodiment can contain an organic solvent. Examples of organic solvents include N,N-dimethylformamide (DMF), N,N-dimethylacetamide (DMAc), N,N-diethylacetamide, N-methyl-2-pyrrolidone (NMP), 2-butanone, dimethyl Examples include sulfoxide (DMSO), hexamethylphosphoramide, N-methylcaprolactam, dimethyl sulfate, cyclohexanone, dioxane, tetrahydrofuran, diglyme, triglyme, and cresol. Two or more of these solvents can be used in combination, and aromatic hydrocarbons such as xylene and toluene can also be used in combination. The content of the organic solvent is not particularly limited, but it is preferable to adjust the amount so that the concentration of polyamic acid or polyimide is about 5 to 30% by weight.

さらに、本実施の形態の樹脂組成物は、必要に応じて、発明の効果を損なわない範囲で、上記条件a~cを具備する球状シリカ粒子以外の無機フィラーや、有機フィラーを含有してもよい。具体的には、例えば、上記条件a~cを具備しないシリカ粒子や、酸化アルミニウム、酸化マグネシウム、酸化ベリリウム、窒化ホウ素、窒化アルミニウム、窒化ケイ素、フッ化アルミニウム、フッ化カルシウム等の無機フィラー、フッ素系ポリマー粒子や液晶ポリマー粒子等の有機フィラーが挙げられる。これらは1種又は2種以上を混合して用いることができる。さらに必要に応じて、他の任意成分として可塑剤、硬化促進剤、カップリング剤、充填剤、顔料、難燃剤などを適宜配合することができる。 Furthermore, the resin composition of the present embodiment may contain an inorganic filler or an organic filler other than the spherical silica particles satisfying the above conditions a to c, if necessary, to the extent that the effects of the invention are not impaired. good. Specifically, for example, silica particles that do not meet the above conditions a to c, inorganic fillers such as aluminum oxide, magnesium oxide, beryllium oxide, boron nitride, aluminum nitride, silicon nitride, aluminum fluoride, calcium fluoride, and fluorine Examples include organic fillers such as polymer particles and liquid crystal polymer particles. These can be used alone or in combination of two or more. Furthermore, if necessary, other optional components such as a plasticizer, hardening accelerator, coupling agent, filler, pigment, flame retardant, etc. can be appropriately blended.

<粘度>
樹脂組成物の粘度は、樹脂組成粒を塗工する際のハンドリング性を高め、均一な厚みの塗膜を形成しやすい粘度範囲として、例えば5000cps~100000cpsの範囲内とすることが好ましく、10000cps~50000cpsの範囲内とすることがより好ましい。上記の粘度範囲を外れると、コーター等による塗工作業の際にフィルムに厚みムラ、スジ等の不良が発生し易くなる。
<Viscosity>
The viscosity of the resin composition is preferably within the range of 5,000 cps to 100,000 cps, for example, 10,000 cps to 100,000 cps, as a viscosity range that improves handling properties when coating resin composition particles and facilitates forming a coating film of uniform thickness. More preferably, it is within the range of 50,000 cps. If the viscosity is outside the above range, defects such as uneven thickness and streaks are likely to occur in the film during coating with a coater or the like.

<樹脂組成物の調製>
樹脂組成物の調製に際しては、例えばポリアミド酸の樹脂溶液に球状シリカ粒子を直接配合してもよい。あるいは、フィラーの分散性を考慮し、ポリアミド酸の原料である酸二無水物成分及びジアミン成分のいずれか片方を投入した反応溶媒に予め球状シリカ粒子を配合した後、攪拌下にもう片方の原料を投入して重合を進行させてもよい。いずれの方法においても、一回で球状シリカ粒子を全量投入してもよいし、数回分けて少しずつ添加してもよい。また、原料も一括で入れてもよいし、数回に分けて少しずつ混合してもよい。
<Preparation of resin composition>
When preparing a resin composition, for example, spherical silica particles may be directly blended into a resin solution of polyamic acid. Alternatively, considering the dispersibility of the filler, spherical silica particles are mixed in advance into a reaction solvent containing one of the acid dianhydride component and diamine component, which are raw materials for polyamic acid, and then the other raw material is added to the reaction solvent while stirring. may be added to advance the polymerization. In either method, the entire amount of spherical silica particles may be added at once, or may be added little by little over several portions. Further, the raw materials may be added all at once, or may be mixed little by little in several batches.

[樹脂フィルム]
本実施の形態の樹脂フィルムは、単層又は複数層のポリイミド層を有する樹脂フィルムであって、ポリイミド層の少なくとも1層が、上記樹脂組成物の硬化物からなる球状シリカ含有ポリイミド層であればよい。
[Resin film]
The resin film of this embodiment is a resin film having a single layer or multiple polyimide layers, and at least one of the polyimide layers is a spherical silica-containing polyimide layer made of a cured product of the resin composition. good.

樹脂フィルム中で、樹脂組成物によって形成される球状シリカ含有ポリイミド層の厚みは、例えば5~150μmの範囲内であることが好ましく、45~100μmの範囲内であることがより好ましい。また、球状シリカ粒子の粒子径D100が球状シリカ含有ポリイミド層の厚みに対して0.05~0.7の範囲内であることが好ましい。球状シリカ粒子の粒子径D100が球状シリカ含有ポリイミド層の厚みに対して0.05を下回る場合は、誘電特性の改善効果が不十分となることがあり、0.7を超える場合は、球状シリカ含有ポリイミド層の表面の平滑性が損なわれ、樹脂フィルムを形成したときに折り曲げ性が低下することがある。 In the resin film, the thickness of the spherical silica-containing polyimide layer formed from the resin composition is preferably within the range of 5 to 150 μm, and more preferably within the range of 45 to 100 μm. Further, the particle diameter D 100 of the spherical silica particles is preferably within the range of 0.05 to 0.7 relative to the thickness of the spherical silica-containing polyimide layer. If the particle diameter D 100 of the spherical silica particles is less than 0.05 with respect to the thickness of the spherical silica-containing polyimide layer, the effect of improving dielectric properties may be insufficient; if it exceeds 0.7, the spherical The smoothness of the surface of the silica-containing polyimide layer may be impaired, and the bendability may be reduced when a resin film is formed.

樹脂フィルム全体の厚さは、例えば5~150μmの範囲内であることが好ましく、45~80μmの範囲内がより好ましい。樹脂フィルムの厚みが5μmに満たないと、金属張積層板の製造時の搬送工程で金属箔にシワが入るなどの不具合が生じやすくなる。反対に、樹脂フィルムの厚みが100μmを超えると樹脂フィルムの折り曲げ性が低下するなどの点で不利になる傾向となる。 The thickness of the entire resin film is, for example, preferably within the range of 5 to 150 μm, more preferably within the range of 45 to 80 μm. If the thickness of the resin film is less than 5 μm, problems such as wrinkles in the metal foil are likely to occur during the transportation process during production of the metal-clad laminate. On the other hand, if the thickness of the resin film exceeds 100 μm, it tends to be disadvantageous in that the bendability of the resin film decreases.

また、樹脂フィルムの全体の厚みに対する球状シリカ含有ポリイミド層の厚みの割合は、50%以上であることが好ましい。樹脂フィルムの全体の厚みに対する球状シリカ含有ポリイミド層の厚みの割合が50%未満では、誘電特性の改善効果が十分に得られない。 Further, the ratio of the thickness of the spherical silica-containing polyimide layer to the total thickness of the resin film is preferably 50% or more. If the ratio of the thickness of the spherical silica-containing polyimide layer to the total thickness of the resin film is less than 50%, a sufficient effect of improving dielectric properties cannot be obtained.

球状シリカ含有ポリイミド層を形成する方法は、特に限定されるものではなく公知の手法を採用することができる。ここでは、その最も代表的な例を示す。
まず、樹脂組成物を任意の支持基材上に直接流延塗布して塗布膜を形成する。次に、塗布膜を150℃以下の温度である程度溶媒を乾燥除去する。樹脂組成物がポリアミド酸を含有する場合は、その後、塗布膜に対し、更にイミド化のために100~400℃、好ましくは130~360℃の温度範囲で5~30分間程度の熱処理を行う。このようにして支持基材上に球状シリカ含有ポリイミド層を形成することができる。2層以上のポリイミド層とする場合、第一のポリアミド酸の樹脂溶液を塗布、乾燥したのち、第二のポリアミド酸の樹脂溶液を塗布、乾燥する。それ以降は、同様にして第三のポリアミド酸の樹脂溶液、次に、第4のポリアミド酸の樹脂溶液、・・・というように、ポリアミド酸の樹脂溶液を、必要な回数だけ、順次塗布し、乾燥する。その後、まとめて100~400℃の温度範囲で5~30分間程度の熱処理を行って、イミド化を行うことがよい。熱処理の温度が100℃より低いとポリイミドの脱水閉環反応が十分に進行せず、反対に400℃を超えると、ポリイミド層が劣化するおそれがある。
The method for forming the spherical silica-containing polyimide layer is not particularly limited, and any known method can be employed. The most typical example is shown here.
First, a resin composition is directly cast-coated onto an arbitrary supporting substrate to form a coating film. Next, the coating film is dried to remove some of the solvent at a temperature of 150° C. or lower. When the resin composition contains polyamic acid, the coated film is then further subjected to heat treatment for imidization at a temperature range of 100 to 400°C, preferably 130 to 360°C for about 5 to 30 minutes. In this way, a spherical silica-containing polyimide layer can be formed on the supporting substrate. In the case of two or more polyimide layers, a first resin solution of polyamic acid is applied and dried, and then a second resin solution of polyamic acid is applied and dried. From then on, apply the polyamic acid resin solution in the same manner as necessary, sequentially, as needed. ,dry. Thereafter, it is preferable to perform imidization by heat treatment at a temperature range of 100 to 400° C. for about 5 to 30 minutes. If the heat treatment temperature is lower than 100°C, the dehydration ring-closing reaction of the polyimide will not proceed sufficiently, whereas if it exceeds 400°C, the polyimide layer may deteriorate.

また、球状シリカ含有ポリイミド層を形成する別の例を挙げる。
まず、任意の支持基材上に、樹脂組成物を流延塗布してフィルム状成型する。このフィルム状成型物を、支持基材上で加熱乾燥することにより自己支持性を有するゲルフィルムとする。ゲルフィルムを支持基材より剥離した後、樹脂組成物がポリアミド酸を含有する場合は、更に高温で熱処理し、イミド化させてポリイミドの樹脂フィルムとする。
Another example of forming a spherical silica-containing polyimide layer will also be given.
First, a resin composition is cast onto an arbitrary support base material and molded into a film. This film-like molded product is heated and dried on a supporting base material to form a self-supporting gel film. After the gel film is peeled off from the supporting base material, if the resin composition contains polyamic acid, it is further heat-treated at a high temperature to imidize it to form a polyimide resin film.

球状シリカ含有ポリイミド層の形成に用いる支持基材は、特に限定されるものではなく、任意の材質の基材を用いることができる。また、樹脂フィルムの形成にあたっては、支持基材上で完全にイミド化を完了させた樹脂フィルムを形成する必要はない。例えば、半硬化状態のポリイミド前駆体状態での樹脂フィルムを支持基材から剥離等の手段で分離し、分離後イミド化を完了させて樹脂フィルムとすることもできる。 The supporting base material used for forming the spherical silica-containing polyimide layer is not particularly limited, and any base material may be used. Further, in forming the resin film, it is not necessary to form the resin film completely imidized on the supporting base material. For example, a resin film in a semi-cured polyimide precursor state can be separated from a supporting base material by means such as peeling, and after separation, imidization can be completed to obtain a resin film.

樹脂フィルムは、球状シリカ粒子などの無機フィラーを含有するポリイミド層(上記球状シリカ含有ポリイミド層を含む)のみからなっていてもよく、無機フィラーを含有しないポリイミド層を有してもよい。樹脂フィルムを複数層の積層構造とする場合、誘電特性の改善を考慮するとすべての層に無機フィラーを含有させることが好ましい。ただし、無機フィラーを含有するポリイミド層の隣接層を、無機フィラーを含有しない層とするか、あるいはその含有量が低い層とすることにより、加工時等の無機フィラーの滑落が防止できるという有利な効果をもたせることができる。無機フィラーを含有しないポリイミド層を有する場合、その厚みは、例えば、無機フィラーを含有するポリイミド層の1/100~1/2の範囲内、好ましくは1/20~1/3の範囲内とすることがよい。無機フィラーを含有しないポリイミド層を有する場合、そのポリイミド層が金属層に接するようにすれば、金属層と絶縁樹脂層の接着性が向上する。 The resin film may consist only of a polyimide layer containing an inorganic filler such as spherical silica particles (including the above-mentioned spherical silica-containing polyimide layer), or may have a polyimide layer containing no inorganic filler. When the resin film has a laminated structure of multiple layers, it is preferable that all the layers contain an inorganic filler in consideration of improving dielectric properties. However, by making the layer adjacent to the polyimide layer containing inorganic filler a layer that does not contain inorganic filler or a layer with a low content of inorganic filler, it is possible to prevent the inorganic filler from slipping off during processing. It can be effective. When having a polyimide layer that does not contain an inorganic filler, its thickness is, for example, within the range of 1/100 to 1/2, preferably within the range of 1/20 to 1/3 of the polyimide layer containing the inorganic filler. That's good. When the polyimide layer does not contain an inorganic filler, the adhesion between the metal layer and the insulating resin layer is improved by bringing the polyimide layer into contact with the metal layer.

樹脂フィルムの熱膨張係数(CTE)は、特に限定されないが、例えば5×10-6~40×10-6/K(5~40ppm/K)の範囲内にあることが好ましく、10×10-6~35×10-6/K(10~35ppm/K)の範囲内がより好ましい。樹脂フィルムの熱膨張係数が5×10-6/Kより小さいと、金属張積層板とした後でカールが生じやすくハンドリング性に劣る。一方、樹脂フィルムの熱膨張係数が40×10-6/Kを超えると、フレキシブル基板など電子材料としての寸法安定性に劣り、また耐熱性も低下する傾向にある。 The coefficient of thermal expansion (CTE) of the resin film is not particularly limited, but is preferably within the range of, for example, 5×10 −6 to 40×10 −6 /K (5 to 40 ppm/K), and 10×10 −6 /K (5 to 40 ppm/K). It is more preferably within the range of 6 to 35×10 −6 /K (10 to 35 ppm/K). If the thermal expansion coefficient of the resin film is smaller than 5×10 −6 /K, curling tends to occur after forming the metal-clad laminate, resulting in poor handling properties. On the other hand, if the thermal expansion coefficient of the resin film exceeds 40×10 −6 /K, the dimensional stability as an electronic material such as a flexible substrate will be poor, and the heat resistance will also tend to decrease.

<誘電正接>
樹脂フィルムは、例えば、回路基板の絶縁樹脂層として適用する場合において、高周波信号の伝送時における誘電損失を低減するために、フィルム全体として、スプリットポスト誘電体共振器(SPDR)により測定したときの10GHzにおける誘電正接(Tanδ)が、0.005以下であることが好ましく、0.004以下であることがより好ましい。回路基板の伝送損失を改善するためには、特に絶縁樹脂層の誘電正接を制御することが重要であり、誘電正接を上記範囲内とすることで、伝送損失を下げる効果が増大する。従って、樹脂フィルムを、例えば高周波回路基板の絶縁樹脂層として適用する場合、伝送損失を効率よく低減できる。10GHzにおける誘電正接が0.005を超えると、樹脂フィルムを回路基板の絶縁樹脂層として適用した際に、高周波信号の伝送経路上で電気信号のロスが大きくなるなどの不都合が生じやすくなる。10GHzにおける誘電正接の下限値は特に制限されないが、樹脂フィルムを回路基板の絶縁樹脂層として適用する場合の物性制御を考慮する必要がある。
<Dielectric loss tangent>
For example, when a resin film is applied as an insulating resin layer of a circuit board, in order to reduce dielectric loss during high-frequency signal transmission, the film as a whole has a The dielectric loss tangent (Tan δ) at 10 GHz is preferably 0.005 or less, more preferably 0.004 or less. In order to improve the transmission loss of a circuit board, it is particularly important to control the dielectric loss tangent of the insulating resin layer, and by controlling the dielectric loss tangent within the above range, the effect of lowering the transmission loss increases. Therefore, when the resin film is applied, for example, as an insulating resin layer of a high frequency circuit board, transmission loss can be efficiently reduced. If the dielectric loss tangent at 10 GHz exceeds 0.005, when the resin film is applied as an insulating resin layer of a circuit board, problems such as increased electrical signal loss on the high frequency signal transmission path are likely to occur. Although the lower limit of the dielectric loss tangent at 10 GHz is not particularly limited, it is necessary to consider physical property control when applying the resin film as an insulating resin layer of a circuit board.

<比誘電率>
樹脂フィルムは、例えば回路基板の絶縁樹脂層として適用する場合において、インピーダンス整合性を確保するために、フィルム全体として、3~20GHzにおける比誘電率が4.0以下であることが好ましい。3~20GHzにおける比誘電率が4.0を超えると、樹脂フィルムを回路基板の絶縁樹脂層として適用した際に、誘電損失の悪化に繋がり、高周波信号の伝送経路上で電気信号のロスが大きくなるなどの不都合が生じやすくなる。
<Relative dielectric constant>
When the resin film is applied, for example, as an insulating resin layer of a circuit board, the relative permittivity of the film as a whole at 3 to 20 GHz is preferably 4.0 or less in order to ensure impedance matching. If the relative permittivity at 3 to 20 GHz exceeds 4.0, when the resin film is applied as an insulating resin layer of a circuit board, it will lead to worsening of dielectric loss and a large loss of electrical signals on the high frequency signal transmission path. Inconveniences such as

<金属張積層板>
本実施の形態の金属張積層板は、絶縁樹脂層と、この絶縁樹脂層の少なくとも一方の面に積層された金属層と、を備えた金属張積層板であり、絶縁樹脂層の少なくとも1層が上記樹脂フィルムからなる。金属張積層板は、絶縁樹脂層の片面側のみに金属層を有する片面金属張積層板であってもよいし、絶縁樹脂層の両面に金属層を有する両面金属張積層板であってもよい。
<Metal-clad laminate>
The metal-clad laminate of this embodiment is a metal-clad laminate including an insulating resin layer and a metal layer laminated on at least one surface of the insulating resin layer, and at least one layer of the insulating resin layer. is made of the above resin film. The metal-clad laminate may be a single-sided metal-clad laminate having a metal layer on only one side of the insulating resin layer, or a double-sided metal-clad laminate having metal layers on both sides of the insulating resin layer. .

本実施の形態の金属張積層板は、無機フィラーを含有するポリイミド層と金属箔とを接着するための接着剤を用いることを除外するものではない。ただし、絶縁樹脂層の両面に金属層を有する両面金属張積層板において接着層を介在させる場合には、接着層の厚みは、誘電特性を損なわないように、全絶縁樹脂層の厚みの30%未満とすることが好ましく、20%未満とすることがより好ましい。また、絶縁樹脂層の片面のみに金属層を有する片面金属張積層板において接着層を介在させる場合には、接着層の厚みは、誘電特性を損なわないように、全絶縁樹脂層の厚みの15%未満とすることが好ましく、10%未満とすることがより好ましい。また、接着層は絶縁樹脂層の一部を構成するので、ポリイミド層であることが好ましい。絶縁樹脂層の主たる材質であるポリイミドのガラス転移温度は、耐熱性を付与する観点から300℃以上とすることが好ましい。ガラス転移温度を300℃以上とするには、ポリイミドを構成する上記の酸二無水物やジアミン成分を適宜選択することで可能となる。 The metal-clad laminate of this embodiment does not exclude the use of an adhesive for bonding the polyimide layer containing an inorganic filler and the metal foil. However, when interposing an adhesive layer in a double-sided metal-clad laminate having metal layers on both sides of the insulating resin layer, the thickness of the adhesive layer is 30% of the total thickness of the insulating resin layer so as not to impair the dielectric properties. It is preferably less than 20%, more preferably less than 20%. In addition, when interposing an adhesive layer in a single-sided metal-clad laminate having a metal layer on only one side of the insulating resin layer, the thickness of the adhesive layer is set to 15% of the total thickness of the insulating resin layer so as not to impair the dielectric properties. %, more preferably less than 10%. Furthermore, since the adhesive layer constitutes a part of the insulating resin layer, it is preferably a polyimide layer. The glass transition temperature of polyimide, which is the main material of the insulating resin layer, is preferably 300° C. or higher from the viewpoint of imparting heat resistance. A glass transition temperature of 300° C. or higher can be achieved by appropriately selecting the acid dianhydride and diamine components mentioned above that constitute the polyimide.

樹脂フィルムを絶縁樹脂層とする金属張積層板を製造する方法としては、例えば、樹脂フィルムに直接、又は任意の接着剤を介して金属箔を加熱圧着する方法や、金属蒸着等の手法によって樹脂フィルムに金属層を形成する方法などを挙げることができる。なお、両面金属張積層板は、例えば、片面金属張積層板を形成した後、互いにポリイミド層を向き合わせて熱プレスによって圧着し形成する方法や、片面金属張積層板のポリイミド層に金属箔を圧着し形成する方法等により得ることができる。 Methods for manufacturing metal-clad laminates using resin films as insulating resin layers include, for example, applying heat and pressure to the resin film directly or using an arbitrary adhesive, or applying resin to the resin film using methods such as metal vapor deposition. Examples include a method of forming a metal layer on a film. Note that double-sided metal-clad laminates can be formed, for example, by forming a single-sided metal-clad laminate, then facing each other and pressing the polyimide layers together using heat press, or by applying metal foil to the polyimide layer of a single-sided metal-clad laminate. It can be obtained by a method of crimping and forming.

<金属層>
金属層の材質としては、特に制限はないが、例えば、銅、ステンレス、鉄、ニッケル、ベリリウム、アルミニウム、亜鉛、インジウム、銀、金、スズ、ジルコニウム、タンタル、チタン、鉛、マグネシウム、マンガン及びこれらの合金等が挙げられる。この中でも、特に銅又は銅合金が好ましい。金属層は、金属箔からなるものであってもよいし、フィルムに金属蒸着したものであってもよい。また、樹脂組成物を直接塗布可能な点から、金属箔でも金属板でも使用可能であり、銅箔若しくは銅板が好ましい。
<Metal layer>
The material of the metal layer is not particularly limited, but examples include copper, stainless steel, iron, nickel, beryllium, aluminum, zinc, indium, silver, gold, tin, zirconium, tantalum, titanium, lead, magnesium, manganese, and these. Examples include alloys of Among these, copper or copper alloy is particularly preferred. The metal layer may be made of metal foil, or may be made by vapor-depositing metal onto a film. Further, since the resin composition can be directly applied, either metal foil or metal plate can be used, and copper foil or copper plate is preferable.

金属層の厚みは、金属張積層板の使用目的に応じて適宜設定されるため特に限定されないが、例えば5μm~3mmの範囲内が好ましく、12μm~1mmの範囲内がより好ましい。金属層の厚みが5μmに満たないと、金属張積層板の製造等における搬送時にシワが入るなどの不具合が生じるおそれがある。反対に金属層の厚みが3mmを超えると硬くて加工性が悪くなる。金属層の厚みについては、一般的に、車載用回路基板などの用途では厚いものが適し、LED用回路基板などの用途などでは薄い金属層が適する。 The thickness of the metal layer is not particularly limited as it is appropriately set depending on the purpose of use of the metal-clad laminate, but is preferably within the range of 5 μm to 3 mm, and more preferably within the range of 12 μm to 1 mm. If the thickness of the metal layer is less than 5 μm, problems such as wrinkles may occur during transportation during manufacturing of metal-clad laminates. On the other hand, if the thickness of the metal layer exceeds 3 mm, it will be hard and have poor workability. Regarding the thickness of the metal layer, generally, a thick metal layer is suitable for applications such as an automotive circuit board, and a thin metal layer is suitable for applications such as an LED circuit board.

以下に実施例を示し、本発明の特徴をより具体的に説明する。ただし、本発明の範囲は、実施例に限定されない。なお、以下の実施例において、特にことわりのない限り各種測定、評価は下記によるものである。 Examples are shown below to explain the features of the present invention more specifically. However, the scope of the present invention is not limited to the examples. In addition, in the following examples, various measurements and evaluations are as follows unless otherwise specified.

[粘度の測定]
樹脂溶液の粘度はE型粘度計(ブルックフィールド社製、商品名;DV-II+Pro)を用いて、25℃における粘度を測定した。トルクが10%~90%になるよう回転数を設定し、測定を開始してから1分経過後、粘度が安定した時の値を読み取った。
[Measurement of viscosity]
The viscosity of the resin solution was measured at 25° C. using an E-type viscometer (manufactured by Brookfield, trade name: DV-II+Pro). The rotational speed was set so that the torque was 10% to 90%, and the value when the viscosity stabilized was read one minute after starting the measurement.

[比誘電率及び誘電正接の測定]
<シリカ粒子>
空洞共振器摂動法による関東電子応用開発社製の誘電率測定装置を用い、誘電率測定モード;TM101に設定し、周波数10GHzにおけるシリカ粒子の比誘電率(ε1)及び誘電正接(Tanδ1)を測定した。なお、試料管チューブの内径は1.68mm、外径は2.8mm、高さは8cmである。
<樹脂フィルム>
比誘電率及び誘電正接は、ベクトルネットワークアナライザ(Agilent社製、商品名;ベクトルネットワークアナライザE8363C)およびSPDR共振器を用いて、周波数10GHzにおける樹脂フィルム(硬化後の樹脂フィルム)の比誘電率(ε1)および誘電正接(Tanδ1)を測定した。なお、測定に使用した樹脂フィルムは、温度;24~26℃、湿度;45~55%の条件下で、24時間放置したものである。
[Measurement of relative permittivity and dielectric loss tangent]
<Silica particles>
Using a dielectric constant measurement device manufactured by Kanto Denshi Application Development Co., Ltd. using the cavity resonator perturbation method, the dielectric constant measurement mode was set to TM101, and the relative dielectric constant (ε1) and dielectric loss tangent (Tan δ1) of silica particles were measured at a frequency of 10 GHz. did. The sample tube has an inner diameter of 1.68 mm, an outer diameter of 2.8 mm, and a height of 8 cm.
<Resin film>
The relative permittivity and dielectric loss tangent are calculated using a vector network analyzer (manufactured by Agilent, trade name: Vector Network Analyzer E8363C) and an SPDR resonator. ) and dielectric loss tangent (Tan δ1) were measured. The resin film used in the measurement was left for 24 hours at a temperature of 24 to 26°C and a humidity of 45 to 55%.

[線熱膨張係数(CTE)の測定方法]
3mm×20mmのサイズの樹脂フィルムを、サーモメカニカルアナライザー(Bruker社製、商品名;4000SA)を用い、5.0gの荷重を加えながら一定の昇温速度で30℃から265℃まで昇温させ、更にその温度で10分保持した後、5℃/分の速度で冷却し、200℃から100℃までの平均熱膨張係数(熱膨張係数)を求めた。
[Measurement method of coefficient of linear thermal expansion (CTE)]
A resin film with a size of 3 mm x 20 mm was heated from 30° C. to 265° C. at a constant heating rate while applying a load of 5.0 g using a thermomechanical analyzer (manufactured by Bruker, trade name: 4000SA). After further holding at that temperature for 10 minutes, it was cooled at a rate of 5°C/min, and the average coefficient of thermal expansion (coefficient of thermal expansion) from 200°C to 100°C was determined.

[粒径の測定方法]
レーザ回折式粒度分布測定装置(マルバーン社製、商品名;Master Sizer 3000)を用いて、レーザ回折・散乱式測定方式による粒子径の測定を行った。
[Method of measuring particle size]
The particle diameter was measured by a laser diffraction/scattering measurement method using a laser diffraction particle size distribution analyzer (manufactured by Malvern, trade name: Master Sizer 3000).

[真比重の測定方法]
連続自動粉体真密度測定装置(セイシン企業社製、商品名;AUTO TRUE DENSERMAT‐7000)を用い、ピクノメーター法(液相置換法)にて測定した。
[Measurement method of true specific gravity]
The measurement was carried out by the pycnometer method (liquid phase displacement method) using a continuous automatic powder true density measuring device (manufactured by Seishin Enterprise Co., Ltd., trade name: AUTO TRUE DENSERMAT-7000).

[折り曲げ性の評価]
JISK5600-1に準拠し、5cm×10cmサイズの樹脂フィルムの長辺の中心を、5mmφの金属棒に巻きつけるように1~2秒かけて均一に曲げ、樹脂フィルムが180℃折り曲がっても破断又はクラックが入らないものを「良」、破断又はクラックが発生するものを「不可」とした。
[Evaluation of bendability]
In accordance with JISK5600-1, the center of the long side of a 5cm x 10cm resin film is bent uniformly for 1 to 2 seconds as if wrapped around a 5mmφ metal rod, and even if the resin film is bent at 180 degrees, it will not break. Or, those with no cracks were rated as "good," and those with breakage or cracks were rated as "unacceptable."

合成例及び比較例、実施例に用いた略号は、以下の化合物を示す。
PMDA:ピロメリット酸二無水物
BPDA:3,3’,4,4’‐ビフェニルテトラカルボン酸二無水物
BAPP:2,2-ビス[4-(4-アミノフェノキシ)フェニル]プロパン
m‐TB:2,2’‐ジメチル‐4,4’‐ジアミノビフェニル
DMAc:N,N‐ジメチルアセトアミド
フィラー1:日鉄ケミカル&マテリアル社製、商品名;CR10-20(球状クリストバライトシリカ粉末、真球状、シリカ含有率;99.4重量%、クリストバライト相;98重量%、真比重;2.33、比表面積;0.63m/g、D50;10.8μm、D90;16.4μm、D100;24.1μm、頻度極大値F1の粒子径;11.2μm、頻度極大値F1;10.6%、頻度極大値F2の粒子径;1.0μm、頻度極大値F2;1.4%、F1/F2;11.2、10GHzにおける比誘電率;3.16、10GHzにおける誘電正接;0.0008)
フィラー2:日鉄ケミカル&マテリアル社製、商品名;SC70-2(球状非晶質シリカ粉末、真球状、シリカ含有率;99.9重量%、真比重;2.33、比表面積;1.1m/g、D50;11.7μm、D90;16.4μm、D100;24.1μm、頻度極大値F1の粒子径;11.2μm、頻度極大値F1;10.8%、頻度極大値F2の粒子径;1.5μm、頻度極大値F2;1.2%、F1/F2;7.5、10GHzにおける比誘電率;3.08、10GHzにおける誘電正接;0.0015)
フィラー3:日鉄ケミカル&マテリアル社製、商品名;SP40-10(球状非晶質シリカ粉末、真球状、シリカ含有率;99.9重量%、真比重;2.21、比表面積;8.6m/g、D50;2.5μm、D90;3.6μm、D100;7.0μm、頻度極大値F1の粒子径;2.2μm、頻度極大値F1;9.0%、頻度極大値F2の粒子径;0.9μm、頻度極大値F2;4.3%、F1/F2;2.4、10GHzにおける比誘電率;2.78、10GHzにおける誘電正接;0.0030)
Abbreviations used in Synthesis Examples, Comparative Examples, and Examples indicate the following compounds.
PMDA: Pyromellitic dianhydride BPDA: 3,3',4,4'-biphenyltetracarboxylic dianhydride BAPP: 2,2-bis[4-(4-aminophenoxy)phenyl]propane m-TB: 2,2'-dimethyl-4,4'-diaminobiphenylDMAc: N,N-dimethylacetamide
Filler 1: manufactured by Nippon Steel Chemical & Materials Co., Ltd., product name: CR10-20 (spherical cristobalite silica powder, true spherical, silica content: 99.4% by weight, cristobalite phase: 98% by weight, true specific gravity: 2.33, Specific surface area; 0.63 m 2 /g, D 50 ; 10.8 μm, D 90 ; 16.4 μm, D 100 ; 24.1 μm, particle diameter at maximum frequency value F1: 11.2 μm, maximum frequency value F1; 10. 6%, particle size at maximum frequency value F2; 1.0 μm, maximum frequency value F2; 1.4%, F1/F2; 11.2, relative dielectric constant at 10 GHz; 3.16, dielectric loss tangent at 10 GHz; 0. 0008)
Filler 2: manufactured by Nippon Steel Chemical & Materials Co., Ltd., trade name: SC70-2 (spherical amorphous silica powder, true spherical, silica content: 99.9% by weight, true specific gravity: 2.33, specific surface area: 1. 1 m 2 /g, D 50 ; 11.7 μm, D 90 ; 16.4 μm, D 100 ; 24.1 μm, maximum frequency value F1 particle diameter: 11.2 μm, maximum frequency value F1; 10.8%, maximum frequency Particle diameter of value F2: 1.5 μm, maximum frequency value F2: 1.2%, F1/F2: 7.5, relative dielectric constant at 10 GHz: 3.08, dielectric loss tangent at 10 GHz: 0.0015)
Filler 3: manufactured by Nippon Steel Chemical & Materials Co., Ltd., product name: SP40-10 (spherical amorphous silica powder, true spherical, silica content: 99.9% by weight, true specific gravity: 2.21, specific surface area: 8. 6 m 2 /g, D 50 ; 2.5 μm, D 90 ; 3.6 μm, D 100 ; 7.0 μm, particle diameter at maximum frequency value F1; 2.2 μm, maximum frequency value F1; 9.0%, maximum frequency Particle diameter of value F2: 0.9 μm, maximum frequency value F2: 4.3%, F1/F2: 2.4, relative dielectric constant at 10 GHz: 2.78, dielectric loss tangent at 10 GHz: 0.0030)

(合成例1)
300mlのセパラブルフラスコに、21.65gのm-TB(101.66mmol)、255gのDMAcを投入し、室温、窒素気流下で撹拌した。完全に溶解した後、17.46gのPMDA(80.03mmol)及び5.90gのBPDA(20.01mmol)を添加し、室温で18時間撹拌してポリアミド酸溶液A(固形分濃度;15%)を得た。得られたポリアミド酸溶液Aの粘度は22,400cpsであった。
(Synthesis example 1)
21.65 g of m-TB (101.66 mmol) and 255 g of DMAc were placed in a 300 ml separable flask and stirred at room temperature under a nitrogen stream. After completely dissolving, 17.46 g of PMDA (80.03 mmol) and 5.90 g of BPDA (20.01 mmol) were added and stirred at room temperature for 18 hours to form polyamic acid solution A (solid content concentration: 15%). I got it. The viscosity of the obtained polyamic acid solution A was 22,400 cps.

(合成例2)
300mlのセパラブルフラスコに、29.21gのBAPP(71.15mmol)、255gのDMAcを投入し、室温、窒素気流下で撹拌した。完全に溶解した後、14.74gのPMDA(67.60mmol)、1.05gのBPDA(3.56mmol)を添加し、室温で18時間撹拌してポリアミド酸溶液Bを得た。得られたポリアミド酸溶液B(固形分濃度;15%)の粘度は21,074cpsであった。
(Synthesis example 2)
29.21 g of BAPP (71.15 mmol) and 255 g of DMAc were placed in a 300 ml separable flask and stirred at room temperature under a nitrogen stream. After completely dissolving, 14.74 g of PMDA (67.60 mmol) and 1.05 g of BPDA (3.56 mmol) were added and stirred at room temperature for 18 hours to obtain polyamic acid solution B. The viscosity of the obtained polyamic acid solution B (solid content concentration: 15%) was 21,074 cps.

[実施例1]
70.0gのポリアミド酸溶液A及び7.8gのフィラー1を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液1(粘度;24,800cps、フィラー1とポリアミド酸との合計量に対するフィラーの含有率;32.6体積%)を調製した。
銅箔1(電解銅箔、厚み;12μm)の上にポリアミド酸溶液1を塗布し、130℃で3分間乾燥させた。その後、155℃から360℃まで段階的な熱処理を行ってイミド化し、金属張積層板1を調製した。
金属張積層板1の銅箔をエッチング除去し、樹脂フィルム1を調製した。樹脂フィルム1(厚み;46.1μm)の比誘電率は2.78、誘電正接は0.0037、CTEは34ppm/Kであり、折り曲げ性は良であった。樹脂フィルム1の評価結果を表1に示す。
[Example 1]
70.0 g of polyamic acid solution A and 7.8 g of filler 1 were mixed and stirred until a visually uniform solution was obtained. The filler content (32.6% by volume relative to the total amount ) was prepared.
Polyamic acid solution 1 was applied onto copper foil 1 (electrolytic copper foil, thickness: 12 μm) and dried at 130° C. for 3 minutes. Thereafter, a stepwise heat treatment was performed from 155° C. to 360° C. to imidize the material, thereby preparing a metal-clad laminate 1.
The copper foil of the metal-clad laminate 1 was removed by etching to prepare a resin film 1. Resin film 1 (thickness: 46.1 μm) had a dielectric constant of 2.78, a dielectric loss tangent of 0.0037, a CTE of 34 ppm/K, and had good bendability. Table 1 shows the evaluation results for Resin Film 1.

[実施例2]
60.0gのポリアミド酸溶液A及び20.0gのフィラー1を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液2(粘度;28,400cps、フィラー1とポリアミド酸との合計量に対するフィラーの含有率;59.2体積%)を調製した。
実施例1と同様にして、金属張積層板2及び樹脂フィルム2を調製した。樹脂フィルム2(厚み;78.1μm)の比誘電率は2.71、誘電正接は0.0028、CTEは34ppm/Kであり、折り曲げ性は良であった。樹脂フィルム2の評価結果を表1に示す。
[Example 2]
60.0 g of polyamic acid solution A and 20.0 g of filler 1 were mixed and stirred until a visually uniform solution was obtained. The filler content (59.2% by volume relative to the total amount ) was prepared.
A metal-clad laminate 2 and a resin film 2 were prepared in the same manner as in Example 1. Resin film 2 (thickness: 78.1 μm) had a dielectric constant of 2.71, a dielectric loss tangent of 0.0028, a CTE of 34 ppm/K, and had good bendability. Table 1 shows the evaluation results for Resin Film 2.

[実施例3]
58.7gのポリアミド酸溶液B及び6.1gのフィラー1を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液3(粘度;23,000cps、フィラー1とポリアミド酸との合計量に対するフィラーの含有率;30.0体積%)を調製した。
実施例1と同様にして、金属張積層板3及び樹脂フィルム3を調製した。樹脂フィルム3(厚み;51.6μm)の誘電率は3.04、誘電正接は0.0044であり、折り曲げ性は良であった。樹脂フィルム3の評価結果を表1に示す。
[Example 3]
58.7 g of polyamic acid solution B and 6.1 g of filler 1 were mixed and stirred until a visually uniform solution was obtained. The filler content (30.0% by volume relative to the total amount ) was prepared.
A metal-clad laminate 3 and a resin film 3 were prepared in the same manner as in Example 1. The dielectric constant of the resin film 3 (thickness: 51.6 μm) was 3.04, the dielectric loss tangent was 0.0044, and the bendability was good. Table 1 shows the evaluation results for resin film 3.

[実施例4]
70.0gのポリアミド酸溶液A及び7.8gのフィラー2を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液4(粘度;23,600cps、フィラー2とポリアミド酸との合計量に対するフィラーの含有率;33.8体積%)を調製した。
実施例1と同様にして、金属張積層板4及び樹脂フィルム4を調製した。樹脂フィルム4(厚み;50.4μm)の比誘電率は2.84、誘電正接は0.0038、CTEは28.2ppm/Kであり、折り曲げ性は良であった。樹脂フィルム4の評価結果を表1に示す。
[Example 4]
70.0 g of polyamic acid solution A and 7.8 g of filler 2 were mixed and stirred until a visually uniform solution was obtained. The filler content (33.8% by volume relative to the total amount ) was prepared.
A metal-clad laminate 4 and a resin film 4 were prepared in the same manner as in Example 1. Resin film 4 (thickness: 50.4 μm) had a dielectric constant of 2.84, a dielectric loss tangent of 0.0038, a CTE of 28.2 ppm/K, and had good bendability. Table 1 shows the evaluation results of resin film 4.

[実施例5]
60.0gのポリアミド酸溶液A及び20.0gのフィラー2を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液5(粘度;30,100cps、フィラー2とポリアミド酸との合計量に対するフィラーの含有率;60.5体積%)を調製した。
実施例1と同様にして、金属張積層板5及び樹脂フィルム5を調製した。樹脂フィルム5(厚み;79.3μm)の比誘電率は2.75、誘電正接は0.0028、CTEは20.4ppm/Kであり、折り曲げ性は良であった。樹脂フィルム5の評価結果を表1に示す。
[Example 5]
60.0 g of polyamic acid solution A and 20.0 g of filler 2 were mixed and stirred until a visually uniform solution was obtained. Filler content (60.5% by volume relative to the total amount ) was prepared.
A metal-clad laminate 5 and a resin film 5 were prepared in the same manner as in Example 1. Resin film 5 (thickness: 79.3 μm) had a dielectric constant of 2.75, a dielectric loss tangent of 0.0028, a CTE of 20.4 ppm/K, and had good bendability. Table 1 shows the evaluation results of resin film 5.

[実施例6]
56.2gのポリアミド酸溶液B及び5.5gのフィラー2を混合し、目視にて一様な溶液となるまで攪拌し、ポリアミド酸溶液6(粘度;23,600cps、フィラー2とポリアミド酸との合計量に対するフィラーの含有率;30.0体積%)を調製した。
実施例1と同様にして、金属張積層板6及び樹脂フィルム6を調製した。樹脂フィルム6(厚み;50.7μm)の比誘電率は3.04、誘電正接は0.0047であり、折り曲げ性は良であった。樹脂フィルム6の評価結果を表1に示す。
[Example 6]
56.2 g of polyamic acid solution B and 5.5 g of filler 2 were mixed and stirred until a visually uniform solution was obtained. The filler content (30.0% by volume relative to the total amount ) was prepared.
A metal-clad laminate 6 and a resin film 6 were prepared in the same manner as in Example 1. The resin film 6 (thickness: 50.7 μm) had a dielectric constant of 3.04, a dielectric loss tangent of 0.0047, and had good bendability. Table 1 shows the evaluation results of the resin film 6.

(比較例1)
銅箔1の上に70.0gのポリアミド酸溶液Aを塗布し、130℃で3分間乾燥させた。その後155℃から360℃まで段階的な熱処理を行ってイミド化し、金属張積層板7を調製した。
実施例1と同様にして、金属張積層板7の銅箔をエッチング除去し、樹脂フィルム7を調製した。樹脂フィルム7(厚み;26.7μm)の誘電率は3.13、誘電正接は0.0056、CTEは21.3ppm/Kであり、折り曲げ性は良であった。樹脂フィルム7の評価結果を表2に示す。
(Comparative example 1)
70.0 g of polyamic acid solution A was applied onto copper foil 1 and dried at 130° C. for 3 minutes. Thereafter, a stepwise heat treatment was performed from 155° C. to 360° C. to imidize the material, thereby preparing a metal-clad laminate 7.
In the same manner as in Example 1, the copper foil of the metal-clad laminate 7 was removed by etching to prepare a resin film 7. Resin film 7 (thickness: 26.7 μm) had a dielectric constant of 3.13, a dielectric loss tangent of 0.0056, a CTE of 21.3 ppm/K, and had good bendability. The evaluation results of resin film 7 are shown in Table 2.

(比較例2)
銅箔1の上に60.0gのポリアミド酸溶液Bを塗布し、90℃で1分間、130℃で5分間乾燥させた。その後155℃から360℃まで段階的な熱処理を行ってイミド化し、金属張積層板8を調製した。
実施例1と同様にして、金属張積層板8の銅箔をエッチング除去し、樹脂フィルム8を調製した。樹脂フィルム8(厚み;41.4μm)の誘電率は3.16、誘電正接は0.0062、CTEは51.3ppm/Kであり、折り曲げ性は良であった。樹脂フィルム8の評価結果を表2に示す。
(Comparative example 2)
60.0 g of polyamic acid solution B was applied onto copper foil 1 and dried at 90° C. for 1 minute and at 130° C. for 5 minutes. Thereafter, a stepwise heat treatment was performed from 155° C. to 360° C. to imidize the material, thereby preparing a metal-clad laminate 8.
In the same manner as in Example 1, the copper foil of the metal-clad laminate 8 was removed by etching to prepare a resin film 8. Resin film 8 (thickness: 41.4 μm) had a dielectric constant of 3.16, a dielectric loss tangent of 0.0062, a CTE of 51.3 ppm/K, and had good bendability. The evaluation results of resin film 8 are shown in Table 2.

(参考例1)
55.0gのポリアミド酸溶液A及び36.3gのフィラー1を混合したこと以外、実施例1と同様にして、ポリアミド酸溶液9を調製した。
銅箔1の上にポリアミド酸溶液9を塗布し、実施例1と同様にして、金属張積層板9を調製後、樹脂フィルム9を調製した。樹脂フィルム9(厚み;117.8μm)の比誘電率は2.56、誘電正接は0.0015、CTEは31ppm/Kであり、折り曲げ性は不可であった。樹脂フィルム9の評価結果を表3に示す。
(Reference example 1)
Polyamic acid solution 9 was prepared in the same manner as in Example 1 except that 55.0 g of polyamic acid solution A and 36.3 g of filler 1 were mixed.
A polyamic acid solution 9 was applied onto the copper foil 1, a metal-clad laminate 9 was prepared in the same manner as in Example 1, and then a resin film 9 was prepared. Resin film 9 (thickness: 117.8 μm) had a dielectric constant of 2.56, a dielectric loss tangent of 0.0015, a CTE of 31 ppm/K, and poor bendability. Table 3 shows the evaluation results of resin film 9.

(参考例2)
55.6gのポリアミド酸溶液A及び36.3gのフィラー2を混合したこと以外、実施例1と同様にして、ポリアミド酸溶液10を調製した。
銅箔1の上にポリアミド酸溶液10を塗布し、実施例1と同様にして、金属張積層板10を調製後、樹脂フィルム10を調製した。樹脂フィルム10(厚み;116.7μm)の比誘電率は2.75、誘電正接は0.0018、CTEは13ppm/Kであり、折り曲げ性は不可であった。樹脂フィルム10の評価結果を表3に示す。
(Reference example 2)
Polyamic acid solution 10 was prepared in the same manner as in Example 1 except that 55.6 g of polyamic acid solution A and 36.3 g of filler 2 were mixed.
Polyamic acid solution 10 was applied onto copper foil 1, metal-clad laminate 10 was prepared in the same manner as in Example 1, and then resin film 10 was prepared. The resin film 10 (thickness: 116.7 μm) had a dielectric constant of 2.75, a dielectric loss tangent of 0.0018, a CTE of 13 ppm/K, and poor bendability. Table 3 shows the evaluation results of the resin film 10.

(参考例3)
56.2gのポリアミド酸溶液B及び5.5gのフィラー3を混合したこと以外、実施例1と同様にして、ポリアミド酸溶液11を調製した。
銅箔1の上にポリアミド酸溶液11を塗布し、実施例1と同様にして、金属張積層板11を調製後、樹脂フィルム11を調製した。樹脂フィルム11(厚み;45.6μm)の比誘電率は3.25、誘電正接は0.0052、CTEは40.9であり、折り曲げ性は良であった。樹脂フィルム11の評価結果を表3に示す。
(Reference example 3)
Polyamic acid solution 11 was prepared in the same manner as in Example 1 except that 56.2 g of polyamic acid solution B and 5.5 g of filler 3 were mixed.
Polyamic acid solution 11 was applied onto copper foil 1, metal-clad laminate 11 was prepared in the same manner as in Example 1, and then resin film 11 was prepared. The resin film 11 (thickness: 45.6 μm) had a dielectric constant of 3.25, a dielectric loss tangent of 0.0052, a CTE of 40.9, and had good bendability. Table 3 shows the evaluation results for resin film 11.

Figure 0007405560000004
Figure 0007405560000004

Figure 0007405560000005
Figure 0007405560000005

Figure 0007405560000006
Figure 0007405560000006

実施例1~6の平均粒子径D50が10μm以上の球状シリカ粒子を含有するポリイミドフィルムは、比較例1及び2のシリカを含まないポリイミドフィルムと比較して、誘電率及び誘電正接が低下している。
また、球状シリカ粒子を70vol%以上含有する参考例1及び2のポリイミドフィルムは、実施例と比較して折り曲げ性が悪化した。
さらに、平均粒子径D50が2.5μmと小さな球状シリカ粒子を配合した参考例3のポリイミドフィルムは、実施例に比べ誘電率及び誘電正接が高く、誘電特性の改善効果が小さかった。
The polyimide films containing spherical silica particles with an average particle diameter D50 of 10 μm or more in Examples 1 to 6 had lower dielectric constants and dielectric loss tangents than the silica-free polyimide films of Comparative Examples 1 and 2. ing.
Moreover, the polyimide films of Reference Examples 1 and 2 containing 70 vol % or more of spherical silica particles had worse bending properties compared to Examples.
Furthermore, the polyimide film of Reference Example 3 containing spherical silica particles with a small average particle diameter D 50 of 2.5 μm had a higher dielectric constant and dielectric loss tangent than those of Examples, and the effect of improving dielectric properties was small.

以上、本発明の実施の形態を例示の目的で詳細に説明したが、本発明は上記実施の形態に制約されることはなく、種々の変形が可能である。
Although the embodiments of the present invention have been described above in detail for the purpose of illustration, the present invention is not limited to the above embodiments and can be modified in various ways.

Claims (6)

単層又は複数層のポリイミド層を有する樹脂フィルムであって、
前記ポリイミド層の少なくとも1層が、球状シリカ含有ポリイミド層であり、前記球状シリカ含有ポリイミド層が、ポリアミド酸又はポリイミドと、球状シリカ粒子と、からなる樹脂組成物の硬化物であるとともに、レーザ回折散乱法による体積基準の粒度分布測定によって得られる前記球状シリカ粒子の頻度分布曲線が、下記の条件a~c;
a)累積値が50%となる平均粒子径D50が9.0~12.0μmの範囲内であること;
b)累積値が90%となる粒子径D90が15~20μmの範囲内であること;
c)累積値が100%となる粒子径D100が25μm以下であること;
を満たし、前記球状シリカ粒子の含有量が、該球状シリカ粒子と前記ポリアミド酸又は前記ポリイミドとの合計量に対し、20~65体積%の範囲内であり、
前記球状シリカ含有ポリイミド層の厚みが5~150μmの範囲内であることを特徴とする樹脂フィルム。
A resin film having a single layer or multiple polyimide layers,
At least one layer of the polyimide layer is a spherical silica-containing polyimide layer, and the spherical silica-containing polyimide layer is a cured product of a resin composition consisting of polyamic acid or polyimide and spherical silica particles, and the laser diffraction The frequency distribution curve of the spherical silica particles obtained by volume-based particle size distribution measurement using a scattering method is under the following conditions a to c;
a) The average particle diameter D 50 at which the cumulative value is 50% is within the range of 9.0 to 12.0 μm;
b) The particle diameter D90 at which the cumulative value is 90% is within the range of 15 to 20 μm;
c) The particle diameter D100 at which the cumulative value is 100% is 25 μm or less;
and the content of the spherical silica particles is within the range of 20 to 65% by volume based on the total amount of the spherical silica particles and the polyamic acid or the polyimide,
A resin film characterized in that the thickness of the spherical silica-containing polyimide layer is within a range of 5 to 150 μm.
前記球状シリカ粒子が、更に、下記の条件d;
d)頻度極大値F1及び頻度極大値F2を有し、前記F1が9.0~14.0μmの領域内、前記F2が0.5~3.0μmの領域内にあること;
を満たすことを特徴とする請求項1に記載の樹脂フィルム。
The spherical silica particles further meet the following conditions d;
d) having a maximum frequency value F1 and a maximum frequency value F2, with F1 being within a range of 9.0 to 14.0 μm and F2 being within a range of 0.5 to 3.0 μm;
The resin film according to claim 1, which satisfies the following.
前記球状シリカ粒子が、更に、下記の条件e;
e)頻度極大値F1及び頻度極大値F2を有し、前記F1及びF2の比(F1/F2)が3~28の範囲内であること;
を満たすことを特徴とする請求項1又は2に記載の樹脂フィルム。
The spherical silica particles further meet the following conditions e;
e) It has a maximum frequency value F1 and a maximum frequency value F2, and the ratio of F1 and F2 (F1/F2) is within the range of 3 to 28;
The resin film according to claim 1 or 2, wherein the resin film satisfies the following.
前記球状シリカ粒子の粒子径D100が前記球状シリカ含有ポリイミド層の厚みに対して0.05~0.7の範囲内であることを特徴とする請求項1に記載の樹脂フィルム。 The resin film according to claim 1, wherein the particle diameter D 100 of the spherical silica particles is within a range of 0.05 to 0.7 with respect to the thickness of the spherical silica-containing polyimide layer. 厚みが5~150μmの範囲内であり、前記球状シリカ含有ポリイミド層の厚みの割合が50%以上であることを特徴とする請求項1に記載の樹脂フィルム。 The resin film according to claim 1, wherein the resin film has a thickness in a range of 5 to 150 μm, and a thickness ratio of the spherical silica-containing polyimide layer is 50% or more. 絶縁樹脂層と、前記絶縁樹脂層の少なくとも一方の面に積層された金属層と、を備えた金属張積層板であって、
前記絶縁樹脂層が請求項1~5のいずれか1項に記載の樹脂フィルムからなることを特徴とする金属張積層板。
A metal-clad laminate comprising an insulating resin layer and a metal layer laminated on at least one surface of the insulating resin layer,
A metal-clad laminate, wherein the insulating resin layer is made of the resin film according to any one of claims 1 to 5.
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