JP6962863B2 - 荷電粒子線装置 - Google Patents
荷電粒子線装置 Download PDFInfo
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Description
Claims (6)
- 対象物に対する荷電粒子線の照射により前記対象物を観察する観察機構と、
前記観察機構に設定された現観察条件に突き合わされる少なくとも1つの第1観察条件と前記観察機構に設定され得る複数の想定観察条件としての複数の第2観察条件との間において規定される複数の変換タイプを管理するための変換タイプ管理テーブルを記憶した記憶部と、
前記変換タイプ管理テーブルにおける前記複数の変換タイプの中から、前記現観察条件に適合する1又は複数の変換タイプを特定する制御部と、
前記特定された1又は複数の変換タイプに対応する1又は複数の画像変換により、前記現観察条件の下で前記観察機構により得られた現画像に基づいて、1又は複数の想定観察条件の下で前記観察機構により得られるであろう1又は複数の画像を1又は複数の参照画像として推定する推定部と、
前記1又は複数の参照画像を表示する表示器と、
を含み、
前記制御部は、前記1又は複数の参照画像の中から選択された特定の参照画像に対応する特定の想定観察条件を新たな現観察条件として前記観察機構に設定する、
ことを特徴とする荷電粒子線装置。 - 請求項1記載の荷電粒子線装置において、
前記推定部は、前記現画像を前記1又は複数の参照画像に変換する機械学習型の画像変換部を含む、
ことを特徴とする荷電粒子線装置。 - 請求項2記載の荷電粒子線装置において、
前記画像変換部は、前記現画像を前記複数の想定観察条件に対応した前記複数の参照画像に変換し、
前記表示器には前記複数の参照画像が表示される、
ことを特徴とする荷電粒子線装置。 - 請求項3記載の荷電粒子線装置において、
前記画像変換部は、
複数の学習済みパラメータセットを格納した格納部と、
前記複数の学習済みパラメータセットの中から順次選択された学習済みパラメータセットが組み込まれるエンジンと、
を含み、
前記複数の学習済みパラメータセット及び前記エンジンがそれら全体として複数の機械学習型の画像変換器として機能する、
ことを特徴とする荷電粒子線装置。 - 請求項3記載の荷電粒子線装置において、
前記複数の参照画像の中から前記特定の参照画像をユーザーにより選択するための選択部を含む、
ことを特徴とする荷電粒子線装置。 - 請求項1記載の荷電粒子線装置において、
前記現観察条件には第1加速電圧が含まれ、
前記複数の想定観察条件の内のいずれかには前記第1加速電圧よりも高い第2加速電圧が含まれる、
ことを特徴とする荷電粒子線装置。
Priority Applications (4)
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JP2018100932A JP6962863B2 (ja) | 2018-05-25 | 2018-05-25 | 荷電粒子線装置 |
EP19174992.8A EP3573019B1 (en) | 2018-05-25 | 2019-05-16 | Charged particle beam apparatus and machine learning method |
US16/415,514 US11222241B2 (en) | 2018-05-25 | 2019-05-17 | Charged particle beam apparatus and machine learning method |
CN201910435670.9A CN110534390B (zh) | 2018-05-25 | 2019-05-23 | 带电粒子束装置和机器学习方法 |
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JP2018100932A JP6962863B2 (ja) | 2018-05-25 | 2018-05-25 | 荷電粒子線装置 |
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JP6962863B2 true JP6962863B2 (ja) | 2021-11-05 |
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EP (1) | EP3573019B1 (ja) |
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JP2021026926A (ja) * | 2019-08-07 | 2021-02-22 | 株式会社日立ハイテク | 画像生成方法、非一時的コンピューター可読媒体、及びシステム |
JP7346739B2 (ja) * | 2020-06-12 | 2023-09-19 | 株式会社日立ハイテク | 荷電粒子線装置および試料観察方法 |
WO2023144970A1 (ja) * | 2022-01-27 | 2023-08-03 | 株式会社日立ハイテク | 荷電粒子線検査システム、荷電粒子線検査方法 |
WO2024142316A1 (ja) * | 2022-12-27 | 2024-07-04 | 株式会社日立ハイテク | 集束イオンビーム装置 |
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JPH1167136A (ja) * | 1997-08-26 | 1999-03-09 | Hitachi Ltd | 荷電粒子装置及び荷電粒子装置ネットワークシステム |
JP3666267B2 (ja) * | 1998-09-18 | 2005-06-29 | 株式会社日立製作所 | 荷電粒子ビーム走査式自動検査装置 |
JP2000314710A (ja) * | 1999-04-28 | 2000-11-14 | Hitachi Ltd | 回路パターンの検査方法及び検査装置 |
US6664546B1 (en) * | 2000-02-10 | 2003-12-16 | Kla-Tencor | In-situ probe for optimizing electron beam inspection and metrology based on surface potential |
US7071969B1 (en) * | 2001-09-27 | 2006-07-04 | National Semiconductor Corporation | Parameterized preview array for iterative image optimization in remote applications |
JP5006520B2 (ja) | 2005-03-22 | 2012-08-22 | 株式会社日立ハイテクノロジーズ | 欠陥観察装置及び欠陥観察装置を用いた欠陥観察方法 |
CN102292790B (zh) * | 2009-01-22 | 2014-05-28 | 株式会社日立高新技术 | 电子显微镜 |
JP5506345B2 (ja) * | 2009-11-26 | 2014-05-28 | 株式会社日立ハイテクノロジーズ | 荷電粒子線顕微鏡および当該荷電粒子顕微鏡の制御方法 |
EP2633496B1 (en) | 2010-10-27 | 2023-01-11 | Koninklijke Philips N.V. | Image artifact identification and mitigation |
JP6063756B2 (ja) | 2013-01-25 | 2017-01-18 | 株式会社Screenホールディングス | 教師データ作成支援装置、教師データ作成装置、画像分類装置、教師データ作成支援方法、教師データ作成方法および画像分類方法 |
DE112014002043T5 (de) * | 2013-05-30 | 2016-01-14 | Hitachi High-Technologies Corporation | Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Probenbeobachtungsverfahren |
WO2016016927A1 (ja) * | 2014-07-28 | 2016-02-04 | 株式会社日立製作所 | 荷電粒子線装置、シミュレーション方法およびシミュレーション装置 |
KR102566134B1 (ko) * | 2015-12-07 | 2023-08-10 | 삼성전자주식회사 | 반도체 소자의 3d 프로파일링 시스템 및 이의 동작 방법 |
US10043261B2 (en) * | 2016-01-11 | 2018-08-07 | Kla-Tencor Corp. | Generating simulated output for a specimen |
US10395356B2 (en) | 2016-05-25 | 2019-08-27 | Kla-Tencor Corp. | Generating simulated images from input images for semiconductor applications |
JP6826455B2 (ja) * | 2017-02-14 | 2021-02-03 | 株式会社日立製作所 | 画像形成装置 |
JP6668278B2 (ja) * | 2017-02-20 | 2020-03-18 | 株式会社日立ハイテク | 試料観察装置および試料観察方法 |
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- 2019-05-16 EP EP19174992.8A patent/EP3573019B1/en active Active
- 2019-05-17 US US16/415,514 patent/US11222241B2/en active Active
- 2019-05-23 CN CN201910435670.9A patent/CN110534390B/zh active Active
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EP3573019B1 (en) | 2022-04-13 |
US11222241B2 (en) | 2022-01-11 |
CN110534390B (zh) | 2023-11-07 |
US20190362189A1 (en) | 2019-11-28 |
JP2019204757A (ja) | 2019-11-28 |
EP3573019A1 (en) | 2019-11-27 |
CN110534390A (zh) | 2019-12-03 |
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